CN112415283B - Antenna test fixture and antenna test system - Google Patents

Antenna test fixture and antenna test system Download PDF

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Publication number
CN112415283B
CN112415283B CN202011287730.6A CN202011287730A CN112415283B CN 112415283 B CN112415283 B CN 112415283B CN 202011287730 A CN202011287730 A CN 202011287730A CN 112415283 B CN112415283 B CN 112415283B
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China
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antenna
assembly
signal
coaxial cable
coaxial connector
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CN202011287730.6A
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CN112415283A (en
Inventor
曾士齐
刘祐成
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Universal Scientific Industrial Shanghai Co Ltd
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Universal Scientific Industrial Shanghai Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/10Radiation diagrams of antennas

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention discloses an antenna test fixture and an antenna test system. The antenna test fixture comprises a circuit substrate, a coaxial connector, a signal contact and two grounding contacts. The coaxial connector is coupled to the circuit substrate. The signal contact is arranged on the circuit substrate and is electrically connected with the coaxial connector. The two ground contacts are disposed on the circuit substrate. The signal contact is located between two ground contacts. The signal contacts and the two ground contacts are arranged linearly along the edge of the circuit substrate. The antenna test system comprises a test device, a first antenna assembly, a first coaxial cable, a second antenna assembly, an antenna test fixture, a second coaxial cable, a probe assembly and a third coaxial cable.

Description

Antenna test fixture and antenna test system
Technical Field
The present invention relates to an antenna testing jig and an antenna testing system, and more particularly, to an antenna testing jig and an antenna testing system suitable for different frequency bands and capable of saving cost.
Background
Currently, an OTA path loss test of an antenna is performed by feeding a signal to a horn antenna (an antenna to be tested) through a coaxial cable. However, in the development of the fifth generation mobile communication technology (5G), millimeter wave (mmw) antennas are generally small in size (measured in millimeters) due to the characteristics of the high frequency short wavelength of 5G millimeter waves. The millimeter wave antenna cannot be fed with signals via the coaxial cable.
In the prior art, there are also performance tests using a chip antenna as a reference antenna. However, the chip antenna is limited to a special process thereof, and thus has disadvantages of high cost and inelastic band design (fixed at 18GHz to 26 GHz).
Therefore, how to overcome the above-mentioned drawbacks by improving the structural design has become one of the important problems to be solved by this industry.
Disclosure of Invention
The invention aims to solve the technical problem of providing an antenna test fixture aiming at the defects in the prior art, which comprises: the circuit board comprises a circuit substrate, a coaxial connector, a signal contact and two grounding contacts. The coaxial connector is coupled to the circuit substrate. The signal contact is arranged on the circuit substrate and is electrically connected with the coaxial connector. The two ground contacts are disposed on the circuit substrate. The signal contact is located between two ground contacts, and the signal contact and the two ground contacts are arranged linearly along the edge of the circuit substrate.
Preferably, the coaxial joint is an SMA joint.
In order to solve the above-mentioned problems, another technical solution adopted by the present invention is to provide an antenna testing system, which includes a testing device, a first antenna assembly, a first coaxial cable, a second antenna assembly, an antenna testing fixture, a second coaxial cable, a probe assembly and a third coaxial cable. The first antenna assembly emits an electrical wave signal. The second antenna assembly receives the electric wave signal, and the second antenna assembly is separated from the first antenna assembly by a predetermined distance. The first coaxial cable is connected between the first antenna assembly and the testing device. The second coaxial cable is connected between the second antenna assembly and the antenna testing jig. A third coaxial cable is connected between the probe assembly and the testing device.
Preferably, the antenna test system further comprises: and the second coaxial connector is coupled to the second antenna assembly, one end of the second coaxial cable is connected with the second coaxial connector, and the other end of the second coaxial cable is connected with the coaxial connector.
Preferably, the antenna test system further comprises: and the third coaxial connector is coupled to the probe assembly, wherein one end of the third coaxial cable is connected with the third coaxial connector, and the other end of the third coaxial cable is connected with the testing device.
Preferably, the antenna test system further comprises: the connecting arm is connected with the probe assembly and used for moving the probe assembly to enable the probe head to contact the signal contact and the two grounding contacts.
Preferably, the first antenna assembly and the second antenna assembly are horn antennas.
Preferably, the coaxial connector, the second coaxial connector and the third coaxial connector are SMA connectors.
Preferably, the testing device is a vector network analyzer.
Preferably, the test device is used for emitting a test signal, and the test device measures the generated signal loss by the test signal passing through a signal transmission path.
Preferably, the signal transmission path is formed by a first coaxial cable, a first antenna element, a second antenna element, wireless transmission between the first antenna element and the second antenna element, a second coaxial cable, a probe element, and a third coaxial cable, and the signal loss includes cable signal loss caused by the first coaxial cable, the second coaxial cable, and the third coaxial cable, antenna signal loss caused by the first antenna element and the second antenna element, signal loss caused by wireless transmission between the first antenna element and the second antenna element, and probe signal loss caused by the probe element.
The antenna test fixture provided by the invention has the beneficial effects that the antenna test fixture can be used for providing a test fixture for testing and correcting different reference antennas by adopting the technical scheme that the coaxial connector is coupled to the circuit substrate and the signal contact is arranged on the circuit substrate and is electrically connected with the coaxial connector, so that various defects caused by the fact that the reference antenna type in the prior art only adopts a chip antenna are overcome.
The antenna test system provided by the invention has the beneficial effects that the coaxial connector is electrically connected with the signal contact point of the antenna test fixture, and the probe assembly is provided with the probe head, and the probe assembly is electrically connected with the coaxial connector through the signal contact point and the grounding contact point of the probe head, so that the antenna test system provides a test fixture for testing and correcting different reference antennas, the correction plane can be prolonged to the probe head of the probe assembly, the measured system loss comprises the effect of the probe assembly, and the total path loss of the antenna test system is measured more accurately.
For a further understanding of the nature and the technical aspects of the present invention, reference should be made to the following detailed description of the invention and the accompanying drawings, which are provided for purposes of reference only and are not intended to limit the invention.
Drawings
Fig. 1 is a schematic top view of the antenna testing fixture of the present invention.
Fig. 2 is a schematic diagram of an antenna testing system according to the present invention.
Fig. 3 is a schematic diagram of a probe and an antenna test fixture of the antenna test system of the present invention.
Fig. 4 is a schematic diagram of a second antenna assembly, an antenna testing jig and a probe of the antenna testing system according to the present invention.
Detailed Description
The following specific embodiments are presented to illustrate the embodiments of the present invention related to an antenna testing jig and an antenna testing system, and those skilled in the art will be able to understand the advantages and effects of the present invention from the disclosure herein. The invention is capable of other and different embodiments and its several details are capable of modifications and various other uses and applications, all of which are obvious from the description, without departing from the spirit of the invention. The drawings of the present invention are merely schematic illustrations, and are not intended to be drawn to actual dimensions. The following embodiments will further illustrate the related art content of the present invention in detail, but the disclosure is not intended to limit the scope of the present invention.
It will be understood that, although the terms "first," "second," "third," etc. may be used herein to describe various elements, these elements should not be limited by these terms. These terms are used primarily to distinguish one element from another element. In addition, the term "or" as used herein shall include any one or combination of more of the associated listed items as the case may be.
Examples (example)
First, referring to fig. 1, the present invention provides an antenna testing fixture 1, which includes a circuit substrate 11, a coaxial connector 12, a signal contact 13, and two ground contacts 14. The coaxial connector 12 is coupled to the circuit substrate 11. The signal contact 13 and the two ground contacts 14 are disposed on the circuit substrate 11, and the signal contact 13 is electrically connected to the coaxial connector 12. As shown in fig. 1, the circuit substrate 11 has a substantially rectangular shape with a first side 111 and a second side 112 opposite to each other. The coaxial connector 12 is coupled to the circuit substrate 11 at a position closer to the first side 111. The signal contact 13 and the two ground contacts 14 are closer to the second side 112, and the signal contact 13 and the two ground contacts 14 are linearly arranged along the edge of the circuit substrate 11, and the signal contact 13 is located between the two ground contacts 14.
In the present invention, the circuit board 11 is PCB (Printed Circuit Board) board, the coaxial connector 12 is SMA (SubMiniature version A) connector, but the present invention is not limited thereto. For example, the antenna test fixture 1 may be a set of calibration tools having two ports. One of the ports is a 2.92 millimeter (mm) SMA connector, and the other port is a ground-signal-ground (GSG) contact assembly consisting of a signal contact 13 and two ground contacts 14. The signal contacts 13 and the two ground contacts 1 are contact points for the lower pins of the microprobe (MicroSeries Probes).
Referring to fig. 2, the present invention provides an antenna testing system Z, which includes an antenna testing fixture 1, a testing device 2, a first antenna assembly 3, a first coaxial cable 4, a second antenna assembly 5, a second coaxial cable 6, a probe assembly 7, and a third coaxial cable 8. A first coaxial cable 4 is connected between the first antenna assembly 3 and the testing device 2. The second coaxial cable 6 is connected between the second antenna assembly 5 and the antenna test fixture 1. A third coaxial cable 8 is connected between the probe assembly 7 and the testing device 2. That is, the first coaxial cable 4, the second coaxial cable 6 and the third coaxial cable 8 are connected in series to the antenna test fixture 1, the test device 2, the first antenna assembly 3, the second antenna assembly 5 and the probe assembly 7 in the antenna test system Z.
The first antenna element 3 is spaced apart from the second antenna element 5 by a predetermined distance H, and the first antenna element 3 and the second antenna element 5 can transmit signals through radio wave radiation. For example, the first antenna element 3 is a measuring antenna, which is used as a transmitting end to transmit the radio wave signal, and the second antenna element 5 is a measuring antenna, which is used as a receiving end to receive the radio wave signal. The magnitude of the predetermined distance H between the first antenna element 3 and the second antenna element 5 affects the intensity of the radio wave signal received by the second antenna element 5.
Therefore, the antenna test system Z is electrically connected in series through the antenna assembly and the coaxial cable, so as to form a signal transmission path. For example, the signal calibration device 2 can be used as a signal source to send out a test signal. The test signal is transmitted to the first antenna assembly 3 through the first coaxial cable 4, and the first antenna assembly 3 receives the test signal and then emits the test signal (electric wave signal) in the form of electromagnetic waves. The test signal propagates in the air and is received by the second antenna assembly 5, and is transmitted to the antenna test fixture 1 via the second coaxial cable 6, and then the test signal is transmitted to the test device 2 via the third coaxial cable 8.
Referring to fig. 3 and 4, fig. 3 is a schematic diagram of a probe and an antenna testing jig of the antenna testing system according to the present invention, and fig. 4 is a schematic diagram of a second antenna assembly, an antenna testing jig and a probe of the antenna testing system according to the present invention. The antenna test fixture 1 comprises a circuit substrate 11, a coaxial connector 12, a signal contact 13 and two grounding contacts 14. The coaxial connector 12 is coupled to the circuit substrate 11, and the coaxial connector 12 is used for connecting the second coaxial cable 6 and connecting to the second antenna assembly 5 through the second coaxial cable 6. The signal contact 13 is disposed on the circuit substrate 11, the signal contact 13 is electrically connected to the coaxial connector 12, and the signal contact 13 is used for contacting with the probe assembly 7. Two ground contacts 14 are provided on the circuit substrate 11, and the signal contact 13 is located between the two ground contacts 14. The signal contacts 13 and the two ground contacts 14 are arranged linearly along the edge of the circuit substrate 11, such that the signal contacts 13 and the two ground contacts 14 form a ground-signal-ground (GSG) contact assembly.
The probe assembly 7 has a probe head 71, and the probe assembly 7 contacts the signal contacts 13 and the two ground contacts 14 through the probe head 71 to electrically connect the coaxial connectors. Furthermore, the antenna testing system Z further comprises a connecting arm 9, the connecting arm 9 being connected to the probe assembly 7, the connecting arm 9 being configured to move the probe assembly 7 such that the probe head 71 contacts the signal contact 13 and the two ground contacts 14. The attachment arm 9 and probe assembly 7 may be fixedly coupled using a plurality of fasteners, such as, but not limited to, screws. Further, first, when the probe head 71 is to contact the signal contact 13 and the two ground contacts 14, the connection arm 9 moves the probe assembly 7 to move the probe head 71 to the position right above the signal contact 13 and the two ground contacts 14 for alignment. Then, the connecting arm 9 continues to move the probe assembly 7, and the probe head 71 moves down and contacts the signal contact 13 and the two ground contacts 14, so that the signal contact 13 and the two ground contacts 14 are electrically connected with the probe head 71.
With continued reference to fig. 4, the antenna testing system Z further includes a second coaxial connector 50 and a third coaxial connector 70. The second coaxial connector 50 is coupled to the second antenna assembly 5, and the third coaxial connector 70 is coupled to the probe assembly 7. One end of the second coaxial cable 6 is connected to the second coaxial connector 50 and the other end is connected to the coaxial connector 12. One end of the third coaxial cable 8 is connected to the third coaxial connector 70, and the other end is connected to the testing device 2.
In the present invention, the test device 2 is a vector network analyzer (Vector Network Analyzer, VNA). The Coaxial cables (the first Coaxial cable 4, the second Coaxial cable 6, and the third Coaxial cable 8) may be Coaxial cables (Coaxial cables). The second coaxial connector 50 and the coaxial connector 12 for connecting two ends of the second coaxial cable 6, and the third coaxial connector 70 for connecting one end of the third coaxial cable 8 may be SMA (SubMiniature version A) connectors, but the invention is not limited thereto. Both the first Antenna element 3 and the second Antenna element 5 are Horn antennas (horns) for calibration, wherein the first Antenna element 3 is a measuring Antenna and the second Antenna element 5 is an Antenna to be measured.
As described above, the vector network analyzer (i.e., the testing device 2) can send out a test signal as a signal source. Therefore, the performance and the characteristics of the device to be tested are determined by the signal transmission path through which the test signal passes. Furthermore, the signal loss generated by the antenna test system Z is measured by the test signal through a signal transmission path.
With continued reference to fig. 2, in particular, the signal transmission path is formed by the first coaxial cable 4, the first antenna element 3, the second antenna element 5, the Over The Air (OTA) between the first antenna element 3 and the second antenna element 5, the second coaxial cable 6, the probe element 7 and the third coaxial cable 8. The signal loss generated by the antenna test system Z includes cable signal loss caused by the first coaxial cable 4, the second coaxial cable 6 and the third coaxial cable 8, antenna signal loss caused by the first antenna element 3 and the second antenna element 5, signal loss (OTA path loss) caused by wireless transmission between the first antenna element 3 and the second antenna element 5, and probe signal loss caused by the probe element 7.
Advantageous effects of the embodiments
One of the advantages of the present invention is that the antenna test fixture provided by the present invention can be used for providing a test fixture for checking an antenna to be tested (the second antenna assembly 5) by means of the technical scheme that the coaxial connector 12 is coupled to the circuit substrate 11 and the signal contact 13 is disposed on the circuit substrate 11, and the signal contact 13 is electrically connected to the coaxial connector 12, so as to overcome the defect that the millimeter wave antenna in the prior art is too small to be fed through the coaxial cable.
The antenna test system Z provided by the invention has the beneficial effects that the antenna test system Z can be used for testing antenna components in different frequency bands by means of the technical scheme that the signal contact of the antenna test fixture 1 is electrically connected with the coaxial connector 12, and the probe component 7 is provided with the probe head 71, and the probe component 7 is electrically connected with the coaxial connector 12 by means of the signal contact 13 and the grounding contact 14 which are contacted with the probe head 71, so that the antenna test fixture 1 is provided, and the antenna test system Z is different from the prior art that a chip antenna is limited in a fixed frequency band. In addition, the antenna test system Z provided by the present invention extends the calibration plane to the probe head 71 of the probe assembly 7 through the antenna test fixture 1, so that the test device 2 (vector network analyzer) can more precisely measure the total path loss of the antenna test system Z.
Further, since millimeter wave (mmw) antennas are generally small in size (in millimeters), the millimeter wave antennas cannot be aligned to the interface between the cable and the alignment antenna by directly feeding signals into the antenna in the prior art as in the prior art with a coaxial cable, and the measured system path loss cannot include the loss of the probe. By using the designed calibration tool, the calibration plane can be extended to the tip of the micro probe station, and the measured system loss includes the effect of the probe, so as to achieve more accurate measurement of the total path loss of the system.
The foregoing disclosure is only a preferred embodiment of the present invention and is not intended to limit the scope of the claims, so that all equivalent technical changes made by the application of the present invention and the accompanying drawings are included in the scope of the claims.

Claims (11)

1. An antenna test fixture, its characterized in that, antenna test fixture includes:
a circuit substrate;
a coaxial connector coupled to the circuit substrate, the coaxial connector being for connecting a coaxial cable and being connected to an antenna assembly by the coaxial cable;
the signal contact is arranged on the circuit substrate and is electrically connected with the coaxial connector, and the signal contact is used for being in contact with the probe assembly; and
and the two grounding contacts are arranged on the circuit substrate, wherein the signal contact is positioned between the two grounding contacts, and the signal contact and the two grounding contacts are linearly arranged along the edge of the circuit substrate.
2. The antenna test fixture of claim 1, wherein the coaxial joint is an SMA joint.
3. An antenna testing system, the antenna testing system comprising:
a testing device;
a first antenna assembly for transmitting an electric wave signal;
a first coaxial cable connected between the first antenna assembly and the testing device;
the second antenna component is used for receiving the electric wave signals and is separated from the first antenna component by a preset distance;
the antenna test fixture comprises a circuit substrate, a coaxial connector, a signal contact and two grounding contacts, wherein the coaxial connector is coupled to the circuit substrate, the signal contact is arranged on the circuit substrate and is electrically connected with the coaxial connector, the two grounding contacts are arranged on the circuit substrate, the signal contact is positioned between the two grounding contacts, and the signal contact and the two grounding contacts are linearly arranged along the edge of the circuit substrate;
the second coaxial cable is connected between the second antenna assembly and the antenna test jig;
the probe assembly is provided with a probe head, and the probe assembly contacts the signal contact and the two grounding contacts through the probe head so as to be electrically connected with the coaxial connector; and
a third coaxial cable is connected between the probe assembly and the testing device.
4. The antenna testing system of claim 3, wherein the antenna testing system further comprises: and a second coaxial connector coupled to the second antenna assembly, wherein one end of the second coaxial cable is connected to the second coaxial connector, and the other end is connected to the coaxial connector.
5. The antenna testing system of claim 4, wherein the antenna testing system further comprises: and a third coaxial connector coupled to the probe assembly, wherein one end of the third coaxial cable is connected to the third coaxial connector, and the other end is connected to the testing device.
6. The antenna testing system of claim 5, wherein the coaxial connector, the second coaxial connector, and the third coaxial connector are SMA connectors.
7. The antenna testing system of claim 3, wherein the antenna testing system further comprises: and the connecting arm is connected with the probe assembly and used for moving the probe assembly to enable the probe head to contact the signal contact and the two grounding contacts.
8. The antenna testing system of claim 3, wherein the first antenna assembly and the second antenna assembly are horn antennas.
9. The antenna test system of claim 3, wherein the test device is a vector network analyzer.
10. The antenna test system of claim 3, wherein the test device is configured to emit a test signal and measure the signal loss by passing the test signal through a signal transmission path.
11. The antenna testing system of claim 10, wherein the signal transfer path is formed by the first coaxial cable, the first antenna assembly, the second antenna assembly, wireless transmissions between the first antenna assembly and the second antenna assembly, the second coaxial cable, the probe assembly, and the third coaxial cable together, the signal loss including cable signal loss caused by the first coaxial cable, the second coaxial cable, and the third coaxial cable, antenna signal loss caused by the first antenna assembly and the second antenna assembly, signal loss caused by wireless transmissions between the first antenna assembly and the second antenna assembly, and probe signal loss caused by the probe assembly.
CN202011287730.6A 2020-11-17 2020-11-17 Antenna test fixture and antenna test system Active CN112415283B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202011287730.6A CN112415283B (en) 2020-11-17 2020-11-17 Antenna test fixture and antenna test system

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Application Number Priority Date Filing Date Title
CN202011287730.6A CN112415283B (en) 2020-11-17 2020-11-17 Antenna test fixture and antenna test system

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CN112415283A CN112415283A (en) 2021-02-26
CN112415283B true CN112415283B (en) 2023-12-22

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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103575996A (en) * 2013-09-25 2014-02-12 苏州佳世达电通有限公司 Antenna detection device
CN208240879U (en) * 2018-05-04 2018-12-14 青岛真时科技有限公司 A kind of antenna coupler
CN110031689A (en) * 2019-05-08 2019-07-19 深圳沸石智能技术有限公司 A kind of antenna measurement device and method
US10520535B1 (en) * 2016-07-28 2019-12-31 Amazon Technologies, Inc. Groundless radio frequency test probe
CN110879315A (en) * 2018-09-05 2020-03-13 矽品精密工业股份有限公司 Test fixture
CN211122948U (en) * 2019-10-24 2020-07-28 昆山联滔电子有限公司 Antenna test fixture and antenna test system

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103575996A (en) * 2013-09-25 2014-02-12 苏州佳世达电通有限公司 Antenna detection device
US10520535B1 (en) * 2016-07-28 2019-12-31 Amazon Technologies, Inc. Groundless radio frequency test probe
CN208240879U (en) * 2018-05-04 2018-12-14 青岛真时科技有限公司 A kind of antenna coupler
CN110879315A (en) * 2018-09-05 2020-03-13 矽品精密工业股份有限公司 Test fixture
CN110031689A (en) * 2019-05-08 2019-07-19 深圳沸石智能技术有限公司 A kind of antenna measurement device and method
CN211122948U (en) * 2019-10-24 2020-07-28 昆山联滔电子有限公司 Antenna test fixture and antenna test system

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