CN111948205A - Sample placing block, sample placing device and sample detection method thereof - Google Patents
Sample placing block, sample placing device and sample detection method thereof Download PDFInfo
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- CN111948205A CN111948205A CN201910411846.7A CN201910411846A CN111948205A CN 111948205 A CN111948205 A CN 111948205A CN 201910411846 A CN201910411846 A CN 201910411846A CN 111948205 A CN111948205 A CN 111948205A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/24—Base structure
- G02B21/241—Devices for focusing
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/34—Microscope slides, e.g. mounting specimens on microscope slides
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Abstract
The invention provides a sample placing block, a sample placing device and a sample detection method thereof, wherein the sample placing block is provided with a top part and a bottom part which are oppositely arranged; a plurality of contact points are formed at the bottom of the sample placing block, the contact points are positioned on the same plane, and the plane where the contact points are positioned is a placing plane; a plurality of focusing points are formed at the top of the sample placing block, the plurality of focusing points are positioned on the same plane, the plane where the plurality of focusing points are positioned is a focusing plane, and the placing plane is parallel to the focusing plane; the sample placement block also has a sample placement region for placing a sample, the sample placement region being recessed inwardly from a top of the sample placement block. According to the sample placing block, the sample placing device and the sample detection method thereof, the special sample placing device is manufactured, the sample to be detected is placed on the special device, the observation surface of the sample is ensured to be consistent with the calibration time through positioning, the detection result accuracy and repeatability are good, and different people can obtain relatively consistent results.
Description
Technical Field
The invention relates to a sample placing block.
The invention also relates to a sample placement device comprising the sample placement block.
The invention also relates to a method for detecting a sample by using the sample placing device.
Background
The body microscope is widely applied to the industrial fields of macroscopic surface observation, failure analysis, fracture analysis and the like of materials. The general magnification of the body type microscope is 1-60 times, the working distance is long, and the focal depth is large. The magnification change of the stereomicroscope is obtained by changing the distance between the intermediate lens groups, and generally has the function of continuously changing the magnification. The microscope is also a manual focusing technique, for example, when the size of a defect existing in a sample or the length and width of a surface feature is to be observed and measured, the sample is placed at an observation position, reflected light is turned on, the sample is observed at the lowest multiple, and the best imaging surface is found by adjusting the lifting. Because the body type microscope has a large focal depth, it is often difficult to judge whether the picture is clear in the upper and lower nearby areas of the optimal imaging surface, and particularly when the imaging contrast of the sample surface is not obvious, the optimal imaging surface is difficult to obtain by naked eyes. The results obtained also vary significantly from person to person. To obtain a better measurement result, it will take more operation time.
Disclosure of Invention
The invention aims to provide a sample placing block, a sample placing device and a sample detection method thereof, which aim to solve the problems of difficult manual focusing and long operation time of a body type microscope.
In order to solve the above problems, the present invention provides the following technical solutions:
the invention provides a sample placing block, which is provided with a top part and a bottom part which are oppositely arranged; a plurality of contact points are formed at the bottom of the sample placing block, the contact points are positioned on the same plane, and the plane where the contact points are positioned is a placing plane; a plurality of focusing points are formed at the top of the sample placing block, the plurality of focusing points are positioned on the same plane, the plane where the plurality of focusing points are positioned is a focusing plane, and the placing plane is parallel to the focusing plane; the sample placement block also has a sample placement region for placing a sample, the sample placement region being recessed inwardly from a top of the sample placement block.
In this technical scheme, place the piece through using this sample, the sample is placed to cooperation sample fixed block, makes different samples through pressing the back, and the observation face of sample keeps unanimous with the focal plane all the time, and microscopical focus need not be adjusted according to the sample of difference, only needs to set up according to predetermined focus, has improved detection efficiency.
Preferably, the sample placing block further has a caliper placing region for placing a calibration ruler, and a calibration surface of the calibration ruler placed in the caliper placing region coincides with the focal plane.
In this technical scheme, the slide caliper rule of piece is placed to the sample and the region is placed and is used for placing the scale, can be used to the demarcation of microscopical predetermined focal position, adjusts microscopical focus, makes the definition of scale on microscopical display screen best, makes the mark on microscopical focusing guide rail, and this mark is predetermined focal position promptly.
The present invention provides a sample placement device comprising:
the sample placing block is provided with a top part and a bottom part which are oppositely arranged; a plurality of contact points are formed at the bottom of the sample placing block, the contact points are positioned on the same plane, and the plane where the contact points are positioned is a placing plane; a plurality of focusing points are formed at the top of the sample placing block, the plurality of focusing points are positioned on the same plane, the plane where the plurality of focusing points are positioned is a focusing plane, and the placing plane is parallel to the focusing plane; the sample placement block further having a sample placement region recessed inwardly from a top of the sample placement block;
a sample fixing block fixed in the sample placement area, the sample fixing block being made of a plastic material, the sample fixing block being used for placing the sample; before the sample fixing block is not deformed, the highest point of the sample is higher than the focusing plane.
In this technical scheme, place the sample through using this sample placer, make different samples through pressing the back, the observation face of sample keeps unanimous with the focus plane all the time, and microscopical focus need not be adjusted according to the sample of difference, only needs to set up according to predetermined focus, has improved detection efficiency.
Preferably, the sample placement device further comprises a calibration ruler, the calibration ruler having a calibration face; the sample placing block is further provided with a caliper placing area, the calibration ruler is placed in the caliper placing area, and a calibration surface of the calibration ruler coincides with the focusing plane.
In the technical scheme, the calibration ruler can be used for calibrating the preset focal position of the microscope, the focal length of the microscope is adjusted, the definition of the calibration ruler on the display screen of the microscope is optimal, and a mark is made on a focusing guide rail of the microscope, wherein the mark is the preset focal position.
Preferably, the calibration surface of the calibration ruler is printed with scales.
In this technical scheme, the calibration scale can be used for measuring the size of sample, and the scale on the calibration scale is as the reference of the size of sample, the measurement of the size of supplementary sample.
Preferably, the caliper placing area is two grooves formed in the top, the two grooves are respectively located on two sides of the sample placing area, and two ends of the calibration ruler are respectively located in the two grooves.
In this technical scheme, place regional position setting through above-mentioned slide caliper rule, make the calibration scale can span on the sample places the region, make and keep shorter distance between calibration scale and the sample to the definition difference is less under the condition of same focus for the calibration face of making calibration scale and the observation face of sample, the calibration of the focus position of being convenient for predetermineeing, and the measurement of the size of the back sample of shooing.
Preferably, the plastic material used for the sample fixing block is plasticine.
In the technical scheme, the sample fixing block is made of plasticine, the plasticine serving as a plastic material can deform under stress and keep the deformed shape when not stressed, and the plasticine is an excellent material for manufacturing the sample fixing block.
The invention also provides a sample detection method, which uses the sample placing device and comprises the following steps:
1) placing a sample fixing block in a sample placing area of the sample placing block, and then placing a sample on the sample fixing block, wherein an observation surface of the sample is positioned at the uppermost part and is higher than the focusing plane;
2) pressing the observation surface of the sample to enable the sample fixing block to generate plastic deformation until the observation surface of the sample is coincided with the focusing plane;
3) placing a sample placing block carrying a sample and a sample fixing block on a placing platform of a microscope, wherein the placing plane is superposed with the placing platform;
4) and adjusting the preset focal length position of the microscope, and detecting the observation surface of the sample.
In the technical scheme, by the detection method, the observation surface of the sample is consistent with the focusing plane, the microscope is always kept at the preset focal position, the sample can be rapidly detected, the accuracy and the repeatability of the detection result are good, and different people can obtain more consistent results.
Preferably, step 2) comprises the steps of:
21) moving a sample placing block carrying a sample and a sample fixing block to a flattening machine to enable the sample to be located below a flattening surface of the flattening machine, wherein the flattening surface is parallel to the focusing plane;
22) the flattening surface of the flattening machine moves downwards, and the observation surface of the sample is pressed to enable the sample fixing block to generate plastic deformation until the flattening surface is contacted with the plurality of focusing points of the sample placing block;
23) the flattening surface of the flattening machine upwards breaks away from the sample and the sample placing block, and the observation surface of the sample coincides with the focusing plane.
In the technical scheme, the observation surface of the sample can be rapidly adjusted to be in a state of being overlapped with the focusing plane by using the flattening machine, so that the detection of the observation surface of the subsequent sample is facilitated.
Preferably, the method for determining the preset focal length position of the microscope in the step 4) comprises the following steps:
a) placing the sample placing block on a placing platform of the microscope, wherein a placing plane of the sample placing block is coincided with the placing platform, and a focusing plane of the sample placing block faces to a lens of the microscope;
b) placing a calibration ruler on the sample placing block, and enabling a calibration surface of the calibration ruler printed with scales to coincide with a focusing plane of the sample placing block;
c) adjusting the focal length of the microscope to ensure that the definition of the scale of the calibration scale on the display screen of the microscope is optimal;
d) and marking the focusing guide rail of the microscope, wherein the mark is a preset focal length position.
In the present solution, the focal length of the microscope with respect to the focal plane is determined by the above steps. In the subsequent sample detection process, the sample can be directly detected only by adjusting the lens of the microscope to the position of the mark, and the focusing work of the microscope is not needed.
Preferably, the detecting the observation surface of the sample in the step 4) includes:
the samples were photographed and the dimensions of the samples were measured using measurement software.
In the technical scheme, the size of the sample can be calculated in a mode of carrying out data analysis on a picture after the sample is photographed.
Preferably, the detecting the observation surface of the sample in the step 4) includes:
placing a calibration ruler on the sample placing block, and enabling a calibration surface of the calibration ruler printed with scales to coincide with a focusing plane of the sample placing block;
and photographing the sample and the calibration scale, and measuring the size of the sample by using the measurement software and the scale of the calibration scale.
In the technical scheme, the calibration scale and the sample are photographed together, and the magnification of the sample can be determined through the scale of the calibration scale, so that more accurate measurement data can be obtained.
On the basis of the common knowledge in the field, the above preferred conditions can be combined randomly to obtain the preferred embodiments of the invention.
The positive progress effects of the invention are as follows:
according to the sample placing block, the sample placing device and the sample detection method thereof, the special sample placing device is manufactured, the sample to be detected is placed on the special device, the observation surface of the sample is ensured to be consistent with the calibration time through positioning, the detection result accuracy and repeatability are good, and different people can obtain relatively consistent results.
Drawings
FIG. 1a is a schematic view of the structure of the sample placement block of the present invention.
FIG. 1b is a cross-sectional view taken along line A-A of the sample placement block shown in FIG. 1 a.
FIG. 1c is a top view of the sample placement block shown in FIG. 1 a.
Fig. 2 is a schematic structural view of a sample placing block and a sample fixing block of the sample placing device of the present invention.
FIG. 3 is a schematic diagram of a calibration scale of the sample placement device of the present invention.
FIG. 4 is a schematic view of a microscope used in the sample detection method of the present invention.
FIG. 5 is a schematic view of a leveler used in the sample testing method of the present invention.
Description of the reference numerals
A sample placement device 100; a sample placement block 1, a top 11, a bottom 12, a placement plane 13, a focal plane 14, a sample placement area 15, a caliper placement area 16, a groove 161; a sample fixing block 2; a calibration ruler 3 and a calibration surface 31;
a microscope 200, a placing platform 201, a lens 202, a focusing guide rail 203 and a mark 204;
a flattening machine 300, a flattening surface 301 and a placing table 302.
Detailed Description
The present invention is further described in the following description with reference to specific embodiments and the accompanying drawings, wherein the details are set forth in order to provide a thorough understanding of the present invention, but it is apparent that the present invention can be embodied in many other forms different from those described herein, and it will be readily appreciated by those skilled in the art that the present invention can be implemented in many different forms without departing from the spirit and scope of the invention.
As shown in fig. 1a to 1c, the sample placement block 1 of the present invention is provided with a top portion 11 and a bottom portion 12 which are oppositely disposed; the bottom 12 of the sample placing block 1 forms a plurality of contact points, the contact points are positioned on the same plane, and the plane where the contact points are positioned is a placing plane 13; the top 11 of the sample placing block 1 forms a plurality of focusing points, the plurality of focusing points are positioned on the same plane, the plane where the plurality of focusing points are positioned is a focusing plane 14, and the placing plane 13 is parallel to the focusing plane 14; the sample placement block 1 also has a sample placement region 15, the sample placement region 15 being recessed inwardly from the top 11 of the sample placement block 1. The sample placement block 1 also has a caliper placement area 16 for placing the calibration scale 3, and a calibration face 31 of the calibration scale 3 placed in the caliper placement area 16 coincides with the focal plane 14.
The sample placement block 1 cooperates with the sample fixation block 2 to form a sample placement device 100, as shown in fig. 2. The sample placement device 100 can make the observation plane of the sample placed in the sample placement area 15 coincide with the focal plane 14, thereby ensuring the stability of the observation plane of the sample. Specifically, the sample fixing block 2 is fixed in the sample placement area 15, the sample fixing block 2 is made of a plastic material, and the sample fixing block 2 is used for placing a sample; the highest point of the sample is above the focal plane 14 before the sample holder block 2 is undeformed.
The sample fixing block 2 can be made of plasticine or other plastic deformation materials. The sample is placed on the sample fixing block 2, and after the sample is stressed, the sample fixing block 2 is subjected to plastic deformation. When the stress of the sample disappears, the sample fixing block 2 still keeps the deformed shape, so that the position of the sample is kept unchanged. The sample is adjusted and held in the correct position by the sample fixing block 2.
When the position of the sample is adjusted, the observation surface of the sample is pressed to plastically deform the sample fixing block 2 until the observation surface of the sample coincides with the focal plane 14. By using the sample placement device 100 to place a sample, the observation surface of the sample is always in agreement with the focal plane 14 after different samples are pressed. And then the sample placing device 100 carrying the sample is placed under the microscope 200, the focal length of the microscope 200 does not need to be adjusted according to different samples, and only needs to be set according to the preset focal length, so that the detection efficiency is improved.
As shown in fig. 1a to 3, the sample placement device 100 further comprises a calibration ruler 3, the calibration ruler 3 having a calibration face 31; the sample placement block 1 also has a caliper placement area 16, the calibration scale 3 is placed in the caliper placement area 16, and the calibration face 31 of the calibration scale 3 coincides with the focal plane 14.
The calibration ruler 3 may be used for calibrating a preset focal position of the microscope 200. Specifically, the scale 3 is placed on the sample placement block 1 such that the scale surface 31 of the scale 3 coincides with the focal plane 14. Adjusting the focal length of the microscope 200 to optimize the definition of the calibration scale 3 on the display screen of the microscope 200, and making a mark 204 on the focusing guide rail 203 of the microscope 200, wherein the mark 204 is a preset focal length position.
The calibration face 31 of the calibration scale 3 is printed with scales and can be used for measuring the size of a sample. Specifically, the scale 3 is photographed together with the sample at the same time of photographing the sample, and the scale on the scale 3 is used as a reference for the size of the sample to assist the measurement of the size of the sample.
As shown in fig. 1a and fig. 2, the caliper receiving area 16 is two grooves 161 disposed on the top 11, the two grooves 161 are respectively located at two sides of the sample receiving area 15, and two ends of the calibration ruler 3 are respectively located in the two grooves 161. Through the position setting that above-mentioned slide caliper rule placed region 16, make calibration scale 3 can span on sample placement region 15, make and keep shorter distance between calibration scale 3 and the sample to the definition difference is less under the condition of same focus for the calibration face 31 of making calibration scale 3 and the observation face of sample, the calibration of the focus position of being convenient for predetermineeing, and the measurement of the size of the back sample of shooing.
Using the sample placement device 100 and the microscope 200 described above, the examination of the sample can be performed. As shown in fig. 4, the microscope 200 has a placing stage 201 for placing the sample placing device 100, and a lens 202 of the microscope 200 is positioned above the placing stage 201. The focal length of the microscope 200 can be adjusted by adjusting the lens 202 of the microscope 200 along the focusing guide 203. When the sample placement device 100 is placed on the placement platform 201, the contact points of the bottom 12 of the sample placement block 1 contact the placement platform 201, such that the placement plane 13 coincides with the placement platform 201, and the focal plane 14 of the sample placement block 1 faces the lens 202.
The sample testing method using the above sample placement device 100 and microscope 200 includes the steps of:
1) placing the sample fixing block 2 in a sample placing area 15 of the sample placing block 1, and then placing the sample on the sample fixing block 2, wherein the observation surface of the sample is positioned at the top and is higher than the focusing plane 14;
2) pressing the observation surface of the sample to enable the sample fixing block 2 to generate plastic deformation until the observation surface of the sample coincides with the focusing plane 14;
3) placing the sample placing block 1 carrying the sample and the sample fixing block 2 on a placing platform 201 of the microscope 200, wherein the placing plane 13 is overlapped with the placing platform 201;
4) the microscope 200 is adjusted to a preset focal position to detect the observation surface of the sample.
By the detection method, the observation surface of the sample is consistent with the focusing plane, the microscope 200 is always kept at the preset focal length position, the sample can be rapidly detected, the accuracy and the repeatability of the detection result are good, and different people can obtain more consistent results.
In step 2) of the sample testing method, pressing the observation surface of the sample can be performed by using the leveling machine 300. As shown in fig. 5, the flattening machine 300 has a flattening surface 301 and a placing table 302, and the flattening surface 301 and the placing table 302 are parallel to each other. When the sample placement device 100 is placed on the placement stage 302, the contact points of the bottom 12 of the sample placement block 1 are brought into contact with the placement stage 302 so that the placement plane 13 coincides with the placement stage 302, and the focal plane 14 of the sample placement block 1 faces the pressing plane 301. The pressing plane 301 of the flatting machine 300 can move downward to press the observation surface of the sample.
Specifically, the step 2) includes the steps of:
21) moving the sample placing block 1 carrying the sample and the sample fixing block 2 to the flatting machine 300, so that the sample is positioned below a flattening surface 301 of the flatting machine 300, and the flattening surface 301 is parallel to the focusing plane 14;
22) the flattening surface 301 of the flattening machine 300 moves downwards to press the observation surface of the sample, so that the sample fixing block 2 is subjected to plastic deformation until the flattening surface 301 is contacted with a plurality of focusing points of the sample placing block 1;
23) the flattening surface 301 of the flattening machine 300 is separated upward from the sample and the sample placement block 1, and the observation surface of the sample coincides with the focal plane 14.
By using the flatting machine 300, the observation plane of the sample can be rapidly adjusted to be coincident with the focusing plane 14, which facilitates the subsequent detection of the observation plane of the sample.
The method for determining the preset focal length position of the microscope 200 in the step 4) of the sample detection method comprises the following steps:
a) placing the sample placing block 1 on a placing platform 201 of a microscope 200, wherein a placing plane 13 of the sample placing block 1 is superposed with the placing platform 201, and a focusing plane 14 of the sample placing block 1 faces a lens 202 of the microscope 200;
b) placing the calibration ruler 3 on the sample placing block 1, and enabling the calibration surface 31 printed with scales of the calibration ruler 3 to coincide with the focusing plane 14 of the sample placing block 1;
c) adjusting the focal length of the microscope 200 to optimize the definition of the scale of the calibration scale 3 on the display screen of the microscope 200;
d) a mark 204 is made on the focusing guide rail 203 of the microscope 200, and the mark 204 is a preset focal length position.
Through the above steps, the focal length of the microscope 200 with respect to the focal plane 14 is determined. In the subsequent sample detection process, the sample can be directly detected only by adjusting the lens 202 of the microscope 200 to the position of the mark 204, and the focusing work of the microscope 200 is not required.
In step 4), the observation surface of the sample is detected, and the observation surface may be observed for the tissue, or the size of the observation surface may be measured. The microscope 200 is connected to a display screen of an electronic device, and the electronic device can reflect an image presented by the lens 202 of the microscope 200 on the display screen, or can photograph and analyze the image.
After the sample is photographed, the size of the sample can be measured using the measurement software. In order to better determine the magnification of the microscope 200, the calibration scale 3 may be placed on the sample placement block 1 such that the calibration surface 31 of the calibration scale 3 on which the scale is printed coincides with the focal plane 14 of the sample placement block 1; and then the sample and the calibration scale 3 are photographed, and the size of the sample is measured by using the measurement software and the scale of the calibration scale 3. By scaling the scale of the scale 3, the magnification of the sample can be determined, thereby obtaining more accurate measurement data.
Through the sample placing block, the sample placing device and the sample detection method thereof, the special sample placing device is manufactured, the sample to be detected is placed on the special device, the observation surface of the sample is ensured to be consistent with the calibration time through positioning, the accuracy and the repeatability of the detection result are good, and different people can obtain relatively consistent results.
Although the present invention has been disclosed in terms of the preferred embodiment, it is not intended to limit the invention, and variations and modifications may be made by one skilled in the art without departing from the spirit and scope of the invention. Any modification, equivalent change and modification of the above embodiments according to the technical essence of the present invention are within the scope of protection defined by the claims of the present invention, unless departing from the content of the technical solution of the present invention.
Claims (12)
1. A sample placement block, comprising: the sample placing block is provided with a top part and a bottom part which are oppositely arranged; a plurality of contact points are formed at the bottom of the sample placing block, the contact points are positioned on the same plane, and the plane where the contact points are positioned is a placing plane; a plurality of focusing points are formed at the top of the sample placing block, the plurality of focusing points are positioned on the same plane, the plane where the plurality of focusing points are positioned is a focusing plane, and the placing plane is parallel to the focusing plane; the sample placement block also has a sample placement region for placing a sample, the sample placement region being recessed inwardly from a top of the sample placement block.
2. The sample placement block of claim 1, wherein: the sample placing block is also provided with a caliper placing area for placing a calibration ruler, and a calibration surface of the calibration ruler placed in the caliper placing area coincides with the focusing plane.
3. A sample placement device, comprising:
the sample placing block is provided with a top part and a bottom part which are oppositely arranged; a plurality of contact points are formed at the bottom of the sample placing block, the contact points are positioned on the same plane, and the plane where the contact points are positioned is a placing plane; a plurality of focusing points are formed at the top of the sample placing block, the plurality of focusing points are positioned on the same plane, the plane where the plurality of focusing points are positioned is a focusing plane, and the placing plane is parallel to the focusing plane; the sample placement block further having a sample placement region recessed inwardly from a top of the sample placement block;
a sample fixing block fixed in the sample placement area, the sample fixing block being made of a plastic material, the sample fixing block being used for placing the sample; before the sample fixing block is not deformed, the highest point of the sample is higher than the focusing plane.
4. The sample placement device of claim 3, wherein: the sample placement device further comprises a calibration ruler, and the calibration ruler is provided with a calibration surface;
the sample placing block is further provided with a caliper placing area, the calibration ruler is placed in the caliper placing area, and a calibration surface of the calibration ruler coincides with the focusing plane.
5. The sample placement device of claim 4, wherein: the calibration surface of the calibration ruler is printed with scales.
6. The sample placement device of claim 4, wherein: the caliper placing area is two grooves formed in the top, the two grooves are respectively located on two sides of the sample placing area, and two ends of the calibration ruler are respectively located in the two grooves.
7. The sample placement device of claim 3, wherein: the plastic material used for the sample fixing block is plasticine.
8. A sample testing method using the sample placement device according to any one of claims 3 to 7, characterized in that the sample testing method comprises the steps of:
1) placing a sample fixing block in a sample placing area of the sample placing block, and then placing a sample on the sample fixing block, wherein an observation surface of the sample is positioned at the uppermost part and is higher than the focusing plane;
2) pressing the observation surface of the sample to enable the sample fixing block to generate plastic deformation until the observation surface of the sample is coincided with the focusing plane;
3) placing a sample placing block carrying a sample and a sample fixing block on a placing platform of a microscope, wherein the placing plane is superposed with the placing platform;
4) and adjusting the preset focal length position of the microscope, and detecting the observation surface of the sample.
9. The method for detecting a sample according to claim 8, wherein the step 2) comprises the steps of:
21) moving a sample placing block carrying a sample and a sample fixing block to a flattening machine to enable the sample to be located below a flattening surface of the flattening machine, wherein the flattening surface is parallel to the focusing plane;
22) the flattening surface of the flattening machine moves downwards, and the observation surface of the sample is pressed to enable the sample fixing block to generate plastic deformation until the flattening surface is contacted with the plurality of focusing points of the sample placing block;
23) the flattening surface of the flattening machine upwards breaks away from the sample and the sample placing block, and the observation surface of the sample coincides with the focusing plane.
10. The method for detecting a sample according to claim 8, wherein the method for determining the preset focal position of the microscope in step 4) comprises the following steps:
a) placing the sample placing block on a placing platform of the microscope, wherein a placing plane of the sample placing block is coincided with the placing platform, and a focusing plane of the sample placing block faces to a lens of the microscope;
b) placing a calibration ruler on the sample placing block, and enabling a calibration surface of the calibration ruler printed with scales to coincide with a focusing plane of the sample placing block;
c) adjusting the focal length of the microscope to ensure that the definition of the scale of the calibration scale on the display screen of the microscope is optimal;
d) and marking the focusing guide rail of the microscope, wherein the mark is a preset focal length position.
11. The method for detecting a sample according to claim 8, wherein the step 4) of detecting the observation surface of the sample includes:
the samples were photographed and the dimensions of the samples were measured using measurement software.
12. The method for detecting a sample according to claim 8, wherein the step 4) of detecting the observation surface of the sample includes:
placing a calibration ruler on the sample placing block, and enabling a calibration surface of the calibration ruler printed with scales to coincide with a focusing plane of the sample placing block;
and photographing the sample and the calibration scale, and measuring the size of the sample by using the measurement software and the scale of the calibration scale.
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Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
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