CN117169606A - Multifunctional ion characteristic detection probe and ion characteristic detection method - Google Patents
Multifunctional ion characteristic detection probe and ion characteristic detection method Download PDFInfo
- Publication number
- CN117169606A CN117169606A CN202311433292.3A CN202311433292A CN117169606A CN 117169606 A CN117169606 A CN 117169606A CN 202311433292 A CN202311433292 A CN 202311433292A CN 117169606 A CN117169606 A CN 117169606A
- Authority
- CN
- China
- Prior art keywords
- ion
- collector
- voltage
- characteristic detection
- fixedly connected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 title claims abstract description 84
- 238000001514 detection method Methods 0.000 title claims abstract description 44
- 150000002500 ions Chemical class 0.000 claims abstract description 118
- 239000012212 insulator Substances 0.000 claims description 15
- 238000001739 density measurement Methods 0.000 claims description 11
- 238000000034 method Methods 0.000 claims description 6
- 238000010884 ion-beam technique Methods 0.000 claims description 5
- 238000005259 measurement Methods 0.000 claims description 4
- 238000013459 approach Methods 0.000 claims description 3
- 230000004069 differentiation Effects 0.000 claims description 2
- 238000009434 installation Methods 0.000 claims 2
- 230000001419 dependent effect Effects 0.000 abstract description 5
- 238000005315 distribution function Methods 0.000 abstract description 5
- 230000002452 interceptive effect Effects 0.000 abstract description 4
- 239000002245 particle Substances 0.000 abstract description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 238000013461 design Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000010292 electrical insulation Methods 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001846 repelling effect Effects 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Landscapes
- Plasma Technology (AREA)
Abstract
The application relates to a multifunctional ion characteristic detection probe and an ion characteristic detection method, wherein the multifunctional ion characteristic detection probe is fixedly connected with a shielding grid outside a Faraday probe shell, so that the Faraday probe has the function of measuring ion energy, a voltage source meter capable of applying scanning voltage is additionally arranged on an original collector circuit, so that the collector is provided with voltage, when the voltage is completely the same as the energy of beam ions, the beam ions cannot reach the collector, at the moment, the indication number of the current meter is zero, and the maximum voltage at the moment, namely the maximum energy of the beam ions, is obtained. And performing a first derivative on a function which takes the ion current as a dependent variable and the scanning voltage as an independent variable to obtain an ion energy distribution function, wherein the scanning voltage corresponding to the maximum value is ion average energy. The shielding component prevents secondary electrons or other particles from interfering with the original discharge morphology, so that the application range of the Faraday probe is effectively widened.
Description
Technical Field
The application relates to the technical field of aerospace instruments, in particular to a multifunctional ion characteristic detection probe and an ion characteristic detection method.
Background
The aerospace engineering relates to research, design, development, construction and test of aircrafts such as airplanes and aircrafts such as artificial satellites, is one branch of engineering, comprises knowledge in a plurality of fields such as mathematics, physics, computers, materials and the like, and mainly researches the design and manufacturing technology of aircrafts outside the earth atmosphere, such as artificial satellites, landers, space stations and the like.
Various aerospace instruments are needed to be used in aerospace engineering, and a Faraday probe is one of the aerospace instruments and is often used in aerospace engineering. Typically, the collector of the faraday probe is connected to a current meter, current values are acquired in real time, and the shield enclosure is negatively biased for repelling electrons in the plume.
Existing faraday probes can be used to detect ion distribution characteristics in plumes generated by electric thrusters. However, the current faraday probe has a single function and can only measure the ion current density in the plasma, so that the faraday probe cannot meet different requirements.
Disclosure of Invention
Based on this, it is necessary that existing faraday probes be used to detect ion distribution characteristics in plumes generated by electric thrusters. However, the current faraday probe has a single function, and can only measure the ion current density in the plasma, so that the faraday probe can not meet different requirements.
In one aspect, the present application provides a multifunctional ion characteristic detection probe comprising:
the Faraday probe shell is a hollow cylinder, and one end of the Faraday probe shell is fixedly connected with a first connecting groove;
the shielding assembly comprises a shielding grid and a shielding shell, wherein the shielding grid is fixedly connected to one end of the shielding shell, and the shielding shell is nested outside the Faraday probe shell;
the collecting assembly comprises a collector, a supporting body and an insulator, wherein the collector is fixedly connected to one end of the supporting body, the supporting body is fixedly connected to the inside of the insulator, and the insulator is fixedly connected to the inside of the Faraday probe shell.
On the other hand, the application also provides an ion characteristic detection method.
The ion current density measurement method is applied to the multifunctional ion characteristic detection probe as mentioned in the foregoing, and comprises the following steps:
configuring a plasma thruster into an ion current density measurement mode, and adjusting a Faraday probe to be positioned at a first position;
starting a plasma thruster in an ion current density measurement mode to form ion beam current;
and connecting an ion current density measuring circuit to measure the ion current density.
The application relates to a multifunctional ion characteristic detection probe and an ion characteristic detection method, wherein a shielding grid is fixedly connected outside a Faraday probe shell, so that the Faraday probe has the function of measuring ion energy, a voltage source meter capable of applying scanning voltage is additionally arranged on an original collector circuit, so that the collector is provided with voltage, when the voltage is completely the same as the energy of beam ions, the beam ions cannot reach the collector, the indication of the current meter is zero, and the maximum voltage at the moment is the maximum energy of the beam ions. And performing a first derivative on a function which takes the ion current as a dependent variable and the scanning voltage as an independent variable to obtain an ion energy distribution function, wherein the scanning voltage corresponding to the maximum value is ion average energy. The shielding component shields the collector from the plasma thruster body, so that secondary electrons or other particles generated are prevented from interfering with the original discharge morphology, and the application range of the Faraday probe is effectively widened.
Drawings
Fig. 1 is a schematic structural diagram of a multifunctional ion characteristic detection probe according to an embodiment of the present application.
Fig. 2 is a schematic perspective view of a multifunctional ion characteristic detection probe according to an embodiment of the application.
Fig. 3 is a schematic perspective view illustrating removal of a shielding grid and a shielding case in a multifunctional ion characteristic detection probe according to an embodiment of the present application.
Fig. 4 is a schematic perspective view of a support in a multifunctional ion characteristic detection probe according to an embodiment of the application.
Fig. 5 is a schematic perspective view of an insulator in a multifunctional ion characteristic detection probe according to an embodiment of the present application.
Fig. 6 is a schematic perspective view of a shielding gate in a multifunctional ion characteristic detection probe according to an embodiment of the application.
Fig. 7 is a schematic perspective view of a shielding shell in a multifunctional ion characteristic detecting probe according to an embodiment of the application.
Fig. 8 is a schematic perspective view of a mounting base of a multifunctional ion characteristic detection probe according to an embodiment of the present application.
Fig. 9 is a flow chart of a method for measuring ion current density of a multifunctional ion characteristic detection probe according to an embodiment of the application.
Fig. 10 is a flow chart of a method for measuring ion energy of a multifunctional ion characteristic detection probe according to an embodiment of the application.
Fig. 11 is a circuit connection diagram of a multifunctional ion characteristic detection probe in an ion current density measurement mode according to an embodiment of the present application.
Fig. 12 is a circuit connection diagram of a multifunctional ion characteristic detection probe in an ion energy measurement mode according to an embodiment of the present application.
Reference numerals:
1. a high-precision ammeter; 2. a constant voltage source; 3. a scanning voltage source;
100. a Faraday probe housing; 101. a first connection groove; 200. a shielding assembly;
300. a collection assembly; 400. a mounting base; 201. a shield gate; 202. a shielding housing;
203. a gate mounting groove; 204. a gate hole; 205. a second connecting groove; 301. a collector;
302. a support body; 303. an insulator; 302a, a support table; 302b, mounting slots;
302c, tail threads; 303a, a support section; 303b, a positioning section; 303c, a limiting section;
303d, mounting holes; 401. a first connection hole; 402. and a second connection hole.
Detailed Description
The present application will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present application more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application.
As shown in fig. 1 to 3, the present application provides a multifunctional ion characteristic detection probe including a faraday probe enclosure 100, a shielding assembly 200, and a collection assembly 300.
The faraday probe housing 100 is a hollow cylinder, and one end of the faraday probe housing 100 is fixedly connected with a first connecting groove 101. The shielding assembly 200 includes a shielding grid 201 and a shielding housing 202, the shielding grid 201 is fixedly connected to one end of the shielding housing 202, and the shielding housing 202 is nested outside the faraday probe housing 100. The collecting assembly 300 comprises a collector 301, a supporting body 302 and an insulator 303, wherein the collector 301 is fixedly connected to one end of the supporting body 302, the supporting body 302 is fixedly connected to the inside of the insulator 303, and the insulator 303 is fixedly connected to the inside of the Faraday probe housing 100.
Specifically, the material of the collector 301 may be a metal material having a low secondary electron emission coefficient. The material of the support 302 may be stainless steel. The material of the insulator 303 may be a ceramic material.
The application relates to a multifunctional ion characteristic detection probe, which is characterized in that a shielding grid 201 is fixedly connected outside a Faraday probe shell 100, so that the Faraday probe has the function of measuring ion energy, a voltage source meter capable of applying scanning voltage is additionally arranged on an original collector 301 circuit, so that the collector 301 is provided with voltage, when the voltage is completely the same as the energy of beam ions, the beam ions cannot reach the collector 301, the indication of a high-precision ammeter is zero, and the maximum voltage at the moment is the maximum energy of the beam ions. And performing a first derivative on a function which takes the ion current as a dependent variable and the scanning voltage as an independent variable to obtain an ion energy distribution function, wherein the scanning voltage corresponding to the maximum value is ion average energy. The shielding assembly 200 shields the collector 301 from the plasma thruster body, so as to prevent secondary electrons or other particles from interfering with the original discharge morphology. Effectively expands the application range of the Faraday probe.
As shown in fig. 4, in an embodiment of the present application, the support body 302 includes a support base 302a, a mounting groove 302b and a tail screw 302c, the mounting groove 302b is fixedly connected to one end of the support base 302a, the tail screw 302c is fixedly connected to the other end of the support base 302, and the collector 301 is fixedly connected to the mounting groove 302b.
Specifically, the support 302 has a T-shape, and the support base 302a has an outer diameter equal to or greater than the diameter of the mounting groove 302b, so as to ensure that the collector 301 occupies a main collecting area. The outer diameter of the support table 302a also needs to be smaller than the inner diameter of the faraday probe enclosure 100 to ensure electrical insulation between the support table 302a and the faraday probe enclosure 100. The depth of the mounting groove 302b is equal to the thickness of the collector 301 to ensure that the collection plane of the collector 301 is flush with the plane of the front end of the support 302.
In this embodiment, the collector 301 is fixedly connected to the support base 302a through the mounting groove 302b, and one end of the support base 302a is fixedly connected to the first connection hole 401 of the mounting base 400 through the mounting hole 303d of the insulator 303. The tail threads 302c are electrically connected to the collector 301.
As shown in fig. 5, in an embodiment of the present application, the insulator 303 includes a supporting section 303a, a positioning section 303b, a limiting section 303c and a mounting hole 303d, one end of the supporting section 303a is fixedly connected with the positioning section 303b, the limiting section 303c is nested outside the supporting section 303b, the supporting section 303a is provided with the mounting hole 303d, and the lower end of the supporting table 302a is inserted into the mounting hole 303 d.
Specifically, the total height of the support section 303a, the positioning section 303b, and the support table 302a is equal to the height of the inner hollow portion of the faraday probe enclosure 100.
In this embodiment, the support 302 and the collector 301 are fixedly connected to the inside of the faraday probe enclosure 100 by the support section 303a, and the positioning section 303b ensures that the support 302 and the collector 301 can be connected to a specified position.
As shown in fig. 6 and fig. 7, in an embodiment of the present application, one end of the shielding shell 202 is fixedly connected with a second connection slot 205, the other end of the shielding shell 202 is provided with a grid mounting slot 203, the shielding grid 201 is fixedly connected to the grid mounting slot 203, and the shielding grid 201 is provided with a grid hole 204.
Specifically, the height of the bottom of the grid mounting slot 203 of the shield enclosure 202 is higher than the height of the collection plane of the collector 301 to ensure electrical insulation between the shield enclosure 202, the shield grid 201 and the collector 301. The transmittance of the shield gate 201 may be 50% or 75%. The shape of the gate hole 204 may be circular or rectangular.
In this embodiment, the collector 301 is shielded from the plasma emitter by the shielding grid 201, so as to avoid secondary electrons or other particles from interfering with the original discharge morphology.
As shown in fig. 8, in an embodiment of the present application, the multifunctional ion property detection probe further includes:
the mounting base 400, a first connection hole 401 and a second connection hole 402 are formed in the mounting base 400, one end of the support body 302 is fixedly connected to the first connection hole 401, and one end of the faraday probe housing 100 is fixedly connected to the second connection hole 402.
Specifically, the second connection holes 402 are identical to the number of the first connection grooves 101 of the faraday probe enclosure 100.
In this embodiment, the support 302 is fixedly connected to the mounting base 400 through the first connection hole 401, and the faraday probe enclosure 100 is fixedly connected to the mounting base 400 through the second connection hole 402.
The application also provides an ion characteristic detection method.
As shown in fig. 9 and 10, in an embodiment of the present application, the ion characteristic detection method includes:
s100, configuring a plasma thruster as an ion current density measurement mode, and adjusting a Faraday probe to be positioned at a first position;
s110, starting a plasma thruster in an ion current density measurement mode to form ion beam current;
s120, connecting an ion current density measuring circuit to measure the ion current density.
In particular, the first position of the faraday probe may be 50cm, 75cm, or 100cm from the plasma thruster.
In this embodiment, the step of configuring the plasma thruster to be in the ion current density measurement mode includes removing the shielding shell and the shielding grid, and then adjusting the position of the faraday probe to make the faraday probe be in the first position, so as to avoid the faraday probe from affecting the normal operation of the plasma thruster.
In an embodiment of the present application, the S120 includes:
s121, connecting one end of a high-precision ammeter with a collector;
s122, connecting the Faraday probe with the negative electrode of the power supply;
s123, connecting the other end of the high-precision ammeter with the negative electrode of the power supply, and grounding the positive electrode of the power supply;
s124, obtaining the numerical value of the high-precision ammeter, and calculating the ion current density according to the numerical value of the high-precision ammeter.
In this embodiment, as shown in fig. 11, after the ion current density measurement circuit is connected, the value displayed by the high-precision ammeter is the magnitude of the ion current collected by the collector, and the ion current magnitude is divided by the area of the collector, so as to obtain the ion current density of the plasma thruster.
In an embodiment of the present application, the ion characteristic detection method further includes:
s200, configuring a plasma thruster into an ion energy measuring mode, and adjusting the Faraday probe to be at a second position;
s210, starting a plasma thruster in an ion energy measuring mode to form an ion beam;
s220, connecting an ion energy measuring circuit to measure ion energy.
Specifically, in the ion energy measuring circuit, the shielding shell is in no circuit connection with the shielding grid electrode and is in a suspension state, and only plays a role in shielding so as to prevent the plasma thruster discharge state from being interfered by the ions repelled by the collector.
The circuit connection diagram in the ion energy measurement mode is shown in fig. 12.
In this embodiment, the step of configuring the plasma thruster includes installing a shield enclosure and a shield grid, and then adjusting the second position of the faraday probe to ensure that the faraday probe does not image the normal operation of the plasma thruster.
In an embodiment of the present application, the S220 includes:
s221, connecting one end of the high-precision ammeter with a collector, connecting the other end of the high-precision ammeter with the positive electrode of the scanning voltage source, and grounding the negative electrode of the scanning voltage source.
In an embodiment of the present application, after S221, S220 further includes:
s222, starting a scanning voltage source, and applying continuous voltage to the collector until the voltage reaches a threshold voltage; recording the value of the high-precision ammeter while applying a continuous voltage to the collector;
s223, after the voltage of the collector reaches the threshold voltage, the voltage resolution is improved until the value of the high-precision ammeter approaches 0 and keeps stable, the continuous voltage is stopped being applied to the collector, and the maximum ending voltage at the moment is the maximum energy of the ions;
s224, obtaining a relation between the high-precision ammeter and the scanning voltage;
s225, deriving the acquired relational expression to obtain a relation of voltage and current to voltage first-order differentiation, wherein the scanning voltage corresponding to the maximum value is recorded as ion average energy.
And performing a first derivative on a function which takes the ion current as a dependent variable and the scanning voltage as an independent variable to obtain an ion energy distribution function, wherein the scanning voltage corresponding to the maximum value is ion average energy.
And obtaining the numerical value of the high-precision ammeter, and calculating the maximum and average energy of the ions according to the numerical value of the high-precision ammeter.
In this embodiment, a continuous voltage from 0 is applied to the collector by the scan voltage source, the value of the high-precision current is recorded in real time, when the continuous voltage applied by the scan voltage source reaches the threshold voltage, the value of the high-precision ammeter starts to dip, the voltage resolution applied by the scan voltage source is improved at this time, the scan is stopped until the value of the high-precision ammeter approaches 0 and remains stable, and the measurement is completed, at this time, the maximum end voltage is the maximum energy of the ions. And performing a first derivative on a function which takes the ion current as a dependent variable and the scanning voltage as an independent variable to obtain an ion energy distribution function, wherein the scanning voltage corresponding to the maximum value is ion average energy.
The technical features of the above embodiments may be combined arbitrarily, and the steps of the method are not limited to the execution sequence, so that all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description of the present specification.
The foregoing examples illustrate only a few embodiments of the application and are described in detail herein without thereby limiting the scope of the application. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the application, which are all within the scope of the application. Accordingly, the scope of the application should be assessed as that of the appended claims.
Claims (10)
1. The utility model provides a multi-functional ion characteristic detection probe, multi-functional ion characteristic detection probe includes faraday probe shell, faraday probe shell is hollow cylinder, the one end fixedly connected with first spread groove of faraday probe shell, its characterized in that, multi-functional ion characteristic detection probe still includes:
the shielding assembly comprises a shielding grid and a shielding shell, wherein the shielding grid is fixedly connected to one end of the shielding shell, and the shielding shell is nested outside the Faraday probe shell;
the collecting assembly comprises a collector, a supporting body and an insulator, wherein the collector is fixedly connected to one end of the supporting body, the supporting body is fixedly connected to the inside of the insulator, and the insulator is fixedly connected to the inside of the Faraday probe shell.
2. The multifunctional ion characteristic detection probe according to claim 1, wherein the support body comprises a support table, a mounting groove and tail threads, the mounting groove is fixedly connected to one end of the support table, the other end of the support table is fixedly connected with the tail threads, and the collector is fixedly connected to the mounting groove.
3. The multifunctional ion characteristic detection probe according to claim 2, wherein the insulator comprises a supporting section, a positioning section, a limiting section and a mounting hole, one end of the supporting section is fixedly connected with the positioning section, the limiting section is nested outside the supporting section, the mounting hole is formed in the supporting section, and the lower end of the supporting table is inserted into the mounting hole.
4. The multifunctional ion characteristic detection probe according to claim 3, wherein one end of the shielding shell is fixedly connected with a second connecting groove, the other end of the shielding shell is provided with a grid mounting groove, the shielding grid is fixedly connected with the grid mounting groove, and the shielding grid is provided with a grid hole.
5. The multifunctional ion property detection probe of claim 4, further comprising:
the installation base, first connecting hole and second connecting hole have been seted up on the installation base, the one end fixed connection of supporter is in first connecting hole, the one end fixed connection of faraday probe shell is in the second connecting hole.
6. An ion characteristic detection method, characterized by being applied to the multifunctional ion characteristic detection probe according to any one of claims 1 to 5, comprising:
configuring a plasma thruster into an ion current density measurement mode, and adjusting a Faraday probe to be positioned at a first position;
starting a plasma thruster in an ion current density measurement mode to form ion beam current;
and connecting an ion current density measuring circuit to measure the ion current density.
7. The method of claim 6, wherein the connecting the ion current density measurement circuit to measure the ion current density comprises:
connecting one end of a high-precision ammeter with a collector;
connecting the Faraday probe with the negative electrode of the power supply;
connecting the other end of the high-precision ammeter with the negative electrode of the power supply, and grounding the positive electrode of the power supply;
and obtaining the numerical value of the high-precision ammeter, and calculating the ion current density according to the numerical value of the high-precision ammeter.
8. The ion characteristic detection method according to claim 7, further comprising:
configuring a plasma thruster into an ion energy measuring mode, and adjusting the Faraday probe to be positioned at a second position;
starting a plasma thruster in an ion energy measuring mode to form ion beam current;
ion energy is measured by connecting an ion energy measuring circuit.
9. The ion characteristic detection method according to claim 8, wherein the connecting an ion energy measurement circuit measures ion energy, comprising:
one end of the high-precision ammeter is connected with the collector, the other end of the high-precision ammeter is connected with the positive electrode of the scanning voltage source, and the negative electrode of the scanning voltage source is grounded.
10. The ion characteristic detecting method according to claim 9, wherein after connecting one end of the high-precision ammeter to the collector and the other end of the high-precision ammeter to the positive electrode of the scanning voltage source and grounding the negative electrode of the scanning voltage source, the ion energy measuring circuit is connected to measure ion energy, further comprising:
starting a scanning voltage source, and applying continuous voltage to the collector until the voltage reaches a threshold voltage; recording the value of the high-precision ammeter while applying a continuous voltage to the collector;
after the voltage of the collector reaches the threshold voltage, the voltage resolution is improved until the value of the high-precision ammeter approaches 0 and keeps stable, the continuous voltage is stopped being applied to the collector, and the ending voltage at the moment is the maximum energy of the ions;
acquiring a relation between a high-precision ammeter and a scanning voltage;
and deriving the obtained relational expression to obtain a relation of voltage and current to voltage first-order differentiation, wherein the scanning voltage corresponding to the maximum value is ion average energy.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311433292.3A CN117169606A (en) | 2023-11-01 | 2023-11-01 | Multifunctional ion characteristic detection probe and ion characteristic detection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311433292.3A CN117169606A (en) | 2023-11-01 | 2023-11-01 | Multifunctional ion characteristic detection probe and ion characteristic detection method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN117169606A true CN117169606A (en) | 2023-12-05 |
Family
ID=88932021
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202311433292.3A Pending CN117169606A (en) | 2023-11-01 | 2023-11-01 | Multifunctional ion characteristic detection probe and ion characteristic detection method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN117169606A (en) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103017820A (en) * | 2012-11-25 | 2013-04-03 | 中国航天科技集团公司第五研究院第五一〇研究所 | Test system for distribution characteristics of artificial plasmas |
| CN104422478A (en) * | 2013-08-23 | 2015-03-18 | 中国科学院空间科学与应用研究中心 | Apparatus and method for measuring parameters of transient plasmas in high-speed impact |
| CN105116436A (en) * | 2015-07-13 | 2015-12-02 | 兰州空间技术物理研究所 | Ion thruster beam test system based on Faraday probe array |
| CN108022824A (en) * | 2017-11-21 | 2018-05-11 | 中国科学技术大学 | High-precision ion energy analysis instrument |
| CN108387260A (en) * | 2017-12-20 | 2018-08-10 | 中国空间技术研究院 | A kind of electric propulsion plume testing appraisal procedure |
| CN108696978A (en) * | 2018-07-25 | 2018-10-23 | 北京航空航天大学 | Langmuir probe, Langmuir probe diagnostic system and its diagnostic method |
| CN110244342A (en) * | 2019-07-22 | 2019-09-17 | 中国科学技术大学 | Stable state atomic beam spectral measurement system and method |
| CN112305326A (en) * | 2019-07-31 | 2021-02-02 | 中国科学院国家空间科学中心 | Device for measuring surface potential of moon in place |
-
2023
- 2023-11-01 CN CN202311433292.3A patent/CN117169606A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103017820A (en) * | 2012-11-25 | 2013-04-03 | 中国航天科技集团公司第五研究院第五一〇研究所 | Test system for distribution characteristics of artificial plasmas |
| CN104422478A (en) * | 2013-08-23 | 2015-03-18 | 中国科学院空间科学与应用研究中心 | Apparatus and method for measuring parameters of transient plasmas in high-speed impact |
| CN105116436A (en) * | 2015-07-13 | 2015-12-02 | 兰州空间技术物理研究所 | Ion thruster beam test system based on Faraday probe array |
| CN108022824A (en) * | 2017-11-21 | 2018-05-11 | 中国科学技术大学 | High-precision ion energy analysis instrument |
| CN108387260A (en) * | 2017-12-20 | 2018-08-10 | 中国空间技术研究院 | A kind of electric propulsion plume testing appraisal procedure |
| CN108696978A (en) * | 2018-07-25 | 2018-10-23 | 北京航空航天大学 | Langmuir probe, Langmuir probe diagnostic system and its diagnostic method |
| CN110244342A (en) * | 2019-07-22 | 2019-09-17 | 中国科学技术大学 | Stable state atomic beam spectral measurement system and method |
| CN112305326A (en) * | 2019-07-31 | 2021-02-02 | 中国科学院国家空间科学中心 | Device for measuring surface potential of moon in place |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Stockli | Measuring and analyzing the transverse emittance of charged particle beams | |
| US8175827B2 (en) | RF probe technique for determining plasma potential | |
| CN117169606A (en) | Multifunctional ion characteristic detection probe and ion characteristic detection method | |
| CN117062290A (en) | Probe system for plume plasma potential diagnosis of electric thruster | |
| CN210042342U (en) | Detection device and detection system for plasma parameters | |
| CN116754789A (en) | Multi-mode TOF probe system for measuring pulse plume velocity of electric thruster | |
| US3784909A (en) | Picosecond beam monitor | |
| US20050083065A1 (en) | Plasma potential measuring method and apparatus, and plasma potential measuring probe | |
| Shastry et al. | Langmuir Probe Measurements Within the Discharge Channel of the 20-kW NASA-300M and NASA-300MS Hall Thrusters | |
| Savas et al. | Capacitive probes for rf process plasmas | |
| Wilson et al. | Measurements of time varying plasma potential, temperature, and density in a 13.56 MHz radio‐frequency discharge | |
| Carlson et al. | Studies of the dynamic properties of Langmuir probes I: Measuring methods | |
| CN110677967B (en) | Satellite surface plasma charging current monitoring method based on Faraday cup | |
| CN109752601B (en) | Device for measuring dynamic characteristics of wall surface charges of discharge chamber of ion thruster | |
| Zheng-Hua et al. | Experimental study on the performance of a single-THGEM gas detector | |
| Stoub et al. | A helical-cathode proportional chamber system for a charged-particle spectrometer | |
| Bonvicini et al. | Junction and interdiode capacitance of silicon pixel arrays | |
| Xu et al. | Analysis of plasma characteristics of a high-power radio frequency negative ion source based on Langmuir probe | |
| Sun et al. | L-, S-, and C-Band EMI measurement and characterization of spacecraft ESD events | |
| Sommers et al. | Preliminary characterization of ion energy spectra acquired from high current hollow cathodes | |
| Chuaqui et al. | Simple Faraday cup with subnanosecond response | |
| RU2660465C2 (en) | Ion current density onto the contacting with plasma wall determining method and device for its implementation | |
| CN117590140B (en) | Measurement method suitable for measuring response time of electric thruster and readable storage medium | |
| Sun et al. | The RF bpm pickup electrodes development for the APS-MBA upgrade | |
| Steinacher et al. | A fast beam position monitor based on arrays of secondary emission monitors |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |