CN211627718U - Multifunctional large-current impact electromagnetic compatibility testing equipment - Google Patents

Multifunctional large-current impact electromagnetic compatibility testing equipment Download PDF

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CN211627718U
CN211627718U CN202020075314.9U CN202020075314U CN211627718U CN 211627718 U CN211627718 U CN 211627718U CN 202020075314 U CN202020075314 U CN 202020075314U CN 211627718 U CN211627718 U CN 211627718U
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switch
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彭学文
隆众军
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Shenzhen Huake Xinda Technology Co ltd
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Shenzhen Huake Xinda Technology Co ltd
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Abstract

The utility model provides a multifunctional large current impact electromagnetic compatibility testing device, which adopts a modular design and comprises a control module, a high-voltage source and polarity switching module, a capacitance charging and energy storage module, a bidirectional electronic switch module, a high-voltage distribution unit and a waveform distribution module, wherein the control module carries out logic, time sequence control and data analysis control; the utility model discloses in, adopt the modularized design, can be according to customer's needs, the required equipment of rapid debugging test, equipment greatly improves production efficiency, has reduced equipment cost. The bidirectional electronic switch can effectively avoid the defects that the ball gap discharge switch is easy to oxidize, has sparks, has poor reliability after long-term use and has large workload of later maintenance.

Description

Multifunctional large-current impact electromagnetic compatibility testing equipment
Technical Field
The utility model relates to an electromagnetic compatibility test field, especially a multi-functional heavy current strikes electromagnetic compatibility test equipment.
Background
The electromagnetic compatibility test equipment is a series of test equipment which respectively complete test functions specified by IEC61000-4-X (corresponding to the domestic standard GB/T17626.X) and ITUK2X, ITUK4X and the like, and the former electromagnetic compatibility test equipment is usually one piece of equipment with one function, such as an electromagnetic compatibility test system of electric power metering equipment disclosed by Chinese patent application No. 201811139666. X; the patent application No. 201810522301.9 discloses a test system for electromagnetic compatibility of inverter equipment, and the patent application No. 201710862562.0 discloses an electromagnetic compatibility (EMC) test method for photovoltaic inverters. These electromagnetic compatibility test devices are not integrated, modular to design the test device.
The existing electromagnetic compatibility testing equipment has the defects that 1: different test functions, different circuit and device requirements, various types of circuits and devices, difficulty in assembly and maintenance of manufacturers, high equipment cost and difficulty in equipment popularization.
And less than 2: the existing electromagnetic compatibility test equipment has one function, does not perform multifunctional integration and optimization, and is not beneficial to the appearance and style consistency of products. For customers needing multiple functions, equipment purchasing cost is high, and occupied area is large.
Less than 3: the existing high-voltage and high-current electromagnetic compatibility testing equipment generally uses a spark ball gap switch, after multiple switches are carried out, a discharge ball is easy to oxidize, the reliability and the effect of subsequent switches are influenced, adjustment and maintenance are required to be carried out regularly, and the maintenance workload is large; the discharge ball generates sparks at the moment of being switched on, and strong electromagnetic interference is generated to the outside.
SUMMERY OF THE UTILITY MODEL
The utility model discloses not integrating, the modularization carries out the not enough that designs to test equipment to present electromagnetic compatibility test equipment, provides a multi-functional heavy current strikes electromagnetic compatibility test equipment.
The utility model discloses realize that its technical purpose technical scheme is: a multifunctional high-current impact electromagnetic compatibility testing device adopts a modular design and comprises a control module, a high-voltage source and polarity switching module, a capacitor charging and energy storage module, a bidirectional electronic switch module, a high-voltage distribution unit and a waveform distribution module, wherein the control module is used for carrying out logic, time sequence control and data analysis control;
the bidirectional electronic switch module comprises:
the switch comprises n multiplied by m bidirectional thyristors, wherein m groups of n bidirectional thyristors are connected in parallel to form m bidirectional thyristor parallel circuits, and the m bidirectional thyristor parallel circuits are sequentially connected in series between a first direct-current high-voltage power supply HV1 and a second direct-current high-voltage power supply HV2 which use the switch;
the device comprises an adjustable direct current power supply U1, an adjustable direct current power supply U2, a current limiting resistor R1, a driving transformer T and a switching tube Q; the current-limiting resistor R1, the source side coil of the driving transformer T and the D, S pole of the switching tube Q are sequentially connected in series at two ends of the adjustable direct-current power supply U1 after being controlled by the switch K3, and are sequentially connected in series at two ends of the adjustable direct-current power supply U2 after being controlled by the switch K4; the switch K3 and the switch K4 are not closed at the same time; the current directions of the adjustable direct current power supply U1 and the adjustable direct current power supply U2 flowing through the current limiting resistor R1, the source side coil of the driving transformer T and the D, S pole of the switching tube Q are opposite;
two ends of m secondary side coils of the driving transformer T are respectively connected with a T1 pole and a G pole of the bidirectional thyristor in the m bidirectional thyristor parallel circuits, the same-phase end in the secondary side coils is connected with the G pole of the bidirectional thyristor, and a Q grid of the switching tube forms a control end of the bidirectional semiconductor switch; n and m are natural numbers larger than 3.
The utility model discloses in, adopt the modularized design, can be according to customer's needs, the required equipment of rapid debugging test, equipment greatly improves production efficiency, has reduced equipment cost. The bidirectional electronic switch can effectively avoid the defects that the ball gap discharge switch is easy to oxidize, has sparks, has poor reliability after long-term use and has large workload of later maintenance.
Further, in the above multifunctional high-current impact electromagnetic compatibility testing apparatus: and a bypass switch PKi, i being a natural number greater than or equal to zero and less than m, respectively provided between the T1 and T2 poles of the triacs in the m triac parallel circuits.
Further, in the above multifunctional high-current impact electromagnetic compatibility testing apparatus: the control circuit of the bypass switch PKi comprises an isolation circuit to form an isolation control circuit.
Further, in the above multifunctional high-current impact electromagnetic compatibility testing apparatus: the bidirectional electronic switch module comprises:
the switch comprises n multiplied by m bidirectional thyristors, wherein m groups of n bidirectional thyristors are connected in parallel to form m bidirectional thyristor parallel circuits, and the m bidirectional thyristor parallel circuits are sequentially connected in series between a first direct-current high-voltage power supply HV1 and a second direct-current high-voltage power supply HV2 which use the switch;
an adjustable direct current power supply U1, an adjustable direct current power supply U2, a current limiting resistor R1, a driving transformer T1, a driving transformer TV, a driving transformer Tn-1 of …, a driving transformer Tn and a switching tube Q, wherein source side coils are mutually connected in series; the current limiting resistor R1, the driving transformer T1 and the driving transformers TV and … are connected in series with each other, the source side coil of the driving transformer Tn and the D, S pole of the switching tube Q are sequentially connected in series at two ends of the adjustable direct current power supply U1 after being controlled by a switch K3, and are sequentially connected in series at two ends of the adjustable direct current power supply U2 after being controlled by a switch K4; the switch K3 and the switch K4 are not closed at the same time; an adjustable direct current power supply U1 and an adjustable direct current power supply U2 flow through a current-limiting resistor R1, a driving transformer T1 with a primary coil connected in series, a driving transformer TV and a driving transformer Tn-1 with a primary coil …, and the current directions of a source coil of the driving transformer Tn and a D, S pole of a switching tube Q are opposite;
a driving transformer T1, a driving transformer TV and a … driving transformer Tn-1 are connected with primary side coils in series, two ends of a secondary side coil of the driving transformer Tn are respectively connected with a T1 pole and a G pole of a bidirectional thyristor in m bidirectional thyristor parallel circuits, the same phase end in the secondary side coil is connected with the G pole of the bidirectional thyristor, and the grid of the switching tube Q forms a control end of the bidirectional semiconductor switch; n and m are natural numbers larger than 3.
Further, in the above multifunctional high-current impact electromagnetic compatibility testing apparatus: the high-voltage source and polarity switching module comprises a high-voltage source, an adjusting module for adjusting the output voltage of the high-voltage source and a switching module for switching the positive polarity and the negative polarity of the output voltage of the high-voltage source.
Further, in the above multifunctional high-current impact electromagnetic compatibility testing apparatus: the capacitor charging and energy storage module comprises a charging module for charging the energy storage capacitor by a high-voltage source, and a selection module for realizing the series-parallel connection of a plurality of capacitors by inserting a metal rod or switching an automatic switch to realize a 9uF capacitor, an 18uF capacitor and a 36uF capacitor.
Further, in the above multifunctional high-current impact electromagnetic compatibility testing apparatus: the high-voltage distribution unit is used for distributing high-voltage energy to different pulse forming networks; the pulse forming network comprises an 8/20us combined wave pulse forming network, a 10/700us communication wave surge pulse forming network, a 8/20 mu s current pulse forming network, a 10/350 mu s current pulse forming network and a 10/1000 mu s current pulse forming network.
Further, in the above multifunctional high-current impact electromagnetic compatibility testing apparatus: and the waveform distribution module selects a corresponding waveform according to the test requirement and applies the waveform to the tested object at the output port.
The present invention will be described in more detail with reference to the accompanying drawings and examples.
Drawings
Fig. 1 is the utility model discloses embodiment 1 multi-functional heavy current strikes electromagnetic compatibility test equipment module structure picture.
Fig. 2 is the circuit schematic diagram of embodiment 1 of the high-voltage high-current bidirectional semiconductor switch of the multifunctional high-current impact electromagnetic compatibility testing equipment of the embodiment 1 of the utility model.
Fig. 3 is the utility model discloses embodiment 1 multi-functional heavy current strikes electromagnetic compatibility test equipment rack distribution diagram.
Detailed Description
This embodiment is one kind does the utility model discloses multi-functional heavy current strikes electromagnetic compatibility test equipment adopts the modularized design, including control module and by control module carry out logic, sequential control and data analysis control's high pressure source and polarity switching module, electric capacity charge with energy storage module, two-way electronic switch module, high-pressure distribution unit, waveform distribution module.
The bidirectional electronic switch module is a bidirectional, fast, high-voltage high-power semiconductor switch in a full voltage range as shown in fig. 2, and the bidirectional, fast, high-voltage high-power bidirectional semiconductor switch in the full voltage range includes: n x m bidirectional thyristors, n and m are natural numbers larger than 3. The bidirectional thyristor is made of N-P-N-P-N five-layer semiconductor materials, three electrodes are respectively a main electrode T1 electrode and a main electrode T2 electrode which are controlled by a G electrode to be conducted or not, one end of the T1 is a first electrode, the T2 is a second electrode, and the G electrode is a control electrode. The current-voltage characteristic curve of the bidirectional thyristor has symmetry in the positive and negative characteristics, so that the bidirectional thyristor can be conducted in any direction, and is an ideal alternating-current switching device.
The triac has a trigger control characteristic as well as the triac. However, its trigger control characteristics are very different from those of the triac, that is, no matter what polarity of voltage is applied between the anode and the cathode, the triac can be turned on by applying a trigger pulse to its control electrode, and no matter what polarity of the pulse is. Since the triac can be triggered by any polarity of operating voltage between the anode and the cathode, the main electrodes of the triac are not divided into the anode and the cathode, and these two main electrodes are usually called T1 electrode and T2 electrode, the main electrode connected to the P-type semiconductor material is called T1 electrode, and the electrode connected to the N-type semiconductor material is called T2 electrode. Since the two main electrodes of the bidirectional thyristor have no positive and negative division, the parameters of the bidirectional thyristor have no forward peak voltage and no inverse peak voltage division, only one maximum peak voltage is used, and other parameters of the bidirectional thyristor are the same as those of the unidirectional thyristor.
In the embodiment, m groups of n bidirectional thyristors are connected in parallel to form m bidirectional thyristor parallel circuits, and the m bidirectional thyristor parallel circuits are sequentially connected between a first direct-current high-voltage power supply HV1 and a second direct-current high-voltage power supply HV2 in series; here, the n bidirectional thyristors are connected in parallel to form m bidirectional thyristor parallel circuits means that two main electrodes of the n bidirectional thyristors are called as a T1 electrode, a T2 electrode and a control electrode G electrode are respectively connected to form a bidirectional thyristor parallel circuit. The m bidirectional thyristor parallel circuits are connected in series in sequence, namely that the T1 pole in the front bidirectional thyristor parallel circuit is connected with the rear T2 stage in sequence.
In practice, the first high voltage dc power supply HV1 and the second high voltage dc power supply HV2 are the two high voltage terminals that use switches.
The switch comprises n multiplied by m bidirectional thyristors, wherein m groups of n bidirectional thyristors are connected in parallel to form m bidirectional thyristor parallel circuits, and the m bidirectional thyristor parallel circuits are sequentially connected in series between a first direct-current high-voltage power supply HV1 and a second direct-current high-voltage power supply HV2 which use the switch; in practice, the first high voltage dc power supply HV1 and the second high voltage dc power supply HV2 are both ends of the bi-directional switch connection.
The device comprises an adjustable direct current power supply U1, an adjustable direct current power supply U2, a current limiting resistor R1, a driving transformer T and a switching tube Q; the current-limiting resistor R1, the source side coil of the driving transformer T and the D, S pole of the switching tube Q are sequentially connected in series at two ends of the adjustable direct-current power supply U1 after being controlled by the switch K3, and are sequentially connected in series at two ends of the adjustable direct-current power supply U2 after being controlled by the switch K4; switch K3 and switch K4 are not closed at the same time; the adjustable direct current power supply U1 and the adjustable direct current power supply U1 flow through the current limiting resistor R1, the source side coil of the driving transformer T and the D, S pole of the switching tube Q in opposite directions.
The in-phase end of a source side coil of the driving transformer T is connected with the negative pole direction of a power supply U1 or the positive pole direction of a power supply U2, m secondary side coils are respectively connected between the G pole and the T1 pole of m bidirectional thyristor parallel circuits, and the in-phase end of the secondary side coil is connected with the T1 pole.
In addition, when adjustment is needed, a bypass switch PK can be adopted to bypass some bidirectional thyristor parallel circuits, and the control circuit of the bypass switch needs to use an isolation control circuit.
The bidirectional semiconductor switch of the embodiment is a full-voltage range, bidirectional, fast and high-voltage high-power semiconductor switch integrating a high-power semiconductor device technology, a power electronic technology and an electromagnetic compatibility technology. The piezoelectric ceramic can be applied to high-voltage pulse generators, piezoelectric drivers, flash lamp drivers, Crowbar circuits, radar transmitters, radio frequency accelerators, various surge generators and the like. One specific application of a surge generator is shown in fig. 3, where HV is a dc high voltage source, the high voltage source can be as high as 150kV, the maximum current of the switch can be as high as 80kA, and a high power pulse can be obtained at point a.
Although technologies of semiconductor devices such as MOSFETs, IGBTs, SiC and the like have advanced greatly, voltage resistance and current capacity of the solid-state switch are still limited compared with thyristors, so that thyristors are preferably used to realize the solid-state switch in the scene of extra-high voltage and extra-high current. High voltage is realized by connecting a plurality of thyristors in series, and high current is realized by connecting a plurality of thyristors in parallel; the switching speed of the thyristor in microsecond level is ensured by increasing the trigger current and the working voltage as much as possible.
To implement the bidirectional switching function, the present embodiment uses a triac. Each thyristor is controlled in the control section with a single signal, triggered by a highly synchronous, isolated gate driver. Therefore, the wiring of a driving circuit of each thyristor can be very short, and the inconsistency of the transistor switch can be effectively avoided. It is ensured that the transistor switch can safely operate at di/dt and dv/dt under high power conditions and at peak currents as high as possible.
The switching speed of the thyristor is determined by two conditions of trigger current and working voltage, the trigger current determines the delay time of the thyristor, the working voltage determines the conduction time of the thyristor, and the trigger current and the working voltage comprehensively determine the switching speed of the thyristor. At low operating voltages, a significant drop in the switching speed of the thyristors may be caused by a significant drop in the voltage across each thyristor. For solving the problem, the utility model discloses a following two kinds of modes solve the problem that thyristor speed becomes slow under the low pressure condition:
1) under the condition of low voltage, the number of thyristor cascade stages is reduced (some thyristor cascade stages are bypassed through a relay, a contactor, a semiconductor device or other forms), and the working voltage of each thyristor under the condition of low voltage is kept to be still higher so as to ensure the fast conduction speed of the thyristor;
2) in the low-voltage condition, a larger trigger current is applied, and the delay time of the thyristor is reduced as much as possible.
Through the two modes, the requirement on the high switching speed of the solid-state switch under the scene of high-voltage and low-voltage full-voltage ranges is effectively compatible.
In the embodiment, the novel bidirectional, rapid and high-voltage high-power semiconductor switch is adopted, the maximum switching voltage is 150kV and 100kA, the switching speed is microsecond, and the switching frequency can reach 1012An order of magnitude.
In the embodiment, the novel bidirectional, rapid and high-voltage high-power semiconductor switch has no mechanical contact and no spark, can effectively avoid the defects of easy oxidation, spark and strong electromagnetic interference to the outside world of the spherical gap discharge switch, and can completely replace various application scenes of the spherical gap discharge switch.
In the embodiment, the switching speed of the novel bidirectional, rapid and high-voltage high-power semiconductor switch can be guaranteed in a micro-level switching speed within a high-voltage and low-voltage full-voltage range, and the problem that the switching speed of a spherical gap switch and a solid-state switch is greatly reduced in a low-voltage scene is solved.
In this embodiment, the driving transformer T is a source coil, the in-phase terminal of the source coil of the driving transformer T is connected to the negative electrode direction of the power supply U1 or the positive electrode direction of the power supply U2, the m secondary coils are respectively connected between the G pole and the T1 pole of the m bidirectional thyristor parallel circuits, and the in-phase terminal of the secondary coil is connected to the T1 pole.
In the present embodiment, the driving transformer is composed of m source windings connected in series with driving transformers T1, T2, … Tm-1 and Tm, as shown in fig. 2, m full secondary windings are respectively connected between G poles and T1 poles of m bidirectional thyristor parallel circuits, and the in-phase winding of the secondary winding is connected to T1 pole.
In the present embodiment, as shown in fig. 1 and 3: the combined wave surge module (IEC/EN 61000-4-5Ed3.0), the communication wave surge module (IEC/EN 61000-4-5), the current pulse wave 8/20uS module (ITU K20), the current pulse wave 10/350uS module (ITU K42), the current pulse wave 10/1000uS module (ITU K44) and other testing functions are integrated.
The parameters are as follows:
-combined wave surge, 1.2/50 μ sand 8/20us,30kV/15kA, output impedance 2 Ω, 9uF energy storage capacitance;
communication wave surge, 10/700us,7kV/254A, output impedance 27.5 Ω, 18uF energy storage capacitance.
Current pulse wave, 8/20 μ s,15 kV/30kA, output impedance 0.5 Ω, 36uF energy storage capacitance.
Current pulse wave, 10/350 μ s,15 kV/1.2kA, output impedance 12 Ω, 36uF energy storage capacitance.
Current pulse wave, 10/1000 μ s,15kV/0.4kA, output impedance 36 Ω, 36uF storage capacitor.
In order to integrate the above-mentioned multiple functions, compromise electric and electromagnetic property again, compromise the assembly of equipment simultaneously, maintainability does following novel design to multi-functional modularization electromagnetic compatibility test equipment:
the test device has the advantages that 1, the function is modularized, the research and the manufacture of the function module are facilitated, and the mechanical structure design of the test device is facilitated. According to the electromagnetic compatibility immunity test function to be completed by the multifunctional modularized electromagnetic compatibility test equipment, the same function in the test functions can be generalized, the hardware circuit and the structure which are to complete the function are fixed in a modularized form, meanwhile, different functions of the different electromagnetic compatibility immunity test functions are generalized, and the hardware circuit and the structure which are to complete the function are fixed in a modularized form. Through analysis and summarization, the hardware circuit and structure of the multifunctional modular electromagnetic compatibility testing device are shown in fig. 1 and are composed of the following modules:
the upper control and display module 1, on the one hand, transmits commands and status signals with the control module, and on the other hand, displays a human-computer interface.
The control module 2 is a control core of the entire system. The device mainly carries out logic and time sequence control and data analysis on a high-voltage source and polarity switching module, a capacitor charging and energy storage module, a bidirectional electronic switch module, a high-voltage distribution unit module, a waveform distribution module and the like according to a command transmitted by an upper control & display module.
The high voltage source and polarity switching module 3 adjusts the output voltage of the high voltage direct current source and switches the positive polarity and the negative polarity according to the instruction issued by the control module.
And the capacitor charging and energy storage module 4 charges the energy storage capacitor through the output of the high voltage source. And meanwhile, a plurality of capacitors are connected in series and in parallel by inserting metal rods or switching automatic switches, so that selection of 9uF capacitors, 18uF capacitors and 36uF capacitors is realized.
The bidirectional electronic switch 5 is a key execution component of the whole system as shown in fig. 2, and discharges the energy on the high-voltage energy storage capacitor to the pulse shaping network and the tested object at the later stage.
The high voltage distribution module 6 distributes the high voltage energy to the different pulse shaping networks. The device comprises an 8/20us combined wave pulse forming network, a 10/700us communication wave surge pulse forming network, a 8/20 mu s current pulse forming network, a 10/350 mu s current pulse forming network and a 10/1000 mu s current pulse forming network.
The waveform distribution unit 7 selects a corresponding waveform according to the test requirement and applies the waveform to the output port tested object. 8/20us combined wave coupling and decoupling unit 9; 10/700us communication wave coupling and decoupling unit 10; the test unit 11 monitors and displays the voltage and current signals in the test process in real time.
As shown in fig. 3, in this embodiment, the whole equipment is composed of two cabinets, and 8/20us combined wave coupling and decoupling unit 9 and 10/700us communication wave coupling and decoupling unit 10 two coupling and decoupling modules (CDNs) are placed in the left cabinet, and the rest modules are placed in the right cabinet. Through the modularized design, the required equipment can be quickly debugged, tested and assembled, the production efficiency is greatly improved, and the equipment cost is reduced.
In addition, there is explosion-proof box 12, is used for putting the measured article, ensures that the measured article testing process does not take place the injury to personnel.
In order to avoid the influence of high-voltage and high-current strong interference sources on low-voltage and low-current circuits in equipment, weak current parts such as an upper control and display module and a control module are placed on an explosion-proof box, a plurality of high-voltage and high-current modules are placed below the explosion-proof box, the upper control and display module and the control module are shielded by upper and lower metal partition plates of the explosion-proof box, and meanwhile, control signals are transmitted to a high-voltage and high-current side through isolation devices such as an optical coupler, a relay and a contactor. Different high-voltage and high-current modules are mutually shielded through metal clapboards.
In order to conveniently add or cut functions according to the requirements of customers, the pulse forming network is made into a detachable mode. When a customer needs a certain function, the corresponding pulse shaping network is installed.
Due to the different test functions, energy storage capacitors of 9uF, 18uF, 36uF are required, respectively. The series-parallel connection relation of the capacitors can be changed by manually inserting metal rods or automatically switching switches, so that different capacitance values can be obtained.
In this embodiment, the multifunctional modular electromagnetic compatibility test device is a high-integration test device, and a plurality of test functions are integrated in a limited device by adopting a modular design. In a device, high-frequency, high-voltage, high-power and low-voltage control data electric signals are in a space, mutual interference of various electric signals is inevitable, and therefore, the device is in a critical design on mechanical structure in a partitioning and shielding mode. The bidirectional electronic switch has no mechanical contact, no spark, high reliability and long service life.
The embodiment has the following advantages:
by adopting the modular design, the required equipment can be quickly debugged, tested and assembled according to the requirements of customers, the production efficiency is greatly improved, and the equipment cost is reduced.
By adopting modularization and advanced mechanical structure design, the excellent electrical and electromagnetic compatibility of the testing equipment is ensured, and the reliability of the equipment is greatly improved.
The bidirectional electronic switch can effectively avoid the defects that the ball gap discharge switch is easy to oxidize, has sparks, has poor reliability after long-term use and has large workload of later maintenance.

Claims (8)

1. The utility model provides a multi-functional heavy current strikes electromagnetic compatibility test equipment which characterized in that: the system adopts a modular design and comprises a control module, a high-voltage source and polarity switching module, a capacitor charging and energy storage module, a bidirectional electronic switch module, a high-voltage distribution unit and a waveform distribution module, wherein the control module is used for carrying out logic, time sequence control and data analysis control;
the bidirectional electronic switch module comprises:
the switch comprises n multiplied by m bidirectional thyristors, wherein m groups of n bidirectional thyristors are connected in parallel to form m bidirectional thyristor parallel circuits, and the m bidirectional thyristor parallel circuits are sequentially connected in series between a first direct-current high-voltage power supply HV1 and a second direct-current high-voltage power supply HV2 which use the switch;
the device comprises an adjustable direct current power supply U1, an adjustable direct current power supply U2, a current limiting resistor R1, a driving transformer T and a switching tube Q; the current-limiting resistor R1, the source side coil of the driving transformer T and the D, S pole of the switching tube Q are sequentially connected in series at two ends of the adjustable direct-current power supply U1 after being controlled by the switch K3, and are sequentially connected in series at two ends of the adjustable direct-current power supply U2 after being controlled by the switch K4; the switch K3 and the switch K4 are not closed at the same time; the current directions of the adjustable direct current power supply U1 and the adjustable direct current power supply U2 flowing through the current limiting resistor R1, the source side coil of the driving transformer T and the D, S pole of the switching tube Q are opposite;
two ends of m secondary side coils of the driving transformer T are respectively connected with a T1 pole and a G pole of the bidirectional thyristor in the m bidirectional thyristor parallel circuits, the same-phase end in the secondary side coils is connected with the G pole of the bidirectional thyristor, and a Q grid of the switching tube forms a control end of the bidirectional semiconductor switch; n and m are natural numbers larger than 3.
2. The multifunctional high-current impact electromagnetic compatibility testing device of claim 1, wherein: and a bypass switch PKi, i being a natural number greater than or equal to zero and less than m, respectively provided between the T1 and T2 poles of the triacs in the m triac parallel circuits.
3. The multifunctional high-current impact electromagnetic compatibility testing device according to claim 2, characterized in that: the control circuit of the bypass switch PKi comprises an isolation circuit to form an isolation control circuit.
4. The multifunctional high-current impact electromagnetic compatibility testing device of claim 1, wherein: the bidirectional electronic switch module comprises:
the switch comprises n multiplied by m bidirectional thyristors, wherein m groups of n bidirectional thyristors are connected in parallel to form m bidirectional thyristor parallel circuits, and the m bidirectional thyristor parallel circuits are sequentially connected in series between a first direct-current high-voltage power supply HV1 and a second direct-current high-voltage power supply HV2 which use the switch;
an adjustable direct current power supply U1, an adjustable direct current power supply U2, a current limiting resistor R1, a driving transformer T1, a driving transformer TV, a driving transformer Tn-1 of …, a driving transformer Tn and a switching tube Q, wherein source side coils are mutually connected in series; the current limiting resistor R1, the driving transformer T1 and the driving transformers TV and … are connected in series with each other, the source side coil of the driving transformer Tn and the D, S pole of the switching tube Q are sequentially connected in series at two ends of the adjustable direct current power supply U1 after being controlled by a switch K3, and are sequentially connected in series at two ends of the adjustable direct current power supply U2 after being controlled by a switch K4; the switch K3 and the switch K4 are not closed at the same time; an adjustable direct current power supply U1 and an adjustable direct current power supply U2 flow through a current-limiting resistor R1, a driving transformer T1 with a primary coil connected in series, a driving transformer TV and a driving transformer Tn-1 with a primary coil …, and the current directions of a source coil of the driving transformer Tn and a D, S pole of a switching tube Q are opposite;
a driving transformer T1, a driving transformer TV and a … driving transformer Tn-1 are connected with primary side coils in series, two ends of a secondary side coil of the driving transformer Tn are respectively connected with a T1 pole and a G pole of a bidirectional thyristor in m bidirectional thyristor parallel circuits, the same phase end in the secondary side coil is connected with the G pole of the bidirectional thyristor, and the grid of the switching tube Q forms a control end of the bidirectional semiconductor switch; n and m are natural numbers larger than 3.
5. The multifunctional high-current impact electromagnetic compatibility testing device of claim 1, wherein: the high-voltage source and polarity switching module comprises a high-voltage source, an adjusting module for adjusting the output voltage of the high-voltage source and a switching module for switching the positive polarity and the negative polarity of the output voltage of the high-voltage source.
6. The multifunctional high-current impact electromagnetic compatibility testing device according to claim 5, characterized in that: the capacitor charging and energy storage module comprises a charging module for charging the energy storage capacitor by a high-voltage source, and a selection module for realizing the series-parallel connection of a plurality of capacitors by inserting a metal rod or switching an automatic switch to realize a 9uF capacitor, an 18uF capacitor and a 36uF capacitor.
7. The multifunctional high-current impact electromagnetic compatibility testing device according to claim 6, characterized in that: the high-voltage distribution unit is used for distributing high-voltage energy to different pulse forming networks; the pulse forming network comprises an 8/20us combined wave pulse forming network, a 10/700us communication wave surge pulse forming network, a 8/20 mu s current pulse forming network, a 10/350 mu s current pulse forming network and a 10/1000 mu s current pulse forming network.
8. The multifunctional high-current impact electromagnetic compatibility testing device according to claim 7, characterized in that: and the waveform distribution module selects a corresponding waveform according to the test requirement and applies the waveform to the tested object at the output port.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114326497A (en) * 2021-12-24 2022-04-12 湖南长高思瑞自动化有限公司 Isolation switch reliability test platform
CN116819218A (en) * 2023-08-30 2023-09-29 传麒科技(北京)股份有限公司 Automatic testing method and system for inverter

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114326497A (en) * 2021-12-24 2022-04-12 湖南长高思瑞自动化有限公司 Isolation switch reliability test platform
CN116819218A (en) * 2023-08-30 2023-09-29 传麒科技(北京)股份有限公司 Automatic testing method and system for inverter
CN116819218B (en) * 2023-08-30 2023-11-17 传麒科技(北京)股份有限公司 Automatic testing method and system for inverter

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