CN111835902A

CN111835902A - Device testing method and device, electronic device and storage medium

Info

Publication number: CN111835902A
Application number: CN202010702492.4A
Authority: CN
Inventors: 王建军
Original assignee: Netease Hangzhou Network Co Ltd
Current assignee: Netease Hangzhou Network Co Ltd
Priority date: 2020-07-20
Filing date: 2020-07-20
Publication date: 2020-10-27

Abstract

The application provides a device testing method and device, electronic equipment and a storage medium, and relates to the technical field of device testing. The method can be applied to a test slave in a test system, and the test system comprises the following steps: the method comprises the steps that a test host machine and at least one test slave machine are in communication connection, the test slave machine is used for mounting at least one device to be tested, the method can obtain a device identification and a device state of the device to be tested, and the device state comprises an online state or an offline state; acquiring equipment information of the equipment to be tested with the equipment state being in an online state according to the equipment identification and the equipment state; the equipment state and the equipment information of the equipment to be tested are sent to the test host, so that the equipment state and the equipment information of the equipment to be tested can be separately obtained.

Description

Device testing method and device, electronic device and storage medium

Technical Field

The present disclosure relates to the field of device testing technologies, and in particular, to a device testing method and apparatus, an electronic device, and a storage medium.

Background

With the rapid development of the mobile internet, various electronic devices such as a mobile device, a tablet computer, a laptop computer, or a built-in device in a motor vehicle are developed endlessly, and during the development of the electronic devices, the electronic devices are usually debugged and tested by a special testing system.

In the prior art, when a test system is used to debug and test an electronic device, the online state of the electronic device and the device information are bound, that is, when the test system is used to debug and test the electronic device, the device information of the electronic device must be acquired if the online state of the electronic device is acquired.

However, generally, the online status of the electronic device is updated more frequently than the device information, and therefore, the conventional test system has a problem of redundancy of the device information.

Disclosure of Invention

An object of the present application is to provide a device testing method, apparatus, electronic device and storage medium, which can solve the problem of device information redundancy existing in the existing testing system, in view of the above disadvantages in the prior art.

In order to achieve the above purpose, the technical solutions adopted in the embodiments of the present application are as follows:

in a first aspect, an embodiment of the present application provides an apparatus testing method, which is applied to a test slave in a test system, where the test system includes: the test system comprises a test host and at least one test slave, wherein the test slave is in communication connection with the test host and is used for mounting at least one device to be tested, and the method comprises the following steps:

respectively acquiring an equipment identifier and an equipment state of the equipment to be tested, wherein the equipment state comprises an online state or an offline state;

acquiring the equipment information of the equipment to be tested, of which the equipment state is an online state, according to the equipment identification and the equipment state;

and respectively sending the equipment state and the equipment information of the equipment to be tested to the test host.

Optionally, the obtaining the device information of the device under test with the device state being the online state includes:

generating an equipment online list according to the equipment identifier and the equipment state of the equipment to be tested;

and acquiring the equipment information of the equipment to be tested with the equipment state being the online state according to the equipment online list.

Optionally, the method further includes:

receiving a device control instruction which is sent by the test host and carries the device identification;

and controlling the equipment to be tested corresponding to the equipment identification to execute corresponding operation according to the equipment control instruction.

Optionally, the controlling, according to the device control instruction, the device to be tested corresponding to the device identifier to execute a corresponding operation includes:

determining whether the equipment state of the equipment to be tested corresponding to the equipment identification is an online state;

if yes, controlling the equipment to be tested corresponding to the equipment identification to execute corresponding control operation according to the equipment control instruction and the equipment state.

Optionally, the device control instruction includes at least one of: and the power-on instruction, the power-off instruction and the quick operation instruction of the equipment to be tested.

Optionally, the test system further includes: the device to be tested is connected with the test slave through the control switch;

when the device control instruction includes a power-on instruction or a power-off instruction of the device to be tested, according to the device control instruction and the device state, controlling the device to be tested corresponding to the device identifier to execute corresponding control operation, including:

and controlling the control switch connected with the equipment to be tested corresponding to the equipment identification to be switched on or switched off according to the equipment control instruction and the equipment state.

Optionally, the test system further includes: the test slave is connected with the equipment to be tested through the expansion equipment; the control switch is arranged between the expansion equipment and the test slave.

Optionally, the method further includes:

and acquiring initial system setting information when the equipment to be tested is on line for the first time.

Optionally, the method further includes:

receiving a setting recovery instruction which is sent by the test host and carries the equipment identification;

and recovering the system setting of the equipment to be tested corresponding to the equipment identification according to the setting recovery instruction and the initial system setting information.

Optionally, the method further includes:

receiving a preset information display instruction which is sent by the test host and carries the equipment identification;

controlling an interface of the device to be tested corresponding to the device identifier to display preset information according to the preset information display instruction, wherein the preset information includes at least one of the following: equipment identification, equipment model and equipment manufacturer of the equipment to be tested.

Optionally, the test system further includes a sensor connected to the test slave, and the method further includes:

acquiring environmental parameters acquired by the sensor;

and sending the environmental parameters collected by the sensor to the test host.

In a second aspect, an embodiment of the present application provides an apparatus testing method, which is applied to a test host in a test system, where the test system includes: the method comprises the following steps that a test host machine and at least one test slave machine are connected with the test host machine in a communication mode, the test slave machine is used for mounting at least one device to be tested, and the method comprises the following steps:

and respectively receiving the equipment state and the equipment information of the equipment to be tested, which are sent by the test slave, wherein the equipment state comprises the online state or the offline state of the equipment to be tested.

Optionally, the method further comprises: sending at least one of the following instructions carrying an equipment identifier to the test slave: the method comprises the steps of equipment control instruction, setting recovery instruction and presetting information display instruction.

The device control instructions include at least one of: and the power-on instruction, the power-off instruction and the quick operation instruction of the equipment to be tested.

Optionally, the test system further comprises a sensor connected to the test slave, and the method further comprises: and receiving the environmental parameters collected by the sensor and sent by the testing slave machine.

In a third aspect, an embodiment of the present application provides an apparatus testing device, which is applied to a test slave in a test system, where the test system includes: the device comprises a test host and at least one test slave, wherein the test slave is in communication connection with the test host and is used for mounting at least one device to be tested, and the device comprises: the device comprises a first acquisition module, a second acquisition module and a sending module;

the first obtaining module is configured to obtain an equipment identifier and an equipment state of the device to be tested, where the equipment state includes an online state or an offline state;

the second obtaining module is configured to obtain, according to the device identifier and the device state, device information of the device to be tested, where the device state is an online state;

the sending module is configured to send the device state and the device information of the device to be tested to the test host, respectively.

Optionally, the second obtaining module is specifically configured to generate an online device list according to the device identifier and the device state of the device to be tested;

Optionally, the apparatus further comprises: the device comprises a receiving module and a control module;

the receiving module is used for receiving the equipment control instruction which is sent by the test host and carries the equipment identification;

and the control module is used for controlling the equipment to be tested corresponding to the equipment identification to execute corresponding operation according to the equipment control instruction.

Optionally, the control module is specifically configured to determine whether the device state of the device to be tested corresponding to the device identifier is an online state;

Optionally, the device control instructions include at least one of: and the power-on instruction, the power-off instruction and the quick operation instruction of the equipment to be tested.

Optionally, the test system further comprises: the device to be tested is connected with the test slave through the control switch; when the device control instruction includes an energization instruction or a power-off instruction of the device to be tested, the control module is specifically configured to control the control switch connected to the device to be tested corresponding to the device identifier to be turned on or off according to the device control instruction and the device state.

Optionally, the test system further comprises: the test slave is connected with the equipment to be tested through the expansion equipment; the control switch is arranged between the expansion equipment and the test slave.

Optionally, the apparatus further includes a third obtaining module, configured to obtain initial system setting information when the device to be tested is on line for the first time.

Optionally, the receiving module is further configured to receive a setting recovery instruction carrying the device identifier and sent by the test host;

Optionally, the receiving module is further configured to receive a preset information display instruction carrying the device identifier and sent by the test host;

Optionally, the test system further includes a sensor, the sensor is connected to the test slave, and the sending module is further configured to obtain the environmental parameters collected by the sensor; and sending the environmental parameters collected by the sensor to the test host.

In a fourth aspect, an embodiment of the present application provides an apparatus testing device, which is applied to a test host in a test system, where the test system includes: the device comprises a test host and at least one test slave, wherein the test slave is in communication connection with the test host and is used for mounting at least one device to be tested, and the device comprises: and the receiving module is used for respectively receiving the equipment state and the equipment information of the equipment to be tested, which are sent by the test slave, wherein the equipment state comprises the online state or the offline state of the equipment to be tested.

Optionally, the apparatus further comprises: a sending module, configured to send at least one of the following instructions with an equipment identifier to the test slave: the method comprises the steps of equipment control instruction, setting recovery instruction and presetting information display instruction.

Optionally, the test system further includes a sensor, the sensor is connected to the test slave, and the receiving module is further configured to receive the environmental parameters collected by the sensor and sent by the test slave.

In a fifth aspect, an embodiment of the present application provides an electronic device, including: the device testing method comprises a processor, a storage medium and a bus, wherein the storage medium stores machine-readable instructions executable by the processor, when the electronic device runs, the processor and the storage medium communicate through the bus, and the processor executes the machine-readable instructions to execute the steps of the device testing method of the first aspect or the second aspect.

In a sixth aspect, an embodiment of the present application provides a storage medium, where a computer program is stored on the storage medium, and the computer program is executed by a processor to perform the steps of the device testing method according to the first aspect or the second aspect.

The beneficial effect of this application is:

in the device testing method, apparatus, electronic device and storage medium provided in the embodiments of the present application, the method may be applied to a test slave in a test system, and the test system may include: the method comprises the steps that a test host machine and at least one test slave machine are in communication connection, the test slave machine is used for mounting at least one device to be tested, the method can obtain a device identification and a device state of the device to be tested, and the device state comprises an online state or an offline state; acquiring equipment information of the equipment to be tested with the equipment state being in an online state according to the equipment identification and the equipment state; the equipment state and the equipment information of the equipment to be tested are sent to the test host, so that the equipment state and the equipment information of the equipment to be tested can be separately obtained, namely, the equipment state of the equipment to be tested can be independently obtained.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained from the drawings without inventive effort.

Fig. 1 is a schematic structural diagram of a test system according to an embodiment of the present disclosure;

fig. 2 is a schematic flowchart of a device testing method according to an embodiment of the present disclosure;

fig. 3 is a schematic flowchart of another device testing method according to an embodiment of the present disclosure;

fig. 4 is a schematic flowchart of another device testing method provided in the embodiment of the present application;

fig. 5 is a schematic flowchart of another device testing method according to an embodiment of the present application;

FIG. 6 is a block diagram of another testing system according to an embodiment of the present disclosure;

fig. 7 is a schematic flowchart of another device testing method according to an embodiment of the present application;

fig. 8 is a schematic flowchart of another device testing method provided in the embodiment of the present application;

fig. 9 is a schematic flowchart of another device testing method according to an embodiment of the present application;

fig. 10 is a functional block diagram of an apparatus testing device according to an embodiment of the present disclosure;

FIG. 11 is a functional block diagram of another apparatus testing device according to an embodiment of the present disclosure;

FIG. 12 is a functional block diagram of another apparatus testing device according to an embodiment of the present disclosure;

fig. 13 is a schematic structural diagram of an electronic device according to an embodiment of the present application.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. The components of the embodiments of the present application, generally described and illustrated in the figures herein, can be arranged and designed in a wide variety of different configurations.

Thus, the following detailed description of the embodiments of the present application, presented in the accompanying drawings, is not intended to limit the scope of the claimed application, but is merely representative of selected embodiments of the application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.

In the prior art, when testing various electronic devices, a mobile phone is taken as an example, and in order to meet development requirements and test requirements of mobile phones of different models, a method is generally adopted to connect the mobile phone into an equipment cluster system, wherein the equipment cluster system can be divided into two layers, the upper layer is a central node host, and the lower layer is a slave, the slave directly controls the connected equipment to be tested, in the system, after the slave scans the mobile phone, whether the connection state of the mobile phone is normal is judged, and then data information of each mobile phone is collected to perform equipment data acquisition. In the technical scheme, the online state of the mobile phone and the equipment information are sent and bound together, for example, a slave computer is connected with a number 1-9 mobile phone, and when the number 1-9 mobile phone is detected to be online currently, the equipment information of the number 1-9 mobile phone is obtained and then sent to an upper-layer host computer. If the number 9 is suddenly disconnected (for example, the mobile phone is manually taken down), the device information of the number 1-8 mobile phone is acquired and sent to the upper-layer host. After the upper host computer receives the corresponding equipment data, the upper host computer can present the connectable and occupied state of the equipment, and for the website page used by the upper user, the user can perform relevant operations such as equipment occupation, so that each mobile phone can be conveniently used by a plurality of people, the equipment utilization rate is greatly improved, and the trouble of borrowing the real machine is avoided.

However, in the above scheme, since the frequency of updating the online status of the device is much higher than the frequency of updating the device information, for example, the updating frequency of the online status of the device may be once every 5 seconds, so as to ensure that the upper layer host can obtain the corresponding message in 5 seconds after the device is disconnected. The device information also needs to be updated, for example, when the wifi wireless network connection of the device changes, the upper host needs to obtain new wifi connection information, but the update frequency of the device information is lower, for example, it may be once every 5 minutes, because the detected device information generally changes infrequently.

Based on the above example, it is further explained that the slave is connected with a number 1-9 mobile phone, and the device information is acquired when the online state of the mobile phone is detected each time, so that device information redundancy exists, and the acquisition of the redundant information will bring extra performance consumption to the slave.

In addition, if it is detected that the number 1-9 mobile phone is online, but when information is acquired, the device information of the number 9 mobile phone fails to be acquired due to reasons such as the card pause/short-time abnormality of the number 9 mobile phone, the slave computer can only send the information to the host computer to acquire the device information of the normal number 1-8 mobile phone, and at this time, the web page can only display that the number 1-8 mobile phone is online, although the number 9 mobile phone can be normally used in practice, the number 9 mobile phone appears offline, that is, the device information acquisition failure may affect the refreshing of the online state of the device.

In view of this, the present application provides an apparatus testing method, which can solve the problem that redundancy exists in the apparatus information acquisition in the existing testing system, and reduce the performance consumption of the testing slave machine.

Fig. 1 is a schematic structural diagram of a test system according to an embodiment of the present disclosure. Fig. 2 is a schematic flowchart of a device testing method provided in an embodiment of the present application, where the method may be applied to a test slave in a test system, and as shown in fig. 1, the test system may include: the testing system comprises a testing host 110 and at least one testing slave 120, wherein the testing slave 120 is in communication connection with the testing host 110, and the testing slave 120 is used for mounting at least one device to be tested 130, wherein the device to be tested 130 may be an Android mobile phone/tablet, an iOS mobile phone/tablet, a mobile device, a wearable device, a mobile device simulator and the like of other types of operating systems, and the application is not limited herein.

Optionally, in practical application, the test system may further include a slave cabinet, where a power line and a network cable may be led out from the slave cabinet to connect to the corresponding power module and the network module; the slave machine cabinet can adopt a drawer modular design, the number of the drawers can be 00, 01, 02, 03 and the like from top to bottom, and optionally, a ventilation and heat dissipation system, a switch, an Access Point (AP) preassembly position, an LED lamp strip, a self-locking drawer slide rail, a wiring rack, a shelf and the like can be further arranged in the slave machine cabinet. The test host 110 may be located on a shelf in the slave cabinet, the test slave 120 may be located in the drawer, the test slave 120 may monitor information such as a device state of the device to be tested and a temperature and humidity of the cabinet, and send the monitored related information to the test host, so that the information may be displayed through the test host. Alternatively, the test slave 120 may not have a separate display panel, so that the manufacturing cost of the test slave 120 may be reduced. Each test slave 120 may correspond to a drawer, for example, the test slave 120 with the product name and the tail number of 00-03 may correspond to the drawers 00-03 of the slave cabinet from top to bottom, but the corresponding relationship is not limited thereto.

The drawers can also be used for placing other control hardware, each drawer can also comprise a front panel, the front panel can be used for placing the equipment to be tested 130 (such as a mobile phone, a tablet personal computer and the like), and the front panel can be further provided with a USB wiring hole. Optionally, a plurality of devices under test (e.g., 8) may be placed on the front panel corresponding to one drawer, so that when a plurality of devices under test 130 are mounted on one test slave 120, a plurality of devices under test 130 may be placed on the front panel. Optionally, drawer handles may be further disposed on two sides of the slave cabinet, so that the drawers can be quickly opened for equipment maintenance, and of course, the shape of the cabinet of the slave cabinet is not limited herein, and may be a rectangular parallelepiped, a cube, or other irregular shape.

As shown in fig. 2, the device testing method may include:

s101, respectively obtaining an equipment identifier and an equipment state of the equipment to be tested, wherein the equipment state comprises an online state or an offline state.

Each test slave can mount at least one device to be tested, and the test slave can perform related debugging, testing and the like on the device to be tested. The device identifier may be a unique string for each device, may correspond to a device serial number of the device to be tested, or may be an identification code defined by a user, and the application is not limited herein.

The device state can be obtained in different modes according to different types (for example, the device state can be obtained according to operating systems) of the device to be tested, for example, for a device waiting for a mobile phone, a tablet and a simulator of an Android system, the device state can be obtained through an Android Debug Bridge (adb) instruction, wherein the adb is a command line tool which can be used for operating the mobile phone device or the simulator; for the mobile phone, the tablet, the simulator waiting equipment of the iOS system, the acquisition can be performed through the system service protocol, and the acquisition mode can be flexibly selected according to the actual application scenario, which is not limited herein.

S102, acquiring the equipment information of the equipment to be tested with the equipment state being in an online state according to the equipment identification and the equipment state.

Wherein, the device information may include, but is not limited to, a device identifier, a device operating system type, a device model, a device manufacturer, a device memory space (RAM), a device memory space (ROM), a device CPU model, a device GPU model, a device OpenGL rendering engine version, a device CPU dominant frequency, a device CPU core number, a device CPU architecture, a device width (pixel count), a device height (pixel count), a device network card address, a device Software Development Kit (SDK) version, a device operating system version number, a device connected wireless network name, a device network IP, a device network DNS setting, a device remaining memory space, a device remaining power, a device battery health status, a device operator, and other data, and may include one or more of the above combinations according to the type and application scenario of the device to be tested, the present application is not limited thereto.

Certainly, the obtaining mode of the device information may be different according to the type of the device to be tested, for example, for a mobile phone, a tablet, a simulator waiting device of an Android system, the device information may be obtained through an adb instruction, or corresponding device information may be obtained from an application program in the Android system; for the mobile phone, the tablet and the simulator waiting equipment of the iOS system, data can be acquired through a system service protocol, or corresponding equipment information can be acquired from an application program in the iOS system.

Optionally, for the obtaining steps of S101 and S102, the test slave may respectively start a cyclic monitoring program of the device status and the device information to obtain, where the test slave may continuously monitor the device to be tested mounted on the test slave through the cyclic monitoring program of the device status, that is, may continuously monitor the online device to be tested, and then the test slave may cache the corresponding device identifier and send the device identifier to the upper test host, and the test host may determine whether a certain device to be tested is online according to the device identifier; the test slave machine can acquire the equipment information of the equipment to be tested with the equipment state being in an online state based on the cached equipment identification through the equipment information circulation monitoring program, and then the test slave machine can send the equipment information of the equipment to be tested to the upper test host machine, so that the equipment state and the equipment information of the equipment to be tested can be acquired separately, that is, the equipment state of the equipment to be tested can be acquired separately, the problem of equipment information acquisition redundancy in the existing test system is solved, and compared with the existing test system, the performance consumption of the test slave machine in the test system can be reduced.

In addition, it should be noted that, by applying the embodiment of the present application, it is also possible to avoid that the device state is refreshed due to the device information acquisition failure.

S103, respectively sending the equipment state and the equipment information of the equipment to be tested to the test host.

Optionally, the test slave may uniformly encapsulate the acquired device state and device information of the device to be tested into a JSON object Notation (JSON) format, and send the JSON format to the test host, so that the test host may determine whether a certain device to be tested is online according to the device identifier, the device state, and the device information sent by the test slave, and display a related test interface, thereby facilitating a user to perform a test. JSON is a lightweight data exchange format.

It should be noted that, if a plurality of devices to be tested are mounted on the test slave, each device to be tested can be sequentially reused for a plurality of devices to be tested according to the foregoing method, which is not described herein again.

It should be noted that, if the current test system includes at least one test slave and at least one device under test, when the test slave sends the device state and the device information of the device under test to the test host, the test slave should also carry a corresponding device identifier and a slave identifier of the test slave to which the device under test belongs, so that the test slave to which the device under test belongs and the device identifier can be known by the test host when receiving the device state and the device information sent by the test slave, respectively. In addition, the time for sending the device state and the device information from the test slave to the test master is not limited in the application, and the device state and the device information may be sent after being obtained, or the device state and the device information may be sent in a combined manner.

To sum up, the device testing method provided by the embodiment of the present application may be applied to a test slave in a test system, where the test system may include: the method comprises the steps that a test host machine and at least one test slave machine are in communication connection, the test slave machine is used for mounting at least one device to be tested, the method can obtain a device identification and a device state of the device to be tested, and the device state comprises an online state or an offline state; acquiring equipment information of the equipment to be tested with the equipment state being in an online state according to the equipment identification and the equipment state; the equipment state and the equipment information of the equipment to be tested are sent to the test host, so that the equipment state and the equipment information of the equipment to be tested can be separately obtained, namely, the equipment state of the equipment to be tested can be independently obtained.

Fig. 3 is a schematic flowchart of another device testing method according to an embodiment of the present application. In some embodiments, the obtaining, according to the device identifier and the device state, device information of the device under test whose device state is an online state, as shown in fig. 3, may include:

s201, generating an equipment online list according to the equipment identification and the equipment state of the equipment to be tested.

S202, acquiring the equipment information of the equipment to be tested with the equipment state being in the online state according to the equipment online list.

The device online list may include device identification, online time, online duration, online frequency, and other relevant information of at least one device to be tested that is currently online (i.e., connected normally), which is not limited herein. The test slave can detect the equipment state of each equipment to be tested through a preset online detection circulating logic, so that when the equipment state of each equipment to be tested is obtained, an equipment online list can be generated, and the equipment information of the equipment to be tested corresponding to the equipment identification is obtained according to the equipment identification recorded in the equipment online list.

Optionally, when the test slave performs the device state detection on the mounted device to be tested according to the preset online detection logic each time, a corresponding device online list may be generated according to the detection result, so that when the test slave receives a relevant control instruction (such as restart, shutdown, mute, and the like) which is sent by the test host and carries the device identifier, the test slave may search whether the device to be tested corresponding to the device identifier carried in the instruction is online according to the device online list, and if the device to be tested is online, the execution success may be returned; if the operation is not on-line or the operation is unsuccessful, operation failure and failure detailed information (equipment serial number, on-line state, success or failure of operation execution) can be returned, so that a user can conveniently check the reason of the operation failure. Of course, the test slave can also send the device online list to the test host, so that the test host can determine whether a certain device to be tested is online based on the device online list, and then can send a corresponding device control instruction for the online device to be tested, thereby reducing the performance consumption of the test host.

Fig. 4 is a schematic flowchart of another device testing method according to an embodiment of the present application. In some embodiments, the test slave may also respond to the call of the upper test master to perform a corresponding operation on the mounted detection device object, which may be specifically referred to as the following process, as shown in fig. 4, where the method further includes:

s301, receiving a device control instruction which is sent by the test host and carries the device identification.

During specific implementation, the test slave can start related monitoring services in the test process to monitor the device control instruction sent by the test host. The listening service may be implemented based on Remote Procedure Call (RPC), but not limited thereto, and may be flexibly selected according to an actual application scenario. Of course, it should be noted that the device control instruction may include: the device identification command includes one or more device identifications, identifications of test slaves to which the one or more device identifications belong, and device control commands (for example, control commands such as shutdown, mute, and screen lock), so that according to the device identification command, the test slaves can determine corresponding devices to be tested and operations to be executed.

And S302, controlling the equipment to be tested corresponding to the equipment identification to execute corresponding operation according to the equipment control instruction.

After receiving the device control instruction, the test slave may control the corresponding device to execute a corresponding operation according to the device control instruction. For example, the device with the device identifier 1 may be controlled to shut down, and the device with the device identifier 2 may be controlled to lock the screen, but the disclosure is not limited thereto.

Fig. 5 is a schematic flowchart of another device testing method according to an embodiment of the present application. In some embodiments, the controlling, according to the device control instruction, the device to be tested corresponding to the device identifier to perform a corresponding operation, as shown in fig. 5, includes:

s401, determining whether the equipment state of the equipment to be tested corresponding to the equipment identification is an online state.

It should be noted that, based on the description of the foregoing embodiment, if the device online list is generated, the device identifier may be searched in the device online list according to the device identifier in the device control instruction, if the device identifier is found, it may be determined whether the device state of the device to be tested corresponding to the device identifier is an online state, and if the device state is not found, it may be determined that the device state is an offline state.

And S402, if yes, controlling the equipment to be tested corresponding to the equipment identification to execute corresponding control operation according to the equipment control instruction and the equipment state.

When the device to be tested is determined to be in the online state, the device to be tested corresponding to the identifier of the device to be tested may be controlled to execute corresponding control operations, where the control operations may include, but are not limited to, shutdown, restart, screen lock, lighting, camera opening, volume up, volume down, mute, text input, and the like. By applying the embodiment of the application, the on-line equipment to be tested can be quickly controlled, so that the test is more convenient.

In some embodiments, the device control instructions include at least one of: and the power-on instruction, the power-off instruction and the quick operation instruction of the equipment to be tested.

The shortcut operation corresponding to the shortcut operation instruction may include the control operation listed above, and certainly may also include some other shortcut operations, for example, opening an application program, opening a web page, and the like.

In some embodiments, the test system further comprises: the device to be tested is connected with the test slave through the control switch;

when the device control instruction includes a power-on instruction or a power-off instruction of the device to be tested, the device to be tested corresponding to the control device identifier executes corresponding control operation according to the device control instruction and the device state, and the method includes:

and controlling the on/off of a control switch connected with the equipment to be tested corresponding to the equipment identification according to the equipment control instruction and the equipment state.

The control switch may be a relay, but not limited to this, and may be other types of devices according to an actual application scenario, so that the control switch connected to the device to be tested corresponding to the device to be tested identifier is controlled to be turned on or off, and further, the power on or off of the device to be tested mounted on the test slave may be controlled. The power-off of the equipment to be tested is controlled, so that the quick service life attenuation of the battery caused by the fact that the equipment to be tested is powered on all the time can be prevented; by controlling the power-on of the equipment to be tested, the power-on work of the equipment to be tested can be controlled at any time when the equipment to be tested needs to be tested, and the testing efficiency is improved.

Of course, it should be noted that the number of the control switches is not limited herein, and the test system may include one or more control switches, where each test slave may correspond to one or more control switches for controlling power on and power off of one or more devices under test, and may be different according to an actual application scenario.

Fig. 6 is a schematic structural diagram of another test system according to an embodiment of the present application. In some embodiments, for the same mount interface on the test slave, in order to mount a plurality of devices under test, and implement batch operation on the plurality of devices under test on the test slave, as shown in fig. 6, the test system further includes: the extension equipment 160 is provided with at least one extension interface, and the test slave 120 is connected with the equipment to be tested 130 through the extension equipment 160; the control switch 150 is provided between the expansion device 160 and the test slave 120.

The expansion device 160 may be a Universal serial bus Hub (USB-Hub), and correspondingly, the expansion interface may be a USB interface, but is not limited thereto, and may be other types of devices according to an actual application scenario. The USB Hub is a device that can expand one USB interface into multiple USB interfaces and can use the USB interfaces simultaneously, and the application does not limit the number of the expansion interfaces in the expansion device, and the number may be 4, 6, 8, and the like, and can be flexibly adjusted according to the actual application scenario.

Optionally, as for a process of controlling power on or power off of the device to be tested connected in the expansion device, referring to the following related description, if the test slave receives a power on or power off instruction sent by the upper test host through the rpc service, the test slave may control the relay to be turned on or off through the relay hardware drive, so as to control power on or power off of the USB-hub, and implement power on or power off of the device to be tested connected with the USB-hub, so that by actively controlling whether the device to be tested is powered on or not, the device to be tested is prevented from being powered on all the time to cause rapid degradation of the battery life, and the service life of the battery in the device to be tested is prolonged.

In the embodiment of the application, the control switch is arranged between the expansion equipment and the test slave, so that the power-on or power-off of the equipment to be tested connected in the expansion equipment can be controlled by controlling the on or off of the control switch, the batch control of the equipment to be tested connected in the expansion equipment can be realized, and the power-on and power-off efficiency is improved. Of course, it should be noted that, besides performing batch power-on and power-off on multiple devices to be tested, some other batch controls (for example, the foregoing shortcut controls) may also be performed, which may specifically refer to the foregoing power-on and power-off processes, and this application is not described herein again.

Fig. 7 is a schematic flowchart of another device testing method according to an embodiment of the present application. In some embodiments, in order to restore the system setting of the device under test after being used by the user to the initial access, as shown in fig. 7, the method further includes:

s501, acquiring initial system setting information when the device to be tested is on line for the first time.

The initial system device information may include, but is not limited to: the device to be tested is firstly mounted on an application program installation list, system setting and the like when the slave machine is tested, and the initial system setting information is obtained, so that the device to be tested after being tested and debugged by a user can be restored to an application installation state and a system setting state when the device to be tested is initially accessed, and the convenient management of the device to be tested is realized.

Optionally, the system setting of the device under test at the time of initial access may be referred to as the following process, as shown in fig. 7, where the method further includes:

s502, receiving a setting recovery instruction which is sent by the test host and carries the equipment identification.

S503, according to the setting recovery instruction and the initial system setting information, recovering the system setting of the equipment to be tested corresponding to the equipment identification.

The test slave can receive the setting recovery instruction sent by the test host through the rpc service, and then according to the setting recovery instruction and the initial system setting information, the current system equipment of the equipment to be tested can be recovered to the initial system setting, so that the recovery operation of the system setting is realized. Of course, it should be noted that the device under test identifier carried in the setting recovery instruction may include one or more identifiers, and the application is not limited herein.

For example, if a user installs some applications and modifies system settings when using a certain device under test, the device under test can be restored to the application installation state and the system setting state (deleting redundant applications and restoring system settings) when initially accessing according to the setting restoration instruction, and it can be ensured that the device under test is still in the initial system settings when being used next time.

Fig. 8 is a schematic flowchart of another device testing method according to an embodiment of the present application. In some embodiments, in order to enable the administrator to find the target device from the at least one device under test mounted by the test slave during the routine maintenance of the device under test, as shown in fig. 8, the method further includes:

s601, receiving a preset information display instruction which is sent by a test host and carries an equipment identifier.

And S602, controlling an interface of the equipment to be tested corresponding to the equipment identification to display preset information according to the preset information display instruction.

The preset information includes at least one of: equipment identification, equipment model and equipment manufacturer of the equipment to be tested.

The preset information display instruction is used for controlling an interface of the device to be tested corresponding to the identifier of the device to be tested to display preset information, and the preset information may include, in addition to the above-mentioned content, other preset information, such as a device serial number of the device to be tested, temperature information, and user-defined information (such as an asset number) of the device to be tested, and the application is not limited herein. The temperature of the equipment can be obtained through a temperature sensor connected with the testing slave, and the temperature testing method and the equipment are not limited in the application and can be flexibly adjusted according to actual application scenes.

By applying the embodiment of the application, the interface of the equipment to be tested is controlled to display the preset information, so that when an administrator performs daily maintenance management on the equipment to be tested, if part of maintenance operation needs to be performed manually, the administrator can quickly find the corresponding equipment to be maintained through the display information on the interface of the equipment to be tested, and the maintenance management efficiency is improved.

Fig. 9 is a schematic flowchart of another device testing method according to an embodiment of the present application. In some embodiments, in order to monitor physical environmental parameters of the device under test in real time, such as environmental parameters of temperature, humidity, longitude and latitude, altitude, and the like, the test system further includes a sensor, and the sensor is connected to the test slave, as shown in fig. 9, the method further includes:

and S701, acquiring the environmental parameters acquired by the sensor.

And S702, sending the environmental parameters collected by the sensor to the test host.

The test slave may include a corresponding data acquisition port, such as a serial port, a USB interface, and the like, and the sensor may include but is not limited to: temperature sensors, humidity sensors, position sensors, altitude sensors, etc., and the present application is not limited thereto. The sensor can be connected to the test slave machine through a corresponding data acquisition port, and can acquire the environmental parameters through the hardware drive of the sensor when acquiring the environmental parameters specifically so as to acquire the relevant environmental parameters, such as temperature, humidity, longitude and latitude, height and the like.

Of course, it should be noted that the number of the sensors is not limited herein, and according to an actual application scenario, one testing slave may include a plurality of sensors, and each device under test may correspond to one or more types, and the application is not limited herein.

Optionally, after the environment parameter is obtained, the environment parameter may be combined with the device information and sent to the test host, and the test host displays the corresponding test information.

The foregoing device testing method is described in conjunction with a specific embodiment, wherein, the test slave can mount the USB-hub through the relay, the device to be tested can be connected into the USB-hub, the test slave machine can be accessed to the sensor (such as a temperature sensor, a humidity sensor, a positioning sensor and a height sensor) through a serial port and is provided with a related sensor driver, the process of respectively acquiring and sending the equipment identifier and the equipment state of the equipment to be tested in the test slave machine can be realized through a preset 'online state detection module', the process of acquiring and sending the equipment information of the equipment to be tested with the equipment state being an online state can be realized through the preset 'equipment information detection module', the process of receiving a related instruction sent by the test master machine can be realized through a preset 'equipment operation module', and the equipment operation module can start rpc a service monitoring call request; the test host can externally present the online condition of the equipment according to the equipment state sent by the online state detection module and externally present the details of the equipment information according to the equipment information sent by the equipment information detection module; the test host can send a device control instruction, a setting recovery instruction, a preset information display instruction and the like to the device operation module and receive an operation execution result.

In the process, the sensors, the relays and the USB-hub are added in the test system, and a control application program, a split device online logic and a device information detection logic on the device are added, so that the test slave can reliably provide the device online condition and the device information for the upper-layer test host, provide environment data of the device, realize quick control on the mounted control object device, guarantee the service life of the battery of the mounted device to be tested through power-off operation, and provide a basic function for the cloud real machine cluster.

Optionally, an embodiment of the present application further provides an apparatus testing method, where the method may be applied to a test host in a test system, and the test system may include: the method comprises the following steps that a test host machine and at least one test slave machine are connected with the test host machine in a communication mode, and the test slave machine is used for mounting at least one device to be tested, and the method comprises the following steps:

The test host can know the current online equipment to be tested in the test system by receiving the equipment state of the equipment to be tested sent by the test slave; and the received equipment information can be further stored, processed and displayed by receiving the equipment information of the equipment to be tested, which is sent by the test slave, so that the detailed information of the current online equipment to be tested can be known. For a description of the device information of the device under test, reference may be made to the related parts mentioned above, and details are not repeated herein.

It should be noted that, when the test host updates the historical device state according to the device state of the device under test sent by the test slave each time, in order to ensure the accuracy of the update, the following process may be referred to: and updating the historical equipment information according to the equipment information and the preset time length.

For example, the number of the devices to be tested actually mounted on a certain test slave is 1-9, when the test slave performs first cycle detection, the number 1-9 devices to be tested are detected to be all online, the device state of each device to be tested is sent to the test host, and the test slave receives the device state of each device to be tested; however, in the subsequent detection processes for several consecutive times (for example, it may be set to 5 times), the test slave only detects that No. 1-8 devices to be tested are online, that is, no No. 9 devices to be tested exist in the device state received by the test host within the duration of the consecutive times of device online detection cycles, and then the test host may determine that No. 9 devices to be tested are offline, and update the corresponding display page.

In addition, corresponding to the process of sending the device state and the device information by the test slave, the test master may also receive the device identifier sent by the test slave and the slave identifier of the test slave to which the device under test belongs, so that the test master may know which device under test is currently on the test slave.

Optionally, according to the online state of the device to be tested and the device information, the test master may send at least one of the following instructions to the test slave: the device control instruction, the setting recovery instruction, and the preset information display instruction, but not limited thereto, may include other instructions according to an actual application scenario, and for related content of the portion, reference may be made to the foregoing related portions, which are not described herein again. It should be noted that, in the interaction process, after the test slave performs the relevant operation on the device to be tested according to the instruction, the test slave may also send a corresponding response result to the test master so as to inform the test master whether the current operation is successful.

Optionally, the test system further comprises a sensor, the sensor being connected to the test slave, the method further comprising: and receiving the environmental parameters acquired by the sensor sent by the test slave machine so as to know the environment of each device to be tested through the environmental parameters and realize the environmental monitoring of the environment to be tested. For example, when the test host detects that the temperature of a certain device to be tested is too high, the device to be tested can be controlled to shut down, and dangerous factors are avoided.

In addition, it should be noted that the device testing method provided by the embodiment of the present application may also be associated with a relevant real cloud machine cluster system, so that a better real machine unit automation control system may be provided in a real cloud machine cluster scene, stable and reliable device control over a device to be tested is realized, and the effects of stable operation and convenient maintenance of the whole real cloud machine cluster are achieved.

Fig. 10 is a schematic functional block diagram of an apparatus testing device according to an embodiment of the present application, where the apparatus may be applied to a test slave in a test system, where the test system includes: the basic principle and the generated technical effects of the device are the same as those of the corresponding method embodiment, and for brief description, the parts which are not mentioned in the embodiment can refer to the corresponding contents in the method embodiment. As shown in fig. 10, the device testing apparatus 300 may include: a first obtaining module 310, a second obtaining module 320 and a sending module 330; the first obtaining module 310 is configured to obtain an equipment identifier and an equipment state of a device to be tested, where the equipment state includes an online state or an offline state; a second obtaining module 320, configured to obtain, according to the device identifier and the device state, device information of the device to be tested, where the device state is an online state; the sending module 330 is configured to send the device state and the device information of the device to be tested to the test host, respectively.

Optionally, the second obtaining module 320 is specifically configured to generate an online device list according to the device identifier and the device state of the device to be tested; and acquiring the equipment information of the equipment to be tested with the equipment state being the online state according to the equipment online list.

Fig. 11 is a functional block diagram of another device testing apparatus according to an embodiment of the present disclosure. Optionally, as shown in fig. 11, the device testing apparatus 300 may further include: a receiving module 340 and a control module 350;

a receiving module 340, configured to receive a device control instruction carrying a device identifier sent by a test host; and the control module 350 is configured to control the device to be tested corresponding to the device identifier to execute a corresponding operation according to the device control instruction.

Optionally, the control module 350 is specifically configured to determine whether the device state of the device to be tested corresponding to the device identifier is an online state; if yes, controlling the equipment to be tested corresponding to the equipment identification to execute corresponding control operation according to the equipment control instruction and the equipment state.

Optionally, the device control instructions comprise at least one of: and the power-on instruction, the power-off instruction and the quick operation instruction of the equipment to be tested.

Optionally, the test system further comprises: the device to be tested is connected with the test slave through the control switch; when the device control instruction includes an energization instruction or a power-off instruction of the device to be tested, the control module 350 is specifically configured to control the on/off of a control switch connected to the device to be tested corresponding to the device identifier according to the device control instruction and the device state.

Fig. 12 is a functional block diagram of another apparatus testing device according to an embodiment of the present disclosure. Optionally, as shown in fig. 12, the device testing apparatus 300 further includes a third obtaining module 360, configured to obtain initial system setting information when the device under test is on-line for the first time.

Optionally, the receiving module 340 is further configured to receive a setting recovery instruction carrying an equipment identifier and sent by the test host; and restoring the system setting of the equipment to be tested corresponding to the equipment identification according to the setting restoration instruction and the initial system setting information.

Optionally, the receiving module 340 is further configured to receive a preset information display instruction carrying an equipment identifier and sent by the test host; according to the preset information display instruction, the interface of the equipment to be tested corresponding to the equipment identification is controlled to display preset information, and the preset information comprises at least one of the following information: equipment identification, equipment model and equipment manufacturer of the equipment to be tested.

Optionally, the test system further includes a sensor, the sensor is connected to the test slave, and the sending module 330 is further configured to obtain the environmental parameter collected by the sensor; and sending the environmental parameters collected by the sensor to the test host.

Optionally, an embodiment of the present application further provides another device testing apparatus, where the apparatus may be applied to a test host in a test system, and the test system includes: the device comprises a test host and at least one test slave, wherein the test slave is in communication connection with the test host, and the test slave is used for mounting at least one device to be tested, and the device can comprise: and the receiving module is used for respectively receiving the equipment state and the equipment information of the equipment to be tested, which are sent by the test slave, wherein the equipment state comprises the online state or the offline state of the equipment to be tested.

Optionally, the apparatus further comprises: the sending module is used for sending at least one of the following instructions carrying the equipment identifier to the testing slave machine: the method comprises the steps of equipment control instruction, setting recovery instruction and presetting information display instruction.

The device control command includes at least one of: and the power-on instruction, the power-off instruction and the quick operation instruction of the equipment to be tested.

Optionally, the test system further includes a sensor connected to the test slave, and a receiving module further configured to receive environmental parameters collected by the sensor sent by the test slave.

The above-mentioned apparatus is used for executing the method provided by the foregoing embodiment, and the implementation principle and technical effect are similar, which are not described herein again.

These above modules may be one or more integrated circuits configured to implement the above methods, such as: one or more Application Specific Integrated Circuits (ASICs), or one or more microprocessors (DSPs), or one or more Field Programmable Gate Arrays (FPGAs), among others. For another example, when one of the above modules is implemented in the form of a processing element scheduler code, the processing element may be a general-purpose processor, such as a Central Processing Unit (CPU) or other processor capable of calling program code. For another example, these modules may be integrated together and implemented in the form of a system-on-a-chip (SOC).

Fig. 13 is a schematic structural diagram of an electronic device according to an embodiment of the present application. As shown in fig. 13, the electronic device may include: a processor 510, a storage medium 520, and a bus 530, the storage medium 520 storing machine-readable instructions executable by the processor 510, the processor 510 communicating with the storage medium 520 via the bus 530 when the electronic device is operating, the processor 510 executing the machine-readable instructions to perform the steps of the above-described method embodiments. The specific implementation and technical effects are similar, and are not described herein again.

Optionally, the present application further provides a storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the computer program performs the steps of the above method embodiments. The specific implementation and technical effects are similar, and are not described herein again.

In the several embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the units is only one logical division, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.

The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.

In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, or in a form of hardware plus a software functional unit.

The integrated unit implemented in the form of a software functional unit may be stored in a computer readable storage medium. The software functional unit is stored in a storage medium and includes several instructions for enabling a computer device (which may be a personal computer, a server, or a network device) or a processor (processor) to perform some steps of the methods according to the embodiments of the present application. And the aforementioned storage medium includes: a U disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.

It is noted that, in this document, relational terms such as "first" and "second," and the like, may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.

The above description is only a preferred embodiment of the present application and is not intended to limit the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application. It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures. The above description is only a preferred embodiment of the present application and is not intended to limit the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. An equipment testing method is characterized in that the method is applied to a test slave in a test system, and the test system comprises the following steps: the test system comprises a test host and at least one test slave, wherein the test slave is in communication connection with the test host and is used for mounting at least one device to be tested, and the method comprises the following steps:

2. The method according to claim 1, wherein the obtaining, according to the device identifier and the device status, device information of the device under test whose device status is an online status includes:

3. The method of claim 1, further comprising:

4. The method according to claim 3, wherein the controlling, according to the device control instruction, the device to be tested corresponding to the device identifier to perform a corresponding operation includes:

5. The method of claim 3 or 4, wherein the device control instructions comprise at least one of: and the power-on instruction, the power-off instruction and the quick operation instruction of the equipment to be tested.

6. The method of claim 5, wherein the test system further comprises: the device to be tested is connected with the test slave through the control switch;

7. The method of claim 6, wherein the test system further comprises: the test slave is connected with the equipment to be tested through the expansion equipment; the control switch is arranged between the expansion equipment and the test slave.

8. The method of claim 1, further comprising:

9. The method of claim 8, further comprising:

10. The method of claim 1, further comprising:

11. The method of claim 1, wherein the test system further comprises a sensor coupled to the test slave, the method further comprising:

acquiring environmental parameters acquired by the sensor;

12. The equipment testing method is characterized by being applied to a testing host machine in a testing system, wherein the testing system comprises: the method comprises the following steps that a test host machine and at least one test slave machine are connected with the test host machine in a communication mode, the test slave machine is used for mounting at least one device to be tested, and the method comprises the following steps:

13. An apparatus testing device, applied to a test slave in a test system, the test system comprising: the device comprises a test host and at least one test slave, wherein the test slave is in communication connection with the test host and is used for mounting at least one device to be tested, and the device comprises: the device comprises a first acquisition module, a second acquisition module and a sending module;

14. The device testing apparatus is applied to a testing host in a testing system, and the testing system comprises: the device comprises a test host and at least one test slave, wherein the test slave is in communication connection with the test host and is used for mounting at least one device to be tested, and the device comprises: and the receiving module is used for respectively receiving the equipment state and the equipment information of the equipment to be tested, which are sent by the test slave, wherein the equipment state comprises the online state or the offline state of the equipment to be tested.

15. An electronic device, comprising: a processor, a storage medium and a bus, the storage medium storing machine-readable instructions executable by the processor, the processor and the storage medium communicating via the bus when the electronic device is operating, the processor executing the machine-readable instructions to perform the steps of the device testing method according to any one of claims 1-12.

16. A storage medium having stored thereon a computer program for performing the steps of the device testing method according to any one of claims 1-12 when executed by a processor.