CN112639040B - 粘合片 - Google Patents
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- Publication number
- CN112639040B CN112639040B CN201980058071.8A CN201980058071A CN112639040B CN 112639040 B CN112639040 B CN 112639040B CN 201980058071 A CN201980058071 A CN 201980058071A CN 112639040 B CN112639040 B CN 112639040B
- Authority
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- China
- Prior art keywords
- adhesive layer
- pressure
- adhesive sheet
- sensitive adhesive
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 230000001070 adhesive effect Effects 0.000 title claims abstract description 129
- 239000000853 adhesive Substances 0.000 title claims abstract description 127
- 239000000758 substrate Substances 0.000 claims abstract description 97
- 239000012790 adhesive layer Substances 0.000 claims abstract description 70
- 238000000227 grinding Methods 0.000 claims abstract description 50
- 239000004088 foaming agent Substances 0.000 claims abstract description 41
- 229920005601 base polymer Polymers 0.000 claims abstract description 36
- 238000005187 foaming Methods 0.000 claims abstract description 27
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 19
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 19
- 239000010703 silicon Substances 0.000 claims abstract description 19
- 239000011230 binding agent Substances 0.000 claims abstract description 13
- 239000004820 Pressure-sensitive adhesive Substances 0.000 claims description 138
- 239000010410 layer Substances 0.000 claims description 119
- 229920005989 resin Polymers 0.000 claims description 64
- 239000011347 resin Substances 0.000 claims description 64
- 229920000103 Expandable microsphere Polymers 0.000 claims description 50
- 239000004094 surface-active agent Substances 0.000 claims description 50
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Natural products C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 claims description 36
- 238000000034 method Methods 0.000 claims description 31
- 238000007373 indentation Methods 0.000 claims description 18
- 125000000217 alkyl group Chemical group 0.000 claims description 17
- 239000000463 material Substances 0.000 claims description 16
- 229920001971 elastomer Polymers 0.000 claims description 15
- 239000000806 elastomer Substances 0.000 claims description 13
- 238000004519 manufacturing process Methods 0.000 claims description 11
- 229920002725 thermoplastic elastomer Polymers 0.000 claims description 8
- 125000004432 carbon atom Chemical group C* 0.000 claims description 6
- 238000012545 processing Methods 0.000 claims description 5
- 239000004065 semiconductor Substances 0.000 claims description 5
- 125000003011 styrenyl group Chemical group [H]\C(*)=C(/[H])C1=C([H])C([H])=C([H])C([H])=C1[H] 0.000 claims description 3
- 238000011109 contamination Methods 0.000 abstract description 5
- -1 styrene-ethylene-butylene-styrene Chemical class 0.000 description 60
- 239000000126 substance Substances 0.000 description 37
- 239000003431 cross linking reagent Substances 0.000 description 31
- 238000010438 heat treatment Methods 0.000 description 21
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 18
- 238000011156 evaluation Methods 0.000 description 18
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- 229910052799 carbon Inorganic materials 0.000 description 12
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- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 10
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- 229920006132 styrene block copolymer Polymers 0.000 description 9
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 8
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- 229920003171 Poly (ethylene oxide) Polymers 0.000 description 8
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- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 7
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 7
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- 150000003505 terpenes Chemical class 0.000 description 7
- 235000007586 terpenes Nutrition 0.000 description 7
- RSWGJHLUYNHPMX-UHFFFAOYSA-N Abietic-Saeure Natural products C12CCC(C(C)C)=CC2=CCC2C1(C)CCCC2(C)C(O)=O RSWGJHLUYNHPMX-UHFFFAOYSA-N 0.000 description 6
- KHPCPRHQVVSZAH-HUOMCSJISA-N Rosin Natural products O(C/C=C/c1ccccc1)[C@H]1[C@H](O)[C@@H](O)[C@@H](O)[C@@H](CO)O1 KHPCPRHQVVSZAH-HUOMCSJISA-N 0.000 description 6
- 150000005215 alkyl ethers Chemical class 0.000 description 6
- 230000000694 effects Effects 0.000 description 6
- 235000011007 phosphoric acid Nutrition 0.000 description 6
- 229920001200 poly(ethylene-vinyl acetate) Polymers 0.000 description 6
- 229920000642 polymer Polymers 0.000 description 6
- KHPCPRHQVVSZAH-UHFFFAOYSA-N trans-cinnamyl beta-D-glucopyranoside Natural products OC1C(O)C(O)C(CO)OC1OCC=CC1=CC=CC=C1 KHPCPRHQVVSZAH-UHFFFAOYSA-N 0.000 description 6
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 5
- 239000004604 Blowing Agent Substances 0.000 description 5
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 5
- 239000003963 antioxidant agent Substances 0.000 description 5
- 230000003078 antioxidant effect Effects 0.000 description 5
- 239000011248 coating agent Substances 0.000 description 5
- 239000011247 coating layer Substances 0.000 description 5
- 239000005038 ethylene vinyl acetate Substances 0.000 description 5
- 150000004665 fatty acids Chemical class 0.000 description 5
- 239000011806 microball Substances 0.000 description 5
- 239000004005 microsphere Substances 0.000 description 5
- 239000002736 nonionic surfactant Substances 0.000 description 5
- 239000001993 wax Substances 0.000 description 5
- FLIACVVOZYBSBS-UHFFFAOYSA-N Methyl palmitate Chemical compound CCCCCCCCCCCCCCCC(=O)OC FLIACVVOZYBSBS-UHFFFAOYSA-N 0.000 description 4
- 239000003945 anionic surfactant Substances 0.000 description 4
- 239000003093 cationic surfactant Substances 0.000 description 4
- 239000003795 chemical substances by application Substances 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 4
- 239000010432 diamond Substances 0.000 description 4
- 229910003460 diamond Inorganic materials 0.000 description 4
- 230000001747 exhibiting effect Effects 0.000 description 4
- 239000011888 foil Substances 0.000 description 4
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- 239000004014 plasticizer Substances 0.000 description 4
- 229920000346 polystyrene-polyisoprene block-polystyrene Polymers 0.000 description 4
- 229920000468 styrene butadiene styrene block copolymer Polymers 0.000 description 4
- 150000003440 styrenes Chemical class 0.000 description 4
- VZCYOOQTPOCHFL-UHFFFAOYSA-N trans-butenedioic acid Natural products OC(=O)C=CC(O)=O VZCYOOQTPOCHFL-UHFFFAOYSA-N 0.000 description 4
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 3
- 239000004925 Acrylic resin Substances 0.000 description 3
- 229920000178 Acrylic resin Polymers 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-O Ammonium Chemical compound [NH4+] QGZKDVFQNNGYKY-UHFFFAOYSA-O 0.000 description 3
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 3
- 239000005977 Ethylene Substances 0.000 description 3
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 3
- 239000013032 Hydrocarbon resin Substances 0.000 description 3
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 3
- 239000004743 Polypropylene Substances 0.000 description 3
- OFOBLEOULBTSOW-UHFFFAOYSA-N Propanedioic acid Natural products OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 3
- WQDUMFSSJAZKTM-UHFFFAOYSA-N Sodium methoxide Chemical compound [Na+].[O-]C WQDUMFSSJAZKTM-UHFFFAOYSA-N 0.000 description 3
- 230000000996 additive effect Effects 0.000 description 3
- 125000001931 aliphatic group Chemical group 0.000 description 3
- CADWTSSKOVRVJC-UHFFFAOYSA-N benzyl(dimethyl)azanium;chloride Chemical compound [Cl-].C[NH+](C)CC1=CC=CC=C1 CADWTSSKOVRVJC-UHFFFAOYSA-N 0.000 description 3
- 229920001400 block copolymer Polymers 0.000 description 3
- 150000001768 cations Chemical class 0.000 description 3
- AFABGHUZZDYHJO-UHFFFAOYSA-N dimethyl butane Natural products CCCC(C)C AFABGHUZZDYHJO-UHFFFAOYSA-N 0.000 description 3
- ILRSCQWREDREME-UHFFFAOYSA-N dodecanamide Chemical compound CCCCCCCCCCCC(N)=O ILRSCQWREDREME-UHFFFAOYSA-N 0.000 description 3
- 239000003814 drug Substances 0.000 description 3
- 239000000945 filler Substances 0.000 description 3
- 239000006260 foam Substances 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 229920006270 hydrocarbon resin Polymers 0.000 description 3
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 3
- VZCYOOQTPOCHFL-UPHRSURJSA-N maleic acid Chemical compound OC(=O)\C=C/C(O)=O VZCYOOQTPOCHFL-UPHRSURJSA-N 0.000 description 3
- 239000011976 maleic acid Substances 0.000 description 3
- LYRFLYHAGKPMFH-UHFFFAOYSA-N octadecanamide Chemical compound CCCCCCCCCCCCCCCCCC(N)=O LYRFLYHAGKPMFH-UHFFFAOYSA-N 0.000 description 3
- 239000003921 oil Substances 0.000 description 3
- 239000000123 paper Substances 0.000 description 3
- 239000003208 petroleum Substances 0.000 description 3
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 3
- 229920002647 polyamide Polymers 0.000 description 3
- 229920000728 polyester Polymers 0.000 description 3
- 229920001155 polypropylene Polymers 0.000 description 3
- 229920002635 polyurethane Polymers 0.000 description 3
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- 239000004800 polyvinyl chloride Substances 0.000 description 3
- 238000003825 pressing Methods 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- 229920003002 synthetic resin Polymers 0.000 description 3
- 239000000057 synthetic resin Substances 0.000 description 3
- 125000000383 tetramethylene group Chemical group [H]C([H])([*:1])C([H])([H])C([H])([H])C([H])([H])[*:2] 0.000 description 3
- QMMJWQMCMRUYTG-UHFFFAOYSA-N 1,2,4,5-tetrachloro-3-(trifluoromethyl)benzene Chemical compound FC(F)(F)C1=C(Cl)C(Cl)=CC(Cl)=C1Cl QMMJWQMCMRUYTG-UHFFFAOYSA-N 0.000 description 2
- IANQTJSKSUMEQM-UHFFFAOYSA-N 1-benzofuran Chemical compound C1=CC=C2OC=CC2=C1 IANQTJSKSUMEQM-UHFFFAOYSA-N 0.000 description 2
- OZAIFHULBGXAKX-UHFFFAOYSA-N 2-(2-cyanopropan-2-yldiazenyl)-2-methylpropanenitrile Chemical compound N#CC(C)(C)N=NC(C)(C)C#N OZAIFHULBGXAKX-UHFFFAOYSA-N 0.000 description 2
- FALRKNHUBBKYCC-UHFFFAOYSA-N 2-(chloromethyl)pyridine-3-carbonitrile Chemical compound ClCC1=NC=CC=C1C#N FALRKNHUBBKYCC-UHFFFAOYSA-N 0.000 description 2
- AOBIOSPNXBMOAT-UHFFFAOYSA-N 2-[2-(oxiran-2-ylmethoxy)ethoxymethyl]oxirane Chemical compound C1OC1COCCOCC1CO1 AOBIOSPNXBMOAT-UHFFFAOYSA-N 0.000 description 2
- MPNXSZJPSVBLHP-UHFFFAOYSA-N 2-chloro-n-phenylpyridine-3-carboxamide Chemical compound ClC1=NC=CC=C1C(=O)NC1=CC=CC=C1 MPNXSZJPSVBLHP-UHFFFAOYSA-N 0.000 description 2
- HIQIXEFWDLTDED-UHFFFAOYSA-N 4-hydroxy-1-piperidin-4-ylpyrrolidin-2-one Chemical compound O=C1CC(O)CN1C1CCNCC1 HIQIXEFWDLTDED-UHFFFAOYSA-N 0.000 description 2
- 229920002126 Acrylic acid copolymer Polymers 0.000 description 2
- ATRRKUHOCOJYRX-UHFFFAOYSA-N Ammonium bicarbonate Chemical compound [NH4+].OC([O-])=O ATRRKUHOCOJYRX-UHFFFAOYSA-N 0.000 description 2
- 239000004156 Azodicarbonamide Substances 0.000 description 2
- NDKYEUQMPZIGFN-UHFFFAOYSA-N Butyl dodecanoate Chemical compound CCCCCCCCCCCC(=O)OCCCC NDKYEUQMPZIGFN-UHFFFAOYSA-N 0.000 description 2
- 239000004215 Carbon black (E152) Substances 0.000 description 2
- FBPFZTCFMRRESA-FSIIMWSLSA-N D-Glucitol Natural products OC[C@H](O)[C@H](O)[C@@H](O)[C@H](O)CO FBPFZTCFMRRESA-FSIIMWSLSA-N 0.000 description 2
- QUSNBJAOOMFDIB-UHFFFAOYSA-N Ethylamine Chemical compound CCN QUSNBJAOOMFDIB-UHFFFAOYSA-N 0.000 description 2
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 2
- VZCYOOQTPOCHFL-OWOJBTEDSA-N Fumaric acid Chemical compound OC(=O)\C=C\C(O)=O VZCYOOQTPOCHFL-OWOJBTEDSA-N 0.000 description 2
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 2
- HPEUJPJOZXNMSJ-UHFFFAOYSA-N Methyl stearate Chemical compound CCCCCCCCCCCCCCCCCC(=O)OC HPEUJPJOZXNMSJ-UHFFFAOYSA-N 0.000 description 2
- BAVYZALUXZFZLV-UHFFFAOYSA-N Methylamine Chemical compound NC BAVYZALUXZFZLV-UHFFFAOYSA-N 0.000 description 2
- IMNFDUFMRHMDMM-UHFFFAOYSA-N N-Heptane Chemical compound CCCCCCC IMNFDUFMRHMDMM-UHFFFAOYSA-N 0.000 description 2
- OFBQJSOFQDEBGM-UHFFFAOYSA-N Pentane Chemical compound CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 2
- 239000004696 Poly ether ether ketone Substances 0.000 description 2
- 239000004698 Polyethylene Substances 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 2
- 239000004734 Polyphenylene sulfide Substances 0.000 description 2
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 2
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 2
- UIIMBOGNXHQVGW-UHFFFAOYSA-M Sodium bicarbonate Chemical compound [Na+].OC([O-])=O UIIMBOGNXHQVGW-UHFFFAOYSA-M 0.000 description 2
- 239000004902 Softening Agent Substances 0.000 description 2
- GSEJCLTVZPLZKY-UHFFFAOYSA-N Triethanolamine Chemical compound OCCN(CCO)CCO GSEJCLTVZPLZKY-UHFFFAOYSA-N 0.000 description 2
- 239000006061 abrasive grain Substances 0.000 description 2
- 229910052783 alkali metal Inorganic materials 0.000 description 2
- 150000001340 alkali metals Chemical class 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 239000001099 ammonium carbonate Substances 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 239000004760 aramid Substances 0.000 description 2
- 229920003235 aromatic polyamide Polymers 0.000 description 2
- XOZUGNYVDXMRKW-AATRIKPKSA-N azodicarbonamide Chemical compound NC(=O)\N=N\C(N)=O XOZUGNYVDXMRKW-AATRIKPKSA-N 0.000 description 2
- 235000019399 azodicarbonamide Nutrition 0.000 description 2
- 229910052788 barium Inorganic materials 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- CQEYYJKEWSMYFG-UHFFFAOYSA-N butyl acrylate Chemical compound CCCCOC(=O)C=C CQEYYJKEWSMYFG-UHFFFAOYSA-N 0.000 description 2
- BPOZNMOEPOHHSC-UHFFFAOYSA-N butyl prop-2-enoate;prop-2-enoic acid Chemical compound OC(=O)C=C.CCCCOC(=O)C=C BPOZNMOEPOHHSC-UHFFFAOYSA-N 0.000 description 2
- YMKDRGPMQRFJGP-UHFFFAOYSA-M cetylpyridinium chloride Chemical compound [Cl-].CCCCCCCCCCCCCCCC[N+]1=CC=CC=C1 YMKDRGPMQRFJGP-UHFFFAOYSA-M 0.000 description 2
- 229960001927 cetylpyridinium chloride Drugs 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- JMGZBMRVDHKMKB-UHFFFAOYSA-L disodium;2-sulfobutanedioate Chemical compound [Na+].[Na+].OS(=O)(=O)C(C([O-])=O)CC([O-])=O JMGZBMRVDHKMKB-UHFFFAOYSA-L 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 150000002148 esters Chemical class 0.000 description 2
- 125000005670 ethenylalkyl group Chemical group 0.000 description 2
- RGXWDWUGBIJHDO-UHFFFAOYSA-N ethyl decanoate Chemical compound CCCCCCCCCC(=O)OCC RGXWDWUGBIJHDO-UHFFFAOYSA-N 0.000 description 2
- 239000011737 fluorine Substances 0.000 description 2
- 229910052731 fluorine Inorganic materials 0.000 description 2
- 239000003292 glue Substances 0.000 description 2
- 229930195733 hydrocarbon Natural products 0.000 description 2
- 150000002430 hydrocarbons Chemical class 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- NNPPMTNAJDCUHE-UHFFFAOYSA-N isobutane Chemical compound CC(C)C NNPPMTNAJDCUHE-UHFFFAOYSA-N 0.000 description 2
- 239000012948 isocyanate Substances 0.000 description 2
- 150000002513 isocyanates Chemical class 0.000 description 2
- QWTDNUCVQCZILF-UHFFFAOYSA-N isopentane Chemical compound CCC(C)C QWTDNUCVQCZILF-UHFFFAOYSA-N 0.000 description 2
- XUGNVMKQXJXZCD-UHFFFAOYSA-N isopropyl palmitate Chemical compound CCCCCCCCCCCCCCCC(=O)OC(C)C XUGNVMKQXJXZCD-UHFFFAOYSA-N 0.000 description 2
- FQPSGWSUVKBHSU-UHFFFAOYSA-N methacrylamide Chemical class CC(=C)C(N)=O FQPSGWSUVKBHSU-UHFFFAOYSA-N 0.000 description 2
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 2
- QSQLTHHMFHEFIY-UHFFFAOYSA-N methyl behenate Chemical compound CCCCCCCCCCCCCCCCCCCCCC(=O)OC QSQLTHHMFHEFIY-UHFFFAOYSA-N 0.000 description 2
- UQDUPQYQJKYHQI-UHFFFAOYSA-N methyl laurate Chemical compound CCCCCCCCCCCC(=O)OC UQDUPQYQJKYHQI-UHFFFAOYSA-N 0.000 description 2
- ZAZKJZBWRNNLDS-UHFFFAOYSA-N methyl tetradecanoate Chemical compound CCCCCCCCCCCCCC(=O)OC ZAZKJZBWRNNLDS-UHFFFAOYSA-N 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 2
- CRSOQBOWXPBRES-UHFFFAOYSA-N neopentane Chemical compound CC(C)(C)C CRSOQBOWXPBRES-UHFFFAOYSA-N 0.000 description 2
- 150000002825 nitriles Chemical class 0.000 description 2
- 229920001707 polybutylene terephthalate Polymers 0.000 description 2
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- 229920000573 polyethylene Polymers 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 238000006116 polymerization reaction Methods 0.000 description 2
- 229920000069 polyphenylene sulfide Polymers 0.000 description 2
- 229920000915 polyvinyl chloride Polymers 0.000 description 2
- 229910052700 potassium Inorganic materials 0.000 description 2
- 239000011591 potassium Substances 0.000 description 2
- 239000005060 rubber Substances 0.000 description 2
- 238000004626 scanning electron microscopy Methods 0.000 description 2
- 229910052708 sodium Inorganic materials 0.000 description 2
- 239000011734 sodium Substances 0.000 description 2
- 239000000600 sorbitol Substances 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 229920003048 styrene butadiene rubber Polymers 0.000 description 2
- 229940014800 succinic anhydride Drugs 0.000 description 2
- 229920003051 synthetic elastomer Polymers 0.000 description 2
- 239000005061 synthetic rubber Substances 0.000 description 2
- JREYOWJEWZVAOR-UHFFFAOYSA-N triazanium;[3-methylbut-3-enoxy(oxido)phosphoryl] phosphate Chemical compound [NH4+].[NH4+].[NH4+].CC(=C)CCOP([O-])(=O)OP([O-])([O-])=O JREYOWJEWZVAOR-UHFFFAOYSA-N 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- DTGKSKDOIYIVQL-WEDXCCLWSA-N (+)-borneol Chemical group C1C[C@@]2(C)[C@@H](O)C[C@@H]1C2(C)C DTGKSKDOIYIVQL-WEDXCCLWSA-N 0.000 description 1
- WJTCHBVEUFDSIK-NWDGAFQWSA-N (2r,5s)-1-benzyl-2,5-dimethylpiperazine Chemical compound C[C@@H]1CN[C@@H](C)CN1CC1=CC=CC=C1 WJTCHBVEUFDSIK-NWDGAFQWSA-N 0.000 description 1
- KYPOHTVBFVELTG-OWOJBTEDSA-N (e)-but-2-enedinitrile Chemical compound N#C\C=C\C#N KYPOHTVBFVELTG-OWOJBTEDSA-N 0.000 description 1
- UWFRVQVNYNPBEF-UHFFFAOYSA-N 1-(2,4-dimethylphenyl)propan-1-one Chemical compound CCC(=O)C1=CC=C(C)C=C1C UWFRVQVNYNPBEF-UHFFFAOYSA-N 0.000 description 1
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Images
Classifications
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Abstract
提供一种粘合片,其可以在硬脆基板的背面磨削工序中用于硬脆基板的磨削,其磨削精度、低污染性、生产率、及固定性均优异。本发明的粘合片具备粘合剂层,该粘合剂层包含:含有基础聚合物的粘合剂;和发泡温度为90℃以上的发泡剂,将该粘合片的粘合面贴合于硅芯片时的剪切粘接强度在25℃的环境温度下为1.0MPa以上、且在80℃的环境温度下为0.2MPa以上。
Description
技术领域
本发明涉及粘合片。
背景技术
近年来,精度良好地制造白色LED用基板、SOS(硅蓝宝石,Silicon on Sapphire)等电子设备和/或智能手机和/或手表的保护玻璃等中使用的蓝宝石基板、可期待作为功率半导体用基板的碳化硅基板、氮化镓基板、氧化镓基板、金刚石基板、作为功率半导体用的散热电路板材料使用的氮化硅基板、氮氧化铝基板、玻璃和/或透镜的水晶振子等中使用的石英基板等硬且脆的陶瓷基板(以下统称为硬脆基板)的需求变高。作为制造这样的基板的工序的代表例,进行将基板(晶圆)的背面磨削至期望厚度的背面磨削工序,在该工序中,为了将基板固定,使用蜡或粘合片(背面磨削带)。
上述那样的基板(硬脆基板)为高硬度,在对高硬度的硬脆基板进行磨削时,需要边将以金刚石等作为材质的固定磨粒或游离磨粒以高载荷挤压到被磨削体(硬脆基板)上边使研磨机旋转,使该被磨削体薄型化。以往,在这样的工序中,常使用蜡作为磨削性优异的固定材料。但是,在使用蜡时,为了在磨削后去除蜡,需要进行使用大量溶剂的清洗工序,存在污染性及生产率的问题。
作为可以解决污染性和/或生产率的问题的方法,已知利用粘合片固定被磨削体的方法,在磨削加工相对容易的硅基板(晶圆)的背面磨削工序中,实际使用的是粘合片(例如专利文献1)。但是,在硬脆基板的背面磨削工序中,如上所述在高载荷下进行磨削,因此,在被磨削体(硬脆基板)和磨石之间会产生极大的摩擦阻力,其结果,会产生粘合片的粘合力因摩擦热而降低、无法充分固定被磨削体(硬脆基板)的问题。另一方面,使用在高温下下表现出强粘合性的粘合片时,存在如下的问题:重剥离化、产生残胶、或者需要清洗被残胶污染的被磨削体(硬脆基板)等问题。
现有技术文献
专利文献
专利文献1:日本特开2011-151163号公报
发明内容
发明要解决的问题
本发明是为了解决上述现有的问题而做出的,其目的在于,提供一种粘合片,其可以在硬脆基板的背面磨削工序中用于硬脆基板的磨削,其磨削精度、低污染性、生产率、及固定性均优异。
用于解决问题的方案
本发明的粘合片为具备粘合剂层的粘合片,其中,该粘合剂层包含:含有基础聚合物的粘合剂;和发泡温度为90℃以上的发泡剂,将该粘合片的粘合面贴合于硅芯片时的剪切粘接强度在25℃的环境温度下为1.0MPa以上,且在80℃的环境温度下为0.2MPa以上。
在一个实施方式中,上述粘合剂层在25℃下的压痕硬度H为10MPa~1GPa。
在一个实施方式中,上述粘合剂中所含的基础聚合物为热塑性弹性体。
在一个实施方式中,上述热塑性弹性体为苯乙烯系弹性体。
在一个实施方式中,上述粘合剂还包含增粘树脂。
在一个实施方式中,上述增粘树脂的含量相对于前述基础聚合物100重量份为20重量份~350重量份。
在一个实施方式中,上述粘合剂还包含表面活性剂。
在一个实施方式中,上述表面活性剂的含量相对于前述基础聚合物100重量份为0.001重量份~15重量份。
在一个实施方式中,上述发泡剂为热膨胀性微球。
在一个实施方式中,上述热膨胀性微球的含量相对于前述基础聚合物100重量份为20重量份~210重量份。
在一个实施方式中,上述粘合片还具备配置在上述粘合剂层的至少单侧的基材。
在一个实施方式中,上述粘合片还具备配置在上述粘合剂层的至少单侧的其它粘合剂层。
在一个实施方式中,上述基材配置在上述粘合剂层和上述其它粘合剂层之间。
在一个实施方式中,上述粘合片作为半导体制造工序中的基板加工时的临时固定材料使用。
根据本发明的其它方面,提供一种基板的磨削方法。该基板的磨削方法包括:将基板载置在具备粘合剂层的粘合片的该粘合剂层上并固定之后,对该基板的与粘合剂层侧处于相反侧的面进行磨削,该粘合剂层包含:含有基础聚合物的粘合剂、和发泡温度为90℃以上的发泡剂,将该粘合片的粘合面贴合于硅芯片时的剪切粘接强度在25℃的环境温度下为1.0MPa以上,且在80℃的环境温度下为0.2MPa以上。
根据本发明的其它方面,提供一种芯片的制造方法。该芯片的制造方法包括如下的磨削工序:将基板载置在具备粘合剂层的粘合片的该粘合剂层上并固定之后,对该基板的与粘合剂层侧处于相反侧的面进行磨削,该粘合剂层包含:含有基础聚合物的粘合剂、和发泡温度为90℃以上的发泡剂,将该粘合片的粘合面贴合于硅芯片时的剪切粘接强度在25℃的环境温度下为1.0MPa以上,且在80℃的环境温度下为0.2MPa以上。
发明的效果
根据本发明,能够提供一种粘合片,其可以在硬脆基板的背面磨削工序中用于硬脆基板的磨削,其磨削精度、低污染性、生产率、及固定性均优异。
附图说明
图1的(a)、(b)及(c)为本发明的1个实施方式的粘合片的示意截面图。
具体实施方式
A.粘合片的概要
图1的(a)是本发明的1个实施方式的粘合片的示意截面图。粘合片100具备粘合剂层10。本发明的粘合片可以仅由粘合剂层10构成,也可以除了该粘合剂层以外还具备任意适当的层。
图1的(b)是本发明的其它实施方式的粘合片的示意截面图。粘合片200具备粘合剂层10和配置在粘合剂层10的至少单侧的基材20。图1的(c)是本发明的其它实施方式的粘合片的示意截面图。粘合片300具备粘合剂层10和配置在粘合剂层10的至少单侧的其它粘合剂层30。可以如图示例那样在粘合剂层10和其它粘合剂层30之间配置基材20,虽然未图示,但是也可以省略基材而由粘合剂层和其它粘合剂层构成粘合片。此外,虽然未图示,但是,上述粘合片中,作为除粘合剂层以外的层,还可以具备可对上述粘合片赋予弹性的弹性层(后述E项)、可剥离地配置在粘合剂层上的隔离体(后述F项)等。
本发明的粘合片中具备的粘合剂层包含:含有基础聚合物的粘合剂、和发泡剂(优选热膨胀性微球;详情在后面叙述)。该发泡剂可以在规定温度(发泡起始温度:90℃以上)下发泡。就包含这样的发泡剂的粘合剂层而言,发泡剂会因加热而发泡,从而在粘合面(即粘合剂层表面)上产生凹凸,粘合力降低或消失。将本发明的粘合片在例如背面磨削工序时用作被磨削体的固定用片的情况下,在磨削时表现出所需的粘合性,在磨削后从被磨削体将粘合片剥离时,通过加热而粘合力降低或消失,表现出良好的剥离性。
将本发明的粘合片的粘合面贴合于硅芯片时的剪切粘接强度在25℃的环境温度下为1.0MPa以上、优选为1.5MPa以上、更优选为2.0MPa以上、进一步优选为2.3MPa以上、特别优选为3MPa以上。25℃环境温度下的上述剪切粘接强度越高越优选,但其上限例如为8MPa。在本说明书中,剪切粘接强度可以如下来测定:将粘合剂层表面作为贴合面,利用热压制机在100℃、0.1MPa的贴合条件下热压接1分钟而将硅芯片固定,使用Nordson公司制造的dage4000,在距离贴附面的高度为50μm的位置设置测定端子,以剪切速度500μm/sec.对芯片沿水平方向施加外力,从由此得到的载荷-位移曲线读取最大破坏载荷,由此测定。需要说明的是,在作为对象的样品为单面胶带的情况下,将基材的背面(与粘合剂层处于相反侧的面)利用日东电工株式会社制造的双面胶带NO.585贴附并固定于规定的基座,进行上述测定。
将本发明的粘合片的粘合面贴合于硅芯片时的剪切粘接强度在80℃的环境温度下为0.2MPa以上、优选为0.3MPa以上、更优选为0.4MPa以上、进一步优选为0.5MPa以上、特别优选为0.7MPa以上。80℃环境温度下的上述剪切粘接强度的上限例如为5MPa。在本说明书中,80℃的环境温度下的上述剪切粘接强度是指如下的剪切粘接强度:将在硅芯片上贴合粘合片而构成的评价样品在80℃的环境下放置5分钟之后,利用上述方法测定得到的剪切粘接强度。
在本发明中,通过将剪切粘接强度设为上述范围,能够得到对于在高载荷下被摩擦而高温化的被粘物的固定而言适宜的粘合片。此外,通过在粘合剂层中含有可以在规定温度以上发泡的发泡剂,能够得到如下的粘合片:在需要固定的情况下能够表现出上述那样的高剪切粘接强度、并且在需要剥离被粘物的情况下能够通过加热而容易地将被粘物剥离。本发明的粘合片适宜用作半导体制造工序中的基板加工时的(例如对硬脆基板进行磨削时的)临时固定材料。更具体而言,本发明的粘合片在硬脆基板的背面磨削工序中可以用作该硬脆基板的临时固定材料。在一个实施方式中,使用蓝宝石晶圆作为硬脆基板。将本发明的粘合片用于背面磨削工序时,即使在硬脆基板因磨削时的摩擦而高温化的情况下,也能够防止剥落和/或浮起等不良情况,从而磨削精度良好地进行背面磨削。此外,在背面磨削之后,通过将粘合片加热至规定温度以上(例如发泡剂的发泡起始温度+10℃~40℃),能够容易地将硬脆基板从粘合片剥离。这之后的硬脆基板的洁净性高,能够省略在使用蜡进行背面磨削时所必需的清洗工序,或者,在需要清洗工序的情况下也能够显著减少溶剂使用量。需要说明的是,粘合片的剪切粘接强度可以通过粘合剂层中所含的粘合剂的种类、构成粘合剂的基础聚合物的结构、添加在粘合剂中的添加剂的种类和/或量等来调整。
本发明的粘合片也可以以贴合于被加工物的状态供于背面磨削工序、树脂密封工序、蒸镀、溅射等基板(晶圆)背面(磨削面)的处理工序、切割工序、破断(Breaking)工序中的单一工序或其组合工序。
上述粘合片的、使发泡剂发泡后的对硅芯片的剪切粘接强度优选为0.2MPa以下、更优选为0.1MPa以下。使发泡剂发泡后的剪切粘接强度可以在将加热后的测定样品恢复至常温(25℃)之后测定。
本发明的粘合片的厚度优选为5μm~500μm、更优选为10μm~300μm、进一步优选为15μm~300μm。
根据本发明的其它方面,提供一种使用了上述粘合片的基板的磨削方法。该方法例如包括:将基板载置在粘合片的上述粘合剂层上并固定后,对该基板的与粘合剂层侧处于相反侧的面进行磨削。基板的磨削可以采用任意适当的方法。该磨削例如可以出于使基板为期望的厚度的目的来进行。在一个实施方式中,作为基板,可以使用圆形或定向平面形状的晶圆。此外,作为上述基板,可以使用例如蓝宝石基板(蓝宝石晶圆)等硬脆基板(晶圆)。
根据本发明的其它方面,提供一种使用了上述粘合片的芯片的制造方法。该制造方法例如包括:将基板载置在粘合片的上述粘合剂层上并固定后,对该基板的与粘合剂层侧处于相反侧的面进行磨削的磨削工序。作为基板,可以使用例如圆形或定向平面形状的晶圆。此外,上述制造方法除了磨削工序之外可以包含任意适当的工序。例如,可以包含将基板(晶圆)切断的切割工序、在切割后将被切断体分割而芯片化的破断工序、蒸镀、溅射等芯片背面(磨削面)的处理工序、对芯片进行树脂密封的密封工序等。作为上述芯片,可列举出例如以蓝宝石晶圆等硬脆晶圆作为支撑体的LED芯片等。
B.粘合剂层
上述粘合剂层包含用于赋予粘合性的粘合剂、和发泡剂。
上述粘合剂层在25℃下的压痕硬度H优选为10MPa~1GPa、更优选为12MPa~0.8GPa、进一步优选为15MPa~0.4GPa。在这样的范围时,能够得到能以优异的磨削精度进行背面磨削的粘合片。此外,上述粘合剂层在80℃下的压痕硬度H优选为0.03MPa~50MPa、更优选为0.05MPa~40MPa、进一步优选为0.1MPa~30MPa。在这样的范围时,能够得到能以优异的磨削精度进行硬脆基板(例如蓝宝石晶圆)的背面磨削的粘合片。压痕硬度H如下来得到:利用测定装置附带的软件(triboscan)对将金刚石制的Berkovich型(三角锥型)探针垂直按压在粘合剂层的表面(不存在发泡剂的场所)而得到的位移-载荷滞后曲线进行数值处理,由此得到。在本说明书中,压痕硬度H是指:使用纳米压痕仪(Hysitron Inc公司制造的Triboindenter TI-950),利用规定温度(25℃、80℃)下的单一压痕法在压痕速度约500nm/sec、压痕深度约3000nm的测定条件下测定得到的压痕硬度H。需要说明的是,粘合剂层的压痕硬度H可以通过粘合剂层中所含的粘合剂的种类、构成粘合剂的基础聚合物的结构、添加在粘合剂中的添加剂的种类和/或量等进行调整。
上述粘合剂层的厚度优选为5μm~300μm、更优选为15μm~250μm、进一步优选为20μm~100μm、特别优选为20μm~70μm。
B-1.粘合剂
作为构成上述粘合剂层的粘合剂,只要能够得到本发明的效果,则可以使用任意适当的粘合剂。作为上述粘合剂,可列举出例如包含热塑性弹性体、丙烯酸系树脂、有机硅系树脂、乙烯基烷基醚系树脂、聚酯系树脂、聚酰胺系树脂、氨基甲酸酯系树脂、氟化树脂等作为基础聚合物(粘合性树脂)的粘合剂。优选的是,上述粘合剂包含热塑性树脂作为基础聚合物。优选的是,使用包含热塑性弹性体作为基础聚合物的粘合剂。作为热塑性弹性体,优选使用苯乙烯系弹性体。例如,使用苯乙烯系弹性体时,通过调整苯乙烯单元比率,能够容易地控制上述剪切粘接强度及压痕硬度H。
作为苯乙烯系弹性体,可列举出苯乙烯·丁二烯共聚物(SB)、苯乙烯·异戊二烯共聚物(SI)、苯乙烯·异戊二烯·苯乙烯嵌段共聚物(SIS)、苯乙烯·丁二烯·苯乙烯嵌段共聚物(SBS)、苯乙烯·异丁烯·苯乙烯共聚物(SIBS)、苯乙烯·乙烯·丁烯·苯乙烯嵌段共聚物(SEBS)、苯乙烯·乙烯·丙烯嵌段共聚物(SEP)、苯乙烯·乙烯·丙烯·苯乙烯嵌段共聚物(SEPS)、它们的改性体等。其中,优选为SEBS、SBS、SIS、SIBS。这些共聚物优选为嵌段共聚物。
上述苯乙烯系弹性体中,源自苯乙烯的构成单元的含有比例相对于苯乙烯系弹性体100重量份优选为10重量份~75重量份,更优选为20重量份~70重量份,进一步优选为20重量份~50重量份。在这样的范围时,能够形成具有适度的弹性、且粘合性优异的粘合剂层,从而能够得到能以优异的磨削精度进行背面磨削的粘合片。此外,在加热至发泡剂的发泡起始温度以上时,会适度软化而不阻碍发泡剂的膨胀,能够得到可表现出优异的剥离性的粘合片。
在一个实施方式中,作为上述苯乙烯系弹性体,使用经酸改性的苯乙烯系弹性体(优选经酸改性的SEBS、SBS、SIS或SIBS)。作为上述酸改性中使用的酸,可列举例如马来酸、马来酸酐等,优选为马来酸改性。通过使用经酸改性的苯乙烯系弹性体,并组合使用交联剂(例如环氧系交联剂),能够调整分子量或形成交联结构,能够容易地控制发泡起始温度以上的高温区域中的粘合剂的弹性模量。经酸改性的苯乙烯系弹性体的酸值优选为5mg(CH3ONa)/g以上、更优选为7mg(CH3ONa)/g以上、进一步优选为7mg(CH3ONa)/g~25(CH3ONa)/g。需要说明的是,这里的酸值是指将1g基础聚合物中和的甲醇钠(CH3ONa)的重量(mg)。此外,基础聚合物的酸值可以基于JIS K0070:1992来测定。
上述粘合剂根据需要可以包含任意适当的添加剂。作为该添加剂,可列举出例如增粘树脂、增塑剂、颜料、染料、填充剂、防老剂、导电材料、防静电剂、紫外线吸收剂、光稳定剂、剥离调整剂、软化剂、表面活性剂、阻燃剂、抗氧化剂、交联剂等。为了将该粘合剂的强粘接性和剥离性控制为适当程度,特别优选包含交联剂、例如环氧系交联剂。
在一个实施方式中,上述粘合剂包含增粘树脂。特别是粘合剂包含苯乙烯系弹性体时,优选组合使用该弹性体和增粘树脂。通过组合使用增粘树脂,能够形成粘合性优异的粘合剂层。
作为上述增粘树脂,只要能够获得本发明的效果就可以使用任意适当的增粘树脂。作为增粘树脂的具体例,可列举出松香系增粘树脂(例如未改性松香、改性松香、松香酚系树脂、松香酯系树脂等)、萜烯系增粘树脂(例如萜烯系树脂、萜烯酚系树脂、苯乙烯改性萜烯系树脂、芳香族改性萜烯系树脂、氢化萜烯系树脂)、烃系增粘树脂(例如脂肪族系烃树脂、脂肪族系环状烃树脂、芳香族系烃树脂(例如苯乙烯系树脂、二甲苯系树脂等)、脂肪族·芳香族系石油树脂、脂肪族·脂环族系石油树脂、氢化烃树脂、香豆酮系树脂、香豆酮茚系树脂等)、酚系增粘树脂(例如烷基酚系树脂、二甲苯甲醛系树脂、甲阶酚醛树脂、酚醛清漆等)、酮系增粘树脂、聚酰胺系增粘树脂、环氧系增粘树脂、弹性体系增粘树脂等。其中,优选为萜烯系增粘树脂、松香系增粘树脂或烃系增粘树脂(优选脂肪族饱和烃树脂)。增粘树脂可以单独使用或组合使用2种以上。
上述增粘树脂的含量相对于基础聚合物100重量份优选为20重量份~350重量份、更优选为10重量份~300重量份。在这样的范围时,能够形成粘合性优异的粘合剂层。增粘树脂的含量过多时,存在粘合剂层变脆的担心。
在一个实施方式中,上述粘合剂包含表面活性剂。使用包含表面活性剂的粘合剂时,在粘合剂层中,由于加热引起的表面活性剂的偏析而形成轻剥离层,能够得到剥离性优异的粘合片。本发明的粘合片中,以80℃下的粘合性变高的方式来构成,因此,有时在发泡剂的发泡起始温度附近也残存若干粘合性,但是,通过添加表面活性剂,能够得到剥离性显著优异的粘合片。
作为上述表面活性剂,只要能够得到本发明的效果则可以使用任意适当的表面活性剂。作为上述表面活性剂,可列举出例如非离子型表面活性剂、阴离子型表面活性剂、阳离子型表面活性剂、两性表面活性剂等。其中,优选使用非离子型表面活性剂、阴离子型表面活性剂、阳离子型表面活性剂,更优选使用非离子型表面活性剂、或阳离子型表面活性剂。上述表面活性剂可以单独使用或组合使用2种以上。
作为上述非离子型表面活性剂,可列举出聚氧亚乙基月桂基醚、聚氧亚乙基硬脂基醚等聚氧亚乙基烷基醚;聚氧亚乙基辛基苯基醚、聚氧亚乙基壬基苯基醚等聚氧亚乙基烷基苯基醚;山梨糖醇酐单月桂酸酯、山梨糖醇酐单硬脂酸酯、聚氧亚乙基山梨糖醇酐单月桂酸酯等山梨糖醇酐脂肪酸酯;聚氧亚乙基甘油基醚脂肪酸酯;聚氧亚乙基-聚氧亚丙基嵌段共聚物;辛酸乙酯、癸酸乙酯、月桂酸甲酯、月桂酸丁酯、肉豆蔻酸甲酯、肉豆蔻酸异丙酯、棕榈酸甲酯、棕榈酸异丙酯、硬脂酸甲酯、硬脂酸丁酯、山嵛酸甲酯、月桂酸丁酯、硬脂酸丁酯、肉豆蔻酸异丙酯、棕榈酸异丙酯等饱和脂肪酸酯;月桂酸酰胺、棕榈酸酰胺、硬脂酸酰胺、山嵛酸酰胺等脂肪酸酰胺等。
在一个实施方式中,作为表面活性剂(非离子型表面活性剂),使用磷酸酯化合物。作为磷酸酯化合物,可列举出例如异丙基磷酸及月桂基磷酸等烷基磷酸;聚氧亚烷基烷基醚磷酸;它们的盐等。其中,优选为聚氧亚烷基烷基醚磷酸。
作为磷酸酯系化合物为盐时构成盐的抗衡离子,可列举出例如碱金属、铵、有机铵的阳离子等。作为碱金属,可列举出例如钠、钾、锂等。作为有机铵,可列举出例如甲基胺、乙基胺等烷基胺;单乙醇胺、二乙醇胺、三乙醇胺等烷醇胺等。
作为聚氧亚烷基烷基醚磷酸,可列举出例如聚氧亚乙基辛基醚磷酸、聚氧亚乙基癸基醚磷酸、聚氧亚乙基月桂基醚磷酸、聚氧亚乙基十三烷基醚磷酸、聚氧亚乙基肉豆蔻基醚磷酸、聚氧亚乙基十五烷基醚磷酸、及聚氧亚乙基硬脂基醚磷酸等。聚氧亚烷基烷基醚磷酸为盐时,作为构成盐的抗衡离子,优选选择例如钠、钾、钡、三乙醇胺等。
聚氧亚烷基烷基醚磷酸的环氧乙烷的加成摩尔数优选为1~20、更优选为1~10、进一步优选为1~6、特别优选为1~4、最优选为2~4。
作为上述阴离子型表面活性剂,可列举出月桂基硫酸盐、十八烷基硫酸盐等烷基硫酸盐;脂肪酸盐;壬基苯磺酸盐、十二烷基苯磺酸盐等烷基苯磺酸盐;十二烷基萘磺酸盐等萘磺酸盐;十二烷基二苯基醚二磺酸盐等烷基二苯基醚二磺酸盐;聚氧亚乙基十八烷基醚硫酸盐、聚氧亚乙基月桂基醚硫酸盐等聚氧亚乙基烷基醚硫酸盐;聚氧亚乙基月桂基苯基醚硫酸盐等聚氧亚乙基烷基苯基醚硫酸盐;聚氧亚乙基苯乙烯化苯基醚硫酸盐;月桂基磺基琥珀酸盐、聚氧亚乙基月桂基磺基琥珀酸盐、二辛基磺基琥珀酸盐(二辛基磺基琥珀酸钠)等磺基琥珀酸盐;聚氧亚乙基烷基醚磷酸盐;聚氧亚乙基烷基醚乙酸盐;等。阴离子型表面活性剂形成盐时,该盐可以为例如钠盐、钾盐、钙盐、镁盐等金属盐(优选一价金属的盐)、铵盐、胺盐等。
作为上述阳离子型表面活性剂,可列举出氯化烷基三甲基铵、氯化硬脂基三甲基铵、氯化月桂基三甲基铵、氯化鲸蜡基三甲基铵、氯化牛脂烷基三甲基铵、氯化山嵛基三甲基铵、溴化硬脂基三甲基铵、溴化山嵛基三甲基铵、氯化二硬脂基二甲基铵、氯化二椰油酰基二甲基铵、氯化二辛基二甲基铵、氯化二(POE)油烯基甲基铵(2EO)、氯化苄烷铵、氯化烷基苄烷铵、氯化烷基二甲基苄烷铵、苄索氯铵、氯化硬脂基二甲基苄基铵、羊毛脂衍生季铵盐、硬脂酸二乙基氨基乙基酰胺、硬脂酸二甲基氨基丙基酰胺、氯化山嵛酸酰胺丙基二甲基羟基丙基铵、司吡氯铵(stearoyl colaminoformyl methylpyridinium chloride)、氯化鲸蜡基吡啶鎓、氯化妥尔油烷基苄基羟基乙基咪唑啉鎓、苄基铵盐等。
作为上述表面活性剂,也可以使用市售品。作为市售品的表面活性剂,可列举出例如东邦化学工业株式会社制造的商品名“Phosphanol RL210”等磷酸酯系表面活性剂;花王株式会社制造的商品名“EXEPARL IPP”、东京化成工业株式会社制造的棕榈酸甲酯等脂肪酸酯系表面活性剂;东京化成工业株式会社制造的硬脂酸酰胺、月桂酸酰胺等脂肪酸酰胺系表面活性剂;东邦化学工业株式会社制造的商品名“Catinal MAPS”等脂肪酸氨基烷基酰胺系表面活性剂;东邦化学工业株式会社制造的商品名“Catinal STC-70ET”等氯化三甲基铵系表面活性剂;三洋化成株式会社制造的商品名“CATION S”等氯化二甲基苄基铵系表面活性剂;三洋化成工业株式会社制造的商品名“DSA”、“PDSA-DA”等琥珀酸酐系表面活性剂;三洋化成工业株式会社制造的商品名“Sansepara 100”等磺基琥珀酸钠系表面活性剂等。
在一个实施方式中,上述表面活性剂具有烷基作为疏水基。优选使用具有碳数为5~20(更优选8~18、进一步优选10~18)的直链状或支链状的(优选直链状的)烷基的表面活性剂。使用这样的表面活性剂时,能够得到常温下的粘合性不会受损、高温下可发挥优异的剥离性的粘合片。
上述表面活性剂的含量相对于基础聚合物100重量份优选为0.001重量份~15重量份、更优选为0.01重量份~10重量份、进一步优选为0.1重量份~8重量份、特别优选为1重量份~5重量份。在这样的范围时,能够得到即使在高温下也能发挥优异的剥离性的粘合片。
上述表面活性剂的分子量优选为800以下、更优选为600以下、进一步优选为500以下。表面活性剂的分子量的下限例如为150。在这样的范围时,能够得到即使在高温下也能发挥优异的剥离性的粘合片。
在一个实施方式中,上述粘合剂包含交联剂。含有交联剂时,能够调整粘合剂层的内聚力,能够得到常温下具有优异的粘接性、并且高温下的剥离性优异的粘合片。
作为上述交联剂,只要能够得到本发明的效果,则可以使用任意适当的交联剂。作为上述交联剂,可列举出例如环氧系交联剂、异氰酸酯系交联剂、三聚氰胺系交联剂、过氧化物系交联剂、以及脲系交联剂、金属醇盐系交联剂、金属螯合物系交联剂、金属盐系交联剂、碳二亚胺系交联剂、噁唑啉系交联剂、氮丙啶系交联剂、胺系交联剂等。其中,优选为环氧系交联剂。
作为上述环氧系交联剂,可列举出例如N,N,N’,N’-四缩水甘油基-间二甲苯二胺、二缩水甘油基苯胺、1,3-双(N,N-缩水甘油基氨基甲基)环己烷(三菱瓦斯化学株式会社制造、商品名“Tetrad C”)、1,6-己二醇二缩水甘油醚(共荣社化学株式会社制造、商品名“Epolight 1600”)、新戊二醇二缩水甘油醚(共荣社化学株式会社制造、商品名“Epolight1500NP”)、乙二醇二缩水甘油醚(共荣社化学株式会社制造、商品名“Epolight 40E”)、丙二醇二缩水甘油醚(共荣社化学株式会社制造、商品名“Epolight 70P”)、聚乙二醇二缩水甘油醚(日本油脂株式会社制造、商品名“EPIOL E-400”)、聚丙二醇二缩水甘油醚(日本油脂株式会社制造、商品名“EPIOL P-200”)、山梨糖醇多缩水甘油醚(Nagase ChemteXCorporation制造、商品名“DENACOL EX-611”)、甘油多缩水甘油醚(Nagase ChemteXCorporation制造、商品名“DENACOL EX-314”)、季戊四醇多缩水甘油醚、聚甘油多缩水甘油醚(Nagase ChemteX Corporation制造、商品名“DENACOL EX-512”)、山梨糖醇酐多缩水甘油醚、三羟甲基丙烷多缩水甘油醚、己二酸二缩水甘油酯、邻苯二甲酸二缩水甘油酯、三缩水甘油基-三(2-羟基乙基)异氰脲酸酯、间苯二酚二缩水甘油醚、双酚-S-二缩水甘油醚、分子内具有2个以上环氧基的环氧系树脂等。环氧系交联剂的含量可以根据期望的粘合力、粘合剂层的弹性等而设定成任意适当的量,相对于基础聚合物100重量份,代表性的是为0.01重量份~10重量份,更优选为0.03重量份~5重量份。
B-2.发泡剂
上述粘合剂层还包含发泡剂。发泡剂为可通过加热而发泡的添加剂。作为发泡剂,只要可得到本发明的效果,则可以使用任意适当的发泡剂。代表性的是,作为上述发泡剂,可使用热膨胀性微球。就具备包含热膨胀性微球的粘合剂层的粘合片而言,该热膨胀性微球会因加热而发生膨胀或发泡,在粘合面上产生凹凸,其结果,粘合力降低或消失。这样的粘合片通过加热能够容易地剥离。
上述发泡剂的发泡起始温度为90℃以上、优选为90℃~260℃、更优选为100℃~220℃。如果使用发泡起始温度在这样的范围的发泡剂(优选热膨胀性微球),则在对硬脆基板(例如蓝宝石晶圆)进行背面磨削时,能够得到在背面磨削中具有优异的粘合性、在背面磨削后可表现出基于加热的优异的剥离性的粘合片。在本说明书中,发泡起始温度例如相当于如下的温度:粘合剂层的粘合力相对于该粘合剂层的常态粘合力(23℃下对PET薄膜的粘合力)变为10%以下的最低温度。此时的粘合力是指:利用基于JIS Z 0237:2000的方法(贴合条件:2kg辊往复1次、剥离速度:300mm/min、剥离角度180°)测定得到的粘合力。此外,发泡起始温度下(及加热后的测定样品)的粘合力在将测定样品恢复至常温(23℃)之后进行测定。需要说明的是,发泡剂为热膨胀性微球时,该热膨胀性微球开始膨胀的温度相当于发泡起始温度。
作为上述热膨胀性微球,只要能够在上述发泡起始温度下发泡,则可以使用任意适当的热膨胀性微球。作为上述热膨胀性微球,可以使用例如使容易因加热而膨胀的物质内包于具有弹性的壳内而成的微球。这样的热膨胀性微球可以利用任意适当的方法、例如凝聚法、界面聚合法等来制造。
作为容易因加热而膨胀的物质,可列举出例如丙烷、丙烯、丁烯、正丁烷、异丁烷、异戊烷、新戊烷、正戊烷、正己烷、异己烷、庚烷、辛烷、石油醚、甲烷的卤化物、四烷基硅烷等低沸点液体;通过热分解而气化的偶氮二甲酰胺;等。
作为构成上述壳的物质,可列举出例如由如下单体构成的聚合物,所述单体为:丙烯腈、甲基丙烯腈、α-氯丙烯腈、α-乙氧基丙烯腈、富马腈等腈单体;丙烯酸、甲基丙烯酸、衣康酸、马来酸、富马酸、柠康酸等羧酸单体;偏氯乙烯;乙酸乙烯酯;(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸正丁酯、(甲基)丙烯酸异丁酯、(甲基)丙烯酸叔丁酯、(甲基)丙烯酸异冰片酯、(甲基)丙烯酸环己酯、(甲基)丙烯酸苄酯、丙烯酸β-羧基乙酯等(甲基)丙烯酸酯;苯乙烯、α-甲基苯乙烯、氯苯乙烯等苯乙烯单体;丙烯酰胺、取代丙烯酰胺、甲基丙烯酰胺、取代甲基丙烯酰胺等酰胺单体;等。由这些单体构成的聚合物可以为均聚物、也可以为共聚物。作为该共聚物,可列举出例如偏氯乙烯-甲基丙烯酸甲酯-丙烯腈共聚物、甲基丙烯酸甲酯-丙烯腈-甲基丙烯腈共聚物、甲基丙烯酸甲酯-丙烯腈共聚物、丙烯腈-甲基丙烯腈-衣康酸共聚物等。
上述热膨胀性微球也可以使用市售品。作为市售品的热膨胀性微球的具体例,可列举出松本油脂制药株式会社制造的商品名“Matsumoto Microsphere”(等级:F-30、F-30D、F-36D、F-36LV、F-50、F-50D、F-65、F-65D、FN-100SS、FN-100SSD、FN-180SS、FN-180SSD、F-190D、F-260D、F-2800D)、Japan Fillite Co.,Ltd.制造的商品名“Expancel”(等级:053-40、031-40、920-40、909-80、930-120)、吴羽化学工业株式会社制造的“DAIFOAM”(等级:H750、H850、H1100、S2320D、S2640D、M330、M430、M520)、积水化学工业株式会社制造的“ADVANCELL”(等级:EML101、EMH204、EHM301、EHM302、EHM303、EM304、EHM401、EM403、EM501)等。
25℃的环境温度下的、使上述热膨胀性微球发泡之前的、该热膨胀性微球的平均粒径优选为50μm以下、更优选为1μm~50μm、进一步优选为3μm~35μm、特别优选为5μm~35μm。通过使用平均粒径为50μm以下的热膨胀性微球,在该热膨胀性微球发泡前(即、粘合剂层需要粘合性的状况),不易在粘合剂层表面产生该热膨胀性微球的影响,能够得到对被粘物的密合性高且具有优异的粘合性的粘合片。在上述范围内,热膨胀性微球的平均粒径越大,加热时越膨胀,故而优选,使用平均粒径在上述范围的热膨胀性微球时,能够得到剥离性优异的粘合片。上述热膨胀性微球的平均粒径可以通过例如将该热膨胀性微球聚合时的条件(例如聚合时的搅拌叶片转速、聚合温度)来控制。此外,在使用市售的热膨胀性微球时,可以通过筛网处理、过滤器处理、离心分离处理等分级处理来控制。需要说明的是,在本说明书中,平均粒径也可以通过使用光学显微镜或电子显微镜对所使用的热膨胀性微球、或者从加热前的粘合剂层中取出的热膨胀性微球进行观察来测定。此外,平均粒径可以通过激光散射法中的粒度分布测定法来测定。更具体而言,平均粒径可以在将所使用的热膨胀性微球分散于规定的溶剂(例如水)中之后使用粒度分布测定装置(例如岛津制作所制造的商品名“SALD-2000J”)来测定。
上述热膨胀性微球优选具有体积膨胀率直至优选5倍以上、更优选7倍以上、进一步优选10倍以上为止才破裂的适度的强度。使用这样的热膨胀性微球时,能够通过加热处理有效地使粘合力降低。
上述粘合剂层中的热膨胀性微球的含量可以根据期望的粘合力的降低性等来适当设定。热膨胀性微球的含量相对于上述基础聚合物100重量份优选为20重量份~210重量份、更优选为30重量份~200重量份、进一步优选为50重量份~150重量份。在这样的范围时,能够得到在背面磨削时显示出良好的粘接性、并且在加热时可容易地将被粘物剥离的粘合片。
上述粘合剂层中的热膨胀性微球的含有比例相对于粘合剂层的重量优选为5重量%~80重量%、更优选为10重量%~70重量%、进一步优选为15重量%~65重量%。热膨胀性微球的含有比例可以根据由X射线CT分析、SEM分析等得到的热膨胀性微球的体积填充率(发泡起始温度以下(例如23℃)的体积填充率)、热膨胀性微球的比重及热膨胀性微球以外的区域的比重算出。在一个实施方式中,可以通过将热膨胀性微球的比重估算为1、将热膨胀性微球以外的区域的比重估算为1来算出,此时的热膨胀性微球的含有比例在上述范围。
上述粘合剂层中的热膨胀性微球的含有比例相对于粘合剂层的体积优选为5体积%~80体积%、更优选为10体积%~70体积%、进一步优选为15体积%~65体积%。体积基准的含有比例相当于上述体积填充率,如上所述,可以通过X射线CT分析、SEM分析等来测定。更具体而言,体积填充率可以利用以下的方法来测定。
<体积填充率测定方法>
i)以使加热前的粘合片的粘合剂层朝上的状态将试样固定于保持件,通过X射线CT对0~180°拍摄1601张连续透射图像。X射线CT使用ZEISS,Xradia 520Versa,以管电压40kV、管电流73μA、像素大小0.3μm/Pixel进行测定。
ii)以得到的全部透射图像为基础进行重建而制作层析图象,使用解析软件ImageJ.制作三维重建图象(TIF堆叠图像)和重建截面图像(3面图)。
iii)对得到的三维重建图象(TIF堆叠图像)实施图像处理,进行热膨胀性微球的识别。由识别结果算出厚度方向的体积填充率、各个发泡体的体积、及球当量直径。
需要说明的是,各试样的粘合剂层厚度通过SEM截面观察来测定,以除气泡部分之外的值作为总体积来算出填充率。
作为上述发泡剂,可以使用无机系发泡剂或有机系发泡剂。作为无机系发泡剂,可列举出例如碳酸铵、碳酸氢铵、碳酸氢钠、亚硝酸铵、硼氢化钠、各种叠氮类等。此外,作为有机系发泡剂,可列举出例如三氯单氟甲烷、二氯单氟甲烷等氯氟化烷烃系化合物;偶氮双异丁腈、偶氮二甲酰胺、偶氮二羧酸钡等偶氮系化合物;对甲苯磺酰肼、二苯基砜-3,3′-二磺酰肼、4,4′-氧代双(苯磺酰肼)、烯丙基双(磺酰肼)等肼系化合物;对甲苯磺酰氨基脲、4,4′-氧代双(苯磺酰氨基脲)等氨基脲系化合物;5-吗啉基-1,2,3,4-噻三唑等三唑系化合物;N,N′-二亚硝基五亚甲基四胺、N,N′-二甲基-N,N′-二亚硝基对苯二甲酰胺等N-亚硝基系化合物等。
C.基材
作为上述基材,可列举出例如树脂片、无纺布、纸、金属箔、织布、橡胶片、发泡片、它们的层叠体(特别是包含树脂片的层叠体)等。作为构成树脂片的树脂,可列举出例如聚对苯二甲酸乙二醇酯(PET)、聚萘二甲酸乙二醇酯(PEN)、聚对苯二甲酸丁二醇酯(PBT)、聚乙烯(PE)、聚丙烯(PP)、乙烯-丙烯共聚物、乙烯-乙酸乙烯酯共聚物(EVA)、聚酰胺(尼龙)、全芳香族聚酰胺(芳纶)、聚酰亚胺(PI)、聚氯乙烯(PVC)、聚苯硫醚(PPS)、氟系树脂、聚醚醚酮(PEEK)等。作为无纺布,可列举出包含马尼拉麻的无纺布等由具有耐热性的天然纤维形成的无纺布;聚丙烯树脂无纺布、聚乙烯树脂无纺布、酯系树脂无纺布等合成树脂无纺布等。作为金属箔,可列举出铜箔、不锈钢箔、铝箔等。作为纸,可列举出日本纸、牛皮纸等。上述基材可以为单层、也可以为多层。上述基材为多层时,各层的构成可以相同也可以不同。
上述基材的厚度可以根据期望的强度或柔软性、以及使用目的等而设定成任意适当的厚度。基材的厚度优选为1000μm以下、更优选为1μm~1000μm、进一步优选为1μm~500μm、特别优选为3μm~300μm、最优选为5μm~250μm。
上述基材也可以实施表面处理。作为表面处理,可列举出例如电晕处理、铬酸处理、臭氧暴露、火焰暴露、高压电击暴露、电离辐射线处理、利用底涂剂的涂布处理等。
作为上述有机涂布材料,可列举出例如“塑料硬涂材料(プラスチックハードコート材料)II(CMC出版、(2004))”中记载的材料。优选使用氨基甲酸酯系聚合物,更优选使用聚丙烯酸类氨基甲酸酯、聚酯氨基甲酸酯或它们的前体。这是因为,向基材的涂覆和/或涂布简便、并且工业上可以有多种选择并能够廉价地获得。该氨基甲酸酯系聚合物为例如由异氰酸酯单体和含醇性羟基单体(例如含羟基的丙烯酸类化合物或含羟基的酯化合物)的反应混合物形成的聚合物。有机涂布材料也可以包含多胺等链延长剂、防老剂、氧化稳定剂等作为任意的添加剂。有机涂布层的厚度没有特别限定,例如0.1μm~10μm的程度是适合的,优选为0.1μm~5μm的程度,更优选为0.5μm~5μm的程度。
D.其它粘合剂层
作为上述其它粘合剂层,可以形成任意适当的粘合剂层。作为形成其它粘合剂层的粘合剂,可列举出例如橡胶系粘合剂、丙烯酸系粘合剂、乙烯基烷基醚系粘合剂、有机硅系粘合剂、聚酯系粘合剂、聚酰胺系粘合剂、氨基甲酸酯系粘合剂、氟系粘合剂、苯乙烯-二烯嵌段共聚物系粘合剂等。在粘合剂中也可以配混例如增塑剂、填充剂、表面活性剂、防老剂、粘合性赋予剂等公知或惯用的添加剂。
其它粘合剂层的厚度优选为300μm以下、更优选为1μm~300μm、进一步优选为5μm~100μm。
E.弹性层
本发明的粘合片也可以进一步具备弹性层。弹性层可以配置在粘合剂层的单面。粘合片具备基材时,弹性层可以配置在粘合剂层和基材之间。通过具备弹性层,对被粘物的追随性提高。此外,在剥离时进行加热的情况下,具备弹性层的粘合片的、粘合剂层的面方向的变形(膨胀)受到限制,优先发生厚度方向的变形。其结果,剥离性提高。
上述弹性层包含基础聚合物,作为该基础聚合物,可以使用上述作为构成粘合剂层的基础聚合物而例示的聚合物。在一个实施方式中,上述弹性层也可以包含天然橡胶、合成橡胶、合成树脂等。作为该合成橡胶及合成树脂,可列举出腈系、二烯系、丙烯酸系的合成橡胶;聚烯烃系、聚酯系等热塑性弹性体;乙烯-乙酸乙烯酯共聚物;聚氨基甲酸酯;聚丁二烯;软质聚氯乙烯等。构成上述弹性层的基础聚合物可以与形成上述粘合剂层的基础聚合物相同、也可以不同。上述弹性层也可以为由上述基础聚合物形成的发泡薄膜。该发泡薄膜可以利用任意适当的方法来得到。需要说明的是,弹性层和粘合剂层可以通过基础聚合物的不同和/或发泡剂的有无(弹性层不包含发泡剂)来区分。更详细而言,弹性层和粘合剂层由不同的基础聚合物形成的情况等能够通过截面观察来识别弹性层和粘合剂层的界面的情况下,弹性层和粘合剂层的边界通过该界面来规定。此外,无法通过截面观察识别弹性层和粘合剂层的界面的情况下,通过截面观察而观察到发泡剂的区域为粘合剂层。
上述弹性层根据需要可以包含任意适当的添加剂。作为该添加剂,可列举出例如交联剂、硫化剂、增粘树脂、增塑剂、柔软剂、填充剂、防老剂等。作为基础聚合物使用聚氯乙烯等硬质树脂时,优选组合使用增塑剂和/或柔软剂而形成具有期望的弹性的弹性层。
上述弹性层的厚度优选为3μm~200μm、更优选为5μm~100μm。在这样的范围时,能够充分发挥弹性层的上述功能。
上述弹性层在25℃下的拉伸弹性模量优选为0.2MPa~500MPa、更优选为0.3MPa~500MPa、进一步优选为0.5MPa~500MPa。在这样的范围时,能够充分发挥弹性层的上述功能。需要说明的是,拉伸弹性模量可以基于JIS K 7161:2008来测定。
F.隔离体
本发明的粘合片根据需要可以进一步具备隔离体。该隔离体的至少一个面为剥离面,可以为了保护上述粘合剂层而设置。隔离体可以由任意适当的材料构成。
G.粘合片的制造方法
本发明的粘合片可以利用任意适当的方法来制造。本发明的粘合片可列举出例如下述方法:在基材(得到不包含基材的粘合片的情况下为任意适当的基体)上直接涂覆包含粘合剂及发泡剂的组合物的方法、或将在任意适当的基体上涂覆包含粘合剂及发泡剂的组合物而形成的涂覆层转印到基材上的方法等。包含粘合剂及发泡剂的组合物可以包含任意适当的溶剂。此外,也可以利用包含粘合剂的组合物来形成粘合剂涂覆层之后,对该粘合剂涂覆层喷洒发泡剂(热膨胀性微球),然后,使用层压机等将该发泡剂埋入该涂覆层中,从而形成包含发泡剂的粘合剂层。
粘合剂层具有上述弹性层的情况下,例如可以在基材上或粘合剂层上涂覆用于形成弹性层的组合物来形成弹性层。
作为上述各组合物的涂覆方法,可以采用任意适当的涂覆方法。例如,可以在涂布之后进行干燥而形成各层。作为涂布方法,可列举出例如使用多层涂布机、模涂机、凹版涂布机、涂抹器等的涂布方法。作为干燥方法,可列举出例如自然干燥、加热干燥等。加热干燥时的加热温度可以根据作为干燥对象的物质的特性而设定为任意适当的温度。
实施例
以下利用实施例对本发明进行具体说明,但本发明不受这些实施例的限定。实施例中的评价方法如下。需要说明的是,在下述评价中,使用将隔离体剥离之后的粘合片。此外,在实施例中,只要没有特别说明则“份”及“%”为重量基准。
<评价方法>
在下述的评价方法中,粘合剂层(及其它粘合剂层)的贴合在将层叠于贴合面的隔离体剥离之后进行。
(1)剪切粘接强度
对于实施例及比较例中得到的粘合片(尺寸:20mm×20mm),将与粘合剂层处于相反侧的面贴附于规定的基座(例如20mm×20mm硅芯片)并固定,在该粘合片的粘合剂层表面配置5mm×5mm硅芯片,将该硅芯片利用热压制机在100℃、0.1MPa的贴合条件下热压接1分钟,从而制作评价用样品。需要说明的是,不具备其它粘合剂层的粘合片向基座的固定使用日东电工株式会社制造的双面胶带No.585。
对于该评价用样品,在25℃的环境温度下,使用Nordson公司制造的dage4000在距离贴附面的高度为50μm的位置在5mm×5mm硅芯片的侧面设置测定端子,以剪切速度500μm/sec.对芯片沿水平方向施加外力,从由此得到的载荷-位移曲线读取最大破坏载荷,将其作为25℃环境温度下的剪切粘接强度。
此外,在80℃的环境温度下与上述同样地测定剪切粘接强度。
表1中示出分别测定3次的平均值。
(2)压痕硬度
利用测定装置附带的软件(triboscan)对通过将金刚石制的Berkovich型(三角锥型)探针垂直按压在实施例及比较例中得到的粘合片的粘合剂层表面(不存在发泡剂的部位)而得到的位移-载荷滞后曲线进行数值处理,测定压痕硬度H。压痕硬度H使用纳米压痕仪(Hysitron Inc公司制造的Triboindenter TI-950)利用25℃下的单一压痕法在压痕速度约500nm/sec、压痕深度约3000nm的测定条件下进行测定。
(3)蓝宝石磨削性
在实施例及比较例中得到的粘合片的粘合剂层上配置厚度900μm、4英寸尺寸的蓝宝石晶圆之后,将它们利用预先预热至90℃的热压制机以1.0MPa的压力压接5分钟。将固定有蓝宝石晶圆的粘合片设置在DISCO Inc.制造的研磨机装置DFG8540中,磨削至晶圆厚度变为120μm。磨削性基于以下的基准来评价。
〇:能够背面磨削至晶圆厚度变为120μm。
×:在晶圆厚度变为120μm之前晶圆破裂、或者晶圆端部缺损。(无法进行背面磨削)
(4)剥离性
将实施例及比较例中得到的粘合片切割成30mm×30mm,在30mm×30mm尺寸的玻璃板上贴附粘合剂层表面之后,在与粘合剂层处于相反侧的面上也配置30mm×30mm尺寸的玻璃板,利用预先预热至90℃的热压制机以0.3MPa的压力压接1分钟,制作样品。将制得的样品放置于预先预热至比粘合剂层中含有的热膨胀性微球的发泡起始温度高30℃的温度的热板上,确认加热5分钟时的加热剥离性。剥离性基于以下的基准进行评价。需要说明的是,对于不具备其它粘合剂层的粘合片,与粘合剂层处于相反侧的面与玻璃板的固定使用日东电工株式会社制造的双面胶带No.585。
〇:加热后,粘合剂层侧的玻璃板能够分离。
×:加热后,粘合剂层侧的玻璃板也无法分离。
[实施例1]
将马来酸改性苯乙烯·乙烯·丁烯·苯乙烯嵌段共聚物(a)(SEBS:苯乙烯部位/乙烯·丁烯部位(重量比)=30/70、酸值:10(mg-CH3ONa/g)、旭化成化学株式会社制造、商品名“Tuftec M1913”)100重量份、萜烯酚系增粘树脂(YASUHARA CHEMICAL CO.,LTD.制造、商品名“YS Polystar T80”)25重量份、环氧系交联剂(三菱瓦斯化学株式会社制造、商品名“TETRAD-C”)3重量份、热膨胀性微球(松本油脂制药株式会社制造、商品名“MatsumotoMicrosphere F-50D”、发泡起始温度120℃、平均粒径14μm)30重量份、磷酸酯系表面活性剂(东邦化学工业株式会社制造、商品名“Phosphanol RL210”、分子量422.57、化学式:C22H47O5P、烷基的碳数:18)3重量份、和作为溶剂的甲苯混合,制备树脂组合物(I)(混合物)。将该树脂组合物(I)涂布在隔离体上,使得干燥后的厚度为40μm,进行干燥而形成粘合剂层。进而,将隔离体上的粘合剂层与另一隔离体贴合,制作具有隔离体/粘合剂层/隔离体的层构成的粘合片。
将得到的粘合片供于上述评价(1)~(4)。将结果示于表1。
[实施例2~5]
将增粘树脂及热膨胀性微球的添加量设为表1所示的量,除此以外,与实施例1同样操作,得到粘合片。将得到的粘合片供于上述评价(1)~(4)。将结果示于表1。
[实施例6]
代替马来酸改性苯乙烯·乙烯·丁烯·苯乙烯嵌段共聚物(a),使用苯乙烯部位/乙烯·丁烯部位(重量比)为20/80的马来酸改性苯乙烯·乙烯·丁烯·苯乙烯嵌段共聚物(b)(酸值:10(mg-CH3ONa/g)、旭化成化学株式会社制造、商品名“Tuftec M1943”),将增粘树脂及热膨胀性微球的添加量设为表1所示的量,除此以外,与实施例1同样操作,得到粘合片。将得到的粘合片供于上述评价(1)~(4)。将结果示于表1。
[实施例7]
代替马来酸改性苯乙烯·乙烯·丁烯·苯乙烯嵌段共聚物(a),使用苯乙烯部位/乙烯·丁烯部位(重量比)为70/30的苯乙烯·乙烯·丁烯·苯乙烯嵌段共聚物(c)(未酸改性品、旭化成化学株式会社制造、商品名“Tuftec H1043”),将增粘树脂及热膨胀性微球的添加量设为表1所示的量,除此以外,与实施例1同样操作,得到粘合片。将得到的粘合片供于上述评价(1)~(4)。将结果示于表1。
[实施例8]
将马来酸改性苯乙烯·乙烯·丁烯·苯乙烯嵌段共聚物(a)(SEBS:苯乙烯部位/乙烯·丁烯部位(重量比)=30/70、酸值:10(mg-CH3ONa/g)、旭化成化学株式会社制造、商品名“Tuftec M1913”)100重量份、萜烯酚系增粘树脂(YASUHARA CHEMICAL CO.,LTD.制造、商品名“YS Polystar T80”)50重量份、环氧系交联剂(三菱瓦斯化学株式会社制造、商品名“TETRAD-C”)3重量份、热膨胀性微球(松本油脂制药株式会社制造、商品名“MatsumotoMicrosphere F-50D”、发泡起始温度120℃、平均粒径14μm)50重量份、磷酸酯系表面活性剂(东邦化学工业株式会社制造、商品名“Phosphanol RL210”、分子量422.57、烷基的碳数:18)3重量份、和作为溶剂的甲苯混合,制备树脂组合物(II)(混合物)。
在PET基材(厚度:50μm)的一个面涂布树脂组合物(II),使得干燥后的厚度成为40μm,进行干燥而形成粘合剂层。进而,在粘合剂层上贴合隔离体。
接着,将丙烯酸系树脂(丙烯酸丁酯-丙烯酸共聚物、丙烯酸丁酯:丙烯酸(重量比)=100:5)100重量份、氨基甲酸酯系交联剂(Nippon Polyurethane Industry Co.,Ltd.,制造、商品名“Coronate L”)1重量份、和作为溶剂的甲苯混合,制备树脂组合物(A)。将该树脂组合物(A)涂布于上述PET基材的另一个面,使得干燥后的厚度成为10μm,进行干燥而形成其它粘合剂层。进而,在该其它粘合剂层上贴合隔离体。
如上操作,得到具有隔离体/粘合剂层/基材/其它粘合剂层/隔离体的层构成的粘合片。将得到的粘合片供于上述评价(1)~(4)。将结果示于表1。
[实施例9]
在PET基材(厚度:50μm)的一个面上涂布实施例8中制备的树脂组合物(II),使得干燥后的厚度成为40μm,进行干燥而形成粘合剂层。进而,在粘合剂层上贴合隔离体。
接着,在基材的另一个面上也涂布实施例8中制备的树脂组合物(II),使得干燥后的厚度成为40μm,进行干燥而形成粘合剂层。进而,在粘合剂层上贴合隔离体。
如上操作,得到具有隔离体/粘合剂层/基材/其它粘合剂层/隔离体的层构成的粘合片。将得到的粘合片供于上述评价(1)~(4)。将结果示于表1。
[实施例10]
在PET基材(厚度:50μm)的一个面上涂布实施例8中制备的树脂组合物(II),使得干燥后的厚度成为40μm,进行干燥而形成粘合剂层。进而,在粘合剂层上贴合隔离体。
接着,将马来酸改性苯乙烯·乙烯·丁烯·苯乙烯嵌段共聚物(a)(SEBS:苯乙烯部位/乙烯·丁烯部位(重量比)=30/70、酸值:10(mg-CH3ONa/g)、旭化成化学株式会社制造、商品名“Tuftec M1913”)100重量份、萜烯酚系增粘树脂(YASUHARA CHEMICAL CO.,LTD.制造、商品名“YS Polystar T80”)50重量份、环氧系交联剂(三菱瓦斯化学株式会社制造、商品名“TETRAD-C”)3重量份、磷酸酯系表面活性剂(东邦化学工业株式会社制造、商品名“Phosphanol RL210”、分子量422.57、烷基的碳数:18)3重量份、和作为溶剂的甲苯混合,制备树脂组合物(II’)(混合物)。
将该树脂组合物(II’)涂布于上述PET基材的另一个面,使得干燥后的厚度成为10μm,进行干燥而形成其它粘合剂层。进而,在该其它粘合剂层上贴合隔离体。
如上操作,得到具有隔离体/粘合剂层/基材/其它粘合剂层/隔离体的层构成的粘合片。将得到的粘合片供于上述评价(1)~(4)。将结果示于表1。
[表1]
[实施例11~19]
将增粘树脂及热膨胀性微球的添加量设为表1所示的量,以表1所示的添加量使用表1所示的表面活性剂,除此以外,与实施例1同样操作,得到粘合片。将得到的粘合片供于上述评价(1)~(4)。将结果示于表2。需要说明的是,实施例11~19中使用的表面活性剂如下所述。
实施例11:脂肪酸酯系表面活性剂;花王株式会社制造、商品名“EXEPARL IPP”、化学式:C19H38O2、烷基的碳数:16、分子量:298.50
实施例12:脂肪酸酰胺系表面活性剂;东京化成工业株式会社制造、硬脂酸酰胺、化学式:C18H37NO、烷基的碳数:18、分子量:283.49
实施例13:脂肪酸酰胺系表面活性剂;东京化成工业株式会社制造、月桂酸酰胺、化学式:C12H25NO、烷基的碳数:12、分子量:199.33
实施例14:脂肪酸氨基烷基酰胺系表面活性剂;东邦化学工业株式会社制造、商品名“Catinal MAPS”、化学式:C23H38N2O、烷基的碳数:18、分子量:358.56
实施例15:氯化三甲基铵系表面活性剂;东邦化学工业株式会社制造、商品名“Catinal STC-70ET”、化学式:C21H46ClN、烷基的碳数:16、分子量:348.04
实施例16:氯化二甲基苄基铵系表面活性剂;三洋化成株式会社制造、商品名“CATION S”、化学式:C26H48ClN、烷基的碳数:18、分子量:410.11
实施例17:琥珀酸酐系表面活性剂;三洋化成工业株式会社制造、商品名“DSA”、化学式:C16H26O3、烷基的碳数:12、分子量:266.37
实施例18:琥珀酸酐系表面活性剂;三洋化成工业株式会社制造、商品名“PDSA-DA”、化学式:C19H32O3、烷基的碳数:15、分子量:308.45
实施例19:磺基琥珀酸钠系表面活性剂;三洋化成工业株式会社制造、商品名“Sansepara 100”、化学式:C20H27O7SNa、烷基的碳数:6、分子量:434.48
[表2]
[比较例1]
将乙烯·乙酸乙烯酯共聚树脂(三菱化学株式会社制造、商品名“EV-40W”)100重量份、热膨胀性微球(松本油脂制药株式会社制造、商品名“Matsumoto Microsphere F-50D”、发泡起始温度120℃、平均粒径14μm)50重量份、和作为溶剂的甲苯混合,制备树脂组合物C1(混合物)。将该树脂组合物C1涂布于隔离体上,使得干燥后的厚度成为40μm,进行干燥而形成粘合剂层。进而,将隔离体上的粘合剂层与另一隔离体贴合,制作具有隔离体/粘合剂层/隔离体的层构成的粘合片。
将得到的粘合片供于上述评价(1)~(4)。将结果示于表3。
[比较例2]
代替乙烯·乙酸乙烯酯共聚树脂(三菱化学株式会社制造、商品名“EV-40W”),使用乙烯·乙酸乙烯酯共聚树脂(三菱化学株式会社制造、商品名“EV-150”),除此以外,与比较例1同样操作,得到粘合片。将得到的粘合片供于上述评价(1)~(4)。将结果示于表3。
[比较例3]
将丙烯酸系树脂(丙烯酸丁酯-丙烯酸共聚物、丙烯酸丁酯:丙烯酸(重量比)=100:5)100重量份、氨基甲酸酯系交联剂(Nippon Polyurethane Industry Co.,Ltd.,制造、商品名“Coronate L”)1重量份、热膨胀性微球(松本油脂制药株式会社制造、商品名“Matsumoto Microsphere F-50D”、发泡起始温度120℃、平均粒径14μm)30重量份、和作为溶剂的甲苯混合,制备树脂组合物C2。将该树脂组合物C2涂布于隔离体上,使得干燥后的厚度成为40μm,进行干燥而形成粘合剂层。进而,将隔离体上的粘合剂层与另一隔离体贴合,制作具有隔离体/粘合剂层/隔离体的层构成的粘合片。
将得到的粘合片供于上述评价(1)~(4)。将结果示于表3。
[表3]
附图标记说明
10 粘合剂层
20 基材
30 其它粘合剂层
100、200、300 粘合片
Claims (15)
1.一种粘合片,其为具备粘合剂层的粘合片,
该粘合剂层包含:含有基础聚合物和表面活性剂的粘合剂、和发泡温度为90℃以上的发泡剂,该表面活性剂具有碳数为5~20的直链状或支链状的烷基,
将该粘合片的粘合面贴合于硅芯片时的剪切粘接强度在25℃的环境温度下为1.0MPa以上,并且在80℃的环境温度下为0.2MPa以上。
2.根据权利要求1所述的粘合片,其中,所述粘合剂层在25℃下的压痕硬度H为10MPa~1GPa。
3.根据权利要求1或2所述的粘合片,其中,所述粘合剂中包含的基础聚合物为热塑性弹性体。
4.根据权利要求3所述的粘合片,其中,所述热塑性弹性体为苯乙烯系弹性体。
5.根据权利要求1~4中任一项所述的粘合片,其中,所述粘合剂还包含增粘树脂。
6.根据权利要求5所述的粘合片,其中,所述增粘树脂的含量相对于所述基础聚合物100重量份为20重量份~350重量份。
7.根据权利要求1所述的粘合片,其中,所述表面活性剂的含量相对于所述基础聚合物100重量份为0.001重量份~15重量份。
8.根据权利要求1~7中任一项所述的粘合片,其中,所述发泡剂为热膨胀性微球。
9.根据权利要求8所述的粘合片,其中,所述热膨胀性微球的含量相对于所述基础聚合物100重量份为20重量份~210重量份。
10.根据权利要求1~9中任一项所述的粘合片,其还具备配置在所述粘合剂层的至少单侧的基材。
11.根据权利要求1~10中任一项所述的粘合片,其还具备配置在所述粘合剂层的至少单侧的其它粘合剂层。
12.根据权利要求11所述的粘合片,其中,所述基材配置在所述粘合剂层和所述其它粘合剂层之间。
13.根据权利要求1~12中任一项所述的粘合片,其作为半导体制造工序中的基板加工时的临时固定材料使用。
14.一种基板的磨削方法,其包括:将基板载置在具备粘合剂层的粘合片的该粘合剂层上并固定之后,对该基板的与粘合剂层侧处于相反侧的面进行磨削,
该粘合剂层包含:含有基础聚合物和表面活性剂的粘合剂、和发泡温度为90℃以上的发泡剂,该表面活性剂具有碳数为5~20的直链状或支链状的烷基,
将该粘合片的粘合面贴合于硅芯片时的剪切粘接强度在25℃的环境温度下为1.0MPa以上,并且在80℃的环境温度下为0.2MPa以上。
15.一种芯片的制造方法,其包括如下的磨削工序:将基板载置在具备粘合剂层的粘合片的该粘合剂层上并固定之后,对该基板的与粘合剂层侧处于相反侧的面进行磨削,
该粘合剂层包含:含有基础聚合物和表面活性剂的粘合剂、和发泡温度为90℃以上的发泡剂,该表面活性剂具有碳数为5~20的直链状或支链状的烷基,
将该粘合片的粘合面贴合于硅芯片时的剪切粘接强度在25℃的环境温度下为1.0MPa以上,并且在80℃的环境温度下为0.2MPa以上。
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