CN112098048A - Automatic debugging device and method for electric polarization controller - Google Patents
Automatic debugging device and method for electric polarization controller Download PDFInfo
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- CN112098048A CN112098048A CN201911222955.0A CN201911222955A CN112098048A CN 112098048 A CN112098048 A CN 112098048A CN 201911222955 A CN201911222955 A CN 201911222955A CN 112098048 A CN112098048 A CN 112098048A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
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- G—PHYSICS
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- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/0136—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour for the control of polarisation, e.g. state of polarisation [SOP] control, polarisation scrambling, TE-TM mode conversion or separation
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Abstract
The invention provides an automatic debugging device of an electric polarization controller, which comprises a polarization beam splitter, a power supply, a core board, a semiconductor laser module, a debugged electric polarization controller, a high-voltage delay circuit, a first light intensity measurement module and a second light intensity measurement module, wherein the semiconductor laser module is connected to the debugged electric polarization controller, the debugged electric polarization controller is connected to an EPC to be debugged, the EPC to be debugged is simultaneously connected to the polarization beam splitter, the polarization beam splitter is respectively connected with the first light intensity measurement module and the second light intensity measurement module, the high-voltage delay circuit is connected between the debugged electric polarization controller and the EPC to be debugged, the semiconductor laser module, the high-voltage delay circuit, the first light intensity measurement module and the second light intensity measurement module are connected to. The invention also provides an automatic debugging method of the electric polarization controller. The invention has the following advantages: automatic debugging is realized, and the defects of high requirement on operators, time waste in operation and low efficiency of manual regulation are overcome.
Description
Technical Field
The invention belongs to the technical field of polarization controller debugging, and particularly relates to an automatic debugging device and a debugging method for an electric polarization controller.
Background
Polarization Controller (PC): refers to a device that can convert any input polarization state to any desired output polarization state; the polarization controller is widely applied to coherent optical fiber communication systems and other coherent measurement systems in the field of quantum communication. An Electric Polarization Controller (EPC) is an optical fiber extrusion type polarization controller, is an important one in the polarization controller, mainly extrudes an optical fiber through a thrust force which is deformed after piezoelectric ceramic PZT is electrified, generates a stress birefringence effect to change a polarization state, and has the advantages of simple structure and quick response time.
When the devices of the EPC are assembled, they must be debugged to be ready for use. As shown in fig. 1, the conventional EPC debugging apparatus operates according to the following principle: the method comprises the steps of finding out linear polarized light by adjusting a manual polarization controller, then outputting the linear polarized light to an EPC to be tested, outputting an EPC waveform, and judging the EPC to be qualified when the EPC waveform meets requirements. The connection relationship is as follows: the laser is used as a light source and is sequentially connected with the manual polarization controller, the EPC to be debugged, the polarization beam splitter PBS and the optical power meter to form an optical path, and then the EPC to be debugged is connected with a power supply. The debugging process is as follows: the method comprises the steps that a laser is opened to emit light to a manual polarization controller, then an operator manually adjusts the polarization controller, 3 optical fibers surround a shaft on the manual polarization controller, the three optical fiber shafts are required to be randomly rotated and adjusted until a maximum light intensity value is found and manually recorded, the three optical fiber shafts are randomly rotated and adjusted until a minimum light intensity value is found, a light intensity change value is observed, when the light intensity change value difference is larger than 30dBm, the manual polarization controller is considered to adjust the light emitted by a light source into linearly polarized light, then the waveform of an EPC is manually generated, the waveform of the EPC is manually generated, namely, the power of the EPC to be debugged is manually adjusted, the polarization state of the incident linearly polarized light is modulated through manually adjusting a voltage value loaded on the EPC to be debugged, and accordingly transmitted light power is changed to generate a waveform, namely, the light power. In order to ensure that the EPC can modulate the polarized light to be distributed on the whole bonding ball, the waveform is required to satisfy more than two periods or the half-wave voltage is less than one fourth of the adjustable maximum voltage value in the adjustable voltage range. As an embodiment, when the voltage adjustment range is 0-100V, the corresponding requirement half-wave voltage is less than 25V, and if the fluctuation period of the waveform is greater than 2 (the half-wave voltage is less than 25V), and the contrast is greater than 20dB, it indicates that the EPC is qualified for debugging, that is, the condition can satisfy that the polarized light is distributed over the entire bonding ball, that is, the polarized light can be adjusted to any direction through the EPC. If the light intensity variation value difference is less than 30dBm, the compaction value and the assembly process of EPC piezoelectric ceramics to be debugged need to be checked again, then the maximum light intensity value and the minimum light intensity value of the manual polarization controller are readjusted, if the light intensity variation value difference is more than 30dBm, the manual polarization controller is considered to regulate light emitted by the light source into linearly polarized light, then the waveform of the EPC is generated manually, and if the fluctuation period of the waveform is more than 2 or the half-wave voltage is less than 25V, and the contrast is more than 20dB, the EPC is debugged to be qualified. The light intensity variation value difference is actually a difference value of the light intensities of two orthogonal linearly polarized lights after the background is deducted, and the light intensity variation value difference is not necessarily larger than 30dBm, different threshold values of the light intensity variation value difference can be set for different systems, and the fact that the set light intensity variation value difference is reached indicates that the manual polarization controller adjusts the light emitted by the light source into an ideal linearly polarized light.
The working procedures of the conventional EPC debugging technical scheme are relatively complicated, the debugging process is manual adjustment, and particularly the requirement on operators is high in the process of adjusting the light intensity difference of a manual polarization controller; meanwhile, due to the instability of the optical fiber, the uncertainty of the maximum value and the minimum value of the manual debugging light intensity is large, the operation wastes time, and the efficiency is low; in addition, the manual polarization controller, the light source plate and the optical power meter are independent devices without fixing devices, and each device needs to be supplied with power independently, so that the occupied area is large.
Disclosure of Invention
The invention aims to solve the technical problems that the EPC debugging in the prior art needs manual adjustment, has high requirements on operators and low efficiency, and provides an automatic debugging device capable of automatically adjusting an electric polarization controller and a debugging method thereof.
The invention solves the technical problems through the following technical scheme: an automatic debugging device of an electric polarization controller comprises a polarization beam splitter, a power supply, a light intensity measuring module, a core board, a semiconductor laser module, a debugged electric polarization controller and a high-voltage delay circuit, wherein the light intensity measuring module comprises a first light intensity measuring module and a second light intensity measuring module, the semiconductor laser module is connected to the debugged electric polarization controller, the debugged electric polarization controller is connected to an EPC to be debugged, the EPC to be debugged is simultaneously connected to the polarization beam splitter, the polarization beam splitter is respectively connected with the first light intensity measuring module and the second light intensity measuring module, the high-voltage delay circuit is connected between the debugged electric polarization controller and the EPC to be debugged, the semiconductor laser module, the high-voltage delay circuit, the first light intensity measuring module and the second light intensity measuring module are connected to the core board, and the power supply, the core board, the semiconductor laser module, the tested electric polarization controller, the first light intensity measuring module, the second light intensity measuring module, the high-voltage delay circuit, the polarization beam splitter and the power supply are integrated on one control board.
As an optimized technical scheme, the control board is externally provided with 4 interfaces, an optical output port of the debugged electric polarization controller serves as a 1 st interface, an output port of the high-voltage delay circuit serves as a 2 nd interface, an input port of the polarization beam splitter serves as a 3 rd interface, one input/output interface of the core board serves as a 4 th interface, the 1 st, 2 nd and 3 rd interfaces are connected to an EPC to be debugged, and the 4 th interface is connected to a computer.
As an optimized technical scheme, the semiconductor laser module adopts a 1550 waveband semiconductor laser module.
As an optimized technical scheme, the core board is an ARM core board or a CPU or an FPGA or a DSP.
As an optimized technical scheme, the high-voltage delay circuit respectively provides 3 paths of stepping voltages with the voltage regulation range of 0-100V for the tested electric polarization controller and the stepping motor of the EPC to be debugged.
The invention also provides a method for debugging by adopting the automatic debugging device of the electric polarization controller, which comprises the following steps:
step 1: connecting the EPC to be debugged with the debugged electric polarization controller, the high-voltage delay circuit and the polarization beam splitter respectively;
step 2: the method comprises the steps that a switch of a power supply is turned on, a high-voltage delay circuit inputs step voltage to a step motor of a debugged electric polarization controller, meanwhile, a semiconductor laser module emits light to enter the debugged electric polarization controller, linear polarized light output by the debugged electric polarization controller is transmitted to a first light intensity measuring module and a second light intensity measuring module through an EPC to be debugged and a polarization beam splitter, and the two light intensity measuring modules respectively record and upload light intensity values to a core board;
and step 3: the core board judges that when the variation difference of the light intensity values reaches a set threshold value, the default output of the tested electric polarization controller is linear polarized light, the high-voltage delay circuit outputs constant voltage to the tested electric polarization controller, and meanwhile, the high-voltage delay circuit starts to input stepping voltage to the EPC stepping motor to be debugged;
and 4, step 4: the core board uploads the light intensity values of the first light intensity measuring module and the second light intensity measuring module and the voltage value of the high-voltage delay circuit to the computer, the computer starts to output EPC waveforms to be debugged, and if the waveforms meet set values, the debugging is qualified.
As an optimized technical scheme, in the step 2, the high-voltage delay circuit inputs 3 paths of stepping voltages with an adjustable voltage range of 0-100V to the tested stepping motor of the electric polarization controller, and in the step 3, the high-voltage delay circuit starts to input 3 paths of stepping voltages with an adjustable voltage range of 0-100V to the EPC stepping motor to be debugged.
As an optimized technical solution, in step 3, when the difference of the light intensity value changes is greater than 30dBm, the default output of the electric polarization controller that has been debugged is linear polarized light.
As an optimized technical scheme, in the step 4, if the fluctuation cycle of the waveform is greater than 2 or the half-wave voltage is less than 1/4, and the contrast is greater than 20dB, the debugging is qualified.
Compared with the prior art, the invention has the following advantages:
(1) the debugging method has the advantages that the debugged electric polarization controller is used for replacing the traditional manual polarization controller, the convenience and the accuracy of the debugging process are improved, the rapid output of linear polarized light is realized, the two light intensity measurement modules are used for replacing a single light power meter, the waveform obtained by the two light intensity measurement modules is reverse, the maximum light intensity difference value at a certain time point can be accurately obtained, the polarization voltage value is rapidly obtained and the stepping power supply is started to the EPC to be debugged, the whole debugging process is controlled by an ARM core board main control algorithm, the automatic debugging is realized, and the defects that the requirement of manual regulation on operators is high, the operation time is wasted, and the efficiency is low are overcome;
(2) the manual polarization controller has the advantages that the size is large, the semiconductor laser module and the light intensity measuring module which are small in size are used for replacing a traditional laser and an optical power meter, the size is reduced, the semiconductor laser module, the ARM core board, the high-voltage delay circuit and the two light intensity measuring modules can be integrated on one control board, the whole size is reduced to 1/10 of the original device, the device is convenient to carry, and the size is small.
Drawings
FIG. 1 is a schematic diagram of a debugging apparatus in the prior art;
FIG. 2 is a schematic structural diagram of an automatic debugging apparatus according to an embodiment of the present invention;
fig. 3 is a schematic diagram of two light intensity measurement modules instead of a single optical power meter according to an embodiment of the present invention.
Detailed Description
The following examples are given for the detailed implementation and specific operation of the present invention, but the scope of the present invention is not limited to the following examples.
Referring to fig. 2, the automatic debugging device of the electric polarization controller of the invention comprises an ARM core board, a semiconductor laser module, a tested electric polarization controller, a first light intensity measuring module, a second light intensity measuring module, a high-voltage delay circuit, a polarization beam splitter and a power supply.
The semiconductor laser module is connected to the debugged electric polarization controller and provides a light source for the debugged electric polarization controller.
The debugged electric polarization controller is connected to the EPC to be debugged, and emits linear polarized light to the EPC to be debugged after the semiconductor laser module provides a light source. The debugged electric polarization controller used for the first time can be debugged in the existing debugging mode, and the debugged electric polarization controller used later can be debugged by the automatic debugging method.
The EPC to be debugged is connected to the polarization beam splitter at the same time, and the linear polarization light enters the polarization beam splitter for beam splitting after passing through the EPC to be debugged.
The polarization beam splitter is respectively connected with the first light intensity measuring module and the second light intensity measuring module, and the linearly polarized light split by the polarization beam splitter respectively enters the first light intensity measuring module and the second light intensity measuring module.
And a high-voltage delay circuit is connected between the tested electric polarization controller and the EPC to be debugged. The high-voltage delay circuit provides 3 paths of 0-100V stepping voltages for the tested electric polarization controller and the stepping motor of the EPC to be debugged respectively, and can also provide voltages in other voltage ranges according to system requirements.
The first light intensity measuring module and the second light intensity measuring module measure the entering linear polarized light, and upload light intensity values to the ARM core board after respectively recording measured data.
The semiconductor laser module, the high-voltage delay circuit, the first light intensity measuring module and the second light intensity measuring module are connected to the ARM core board. The ARM core board is connected to a computer, uploads data to the computer and receives instructions of the computer. The ARM core board is used for recording and feeding back light intensity values of the first light intensity measuring module and the second light intensity measuring module and voltage values of the high-voltage delay circuit to a computer, the high-voltage delay circuit is controlled according to light intensity difference values, when the difference values are smaller than 30dBm, the high-voltage delay circuit is controlled to input stepping voltage for the tested electric polarization controller, when the difference values are larger than 30dBm, the high-voltage delay circuit is controlled to input stepping voltage for a stepping motor of an EPC to be tested, and constant voltage is input for the tested electric polarization controller. Of course, the difference threshold is not necessarily set to 30dBm, and different threshold values of the light intensity variation difference may be set for different systems.
The power supply is connected to the ARM core board, the semiconductor laser module, the tested electric polarization controller, the first light intensity measuring module, the second light intensity measuring module, the high-voltage delay circuit and the polarization beam splitter, and supplies power to the devices.
As an optimized technical scheme, the ARM core board, the semiconductor laser module, the debugged electric polarization controller, the first light intensity measuring module, the second light intensity measuring module, the high-voltage delay circuit, the polarization beam splitter, and the power supply are integrated on one control board, and there are a plurality of interfaces for connecting with the EPC to be debugged and the computer, in this embodiment, the control board has 4 interfaces externally, which are: the optical output port of the debugged electric polarization controller is used as a 1 st interface, the output port of the high-voltage delay circuit is used as a 2 nd interface, the input port of the polarization beam splitter is used as a 3 rd interface, one input/output interface of the ARM core board is used as a 4 th interface, the 1 st, the 2 nd and the 3 rd interfaces are all connected to an EPC to be debugged, and the 4 th interface is connected to a computer.
Preferably, the semiconductor laser module adopts a 1550 waveband semiconductor laser module.
Of course, those skilled in the art can easily understand that the ARM core board may also be replaced with a processing chip such as a CPU, an FPGA, a DSP, or the like.
As shown in fig. 3, in the present application, two light intensity measurement modules are used to replace a single optical power meter, when a single power meter is used for measurement in the prior art, that is, only one path (for example, the H path) of the polarization beam splitter is used for power measurement, a PC needs to be continuously adjusted to achieve the maximum power measurement value and mark the power measurement value, and then the measured power is adjusted to be the minimum power, so as to ensure that the subsequent EPC is debugged when the difference value reaches a preset value, and meanwhile, in the actual experiment process, the voltage value corresponding to the optimal polarization state is not an ideal point, but is suitable in a certain small range, thereby increasing the complexity and uncertainty of the judgment; if two paths (H path and V path) of the polarization beam splitter are measured by two paths of measuring modules simultaneously, the polarization beam splitter splits two orthogonal polarizations, when the light intensity of a transmission path is maximum, the light intensity of a corresponding reflection path is minimum, whether a power difference value meets a preset value can be visually obtained through single debugging, and simultaneously, the two paths of measuring results are reversed, so that the optimal voltage starting point can be determined quickly and accurately by combining with each other.
As shown in fig. 3, after passing through a Polarization Beam Splitter (PBS), light debugged by the EPC to be debugged is split into two orthogonal beams perpendicular to each other, where H light and V light are used as representatives, and on the premise of ensuring that no additional jitter error is introduced, if only one light intensity measurement module (optical power meter) is used, the EPC to be debugged needs to be continuously adjusted to find the maximum value of the light intensity of the H or V path, and a mark is made, then the EPC to be debugged is adjusted to obtain the minimum value of the light intensity of the path, and a record is made, so that subsequent debugging is performed when the difference value reaches a preset value. This is not conducive to automated debugging and to accurate and intuitive contrast acquisition. In this embodiment, adopt two way measuring module simultaneous measurement PBS's two ways light intensity of emergent light, because PBS splits two kinds of orthogonal polarization, it is minimum to correspond V way light intensity when H way light intensity is the biggest promptly, can directly perceivedly obtain whether the power difference satisfies the default through the single debugging, simultaneously because two way measuring result are reverse, can combine each other and confirm the most ideal voltage initial point more fast more accurately, compare the mode of original single way, both can satisfy the demand of automatic test, can accurately obtain the measuring result again.
The automatic debugging device of the electric polarization controller of the embodiment replaces the traditional manual polarization controller with the debugged electric polarization controller, improves the convenience and the accuracy of the debugging process, realizes the quick output of linear polarized light, adopts two light intensity measuring modules to replace a single light power meter, can accurately obtain the maximum light intensity difference value at a certain time point because the waveforms obtained by the two light intensity measuring modules are reverse, thereby quickly obtaining the polarization voltage value and starting to supply power to the EPC to be debugged in a stepping manner, controls the whole debugging process by an ARM core board main control algorithm, realizes the automatic debugging, and solves the defects of high requirement of manual regulation on operators, time waste of operation and low efficiency; in addition, the semiconductor laser module and the light intensity measurement module with small volume replace the traditional laser and the optical power meter, the debugged EPC is used for replacing a manual polarization controller with larger volume, the volume is reduced, an ARM core board, the semiconductor laser module, the debugged electric polarization controller, the first light intensity measurement module, the second light intensity measurement module, the high-voltage delay circuit, the polarization beam splitter and a power supply can be integrated on one control board, the whole volume can be reduced to 1/10 of the original device, and the device is convenient to carry and small in volume.
The specific measurement steps of the automatic debugging device of the electric polarization controller comprise:
step 1: connecting EPCs to be debugged with the 1 st, 2 nd and 3 rd interfaces of the control panel respectively, and connecting the 4 th interface with a computer;
step 2: the method comprises the steps that a switch of a power supply is turned on, 3 paths of stepping voltage with the voltage regulation range of 0-100V are input into a stepping motor of a debugged electric polarization controller by a high-voltage delay circuit, light is emitted by a semiconductor laser module and enters the debugged electric polarization controller, the debugged electric polarization controller outputs linearly polarized light rapidly, the linearly polarized light is transmitted to a first light intensity measuring module and a second light intensity measuring module through an EPC to be debugged and a polarization beam splitter, and the two light intensity measuring modules respectively record and upload light intensity values to an ARM core board;
and step 3: the ARM core board judges that when the variation difference of the light intensity values is larger than 30dBm, the default output of the debugged electric polarization controller is linear polarized light, the high-voltage delay circuit outputs constant voltage to the debugged electric polarization controller, and meanwhile, the high-voltage delay circuit starts to input 3 paths of stepping voltage with the voltage regulation range of 0-100V to the stepping motor to be debugged;
and 4, step 4: the ARM core board uploads the light intensity values of the first light intensity measuring module and the second light intensity measuring module and the voltage value of the high-voltage delay circuit to a computer, the computer starts to output an EPC waveform to be debugged, and if the fluctuation cycle of the waveform is larger than 2 or the half-wave voltage is smaller than 25V, and the contrast is larger than 20dB, the debugging is qualified.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (10)
1. The utility model provides an automatic debugging device of electronic polarization controller, includes polarization beam splitter, power, light intensity measurement module, its characterized in that: still include nuclear core plate, semiconductor laser module, the electronic polarization controller of having debugged, high pressure time delay circuit, the light intensity measurement module includes first light intensity measurement module and second light intensity measurement module, semiconductor laser module be connected to the electronic polarization controller of having debugged, the electronic polarization controller of having debugged is connected to waiting to debug the EPC, wait to debug the EPC and be connected to the polarization beam splitter simultaneously, first light intensity measurement module and second light intensity measurement module are connected respectively to the polarization beam splitter, be connected with high pressure time delay circuit between the electronic polarization controller of having debugged and waiting to debug the EPC, semiconductor laser module, high pressure time delay circuit, first light intensity measurement module and second light intensity measurement module are connected to nuclear core plate, the power is used for supplying power, and nuclear core plate is connected to the computer, uploads the computer with data to the instruction of receiving the computer, nuclear core plate, The semiconductor laser module, the tested electric polarization controller, the first light intensity measuring module, the second light intensity measuring module, the high-voltage delay circuit, the polarization beam splitter and the power supply are integrated on one control board.
2. The motorized polarization controller auto-commissioning apparatus of claim 1, wherein: the control panel has 4 interfaces outward, and the light output port of the electric polarization controller that has debugged is as interface 1, and the delivery outlet of high-pressure delay circuit is as interface 2, and the input port of polarization beam splitter is as interface 3, and an input/output interface of nuclear core plate is as interface 4, and interface 1, 2, 3 all are connected to waiting to debug the EPC, and interface 4 is connected to the computer.
3. The motorized polarization controller auto-commissioning apparatus of claim 1, wherein: the semiconductor laser module adopts a 1550 waveband semiconductor laser module.
4. The motorized polarization controller auto-commissioning apparatus of claim 1, wherein: the core board is an ARM core board or a CPU or an FPGA or a DSP.
5. The motorized polarization controller auto-commissioning apparatus of claim 1, wherein: the high-voltage delay circuit provides 3 paths of stepping voltages with the voltage regulation range of 0-100V for the tested electric polarization controller and the stepping motor of the EPC to be debugged respectively.
6. A method for debugging by using the automatic debugging device of the electric polarization controller of any one of claims 1 to 5, characterized in that: the method comprises the following steps:
step 1: connecting the EPC to be debugged with the debugged electric polarization controller, the high-voltage delay circuit and the polarization beam splitter respectively;
step 2: the method comprises the steps that a switch of a power supply is turned on, a high-voltage delay circuit inputs step voltage to a step motor of a debugged electric polarization controller, meanwhile, a semiconductor laser module emits light to enter the debugged electric polarization controller, linear polarized light output by the debugged electric polarization controller is transmitted to a first light intensity measuring module and a second light intensity measuring module through an EPC to be debugged and a polarization beam splitter, and the two light intensity measuring modules respectively record and upload light intensity values to a core board;
and step 3: the core board judges that when the variation difference of the light intensity values reaches a set threshold value, the default output of the tested electric polarization controller is linear polarized light, the high-voltage delay circuit outputs constant voltage to the tested electric polarization controller, and meanwhile, the high-voltage delay circuit starts to input stepping voltage to the EPC stepping motor to be debugged;
and 4, step 4: the core board uploads the light intensity values of the first light intensity measuring module and the second light intensity measuring module and the voltage value of the high-voltage delay circuit to the computer, the computer starts to output EPC waveforms to be debugged, and if the waveforms meet set values, the debugging is qualified.
7. The method of debugging of claim 6, wherein: in the step 2, the high-voltage delay circuit inputs 3 paths of stepping voltages with the adjustable voltage range of 0-100V to the stepping motor of the tested electric polarization controller.
8. The method of debugging of claim 6, wherein: in the step 3, the high-voltage delay circuit starts to input 3 paths of stepping voltages with the adjustable voltage range of 0-100V to the EPC stepping motor to be debugged.
9. The method of debugging of claim 6, wherein: in the step 3, when the variation difference of the light intensity values is greater than 30dBm, the default output of the electric polarization controller which is debugged at the moment is linear polarization light.
10. The method of debugging of claim 6, wherein: in the step 4, if the fluctuation cycle of the waveform is greater than 2 or the half-wave voltage is less than 1/4 and the contrast is greater than 20dB, the debugging is qualified.
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