CN112859401B - Display substrate, detection method thereof and display device - Google Patents
Display substrate, detection method thereof and display device Download PDFInfo
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- CN112859401B CN112859401B CN202110268417.6A CN202110268417A CN112859401B CN 112859401 B CN112859401 B CN 112859401B CN 202110268417 A CN202110268417 A CN 202110268417A CN 112859401 B CN112859401 B CN 112859401B
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Abstract
A display substrate, a detection method thereof and a display device are provided. The display substrate comprises a display area, a frame area and a binding area, wherein the display area is provided with grid lines and data lines, the grid lines and the data lines are intersected to form a plurality of pixels, the binding area comprises test pins and test input lines connected with the test pins, the test pins are arranged to be connected with a Chip On Film (COF), the frame area comprises a grid line driving circuit (GOA), the output of a GOA circuit is connected with the grid lines, the display substrate further comprises test lines between the GOA circuit and the display area, a first overlapping area exists between the test lines and the test input lines, a second overlapping area exists between the test lines and the grid lines, and the test lines are used for enabling the grid lines to be detected to be communicated with the test input lines during detection. The substrate and the detection method provided by the embodiment of the invention can be connected to any grid line to be detected through welding when the detection is needed, so that the detection is more flexible, and screen disassembly is not needed.
Description
Technical Field
The embodiment of the invention relates to the technical field of display, in particular to a display substrate, a detection method thereof and a display device.
Background
Currently, a Liquid Crystal Display (LCD) has a main structure including an array (TFT) substrate and a Color Filter (CF) substrate which are disposed opposite to each other, and a Liquid Crystal (LC) layer disposed between the two substrates. The array substrate includes a display region, a Fan-out (Fan-out) region, and a circuit region, the Fan-out region being disposed between the display region and the circuit region. The display area is provided with grid lines and data lines, a plurality of grid lines and a plurality of data lines are vertically crossed to form a plurality of pixels arranged in a matrix, a Thin Film Transistor (TFT) is arranged in each pixel, a driving circuit and the like are arranged in the circuit area, and a data lead and the like are arranged in the fan-out area.
The GOA (gate driver on array) circuit refers to a gate line driving circuit directly fabricated on the array substrate. The GOA circuit comprises a plurality of stages of shift registers which are sequentially connected, each shift register drives one gate line and provides a starting signal for the next stage of shift register, and therefore the GOA circuit can achieve the purpose of enabling the gate lines to be conducted one by one on the whole.
In the process of manufacturing the LCD panel, there are many GOA related defects, such as abnormal lighting (AD), H-Block, H-Line, etc., and in the process of analyzing the GOA related defects, the waveform signal output by the GOA is often required to be referred.
Disclosure of Invention
The technical problem to be solved by the embodiments of the present invention is to provide a display substrate, a detection method thereof, and a display device, which can realize display without screen detachment.
In order to solve the above technical problem, an embodiment of the present invention provides a display substrate, including a display area, a frame area and a bonding area, where the display area is provided with gate lines and data lines, the gate lines and the data lines intersect to form a plurality of pixels, the bonding area includes a test pin and a test input line connected to the test pin, the test pin is configured to be connected to a chip on film COF, the frame area includes a gate line driving circuit GOA, an output of the GOA circuit is connected to the gate lines, the display substrate further includes a test line between the GOA circuit and the display area, the test line and the test input line have a first overlapping area, the test line and the gate lines have a second overlapping area, and the test line is used for connecting the gate lines to be detected and the test input line during detection.
Optionally, the test line and the test input line present a first overlap region, comprising: one end of the test line overlaps and is connected to the test input line, or one end of the test line overlaps and is insulated from the test input line.
Optionally, the test input line is disposed to be connected to a first gate line adjacent to the test input line.
Optionally, the GOA circuits include a first GOA circuit located on one side of the display area and a second GOA circuit located on an opposite side of the display area, the test lines include a first test line and a second test line, the first test line is located between the first GOA circuit and the display area, and the second test line is located between the second GOA circuit and the display area.
Optionally, the test line and the data line are arranged in parallel and prepared in the same layer as the data line.
The embodiment of the invention also provides a display device which comprises any one of the display substrates.
The embodiment of the invention also provides a detection method of the display substrate, which is used for the display substrate, and the detection method comprises the following steps:
and welding the overlapping position of the test line and the grid line to be detected in the second overlapping area, so that the test line is electrically connected with the grid line to be detected.
Optionally, in the first overlapping region, when the test line is overlapped with the test input line in an insulation manner, the detection method further includes: and welding the overlapping position of the test line and the test input line in the first overlapping region to connect the test line and the test input line.
Optionally, when the test input line is disposed to be connected to a first gate line adjacent to the test input line, the detection method further includes: and cutting off the connection of the test input line and the first grid line.
Optionally, the method further comprises: when a plurality of grid lines need to be detected, the grid lines to be detected are electrically connected with the test lines from the grid lines far away from the test input line, the connection between the detected grid lines and the test lines is cut off after one grid line is detected, the grid lines far away from the test input line are selected from the undetected grid lines, the grid lines to be detected are electrically connected with the test lines, and the process is repeated until all the grid lines to be detected are detected completely.
According to the display substrate, the detection method and the display device provided by the embodiment of the invention, the test line which is overlapped with the grid line is arranged between the GOA circuit and the display area, and the test line can be connected to any grid line to be detected through welding when the detection is needed, so that the detection is more flexible, and the screen does not need to be detached.
Of course, it is not necessary for any product or method to achieve all of the above-described advantages at the same time for practicing the invention. Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objectives and other advantages of the embodiments of the invention will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
Drawings
The accompanying drawings are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the example serve to explain the principles of the invention and not to limit the invention. The shapes and sizes of the various elements in the drawings are not to scale and are merely intended to illustrate the invention.
FIG. 1 is a schematic structural diagram of a display substrate according to an embodiment of the invention;
FIG. 2 is a schematic view of a display substrate according to a first embodiment of the present invention;
FIG. 3 is a schematic view illustrating a process of inspecting a display substrate according to a first embodiment of the present invention;
FIG. 4 is a schematic view of a display substrate according to a third embodiment of the present invention;
FIG. 5 is a schematic view illustrating a process of inspecting a display substrate according to a third embodiment of the present invention;
FIG. 6 is a schematic view of a display substrate according to a fourth embodiment of the present invention;
FIG. 7 is a diagram illustrating a testing process of a display substrate according to a fourth embodiment of the present invention.
Description of reference numerals:
100-a display area; 200-a border region; 300-a binding region;
201-test line; 202 — a first overlap region; 203 — a second overlap region;
301 — test input line.
Detailed Description
The following detailed description of embodiments of the invention is provided in connection with the accompanying drawings and examples. The following examples are intended to illustrate the invention, but are not intended to limit the scope of the invention. It should be noted that the embodiments and features of the embodiments in the present application may be arbitrarily combined with each other without conflict.
Two methods for detecting the output signals of the GOA exist at present, one is to detect the output signals by testing a Gout measuring point On a Printed Circuit Board (PCB), and the Gout output is to connect the output signals of the GOA of the first line or the last line by using a Gate line (Gate) or a Data line (Data) metal wire in the design stage and output the output signals to the PCB through a Pin (Pin) On a Chip On Flex (COF); and secondly, removing the CF glass part above the GOA, and testing the GOA output signal by using a microprobe.
The two detection modes aiming at the defects of the GOA have the defects. By utilizing the Gout measuring points on the PCB, only the GOA output signals of the first line or the last line of the GOA can be tested, and the problem of detection limitation exists; and the micro probe detection is carried out on the GOA output in a mode of removing part of the CF glass, so that the working environment of the GOA can be damaged, and the problem of deviation of the detection result is caused.
To this end, an embodiment of the present invention provides a display substrate, including a display region, a frame region and a bonding region, where the display region is provided with a gate line and a data line, the gate line and the data line intersect to form a plurality of pixels, the bonding region includes a test pin and a test input line connected to the test pin, the test pin is set to be connected to a COF, the frame region includes a GOA circuit, an output of the GOA circuit is connected to the gate line, the display substrate further includes a test line between the GOA circuit and the display region, the test line and the test input line have a first overlapping region, the test line and the gate line have a second overlapping region, and the test line is used to connect the gate line to be detected and the test input line during detection.
Through set up between GOA circuit and display area and have the test line of overlap with the grid line, can detect through welded connection to any grid line that needs to detect when needs for detect more nimble, and need not to tear open the screen.
In an exemplary embodiment, the purpose of the first overlapping region of the test line and the test input line is to connect the test line and the test input line, which may be to connect, i.e., overlap and connect, the test line and the test input line by providing a via hole or a metal layer in the first overlapping region when the display substrate is manufactured, or to provide a first overlapping region of one end of the test line and the test input line when the substrate is manufactured, but without connection, i.e., insulating overlap, and to connect, i.e., solder the first overlapping region, the test line and the test input line when the substrate is inspected.
In an exemplary embodiment, the test line and the data line may be disposed in the same layer. The test line may be prepared at the same time as the data line is prepared. Or the test lines may be provided in the same layer as the test input lines (pre-connected through the same layer of metal). So long as the test line and the grid line are ensured to be overlapped in an insulating way.
In an exemplary embodiment, the test input line may be disposed to be connected to a first gate line adjacent to the test input line. For example, may be provided at the time of preparing the display substrate.
For example, the bonding region may be located at an upper side or a lower side of the display region in a direction horizontal to the display region, and when the bonding region is located at the upper side of the display region, the test input line is connected to a first gate line from top to bottom (in this case, the first gate line); when the bonding region is located at the lower side of the display region, the test input line is connected with a first grid line from bottom to top (the grid line is the first grid line at this time).
In an exemplary embodiment, the frame area is located at the left and/or right side of the display area in a horizontal direction with respect to the display area, and the GOA circuit may be located at the frame area at the left side and/or the frame area at the right side of the display area. When a GOA circuit is respectively established in left side frame area and right side frame area, that is, when two-sided GOA circuits are adopted, the GOA circuit includes a first GOA circuit located on one side (for example, left side) of the display area and a second GOA circuit located on the other side (for example, right side) of the display area, the test lines can be set to two, including a first test line and a second test line, the first test line is located between the first GOA circuit and the display area, and the second test line is located between the second GOA circuit and the display area.
In an exemplary embodiment, the test line may be disposed in parallel with the data line.
The embodiment of the present invention further provides a detection method for a display substrate, where the display substrate is the display substrate in the foregoing embodiment, and includes a display region, a frame region and a binding region, where the display region is provided with gate lines and data lines, the gate lines and the data lines are vertically crossed to form a plurality of pixels arranged in a matrix, the binding region includes a test pin and a test input line connected to the test pin, the test pin is set to be connected to a COF, the frame region includes a GOA circuit, an output of the GOA circuit is connected to the gate lines, the display substrate further includes a test line between the GOA circuit and the display region, the test line and the test input line have a first overlapping region, the test line and the gate lines have a second overlapping region, and the test line is used for connecting the gate lines to be detected and the test input line during detection, and the detection method includes:
and welding the overlapping position of the test line and the grid line to be detected in the second overlapping area to enable the test line to be electrically connected with the grid line to be detected.
According to the embodiment of the invention, the test line overlapped with the grid line is preset, so that the test line can be connected with the grid line to be detected by welding during detection, the limitation that the prior art can only detect the first or last grid line is avoided, the screen is not required to be detached, and the method is simple to realize.
In an exemplary embodiment, when the test line is insulatively overlapped with the test input line at the first overlapping region, the inspection method further includes, at the time of inspection: and welding the overlapping position of the test line and the test input line in the first overlapping region to connect the test line and the test input line.
In an exemplary embodiment, when the test input line is disposed to be connected to a first gate line adjacent to the test input line, the detection method further includes: and cutting off the connection of the test input line and the first grid line.
In an exemplary embodiment, laser cutting and laser welding may be achieved by controlling the power of a laser, which is used at the time of cutting to be greater than that of a laser used at the time of welding.
In an exemplary embodiment, when a plurality of gate lines need to be detected, the detection is started from a gate line far from a test input line. Specifically, the grid lines to be detected are electrically connected with the test lines from the grid lines far away from the test input line for detection, the connection between the detected grid lines and the test lines is cut off after each grid line is detected, the grid lines far away from the test input line are selected from the undetected grid lines, the grid lines to be detected are electrically connected with the test lines for detection, and the process is repeated until all the grid lines to be detected are detected completely.
Fig. 1 is a schematic structural diagram of a display substrate according to an embodiment of the invention. As shown in fig. 1, the display substrate may include a display region 100, a frame region 200 and a bonding region 300, where the display region 100 includes a plurality of gate lines (G1 to Gm in the figure) and a plurality of data lines (D1 to Dn in the figure), and the plurality of gate lines and the plurality of data lines vertically intersect to form a plurality of pixels arranged in a matrix. The data lines are used to input corresponding data voltages to the corresponding pixels. The gate line is used to input a scan signal to a corresponding pixel. The bonding region 300 includes a test pin Gout, which is set to be connected to the COF, and a test input line 301 connected to the test pin Gout. The frame region 200 includes a GOA circuit, the output of which is connected to the gate lines. In the frame area 200, a test line 201 is disposed between the GOA and the display area, and there is a first overlapping area 202 between the test line 201 and the test input line 301, wherein the test line 201 and the test input line 301 are thickened for clarity and do not represent actual widths. The test line 201 and all the gate lines have a second overlap region 203, and the test line 201 is used for connecting the gate line to be tested and the test input line 301 during testing. The test line 201 may be disposed in parallel with the data line to vertically overlap all the gate lines.
The binding area 300 in fig. 1 may be located above the display area or below the display area 100, which is not limited in the present invention.
In the following embodiments, the bonding region 300 is located above the display region, the GOA circuits are located at the left side of the display region, and the bonding region 300 is located below the display region, or when two test lines are disposed in the GOA circuits on both sides, the following embodiments may be referred to.
First embodiment
In this embodiment, when the display substrate is manufactured, the test line and the test input line are disposed to have a first overlapping region and connected in the first overlapping region, as indicated by a point N1 in fig. 2. When the test lines are disposed at different layers from the test input lines, the via connections may be made at overlapping locations. When the test line and the test input line are arranged on the same layer, the test line and the test input line can be connected through metal on the same layer, and the connection position is an overlapping position, namely an overlapping area. In this embodiment, the test pin Gout may be connected to the circuit PCB through the COF, and a test site for the GOA is left on the PCB.
When the substrate has poor GOA correlation and needs to detect a GOA output signal of a specific row, for example, when a certain gate line, such as a gate line Gx1, on the substrate needs to be detected, x1 is greater than or equal to 1 and is less than or equal to m, in the second overlapping region 203, the overlapping position of the gate line Gx1 and the test line is as an N2 point in FIG. 2, the test line 201 is communicated with the gate line Gx1 through laser welding from the bottom side of the glass substrate, so that the electrical connection between the gate line Gx1 to be detected and the test pin Gout can be realized, and a GOA output waveform signal of the gate line Gx1 can be obtained on the PCB through test point positions.
Optionally, after the gate line Gx1 is tested, other gate lines may also be detected, for example, the gate line Gx2 needs to be detected, where x2 is greater than or equal to 1 and is less than x1, at this time, the connection between Gx1 and the test line may be cut off by laser at a point N3 in fig. 3, in other embodiments, laser cutting may be performed at any point on the test line between Gx2 and Gx1, which is not limited by the present invention. The overlapping position of the Gx2 and the test line, for example, N4 point in fig. 3, is formed by connecting the test line 201 and the gate line Gx2 through laser welding, so that the gate line Gx2 to be detected and the test pin Gout can be electrically connected, and a GOA output signal of the gate line Gx2 can be obtained through Gout.
Optionally, other grid lines can be detected, and the detection of Gx2 can be referred to. When a plurality of gate lines need to be detected, the detection is started from the gate line far away from the test input line.
Second embodiment
This embodiment is similar to the first embodiment except that the test lines and the test input lines are disposed at different layers and there is a first overlapping region when the display substrate is manufactured, but the test lines and the test input lines are not connected in the first overlapping region 202, i.e., the test lines and the test input lines are overlapped in an insulated manner.
When the substrate has poor GOA correlation and needs to detect a GOA output signal of a specific row, for example, when a gate line, for example, a gate line Gx1, on the substrate needs to be detected, except that the overlapping position of the gate line Gx1 and the test line in the second overlapping region 203 enables the test line to be communicated with the gate line Gx1, the test line 201 needs to be connected with the test input line 301 in the first overlapping region 202 through laser welding, so that the electrical connection between the gate line Gx1 to be detected and the test pin Gout can be realized, and a GOA output waveform signal of the gate line Gx1 can be obtained on the PCB through a test point location.
Alternatively, a plurality of gate lines may be detected, after the test line 201 and the test input line 301 are electrically connected, during detection, the gate line to be detected is electrically connected to the test line from the gate line far from the test input line, and detection is performed, and when one gate line is detected, the connection between the detected gate line and the test line is cut off, and the gate line far from the test input line is selected from the undetected gate lines, so that the gate line to be detected is electrically connected to the test line, and detection is performed, and the above process is repeated until all the gate lines to be detected are detected.
Third embodiment
This embodiment is similar to the second embodiment in that the test lines are arranged to be insulated from the test input lines in the preparation of the display substrate, i.e., the test lines and the test input lines have a first overlapping region, but are not connected in the first overlapping region. The difference is that in preparing the test input line 301, the test input line is set to be connected to a first gate line adjacent to the test input line, that is, the test input line is connected to a gate line most adjacent to the bonding region. As shown in fig. 4, the test input line 301 is set to be connected to the gate line G1 at a point N5, and the GOA output waveform signal of the first gate line G1 can be obtained through a test point location on the PCB through the test input line 301. The test line 201 and the test input line 301 are arranged to be in insulation overlapping at a first overlapping region 202, the overlapping region is arranged so as to enable the test line 201 to be communicated with the test input line 301 during detection, and the test line 201 and the test input line 301 are arranged on different layers in the embodiment. Fig. 4 shows only one routing manner of the test lines and the test input lines, and in other embodiments, the routing manner of the test lines may be determined according to the layout of the panel, which is not limited in the present invention.
When the substrate has poor GOA correlation and needs to detect the GOA output signal of a specific row, for example, when a certain gate line on the substrate, for example, a gate line Gx1, needs to be detected, the detection method includes:
step 2, in the second overlapping area 203, at the overlapping position of the gate line Gx1 and the test line 201, as shown at point N2 in fig. 5, the test line 201 is communicated with the gate line Gx1 by laser welding from the bottom side of the glass substrate;
step 3, in the first overlapping area 202, the overlapping position of the test input line 301 and the test line 201 connects the test line 201 and the test input line 301 by laser welding.
The execution sequence of the above step 2 and step 3 is not limited.
Therefore, the electric connection between the grid line Gx1 to be detected and the test pin Gout can be realized, and the GOA output waveform signal of the grid line Gx1 can be obtained on the PCB through the test point position.
Optionally, a plurality of gate lines can be detected, during detection, the step 1 and the step 3 can be executed first, when the step 2 is executed, the gate line to be detected is electrically connected with the test line from the gate line far away from the test input line, detection is performed, when one gate line is detected, the connection between the detected gate line and the test line is cut off, the gate line far away from the test input line is selected from the undetected gate lines, the gate line to be detected is electrically connected with the test line, detection is performed, and the above process is repeated until all the gate lines to be detected are detected.
Fourth embodiment
This embodiment is similar to the first embodiment in that a test line is disposed to have a first overlapping region with a test input line and connected in the first overlapping region when a display substrate is prepared, except that the test input line is disposed to be connected to a first gate line adjacent to the test input line, that is, the test input line is connected to a gate line most adjacent to the bonding region, when the test input line 301 is prepared. As shown in fig. 6, the test line 201 overlaps and is connected to the test input line 301 at a point N8 in fig. 6, and the test input line 301 is connected to the gate line G1 at a point N5.
When the substrate has poor GOA correlation and needs to detect the GOA output signal of a specific row, for example, when a certain gate line on the substrate, for example, a gate line Gx1, needs to be detected, the detection method includes:
step 2, in the second overlapping region 203, the overlapping position of the gate line Gx1 and the test line 201 is as N2 point in fig. 7, and the test line 201 is communicated with the gate line Gx1 by laser welding from the bottom side of the glass substrate.
Therefore, the electric connection between the grid line Gx1 to be detected and the test pin Gout can be realized, and the GOA output waveform signal of the grid line Gx1 can be obtained on the PCB through the test point position.
Optionally, a plurality of gate lines may be detected, in the detection, the step 1 may be executed first, in the step 2, the gate line to be detected is electrically connected to the test line from the gate line far away from the test input line, and the detection is performed, and when one gate line is detected, the connection between the detected gate line and the test line is cut off, and the gate line far away from the test input line is selected from the undetected gate lines, so that the gate line to be detected is electrically connected to the test line, and the detection is performed, and the above process is repeated until all the gate lines to be detected are detected.
According to the detection method provided by the embodiment of the invention, the test line overlapped with the grid line is preset, so that the test line can be connected with the grid line to be detected by welding during detection, the limitation that only the first or last grid line can be tested in the prior art is avoided, screen dismantling is not needed, and the detection method is flexible and simple to realize.
Based on the inventive concept of the foregoing embodiments, an embodiment of the present invention further provides a display device, which includes the display substrate employing the foregoing embodiments. The display device may be: any product or component with a display function, such as a mobile phone, a tablet computer, a television, a display, a notebook computer, a digital photo frame, a navigator and the like.
In the description of the embodiments of the present invention, it should be understood that the terms "middle", "upper", "lower", "front", "rear", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed in a particular orientation, and be operated, and thus, should not be construed as limiting the present invention.
In the description of the embodiments of the present invention, it should be noted that, unless explicitly stated or limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in a specific case to those of ordinary skill in the art.
Although the embodiments of the present invention have been described above, the above description is only for the convenience of understanding the present invention, and is not intended to limit the present invention. It will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (6)
1. A display substrate comprises a display area, a frame area and a binding area, wherein the display area is provided with grid lines and data lines, the grid lines and the data lines are intersected to form a plurality of pixels, the binding area comprises a test pin and a test input line connected with the test pin, the test pin is arranged to be connected with a Chip On Film (COF), the frame area comprises a gate line driving circuit (GOA), a GOA circuit output is connected with the grid lines, the display substrate further comprises a test line between the GOA circuit and the display area, a first overlapping area exists between the test line and the test input line, a second overlapping area exists between the test line and the grid lines, the test input line is arranged to be connected with a first grid line adjacent to the test input line, one end of the test line is in insulating overlapping with the test input line in the first overlapping area, and the test line is used for communicating the grid lines to be detected with the test input line in GOA poor detection.
2. The display substrate of claim 1, wherein the GOA circuits comprise a first GOA circuit on one side of the display area and a second GOA circuit on an opposite side of the display area, and wherein the test lines comprise a first test line and a second test line, the first test line being between the first GOA circuit and the display area, and the second test line being between the second GOA circuit and the display area.
3. The display substrate of claim 1, wherein the test lines are disposed parallel to the data lines and are fabricated on the same layer as the data lines.
4. A display device comprising the display substrate according to any one of claims 1 to 3.
5. A detection method of a display substrate, the display substrate comprising a display region, a frame region and a binding region, wherein the display region is provided with a gate line and a data line, the gate line and the data line are intersected to form a plurality of pixels, the binding region comprises a test pin and a test input line connected with the test pin, the test pin is arranged to be connected with a Chip On Film (COF), the frame region comprises a gate line driving circuit (GOA), a GOA circuit output is connected with the gate line, the display substrate further comprises a test line between the GOA circuit and the display region, a first overlapping region exists between the test line and the test input line, a second overlapping region exists between the test line and the gate line, the test input line is arranged to be connected with a first gate line adjacent to the test input line, one end of the test line is insulated and overlapped with the test input line in the first overlapping region, and the test line is used for communicating the gate line to be detected with the test input line during a GOA failure detection, the detection method comprises:
cutting off the connection of the test input line to the first gate line;
welding the overlapping position of the test line and the test input line in the first overlapping area to connect the test line and the test input line;
and welding the overlapping position of the test line and the grid line to be detected in the second overlapping area, so that the test line is electrically connected with the grid line to be detected.
6. The detection method according to claim 5, further comprising:
when a plurality of grid lines need to be detected, the grid lines to be detected are electrically connected with the test lines from the grid lines far away from the test input line, the connection between the detected grid lines and the test lines is cut off after one grid line is detected, the grid lines far away from the test input line are selected from the undetected grid lines, the grid lines to be detected are electrically connected with the test lines, and the process is repeated until all the grid lines to be detected are detected completely.
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