CN112362039B - Separation Raman laser type atomic interference gyro device and debugging method - Google Patents

Separation Raman laser type atomic interference gyro device and debugging method Download PDF

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CN112362039B
CN112362039B CN202011182802.0A CN202011182802A CN112362039B CN 112362039 B CN112362039 B CN 112362039B CN 202011182802 A CN202011182802 A CN 202011182802A CN 112362039 B CN112362039 B CN 112362039B
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raman laser
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CN112362039A (en
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姚战伟
陈红辉
鲁思滨
李润兵
余庚华
罗军
王谨
詹明生
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Institute of Precision Measurement Science and Technology Innovation of CAS
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Abstract

The invention discloses a separation Raman laser type atomic interference gyro device which comprises an atomic interference physical system, an alkali metal atomic source, laser cooling lasers, three Raman lasers and three reflectors matched with the three Raman lasers, a detection laser and a photoelectric detector. Meanwhile, the invention also discloses a method for debugging the separation Raman laser type atomic interferometry gyroscope, which can improve the phase measurement precision and simplify the debugging process of the large-area atomic interferometry. The invention can be used in the technical field of atomic inertial sensing and can improve the measurement sensitivity of an atomic interference gyroscope.

Description

Separation Raman laser type atomic interference gyro device and debugging method
Technical Field
The invention relates to the technical field of atomic inertial measurement, in particular to a method for debugging a separation Raman laser type atomic interferometry gyroscope and a separation Raman laser type atomic interferometry gyroscope device.
Background
The atomic interferometry gyroscope with high precision can be used in the fields of inertial navigation, geophysical measurement and the like. Similar to an optical gyroscope, the measurement accuracy of a cold atom interferometer is proportional to the interference area. Compared with an optical gyroscope, the atomic substance wave wavelength is shorter, the atomic velocity is lower, and the atomic interference gyroscope under the same loop area has higher rotation sensitivity. To improve the accuracy of atomic interferometers, atomic interferometers need to increase the loop area using a split raman laser. Limited by the finite coherence length of atoms, the raman laser direction in a split raman laser type atomic interferometer requires high precision adjustment to ensure the coherence of the atoms during measurement.
To achieve high precision angle adjustment of the split raman laser, t.l. gustavison et al (Precision Rotation Sensing Using Atom Interferometry, doctor article, university of stanford, 2000) adjusted the laser angle using a method of measuring the transition frequency. Tackmann et al (New Journal of Physics, volume 14, page 015002, 2012) adjust the parallelism of the split Raman lasers by maximizing the contrast of a symmetric lambda-bird interferometer. Subsequently, i.dutta et al (Physical Review Letters, volume 116, page 183003, 2016) achieved raman laser angle adjustment of four pulse configuration interferometers using methods of measuring transition frequencies and maximizing the contrast of the lambda-bode interferometer. In contrast, the angular accuracy of the method of measuring transition frequency is proportional to the atomic velocity, and for lower velocity atoms, the angular resolution of the method cannot achieve the accuracy required for atomic interference. Meanwhile, the measurement accuracy of the contrast maximization method is related to the size of the Raman light spot, and when the interference arm length is large relative to the size of the light spot, the measurement accuracy of the method is insufficient to realize accurate angle adjustment of the separated Raman laser.
Disclosure of Invention
The invention aims to provide a method for debugging a separation Raman laser type atomic interferometry gyroscope and a separation Raman laser type atomic interferometry gyroscope device, aiming at the problem that the measurement precision of the Raman laser angle in the existing separation Raman laser type atomic interferometry gyroscope is insufficient. According to the invention, the Raman laser angle is measured by utilizing the interference phase of the symmetrical lambda-bird interferometer, so that the measurement accuracy of the Raman laser angle can be improved. The phase measurement can achieve higher accuracy angle measurement than the transition frequency measurement method and the contrast measurement method. The invention can improve the interference loop area of the atomic interference gyroscope and can be applied to the fields of atomic inertial sensing technology and the like.
The above object of the present invention is achieved by the following technical solutions:
the separation Raman laser type atomic interference gyro device comprises an atomic interference physical system, wherein one end of the atomic interference physical system is a projection end, the other end of the atomic interference physical system is a light-emitting end, a first Raman laser, a second Raman laser and a third Raman laser are sequentially distributed from the projection end to the light-emitting end on one side of the atomic interference physical system, and a first reflecting mirror, a second reflecting mirror and a third reflecting mirror are sequentially distributed from the projection end to the light-emitting end on the other side of the atomic interference physical system;
the cooling laser is positioned at the projection end of the atomic interference physical system, the photoelectric detector is positioned at the light emitting end of the atomic interference physical system, and the detection laser is positioned at the light emitting end of the atomic interference physical system.
The method for debugging the separation Raman laser type atomic interference gyro comprises the following steps:
step 1, an alkali metal atom source moves along a predetermined atom projection track under the action of cooling laser;
step 2, defining i as the number of atom projection, j as serial numbers of different time intervals, and both initial values of i and j are 1;
step 3, performing ith atom projection, when alkali metal atoms of an alkali metal atom source pass through the positions of the first pair of Raman lasers, providing three pairs of laser pulses successively by the first pair of Raman lasers, wherein the time interval of the three pairs of laser pulses is t j ＝t 0 +(j-1)δt 0 ，t 0 For an initial time interval δt 0 The second pair of Raman lasers and the third pair of Raman lasers are turned off for time interval increment with different chirp rates alpha i ＝(i-1)×δα+α 0 Scanning the raman laser frequency difference δω, wherein δα is the chirp rate increment, α 0 For initial chirp rate, when alkali metal atoms of the alkali metal atom source reach the photodetector, the output signal P of the photodetector is recorded ji Fitting the interference fringes to obtain a signal at time interval t j Under the condition of (a), phase phi (alpha) j Linear function relation phi (alpha) with chirp rate alpha j ＝A j +B j X alpha; wherein A is j And B j Are fitting coefficients;
step 4, increasing i by 1, repeating step 3 until the current time interval t is traversed j Throwing all atoms below;
step 5, setting j to be increased by 1 and i to be 1, and returning to the step 3 until all the time intervals are traversed;
step 6, calculating A G q ＝(A (q-1) -A q )/(B q -B (q-1) ) Is recorded as alpha g Q is greater than or equal to 2 and less than or equal to the total number of time intervals;
step 7, performing the nth second interference time TS n Setting TS n ＝TS 0 ++ (n-1) x δTS, where TS 0 For the initial second interference time, n is the number of times set by the second interference time, the initial value of n is 1, delta TS is the increment of the second interference time, an X axis passes through the center of the first reflecting mirror, the positive direction of the X axis is parallel to the projection direction of the alkali atom projection direction on a horizontal plane, a Y axis passes through the center of the first reflecting mirror and is positioned on the horizontal plane and vertical to the X axis, the Z axis is vertical to the horizontal plane, r is the deflection number of the Y axis, and the initial value of r is 1;
from the initial state of the first Raman reflector, the first reflector is deflected for the r time by taking the Y axis as a rotating shaft, the deflection directions of each time are the same, and the deflection angle of each time is delta theta Y, wherein r is the deflection times of the Y axis; the second Raman laser is turned on, the second reflecting mirror is kept motionless, and the third Raman laser is turned off;
step 8, the frequencies of the first Raman laser and the second Raman laser are at the chirp rate alpha g The scanning is performed in such a way that,
under the action of cooling laser, the alkali metal atom source moves along a preset atom track, and the moment corresponding to the movement of the alkali metal atom to the optical axis of the first Raman laser is recorded as T ', and the moment corresponding to the movement of the alkali metal atom source to the optical axis of the second Raman laser is recorded as T';
at T' -TS n At the moment/2, emitting a first Raman laser pulse to split the alkali metal atom sources, wherein the alkali metal atom sources in the first ground state in the split alkali metal atom sources continue to move along a first path, and the alkali metal atoms in the second ground state in the split alkali metal atoms continue to move along a second path;
at T' +TS n At time/2, emitting a first Raman laser pulse to perform alkali metal atoms in a first path first ground stateTransition to the first path second ground state,
at T' -TS n At time/2, an initial phase difference phi is transmitted 0 The alkali metal atoms of the second ground state of the second path are transited to the first ground state of the second path by the second raman laser pulse;
step 9, at T "+TS n At time/2, the phase difference phi (r, TS) of the second Raman laser is adjusted n M) is phi 0 +m×δφ，φ 0 For the initial phase difference, the initial value of the circulation parameter m is 1, delta phi is the phase difference increment, the second Raman laser pulse is emitted, and the first ground state |321 of the second path is obtained>And the first path second ground state |312>Combining the beams, opening the detection laser and the photoelectric detector, and recording the output signals P (r, TS n ，m)；
Step 10, increasing m by 1, repeating steps 7-9 until all m are traversed, and obtaining the same Y-axis deflection times r and interference time TS n Under the condition of (1) the output signals P (r, TS n ，m)；
Step 11, outputting signals P (r, TS) to the photodetectors obtained in steps 7-10 n M) phase difference phi (r, TS) between the corresponding second Raman laser n M) to obtain the output signal P (r, TS) of the photodetector (103) n The phase difference phi (r, TS) of the second Raman laser when m) is 0 n )；
Step 12, increasing the Y-axis deflection times r by 1, repeating the steps 7-11 until all Y-axis deflection times are traversed, and obtaining a phase difference phi (r, TS) for the rxdelta theta Y n ) Fitting to obtain linear function phi (r, TS n )＝C n +D n X r x δθy, where n is the number of times set for the second interference time;
step 13, increasing n by 1, and repeating the steps 7-12 until n is traversed;
step 14, N is recorded as a second interference time TS n Calculating theta by setting total times k ＝(C (k+1) -C k )/(D k -D (k+1) ) Average value of k.epsilon {1 to (N-1) }, θ k The average value of (2) is recorded as Y-axis deflection angle theta 12y ；
Step 15, from the initial state of the first reflecting mirror, deflecting the first reflecting mirror by a Y-axis deflection angle theta along the deflection direction in step 7 by using the Y-axis as a rotation axis 12y The first reflecting mirror is positioned at the final state of Y-axis deflection adjustment,
the final state of Y-axis deflection adjustment of the first reflecting mirror is achieved, the first reflecting mirror is deflected for the w time by taking the X-axis as a rotating shaft, the deflection directions of each time are the same, the deflection angle of each time is delta theta X, w is the X-axis deflection times, the second Raman laser is turned on, the second reflecting mirror is kept motionless, and the third Raman laser is turned off;
selecting the TS set last time in the step 8 n Repeating step 8, at T "+TS n At time/2, the phase difference phi (w, TS) of the second Raman laser is adjusted n M 1) is phi 0 +m1×δφ, the initial value of the cycle parameter m1 is 1, a second Raman laser pulse is emitted, the alkali metal atoms of the first ground state of the second path and the second ground state of the first path are combined, the detection laser and the photodetector are turned on, and the output signal P (w, TS n ，m1)；
Step 16, m1 is increased by 1, step 15 is repeated until all m1 are traversed, and the same X-axis deflection times w and the same interference time TS are obtained n Under the condition of (1) different output signals P (w, TS n ，m1)；
Step 17, increasing the X-axis deflection times w by 1, repeating the steps 15-16 until all X-axis deflection times w are traversed, and performing sine fitting to obtain contrast C corresponding to different deflection angles w multiplied by delta theta X (w=1, 2,3,4, 5) w For C w Performing Gaussian fitting on the function of the angle w multiplied by delta theta X to obtain an angle corresponding to the center value of the Gaussian function, and recording the angle as the X-axis deflection angle theta 12x ；
From the final state of the Y-axis deflection adjustment of the first reflecting mirror, the first reflecting mirror is deflected by θ along the deflection direction in step 15 with the X-axis as the rotation axis 12x The first mirror is in a final yaw adjustment final state.
Compared with the prior art, the invention has the following beneficial effects:
the invention provides a method for measuring angles by utilizing interference phases, which can realize high-precision measurement and debugging of Raman laser angles in a long-arm interferometer, can be applied to the technical field of high-precision atomic inertial sensing, and improves the measurement precision of an atomic interference gyroscope.
Drawings
FIG. 1 is a split Raman laser type atomic interferometry gyro device;
FIG. 2 is a schematic diagram of a Raman laser driven atomic transition;
FIG. 3 is a timing diagram of a split Raman laser type atomic interferometer debug;
FIG. 4 is a diagram of a debugging method of the present invention;
in the figure: 100: atomic interferometry physical system, 101: cooling the laser, 102: detection laser, 103: photodetector, 104: alkali metal atom source, 105: atom projection trajectory, 201: first raman laser, 202: second raman laser, 203: third raman laser, 204: first raman reflected laser, 205: second raman reflected laser, 206: third raman reflected laser, 207: first mirror, 208: second mirror, 209: and a third mirror.
First ground state, |301>: second ground state, |302>: excited state, |304>: virtual energy level; 401 first laser frequency, 402 second laser frequency. 311 is that the first path is in the first ground state; i312:the first path second ground state; i322 > the second path second ground state; and 321:1, the second path is in the first ground state.
Detailed Description
The present invention will be further described in detail below in conjunction with the following examples, for the purpose of facilitating understanding and practicing the present invention by those of ordinary skill in the art, it being understood that the examples described herein are for the purpose of illustration and explanation only and are not intended to limit the invention.
In an embodiment, as shown in fig. 1, the separation raman laser type atomic interferometry gyro device includes an atomic interferometry system 100, wherein one end of the atomic interferometry system 100 is a projection end, the other end is a light-emitting end, a first raman laser 201, a second raman laser 202 and a third raman laser 203 are sequentially distributed from the projection end to the light-emitting end on one side of the atomic interferometry system 100, and a first reflecting mirror 207, a second reflecting mirror 208 and a third reflecting mirror 209 are sequentially distributed from the projection end to the light-emitting end on the other side of the atomic interferometry system 100;
the cooling laser 101 is located at the projection end of the atomic interferometry system 100, the photodetector 103 is located at the light-emitting end of the atomic interferometry system 100, and the detection laser 102 is located at the light-emitting end of the atomic interferometry system 100.
The separation Raman laser type atomic interferometry gyro device comprises an atomic interferometry physical system 100, an alkali metal atomic source 104, an atomic projection track 105, a cooling laser 101, three Raman lasers (201, 202, 203) and three reflectors (207, 208, 209) matched with the three Raman lasers, a detection laser 102 and a photoelectric detector 103. The atomic interferometry physical system 100 implements the vacuum environment required for atomic interferometry by vacuum techniques. The alkali metal atom source 104 implements the low temperature atoms required for atomic interference by laser cooling techniques. The alkali metal atoms are projected along the predetermined atom projection trajectory 105 at a fixed initial velocity by the laser. The three raman lasers (201, 202, 203) form three pairs of raman lasers (201 and 204, 202 and 205, 203 and 206) propagating in the forward and reverse directions by three mirrors (207, 208, 209). During the atomic projection process, the alkali metal atom source 104 sequentially acts with three pairs of raman lasers (201 and 204, 202 and 205, 203 and 206), as shown in fig. 2, the alkali metal atom source 104 can be in the first ground state |301>And a second ground state |302>The transition is reciprocated to obtain momentum, realize atomic beam splitting and the frequency difference delta omega = omega of the Raman laser 1 -ω 2 At a linear chirp rate to match the gravity induced doppler shift. When the alkali metal atom source 104 moves to the position of the detection light 102, the alkali metal atom source 104 and the photodetector 103 are turned on, and an atomic interference signal is recorded. Vacuum techniques and laser cooling techniques are generally general techniques and the present invention will not be described in detail.
The method for debugging the separation Raman laser type atomic interference gyro comprises the following steps:
step 1, an alkali metal atom source 104 moves along a preset atom track 105 under the action of a cooling laser 101. One end of the atomic interferometry physical system 100 is a projection end, the other end of the atomic interferometry physical system 100 is a light-emitting end, the first Raman laser 201, the second Raman laser 202 and the third Raman laser 203 are sequentially distributed outside the atomic interferometry physical system 100 from the projection end to the light-emitting end, the first Raman laser 201, the second Raman laser 202 and the third Raman laser 203 are adjusted to be initially perpendicular to a horizontal plane, then a first reflecting mirror 207 is adjusted to enable a first reverse Raman laser 204 to be parallel to the first Raman laser 201, and the first Raman laser 201 and the first reverse Raman laser 204 form a first pair of Raman lasers; adjusting the second mirror 208 such that the first reverse raman laser 205 is parallel to the first raman laser 202, the first raman laser 202 and the first reverse raman laser 205 comprising a second pair of raman lasers; adjusting the third mirror 209 such that the third reverse raman laser light 206 is parallel to the third raman laser light 203, the third raman laser light 203 and the third reverse raman laser light 206 constituting a third pair of raman laser light;
as shown in fig. 1, the right end of the atomic interferometry system 100 is taken as a light emitting end, an alkali metal atomic source 104 is thrown from the left end to the right end in the atomic interferometry system 100, a cooling laser 101 is positioned at the left end of the atomic interferometry system 100, a photoelectric detector 103 is positioned at the right end of the atomic interferometry system 100, a detection laser 102 is positioned at the right end of the atomic interferometry system 100, and a first pair of raman lasers to a third pair of raman lasers are sequentially distributed along the throwing end to the light emitting end of the atomic interferometry system 100;
step 2, defining i as the number of atom projection, j as the sequence numbers of different time intervals, wherein the initial values of i and j are 1, i epsilon {1,2,3,4,5}, j epsilon {1,2,3,4,5};
step 3, performing ith atom projection, when the alkali metal atoms of the alkali metal atom source 104 pass through the positions of the first pair of Raman lasers (201 and 204), providing three pairs of laser pulses successively by the first pair of Raman lasers (201 and 204), wherein the time interval of the three pairs of laser pulses is t j ＝t 0 +(j-1)δt 0 ，t 0 For an initial time interval δt 0 For time interval increment, the second pair of Raman lasers and the third pair of Raman lasers are turned off, and a Mach-Zehnder interferometer is constructed, and meanwhile, different chirp rates alpha are used i ＝(i-1)×δα+α 0 Scanning raman laser frequency difference δω, wherein δα isChirp rate increment, alpha 0 For initial chirp rate, when the alkali metal atoms of the alkali metal atom source 104 reach the photodetector 103, the output signal P of the photodetector 103 is recorded ji Fitting the interference fringes to obtain a signal at time interval t j Under the condition of (first interference time), phase phi (alpha) j Linear function relation phi (alpha) with chirp rate alpha j ＝A j +B j X alpha; wherein A is j And B j Are fitting coefficients.
Step 4, increasing i by 1, repeating step 3 until the current time interval t is traversed j Throwing all atoms below;
step 5, setting j to be increased by 1 and i to be 1, and returning to the step 3 until all the time intervals are traversed;
step 6, calculating A G q ＝(A (q-1) -A q )/(B q -B (q-1) ) (q=2, 3,4, 5), and the average value is denoted as α g Q is greater than or equal to 2 and less than or equal to the total number of time intervals;
step 7, performing the nth second interference time TS n Setting TS n ＝TS 0 ++ (n-1) x δTS, where TS 0 For the initial second interference time, n is the number of times set by the second interference time, the initial value of n is 1, and n∈ {1,2,3,4,5}; delta TS is a second interference time increment, an X axis passes through the center of the first reflecting mirror 207, the positive direction of the X axis is parallel to the projection direction of the alkali atom projection direction on a horizontal plane, a Y axis passes through the center of the first reflecting mirror 207 and is positioned on the horizontal plane and perpendicular to the X axis, a Z axis is perpendicular to the horizontal plane, r is the deflection times of the Y axis, and the initial value of r is 1.
From the initial state of the first raman mirror, the first mirror 207 is deflected for the r-th time by taking the Y-axis as a rotation axis, the direction of each deflection is the same, and the angle of each deflection is δθy, where r is the number of times of Y-axis deflection, and r e {1,2,3,4,5}; the second raman laser 202 is on, the second mirror 208 remains stationary, and the third raman laser 203 is off;
step 8, first Raman laser 201 and second Raman laserThe frequency of the light 202 is at a chirp rate α g Scanning.
The alkali metal atom source 104 moves along the predetermined atom projection track 105 under the action of the cooling laser 101, as shown in fig. 3, the moment corresponding to the moment when the alkali metal atom moves to the optical axis of the first raman laser 201 is recorded as T ', and the moment corresponding to the moment when the alkali metal atom source 104 moves to the optical axis of the second raman laser 202 is recorded as T';
at T' -TS n At time/2, a pulse of the first raman laser 201 is emitted to split the alkali metal atom source 104. First ground state |301 in the split alkali metal atom source 104>The alkali metal atom source 104 of (c) continues to move along the first path, i.e., the first ground state 311 of the first path in fig. 3>Second ground state |302 in alkali metal atom after beam splitting>The alkali metal atoms of (2) continue to move along the second path, i.e. second ground state |322 of the second path in fig. 3>；
At T' +TS n At time/2, the first pair of pulses of Raman laser 201 is emitted to be in the first ground state 311 of the first path>Transition to the first path second ground state |312>。
At T' -TS n At time/2, an initial phase difference phi is transmitted 0 Is a second ground state |322 of the second path for the second raman laser 202 pulse of (a)>Transition to the second path first ground state |321>；
Step 9, at T "+TS n At time/2, the phase difference phi (r, TS) of the second Raman laser 202 is adjusted n M) is phi 0 +m×δφ，φ 0 For the initial phase difference, the initial value of the circulation parameter m is 1, delta phi is the phase difference increment, the second Raman laser 202 pulse is emitted, and the first ground state |321 of the second path is obtained>And the first path second ground state |312>The beam is combined, the detection laser 102 and the photodetector 103 are turned on, and the output signal P (r, TS n ，m)；
Step 10, m is increased by 1, and the steps 7-9 are repeated until all m (m is { 1-5 }, in the embodiment), the same Y-axis deflection times r and the same interference time TS are obtained n Under the condition of (1) the output signals P (r, TS n ，m)；
Step 11, step-by-stepThe output signal P (r, TS) of the photodetector 103 obtained in steps 7-10 n M) phase difference phi (r, TS) with the corresponding second raman laser 202 n M) to obtain the output signal P (r, TS) of the photodetector 103 n M) is 0, the phase difference phi (r, TS) of the second Raman laser 202 n )；
Step 12, increasing the Y-axis deflection times r by 1, repeating the steps 7-11 until all Y-axis deflection times are traversed, and obtaining a phase difference phi (r, TS) for the rxdelta theta Y n ) Fitting to obtain linear function phi (r, TS n )＝C n +D n X r x δθy, where n is the number of times set for the second interference time;
step 13, increasing n by 1, and repeating the steps 7-12 until n is traversed;
step 14, N is recorded as a second interference time TS n Calculating theta by setting total times k ＝(C (k+1) -C k )/(D k -D (k+1) ) Average value of (k.epsilon. { 1- (N-1) }, θ k The average value of (2) is recorded as Y-axis deflection angle theta 12y ；
Step 15, from the initial state of the first mirror 207, the first mirror 207 is deflected by a Y-axis deflection angle θ along the deflection direction in step 7 with the Y-axis as the rotation axis 12y . The first mirror 207 is in the Y-axis yaw adjustment final state.
From the final state of Y-axis deflection adjustment of the first reflecting mirror 207, the first reflecting mirror 207 is deflected for the w th time by taking the X-axis as a rotation axis, the deflection direction of each time is the same, the deflection angle of each time is delta theta X, w is the X-axis deflection times, in the embodiment, w epsilon {1,2,3,4,5}, the second Raman laser 202 is opened, the second reflecting mirror 208 is kept motionless, and the third Raman laser 203 is closed;
selecting the TS set last time in the step 8 n I.e. n=5, step 8 is repeated, at T "+ts n At time/2, the phase difference phi (w, TS) of the second Raman laser 202 is adjusted n M 1) is phi 0 +m1×δφ, the initial value of the circulation parameter m1 is 1, and the second Raman laser 202 is pulsed for the first ground state of the second path |322>And the first path second ground state |312>Is subjected to beam combination of alkali metal atoms,the detection laser 102 and the photodetector 103 are turned on, and the output signal P (w, TS) of the photodetector 103 is recorded n ，m1)；
Step 16, m1 is increased by 1, and step 15 is repeated until all m1 (m 1 epsilon { 1-5 }, in this embodiment) are traversed to obtain the same X-axis deflection times w and interference time TS n Under the condition of (1) different output signals P (w, TS n ，m1)；
Step 17, increasing the X-axis deflection times w by 1, repeating the steps 15-16 until all X-axis deflection times w are traversed, and performing sine fitting to obtain contrast C corresponding to different deflection angles w multiplied by delta theta X (w=1, 2,3,4, 5) w (w=1, 2,3,4, 5), for C w Performing Gaussian fitting on the function of (w=1, 2,3,4, 5) and the angle w multiplied by delta theta X to obtain an angle corresponding to the center value of the Gaussian function, and recording the angle as the X-axis deflection angle theta 12x ；
From the final state of the Y-axis deflection adjustment of the first mirror 207, the first mirror 207 is deflected by θ in the deflection direction in step 15 with the X-axis as the rotation axis 12x . The first mirror 207 is in the final yaw adjustment final state;
step 18, the left end of the atomic interferometry system 100 is taken as a light emitting end, the right end is taken as a projection end, an alkali metal atomic source 104 is projected from the right end to the left end in the atomic interferometry system 100, a cooling laser 101 is positioned at the right end of the atomic interferometry system 100, a photoelectric detector 103 is positioned at the left end of the atomic interferometry system 100, a detection laser 102 is positioned at the left end of the atomic interferometry system 100, and a first pair of Raman lasers to a third pair of Raman lasers are sequentially distributed along the left end to the right end of the atomic interferometry system 100;
the actual third raman laser is taken as the first raman laser in steps 7-17,
taking the actual third mirror as the first mirror in the steps 7-17;
taking the actual first Raman laser as the third Raman laser in the step 7-17;
taking the actual first reflecting mirror as a third reflecting mirror in the steps 7-17;
repeating the steps 7-17 to sequentially measure the actualY-axis deflection angle θ of third mirror 209 23y And an X-axis deflection angle θ 23x ；
Step 19, from the initial state of the actual third mirror, deflecting the actual third mirror 209 by the Y-axis deflection angle θ with the Y-axis as the rotation axis 23y The third mirror 207 is then deflected by an X-axis deflection angle θ with the X-axis as the rotation axis 23x ；
Step 20, the alkali metal atom source 104 moves along a preset atom projection track 105 under the action of the cooling laser 101, when the alkali metal atom source 104 moves to a position away from the center of the first Raman laser 201, a first Raman laser 201 pulse is emitted to split the alkali metal atom source 104, when the alkali metal atom source 104 moves to a position away from the center of the second Raman laser 202, a second Raman laser 202 pulse is emitted to transition atoms between two energy levels and obtain photon momentum, when the alkali metal atom source 104 moves to a position away from the center of the third Raman laser 203, a third Raman laser 203 pulse is emitted to combine the atoms to form a Mach-Zehnder interferometer, and atomic interference of three separated Raman lasers (201, 202 and 203) is realized.
The techniques of laser cooling, atomic interference, phase extraction, etc. of atoms in an atomic interferometer are general techniques and are not discussed in detail in this patent.
The specific embodiments described herein are offered by way of example only to illustrate the spirit of the invention. Those skilled in the art may make various modifications or additions to the described embodiments or substitutions thereof without departing from the spirit of the invention or exceeding the scope of the invention as defined in the accompanying claims.

Claims (1)

1. The method for debugging the separation Raman laser type atomic interference gyro comprises utilizing a separation Raman laser type atomic interference gyro device, wherein the separation Raman laser type atomic interference gyro device comprises an atomic interference physical system (100), one end of the atomic interference physical system (100) is a casting end, the other end is a light emitting end, one side of the atomic interference physical system (100) is sequentially distributed with a first Raman laser (201), a second Raman laser (202) and a third Raman laser (203) from the casting end to the light emitting end, the other side of the atomic interference physical system (100) is sequentially distributed with a first reflecting mirror (207), a second reflecting mirror (208) and a third reflecting mirror (209) from the casting end to the light emitting end,
the cooling laser (101) is positioned at the projection end of the atomic interferometry physical system (100), the photoelectric detector (103) is positioned at the light emitting end of the atomic interferometry physical system (100), and the detection laser (102) is positioned at the light emitting end of the atomic interferometry physical system (100), and is characterized by comprising the following steps:
step 1, an alkali metal atom source (104) moves along a preset atom projection track (105) under the action of cooling laser (101);
step 2, defining i as the number of atom projection, j as serial numbers of different time intervals, and both initial values of i and j are 1;
step 3, performing ith atom projection, when alkali metal atoms of the alkali metal atom source (104) pass through the positions of the first pair of Raman lasers, providing three pairs of laser pulses successively by the first pair of Raman lasers, wherein the time interval of the three pairs of laser pulses is t j ＝t 0 +(j-1)δt 0 ，t 0 For an initial time interval δt 0 The second pair of Raman lasers and the third pair of Raman lasers are turned off for time interval increment with different chirp rates alpha i ＝(i-1)×δα+α 0 Scanning the raman laser frequency difference δω, wherein δα is the chirp rate increment, α 0 For initial chirp rate, when an alkali metal atom of an alkali metal atom source (104) reaches a photodetector (103), an output signal P of the photodetector (103) is recorded ji Fitting the interference fringes to obtain a signal at time interval t j Under the condition of (a), phase phi (alpha) j Linear function relation phi (alpha) with chirp rate alpha j ＝A j +B j X alpha; wherein A is j And B j Are fitting coefficients;
step 4, increasing i by 1, repeating step 3 until the current time interval t is traversed j Throwing all atoms below;
step 5, setting j to be increased by 1 and i to be 1, and returning to the step 3 until all the time intervals are traversed;
step 6, calculating A G q ＝(A (q-1) -A q )/(B q -B (q-1) ) Is recorded as alpha g Q is greater than or equal to 2 and less than or equal to the total number of time intervals;
step 7, performing the nth second interference time TS n Setting TS n ＝TS 0 ++ (n-1) x δTS, where TS 0 For the initial second interference time, n is the number of times set by the second interference time, the initial value of n is 1, δTS is the second interference time increment, an X axis passes through the center of the first reflecting mirror (207), the positive direction of the X axis is parallel to the projection direction of the alkali atom projection direction on a horizontal plane, a Y axis passes through the center of the first reflecting mirror (207) and is positioned on the horizontal plane and perpendicular to the X axis, the Z axis is perpendicular to the horizontal plane, r is the deflection number of the Y axis, and the initial value of r is 1;
from the initial state of the first Raman reflector, the first reflector (207) deflects for the r time by taking the Y axis as a rotation axis, the deflection directions of each time are the same, and the deflection angle of each time is delta theta Y, wherein r is the deflection times of the Y axis; the second Raman laser (202) is turned on, the second reflecting mirror (208) is kept motionless, and the third Raman laser (203) is turned off;
step 8, the frequencies of the first Raman laser (201) and the second Raman laser (202) are at the chirp rate alpha g The scanning is performed in such a way that,
the alkali metal atom source (104) moves along a preset atom projection track (105) under the action of the cooling laser (101), the moment corresponding to the moment when the alkali metal atom moves to the optical axis of the first Raman laser (201) is recorded as T ', and the moment corresponding to the moment when the alkali metal atom source (104) moves to the optical axis of the second Raman laser (202) is recorded as T';
at T' -TS n At the moment/2, the first Raman laser (201) pulse is emitted to split the alkali metal atom sources (104), the alkali metal atom sources (104) in the first ground state in the split alkali metal atom sources (104) continue to move along a first path, and the alkali metal atoms in the second ground state in the split alkali metal atoms continue to move along a second path;
at T' +TS n At time/2, a first Raman laser (201) pulse is emitted to transition the alkali metal atoms in the first path first ground state to the first path second ground state,
at T' -TS n At time/2Etching, transmitting initial phase difference phi 0 The second raman laser (202) pulse of the second path second ground state alkali metal atoms are transitioned to the second path first ground state;
step 9, at T "+TS n At time/2, the phase difference phi (r, TS) of the second Raman laser (202) is adjusted n M) is phi 0 +m×δφ，φ 0 For initial phase difference, the initial value of the circulation parameter m is 1, delta phi is the phase difference increment, a second Raman laser (202) pulse is emitted, the first ground state of the second path and the second ground state of the first path are combined, the detection laser (102) and the photoelectric detector (103) are opened, and the output signals P (r, TS) of the photoelectric detector (103) are recorded n ，m)；
Step 10, increasing m by 1, repeating steps 7-9 until all m are traversed, and obtaining the same Y-axis deflection times r and interference time TS n Under the condition of (1) the output signals P (r, TS n ，m)；
Step 11, outputting the signals P (r, TS) to the photodetectors (103) obtained in steps 7-10 n M) and the corresponding second raman laser (202) n M) to obtain the output signal P (r, TS) of the photodetector (103) n The phase difference phi (r, TS) of the second Raman laser (202) when m) is 0 n )；
Step 12, increasing the Y-axis deflection times r by 1, repeating the steps 7-11 until all Y-axis deflection times are traversed, and obtaining a phase difference phi (r, TS) for the rxdelta theta Y n ) Fitting to obtain linear function phi (r, TS n )＝C n +D n X r x δθy, where n is the number of times set for the second interference time;
step 13, increasing n by 1, and repeating the steps 7-12 until n is traversed;
step 14, N is recorded as a second interference time TS n Calculating theta by setting total times k ＝(C (k+1) -C k )/(D k -D (k+1) ) Average value of k.epsilon {1 to (N-1) }, θ k The average value of (2) is recorded as Y-axis deflection angle theta 12y ；
Step 15, reflecting the first light from the initial state of the first mirror (207)The mirror (207) deflects the Y-axis by a Y-axis deflection angle theta in the deflection direction in step 7 with the Y-axis as the rotation axis 12y The first mirror (207) is positioned in the final state of Y-axis deflection adjustment,
from the final state of Y-axis deflection adjustment of the first reflecting mirror (207), the first reflecting mirror (207) is deflected for the w time by taking the X-axis as a rotating shaft, the deflection directions of each time are the same, the deflection angle of each time is delta theta X, w is the X-axis deflection times, the second Raman laser (202) is turned on, the second reflecting mirror (208) is kept motionless, and the third Raman laser (203) is turned off;
selecting the TS set last time in the step 8 n Repeating step 8, at T "+TS n At time/2, the phase difference phi (w, TS) of the second Raman laser (202) is adjusted n M 1) is phi 0 +m1×δφ, the initial value of the cycle parameter m1 is 1, a second Raman laser (202) pulse is emitted, alkali metal atoms in the first ground state of the second path and the second ground state of the first path are combined, the detection laser (102) and the photodetector (103) are turned on, and the output signals P (w, TS) of the photodetector (103) are recorded n ，m1)；
Step 16, m1 is increased by 1, step 15 is repeated until all m1 are traversed, and the same X-axis deflection times w and the same interference time TS are obtained n Under the condition of (1) different output signals P (w, TS n ，m1)；
Step 17, increasing the X-axis deflection times w by 1, repeating the steps 15-16 until all X-axis deflection times w are traversed, and performing sine fitting to obtain contrast C corresponding to different deflection angles w multiplied by delta theta X w Wherein w=1, 2,3,4,5, for C w Performing Gaussian fitting on the function of the angle w multiplied by delta theta X to obtain an angle corresponding to the center value of the Gaussian function, and recording the angle as the X-axis deflection angle theta 12x ；
From the final state of Y-axis deflection adjustment of the first mirror (207), the first mirror (207) is deflected by θ in the deflection direction in step 15 with the X-axis as the rotation axis 12x The first mirror (207) is in a final yaw adjustment final state.
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