CN211237679U - Test circuit and display device thereof - Google Patents
Test circuit and display device thereof Download PDFInfo
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- CN211237679U CN211237679U CN202020201144.4U CN202020201144U CN211237679U CN 211237679 U CN211237679 U CN 211237679U CN 202020201144 U CN202020201144 U CN 202020201144U CN 211237679 U CN211237679 U CN 211237679U
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Abstract
The utility model discloses a test circuit and display device thereof, display panel includes display area and non-display area, the non-display area includes virtual pixel, be connected with virtual data line on the virtual pixel, test circuit includes: the test pads are configured in the non-display area and used for receiving or sending a plurality of test signals; and a plurality of test lines connected to the test pads for transmitting at least one of the plurality of test signals to the display panel or transmitting the test signal from the display panel, wherein the dummy data lines are the test lines. Therefore, the normal display of the panel is not influenced while the boundary space is saved, and the output of each level of signal lines can be detected.
Description
Technical Field
The utility model relates to a show technical field, concretely relates to test circuit and display device thereof.
Background
With the development of the optical and electronic technologies, the development of Flat Panel displays (Flat Panel displays) is also increased, and among many Flat Panel displays, Liquid Crystal Displays (LCDs) have been applied to various aspects of production and life due to their excellent characteristics, such as high space utilization efficiency, low power consumption, no radiation, and low electromagnetic interference.
The LCD generally includes a liquid crystal display panel and a backlight module which are oppositely disposed, wherein liquid crystal cells are arranged in a matrix form, and since the liquid crystal display panel cannot emit light, the backlight module is required to provide uniform light to the liquid crystal display panel, and then an image is displayed by applying an electric field according to a received image signal to control light transmittance through the liquid crystal layer. The LCD further includes a driving circuit (e.g., disposed in a peripheral region adjacent to the pixel array) for driving the LCD panel based on the received image data signal.
A pixel array of a liquid crystal display panel includes a Thin Film Transistor (TFT) substrate including a plurality of TFTs corresponding to a plurality of pixels and a color filter substrate (e.g., a red, green, and blue filter matrix), facing each other, with a liquid crystal material interposed therebetween, and spacers (spacers) maintaining a cell gap between the two substrates.
The thin film transistor substrate has scanning lines, data lines, thin film transistors TFT (e.g., serving as switches for each liquid crystal cell) formed at insulating intersections of the scanning lines and the data lines, pixel electrodes connected to the thin film transistors TFT, and alignment films (alignment films) coated on these elements. The scan lines and data lines receive signals from the (peripheral) driver circuit at respective pads. The data lines transmit pixel signals to the pixel electrodes (sources of the TFTs), and electric fields are applied to the liquid crystals in response to scanning signals transmitted from the scanning lines (received at gates of the TFTs).
The color filter substrate includes color filters formed on each liquid crystal cell, a black matrix separating the color filters from each other and reflecting external light, a common electrode supplying a reference (e.g., ground) voltage to all the liquid crystal cells, and an alignment film coated on all these elements.
The thin film transistor substrate and the color filter substrate are separately manufactured and assembled, and liquid crystal is injected between the two substrates, which are sealed, thereby forming a liquid crystal display panel.
After the panel is formed into a box, a lighting test is carried out to detect defects in signal lines (whether the signal lines are short-circuited or open-circuited) and defects in thin film transistor TFTs (thin film transistors) so as to confirm the feasibility of the design and the picture display condition.
SUMMERY OF THE UTILITY MODEL
In order to solve the technical problem, the utility model provides a test circuit and display device thereof does not influence the normal demonstration of panel when can saving boundary space, can also detect signal line output at different levels.
In one aspect, the utility model provides a test circuit for test display panel, display panel includes display area and non-display area, non-display area includes virtual pixel, be connected with virtual data line on the virtual pixel, wherein, test circuit includes:
the test pads are configured in the non-display area and used for receiving or sending a plurality of test signals;
a plurality of test lines connected to the test pads for transmitting at least one of the plurality of test signals to or from the display panel,
wherein the dummy data line is the test line.
Further, the display area includes a pixel array including:
a plurality of scanning lines, a plurality of data lines intersecting the scanning lines in an insulated manner, the data lines and the scanning lines defining a plurality of pixel units,
the plurality of data lines provide a plurality of source driving signals to the pixel units, and the plurality of scanning lines provide a plurality of gate driving signals to the pixel units.
Further, the non-display area further includes:
the grid driving chip is connected with the scanning line and used for providing the grid driving signal;
and the source electrode driving chip is connected with the data line and is used for providing the source electrode driving signal.
Further, the plurality of scanning lines and the test lines in the non-display area are provided with insulating intersection areas.
Furthermore, the test line is connected with any one of the scanning lines and used for testing the signal output of the scanning line.
Furthermore, the test line is connected with any one of the scanning lines by welding the insulating intersection area of any one of the scanning lines and the test line.
Further, the display panel further includes:
and the repairing lines are parallel to the scanning lines and arranged in the non-display area, and the repairing lines respectively have insulating intersection areas with the data lines and the testing lines.
Furthermore, any one of the data lines is connected with the test line and the repair line, and is used for testing the signal output of the data line.
Furthermore, the test wire is connected with the repair wire and simultaneously connected with any data wire by welding the insulation intersection area of any data wire and the test wire and the insulation intersection area of the repair wire.
On the other hand the utility model provides a display device, it includes:
the display panel comprises the test circuit; and
and the backlight module is used for providing brightness for the display panel.
The utility model has the advantages that: the utility model discloses utilize not participating in the virtual pixel that shows, through will connect the virtual data line of this virtual pixel for the test wire of test circuit in the display panel, both be used for accomplishing the test of lighting a lamp, also can be used for testing the line connection condition of display panel, realized saving space while not influencing the normal demonstration of display panel;
meanwhile, the test line of the test circuit and the scan line connected to the display area are both provided with an insulation intersection area, the test line is used as a signal test line for each row of scan lines, the insulation intersection area is welded to realize electric connection, and the output of any row of scan lines can be tested;
in addition, the repair line which is arranged in parallel with the scanning line and is preset in the display panel can be utilized, the electric connection is realized through the insulation intersection area of the test line and the repair line in the welding test circuit and the insulation intersection area of the repair line and the data line to be tested, and the output of any row of data lines can be tested.
Drawings
The above and other objects, features and advantages of the present invention will become more apparent from the following description of the embodiments of the present invention with reference to the accompanying drawings.
Fig. 1 is a schematic structural diagram of a test circuit in a display panel according to an embodiment of the present invention;
fig. 2 is a schematic diagram illustrating a partial structure in a test circuit according to an embodiment of the present invention;
fig. 3 shows a schematic structural diagram of a display panel in an embodiment of the present invention.
Detailed Description
In order to facilitate understanding of the present invention, the present invention will be described more fully hereinafter with reference to the accompanying drawings. The preferred embodiments of the present invention are shown in the drawings. The invention may, however, be embodied in different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.
The present invention will be described in detail below with reference to the accompanying drawings.
Fig. 1 shows the structural schematic diagram of the test circuit in the display panel of the embodiment of the present invention, and fig. 2 shows the structural schematic diagram of the part in the test circuit of the embodiment of the present invention.
As shown in fig. 1 and 2, the embodiment of the present invention provides a test circuit (partial structure is not shown), the test circuit is used for testing the input signal of the display panel 100, the display panel 100 includes a display area and a non-display area, the non-display area includes a virtual pixel, a virtual data line 1241 is connected to the virtual pixel, wherein the test circuit includes: a plurality of test PADs PAD and a plurality of test lines 1241, wherein the plurality of test PADs PAD are disposed in the non-display region for receiving or transmitting a plurality of test signals, and the plurality of test lines 1241 are connected to the test PADs PAD for transmitting at least one of the plurality of test signals to the display panel 100, the input signal includes a driving signal of the display panel 100 and the plurality of test signals, and in this embodiment, the dummy data line connected with the dummy pixel does not participate in the display operation, so the selected dummy data line can be used as the test line 1241 in the test circuit at the time of the box-lighting test, and can also be used as the transmission line of the driving signal of the display panel 100 after the assembly is completed, and the line connection of a certain signal line (data line or scan line) in the display panel is tested. Further, the driving signals include, but are not limited to, gate driving signals and source driving signals.
Further, the display area includes a pixel array, the pixel array including: the liquid crystal display panel comprises a plurality of scanning lines 123 and a plurality of data lines 124 which are insulated and intersected with the scanning lines 123, wherein the data lines 124 and the scanning lines 123 define a plurality of pixel units, each pixel unit comprises a thin film transistor 101 and a pixel electrode, each thin film transistor 101 is connected with the scanning lines 123 and the data lines 124, the pixel electrodes are formed in the insulated and intersected areas of the data lines 124 and the scanning lines 123, each pixel electrode is connected with one thin film transistor 101, the plurality of data lines 124 are used for providing a plurality of source driving signals for the pixel units, and the plurality of scanning lines 123 are used for providing a plurality of gate driving signals for the pixel units. Specifically, the gates of the tfts 101 are electrically connected to a scan line 123, the sources are electrically connected to a data line, the drains are electrically connected to a pixel electrode, and under the control of the scan line, the data signals input by the data line are provided to the corresponding sub-pixels through the pixel electrode to control the display of the sub-pixels.
Further, the non-display area of the display panel 100 further includes: the gate driving chip 10 is connected to a plurality of scan lines 123 for providing the gate driving signals, and the source driving chip 20 is connected to a plurality of data lines 124 for providing the source driving signals.
Furthermore, the plurality of scan lines 123 and the test line 1241 each have an insulating intersection region 102 in the non-display region, and in one embodiment, the test line 1241 is connected to any scan line 123 by soldering the insulating intersection region of any scan line 123 and the test line 1241, and the test PAD is connected to an external test device and/or the other end of the test line 1241 connected to the test PAD is connected to the test chip 30, so that the test chip can be used to test the output condition of the gate driving signal through the scan line 123 and/or the connection condition of the scan line 123.
The utility model provides a test circuit for display panel 100 selects the dummy data line for test circuit in test line 1241, this display panel 100 still includes many repair lines simultaneously, and these many repair lines are parallel with scanning line 123, set up in the non-display area, and wherein, these many repair lines all have insulating crossing region 105 with data line 124 and test line 1241 respectively.
Further, the plurality of repair lines include at least a first repair line 103 and a second repair line 104, wherein the first repair line 103 is disposed adjacent to the source driving chip 10, and the second repair line 104 is disposed adjacent to the test chip 30.
Furthermore, by soldering the insulating intersection region 105 of any data line 124 and the test line 1241 and the repair line 103 (or 104), the test line 1241 is connected to the repair line 103 (or 104) and simultaneously connected to any data line 124, and the test PAD is connected to an external detection device and/or the other end of the test line 1241 connected to the test PAD is connected to the test chip 30, so that the testing device can be used for testing the output condition of the source driving signal through the data line 124 and/or the connection condition of the data line 124.
On the other hand, the present invention provides a display device, which includes the display panel described in the above embodiments; and the backlight module is mainly used for providing brightness for the display panel.
The utility model discloses an in the embodiment, utilize because of being sheltered from by black matrix and not participating in the virtual pixel that shows, through the virtual data line that will connect this virtual pixel act as display panel's test line, realized not influencing display panel's normal demonstration again when saving space.
In another embodiment, the test line of the test circuit and the scan line connected to the display region have an insulation intersection region, the test line is used as a signal test line of each row of scan lines, and the insulation intersection region is welded to realize the electrical connection between the test line and the scan line, so that the output of any row of scan lines can be tested.
In another embodiment, the repair line preset in the display panel and arranged in parallel with the scan line may be used to realize the electrical connection between the test line and the repair line in the welding test circuit and the insulation intersection region between the welding repair line and the data line to be tested, so as to test the output of the data line in any row.
It should be noted that in the description of the present invention, it is to be understood that the terms "upper", "lower", "inner", and the like, indicate positional or positional relationships for convenience of description of the present invention and to simplify the description, but do not indicate or imply that the components or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the present invention.
Further, in this document, the contained terms "include", "contain" or any other variation thereof are intended to cover a non-exclusive inclusion, so that a process, a method, an article or an apparatus including a series of elements includes not only those elements but also other elements not explicitly listed or inherent to such process, method, article or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
Finally, it should be noted that: it should be understood that the above examples are only for clearly illustrating the present invention and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious changes and modifications may be made without departing from the scope of the present invention.
Claims (10)
1. The utility model provides a test circuit for test display panel, display panel includes the display area and not the display area, the not display area includes virtual pixel, be connected with virtual data line on the virtual pixel, its characterized in that, test circuit includes:
the test pads are configured in the non-display area and used for receiving or sending a plurality of test signals;
a plurality of test lines connected to the test pads for transmitting at least one of the plurality of test signals to or from the display panel;
wherein the dummy data line is the test line.
2. The test circuit of claim 1, wherein the display area comprises a pixel array comprising:
a plurality of scanning lines, a plurality of data lines intersecting the scanning lines in an insulated manner, the data lines and the scanning lines defining a plurality of pixel units,
the plurality of data lines provide a plurality of source driving signals to the pixel units, and the plurality of scanning lines provide a plurality of gate driving signals to the pixel units.
3. The test circuit of claim 2, wherein the non-display area further comprises:
the grid driving chip is connected with the scanning line and used for providing the grid driving signal;
and the source electrode driving chip is connected with the data line and is used for providing the source electrode driving signal.
4. The test circuit of claim 2, wherein the plurality of scan lines each have an insulating intersection region with the test line in the non-display region.
5. The test circuit of claim 2, wherein the test line is connected to any of the scan lines for testing a signal output of the scan line.
6. The test circuit of claim 5, wherein the test line is connected to any of the scan lines by soldering an insulated intersection region of any of the scan lines and the test line.
7. The test circuit of claim 2, wherein the display panel further comprises:
and the repairing lines are parallel to the scanning lines and arranged in the non-display area, and the repairing lines respectively have insulating intersection areas with the data lines and the testing lines.
8. The test circuit of claim 7, wherein any of the data lines is connected to the test line and the repair line for testing a signal output of the data line.
9. The test circuit of claim 8, wherein the test line is connected to the repair line simultaneously with any of the data lines by soldering the insulated intersection regions of any of the data lines to the test line and the repair line, respectively.
10. A display device, comprising:
a display panel comprising the test circuit of any one of claims 1 to 9; and
and the backlight module is used for providing brightness for the display panel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020201144.4U CN211237679U (en) | 2020-02-24 | 2020-02-24 | Test circuit and display device thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020201144.4U CN211237679U (en) | 2020-02-24 | 2020-02-24 | Test circuit and display device thereof |
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| CN211237679U true CN211237679U (en) | 2020-08-11 |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112331115A (en) * | 2020-11-05 | 2021-02-05 | 北海惠科光电技术有限公司 | Liquid crystal panel and GOA circuit detection method of liquid crystal panel |
| CN112349230A (en) * | 2020-12-04 | 2021-02-09 | 厦门天马微电子有限公司 | Display panel, detection method thereof and display device |
| CN112859401A (en) * | 2021-03-12 | 2021-05-28 | 福州京东方光电科技有限公司 | Display substrate, detection method thereof and display device |
| CN112882263A (en) * | 2021-03-11 | 2021-06-01 | 深圳市华星光电半导体显示技术有限公司 | Display panel and display device |
| WO2023159479A1 (en) * | 2022-02-25 | 2023-08-31 | 京东方科技集团股份有限公司 | Display substrate, test method therefor, and display apparatus |
-
2020
- 2020-02-24 CN CN202020201144.4U patent/CN211237679U/en active Active
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112331115A (en) * | 2020-11-05 | 2021-02-05 | 北海惠科光电技术有限公司 | Liquid crystal panel and GOA circuit detection method of liquid crystal panel |
| CN112349230A (en) * | 2020-12-04 | 2021-02-09 | 厦门天马微电子有限公司 | Display panel, detection method thereof and display device |
| US11749179B2 (en) | 2020-12-04 | 2023-09-05 | Xiamen Tianma Micro-Electronics Co., Ltd. | Display panel, detection method thereof and display device |
| CN112882263A (en) * | 2021-03-11 | 2021-06-01 | 深圳市华星光电半导体显示技术有限公司 | Display panel and display device |
| CN112859401A (en) * | 2021-03-12 | 2021-05-28 | 福州京东方光电科技有限公司 | Display substrate, detection method thereof and display device |
| WO2023159479A1 (en) * | 2022-02-25 | 2023-08-31 | 京东方科技集团股份有限公司 | Display substrate, test method therefor, and display apparatus |
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