CN112082946A - Automatic detection system and method thereof - Google Patents
Automatic detection system and method thereof Download PDFInfo
- Publication number
- CN112082946A CN112082946A CN201910509406.5A CN201910509406A CN112082946A CN 112082946 A CN112082946 A CN 112082946A CN 201910509406 A CN201910509406 A CN 201910509406A CN 112082946 A CN112082946 A CN 112082946A
- Authority
- CN
- China
- Prior art keywords
- distance
- production line
- tested
- status screen
- photographing device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 71
- 238000000034 method Methods 0.000 title description 6
- 238000004519 manufacturing process Methods 0.000 claims abstract description 55
- 238000009434 installation Methods 0.000 claims description 25
- 238000007689 inspection Methods 0.000 claims description 13
- 238000000611 regression analysis Methods 0.000 claims description 5
- 230000006698 induction Effects 0.000 claims 1
- 239000013589 supplement Substances 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 13
- 230000002950 deficient Effects 0.000 description 6
- 230000017525 heat dissipation Effects 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 238000013135 deep learning Methods 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0181—Memory or computer-assisted visual determination
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
技术领域technical field
本发明是一种自动化检测系统及检测方法,具体而言,是一种藉由影像辨识来检测各种电子产品的元件的安装状态的自动化检测系统及方法。The present invention is an automatic detection system and a detection method, in particular, an automatic detection system and method for detecting the installation state of components of various electronic products through image recognition.
背景技术Background technique
显示卡,是个人电脑装置最基本组成部分之一,用途是将电脑系统所需要的显示资讯进行转换驱动显示器,并向显示器提供逐行或隔行扫描讯号,控制显示器的正确显示,是连接显示器和个人电脑主机板的重要元件,且是“人机对话”的重要装置之一。再者,现场可程式化逻辑闸阵列(Field Programmable Gate Array,FPGA),它是在PAL、GAL、CPLD等可程式逻辑装置的基础上进一步发展的产物。它是作为特殊应用积体电路领域中的一种半客制化电路而出现的,既解决了全客制化电路的不足,又克服了原有可程式化逻辑装置闸电路数有限的缺点。Display card is one of the most basic components of personal computer devices. Its purpose is to convert the display information required by the computer system to drive the display, and to provide progressive or interlaced scanning signals to the display to control the correct display of the display. It is the connection between the display and the display. It is an important component of the motherboard of the personal computer, and one of the important devices for "man-machine dialogue". Furthermore, Field Programmable Gate Array (FPGA) is a product further developed on the basis of PAL, GAL, CPLD and other programmable logic devices. It appears as a semi-customized circuit in the field of special application integrated circuits, which not only solves the shortcomings of full-customized circuits, but also overcomes the shortcomings of the limited number of gate circuits of the original programmable logic device.
显示卡及FPGA在运作时皆会产生高温,导致内部元件,尤其是运算晶片的温度升高,若显示卡及FPGA的散热部件未安装好,将导致显示卡及FPGA因高温而热当机。因此,在目前显示卡及FPGA的制程中,通常是利用人工检测方式来确认每张显示卡及FPGA的散热部件是否安装正确。然而,在上述的人工检测方式中,往往会发生漏看的情况,导致有不良品却未检出的情形发生。此外,人工检测方式会导致检测时间拉长,进而导致产能下降。Both the graphics card and the FPGA will generate high temperature during operation, which will cause the temperature of the internal components, especially the computing chip, to rise. Therefore, in the current manufacturing process of display cards and FPGAs, manual inspection is usually used to confirm whether the heat dissipation components of each display card and FPGA are installed correctly. However, in the above-mentioned manual detection method, there is often a situation of omission, resulting in a situation where defective products are not detected. In addition, the manual inspection method will lead to longer inspection time, which will lead to a decrease in production capacity.
基于上述原因,如何发明一种自动化检测系统及检测方法,能够快速且有效的对显示卡及FPGA自动进行检测,乃是待解决的问题。Based on the above reasons, it is a problem to be solved how to invent an automatic detection system and a detection method, which can quickly and effectively automatically detect the display card and the FPGA.
发明内容SUMMARY OF THE INVENTION
为达成前述目的,本发明提供一种自动化检测系统,包括:一产线,包括一感应区以及一检测区;至少一感应器,在感应区处设置于邻近该产线的位置,该至少一感应器感应藉由该产线输送的至少一待测物品;至少一补光元件,在该检测区中设置于该产线的上方及/或侧边;一第一摄影装置,在该检测区中以一第一距离设置于该产线的上方,该第一摄影装置获取该至少一待测物品的上方状态画面;一第二摄影装置,在该检测区中以一第二距离设置于该产线的侧边,该第二摄影装置获取该至少一待测物品的侧边状态画面;以及一计算机装置,电性连接至该至少一感应器、该至少一补光元件、该第一摄影装置及该第二摄影装置,该计算机装置接收该上方状态画面及该侧边状态画面,并对该上方状态画面及该侧边状态画面进行影像辨识。In order to achieve the aforementioned object, the present invention provides an automatic detection system, comprising: a production line, including a sensing area and a detection area; at least one sensor, which is arranged at a position adjacent to the production line in the sensing area, the at least one sensor A sensor senses at least one object to be tested conveyed by the production line; at least one supplementary light element is arranged above and/or on the side of the production line in the detection area; a first photographing device is located in the detection area The first camera is arranged above the production line at a first distance, and the first photographing device captures the upper state picture of the at least one item to be tested; and a second photography device is arranged at a second distance in the detection area. On the side of the production line, the second camera device captures the side status picture of the at least one item to be tested; and a computer device is electrically connected to the at least one sensor, the at least one supplementary light element, and the first camera In the device and the second photographing device, the computer device receives the upper state image and the side state image, and performs image recognition on the upper state image and the side state image.
再者,本发明的自动化检测系统进一步包括一机械手臂,该机械手臂电性连接置该计算机装置,且该机械手臂在该检测区中设置于该产线的侧边,该第二摄影装置设置于该机械手臂上,该第二摄影装置藉由该机械手臂的移动而与该至少一待测物品保持该第二距离。Furthermore, the automated inspection system of the present invention further includes a robotic arm, the robotic arm is electrically connected to the computer device, and the robotic arm is disposed on the side of the production line in the inspection area, and the second photographing device is disposed On the robotic arm, the second photographing device maintains the second distance from the at least one object to be tested by the movement of the robotic arm.
较佳地,该待测物品为显示卡或现场可程式化逻辑闸阵列,该上方状态画面为该显示卡或该现场可程式化逻辑闸阵列的风扇状态画面,该侧边状态画面为该显示卡或该现场可程式化逻辑闸阵列的晶片与汇散热排之间的安装状态画面。Preferably, the object to be tested is a display card or a field programmable logic gate array, the upper status screen is a fan status screen of the display card or the field programmable logic gate array, and the side status screen is the display Installation status screen between the card or the chip of the field programmable logic gate array and the bus heatsink.
较佳地,该第一距离及该第二距离为10-22.99公分中的任一数值。Preferably, the first distance and the second distance are any value between 10-22.99 cm.
较佳地,该第一距离及该第二距离为15公分。Preferably, the first distance and the second distance are 15 cm.
另一方面,本发明亦提供一种自动化检测方法,包括以下步骤:藉由一产线输送至少一待测物品,该产线包括一感应区及一检测区;藉由设置于该感应区的至少一感应器感应该至少一待测物品,且当该至少一感应器感应到该至少一待测物品时会开启至少一补光元件,其中,该至少一补光元件设置于该检测区的上方及/或侧边;在该检测区中藉由设置于该产线上方一第一距离处的一第一摄影装置撷取该至少一待测物品的上方状态画面;在该检测区中藉由设置于该产线侧边一第二距离处的一第二摄影装置撷取该至少一待测物品的侧边状态画面;以及藉由一计算机装置接收该上方状态画面及该侧边状态画面,并对该上方状态画面及该侧边状态画面进行影像辨识,其中,该计算机装置电性连接至该至少一感应器、该至少一补光元件、该第一摄影装置及该第二摄影装置。On the other hand, the present invention also provides an automatic detection method, comprising the following steps: conveying at least one object to be tested through a production line, the production line including a sensing area and a detection area; At least one sensor senses the at least one object to be tested, and when the at least one sensor senses the at least one object to be tested, it will turn on at least one supplementary light element, wherein the at least one supplementary light element is disposed in the detection area. upper and/or side; in the detection area, a first camera device disposed at a first distance above the production line captures the upper state picture of the at least one object to be tested; in the detection area Capture the side status picture of the at least one object to be tested by a second camera disposed at a second distance on the side of the production line; and receive the upper status picture and the side status picture by a computer device , and perform image recognition on the upper status screen and the side status screen, wherein the computer device is electrically connected to the at least one sensor, the at least one supplementary light element, the first camera device and the second camera device .
较佳地,该待测物品为显示卡或现场可程式化逻辑闸阵列,该上方状态画面为该显示卡或该现场可程式化逻辑闸阵列的风扇状态画面,该侧边状态画面为该显示卡或该现场可程式化逻辑闸阵列的晶片与汇散热排之间的安装状态画面。Preferably, the object to be tested is a display card or a field programmable logic gate array, the upper status screen is a fan status screen of the display card or the field programmable logic gate array, and the side status screen is the display Installation status screen between the card or the chip of the field programmable logic gate array and the bus heatsink.
较佳地,该计算机装置接收到该安装状态画面后,该计算机装置在该安装状态画面中设置一边界框,并藉由该边界框中的间隙量与该边界框的长宽比例进行回归分析,以判定该晶片与该汇散热排之间的安装是否正确及该晶片与该汇散热排之间的散热膏是否涂装完整。Preferably, after the computer device receives the installation state picture, the computer device sets a bounding box in the installation state picture, and performs regression analysis based on the amount of the gap in the bounding box and the ratio of the length and width of the bounding box. , so as to determine whether the installation between the chip and the heat sink is correct and whether the heat dissipation paste between the chip and the heat sink is completely coated.
较佳地,该第一距离及该第二距离为10-22.99公分中的任一数值。Preferably, the first distance and the second distance are any value between 10-22.99 cm.
较佳地,该第一距离及该第二距离为15公分。Preferably, the first distance and the second distance are 15 cm.
附图说明Description of drawings
本领域中具有通常知识者在参照附图阅读下方的详细说明后,可以对本发明的各种态样以及其具体的特征与优点有更良好的了解,其中,该些附图包括:Those skilled in the art may have a better understanding of various aspects of the present invention and its specific features and advantages after reading the following detailed description with reference to the accompanying drawings, wherein the drawings include:
图1为说明本发明一实施例的自动化检测系统的结构的俯视示意图;1 is a schematic top view illustrating the structure of an automated detection system according to an embodiment of the present invention;
图2为说明本发明一实施例的检测区的结构示意图;2 is a schematic structural diagram illustrating a detection area according to an embodiment of the present invention;
图3A为说明本发明一实施例的第一摄影装置所获取的画面的示意图;3A is a schematic diagram illustrating a picture captured by a first photographing device according to an embodiment of the present invention;
图3B为说明本发明一实施例的第二摄影装置所获取的画面的示意图;3B is a schematic diagram illustrating a picture captured by a second photographing device according to an embodiment of the present invention;
图4A为说明本发明另一实施例的第一摄影装置所获取的画面的示意图;4A is a schematic diagram illustrating a picture captured by a first photographing device according to another embodiment of the present invention;
图4B为说明本发明另一实施例的第二摄影装置所获取的画面的示意图;4B is a schematic diagram illustrating a picture captured by a second photographing device according to another embodiment of the present invention;
图5为说明本发明又一实施例的检测区的结构示意图;以及FIG. 5 is a schematic structural diagram illustrating a detection area according to another embodiment of the present invention; and
图6为说明本发明一实施的自动化检测方法的流程图。FIG. 6 is a flow chart illustrating an automated detection method according to an embodiment of the present invention.
其中,附图标记说明如下:Among them, the reference numerals are described as follows:
2 自动化检测系统2 Automatic detection system
10 产线10 production lines
20 感应器20 Sensors
30 补光元件30 fill light element
40 第一摄影装置40 The first photographic installation
50 第二摄影装置50 Second photographic installation
60 待测物品、显示卡60 Items to be tested, display cards
70 边界框70 Bounding Box
101 感应区101 Sensing area
103 检测区103 Detection area
501 机械手臂501 Robotic Arm
601 风扇601 Fan
603 晶片603 chip
605 汇散热排605 sink heat sink
607 空隙607 void
D1 第一距离D1 first distance
D2 第二距离D2 second distance
S10-S50 步骤S10-S50 steps
具体实施方式Detailed ways
以下配合图式及附图标记对本发明的实施方式做更详细的说明,使本领域技术人员在研读本说明书后能据以实施。The embodiments of the present invention will be described in more detail below with reference to the drawings and reference numerals, so that those skilled in the art can implement the present invention accordingly.
图1为一俯视示意图,用以说明本发明一实施例的自动化检测系统的结构。请参照图1,在本发明一实施例中,自动化检测系统1包括一产线10、至少一感应器20、至少一补光元件30、一第一摄影装置40、一第二摄影装置50以及一计算机装置(未于图中示出)。FIG. 1 is a schematic top view for illustrating the structure of an automated detection system according to an embodiment of the present invention. Referring to FIG. 1 , in an embodiment of the present invention, an
产线10包括一感应区101以及一检测区103。至少一感应器20在感应区101处设置邻近于产线10的位置,例如产线10的上方、侧边等,在图1中是示出设置于产线10的上方。至少一感应器20可感应藉由产线10所输送的至少一待测物品60,其中,在产线10的感应区101中,至少一感应器20可藉由至少一支架或滑轨(未示于图中)装置而设置于产线10的上方或侧边,且感应器20的数量可为一个以上。举例而言,感应器20可为一红外线感应器,当至少一待测物品60经过感应器20时,感应器20可感应到至少一待测物品60。The
至少一补光元件30设置于检测区103的上方及/或侧边,第一摄影装置40在检测区103中以一第一距离设置于产线10的上方,第二摄影装置50在检测区103中以一第二距离设置于产线10的侧边。换言之,第一摄影机40及第二摄影机50可选择性地搭配一补光元件30而设置于产线10的上方及侧边,以进一步获取进入检测区103的至少一待测物品60的状态画面。At least one
计算机装置是电性连接至感应器20、至少一补光元件30、第一摄影装置40及第二摄影装置50,当感应器20感应到待测物品60后,会传讯息以通知该计算机装置,进而藉由该计算机装置开启至少一补光元件30、第一摄影装置40及第二摄影装置50,以藉由第一摄影装置40及第二摄影装置50获取进入检测区103的待测物品60的状态画面。再者,该计算机装置可接收第一摄影装置40及第二摄影装置50所获取到的状态画面,并对该状态画面进行影像辨识,以判断待测物品60的元件安装是否正确。The computer device is electrically connected to the
图2为一示意图,用以说明本发明一实施例的检测区的结构。请参照图1及图2,第一摄影装置40在检测区103中是以一第一距离D1设置于产线10的上方,第二摄影装置50在检测区103中则是以一第二距离D2设置于产线10的侧边。当待测物品60经过感应器20并进入检测区103后,设置于产线10上方的第一摄影装置40可藉由补光元件30的补光并获取待测物品60的上方状态画面,设置于产线10侧边的第二摄影装置50可藉由补光元件30的补光并获取待测物品60的侧边状态画面。FIG. 2 is a schematic diagram for explaining the structure of the detection area according to an embodiment of the present invention. Referring to FIGS. 1 and 2 , the first photographing
值得一提的是,第一距离D1及第二距离D2对本发明而言非常重要,若第一距离D1及第二距离D2的数值设置错误,将导致第一摄影装置40及第二摄影装置50获取到的画面不清楚,进而无法让计算机装置进行影像辨识。因此,在本发明一实施例中,是将第一距离D1及第二距离D2分别设置为10-22.99公分中的任一数值,在本发明较佳的实施例中,是将第一距离D1及第二距离D2皆设置为15公分,如此的距离能使第一摄影装置40及第二摄影装置50获取到最佳的状态画面。It is worth mentioning that the first distance D1 and the second distance D2 are very important to the present invention. If the values of the first distance D1 and the second distance D2 are set incorrectly, the first photographing
另一方面,本发明可藉由第一摄影装置40及第二摄影装置50之坐标整合来达成两台摄影机显示追踪资讯之整合,以进行待测物品60的位置判别。On the other hand, the present invention can achieve the integration of the tracking information displayed by the two cameras by integrating the coordinates of the
图3A为一示意图,用以说明本发明一实施例的第一摄影装置所撷取的画面。请参照图3A,在本发明一实施例中,待测物品60可为显示卡或现场可程式化逻辑闸阵列,在图3A中是以显示卡为例,且图3A示出的即是第一摄影装置40所获取待测物品60的上方状态画面,该上方状态画面为显示卡60的风扇601状态画面,该计算机装置接收到风扇601状态画面后可对风扇601状态画面进行影像辨识,以判断风扇601的状态是否良好,例如是否有出现破损等缺陷。FIG. 3A is a schematic diagram for illustrating a frame captured by the first photographing device according to an embodiment of the present invention. Referring to FIG. 3A, in an embodiment of the present invention, the object to be tested 60 may be a display card or a field programmable logic gate array. In FIG. 3A, a display card is used as an example, and FIG. 3A shows the first An upper status picture of the
再者,图3B为一示意图,用以说明本发明一实施例的第二摄影装置所获取的画面。请参照图3B,图3B示出的即是第二摄影装置50所获取的待测物品60的侧边状态画面,该侧边状态画面为显示卡60的晶片603及汇散热排605之间的安装状态画面,该计算机装置接收到晶片603及汇散热排605之间的安装状态画面后可对晶片603及汇散热排605之间的安装状态画面进行影像辨识,以判断晶片603及汇散热排605之间的安装状态是否良好,例如散热膏是否未涂好或晶片603及汇散热排605之间是否有出现空隙。Furthermore, FIG. 3B is a schematic diagram for illustrating a picture acquired by the second photographing device according to an embodiment of the present invention. Please refer to FIG. 3B . FIG. 3B shows the side status picture of the
进一步地说明,该计算机装置在对晶片603及汇散热排605之间的安装状态画面进行影像辨识时,该计算机装置会藉由在该安装状态画面中设置一边界框70,并藉由边界框70中的间隙量与边界框70的长宽比例进行回归分析,以判定晶片603与汇散热排605之间的安装是否正确及晶片603与汇散热排605之间的散热膏是否涂装完整。其中,边界框70的长宽比例是预先设定于该计算机装置中,边界框70中的间隙量意指的是晶片603与汇散热排605之间的空隙大小,若晶片603与汇散热排605之间有空隙,光线即可穿过该空隙,进而使得空隙的影像被捕捉到,该计算机装置即可藉由边界框70的长宽比例来判断空隙的大小,若空隙大小超过一预设值即判定为不良品。由此可知,图3B示出即为晶片603与汇散热排605判定为良品的画面,因晶片603与汇散热排605之间并未辨识到空隙。To further illustrate, when the computer device performs image recognition on the installation status screen between the
此外,该计算机装置可藉由第一摄影装置40及第二摄影装置50来计算产线10上待测物品60之平面位置和坐标,以在第二摄影装置50所获取到的画面中设置边界框70。In addition, the computer device can calculate the plane position and coordinates of the object to be tested 60 on the
图4A为一示意图,用以说明本发明另一实施例的第一摄影装置所撷取的画面。请参照图4A,在本发明另一实施例中,待测物品60可为显示卡或现场可程式化逻辑闸阵列,在图4A中是以显示卡为例,且图4A示出的即是第一摄影装置40所获取待测物品60的上方状态画面,该上方状态画面为显示卡60的风扇601状态画面,该计算机装置接收到风扇601状态画面后可对风扇601状态画面进行影像辨识,以判断风扇601的状态是否良好,例如是否有出现破损等缺陷。FIG. 4A is a schematic diagram illustrating a frame captured by a first photographing device according to another embodiment of the present invention. Referring to FIG. 4A , in another embodiment of the present invention, the object to be tested 60 may be a display card or a field programmable logic gate array. In FIG. 4A , a display card is used as an example, and FIG. 4A shows The first photographing
再者,图4B为一示意图,用以说明本发明另一实施例的第二摄影装置所获取的画面。请参照图4B,图4B示出的即是第二摄影装置50所获取待测物品60的侧边状态画面,该侧边状态画面为显示卡60的晶片603及汇散热排605之间的安装状态画面,且在该安装状态画面中,晶片603与汇散热排605之间具有空隙607。在此实施例中,光线会穿过空隙607,进而使得空隙607的影像被捕捉到,该计算机装置即可藉由边界框70的长宽比例来判断空隙607的大小,若空隙607大小超过一预设值即判定为不良品,在本发明一实施例中,空隙大小的预设值为2mm,若空隙607的大小超过2mm,表示晶片603与汇散热排605之间未正确安装或散热膏的厚度不足,因此经该计算机装置的影像辨识后会判定为不良品。Furthermore, FIG. 4B is a schematic diagram for illustrating a picture acquired by a second photographing device according to another embodiment of the present invention. Please refer to FIG. 4B . FIG. 4B shows the side status screen of the object to be tested 60 obtained by the
应了解的是,为了更清楚说明本发明的影像辨识,图3A-图4B仅示出边界框70及边界框70中所撷取到的画面。It should be understood that, in order to illustrate the image recognition of the present invention more clearly, FIGS. 3A-4B only show the
图5为一示意图,用以说明本发明又一实施例的检测区的结构。请参照图1及图5,在本发明又一实施例中,本发明的自动化检测系统1进一步包括一机械手臂501,机械手臂501电性连接至该计算机装置,且机械手臂501在检测区103中是设置于产线10的侧边,同时,第二摄影装置50是设置于机械手臂501上。如此一来,第二摄影装置50可藉由机械手臂501的移动而与待测物品60保持第二距离D2。举例而言,产线10上的待测物品60经第一摄影装置40及第二摄影装置50之坐标整合并完成定位后,可将位置资讯传送至该计算机装置,并藉由该计算机装置来控制机械手臂501,以将第二摄影装置50与待测物品60的距离保持在第二距离D2。应了解的是,在本发明其他实施例中,可藉由一线性滑轨(未于图中示出)来取代机械手臂501,并将第二摄影装置50设置于该线性滑轨上。FIG. 5 is a schematic diagram for explaining the structure of the detection area according to another embodiment of the present invention. Referring to FIGS. 1 and 5 , in another embodiment of the present invention, the
另一方面,本发明其他实施例中,该计算机装置可进一步与一资料库(未于图中示出)连接,当该计算机装置接收到第一摄影装置40及第二摄影装置50所获取的画面后,可将判定为不良品的画面存入该资料库中,并藉由多种的不良品画面进行影像深度学习,影像深度学习部分可透过基于深度学习的物件侦测(YOLOv3)进行显示卡影像样本之训练学习,并进行侦测应用。On the other hand, in other embodiments of the present invention, the computer device may be further connected with a database (not shown in the figure), when the computer device receives the data obtained by the
图6为一流程图,用以说明本发明一实施例的自动化检测方法。请参照图6,本发明的自动化检测方法包括步骤S10-S50,步骤S10为:藉由一产线输送至少一待测物品,该产线包括一感应区及一检测区;步骤S20为:藉由设置于该感应区的至少一感应器感应该至少一待测物品,且当该至少一感应器感应到该至少一待测物品时会开启至少一补光元件,其中,该至少一补光元件设置于该检测区的上方及/或侧边;步骤S30为:在该检测区中藉由设置于该产线上方一第一距离处的一第一摄影装置撷取该至少一待测物品的上方状态画面;步骤S40为:在该检测区中藉由设置于该产线侧边一第二距离处的一第二摄影装置撷取该至少一待测物品的侧边状态画面;以及步骤S50为:藉由一计算机装置接收该上方状态画面及该侧边状态画面,并对该上方状态画面及该侧边状态画面进行影像辨识,其中,该计算机装置电性连接至该至少一感应器、该至少一补光元件、该第一摄影装置及该第二摄影装置。FIG. 6 is a flow chart for explaining an automatic detection method according to an embodiment of the present invention. 6, the automatic detection method of the present invention includes steps S10-S50, step S10 is: conveying at least one item to be tested by a production line, the production line includes a sensing area and a detection area; Step S20 is: borrowing At least one object to be tested is sensed by at least one sensor disposed in the sensing area, and when the at least one sensor senses the at least one object to be tested, at least one fill light element is turned on, wherein the at least one fill light The components are arranged above and/or on the side of the inspection area; step S30 is: capturing the at least one item to be inspected in the inspection area by a first camera device disposed at a first distance above the production line Step S40 is: capturing the side status picture of the at least one item to be tested by a second camera disposed at a second distance on the side of the production line in the detection area; and the step S50 is: receiving the upper status screen and the side status screen by a computer device, and performing image recognition on the upper status screen and the side status screen, wherein the computer device is electrically connected to the at least one sensor , the at least one supplementary light element, the first photographing device and the second photographing device.
另一方面,在本发明的自动化检测方法中,该待测物品可为显示卡或现场可程式化逻辑闸阵列,该上方状态画面为该显示卡或该现场可程式化逻辑闸阵列的风扇状态画面,该侧边状态画面为该显示卡或该现场可程式化逻辑闸阵列的晶片与汇散热排之间的安装状态画面。On the other hand, in the automatic detection method of the present invention, the object to be tested can be a display card or a field programmable logic gate array, and the upper status screen is the fan status of the display card or the field programmable logic gate array a screen, the side status screen is an installation status screen between the chip of the display card or the field programmable logic gate array and the bus heatsink.
再者,搭配图4B的示意图,该计算机装置接收到该安装状态画面后,该计算机装置会在该安装状态画面中设置一边界框70,并藉由边界框70中空隙607的间隙量与边界框70的长宽比例进行回归分析,以判定晶片603与汇散热排605之间的安装是否正确及晶片603与汇散热排605之间的散热膏是否涂装完整。Furthermore, with reference to the schematic diagram of FIG. 4B , after the computer device receives the installation status screen, the computer device sets a
值得一提的是,再请参照图2,第一距离D1及第二距离D2对本发明而言非常重要,若第一距离D1及第二距离D2的数值设置错误,将导致第一摄影装置40及第二摄影装置50获取到的画面不清楚,进而无法让计算机装置进行影像辨识。因此,在本发明的自动化检测方法中,是将第一距离D1及第二距离D2分别设置为10-22.99公分中的任一数值,在本发明较佳的实施例中,是将第一距离D1及第二距离D2皆设置为15公分,如此的距离能使第一摄影装置40及第二摄影装置50获取到最佳的状态画面。It is worth mentioning that, referring to FIG. 2 again, the first distance D1 and the second distance D2 are very important to the present invention. If the values of the first distance D1 and the second distance D2 are set incorrectly, the first photographing
此外,在本发明的自动化检测方法中,可在该计算机装置中显示一整合画面,以显示生产线上之显示卡定位判别和检测结果,并发送讯号给予检测通过亮绿灯,检测不过亮红灯,并将所有影像截取画面及检测资料及检测结果,存于主控与该计算机装置连接的一资料库中。In addition, in the automatic detection method of the present invention, an integrated screen can be displayed in the computer device to display the positioning determination and detection results of the display card on the production line, and a signal is sent to give a green light for the detection pass, and a red light for the detection failure. All images are captured, and the detection data and detection results are stored in a database connected between the main control and the computer device.
综上所述,本发明成功地提供了一种自动化检测系统及其方法。本发明的自动化检测系统及其方法具有以下技术特征及优点:1.于产线中架设两台摄影装置,并藉由两台摄影装置的坐标整合计算出待测物品的位置,以达成两台摄影装置显示追踪资讯的整合。2.藉由在获取到的影像中设置一边界框,并藉由边界框中之间隙量与长宽比例回归分析进行分析,以判别显示卡的晶片与散热排之间的安装是否正确及散热膏是否涂装。To sum up, the present invention successfully provides an automatic detection system and method thereof. The automatic detection system and method of the present invention have the following technical features and advantages: 1. Two cameras are set up in the production line, and the coordinates of the two cameras are integrated to calculate the position of the object to be tested, so as to achieve two cameras The camera device shows the integration of the tracking information. 2. By setting a bounding box in the acquired image, and analyzing the gap between the bounding box and the aspect ratio regression analysis, to determine whether the installation between the chip of the graphics card and the heat sink is correct and the heat dissipation Whether the paste is applied.
以上所述仅为用以解释本发明的较佳实施例,并非企图据以对本发明做任何形式上的限制,因此,凡有在相同的发明精神下所作有关本发明的任何修饰或变更,皆仍应包括在本发明意图保护的范畴。The above descriptions are only used to explain the preferred embodiments of the present invention, and are not intended to limit the present invention in any form. It should still be included in the scope of the intended protection of the present invention.
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910509406.5A CN112082946A (en) | 2019-06-13 | 2019-06-13 | Automatic detection system and method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910509406.5A CN112082946A (en) | 2019-06-13 | 2019-06-13 | Automatic detection system and method thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
CN112082946A true CN112082946A (en) | 2020-12-15 |
Family
ID=73733463
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201910509406.5A Pending CN112082946A (en) | 2019-06-13 | 2019-06-13 | Automatic detection system and method thereof |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN112082946A (en) |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN202290600U (en) * | 2011-10-21 | 2012-07-04 | 中国科学院广州电子技术研究所 | Cross-flow fan impeller defect detection system |
CN105277120A (en) * | 2014-06-25 | 2016-01-27 | 财团法人工业技术研究院 | Object measuring system and method |
CN205620358U (en) * | 2016-03-22 | 2016-10-05 | 华南理工大学 | CPU radiator detecting system based on sensor fusion |
CN106290394A (en) * | 2016-09-30 | 2017-01-04 | 华南理工大学 | A kind of cpu heat aluminium extruded forming defect detecting system and detection method |
CN108593653A (en) * | 2017-12-31 | 2018-09-28 | 芜湖哈特机器人产业技术研究院有限公司 | A kind of screw classification of view-based access control model and damage detection device and method |
CN109142387A (en) * | 2018-07-31 | 2019-01-04 | 格力电器(武汉)有限公司 | Device for detecting cleanliness of surface heat dissipation paste of radiator of air conditioner external unit |
TWI647444B (en) * | 2017-05-12 | 2019-01-11 | 廣盈自動化工程股份有限公司 | Battery yield automatic detecting device and method thereof |
CN109358067A (en) * | 2018-11-30 | 2019-02-19 | 桂林电子科技大学 | Computer vision-based motor ring varistor defect detection system and method |
CN109752635A (en) * | 2017-11-02 | 2019-05-14 | 精工爱普生株式会社 | Electronic component conveying device and electronic component testing device |
-
2019
- 2019-06-13 CN CN201910509406.5A patent/CN112082946A/en active Pending
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN202290600U (en) * | 2011-10-21 | 2012-07-04 | 中国科学院广州电子技术研究所 | Cross-flow fan impeller defect detection system |
CN105277120A (en) * | 2014-06-25 | 2016-01-27 | 财团法人工业技术研究院 | Object measuring system and method |
CN205620358U (en) * | 2016-03-22 | 2016-10-05 | 华南理工大学 | CPU radiator detecting system based on sensor fusion |
CN106290394A (en) * | 2016-09-30 | 2017-01-04 | 华南理工大学 | A kind of cpu heat aluminium extruded forming defect detecting system and detection method |
TWI647444B (en) * | 2017-05-12 | 2019-01-11 | 廣盈自動化工程股份有限公司 | Battery yield automatic detecting device and method thereof |
CN109752635A (en) * | 2017-11-02 | 2019-05-14 | 精工爱普生株式会社 | Electronic component conveying device and electronic component testing device |
CN108593653A (en) * | 2017-12-31 | 2018-09-28 | 芜湖哈特机器人产业技术研究院有限公司 | A kind of screw classification of view-based access control model and damage detection device and method |
CN109142387A (en) * | 2018-07-31 | 2019-01-04 | 格力电器(武汉)有限公司 | Device for detecting cleanliness of surface heat dissipation paste of radiator of air conditioner external unit |
CN109358067A (en) * | 2018-11-30 | 2019-02-19 | 桂林电子科技大学 | Computer vision-based motor ring varistor defect detection system and method |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR101590831B1 (en) | Method of inspecting foreign substance on a board | |
TWI761880B (en) | Apparatus, method, computer readable medium and computer program product for inspecting substrate defect | |
CN105588841A (en) | Stitch inclination defect detection device based on machine vision | |
KR100997415B1 (en) | Recording medium on which image binarization method, image processing apparatus and computer program are recorded | |
CN103389309A (en) | Method and apparatus for inspecting via hole | |
US20220207686A1 (en) | System and method for inspecting an object for defects | |
KR20070101669A (en) | Vision Inspection System and Inspection Method of Mounting Plate Assembly | |
JP4454428B2 (en) | Component edge detection method, component edge detection program, and inspection apparatus | |
US20140078290A1 (en) | Dynamic imaging system | |
TWI724432B (en) | Automatic detection system and method | |
CN112082946A (en) | Automatic detection system and method thereof | |
JP3049488B2 (en) | Pattern inspection method and pattern inspection device | |
CN116804637A (en) | Inspection system, teacher data generation device, teacher data generation method, and storage medium | |
TW202314592A (en) | Defect inspection system and defect inspection method | |
JP5758474B2 (en) | Sitting posture determination device for semiconductor package test | |
KR101126759B1 (en) | Method of teaching for electronic parts information in chip mounter | |
JPH10141925A (en) | Appearance inspection device | |
TW202100990A (en) | Appearance inspection management system, device, method and program including a photographing component, an inspection component, a defect candidate extraction component, a display component and a visual inspection auxiliary part | |
JP2015075412A (en) | Appearance inspection system | |
TWM585899U (en) | System for inspecting defects of semiconductor device | |
JPH10141930A (en) | Method and device for inspecting pattern | |
JP5249855B2 (en) | Electronic component terminal position detection method and electronic component terminal position detection system | |
KR102129970B1 (en) | Method And Apparatus for Matching inspection Data Electronic Component | |
TW202401373A (en) | Abnormal inspection apparatus and abnormal inspection method | |
TW202144765A (en) | Image recording device and inspect method thereof |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination |