CN112305326A - Device for measuring surface potential of moon in place - Google Patents
Device for measuring surface potential of moon in place Download PDFInfo
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- CN112305326A CN112305326A CN201910699251.6A CN201910699251A CN112305326A CN 112305326 A CN112305326 A CN 112305326A CN 201910699251 A CN201910699251 A CN 201910699251A CN 112305326 A CN112305326 A CN 112305326A
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- 150000002500 ions Chemical class 0.000 claims abstract description 41
- 230000000903 blocking effect Effects 0.000 claims abstract description 29
- 238000005259 measurement Methods 0.000 claims description 8
- 230000000979 retarding effect Effects 0.000 claims description 4
- 230000008859 change Effects 0.000 claims description 3
- 239000004020 conductor Substances 0.000 claims description 3
- 230000005764 inhibitory process Effects 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- 230000001629 suppression Effects 0.000 claims description 3
- 230000000149 penetrating effect Effects 0.000 claims description 2
- 238000011065 in-situ storage Methods 0.000 claims 3
- 238000012625 in-situ measurement Methods 0.000 claims 2
- 230000006872 improvement Effects 0.000 description 9
- 238000013461 design Methods 0.000 description 5
- 239000002689 soil Substances 0.000 description 5
- 238000000034 method Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000011160 research Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
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- 238000006243 chemical reaction Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/12—Measuring electrostatic fields or voltage-potential
- G01R29/14—Measuring field distribution
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
The invention provides a device for measuring the surface potential of a moon in place, which comprises: the device comprises a shielding grid (3), a blocking grid (4), a collecting electrode (5), a main structure (7), a contact type grounding grid (8) and an internal circuit; the main structure (7) is a cuboid, a circular opening is formed above the main structure, and a shielding grid (3) for blocking electrons from passing through and a blocking grid (4) for blocking ions from passing through are arranged at the opening; the shielding grid (3) is arranged above the blocking grid (4); a collecting electrode (5) is arranged below the blocking grid (4); the collecting electrode (5) is connected with an internal circuit; a supporting leg structure (6) is arranged below the main body structure (7) so as to be placed on the surface of the moon conveniently; the contact type grounding net (8) is arranged between the supporting leg structure (6) and the surface of the moon, is connected with the internal circuit through a lead and provides a reference ground potential for the internal circuit.
Description
Technical Field
The invention belongs to the field of spaceflight, and particularly relates to a device for measuring the surface potential of a moon in place.
Background
With the development of lunar exploration in the future, relevant scientific exploration and research can be developed on the lunar surface by spacecrafts and astronauts in China. Related studies have shown that there is a large difference in lunar surface potential between nighttime and daytime. The surface potential of the lunar surface and its changes are of great importance to the safe activities of astronauts in the lunar environment. Therefore, there is a need for a device capable of measuring lunar surface potentials that achieves true and reliable lunar surface potentials and provides a data reference for safe lunar activities. At present, scientists are mostly in the phase of analog simulation for studying lunar surface potential.
The moon surface is covered with a weathered layer, i.e. lunar soil. Due to the action of the space charged particles, lunar soil is charged in a large amount, so that lunar surface potential is formed. However, lunar soil has poor electrical conductivity, unlike the good conductivity of earth soil, and thus it is necessary to design a device capable of adapting to lunar soil to obtain regional potentials of different topography.
Disclosure of Invention
The invention aims to solve the problem that most scientists research the surface potential of the moon at present is in the stage of analog simulation and lacks of a measuring device.
To achieve the above object, the present invention provides an apparatus for measuring the surface potential of the moon in place, the apparatus comprising:
the device comprises a shielding grid (3), a blocking grid (4), a collecting electrode (5), a main structure (7), a contact type grounding grid (8), an internal measuring circuit and an internal voltage circuit;
the main structure (7) is a cuboid box body, a round opening is arranged above the box body, and a shielding grid mesh (3) for blocking electrons from passing through and a blocking grid mesh (4) for blocking ions from passing through are arranged at the opening;
the shielding grid (3) is arranged above the blocking grid (4); a collecting electrode (5) is arranged below the blocking grid (4);
the shielding grid (3) and the blocking grid (4) are connected with an internal voltage circuit;
the collecting electrode (5) is connected with an internal measuring circuit;
a supporting leg structure (6) is arranged below the main body structure (7);
the contact type grounding net (8) is arranged between the supporting leg structure (6) and a local area of the lunar surface, is connected with the internal circuit through a lead, and takes the lunar surface potential as the reference ground potential of the internal circuit;
and calculating the lunar surface potential by adopting the existing current measuring circuit design according to the internal measuring circuit and the scanning voltage generated by the internal voltage circuit at the inflection point of the measured current change is equal to the incident ion potential.
As an improvement of the device, the supporting leg structure (6) is divided into 4 supporting legs which can be unfolded to a certain angle, and the 4 supporting legs can be folded inwards below the main body structure (7) and are flush with the bottom surface.
As an improvement of the device, the contact type ground net (8) is a symmetrical cross-shaped spoke on which a ring-shaped coil is arranged; wherein, the spokes and the annular coil are all metal conductors;
as an improvement of the device, the contact type grounding grid (8) obtains the electric potential V of the local area of the lunar surface to be measured in a direct contact modeoAnd is connected to the "ground" of the internal circuit by a wire.
As an improvement of the device, the internal voltageA circuit designed by the existing voltage circuit for measuring the local lunar surface potential VoAs a reference, an inhibition voltage V is generatedeIs applied to a shielding grid (3) to block the passage of electrons and generates a scanning voltage Vs+VoLoading on a blocking grid (4) to block the ions from passing through.
As an improvement of the device, the internal measurement circuit is arranged to measure the current generated by ions penetrating the retarding grid (4) striking the collector (5).
As an improvement of the device, the size of the ion current and the scanning step size and the scanning voltage V are obtained on the collecting electrode (5)s+VoThe amplitude of (c) is related:
when the scan voltage V iss+Vo<VpWhile the collecting electrode (5) has an ion current, VpIs an incident potential;
when V iss+Vo>VpWhen no current is generated on the collecting electrode (5), the value of the ionic current obtained by the internal measuring circuit is 0.
As an improvement of said device, said local area lunar surface potential VoComprises the following steps:
Vo＝Vp-Vs (1)
wherein, VpIs a known incident ion potential, V, when the current value generated by the collecting electrode (5) measured by the measuring circuit is 0sKnown as the scan potential.
As an improvement of the device, the scanning potential VsIs negative in daytime, and the scanning step amplitude is less than the ion incident potential Vp(ii) a The scanning potential VsPositive value at night, and scanning step amplitude smaller than ion incident potential Vp。
As an improvement of the device, the device also comprises an ion energy detector integrated in the main structure (7) and used for acquiring the incident ion energy and inverting to obtain the ion incident potential Vp。
Compared with the prior art, the invention has the advantages that:
1. the device for measuring the surface potential of the moon in place can detect the potential of the region on the surface of the moon in place to obtain potential data of different landforms of the moon surface;
2. the device for measuring the surface potential of the moon in place can obtain corresponding in-place data by moving the device and placing the device on different landforms of the moon surface;
3. the device for measuring the surface potential of the moon in place has the advantages of small volume, light weight and low power consumption, and is convenient for astronauts to carry and use on the surface of the moon;
4. the device for measuring the surface potential of the moon in place utilizes the principle of blocking ions to obtain the zone potential of the moon surface in place;
5. the device for measuring the surface potential of the moon in place effectively solves the problem of poor conductivity of the surface of the moon by using a contact type grounding grid, and ensures that the device can use the surface potential of the moon to be measured as the reference ground potential.
Drawings
FIG. 1 is a schematic diagram of the components of the apparatus for measuring the surface potential of the moon in place according to the present invention;
FIG. 2 is a perspective view of the apparatus for measuring lunar surface potential in place in accordance with the present invention;
FIG. 3 is a top view of the apparatus for measuring lunar surface potential in place of the present invention;
FIG. 4 is a layout view of a contact counterpoise of the apparatus for measuring lunar surface potential in place according to the present invention;
fig. 5 is a block diagram of the working principle of the device for measuring the surface potential of the moon in place according to the invention.
Reference symbols of the drawings
1. Lunar surface 2, ion incidence 3, shielding grid
4. Retarding grid 5, collecting electrode 6, supporting leg structure
7. Main structure 8, contact type ground net
Detailed Description
The invention is described in detail below with reference to the figures and specific embodiments.
The device for measuring the surface potential of the moon in place comprises a shielding grid 3, a blocking grid 4, a collecting electrode 5, a main body structure 7, a contact type grounding grid 8 and an internal circuit, and is shown in figure 1.
The main structure 7 is a cuboid box body, a circular opening is arranged above the box body, and a shielding grid mesh 3 and a blocking grid mesh 4 are arranged at the opening. The shielding grid 3 acts to block electrons from passing through the grid and the blocking grid 4 acts to block ions from passing through the grid. Below the grid, a collecting electrode 5 is arranged. Below the main structure 7, a support foot structure 6 is provided for placement on the moon surface.
The main structure 7 is a rectangular box, as shown in fig. 2. The electronic circuit is arranged inside the box body to avoid the influence of the moon surface environment.
The supporting foot structure 6, as shown in fig. 3, is divided into 4 supporting feet which can be unfolded to a certain angle, so as to be placed on the surface of the moon stably. In the transportation and carrying process of astronauts, the 4 supporting legs can be folded inwards below the cuboid and are flush with the bottom surface.
The internal circuit includes an internal voltage circuit and an internal measurement circuit. The voltage circuit and the internal measurement circuit are based on an existing circuit design.
The internal voltage circuit takes the potential of the contact type grounding grid 8 as the ground potential, and respectively generates scanning voltage and suppression voltage through the analog-to-digital conversion circuit and the voltage proportion circuit. Wherein the scanning voltage is applied to the blocking grid 4. The suppression voltage is applied to the shielding grid 3. The internal measurement circuit is primarily to measure the current formed on the collecting electrode 5 by ions passing through the grid.
The function of the contact type grounding grid 8 is to obtain the potential of the local area of the lunar surface to be measured in a direct contact mode and connect the potential with the ' ground ' of the internal circuit of the device through a lead, so that the device takes the lunar surface potential of the local area to be measured as the ground potential ' Vo"perform the measurement work. Contact type ground net 8The design of (2) is as shown in fig. 4, symmetrical cross-shaped spokes are adopted, and annular coils are arranged on the spokes. Wherein, the spokes and the annular coil are all metal conductors.
The working principle of the device for measuring the surface potential of the moon in place of the invention is shown in figure 5, and the internal voltage circuit is at ground potential VoAs a reference, an inhibition voltage V is generatede。VeNegative, loaded onto a shielding grid 3, said shielding grid 3 being able to block the penetration of electrons, ensuring the passage of ions, so that the collecting electrode 5 only collects the ionic current.
Internal voltage circuit at ground potential VoAs a reference, a scanning voltage V is generateds+VoAnd is loaded onto the retarding grid 4.
Setting the known incident ion potential to Vp，VpPositive values. When V iss+Vo<VpIons will penetrate the blocking grid 4 and strike the collecting electrode 5, generating a current IiThe internal measurement circuit obtains a current value greater than 0.
When V iss+VoGradually approaches to VpIn the process, the ion current collected by the collecting electrode 5 is gradually reduced.
When V iss+Vo>VpWhen the ion is blocked by the blocking grid 4, no current is generated on the collecting electrode 5, and the current value obtained by the internal measuring circuit is 0.
According to a certain scanning step length, the amplitude of the scanning voltage is changed, and ion current with corresponding size is obtained on the collecting electrode 5.
And solving the inflection point of the current change according to a V-I curve formed by the scanning voltage and the collected current. The scan voltage at the inflection point is the same as the incident ion potential, i.e. Vs+Vo＝Vp. Due to Vp、VsAll are known quantities, thus obtaining the potential V of the local area of the lunar surface to be measuredo＝Vp-Vs。
Relevant research shows that the moon surface is positively charged, namely V, in the daytime due to the influence of illuminationo> 0, presence of Vo＞VpIn the case of. Therefore, when the lunar surface potential is positive during the day, the scanning voltage VsShould be negative and the scan step amplitude is less than the energy of the incident ion.
At night, the moon surface will be negatively charged, i.e. V, due to the influence of the electrical chargeoIs less than 0. Therefore, when the lunar surface potential is negative at night, the potential V is scannedsShould be positive and the scan step amplitude is less than the energy of the incident ion.
In the practical application process, the ion energy detector can obtain the incident ion energy and obtain the ion potential V through inversionp. The ion energy detector can also be integrated in the main structure of the device for integrated design.
Finally, it should be noted that the above embodiments are only used for illustrating the technical solutions of the present invention and are not limited. Although the present invention has been described in detail with reference to the embodiments, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted without departing from the spirit and scope of the invention as defined in the appended claims.
Claims (10)
1. An apparatus for measuring the surface potential of the moon in position, the apparatus comprising: the device comprises a shielding grid (3), a blocking grid (4), a collecting electrode (5), a main structure (7), a contact type grounding grid (8), an internal measuring circuit and an internal voltage circuit;
the main structure (7) is a cuboid box body, a circular opening is formed above the main structure, and a shielding grid mesh (3) for blocking electrons from passing through and a blocking grid mesh (4) for blocking ions from passing through are arranged at the opening;
the shielding grid (3) is arranged above the blocking grid (4); a collecting electrode (5) is arranged below the blocking grid (4);
the shielding grid (3) and the blocking grid (4) are connected with an internal voltage circuit;
the collecting electrode (5) is connected with an internal measuring circuit;
a supporting leg structure (6) is arranged below the main body structure (7);
the contact type grounding net (8) is arranged between the supporting leg structure (6) and a local area of the lunar surface, is connected with the internal circuit through a lead, and takes the lunar surface potential as the reference ground potential of the internal circuit;
the internal measurement circuit calculates the lunar surface potential according to the equality of the scanning voltage generated by the internal voltage circuit at the inflection point of the measured current change and the incident ion potential.
2. Device for measuring the surface potential of the moon in place according to claim 1, characterized in that the supporting foot structure (6) comprises 4 supporting feet which can be unfolded to a certain angle, and the 4 supporting feet can be folded inwards under the main structure (7) and flush with the bottom surface.
3. Device for measuring the surface potential of the moon in place according to claim 1, characterized in that said contact counterpoise (8) is a symmetrical, mitre-shaped spoke on which a toroidal coil is arranged; wherein, the spokes and the annular coil are all metal conductors.
4. Device for measuring the surface potential of the moon in place according to claim 3, characterized in that said contact-type counterpoise (8) obtains the local area potential V of the moon surface to be measured in direct contactoAnd is connected to the "ground" of the internal circuit by a wire.
5. Device for measuring the surface potential of the moon in place according to claim 4,
the internal voltage circuit is used for measuring the local lunar surface potential VoAs a reference, an inhibition voltage V is generatedeIs applied to a shielding grid (3) to block the passage of electrons and generates a scanning voltage Vs+VoLoading on a blocking grid (4) to block ions from passing through; the suppression voltage VeIs negative.
6. An apparatus for in-situ measurement of lunar surface potential as claimed in claim 5, wherein said internal measurement circuit is adapted to measure the current generated by ions penetrating the retarding grid (4) hitting the collector (5).
7. Device for in-situ measurement of the lunar surface potential according to claim 6, characterized in that the ion current is obtained on the collecting electrode (5) with the scanning step and the scanning voltage Vs+VoThe relationship of (1) is:
if the scanning voltage Vs+Vo<VpThen the collecting electrode (5) has an ion current, VpIs an incident potential;
if Vs+Vo>VpOr Vs+Vo＝VpNo current is generated on the collecting electrode (5).
8. Device for measuring lunar surface potential in situ according to claim 7, characterized in that said local area lunar surface potential VoComprises the following steps:
Vo＝Vp-Vs (1)
wherein, VpIs a known incident ion potential, V, when the current value generated by the collecting electrode (5) measured by the measuring circuit is 0sKnown as the scan potential.
9. Device for measuring lunar surface potential in situ according to claim 7, characterized in that said scanning potential VsIs negative in daytime, and the scanning step amplitude is less than the ion incident potential Vp(ii) a The scanning potential VsPositive value at night, and scanning step amplitude smaller than ion incident potential Vp。
10. Apparatus for measuring lunar surface potential in situ according to claim 9, characterized in that it further comprises integrating an ion energy detector in the body structure (7) for obtaining the energy of the incident ions, inverting to obtain the ion influxEmitter potential Vp。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910699251.6A CN112305326B (en) | 2019-07-31 | Device for measuring moon surface potential in place |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910699251.6A CN112305326B (en) | 2019-07-31 | Device for measuring moon surface potential in place |
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| CN112305326A true CN112305326A (en) | 2021-02-02 |
| CN112305326B CN112305326B (en) | 2024-07-05 |
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| CN117169606A (en) * | 2023-11-01 | 2023-12-05 | 国科大杭州高等研究院 | Multifunctional ion characteristic detection probe and ion characteristic detection method |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113438786A (en) * | 2021-05-17 | 2021-09-24 | 中国科学院国家空间科学中心 | Device for collecting space thermal plasma |
| CN117169606A (en) * | 2023-11-01 | 2023-12-05 | 国科大杭州高等研究院 | Multifunctional ion characteristic detection probe and ion characteristic detection method |
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