CN112729355A - Method for calibrating Raman light incidence angle suitable for atomic interferometer - Google Patents
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Abstract
The invention provides a method for calibrating a Raman light incidence angle suitable for an atomic interferometer, which comprises the following steps: scanning a frequency difference between Raman optical frequency and transition frequency of two ground state energy levels of atoms to obtain an atomic transition frequency spectrum of the Raman spectrum; and fitting the frequency difference between two opposite transition peaks in the atomic transition frequency spectrum, and calculating the angle between the Raman light and the atomic projection trajectory. The method for calibrating the incident angle of the Raman light, which is suitable for the atomic interferometer, provided by the embodiment of the invention does not need to use an external measuring instrument, only depends on the atomic interferometer system as an experimental tool, the operation process is greatly simplified, and meanwhile, the precision of the obtained angle value is higher due to a strict theoretical derivation formula.
Description
Technical Field
The invention relates to the technical field of atomic interferometers, in particular to a method for calibrating a Raman light incidence angle suitable for an atomic interferometer.
Background
Over the last two decades, atomic interferometer technology has been rapidly developed and widely used, because of its potentially high sensitivity and quantum properties, in the field of precision measurements, to perform measurements of rotation, acceleration, gravity gradients, fine structure constants, magnetic field gradients, gravitational constants, etc., while being used to examine some fundamental principles of physics. The method has important application prospects in the fields of basic scientific research, inertial navigation, gravity measurement, resource exploration, gravity-assisted navigation and the like.
The atom interferometer generally comprises several processes of cooling, polishing, interfering and detecting, and the series of actions of manipulating atoms are basically completed by laser, which requires that laser with different frequencies and powers be used in different time periods and has higher requirements on the propagation direction of light. The precision of the current variables related to the beam angle, such as the light propagation direction, the included angle between beams, the angle difference between the beams and the atom flight path, and the like in the atom interferometer is mainly ensured by a machining process of a mechanical structure. For an atom interferometer which is vertically thrown upwards, the measurement of the included angle between the propagation direction and the atom throwing track of the Raman light can be measured by optical adjusting instruments such as a theodolite, an autocollimator and the like through a corresponding angle measurement method. The method is technically mature, but is relatively inaccurate, needs experienced process adjustment personnel, is limited in operation space, and is easy to interfere and limit measurement work due to physical structures such as a cavity, a supporting structure and a magnetic shielding system of the experimental device.
Therefore, there is a need for a method for calibrating the incidence angle of raman light suitable for use in atomic interferometers to solve this problem.
Disclosure of Invention
The invention provides a method for calibrating a Raman light incidence angle suitable for an atomic interferometer, which can effectively calibrate an included angle between a Raman light incidence direction and a vertically projected atomic track and determine the gradient of Raman light and aims to solve the problems of low precision and complex operation in the prior art.
In a first aspect, an embodiment of the present invention provides a method for calibrating an incident angle of raman light suitable for an atomic interferometer, including:
scanning a frequency difference between Raman optical frequency and transition frequency of two ground state energy levels of atoms to obtain an atomic transition frequency spectrum of the Raman spectrum;
and fitting the frequency difference between two opposite transition peaks in the atomic transition frequency spectrum, and calculating the angle between the Raman light and the atomic projection trajectory.
Wherein before the scanning a frequency difference between the raman optical frequency and the transition frequency of the two ground state energy levels of the atom to obtain an atomic transition spectrum of the raman spectrum, the method further comprises:
the Raman light is generated by a Raman light laser through a sideband modulation technology or an optical phase-locked loop technology and is started when atoms fly through a Raman light irradiation area.
Wherein, the atoms are vertically thrown upwards, a cold atomic group is generated by a three-dimensional magneto-optical trap, and the atoms pass through the central area of the Raman light in the processes of vertical throwing upwards and free falling.
Wherein the quasi-fingers for the Raman light to be injected are inclined by a preset angle relative to the atom casting direction.
Wherein, for atoms with non-zero vertical velocity, the doppler detuning is:
wherein, ω isDIs the frequency detuning of light relative to atoms in the direction of raman light;is the integral average component velocity of the atomic group in the Raman light direction;is an effective raman wavevector; v. of0Is the initial velocity of the radical up-cast, corresponding to the time t being 0; g is the acceleration of gravity; t is the time at which the atom interacts with the raman light; θ is the angle between the raman light and the atom trajectory.
Wherein, fitting the frequency difference between two opposite transition peaks in the atomic transition spectrum, and calculating the angle between the Raman light and the atomic projection trajectory comprises:
scanning a Doppler peak after changing the frequency difference of the two beams of Raman light, wherein the momentum transfer from the laser to atoms is the largest at the Doppler peak;
and calculating the angle between the Raman light and the atom casting trajectory according to the Doppler detuning formula.
The method for calibrating the incident angle of the Raman light, which is suitable for the atomic interferometer, provided by the embodiment of the invention does not need to use an external measuring instrument, only depends on the atomic interferometer system as an experimental tool, the operation process is greatly simplified, and meanwhile, the precision of the obtained angle value is higher due to a strict theoretical derivation formula.
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In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and those skilled in the art can also obtain other drawings according to the drawings without creative efforts.
FIG. 1 is a schematic flow chart of a method for calibrating an incident angle of Raman light suitable for an atomic interferometer according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of the relative orientation of Raman light and radicals provided by an embodiment of the present invention;
fig. 3 is a diagram illustrating a doppler resonance peak obtained by scanning a frequency difference of a raman laser pair according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.
Fig. 1 is a schematic flow chart of a method for calibrating an incident angle of raman light suitable for an atomic interferometer according to an embodiment of the present invention, as shown in fig. 1, including:
101. scanning a frequency difference between Raman optical frequency and transition frequency of two ground state energy levels of atoms to obtain an atomic transition frequency spectrum of the Raman spectrum;
102. and fitting the frequency difference between two opposite transition peaks in the atomic transition frequency spectrum, and calculating the angle between the Raman light and the atomic projection trajectory.
Specifically, in step 101, by overscanning the frequency difference between the raman optical frequency and the transition frequency of the two ground state energy levels of the atom, an atomic transition spectrum called a raman spectrum can be obtained. The spectrum is generated by the optical and atomic doppler effect and generally includes three formants, the middle peak corresponding to a homodromous transition peak and the two peaks on either side corresponding to opposite transition peaks.
The angle between the raman light and the atom cast trajectory can then be calculated in step 102 by fitting the frequency difference between the two opposing transition peaks.
The method for calibrating the incident angle of the Raman light, which is suitable for the atomic interferometer, provided by the embodiment of the invention does not need to use an external measuring instrument, only depends on the atomic interferometer system as an experimental tool, the operation process is greatly simplified, and meanwhile, the precision of the obtained angle value is higher due to a strict theoretical derivation formula.
On the basis of the above embodiment, before obtaining an atomic transition spectrum of a raman spectrum by scanning a frequency difference between raman optical frequencies and atomic two ground state energy level transition frequencies, the method further includes:
the Raman light is generated by a Raman light laser through a sideband modulation technology or an optical phase-locked loop technology and is started when atoms fly through a Raman light irradiation area.
It should be noted that the environment for implementing the embodiment of the present invention includes a raman beam generated by a raman laser through a sideband modulation technique or an optical phase-locked loop technique, and vertically polished atoms, and the raman beam is turned on when the atoms fly through a raman light irradiation region.
On the basis of the above embodiment, the atoms are vertically thrown upwards, and the cold atomic groups generated by the three-dimensional magneto-optical trap pass through the central region of the raman light in the processes of vertical throwing upwards and free falling.
It should be noted that the environment of the embodiment of the present invention includes a raman beam and vertically upward-thrown atoms, the vertically upward-thrown atoms are cold atomic groups generated by a three-dimensional magneto-optical trap, and the vertical upward-thrown atoms pass through the central region of the raman beam during the process of vertical upward-throwing and free-falling.
On the basis of the above embodiment, the quasi-fingers into which the raman light is injected are inclined by a predetermined angle with respect to the atom casting direction.
FIG. 2 is a schematic diagram of the relative orientation of Raman light and atomic groups provided by an embodiment of the present invention, as shown in FIG. 2, two Raman lights are locked at a frequency ω1And ω2And the light is incident after being collimated by the Raman collimating head. The two beams are deflected in the same line and rotated by 90 ° by the λ/4 slide on the reflecting side. The incident and reflected beams do not interfere. Thus there are two counter-propagating pairs of Raman light with polarizations perpendicular to each other (L)in⊥Lin). That is, the total momentum transfer to the atom isBut in the opposite direction.
On the basis of the above-described embodiment, the raman quasi-fingers are tilted by a slight angle θ with respect to the atom casting direction, in order to eliminate degeneracy. For atoms with non-zero vertical velocity, the doppler detuning is:
wherein, ω isDIs the frequency detuning of light relative to atoms in the direction of raman light;is the integral average component velocity of the atomic group in the Raman light direction;is an effective raman wavevector; v. of0Is the initial velocity of the radical up-cast, corresponding to the time t being 0; g is the acceleration of gravity; t is the time at which the atom interacts with the raman light; θ is the angle between the raman light and the atom trajectory.
This depends on the relative alignment v of the atomic projectile velocities0And are andby varying the frequency difference of the two raman light beams, we can scan the doppler peak where the momentum transfer from the laser to the atoms is greatest.
On the basis of the above embodiment, the fitting a frequency difference between two opposite transition peaks in the atomic transition spectrum to calculate an angle between the raman light and the atomic projection trajectory includes:
scanning a Doppler peak after changing the frequency difference of the two beams of Raman light, wherein the momentum transfer from the laser to atoms is the largest at the Doppler peak;
and calculating the angle between the Raman light and the atom casting trajectory according to the Doppler detuning formula.
FIG. 3 is a schematic diagram of a Doppler resonance peak obtained by scanning a frequency difference of a Raman laser pair according to an embodiment of the present invention, as shown in FIG. 3, the Raman laser pairThe pulse lasts 21 mus. Over-scanning the frequency difference of the raman laser pair, two distinct peaks are observed, corresponding to + keffAnd-keff. The atoms were emitted vertically at 3.27 m/s. The time t to reach the second raman window is 245.23 ms. Combined formula, v ═ v0-gt 0.8667 m/s. In fig. 3, the frequency difference between the two peaks is 310KHz (line frequency). This is keffDetuning between. Using the above formula, θ is calculated to be 4.37 °.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (6)
1. A method for calibrating an angle of incidence of raman light for use in an atomic interferometer, comprising:
scanning a frequency difference between Raman optical frequency and transition frequency of two ground state energy levels of atoms to obtain an atomic transition frequency spectrum of the Raman spectrum;
and fitting the frequency difference between two opposite transition peaks in the atomic transition frequency spectrum, and calculating the angle between the Raman light and the atomic projection trajectory.
2. The method for calibrating incidence angle of raman light for use in an atomic interferometer according to claim 1, wherein before said sweeping raman light frequency is different from a frequency difference between transition frequencies of two ground state energy levels of an atom to obtain an atomic transition spectrum of the raman spectrum, said method further comprises:
the Raman light is generated by a Raman light laser through a sideband modulation technology or an optical phase-locked loop technology and is started when atoms fly through a Raman light irradiation area.
3. The method for calibrating incidence angle of raman light suitable for use in an atomic interferometer according to claim 2, wherein said atoms are vertically thrown upward by a three-dimensional magneto-optical trap to generate cold radicals, which pass through a central region of said raman light during vertical throwing upward and free-falling.
4. The method for calibrating incidence angle of Raman light suitable for use in atomic interferometer according to claim 3, wherein the quasi-fingers of the Raman light incidence are tilted by a predetermined angle with respect to the atom casting direction.
5. The method for calibrating the incidence angle of Raman light suitable for use in an atomic interferometer according to claim 4, wherein the Doppler detuning for atoms with non-zero vertical velocity is:
wherein, ω isDIs the frequency detuning of light relative to atoms in the direction of raman light;is the integral average component velocity of the atomic group in the Raman light direction;is an effective raman wavevector; v. of0Is the initial velocity of the radical up-cast, corresponding to the time t being 0; g is the acceleration of gravity; t is the time at which the atom interacts with the raman light; θ is the angle between the raman light and the atom trajectory.
6. The method for calibrating incidence angle of raman light suitable for use in atomic interferometers according to claim 5, wherein said fitting the frequency difference between two opposing transition peaks in said atomic transition spectrum to calculate the angle between raman light and the atomic projectile trajectory comprises:
scanning a Doppler peak after changing the frequency difference of the two beams of Raman light, wherein the momentum transfer from the laser to atoms is the largest at the Doppler peak;
and calculating the angle between the Raman light and the atom casting trajectory according to the Doppler detuning formula.
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