CN112382330A - Nand Flash bad block detection method and device, storage medium, terminal and burner - Google Patents
Nand Flash bad block detection method and device, storage medium, terminal and burner Download PDFInfo
- Publication number
- CN112382330A CN112382330A CN202011360152.4A CN202011360152A CN112382330A CN 112382330 A CN112382330 A CN 112382330A CN 202011360152 A CN202011360152 A CN 202011360152A CN 112382330 A CN112382330 A CN 112382330A
- Authority
- CN
- China
- Prior art keywords
- nand flash
- bad block
- command
- block information
- scanning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/30—Accessing single arrays
- G11C29/32—Serial access; Scan testing
Abstract
A Nand Flash bad block detection method and device, a storage medium, a terminal and a burner are provided, wherein the Nand Flash bad block detection method comprises the following steps: after software burning of the Nand Flash is started, receiving a scanning command from a burner; responding to the scanning command to scan the Nand Flash to obtain bad block information of the Nand Flash; and returning the bad block information to the burner so that the burner determines whether to continue burning according to the bad block information. The technical scheme of the invention can simply and quickly acquire the Nand Flash bad block information.
Description
Technical Field
The invention relates to the technical field of computers, in particular to a Nand Flash bad block detection method and device, a storage medium, a terminal and a burner.
Background
The bad block refers to that some flash areas can not be erased and written in a Nand flash (Nand flash) of a solid state disk, and such a unit area is called a bad block. Since the read and write operations in the Nand flash are in page (page) units, the erase is in block (block) units, and the erase operation must be performed before the write operation, a minimum operable unit is a block, and any irreparable bit error occurs in the whole block, and the block is considered to be a bad block. The NandFlash bad block of the solid state disk can affect the normal use of the terminal device, for example, the software version cannot be started after being burned into the NandFlash, or the use is abnormal after the version burning is finished, which brings much loss to manufacturers and users.
In the prior art, a software burning tool directly downloads a software version into a memory of a terminal device. The terminal equipment obtains the NandFlash bad block information and mainly depends on a serial port output Log (Log).
However, the NandFlash bad block information is output through the serial port, so that not only are serial port flying wires led out from the shell of the terminal equipment damaged and a computer port occupied, but also the NandFlash bad block number needs to be manually identified and the burning needs to be manually stopped; in addition, different manufacturers of the NandFlash have different protocols, and the NandFlash manufacturer needs to be identified and the NandFlash needs to be scanned by software for reading the bad block information of the NandFlash, so that the method brings huge expenses to the software.
Disclosure of Invention
The invention solves the technical problem of how to simply and quickly acquire Nand Flash bad block information.
In order to solve the above technical problem, an embodiment of the present invention provides a Nand Flash bad block detection method, where the Nand Flash bad block detection method includes: after software burning of the Nand Flash is started, receiving a scanning command from a burner; responding to the scanning command to scan the Nand Flash to obtain bad block information of the Nand Flash; and returning the bad block information to the burner so that the burner determines whether to continue burning according to the bad block information.
Optionally, the scan command includes manufacturer information of the Nand Flash.
Optionally, the scanning the Nand Flash in response to the scan command includes: responding to the scanning command and performing handshake with the Nand Flash; and after the handshake is successful, scanning the Nand Flash.
Optionally, the receiving the scan command from the burner includes: receiving the scanning command sent according to a first preset data format, wherein the first preset data format comprises a head, a command type, a data length, a data content, a check code and a tail, and the command type of the scanning command is a first preset value.
Optionally, the returning the bad block information to the burner includes: and returning the bad block information to the burner according to a second preset data format, wherein the second preset data format comprises a head part, a command type, a data length, data content, a check code and a tail part, and the command type of the bad block information is a second preset value.
In order to solve the technical problem, the embodiment of the invention also discloses another Nand Flash bad block detection method, which comprises the following steps: after software burning of the Nand Flash is started, a scanning command is sent; receiving bad block information of the Nand Flash, wherein the bad block information is obtained by scanning the Nand Flash by a terminal device in response to the scanning command; and determining whether to continue burning or not according to the bad block information.
Optionally, the bad block information includes a bad block number, and determining whether to continue burning according to the bad block information includes: when the number of the bad blocks is smaller than a preset threshold, continuing to execute software burning of the Nand Flash; or stopping the software burning of the Nand Flash when the number of the bad blocks reaches a preset threshold.
Optionally, the scan command includes manufacturer information of the Nand Flash, and the sending the scan command includes: and forming the scanning command by the manufacturer information of the Nand Flash according to a first preset data format, and sending the scanning command out, wherein the first preset data format comprises a head part, a command type, a data length, data content, a check code and a tail part, and the command type of the scanning command is a first preset value.
The embodiment of the invention also discloses a Nand Flash bad block detection device, which comprises: the scanning command receiving module is used for receiving a scanning command from the burner after starting software burning of the Nand Flash; the scanning module is used for responding to the scanning command to scan the Nand Flash so as to obtain bad block information of the Nand Flash; and the bad block information sending module is used for returning the bad block information to the burner so that the burner can determine whether to continue burning according to the bad block information.
The embodiment of the invention also discloses a Nand Flash bad block detection device, which comprises: the scanning command sending module is used for sending a scanning command after starting software burning of the Nand Flash; a bad block information receiving module, configured to receive bad block information of the Nand Flash, where the bad block information is obtained by a terminal device scanning the Nand Flash in response to the scanning command; and the burning determining module is used for determining whether to continue burning or not according to the bad block information.
The embodiment of the invention also discloses a storage medium, wherein a computer program is stored on the storage medium, and the step of the Nand Flash bad block detection method is executed when the computer program is run by a processor.
The embodiment of the invention also discloses a terminal which comprises a memory and a processor, wherein the memory is stored with a computer program which can be operated on the processor, and the processor executes the step of the Nand Flash bad block detection method when operating the computer program.
The embodiment of the invention also discloses a burner, which comprises a memory and a processor, wherein the memory is stored with a computer program capable of running on the processor, and the burner is characterized in that the processor executes the steps of the Nand Flash bad block detection method in any one of claims 6 to 8 when running the computer program.
Compared with the prior art, the technical scheme of the embodiment of the invention has the following beneficial effects:
in the technical scheme of the invention, the terminal equipment feeds back the bad block information of the Nand Flash to the burner by responding to the scanning command of the burner, so that the burner can know the bad block condition of the Nand Flash according to the information fed back by the terminal equipment, and whether burning continues or not is determined; the condition that the log data are led out by damaging the shell of the terminal equipment and leading out serial port flying leads in the prior art is avoided, the simplicity, convenience and quickness in obtaining the bad block information are realized, and the production efficiency of the terminal is improved.
Further, the scan command includes manufacturer information of the Nand Flash. The technical scheme of the invention realizes the automatic identification of Nand Flash manufacturers, reduces the software overhead and further improves the production efficiency.
Drawings
FIG. 1 is a flowchart of a method for detecting bad blocks in Nand Flash according to an embodiment of the present invention;
FIG. 2 is a flowchart of another method for detecting bad blocks in Nand Flash according to an embodiment of the present invention;
FIG. 3 is a schematic diagram illustrating interaction between a terminal device and a burner according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of a terminal device according to an embodiment of the present invention;
FIG. 5 is a schematic structural diagram of a Nand Flash bad block detection apparatus according to an embodiment of the present invention;
FIG. 6 is a schematic structural diagram of another Nand Flash bad block detection apparatus according to an embodiment of the present invention.
Detailed Description
As described in the background art, the NandFlash bad block information is output through the serial port, so that not only is the serial port flying line led out by destroying the shell of the terminal equipment and occupying the port of a computer, but also the NandFlash bad block number needs to be manually identified and the burning needs to be manually stopped; in addition, different manufacturers of the NandFlash have different protocols, and the NandFlash manufacturer needs to be identified and the NandFlash needs to be scanned by software for reading the bad block information of the NandFlash, so that the method brings huge expenses to the software.
In the technical scheme of the invention, the terminal equipment feeds back the bad block information of the Nand Flash to the burner by responding to the scanning command of the burner, so that the burner can know the bad block condition of the Nand Flash according to the information fed back by the terminal equipment, and whether burning continues or not is determined; the condition that the log data are led out by damaging the shell of the terminal equipment and leading out serial port flying leads in the prior art is avoided, the simplicity, convenience and quickness in obtaining the bad block information are realized, and the production efficiency of the terminal is improved.
Further, the scan command includes manufacturer information of the Nand Flash. The technical scheme of the invention realizes the automatic identification of Nand Flash manufacturers, reduces the software overhead and further improves the production efficiency.
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in detail below.
FIG. 1 is a flowchart of a method for detecting a bad block in Nand Flash according to an embodiment of the present invention.
The technical scheme of the invention can be used for the terminal equipment configured with Nand Flash, namely, the terminal equipment can execute the steps of the method. The terminal may be any appropriate terminal, such as, but not limited to, a mobile phone, a computer, an internet of things device, and the like. Specifically, a software program can be configured in the terminal device, and the software program executes each step of the Nand Flash bad block detection method; or, configuring a hardware device capable of interacting with the Nand Flash, such as a Nand Flash controller, in the terminal device, and executing each step of the Nand Flash bad block detection method by the Nand Flash controller.
Specifically, the Nand Flash bad block detection method may include the following steps:
step S101: after software burning of the Nand Flash is started, receiving a scanning command from a burner;
step S102: responding to the scanning command to scan the Nand Flash to obtain bad block information of the Nand Flash;
step S103: and returning the bad block information to the burner so that the burner determines whether to continue burning according to the bad block information.
It should be noted that the sequence numbers of the steps in this embodiment do not represent a limitation on the execution sequence of the steps.
In this embodiment, the burner can perform software burning on Nand Flash in the terminal device.
It should be noted that, the burner in the embodiment of the present invention may be any implementable software or hardware tool capable of burning software of Nand Flash, and the embodiment of the present invention is not limited to this.
In the specific implementation of step S101, the scan command is sent by the burner after the software burning of the Nand Flash is started, that is, after the software burning of the Nand Flash is started. The scanning command can instruct the terminal equipment to scan the bad blocks of the Nand Flash. Specifically, the burner and the terminal device perform handshake, and send a scan command after the handshake is successful.
In the specific implementation of step S102, the terminal device scans the bad block of Nand Flash in response to the scan command. The bad block information of the Nand Flash can represent the bad block condition of the Nand Flash, and at least comprises the number of the bad blocks of the Nand Flash.
In the specific implementation of step S103, the terminal device returns the scanned bad block information to the burner. And the burner determines whether to continue burning or not according to the bad block condition of the Nand Flash. For example, when the bad block condition of Nand Flash is poor, the burning is stopped to ensure the success rate of burning.
Specifically, the bad block information returned by the terminal device may include the number of bad blocks, and may further include the total number of blocks of NandFlash. Further, the bad block information may also include a reserved bit number (reserved).
In the embodiment of the invention, the terminal equipment feeds back the bad block information of the Nand Flash to the burner by responding to the scanning command of the burner, so that the burner can know the bad block condition of the Nand Flash according to the information fed back by the terminal equipment, and whether burning continues or not is determined; the condition that the log data are led out by damaging the shell of the terminal equipment and leading out serial port flying leads in the prior art is avoided, the simplicity, convenience and quickness in obtaining the bad block information are realized, and the production efficiency of the terminal is improved.
In one non-limiting embodiment, the scan command includes vendor information for the Nand Flash.
The information of manufacturers of the Nand Flash is various, the command format of the Nand Flash is also various, in order to avoid continuously identifying the manufacturers of the Nand Flash when reading bad blocks of the Nand Flash, in the embodiment, the manufacturers of the Nand Flash are directly informed of the information of the manufacturers of the Nand Flash through a scanning command, and unnecessary software overhead is avoided.
In specific implementation, after the terminal device obtains the information of the manufacturer of the Nand Flash in the scanning command, the terminal device can package the bad block information according to the packaging requirement corresponding to the information of the manufacturer of the Nand Flash, and send the packaged bad block information.
In one non-limiting embodiment, step S101 shown in fig. 1 may include the following steps: receiving the scanning command sent according to a first preset data format, wherein the first preset data format comprises a head, a command type, a data length, a data content, a check code and a tail, and the command type of the scanning command is a first preset value.
The first preset format in the present embodiment is set specifically for the scan command. Wherein, the data content can be the manufacturer information of the Nand Flash. And the data length is the character length of the manufacturer information of the Nand Flash. The Check code may be a Cyclic Redundancy Check (CRC) code. The head and tail may also be fixed values.
Specifically, the terminal device may determine whether it is a scan command by parsing a command type in the received command. That is, when the command type in the received command is the first preset value, the command is determined to be a scan command.
The specific value of the first preset value may be set according to an actual application scenario, which is not limited in this embodiment of the present invention.
Referring specifically to table 1, table 1 shows a specific data format of the scan command.
TABLE 1
As shown in table 1, the first preset DATA format includes a HEADER (HEADER), a command TYPE (CMD TYPE), a DATA length (DATA LENGTH), a DATA content (DATA), a check code (CRC), and a Trailer (TAIL). Wherein the command type of the scan command is a first preset value 0029.
In one non-limiting embodiment, step S102 shown in fig. 1 may include the following steps: responding to the scanning command and performing handshake with the Nand Flash; and after the handshake is successful, scanning the Nand Flash.
In this embodiment, scanning software or a Nand Flash controller in the terminal device tries to handshake with the Nand Flash until the handshake is successful, and after the handshake is successful, scanning of the Nand Flash is implemented.
In one non-limiting embodiment, step S103 shown in fig. 1 may include the following steps: and returning the bad block information to the burner according to a second preset data format, wherein the second preset data format comprises a head part, a command type, a data length, data content, a check code and a tail part, and the command type of the bad block information is a second preset value.
The second preset format in this embodiment is set specifically for returning bad block information. Wherein, the data content can be the bad block information of the Nand Flash. And the data length is the character length of the bad block information. The Check code may be a Cyclic Redundancy Check (CRC) code. The head and tail may also be fixed values.
Specifically, the burner can determine whether the block information is bad by analyzing the command type in the received command response. That is, when the command type in the received command response is the second preset value, it is determined that the command response is bad block information.
Referring specifically to table 1, table 1 shows a specific data format of the command response.
TABLE 2
As shown in table 2, the second preset DATA format includes a HEADER (HEADER), a command TYPE (CMD TYPE), a DATA length (DATA LENGTH), a DATA content (DATA), a check code (CRC), and a Trailer (TAIL). And the command type of the command response is a second preset value 00B 8.
In one specific example, the vendor information for Nand Flash is ABCD. The scan command may be in the form of: 7E 0029000441424344 xx xx 7E, where xx xx xx denotes a CRC check code. The data form of the bad block information returned by the terminal device may be: 7E 00b 8000 c/00000000/00100000/00000010/xx xx 7E, wherein 00000000 represents reserved bits, 00100000 represents the total number of blocks, 00000010 represents the number of bad blocks, and xx represents a CRC check code.
Referring to fig. 2, the embodiment of the invention also discloses a Nand Flash bad block detection method. The Nand Flash bad block detection method can be used on the side of a burner, namely, the burner executes each step of the method.
Specifically, the Nand Flash bad block detection method may include the following steps:
step S201: after software burning of the Nand Flash is started, a scanning command is sent;
step S202: receiving bad block information of the Nand Flash, wherein the bad block information is obtained by scanning the Nand Flash by a terminal device in response to the scanning command;
step S203: and determining whether to continue burning or not according to the bad block information.
Compared with a conventional burner, the burner in the embodiment of the invention not only can realize software burning of the Nand Flash, but also can send a scanning command, and determines whether to continue burning or not according to bad block information of the Nand Flash so as to ensure burning efficiency.
In one non-limiting embodiment, step S203 shown in fig. 2 may include the following steps: when the number of the bad blocks is smaller than a preset threshold, continuing to execute software burning of the Nand Flash; or stopping the software burning of the Nand Flash when the number of the bad blocks reaches a preset threshold.
It should be noted that, the specific value of the preset threshold may be set according to an actual application scenario, which is not limited in this embodiment of the present invention.
In one non-limiting embodiment, step S201 shown in fig. 2 may include the following steps: and forming the scanning command by the manufacturer information of the Nand Flash according to a first preset data format, and sending the scanning command out, wherein the first preset data format comprises a head part, a command type, a data length, data content, a check code and a tail part, and the command type of the scanning command is a first preset value.
For the first data format, refer to table 1 and corresponding embodiments, which are not described herein again.
In a specific application scenario, please refer to fig. 3, where fig. 3 shows an interaction process between the burner 31 and the terminal device 32.
In step S31, the burner 31 sends a scan command to the terminal device 32.
In step S32, the terminal device 32 scans Nand Flash.
In step S33, the terminal device 32 sends the bad block information of the Nand Flash to the burner 31.
In step S34, the burner 31 determines whether the number of bad blocks is less than a predetermined threshold.
In step S35, the burner 31 continues to burn when the number of bad blocks is smaller than the preset threshold, and stops burning when the number of bad blocks reaches the preset threshold.
In a specific application scenario, please refer to fig. 4, and fig. 4 shows a schematic diagram of a terminal device according to an embodiment of the present invention.
As shown in fig. 4, a Nand Flash controller 43 may be provided in a System On Chip (SOC) 41. The Nand Flash controller 43 can be used as an interface for communication between a burner (not shown) and the Nand Flash 42. The Nand Flash controller 43 includes an auto-scan module 431 for scanning the Nand Flash 42.
In specific implementation, a burner sends a scanning command carrying Nand Flash42 manufacturer information; the auto-scan module 431 scans the Nand Flash42 in response to the scan command; the Nand Flash controller 43 feeds back the scanned bad block information to the burner.
Referring to fig. 5, an embodiment of the invention discloses a Nand Flash bad block detection apparatus 50. The Nand Flash bad block detection apparatus 50 may include:
a scanning command receiving module 501, configured to receive a scanning command from a burner after starting software burning of Nand Flash;
a scanning module 502, configured to scan the Nand Flash in response to the scanning command to obtain bad block information of the Nand Flash;
a bad block information sending module 503, configured to return the bad block information to the burner, so that the burner determines whether to continue burning according to the bad block information.
For more contents of the operating principle and the operating mode of the Nand Flash bad block detecting apparatus 50, reference may be made to the related descriptions in fig. 1 to fig. 4, which are not described herein again.
Referring to fig. 6, an embodiment of the invention discloses a Nand Flash bad block detection device 60. The Nand Flash bad block detection apparatus 60 may include:
the scanning command sending module 601 is used for sending a scanning command after starting software burning of Nand Flash;
a bad block information receiving module 602, configured to receive bad block information of the Nand Flash, where the bad block information is obtained by scanning the Nand Flash by a terminal device in response to the scanning command;
and a burning determination module 603, configured to determine whether to continue burning according to the bad block information.
For more contents of the working principle and the working mode of the Nand Flash bad block detection apparatus 60, reference may be made to the related descriptions in fig. 1 to fig. 2, and details are not repeated here.
The embodiment of the present invention also discloses a storage medium, which is a computer-readable storage medium, and a computer program is stored on the storage medium, and when the computer program runs, the steps of the access control method shown in fig. 3 may be executed. The storage medium may include ROM, RAM, magnetic or optical disks, etc. The storage medium may further include a non-volatile memory (non-volatile) or a non-transitory memory (non-transient), and the like.
The embodiment of the invention also discloses a terminal which can comprise a memory and a processor, wherein the memory is stored with a computer program which can run on the processor. The processor, when running the computer program, may perform the steps of the access control method shown in fig. 2. The user equipment includes but is not limited to a mobile phone, a computer, a tablet computer and other terminal equipment.
It should be understood that the processor may be a general purpose processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), an off-the-shelf programmable gate array (FPGA) or other programmable logic device, a discrete gate or transistor logic device, a discrete hardware component, a system on chip (SoC), a Central Processing Unit (CPU), a Network Processor (NP), a Digital Signal Processor (DSP), a Micro Controller Unit (MCU), a programmable logic controller (PLD), or other integrated chip. The various methods, steps, and logic blocks disclosed in the embodiments of the present application may be implemented or performed. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like. The steps of the method disclosed in connection with the embodiments of the present application may be directly implemented by a hardware decoding processor, or implemented by a combination of hardware and software modules in the decoding processor. The software module may be located in ram, flash memory, rom, prom, or eprom, registers, etc. storage media as is well known in the art. The storage medium is located in a memory, and a processor reads information in the memory and completes the steps of the method in combination with hardware of the processor.
It will also be appreciated that the memory referred to in this embodiment of the invention may be either volatile memory or nonvolatile memory, or may include both volatile and nonvolatile memory. The non-volatile memory may be a read-only memory (ROM), a Programmable ROM (PROM), an Erasable PROM (EPROM), an electrically Erasable EPROM (EEPROM), or a flash memory. Volatile memory can be Random Access Memory (RAM), which acts as external cache memory. By way of example, but not limitation, many forms of RAM are available, such as Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), Synchronous Dynamic Random Access Memory (SDRAM), double data rate SDRAM, enhanced SDRAM, SLDRAM, Synchronous Link DRAM (SLDRAM), and direct rambus RAM (DR RAM). It should be noted that the memory of the systems and methods described herein is intended to comprise, without being limited to, these and any other suitable types of memory.
It should be noted that when the processor is a general-purpose processor, a DSP, an ASIC, an FPGA or other programmable logic device, a discrete gate or transistor logic device, or a discrete hardware component, the memory (memory module) is integrated in the processor. It should be noted that the memory described herein is intended to comprise, without being limited to, these and any other suitable types of memory.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
It is clear to those skilled in the art that, for convenience and brevity of description, the specific working processes of the above-described systems, apparatuses and units may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present application or portions thereof that substantially contribute to the prior art may be embodied in the form of a software product stored in a storage medium and including instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present application. And the aforementioned storage medium includes: various media capable of storing program codes, such as a usb disk, a removable hard disk, a read-only memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk.
Although the present invention is disclosed above, the present invention is not limited thereto. Various changes and modifications may be effected therein by one skilled in the art without departing from the spirit and scope of the invention as defined in the appended claims.
Claims (13)
1. A Nand Flash bad block detection method is characterized by comprising the following steps:
after software burning of the Nand Flash is started, receiving a scanning command from a burner;
responding to the scanning command to scan the Nand Flash to obtain bad block information of the Nand Flash;
and returning the bad block information to the burner so that the burner determines whether to continue burning according to the bad block information.
2. The Nand Flash bad block detection method as claimed in claim 1, wherein the scan command includes manufacturer information of the Nand Flash.
3. The Nand Flash bad block detection method as claimed in claim 1, wherein the scanning the Nand Flash in response to the scan command comprises:
responding to the scanning command and performing handshake with the Nand Flash;
and after the handshake is successful, scanning the Nand Flash.
4. The Nand Flash bad block detection method as claimed in claim 1, wherein the receiving the scan command from the burner comprises:
receiving the scanning command sent according to a first preset data format, wherein the first preset data format comprises a head, a command type, a data length, a data content, a check code and a tail, and the command type of the scanning command is a first preset value.
5. The Nand Flash bad block detection method as claimed in claim 1, wherein the returning the bad block information to the burner comprises:
and returning the bad block information to the burner according to a second preset data format, wherein the second preset data format comprises a head part, a command type, a data length, data content, a check code and a tail part, and the command type of the bad block information is a second preset value.
6. A Nand Flash bad block detection method is characterized by comprising the following steps:
after software burning of the Nand Flash is started, a scanning command is sent;
receiving bad block information of the Nand Flash, wherein the bad block information is obtained by scanning the Nand Flash by a terminal device in response to the scanning command;
and determining whether to continue burning or not according to the bad block information.
7. The Nand Flash bad block detection method as claimed in claim 6, wherein the bad block information includes a bad block number, and the determining whether to continue burning according to the bad block information includes:
when the number of the bad blocks is smaller than a preset threshold, continuing to execute software burning of the Nand Flash;
or stopping the software burning of the Nand Flash when the number of the bad blocks reaches a preset threshold.
8. The Nand Flash bad block detection method as claimed in claim 6, wherein the scan command includes manufacturer information of the Nand Flash, and the sending the scan command includes:
and forming the scanning command by the manufacturer information of the Nand Flash according to a first preset data format, and sending the scanning command out, wherein the first preset data format comprises a head part, a command type, a data length, data content, a check code and a tail part, and the command type of the scanning command is a first preset value.
9. A Nand Flash bad block detection device is characterized by comprising:
the scanning command receiving module is used for receiving a scanning command from the burner after starting software burning of the Nand Flash;
the scanning module is used for responding to the scanning command to scan the Nand Flash so as to obtain bad block information of the Nand Flash;
and the bad block information sending module is used for returning the bad block information to the burner so that the burner can determine whether to continue burning according to the bad block information.
10. A Nand Flash bad block detection device is characterized by comprising:
the scanning command sending module is used for sending a scanning command after starting software burning of the Nand Flash;
a bad block information receiving module, configured to receive bad block information of the Nand Flash, where the bad block information is obtained by a terminal device scanning the Nand Flash in response to the scanning command;
and the burning determining module is used for determining whether to continue burning or not according to the bad block information.
11. A storage medium having stored thereon a computer program, characterized in that the computer program, when being executed by a processor, executes the steps of the Nand Flash bad block detection method of any one of claims 1 to 8.
12. A terminal comprising a memory and a processor, the memory having stored thereon a computer program operable on the processor, wherein the processor executes the computer program to perform the steps of the Nand Flash bad block detection method of any of claims 1 to 5.
13. A burner comprising a memory and a processor, the memory having stored thereon a computer program operable on the processor, wherein the processor executes the computer program to perform the steps of the Nand Flash bad block detection method of any one of claims 6 to 8.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011360152.4A CN112382330B (en) | 2020-11-27 | 2020-11-27 | Nand Flash bad block detection method and device, storage medium, terminal and burner |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011360152.4A CN112382330B (en) | 2020-11-27 | 2020-11-27 | Nand Flash bad block detection method and device, storage medium, terminal and burner |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112382330A true CN112382330A (en) | 2021-02-19 |
| CN112382330B CN112382330B (en) | 2022-09-09 |
Family
ID=74588453
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202011360152.4A Active CN112382330B (en) | 2020-11-27 | 2020-11-27 | Nand Flash bad block detection method and device, storage medium, terminal and burner |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112382330B (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106569852A (en) * | 2016-10-24 | 2017-04-19 | 乐视控股（北京）有限公司 | Burning method and device |
| US20170115890A1 (en) * | 2015-10-22 | 2017-04-27 | HoneycombData Inc. | Eliminating garbage collection in nand flash devices |
| CN106909482A (en) * | 2017-03-01 | 2017-06-30 | 郑州云海信息技术有限公司 | A kind of method and device of solid-state disk service life detection |
| CN107608692A (en) * | 2017-09-01 | 2018-01-19 | 江苏钜芯集成电路技术股份有限公司 | Wireless burning device |
-
2020
- 2020-11-27 CN CN202011360152.4A patent/CN112382330B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20170115890A1 (en) * | 2015-10-22 | 2017-04-27 | HoneycombData Inc. | Eliminating garbage collection in nand flash devices |
| CN106569852A (en) * | 2016-10-24 | 2017-04-19 | 乐视控股（北京）有限公司 | Burning method and device |
| CN106909482A (en) * | 2017-03-01 | 2017-06-30 | 郑州云海信息技术有限公司 | A kind of method and device of solid-state disk service life detection |
| CN107608692A (en) * | 2017-09-01 | 2018-01-19 | 江苏钜芯集成电路技术股份有限公司 | Wireless burning device |
Non-Patent Citations (1)
| Title |
|---|
| 于浩杰: "基于DSP芯片PNX1501的NandFlash在线烧录系统", 《电子元器件应用》 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN112382330B (en) | 2022-09-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8051331B2 (en) | Memory card and its initial setting method | |
| US9043549B2 (en) | Memory storage apparatus, memory controller, and method for transmitting and identifying data stream | |
| JP4600518B2 (en) | Information processing apparatus, information processing system, information processing method, and computer program | |
| CN109298867B (en) | Chip off-line burning method, device and system and computer readable storage medium | |
| TW201711049A (en) | Method for managing a memory apparatus, and associated memory apparatus thereof and associated controller thereof | |
| CN109213448B (en) | Method, device, equipment and storage medium for erasing and writing data of smart card | |
| CN110543281A (en) | Storage compression implementation method, device, equipment and storage medium | |
| US9928137B2 (en) | Data storage device and error correction method | |
| CN112382330B (en) | Nand Flash bad block detection method and device, storage medium, terminal and burner | |
| WO2021179211A1 (en) | Method and apparatus for determining data integrity, and electronic device and storage medium | |
| CN111143258B (en) | Method, system, device and medium for accessing FPGA (field programmable Gate array) by system based on Opencl | |
| US9071718B2 (en) | Information processing apparatus, image forming apparatus, non-transitory computer readable medium storing program, and information processing method | |
| CN111078235B (en) | Digital power supply chip burning method and device | |
| US8225028B2 (en) | Memory devices and methods for programming flash memory utilizing spare blocks | |
| US10782345B2 (en) | Debugging a semiconductor device | |
| US11755439B2 (en) | Memory controller, test device and link identification method | |
| CN110990313B (en) | Method, equipment and storage medium for processing clock stretching of I3C bus | |
| CN114817218A (en) | Data verification method and system, electronic device and readable storage medium | |
| CN111625184A (en) | Flash memory data burning method and system | |
| US9880831B2 (en) | Field firmware upgrading method and computer-readable medium | |
| US20230305716A1 (en) | Data storage system and parameter margin evaluation method | |
| JP7468754B1 (en) | ELECTRONIC INFORMATION STORAGE MEDIUM, IC CHIP, IC CARD, RECEPTION BLOCK PROCESSING METHOD, AND PROGRAM | |
| JP5786702B2 (en) | Security token, instruction execution method in security token, and computer program | |
| TWI698750B (en) | Method for accessing flash memory module and associated flash memory controller and electronic device | |
| CN109933293B (en) | Data writing method and device based on SpiFlash and computer equipment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |