CN112834965A - Automatic tester for satellite electric interface - Google Patents

Automatic tester for satellite electric interface Download PDF

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Publication number
CN112834965A
CN112834965A CN202011631276.1A CN202011631276A CN112834965A CN 112834965 A CN112834965 A CN 112834965A CN 202011631276 A CN202011631276 A CN 202011631276A CN 112834965 A CN112834965 A CN 112834965A
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China
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nth
bus
connector
switch
tested
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CN202011631276.1A
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CN112834965B (en
Inventor
李光
龚文斌
刘会杰
任前义
汪灏
潘晓彤
宋彬
董日昌
陆新颖
邵丰伟
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Shanghai Engineering Center for Microsatellites
Innovation Academy for Microsatellites of CAS
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Shanghai Engineering Center for Microsatellites
Innovation Academy for Microsatellites of CAS
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Priority to CN202011631276.1A priority Critical patent/CN112834965B/en
Priority to CN202111192773.0A priority patent/CN113933566B/en
Publication of CN112834965A publication Critical patent/CN112834965A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/18Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R21/00Arrangements for measuring electric power or power factor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02GINSTALLATION OF ELECTRIC CABLES OR LINES, OR OF COMBINED OPTICAL AND ELECTRIC CABLES OR LINES
    • H02G3/00Installations of electric cables or lines or protective tubing therefor in or on buildings, equivalent structures or vehicles
    • H02G3/02Details
    • H02G3/08Distribution boxes; Connection or junction boxes
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02GINSTALLATION OF ELECTRIC CABLES OR LINES, OR OF COMBINED OPTICAL AND ELECTRIC CABLES OR LINES
    • H02G3/00Installations of electric cables or lines or protective tubing therefor in or on buildings, equivalent structures or vehicles
    • H02G3/02Details
    • H02G3/08Distribution boxes; Connection or junction boxes
    • H02G3/16Distribution boxes; Connection or junction boxes structurally associated with support for line-connecting terminals within the box
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Abstract

The invention provides an automatic testing device for a satellite electrical interface, which comprises: programmable junction box, including at least one connector, at least one multiplexer switch, at least one bus and at least one interface under test, wherein: the connector is configured to be connected between the single machine to be tested and the multi-way selection switch; the multiple multi-way selection switches comprise multiple paths, and each path is connected with a corresponding bus so as to be connected to a corresponding tested interface; the signal of the tested single machine is provided to the data acquisition module through the connector, the multi-path selection switch, the bus and the tested interface in sequence; and the control analysis module provides a remote control instruction for the multi-way selection switch according to the requirement of the test case of the user so as to control the on-off of the channel of the multi-way selection switch.

Description

Automatic tester for satellite electric interface
Technical Field
The invention relates to the technical field of satellite batch production, in particular to an automatic testing device for a satellite electrical interface.
Background
At present, competition of each country for space resources is more and more intense, each country strives to develop a satellite constellation construction plan with a large scale, and SpaceX company provides a low-orbit communication constellation containing 4.2 ten thousand satellites. China also develops the construction of remote measuring, navigation and communication satellite constellations. With the increasing scale of satellite constellations, the requirement on the satellite development cycle is shorter and shorter, and the requirement on the satellite automatic test is higher and higher.
The electrical interface test is one of the important links of the satellite test, determines whether the electrical performance of each single machine accords with the design and whether the electrical interfaces are matched with each other, and only the single machine passing the verification of the interface test can complete the subsequent AIT test along with the whole satellite. The test items of the electrical interface test include: the method comprises the following steps of single machine power supply voltage testing, power testing, surge testing, ripple testing, bus interface testing and the like.
However, the conventional electrical interface test has low test efficiency, and cannot meet the requirements of mass production and test of satellites in the future.
Disclosure of Invention
The invention aims to provide an automatic testing device for a satellite electrical interface, which aims to solve the problems that the existing traditional testing method is low in testing efficiency and cannot meet the requirements of mass production and testing of satellites in the future.
In order to solve the above technical problem, the present invention provides an automatic testing apparatus for a satellite electrical interface, comprising:
programmable junction box, including at least one connector, at least one multiplexer switch, at least one bus and at least one interface under test, wherein:
the connector is configured to be connected between the single machine to be tested and the multi-way selection switch;
the multiple multi-way selection switches comprise multiple paths, and each path is connected with a corresponding bus so as to be connected to a corresponding tested interface;
the signal of the tested single machine is provided to the data acquisition module through the connector, the multi-path selection switch, the bus and the tested interface in sequence;
and the control analysis module provides a remote control instruction for the multi-way selection switch according to the requirement of the test case of the user so as to control the on-off of the channel of the multi-way selection switch.
Optionally, in the automatic satellite electrical interface testing device, the number of the tested interfaces is 3, and the number of the buses is 3; each multi-way selection switch comprises 4 paths, wherein 3 paths are respectively connected with 3 buses, and the other path is suspended;
the connector comprises a plurality of nodes, and each node is connected to the tested interface through a multi-way selection switch.
Optionally, in the automatic testing apparatus for a satellite electrical interface, the connectors include at least one main connector and at least one sub-connector, wherein:
the first single machine is connected with a plurality of the main connectors, and the second single machines are respectively connected with one auxiliary connector.
Optionally, in the automatic satellite electrical interface testing device, the nth node of the first main connector is connected to the 1 st to nth multiple-way selection switches;
the nth node of the first auxiliary connector assembly is connected to the nth node of the first main connector assembly through a 1-nth fusing switch;
the nth node of the nth main connector is connected to the nth-nth multi-way selection switch;
the nth node of the nth auxiliary connector is connected to the nth node of the nth main connector through an nth-nth fusing switch;
wherein n is a positive integer.
Optionally, in the automatic satellite electrical interface testing device, the bus includes a first bus, a second bus and a third bus;
the first bus and the second bus measure voltage quantity;
the first bus is directly connected with the first tested interface so that the first tested interface directly provides the voltage measured by the first bus to the data acquisition module;
the second bus is directly connected with the second tested interface, so that the second tested interface directly provides the voltage measured by the second bus to the data acquisition module.
Optionally, in the automatic satellite electrical interface testing device,
the third bus carries out non-inductive measurement of current through a Hall sensor;
the nth node of the first auxiliary connector is connected to the third bus through the 1 st-nth detection switch;
the nth node of the nth auxiliary connector is connected to the third bus through the nth-nth detection switch;
the Hall sensor is directly sleeved on the third bus;
the third tested interface is connected with a signal end of the Hall sensor, so that the third tested interface directly provides the current measured by the Hall sensor to the data acquisition module.
Optionally, in the automatic satellite electrical interface testing device,
the 1 st-nth fusing switch and the 1 st-nth detection switch are integrated into a first single-pole double-throw switch;
the n-th fusing switch and the n-th detection switch are integrated into an n-th single-pole double-throw switch.
Optionally, in the automatic satellite electrical interface testing device,
the gear of at least one multi-way selector switch is switched to a third path, so that the first single machine is connected with a third bus through the nth node of the nth main connector;
the gear of at least one nth single-pole double-throw switch is switched to a lower gear, so that the nth fusing switch is disconnected, and the nth detection switch is connected;
the second single machine is connected with a third bus through an nth node of an nth auxiliary connector;
the third interface under test provides the current measured by the hall sensor to the data acquisition system.
Optionally, in the automatic satellite electrical interface testing device,
the main connector is connected with the multi-path selection switch through a lead on the PCB;
the multi-path selection switch is connected with the bus through a lead on the PCB;
the lengths of the through wires on the PCB board between the corresponding main connector and the corresponding auxiliary connector are the same.
The inventor finds that in the traditional electrical interface test, the electrical interface signal to be tested is transmitted to the test instruments such as an oscilloscope and a universal meter through a three-way cable, and then the test data is read by the operation of the test instruments performed by a tester. This method has the following problems: 1) each link needs to be plugged and unplugged manually, so that potential safety hazards exist; 2) the test can not be automated and the efficiency is low; 3) the test standards are not uniform, and the data consistency is poor. Therefore, the conventional electrical interface testing method cannot meet the requirements of the electrical interface testing of the mass-produced satellites on automation, mass production and standardization, and research on the electrical interface automation testing of the mass-produced satellites is urgently needed.
Based on the above insights, the invention provides an automatic testing device for a satellite electrical interface, wherein a connector of a programmable junction box is connected between a single machine to be tested and a multi-way selection switch, each passage of the multi-way selection switch is connected with a corresponding bus so as to be connected to the corresponding tested interface, signals of the single machine to be tested are sequentially provided to a data acquisition module through the connector, the multi-way selection switch, the bus and the tested interface, the programmable junction box has the capability of gating a node to be tested to the data acquisition module, a remote control instruction is provided to the multi-way selection switch through a control analysis module according to the requirement of a test case of a user so as to control the on-off of the passages of the multi-way selection switch, and the gating of the node can be controlled through the remote instruction.
The design of the program-controlled junction box is one of important links for completing automatic testing of the automatic testing system of the satellite electrical interface, and the quality of the design of the program-controlled junction box is directly related to the degree of automation of the satellite electrical interface. Compared with the traditional junction box, the program-controlled junction box has the following advantages by adopting the technical means:
can be remotely controlled. The programmable junction box can control the gating of the switch through software, thereby providing a foundation for automatic testing.
The measuring range is wide. The junction box can not only finish the measurement of voltage quantity, but also can perform non-inductive measurement of current through the Hall sensor, and one junction box can finish one-stop measurement of voltage and current.
The volume is small. The connection of the program control junction box is based on the design of a PCB board, the volume of the junction box can be reduced, and a larger space is provided for testing.
Drawings
FIG. 1 is a schematic diagram of an automatic test apparatus (system) for a satellite electrical interface according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of an automatic testing apparatus for a satellite electrical interface according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of an automated testing process for a satellite electrical interface according to one embodiment of the present invention;
shown in the figure: 10-program controlled junction box; 11-a gating module; 20-a data acquisition module; 30-control the analysis module.
Detailed Description
The automatic testing device for satellite electrical interface according to the present invention will be described in detail with reference to the accompanying drawings and specific embodiments. Advantages and features of the present invention will become apparent from the following description and from the claims. It is to be noted that the drawings are in a very simplified form and are not to precise scale, which is merely for the purpose of facilitating and distinctly claiming the embodiments of the present invention.
Furthermore, features from different embodiments of the invention may be combined with each other, unless otherwise indicated. For example, a feature of the second embodiment may be substituted for a corresponding or functionally equivalent or similar feature of the first embodiment, and the resulting embodiments are likewise within the scope of the disclosure or recitation of the present application.
The core idea of the invention is to provide an automatic testing device for a satellite electrical interface, so as to solve the problems that the existing traditional testing method is low in testing efficiency and cannot meet the requirements of mass production and testing of satellites in the future.
In order to realize the idea, the invention provides an automatic testing device for a satellite electrical interface, which comprises: programmable junction box, including at least one connector, at least one multiplexer switch, at least one bus and at least one interface under test, wherein: the connector is configured to be connected between the single machine to be tested and the multi-way selection switch; the multiple multi-way selection switches comprise multiple paths, and each path is connected with a corresponding bus so as to be connected to a corresponding tested interface; the signal of the tested single machine is provided to the data acquisition module through the connector, the multi-path selection switch, the bus and the tested interface in sequence; and the control analysis module provides a remote control instruction for the multi-way selection switch according to the requirement of the test case of the user so as to control the on-off of the channel of the multi-way selection switch.
The present embodiment provides an automatic testing apparatus for a satellite electrical interface, as shown in fig. 1 to 2, including: programmable junction box 10 comprising at least one connector, at least one multiplexing switch (S1-n, … Sn-n), at least one bus and at least one tested interface, wherein: the connector is configured to connect between a tested single machine (single machine 1, … single machine n) and a multi-way selection switch; the multiple multi-way selection switches comprise multiple paths, and each path is connected with a corresponding bus so as to be connected to a corresponding tested interface; the signal of the tested single machine is provided to the data acquisition module 20 through the connector, the multi-way selection switch, the bus and the tested interface in sequence; the control analysis module 30 provides a remote control instruction to the multi-way selector switch according to the requirement of the test case of the user so as to control the on-off of the channel of the multi-way selector switch.
In an embodiment of the present invention, in the automatic satellite electrical interface testing apparatus, the number of the interfaces to be tested is 3 (including the interface to be tested 1, the interface to be tested 2, and the interface to be tested 3, that is, the first interface to be tested, the second interface to be tested, and the third interface to be tested, respectively), and the number of the buses is 3 (including the first bus 11, the second bus 12, and the third bus 13); each multi-way selection switch comprises 4 paths, wherein 3 paths are respectively connected with 3 buses, and the other path is suspended; the connector comprises a plurality of nodes, and each node is connected to the tested interface through a multi-way selection switch.
In an embodiment of the present invention, in the automatic testing apparatus for a satellite electrical interface, the connectors include at least one main connector (including a main connector 1, … and a main connector n) and at least one sub-connector (including a sub-connector 1, … and a sub-connector n), and the connection and disconnection between the main connector and the sub-connector are selected according to the testing requirement, wherein: the first stand-alone (i.e., stand-alone 1) is connected to a plurality of the main connectors, and the second stand-alone (i.e., stand-alone 2, … stand-alone n) is connected to one sub-connector.
In one embodiment of the invention, in the automatic testing device for the satellite electrical interface, the nth node of the first main connector is connected to the 1 st to nth multiplexing switches; the nth node of the first auxiliary connector is connected to the nth node of the first main connector through a 1-nth fusing switch K1; … the nth node of the nth main connector is connected to the nth-nth multiplexing switch; the nth node of the nth auxiliary connector is connected to the nth node of the nth main connector through an nth-nth fusing switch; wherein n is a positive integer.
In one embodiment of the present invention, in the automatic satellite electrical interface testing device, the bus comprises a first bus 11, a second bus 12 and a third bus 13; the first bus and the second bus measure voltage quantity; the first bus is directly connected with the first tested interface so that the first tested interface directly provides the voltage measured by the first bus to the data acquisition module; the second bus is directly connected with the second tested interface, so that the second tested interface directly provides the voltage measured by the second bus to the data acquisition module.
The automatic testing device for the satellite electrical interface further comprises a Hall sensor 14, and the third bus 13 carries out non-inductive measurement on current through the Hall sensor 14; the nth node of the first auxiliary connector is connected to the third bus through the 1 st-nth detection switch; … the nth node of the nth sub-connector is connected to the third bus 13 through the nth-nth detection switch; the hall sensor 14 is directly sleeved on the third bus 13; the third interface to be tested is connected to the signal terminal of the hall sensor 14, so that the third interface to be tested directly provides the current measured by the hall sensor 14 to the data acquisition module 20.
In one embodiment of the present invention, in the automatic test device for a satellite electrical interface, the 1 st-nth fuse switch K1 and the 1 st-nth detection switch K2 are integrated into a first single-pole double-throw switch; … the n-th fusing switch and the n-th detecting switch are integrated into an n-th single-pole double-throw switch.
In one embodiment of the present invention, in the automatic satellite electrical interface testing device, the gear of at least one multi-way selector switch is switched to the third path, so that the first single machine is connected to the third bus 13 through the nth node of the nth main connector; the gear of at least one nth single-pole double-throw switch is switched to a lower gear, so that the nth fusing switch is disconnected, and the nth detection switch is connected; the second single machine is connected with a third bus through an nth node of an nth auxiliary connector; the third interface under test provides the current measured by the hall sensor to the data acquisition system 20.
In one embodiment of the invention, in the automatic testing device for the satellite electrical interface, a main connector is connected with a multi-way selection switch through a lead on a PCB; the multi-path selection switch is connected with the bus through a lead on the PCB; the lengths of the through wires on the PCB board between the corresponding main connector and the corresponding auxiliary connector are the same.
The automatic testing device for the satellite electrical interface provided by the invention is characterized in that a tested single machine and a multi-way selection switch are connected through a connector of a program-controlled junction box, each passage of the multi-way selection switch is connected with a corresponding bus so as to be connected to the corresponding tested interface, signals of the tested single machine are sequentially provided to a data acquisition module through the connector, the multi-way selection switch, the bus and the tested interface, the program-controlled junction box has the capability of gating a node to be tested to the data acquisition module, a remote control instruction is provided to the multi-way selection switch through a control analysis module according to the requirement of a test case of a user so as to control the on-off of the passages of the multi-way selection switch, and the gating of the node can be controlled through the remote instruction.
The design of the program-controlled junction box is one of important links for completing automatic testing of the automatic testing system of the satellite electrical interface, and the quality of the design of the program-controlled junction box is directly related to the degree of automation of the satellite electrical interface. Compared with the traditional junction box, the program-controlled junction box has the following advantages by adopting the technical means:
can be remotely controlled. The programmable junction box can control the gating of the switch through software, thereby providing a foundation for automatic testing.
The measuring range is wide. The junction box can not only finish the measurement of voltage quantity, but also can perform non-inductive measurement of current through the Hall sensor, and one junction box can finish one-stop measurement of voltage and current.
The volume is small. The connection of the program control junction box is based on the design of a PCB board, the volume of the junction box can be reduced, and a larger space is provided for testing.
The programmable junction box needs to have two functions at the same time: 1) the function of direct connection of signals and the tested single machine is achieved, and power supply, 422 signal transmission and the like of the tested single machine are completed; 2) the program-controlled junction box has the capability of gating the node to be tested to the data acquisition system, and the gating of the node can be controlled through a remote instruction.
The schematic diagram of the programmable junction box is shown in fig. 1, and the programmable junction box consists of a main connector, a spare connector and a tested interface. The main connector and the auxiliary connector are the same type of connector. The main connector and the auxiliary connector are connected with the single satellite through cables, and point-to-point direct connection is carried out between the main connector and the auxiliary connector.
Meanwhile, the main connector is connected with 4 paths of tested interfaces (which can be changed according to requirements) through a multi-way selection switch. The multi-way selection switch can select any one of the 4 points to be switched on or switched off according to instructions.
Since a satellite's junction box may need to contain dozens of different types of connectors (depending on the design of the satellite), each connector may contain a different number of nodes, and many may contain more than 100 nodes. In order to avoid the need of manual plugging operation in the test process and ensure the automation principle of test node gating, each node of each connector assembly needs to be connected with a bus of a tested node through a multi-way selection switch. The matrix switch design of the junction box will be very large and complex.
The tested interface of the junction box only reserves 3 interfaces in consideration of items for guaranteeing miniaturization and electrical interface testing of the junction box. In order to avoid complex wiring, a PCB board is considered for connection of the junction box cable and control of the multi-way switch. The main connector and the auxiliary connector are connected through a switch with a fuse, the main connector is connected with the multi-way selection switch through a lead on a PCB, then the multi-way selection switch is connected with buses of the interfaces to be tested 1, 2 and 3 through the lead on the PCB, wherein the interfaces No. 1 and No. 2 are used for measuring voltage signals, and the port No. 3 is used for measuring current quantity. In order to ensure the consistency of signal transmission time sequence, the lengths of through wires on the PCB between the corresponding main connector and the corresponding auxiliary connector are consistent. The cable connection of the programmable junction box is shown in fig. 2.
In order to measure the current conveniently, a Hall current measuring device is adopted in the design, and the current is measured through electromagnetic induction. When current measurement is carried out, the gating switch between the main connector and the auxiliary connector is disconnected, the switch of the main connector selects the No. 3 port, and meanwhile the corresponding switch of the No. 3 bus is communicated with the auxiliary connector. The method can be used for measuring the steady-state current, the surge current and the like of the single machine without inductance.
The present embodiment further provides an automated testing system for a satellite electrical interface, as shown in fig. 1, including: the programmable junction box 10 is configured to gate the test node according to the remote control instruction, so as to provide the tested signal to the data acquisition module 20; the data acquisition module 20 is configured to perform analog-to-digital conversion on the tested signal to form test data, so that the test data can be provided to the control analysis module 30 and can be stored; and a control analysis module 30 configured to perform analysis processing of the test data according to the test items.
In an embodiment of the present invention, the control analysis module 30 is further configured to perform out-of-tolerance data alarm of the test data according to the test items.
In one embodiment of the present invention, the control analysis module 30 is further configured to automatically generate a test report according to the test item.
In one embodiment of the present invention, the control analysis module 30 is further configured to send a remote control command to the programmable junction box 10 according to the test item.
In an embodiment of the present invention, in the automatic test system for a satellite electrical interface, the control analysis module 30 includes a control module and a data analysis module, wherein: the control module configured to perform the following actions: receiving a test case of a user; automatically generating test items and test sequences according to the test cases; and controlling the test according to the test items and the test sequence; the data analysis module configured to perform the following actions: and analyzing the test data according to the requirements of the test items.
Specifically, in the automatic test system for a satellite electrical interface, as shown in fig. 3, the control module automatically generates a test report template according to a test item, and sends the type (i.e., test content) of the test item to the data analysis module; the control module acquires a test node according to the test report module and sends a remote control instruction to the program-controlled junction box 10 according to the test node for gating control; the control module acquires test data acquired by the data acquisition module 20 in unit test time (required by test project time period) and provides the test data to the data analysis module; the data analysis module analyzes the test data according to the requirements of the test items and then sends the test results to the control module; and the control module generates a test report according to the test result.
In an embodiment of the present invention, in the automatic test system for a satellite electrical interface, the programmed junction box 10 includes a stand-alone interface (including main connectors 1 to n and sub connectors 1 to n), a collection interface (including test point 1, test point 2 and test point 3), a gating module 11, a power supply interface, a network interface (i.e. a network interface in fig. 1), and the like, where: the single machine interface is used for being communicated with a single machine to be tested; the acquisition interface is used for communicating with the data acquisition module 20; the gating module 11 is used for generating a gating signal according to a remote control instruction so as to communicate the single-machine interface with the acquisition interface; and the power supply interface is used for providing a power supply for the program control circuit box.
In an embodiment of the present invention, in the automatic test system for a satellite electrical interface, the data acquisition module 20 and the control analysis module 30 are integrated in an industrial personal computer, and the data acquisition module 20 and the control analysis module 30 perform instruction interaction and data interaction through a PXIe bus; the industrial personal computer is connected with the program control junction box through a network port. The control analysis module is provided with a human-computer interaction interface and can receive user instructions through the human-computer interaction interface.
In an embodiment of the present invention, in the automatic test system for a satellite electrical interface, the data acquisition module 20 performs analog-to-digital conversion on the signal under test to form test data, so as to provide the test data to the control analysis module 30 includes: the data acquisition module 20 performs signal acquisition and analog-to-digital conversion on the voltage signal of 0 to +100V to form a digital signal, and then transmits the digital signal to the control analysis module 30.
According to the automatic testing system for the satellite electrical interface, the programmable junction box 10 is used for gating the testing nodes according to the remote control instruction, so that the remote control on-off of the testing interfaces is realized, and potential safety hazards caused by manual cable plugging in and out in the testing link are avoided; the data acquisition module 20 performs analog-to-digital conversion on the tested signal to form test data, and the analysis module 30 is controlled to analyze and process the test data according to the test items, so that the automation of the test process is realized, and the efficiency of the whole test process is improved; furthermore, all tests are performed by performing analog-to-digital conversion on the tested signals through the data acquisition module 20 to form test data, so that the test standards are unified, and the test data has higher consistency.
Therefore, the automatic test system for the satellite electrical interface provided by the invention can meet the requirements of the electrical interface test of mass production satellites on automation, mass production and standardization.
The invention provides a satellite electrical interface automatic test system, which utilizes a program control junction box 10 with a switch gating control function to carry out electrical interface signal gating control, utilizes an acquisition board card of the national instruments limited company in America as a data acquisition module 20 to complete analog-to-digital conversion, acquisition and storage of signals, and utilizes a control analysis module 30 to complete measurement, analysis and automatic generation of test reports of voltage, power, surge, ripple waves and the like of signals to be tested. The method has the following technical advantages:
the test is safer. The gating of the program-controlled junction box 10 is remotely controlled through software, so that potential safety hazards caused by operations such as cable plugging and unplugging in the testing process can be avoided;
the testing efficiency is high. The test can be automatically carried out according to the test case, and the capability of automatic data analysis and automatic report generation is provided.
The expansion capability is strong. When the system is designed, a control mode of a network port is adopted, the data acquisition module 20 reserves an external synchronous interface, the control analysis module 30 reserves an external instruction interface and can be configured into a dynamic link library in a DLL (delay locked loop) form, and the system can be conveniently and subsequently integrated into an automatic test system of the whole satellite as a module.
The invention carries out detailed scheme design on the automatic test system of the electrical interface of the batch production satellite aiming at the requirements of automatic test capability, autonomous data analysis capability and modularized integration capability.
The automatic test system of the electrical interface is composed of a program control junction box 10, a data acquisition module 20 and a control analysis module 30. The programmable junction box 10 can complete the gating function of the tested node according to the instruction. The data acquisition module 20 performs analog-to-digital conversion and data storage of the detected signal. The control analysis module 30 may complete analysis processing of collected data, out-of-tolerance data warning, automatic report generation, and the like according to the item to be tested.
The design of the program-controlled junction box 10 is one of the important links for the automatic testing system of the electrical interface to complete the automatic testing, and the quality of the design of the program-controlled junction box 10 is directly related to the degree of the automation of the electrical interface. The programmable junction box 10 needs to have two functions: 1) the function of direct connection of signals and the tested single machine is achieved, and power supply, 422 signal transmission and the like of the tested single machine are completed; 2) the programmable junction box 10 has the capability of gating the node to be tested to the data acquisition module 20, and the gating of the node can be controlled through a remote instruction. Aiming at the functional requirements and miniaturization of the junction box, the programmable junction box 10 based on the PCB is designed, and the gating of the switch of the programmable junction box 10 can be controlled through a network port.
The data acquisition module 20 mainly functions to convert the 0- +100V voltage signal into a digital signal after signal acquisition and a/D conversion, and then transmit the data to an upper computer. Through the model selection and comparative analysis of products, a PXIe-5164 acquisition board card of NI company is adopted to complete the data acquisition function of the automatic test system of the desktop electrical interface. The PXIe-5164 high-speed acquisition board card device is provided with two or four channels, the sampling rate is as high as 1GS/s, the sampling bit number can reach 14 bits, and the measurement requirements of high-speed and sensitive surge current and the like can be met. Meanwhile, the board card provides flexible coupling, voltage range and filtering setting, the measurement voltage range can reach 100V, and the measurement requirement of satellite voltage signals is met. The acquisition board card is integrated in an NI industrial personal computer (upper computer), and can conveniently interact with the control analysis module 30 through a PXIe bus to perform instructions and data.
The control analysis module 30 runs in an industrial personal computer of NI, receives a user command through a human-computer interaction interface, performs data interaction with the data acquisition module 20 through PXIe, and performs command control on the program control junction box 10 through a network interface.
In summary, the above embodiments have described the different configurations of the automatic satellite electrical interface testing apparatus in detail, and it is understood that the present invention includes, but is not limited to, the configurations listed in the above embodiments, and any modifications made on the configurations provided in the above embodiments are within the scope of the present invention. One skilled in the art can take the contents of the above embodiments to take a counter-measure.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. For the system disclosed by the embodiment, the description is relatively simple because the system corresponds to the method disclosed by the embodiment, and the relevant points can be referred to the method part for description.
The above description is only for the purpose of describing the preferred embodiments of the present invention, and is not intended to limit the scope of the present invention, and any variations and modifications made by those skilled in the art based on the above disclosure are within the scope of the appended claims.

Claims (9)

1. An automatic test device for a satellite electrical interface, comprising:
programmable junction box, including at least one connector, at least one multiplexer switch, at least one bus and at least one interface under test, wherein:
the connector is configured to be connected between the single machine to be tested and the multi-way selection switch;
the multiple multi-way selection switches comprise multiple paths, and each path is connected with a corresponding bus so as to be connected to a corresponding tested interface;
the signal of the tested single machine is provided to the data acquisition module through the connector, the multi-path selection switch, the bus and the tested interface in sequence;
and the control analysis module provides a remote control instruction for the multi-way selection switch according to the requirement of the test case of the user so as to control the on-off of the channel of the multi-way selection switch.
2. The automatic satellite electrical interface testing device of claim 1, wherein the number of the tested interfaces is 3, and the number of the buses is 3; each multi-way selection switch comprises 4 paths, wherein 3 paths are respectively connected with 3 buses, and the other path is suspended;
the connector comprises a plurality of nodes, and each node is connected to the tested interface through a multi-way selection switch.
3. The automatic satellite electrical interface testing apparatus of claim 2 wherein the connectors include at least one primary connector and at least one secondary connector, wherein: the first single machine is connected with a plurality of the main connectors, and the second single machines are respectively connected with one auxiliary connector.
4. The automatic satellite electrical interface testing apparatus of claim 3 wherein the nth node of the first master connector is connected to the 1 st to nth multiplexing switches;
the nth node of the first auxiliary connector assembly is connected to the nth node of the first main connector assembly through a 1-nth fusing switch;
the nth node of the nth main connector is connected to the nth-nth multi-way selection switch;
the nth node of the nth auxiliary connector is connected to the nth node of the nth main connector through an nth-nth fusing switch;
wherein n is a positive integer.
5. The automatic satellite electrical interface testing apparatus of claim 4 wherein the bus comprises a first bus, a second bus, and a third bus;
the first bus and the second bus measure voltage quantity;
the first bus is directly connected with the first tested interface so that the first tested interface directly provides the voltage measured by the first bus to the data acquisition module;
the second bus is directly connected with the second tested interface, so that the second tested interface directly provides the voltage measured by the second bus to the data acquisition module.
6. The automatic satellite electrical interface testing apparatus of claim 5,
the third bus carries out non-inductive measurement of current through a Hall sensor;
the nth node of the first auxiliary connector is connected to the third bus through the 1 st-nth detection switch;
the nth node of the nth auxiliary connector is connected to the third bus through the nth-nth detection switch;
the Hall sensor is directly sleeved on the third bus;
the third tested interface is connected with a signal end of the Hall sensor, so that the third tested interface directly provides the current measured by the Hall sensor to the data acquisition module.
7. The automatic satellite electrical interface testing apparatus of claim 6,
the 1 st-nth fusing switch and the 1 st-nth detection switch are integrated into a first single-pole double-throw switch;
the n-th fusing switch and the n-th detection switch are integrated into an n-th single-pole double-throw switch.
8. The automatic satellite electrical interface testing apparatus of claim 7,
the gear of at least one multi-way selector switch is switched to a third path, so that the first single machine is connected with a third bus through the nth node of the nth main connector;
the gear of at least one nth single-pole double-throw switch is switched to a lower gear, so that the nth fusing switch is disconnected, and the nth detection switch is connected;
the second single machine is connected with a third bus through an nth node of an nth auxiliary connector;
the third interface under test provides the current measured by the hall sensor to the data acquisition system.
9. The automatic satellite electrical interface testing apparatus of claim 8,
the main connector is connected with the multi-path selection switch through a lead on the PCB;
the multi-path selection switch is connected with the bus through a lead on the PCB;
the lengths of the through wires on the PCB board between the corresponding main connector and the corresponding auxiliary connector are the same.
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