CN112415283A - Antenna test fixture and antenna test system - Google Patents

Antenna test fixture and antenna test system Download PDF

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Publication number
CN112415283A
CN112415283A CN202011287730.6A CN202011287730A CN112415283A CN 112415283 A CN112415283 A CN 112415283A CN 202011287730 A CN202011287730 A CN 202011287730A CN 112415283 A CN112415283 A CN 112415283A
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China
Prior art keywords
antenna
signal
coaxial
coaxial cable
assembly
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CN202011287730.6A
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CN112415283B (en
Inventor
曾士齐
刘祐成
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Universal Scientific Industrial Shanghai Co Ltd
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Universal Scientific Industrial Shanghai Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/10Radiation diagrams of antennas

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention discloses an antenna test fixture and an antenna test system. The antenna test fixture comprises a circuit substrate, a coaxial connector, a signal contact and two grounding contacts. The coaxial connector is coupled to the circuit substrate. The signal contact is arranged on the circuit substrate and is electrically connected with the coaxial connector. Two ground contacts are provided on the circuit board. The signal contact is located between two ground contacts. The signal contacts and the two ground contacts are linearly arranged along the edge of the circuit substrate. The antenna test system comprises a test device, a first antenna assembly, a first coaxial cable, a second antenna assembly, an antenna test fixture, a second coaxial cable, a probe assembly and a third coaxial cable.

Description

Antenna test fixture and antenna test system
Technical Field
The present invention relates to an antenna test fixture and an antenna test system, and more particularly, to an antenna test fixture and an antenna test system suitable for different frequency bands and capable of reducing the cost.
Background
At present, the OTA path loss test of the antenna is performed by feeding a signal to a horn antenna (antenna to be tested) through a coaxial cable by using the horn antenna (measuring antenna). However, in the development of the fifth generation mobile communication technology (5G), the size of a millimeter wave (mmw) antenna is generally small (measured in millimeters) due to the high frequency short wavelength characteristic of the 5G millimeter wave. The millimeter wave antenna cannot feed signals through the coaxial cable.
In the prior art, a performance test is also performed by using a chip antenna as a reference antenna. However, the chip antenna is limited by its special process, and thus has the disadvantages of high cost and inelastic band design (fixed at 18GHz to 26 GHz).
Therefore, how to overcome the above-mentioned drawbacks by improving the structural design has become one of the important issues to be solved by the industry.
Disclosure of Invention
The technical problem to be solved by the present invention is to provide an antenna testing fixture for overcoming the disadvantages of the prior art, which includes: the coaxial connector comprises a circuit substrate, a coaxial connector, a signal contact and two grounding contacts. The coaxial connector is coupled to the circuit substrate. The signal contact is arranged on the circuit substrate and is electrically connected with the coaxial connector. Two ground contacts are provided on the circuit board. The signal contact is located between the two ground contacts, and the signal contact and the two ground contacts are linearly arranged along the edge of the circuit substrate.
Preferably, the coaxial joint is an SMA joint.
In order to solve the above technical problem, another technical solution of the present invention is to provide an antenna testing system, which includes a testing device, a first antenna assembly, a first coaxial cable, a second antenna assembly, an antenna testing fixture, a second coaxial cable, a probe assembly, and a third coaxial cable. The first antenna element emits an electric wave signal. The second antenna element receives the electric wave signal, and the second antenna element is separated from the first antenna element by a preset distance. A first coaxial cable is connected between the first antenna assembly and the testing device. The second coaxial cable is connected between the second antenna component and the antenna test fixture. A third coaxial cable is connected between the probe assembly and the testing device.
Preferably, the antenna test system further comprises: and one end of the second coaxial cable is connected with the second coaxial connector, and the other end of the second coaxial cable is connected with the coaxial connector.
Preferably, the antenna test system further comprises: and the third coaxial connector is coupled to the probe assembly, wherein one end of the third coaxial cable is connected with the third coaxial connector, and the other end of the third coaxial cable is connected with the testing device.
Preferably, the antenna test system further comprises: the connecting arm is connected with the probe assembly and used for moving the probe assembly, so that the probe head is in contact with the signal contact and the two grounding contacts.
Preferably, the first antenna element and the second antenna element are horn antennas.
Preferably, the coaxial connector, the second coaxial connector and the third coaxial connector are SMA connectors.
Preferably, the testing device is a vector network analyzer.
Preferably, the test device is configured to send out a test signal, and the test device measures the generated signal loss by the test signal passing through a signal transmission path.
Preferably, the signal transmission path is formed by the first coaxial cable, the first antenna assembly, the second antenna assembly, the wireless transmission between the first antenna assembly and the second antenna assembly, the second coaxial cable, the probe assembly and the third coaxial cable, and the signal loss includes cable signal loss caused by the first coaxial cable, the second coaxial cable and the third coaxial cable, antenna signal loss caused by the first antenna assembly and the second antenna assembly, signal loss caused by the wireless transmission between the first antenna assembly and the second antenna assembly, and probe signal loss caused by the probe assembly.
The antenna test fixture provided by the invention has the beneficial effects that the antenna test fixture can be coupled to the circuit substrate through the coaxial connector and the technical scheme that the signal contact is arranged on the circuit substrate and is electrically connected with the coaxial connector is adopted, so that the test fixture is provided for testing and correcting different reference antennas, and various defects caused by the fact that the reference antenna type in the prior art only adopts a chip antenna are overcome.
The antenna test system provided by the invention has the other beneficial effects that the antenna test system can be electrically connected with the coaxial connector through the signal contact of the antenna test fixture, and the probe assembly is provided with the probe head and is electrically connected with the coaxial connector through the probe head contact signal contact and the grounding contact, so that the test fixture is provided for testing and correcting different reference antennas, the correcting plane can be extended to the probe head of the probe assembly, the measured system loss comprises the effect of the probe assembly, and the total path loss of the antenna test system is more accurately measured.
For a better understanding of the features and technical content of the present invention, reference should be made to the following detailed description of the invention and accompanying drawings, which are provided for purposes of illustration and description only and are not intended to limit the invention.
Drawings
Fig. 1 is a schematic top view of an antenna test fixture according to the present invention.
Fig. 2 is a schematic diagram of an antenna test system according to the present invention.
Fig. 3 is a schematic diagram of a probe and an antenna test fixture of the antenna test system of the invention.
Fig. 4 is a schematic diagram of a second antenna element, an antenna test fixture and a probe of the antenna test system of the invention.
Detailed Description
The following description is provided for the embodiments of the antenna test fixture and the antenna test system disclosed in the present invention with specific embodiments, and those skilled in the art can understand the advantages and effects of the present invention from the disclosure of the present specification. The invention is capable of other and different embodiments and its several details are capable of modification and various other changes, which can be made in various details within the specification and without departing from the spirit and scope of the invention. The drawings of the present invention are for illustrative purposes only and are not intended to be drawn to scale. The following embodiments will further explain the related art of the present invention in detail, but the disclosure is not intended to limit the scope of the present invention.
It will be understood that, although the terms first, second, third, etc. may be used herein to describe various elements, these elements should not be limited by these terms. These terms are used primarily to distinguish one element from another. In addition, the term "or" as used herein should be taken to include any one or combination of more of the associated listed items as the case may be.
[ examples ]
First, referring to fig. 1, the present invention provides an antenna testing fixture 1, which includes a circuit substrate 11, a coaxial connector 12, a signal contact 13 and two ground contacts 14. The coaxial connector 12 is coupled to the circuit substrate 11. The signal contact 13 and the two ground contacts 14 are disposed on the circuit substrate 11, and the signal contact 13 is electrically connected to the coaxial connector 12. As shown in fig. 1, the circuit board 11 has a substantially rectangular shape, and has a first side 111 and a second side 112 opposite to each other. The coaxial connector 12 is coupled to the circuit substrate 11 at a position closer to the first side 111. The signal contact 13 and the two ground contacts 14 are closer to the second side 112, the signal contact 13 and the two ground contacts 14 are linearly arranged along the edge of the circuit substrate 11, and the signal contact 13 is located between the two ground contacts 14.
In the present invention, the Circuit board 11 is a pcb (printed Circuit board) board, and the coaxial connector 12 is an sma (subminiature version a) connector, but the present invention is not limited thereto. For example, the antenna test fixture 1 may be a set of calibration tools having two ports. One of the ports is a 2.92 mm SMA contact, and the other port is a ground-signal-ground (GSG) contact assembly consisting of a signal contact 13 and two ground contacts 14. The signal contacts 13 and the two ground contacts 1 are contacts for the lower pins of a micro Probes (MicroSeries Probes).
Referring to fig. 2, the present invention provides an antenna testing system Z, which includes an antenna testing fixture 1, a testing device 2, a first antenna element 3, a first coaxial cable 4, a second antenna element 5, a second coaxial cable 6, a probe element 7, and a third coaxial cable 8. A first coaxial cable 4 is connected between the first antenna assembly 3 and the testing device 2. The second coaxial cable 6 is connected between the second antenna assembly 5 and the antenna test fixture 1. A third coaxial cable 8 is connected between the probe assembly 7 and the testing device 2. That is, the first coaxial cable 4, the second coaxial cable 6 and the third coaxial cable 8 are connected in series to the antenna test fixture 1, the test apparatus 2, the first antenna assembly 3, the second antenna assembly 5 and the probe assembly 7 in the antenna test system Z.
The first antenna element 3 and the second antenna element 5 are separated by a predetermined distance H, and the first antenna element 3 and the second antenna element 5 can transmit signals through radio wave radiation. For example, the first antenna element 3 is a measuring antenna as a transmitting end for transmitting the radio signal, and the second antenna element 5 is a measuring antenna as a receiving end for receiving the radio signal. The magnitude of the predetermined distance H separating the first antenna element 3 from the second antenna element 5 affects the strength of the radio wave signal received by the second antenna element 5.
Therefore, the antenna test system Z is electrically connected in series through the antenna assembly and the coaxial cable to form a signal transmission path. For example, the signal calibration device 2 can be used as a signal source to send out a test signal. The test signal is transmitted to the first antenna element 3 through the first coaxial cable 4, and the first antenna element 3 receives the test signal and then transmits the test signal (radio wave signal) in the form of electromagnetic waves. The test signal propagates in the air and is received by the second antenna component 5, and then is transmitted to the antenna test fixture 1 via the second coaxial cable 6, and then the test signal is transmitted to the test device 2 via the third coaxial cable 8.
Referring to fig. 3 and 4, fig. 3 is a schematic diagram of a probe and an antenna test fixture of the antenna test system of the invention, and fig. 4 is a schematic diagram of a second antenna element, the antenna test fixture and the probe of the antenna test system of the invention. The antenna test fixture 1 includes a circuit substrate 11, a coaxial connector 12, a signal contact 13 and two ground contacts 14. The coaxial connector 12 is coupled to the circuit substrate 11. The signal contact 13 is disposed on the circuit substrate 11, and the signal contact 13 is electrically connected to the coaxial connector 12. Two ground contacts 14 are provided on the circuit substrate 11, and the signal contact 13 is located between the two ground contacts 14. The signal contacts 13 and the two ground contacts 14 are linearly arranged along the edge of the circuit substrate 11, such that the signal contacts 13 and the two ground contacts 14 form a ground-signal-ground (GSG) contact assembly.
The probe assembly 7 has a probe head 71, and the probe assembly 7 contacts the signal contact 13 and the two ground contacts 14 through the probe head 71 to electrically connect the coaxial connectors. In addition, the antenna test system Z further includes a connecting arm 9, the connecting arm 9 is connected to the probe assembly 7, and the connecting arm 9 is used to move the probe assembly 7 so that the probe head 71 contacts the signal contact 13 and the two ground contacts 14. The connection arm 9 and the probe assembly 7 may be fixedly coupled by a plurality of fasteners, such as, but not limited to, screws. Further, first, when the probe head 71 is to contact the signal contact 13 and the two ground contacts 14, the connecting arm 9 moves the probe assembly 7 to move the probe head 71 to be directly above the signal contact 13 and the two ground contacts 14 for alignment. Then, the connecting arm 9 continues to move the probe assembly 7, and the probe head 71 moves down and contacts the signal contact 13 and the two ground contacts 14, so that the signal contact 13 and the two ground contacts 14 are electrically connected with the probe head 71.
With continued reference to fig. 4, the antenna test system Z further includes a second coaxial connector 50 and a third coaxial connector 70. The second coaxial connector 50 is coupled to the second antenna element 5, and the third coaxial connector 70 is coupled to the probe element 7. One end of the second coaxial cable 6 is connected to the second coaxial connector 50, and the other end is connected to the coaxial connector 12. One end of the third coaxial cable 8 is connected to the third coaxial connector 70, and the other end is connected to the testing device 2.
In the present invention, the test apparatus 2 is a Vector Network Analyzer (VNA). The Coaxial cables (the first Coaxial cable 4, the second Coaxial cable 6, and the third Coaxial cable 8) may be Coaxial cables (Coaxial cables). The second coaxial connector 50 and the coaxial connector 12 for connecting the two ends of the second coaxial cable 6, and the third coaxial connector 70 for connecting one end of the third coaxial cable 8 may be sma (subminiature version a) connectors, but the invention is not limited thereto. The first Antenna element 3 and the second Antenna element 5 are both Horn antennas (horns Antenna), wherein the first Antenna element 3 is a measuring Antenna and the second Antenna element 5 is an Antenna to be measured.
As previously described, the vector network analyzer (i.e., the test apparatus 2) can be used as a signal source to send out a test signal. Therefore, the performance and characteristics of the device under test are determined by the signal transmission path through which the test signal passes. More specifically, the present invention measures the signal loss generated by the antenna test system Z by passing the test signal through a signal transmission path.
With continued reference to fig. 2, in particular, the signal path is formed by the first coaxial cable 4, the first antenna element 3, the second antenna element 5, the Over The Air (OTA) between the first antenna element 3 and the second antenna element 5, the second coaxial cable 6, the probe element 7, and the third coaxial cable 8. The signal loss generated by the antenna test system Z includes the cable signal loss caused by the first coaxial cable 4, the second coaxial cable 6 and the third coaxial cable 8, the antenna signal loss caused by the first antenna element 3 and the second antenna element 5, the signal loss (OTA path loss) caused by the wireless transmission between the first antenna element 3 and the second antenna element 5, and the probe signal loss caused by the probe element 7.
Advantageous effects of the embodiments
One of the benefits of the present invention is that the antenna test fixture provided by the present invention can be coupled to the circuit substrate 11 through the "coaxial connector 12", and the "signal contact 13 is disposed on the circuit substrate 11, and the signal contact 13 is electrically connected to the coaxial connector 12", so as to provide a test fixture for checking the antenna to be tested (the second antenna component 5), thereby improving the disadvantage that the millimeter wave antenna in the prior art is too small in size to feed through the coaxial cable.
Another advantage of the present invention is that the antenna testing system Z provided by the present invention can electrically connect the coaxial connector 12 through the signal contact of the antenna testing fixture 1, and the probe assembly 7 has the probe head 71, and the probe assembly 7 contacts the signal contact 13 and the ground contact 14 through the probe head 71 to electrically connect the coaxial connector 12, so as to provide an antenna testing fixture 1 for testing antenna assemblies of different frequency bands. In addition, the antenna test system Z provided by the present invention extends the calibration plane to the probe head 71 of the probe assembly 7 through the antenna test fixture 1, so that the test apparatus 2 (vector network analyzer) can measure the total path loss of the antenna test system Z more accurately.
Further, since the millimeter wave (mmw) antenna is generally small in size (in millimeters), the millimeter wave antenna cannot be respectively calibrated to the interface between the cable and the calibration antenna by directly feeding signals to the antenna in the prior art through a coaxial cable as in the prior art, and the measured system path loss cannot include the loss of the probe. By using the designed calibration tool, the calibration plane can be extended to the needle point of the micro probe station, and the measured system loss includes the probe effect, so that the total path loss of the system can be measured more accurately.
The disclosure is only a preferred embodiment of the invention, and is not intended to limit the scope of the claims, so that all technical equivalents and modifications using the contents of the specification and drawings are included in the scope of the claims.

Claims (11)

1. The utility model provides an antenna test fixture which characterized in that, antenna test fixture includes:
a circuit substrate;
a coaxial connector coupled to the circuit substrate;
the signal contact is arranged on the circuit substrate and is electrically connected with the coaxial connector; and
the two grounding contacts are arranged on the circuit substrate, wherein the signal contact is positioned between the two grounding contacts, and the signal contact and the two grounding contacts are linearly arranged along the edge of the circuit substrate.
2. The antenna test fixture of claim 1, wherein the coaxial connector is an SMA connector.
3. An antenna test system, characterized in that the antenna test system comprises:
a testing device;
a first antenna assembly for transmitting an electric wave signal;
a first coaxial cable connected between the first antenna assembly and the testing device;
a second antenna element for receiving the electrical wave signal, the second antenna element being spaced apart from the first antenna element by a predetermined distance;
an antenna test fixture, including a circuit substrate, a coaxial connector, a signal contact and two grounding contacts, the coaxial connector is coupled on the circuit substrate, the signal contact is disposed on the circuit substrate, and the signal contact is electrically connected to the coaxial connector, the two grounding contacts are disposed on the circuit substrate, and the signal contact is located between the two grounding contacts, and the signal contact and the two grounding contacts are linearly arranged along the edge of the circuit substrate;
a second coaxial cable connected between the second antenna assembly and the antenna test fixture;
the probe assembly is provided with a probe head, and the probe assembly is in contact with the signal contact and the two grounding contacts through the probe head so as to be electrically connected with the coaxial connector; and
a third coaxial cable connected between the probe assembly and the testing device.
4. The antenna test system of claim 3, further comprising: a second coaxial connector coupled to the second antenna element, wherein one end of the second coaxial cable is connected to the second coaxial connector, and the other end of the second coaxial cable is connected to the coaxial connector.
5. The antenna test system of claim 3, further comprising: and a third coaxial connector coupled to the probe assembly, wherein one end of the third coaxial cable is connected to the third coaxial connector, and the other end of the third coaxial cable is connected to the testing device.
6. The antenna test system of claim 3, further comprising: and the connecting arm is connected with the probe assembly and used for moving the probe assembly so that the probe head contacts the signal contact and the two grounding contacts.
7. The antenna testing system of claim 3, wherein the first and second antenna elements are horn antennas.
8. The antenna testing system of claim 3, wherein the coaxial joint, the second coaxial joint, and the third coaxial joint are SMA joints.
9. The antenna test system of claim 3, wherein the test device is a vector network analyzer.
10. The antenna test system of claim 3, wherein the test device is configured to emit a test signal and measure the resulting signal loss by the test signal passing through a signal propagation path.
11. The antenna test system of claim 10, wherein the signal transmission path is collectively formed by the first coaxial cable, the first antenna assembly, the second antenna assembly, the wireless transmission between the first antenna assembly and the second antenna assembly, the second coaxial cable, the probe assembly, and the third coaxial cable, and wherein the signal losses include cable signal losses caused by the first coaxial cable, the second coaxial cable, and the third coaxial cable, antenna signal losses caused by the first antenna assembly and the second antenna assembly, signal losses caused by the wireless transmission between the first antenna assembly and the second antenna assembly, and probe signal losses caused by the probe assembly.
CN202011287730.6A 2020-11-17 2020-11-17 Antenna test fixture and antenna test system Active CN112415283B (en)

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Application Number Priority Date Filing Date Title
CN202011287730.6A CN112415283B (en) 2020-11-17 2020-11-17 Antenna test fixture and antenna test system

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CN112415283A true CN112415283A (en) 2021-02-26
CN112415283B CN112415283B (en) 2023-12-22

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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103575996A (en) * 2013-09-25 2014-02-12 苏州佳世达电通有限公司 Antenna detection device
CN208240879U (en) * 2018-05-04 2018-12-14 青岛真时科技有限公司 A kind of antenna coupler
CN110031689A (en) * 2019-05-08 2019-07-19 深圳沸石智能技术有限公司 A kind of antenna measurement device and method
US10520535B1 (en) * 2016-07-28 2019-12-31 Amazon Technologies, Inc. Groundless radio frequency test probe
CN110879315A (en) * 2018-09-05 2020-03-13 矽品精密工业股份有限公司 Test fixture
CN211122948U (en) * 2019-10-24 2020-07-28 昆山联滔电子有限公司 Antenna test fixture and antenna test system

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103575996A (en) * 2013-09-25 2014-02-12 苏州佳世达电通有限公司 Antenna detection device
US10520535B1 (en) * 2016-07-28 2019-12-31 Amazon Technologies, Inc. Groundless radio frequency test probe
CN208240879U (en) * 2018-05-04 2018-12-14 青岛真时科技有限公司 A kind of antenna coupler
CN110879315A (en) * 2018-09-05 2020-03-13 矽品精密工业股份有限公司 Test fixture
CN110031689A (en) * 2019-05-08 2019-07-19 深圳沸石智能技术有限公司 A kind of antenna measurement device and method
CN211122948U (en) * 2019-10-24 2020-07-28 昆山联滔电子有限公司 Antenna test fixture and antenna test system

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