CN111813613A

CN111813613A - Test management method, test management device, electronic equipment and storage medium

Info

Publication number: CN111813613A
Application number: CN202010702051.4A
Authority: CN
Inventors: 王建军
Original assignee: Netease Hangzhou Network Co Ltd
Current assignee: Netease Hangzhou Network Co Ltd
Priority date: 2020-07-20
Filing date: 2020-07-20
Publication date: 2020-10-23

Abstract

The application provides a test management method and device, electronic equipment and a storage medium, and relates to the technical field of equipment testing. The method can be applied to a test host in a test system, and the test system comprises the following steps: the method comprises the following steps that a test host and at least one test slave configured in a slave cabinet are connected in a communication mode, each test slave is used for mounting at least one device to be tested, the method comprises the following steps of receiving device information of the device to be tested sent by the test slave and mounting information of the device to be tested in the slave cabinet, and the mounting information comprises the following steps: the equipment to be tested comprises an identifier of a slave machine cabinet to which the equipment to be tested belongs, an equipment identifier of the equipment to be tested and a mounting position of the equipment to be tested in the slave machine cabinet; and displaying the first interface according to the equipment information and the mounting information, so that the display position of the equipment to be tested in the first interface in the slave cabinet can correspond to the position of the real slave cabinet, the manager can quickly position the equipment to be tested, and the management efficiency is improved.

Description

Test management method, test management device, electronic equipment and storage medium

Technical Field

The present disclosure relates to the field of device testing technologies, and in particular, to a test management method and apparatus, an electronic device, and a storage medium.

Background

The test of the mobile terminal is used as an important link in the development process, and the reliability, the stability and the fluency of the operation of the mobile terminal can be ensured by testing the mobile terminal.

Currently, when a mobile terminal is tested, the test can be realized through a cluster cabinet, wherein the cluster cabinet can include a plurality of test interfaces, each test interface corresponds to a test position, the test can be realized by placing the mobile terminal in the test position and connecting the test interfaces through the corresponding test interface, and the cluster cabinet can be connected with an upper-layer host, and the test page of the cluster cabinet can be displayed through a web page.

However, the existing test platform simply lists the mobile terminals, that is, the arrangement positions of the mobile terminals in the test page are randomly arranged out of order, and there is no corresponding relationship with the actual situation in the cluster cabinet, which is not convenient for the management of the cluster manager.

Disclosure of Invention

An object of the present application is to provide a test management method, an apparatus, an electronic device, and a storage medium, which can improve management efficiency of management personnel in a test system, in view of the above-mentioned deficiencies in the prior art.

In order to achieve the above purpose, the technical solutions adopted in the embodiments of the present application are as follows:

in a first aspect, an embodiment of the present application provides a test management method, which is applied to a test host in a test system, where the test system includes: the method comprises the following steps that a test host machine and at least one test slave machine configured in a slave machine cabinet are connected in a communication mode, and each test slave machine is used for mounting at least one device to be tested, and the method comprises the following steps:

receiving equipment information of equipment to be tested sent by a test slave and mounting information of the equipment to be tested in a slave cabinet, wherein the mounting information comprises: the equipment to be tested comprises an identifier of a slave machine cabinet to which the equipment to be tested belongs, an equipment identifier of the equipment to be tested and a mounting position of the equipment to be tested in the slave machine cabinet;

displaying a first interface according to the equipment information and the mounting information; the first interface includes: the equipment comprises an identifier of a slave cabinet, a cabinet graph used for representing the slave cabinet and at least one icon of equipment to be tested used for representing the mounting position of the equipment to be tested in the slave cabinet.

Optionally, the method further includes: and responding to the touch operation aiming at the at least one device to be tested on the first interface, and controlling the at least one device to be tested to execute the control operation corresponding to the touch operation through the test slave computer.

Optionally, the method further includes: and responding to the triggering operation of the equipment maintenance interface, and displaying the equipment maintenance interface.

Optionally, the method further includes: and responding to a position adjusting instruction of the equipment to be tested on the equipment maintenance interface, and adjusting the display positions of the icons of the equipment to be tested on the equipment maintenance interface and the first interface.

Optionally, the method further includes: and responding to the control operation of the equipment to be tested on the equipment maintenance interface, and sending a control instruction to the test slave, wherein the control instruction comprises an equipment identifier of the equipment to be tested.

Optionally, sending a control instruction to the test slave in response to a control operation of the device to be tested on the device maintenance interface, where the control operation includes:

responding to batch control operation of the equipment to be tested on the equipment maintenance interface, and sending batch control instructions to the test slave, wherein the batch control instructions comprise: and the equipment identifications of the plurality of equipment to be tested.

Optionally, the device information includes at least one of: the device state of the device to be tested, the occupation state of the device to be tested, the attribute information of the device to be tested and the environmental parameters of the device to be tested.

Optionally, the method further includes: and responding to the triggering operation of the equipment detail interface, and displaying the equipment detail interface, wherein the equipment detail interface comprises equipment information.

Optionally, the method further includes: responding to a device search instruction input on the device detail interface, and displaying a corresponding search result, wherein the device search instruction comprises: a keyword of the device information.

Optionally, the method further includes: and responding to the editing operation of the device information on the device detail interface, and displaying the edited device detail interface.

Optionally, the device state of the device under test includes: and displaying a first interface according to the equipment information and the mounting information in the online state and the offline state, wherein the first interface comprises:

and acquiring the equipment to be tested with the equipment state being an off-line state, and distinctively displaying the icon of the equipment to be tested corresponding to the equipment to be tested in the first interface.

Optionally, the method further includes: and responding to the equipment to be tested of which the information of the equipment meets the preset conditions on the first interface, and displaying the equipment information of the equipment to be tested meeting the preset conditions on the first interface.

Optionally, the method further includes: responding to the triggering operation of the equipment alarm interface, and displaying the equipment alarm interface, wherein the equipment alarm interface comprises: the reason of the alarm and the equipment identifier of the equipment to be tested where the alarm occurs.

Optionally, the method further includes: and responding to the alarm threshold setting operation on the equipment alarm interface, and displaying an alarm equipment list on the equipment alarm interface according to the alarm threshold and the equipment information of the equipment to be tested, wherein the alarm equipment list comprises at least one equipment identifier of the equipment to be tested.

Optionally, the method further includes: and sending an alarm signal to the test slave in response to the triggering operation of the equipment to be tested in the alarm equipment list on the equipment alarm interface so that the test slave controls the at least one equipment to be tested to execute a preset alarm operation.

Optionally, the method further includes: responding to the trigger operation of the equipment real-machine interface, and displaying the equipment real-machine interface, wherein the equipment real-machine interface comprises: the device identification of the device to be tested, the occupation state of the device to be tested and the attribute information of the device to be tested.

Optionally, the method further includes: responding to the equipment occupation operation of the equipment to be tested on the equipment real machine interface, and displaying the real machine control interface of the equipment to be tested, wherein the real machine control interface comprises: the equipment identification of the equipment to be tested and the preset interface of the equipment to be tested.

Optionally, the method further includes: and responding to the batch occupation operation of the plurality of devices to be tested on the real machine interface of the equipment, switching the devices to be tested from the idle state to the occupation state, wherein the batch application operation comprises the equipment identifications of the plurality of devices to be tested.

In a second aspect, an embodiment of the present application provides a test management apparatus, which is applied to a test host in a test system, where the test system includes: the test management device comprises a test host and at least one test slave configured in a slave cabinet, wherein the test host is in communication connection with the at least one test slave, each test slave is used for mounting at least one device to be tested, and the test management device comprises: the device comprises a receiving module and a display module;

the receiving module is used for receiving equipment information of the equipment to be tested sent by the testing slave and mounting information of the equipment to be tested in the cabinet of the slave, wherein the mounting information comprises: the equipment to be tested comprises an identifier of a slave machine cabinet to which the equipment to be tested belongs, an equipment identifier of the equipment to be tested and a mounting position of the equipment to be tested in the slave machine cabinet;

the display module is used for displaying a first interface according to the equipment information and the mounting information; the first interface includes: the equipment comprises an identifier of a slave cabinet, a cabinet graph used for representing the slave cabinet and at least one icon of equipment to be tested used for representing the mounting position of the equipment to be tested in the slave cabinet.

Optionally, the display module is further configured to control, by the test slave, the at least one device under test to perform a control operation corresponding to the touch operation in response to the touch operation on the at least one device under test on the first interface.

Optionally, the test management apparatus further includes an equipment maintenance module, configured to respond to a trigger operation of the equipment maintenance interface, and display the equipment maintenance interface.

Optionally, the device maintenance module is further configured to adjust display positions of a device icon to be tested of the device to be tested on the device maintenance interface and the first interface in response to a position adjustment instruction of the device to be tested on the device maintenance interface.

Optionally, the device maintenance module is further configured to send a control instruction to the test slave in response to a control operation on the device to be tested on the device maintenance interface, where the control instruction includes a device identifier of the device to be tested.

Optionally, the device maintenance module is further configured to send a batch control instruction to the test slave in response to a batch control operation on the multiple devices to be tested at the device maintenance equipment, where the batch control instruction includes: and the equipment identifications of the plurality of equipment to be tested.

Optionally, the test management apparatus further includes: and the device detail module is used for responding to the triggering operation of the device detail interface and displaying the device detail interface, wherein the device detail interface comprises device information.

Optionally, the device detail module is further configured to display a corresponding search result in response to a device search instruction input on the device detail interface, where the device search instruction includes: a keyword of the device information.

Optionally, the device detail module is further configured to display an edited device detail interface in response to an editing operation on the device information at the device detail interface.

Optionally, the device state of the device under test includes: the display module is specifically used for acquiring the equipment to be tested with the equipment state being an offline state, and distinctively displaying the icon of the equipment to be tested corresponding to the equipment to be tested in the first interface.

Optionally, the display module is further configured to respond to the to-be-tested device whose device information meets the preset condition screened on the first interface, and display the device information of the to-be-tested device meeting the preset condition in the first interface.

Optionally, the test management apparatus further includes: the equipment warning module is used for responding to the triggering operation of the equipment warning interface and displaying the equipment warning interface, and the equipment warning interface comprises: the reason of the alarm and the equipment identifier of the equipment to be tested where the alarm occurs.

Optionally, the device alarm module is further configured to respond to an alarm threshold setting operation on the device alarm interface, and display an alarm device list on the device alarm interface according to the alarm threshold and the device information of the device to be tested, where the alarm device list includes a device identifier of at least one device to be tested.

Optionally, the device alarm module is further configured to send an alarm signal to the test slave in response to a trigger operation of the device to be tested in the alarm device list at the device alarm interface, so that the test slave controls the at least one device to be tested to perform a preset alarm operation.

Optionally, the test management apparatus further includes: the equipment real machine module is used for responding to the trigger operation of the equipment real machine interface and displaying the equipment real machine interface, and the equipment real machine interface comprises: the device identification of the device to be tested, the occupation state of the device to be tested and the attribute information of the device to be tested.

Optionally, the equipment real machine module is further configured to display a real machine control interface of the equipment to be tested in response to an equipment occupation operation of the equipment to be tested on the equipment real machine interface, where the real machine control interface includes: the identification of the equipment to be tested and a preset interface of the equipment to be tested.

Optionally, the device real machine module is further configured to switch the device to be tested from an idle state to an occupied state in response to a batch occupation operation on the device real machine interface on the device to be tested, where the batch application operation includes device identifiers of the multiple devices to be tested.

In a third aspect, an embodiment of the present application provides an electronic device, including: the test management method comprises a processor, a storage medium and a bus, wherein the storage medium stores machine-readable instructions executable by the processor, when the electronic device runs, the processor and the storage medium communicate through the bus, and the processor executes the machine-readable instructions to execute the steps of the test management method of the first aspect.

In a fourth aspect, an embodiment of the present application provides a storage medium, where a computer program is stored on the storage medium, and the computer program is executed by a processor to perform the steps of the test management method according to the first aspect.

The beneficial effect of this application is:

in the test management method, the test management apparatus, the electronic device, and the storage medium provided in the embodiments of the present application, the method may be applied to a test host in a test system, where the test system includes: the test system comprises a test host and at least one test slave configured in a slave cabinet, wherein the test host is in communication connection with the at least one test slave, and each test slave is used for mounting at least one device to be tested, and the method can comprise the following steps: receiving device information of the device to be tested sent by a test slave and mounting information of the device to be tested in a slave cabinet, wherein the mounting information comprises: the equipment to be tested comprises an identifier of a slave machine cabinet to which the equipment to be tested belongs, an equipment identifier of the equipment to be tested and a mounting position of the equipment to be tested in the slave machine cabinet; displaying a first interface according to the equipment information and the mounting information, wherein the first interface comprises: the method enables the display position of the equipment to be tested in the first interface in the slave machine cabinet to correspond to the position of the real slave machine cabinet, enables cluster management personnel to quickly position the equipment to be tested in the real slave machine cabinet based on the display position, improves management efficiency and also improves user experience in a test process.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained from the drawings without inventive effort.

Fig. 1 is a schematic structural diagram of a test system according to an embodiment of the present disclosure;

fig. 2 is a schematic flowchart of a test management method according to an embodiment of the present application;

fig. 3 is a schematic flowchart of a test management method according to an embodiment of the present application;

FIG. 4 is a schematic diagram of an equipment maintenance interface provided in an embodiment of the present application;

FIG. 5 is a schematic view of a first interface provided in an embodiment of the present application;

fig. 6 is a schematic flowchart of another test management method according to an embodiment of the present application;

FIG. 7 is a schematic diagram of a device detail interface provided by an embodiment of the present application;

fig. 8 is a schematic flowchart of another test management method according to an embodiment of the present application;

fig. 9 is a schematic flowchart of another test management method according to an embodiment of the present application;

fig. 10 is a schematic diagram of a real-machine interface of a switching device according to an embodiment of the present disclosure;

fig. 11 is a functional block diagram of a test management apparatus according to an embodiment of the present disclosure;

fig. 12 is a functional block diagram of another test management apparatus according to an embodiment of the present disclosure;

fig. 13 is a functional block diagram of another test management apparatus according to an embodiment of the present disclosure;

fig. 14 is a functional block diagram of another test management apparatus according to an embodiment of the present disclosure;

fig. 15 is a schematic structural diagram of an electronic device according to an embodiment of the present application.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. The components of the embodiments of the present application, generally described and illustrated in the figures herein, can be arranged and designed in a wide variety of different configurations.

Thus, the following detailed description of the embodiments of the present application, presented in the accompanying drawings, is not intended to limit the scope of the claimed application, but is merely representative of selected embodiments of the application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.

Before introducing the present application, an application scenario of the present application is described first, and in an existing management scheme of a real machine cluster, it is common to place a device to be tested in a cluster cabinet and display a test interface of the cluster cabinet through a corresponding web page, so as to implement management of the device to be tested. However, in the existing management mode, only the devices to be tested are simply listed on the test interface, so for the cluster management personnel, if a certain device to be tested needs to be searched, the certain device to be tested in the cluster cabinet cannot be quickly positioned, and the management efficiency is low. For example, a processing scenario in which a fault of a certain device to be tested causes a device to be disconnected: because among the current management mode, the administrator can't know which rack the equipment to be tested that will seek through test platform to and concrete in the rack in what position, consequently, if the user finds the back that the equipment falls off, inform the administrator to handle, at this moment, the administrator can only hold equipment brand information, searches for relevant equipment in the cluster rack through the mode of artificial search, and managerial efficiency is lower.

Therefore, the present application provides a test management method, which can improve the management efficiency of management personnel in a test system, and the following description of the present application is provided with reference to specific embodiments.

Fig. 1 is a schematic structural diagram of a test system according to an embodiment of the present disclosure. Fig. 2 is a schematic flowchart of a test management method provided in an embodiment of the present application, where the method may be applied to a test host in a test system, and as shown in fig. 1, the test system may include: the test system comprises a test host 110 and at least one test slave 120 configured in a slave cabinet, wherein the test host 110 is in communication connection with the at least one test slave 120, and each test slave 120 is used for mounting at least one device under test 130, wherein each test slave 120 and the device under test 130 mounted by the test slave 120 may be referred to as an "device cluster unit", and the device under test may be a mobile phone, a tablet computer, a wearable device, and the like.

Optionally, in practical application, the test system may further include a slave cabinet, where a power line and a network cable may be led out from the slave cabinet to connect to the corresponding power module and the network module; the slave machine cabinet can adopt a drawer modular design, the number of the drawers can be 00, 01, 02, 03 and the like from top to bottom, and optionally, a ventilation and heat dissipation system, a switch, an Access Point (AP) preassembly position, an LED lamp strip, a self-locking drawer slide rail, a wiring rack, a shelf and the like can be further arranged in the slave machine cabinet. The test host 110 may be located on a shelf in the slave cabinet, the test slave 120 may be located in the drawer, the test slave 120 may monitor information such as a device state of the device to be tested and a temperature and humidity of the cabinet, and send the monitored related information to the test host 110, so that the information may be displayed through the test host 110. Alternatively, the test slave 120 may not have a separate display panel, so that the manufacturing cost of the test slave 120 may be reduced. Each test slave 120 may correspond to a drawer, for example, the test slave 120 with the product name and the tail number of 00-03 may correspond to the drawers 00-03 of the slave cabinet from top to bottom, but the corresponding relationship is not limited thereto.

The drawers can also be used for placing other control hardware, each drawer can also comprise a front panel, the front panel can be used for placing the equipment to be tested 130 (such as a mobile phone, a tablet personal computer and the like), and the front panel can be further provided with a USB wiring hole. Optionally, a plurality of devices under test (e.g., 8) may be placed on the front panel corresponding to one drawer, so that when a plurality of devices under test 130 are mounted on one test slave 120, a plurality of devices under test 130 may be placed on the front panel. Optionally, drawer handles may be further disposed on two sides of the slave cabinet, so that the drawers can be quickly opened for equipment maintenance, and of course, the shape of the cabinet of the slave cabinet is not limited herein, and may be a rectangular parallelepiped, a cube, or other irregular shape.

It should be noted that, as can be seen from the above arrangement, each test slave 120 may be placed in a corresponding drawer, and each test slave 120 may also be capable of mounting at least one device under test 130, where when mounting a plurality of devices under test 130, the physical placement positions of the plurality of devices under test 130 on the front panel are uncertain (for example, a certain device under test is located at a first position on the front panel at a certain time, and as a test process proceeds, it is possible that a tester moves the device under test, and at this time, the device under test is located at a second position on the front panel), but the existing test platform simply lists the devices under test, that is, the arrangement position of the device under test in the test interface does not correspond to the mode position of the device in the actual slave cabinet, which is not convenient for the cluster manager to manage.

Therefore, in view of this, the present application provides a test management method, which enables a display position of a device to be tested in a slave cabinet in a first interface to correspond to a position in a real slave cabinet, so that a manager can quickly position the device to be tested, and management efficiency is improved. As shown in fig. 2, the test management method may include:

s201, receiving equipment information of the equipment to be tested sent by the testing slave and mounting information of the equipment to be tested in the cabinet of the slave, wherein the mounting information comprises: the equipment to be tested comprises the identifier of the cabinet of the slave machine to which the equipment to be tested belongs, the equipment identifier of the equipment to be tested and the mounting position of the equipment to be tested in the cabinet of the slave machine.

Wherein, the device information of the device under test may include: the device state of the device to be tested, the attribute information of the device to be tested and other device detail information, wherein the device state of the device to be tested can represent whether the device to be tested is mounted on the test slave or not, namely whether the device to be tested is on line or not; the attribute information of the device under test may represent relevant attributes of the device under test, including but not limited to a brand, a model, a serial number, an operating system version, a name of a connected wireless network, an IP address, a battery temperature, a device memory (RAM), a residual memory/total memory (ROM), and the like, but not limited thereto. The identifier of the slave cabinet may be a number of the slave cabinet, such as No. 1, No. 2, No. 3, etc.; the device identifier of the device to be tested may be a production serial number of the device to be tested, for example, may correspond to a character string; the mounting position of the device to be tested in the slave cabinet can represent the physical placement position of the device to be tested in the slave cabinet, and the physical placement position can be represented by horizontal row numbers, vertical column numbers and the like of the slave cabinet.

Alternatively, the mounting position may be represented by a three-dimensional coordinate (x, y, z), and the abscissa x may represent an identifier of a slave cabinet to which the device to be tested belongs, for example, 0 represents a slave cabinet No. 0 (the number is counted from 0); the ordinate y may represent the number of the horizontal row of the device under test in the slave cabinet, for example, 1 represents the 2 nd horizontal row; the vertical coordinate z may represent the vertical column number of the device under test in the slave cabinet, for example, 2 represents the 3 rd vertical column (i.e. left-right order in the horizontal row), and the three-dimensional coordinate (0, 1, 2) represents that the test position of the device under test in the slave cabinet is the 3 rd column of the 2 nd row in the 0 th cabinet.

Based on the thought, each test slave node can be specially named: for example, the node name "xx-xx-0-1" means that the node is a node in row 2 of the slave cabinet with 0 (starting from 0, and 1 being the row 2), so that when the device-related test interface is rendered according to the node name, it can be ensured that the device to be tested in the test interface is rendered in the correct slave cabinet and the position order of the device to be tested in the horizontal row of the slave cabinet is correct.

Further, based on the above naming, the following naming can be performed for each node of the device under test: for example, the node name "xx-xx-0-1-2" means that the node is a node of the 2 nd horizontal row and the 3 rd vertical row of the 0 th slave cabinet, so that on the basis that the position order of the horizontal row of the device to be tested in the slave cabinet is correct, in the corresponding horizontal row, the left and right order of the device to be tested in the slave cabinet is also aligned, and when a related test interface of the device is rendered according to the node name, the device to be tested in the slave cabinet in the test interface can be ensured to correspond to the placement position of the device in the real cabinet.

Of course, the present application is not limited to the communication method between the test master and the test slave, and may perform communication in the form of a message queue. For example, the test slave may encapsulate the node name and a Remote Procedure Call (RPC) service address of the node into a message queue and send the message queue to the test host.

S202, displaying a first interface according to the equipment information and the mounting information; the first interface includes: the equipment comprises an identifier of a slave cabinet, a cabinet graph used for representing the slave cabinet and at least one icon of equipment to be tested used for representing the mounting position of the equipment to be tested in the slave cabinet.

The device information can reflect the detail information of the device, and the mounting information can reflect the mounting position of the device to be tested in the slave cabinet, so that the corresponding icon of the device to be tested can be displayed on the first interface according to the device information of each device to be tested, and the corresponding identifier of the slave cabinet, the cabinet graph of the slave cabinet, and each device to be tested positioned in the correct slave cabinet, the correct horizontal row and the vertical row can be displayed on the first interface according to the mounting information of the device to be tested in the slave cabinet, so that the display position of the device to be tested in the slave cabinet in the first interface can correspond to the position of the device to be tested in the real slave cabinet, cluster management personnel can quickly position the placement position of the device to be tested in the real slave cabinet based on the display position in the first interface, and the management efficiency is improved. Of course, the number of the slave racks in the first interface is not limited in this application, and one or more slave racks may be included according to an actual application scenario, and each slave rack may correspond to an identifier, so that users can distinguish the slave racks.

Optionally, if the test slave is sent in a message queue, the test host may parse the cabinet number, the horizontal row number, and the vertical column number in the message after taking out the message from the message queue each time, for example, when the node name "xx-xx-0-1-2" is parsed, the 2 nd row and 3 rd column of the 0 th cabinet represented by the node are parsed, and the information is stored in the database. When a user accesses the first interface, the equipment to be tested under the node of the 'xx-xx-0-1-2' in the database is rendered into the 2 nd row and the 3 rd row of the 0 cabinet in the first interface, so that the equipment to be tested is rendered into a correct slave cabinet, a correct horizontal row and a correct vertical row.

To sum up, in the test management method provided in the embodiment of the present application, the method is applied to a test host in a test system, and the test system includes: the test system comprises a test host and at least one test slave configured in a slave cabinet, wherein the test host is in communication connection with the at least one test slave, and each test slave is used for mounting at least one device to be tested, and the method can comprise the following steps: receiving device information of the device to be tested sent by a test slave and mounting information of the device to be tested in a slave cabinet, wherein the mounting information comprises: the equipment to be tested comprises an identifier of a slave machine cabinet to which the equipment to be tested belongs, an equipment identifier of the equipment to be tested and a mounting position of the equipment to be tested in the slave machine cabinet; displaying a first interface according to the equipment information and the mounting information, wherein the first interface comprises: the method enables the display position of the equipment to be tested in the first interface in the slave machine cabinet to correspond to the position of the real slave machine cabinet, enables cluster management personnel to quickly position the equipment to be tested in the real slave machine cabinet based on the display position, improves management efficiency and also improves user experience in a test process.

Optionally, the method further includes:

and responding to the touch operation aiming at the at least one device to be tested on the first interface, and controlling the at least one device to be tested to execute the control operation corresponding to the touch operation through the test slave computer.

The first interface can also execute other touch operations on the online device to be tested, the touch operations include but are not limited to shutdown, restart, mute, screen lock, screen lighting, screen removal, detail checking and the like, and in response to the touch operations, the test host can communicate with the test slave through the RPC and control the device to be tested to execute corresponding operations through the test slave.

For example, in the first interface, a user may click any device to be tested, optionally, a corresponding selection control may be displayed on the first interface, and through the selection control, the user may select any touch operation, such as shutdown, restart, mute, screen lock, screen lighting, screen removal, and details viewing, for the device to be tested.

Fig. 3 is a flowchart illustrating a test management method according to an embodiment of the present application. Optionally, in order to facilitate daily maintenance of the device to be tested, as shown in fig. 3, the method further includes:

and S301, responding to the trigger operation of the equipment maintenance interface, and displaying the equipment maintenance interface.

The display position of the equipment to be tested can be adjusted and the equipment can be controlled quickly through the equipment maintenance interface, for example, related operations such as screen control, sound size control, on-off control and the like are controlled, and the method and the device are not limited herein.

For example, in the actual test process, if a tester adjusts the placement position of any device under test in the slave rack, for example, a certain device under test is currently located in row 2 and column 3 of the No. 0 rack, and after adjustment, the tester adjusts the device under test to be located in row 2 and column 5 of the No. 0 rack, then the display position of the device under test may be correspondingly adjusted on the device maintenance interface, where the adjustment manner includes but is not limited to: the display position of the device to be tested is adjusted on the device maintenance interface, and then the adjustment may be synchronized to other interfaces, for example, the first interface, so that the synchronous update of the information may be ensured.

Optionally, the adjustment method may be referred to in the following relevant portions, and the method further includes:

and responding to a position adjusting instruction of the equipment to be tested on the equipment maintenance interface, and adjusting the display positions of the icons of the equipment to be tested on the equipment maintenance interface and the first interface.

The position adjusting instruction can be operations such as dragging and sliding of a certain device to be tested on the device maintenance interface, the test host responds to the position adjusting instruction, the display position of the icon of the device to be tested on the device maintenance interface can be adjusted, the display position of the device to be tested is reset, when the placement position of the device to be tested in the real slave cabinet changes, the display position of the device to be tested in the slave cabinet in the device maintenance interface can still be guaranteed to correspond to the placement position of the device to be tested in the real slave cabinet through the management method provided by the application, and management of cluster management personnel is facilitated.

It should be noted that, the test host records the position of the device to be tested in the database during each adjustment, so that, after the adjustment, the cabinet rendering in the first interface is also updated in real time, and it can be ensured that the display position of the device to be tested in the first interface in the slave cabinet corresponds to the placement position of the device to be tested in the real slave cabinet.

Fig. 4 is a schematic view of an equipment maintenance interface according to an embodiment of the present application. For example, a manager in the equipment maintenance interface may switch the display interfaces of different slave cabinets, for example, when the display position of a certain device to be tested in the slave cabinet 0 needs to be adjusted, the manager may switch to the display interface of the slave cabinet 0, as shown in fig. 4, "airlab-mini-0-00" refers to row 1 of the cabinet 0. Optionally, in the row, a manager may drag a device to be tested from a current position (for example, column 5) to a target position (for example, column 3) for display in a dragging manner, so as to realize exchange of positions of the device to be tested, thereby quickly realizing adjustment of the left and right positions of the device to be tested.

Optionally, the method further includes: and responding to the control operation of the device to be tested on the device maintenance interface, and sending a control instruction to the test slave, wherein the control instruction can comprise the device identification of the device to be tested.

The device maintenance interface can also perform corresponding shortcut control on the device to be tested, and the control modes include but are not limited to "lighting", "muting", "turning down the volume", "turning up the volume", "locking the screen", "shutting down", "restarting", and the like. Of course, it should be noted that, according to an actual application scenario, the power on/off of all the devices to be tested mounted on a certain test slave may also be controlled in units of device cluster units.

Optionally, the device maintenance interface may include at least one shortcut control element such as "mute," "lock screen," "shutdown," "restart," and the like, and when the device maintenance interface controls the device to be tested, the following process may be referred to, for example, an object to be controlled may be selected by clicking, long pressing, and the like on the device maintenance interface, and then the shortcut control element is clicked to trigger a control operation, so that the test master may send a control instruction to the corresponding test slave by RPC call in response to the control operation (for example, shutdown operation), and the control instruction may carry an identifier of the device to be tested, so that the test slave may control the corresponding device to be tested to complete a corresponding operation according to the carried identifier of the device to be tested after receiving the control instruction.

Optionally, the sending a control instruction to the test slave in response to the control operation of the device to be tested on the device maintenance interface includes:

The method includes selecting a plurality of devices to be tested through a screening mode on an equipment maintenance interface, for example, selecting the plurality of devices to be tested for batch operation according to equipment brands, equipment operating systems and the like, or selecting all the devices to be tested in a certain equipment cluster unit or selecting all the devices to be tested in a certain slave cabinet according to a device cluster unit to which the device cluster unit belongs, a slave cabinet to which the device cluster unit belongs and the like to select the devices to be tested in different ranges quickly and flexibly. In addition, after a plurality of devices to be tested for batch operation are determined, for the process of batch control operation, reference may be made to the process of control operation, which is not described herein again.

Optionally, the device information may include at least one of: the device state of the device to be tested, the occupation state of the device to be tested, the attribute information of the device to be tested and the environmental parameters of the device to be tested.

The device state and attribute information of the device to be tested may refer to the related parts described above, and are not described herein again. The occupation state of the equipment to be tested can represent whether the equipment to be tested is occupied or not, if the equipment to be tested is occupied, the occupation state of the equipment to be tested is occupied, otherwise, the equipment to be tested is in an idle state; the environmental parameters of the device to be tested may be used to characterize a testing environment of the device to be tested, including but not limited to temperature, humidity, longitude and latitude, and the like, and may include other device information according to an actual application scenario, which is not limited herein.

After receiving the device information of the device to be tested sent by the test slave, the test master may store the obtained device information in the database, and may subsequently call related data from the database to provide data support for other interfaces (e.g., the first interface and the device maintenance interface).

Fig. 5 is a schematic view of a first interface according to an embodiment of the present disclosure. The first interface is taken as an example for explanation, device information such as device states, environment parameters, attribute information and the like of each device to be tested can be displayed on the first interface, and optionally, for the device states, different colors can be used for representing whether the devices to be tested are online, so that the online condition of the devices to be tested can be clear at a glance; for the environmental parameters, the device temperature is taken as an example for explanation here, and since the device temperature is important for the service life of the device and the performance of the user when using the device, the lowest temperature, the highest temperature, the average temperature and the like of the device to be tested in the slave cabinet can be displayed in a first preset area (for example, the upper left corner) of the first interface, so that a manager can directly check related temperature data, and if the temperature is too high (for example, more than 42 ℃), the corresponding device to be tested can be temporarily stopped (for example, shut down), and the service life of the device can be guaranteed; as shown in fig. 5, for the attribute information, according to a selection condition of the user (for example, when the user mouse is hovering over a certain device under test), device details of the selected device under test may be displayed in a second preset area (for example, a lower left corner) of the first interface, including but not limited to: the brand, model, production serial number, battery temperature, etc. can adjust the content that shows in a flexible way according to the practical application scene, and this application is not restricted here. As shown in fig. 5, optionally, a user may click any device to be tested, optionally, a corresponding selection control may be displayed on the first interface, and through the selection control, the user may select any touch control operation such as shutdown, restart, mute, screen lock, screen lighting, taking down, and detail viewing for the device to be tested.

Fig. 6 is a flowchart illustrating another test management method according to an embodiment of the present application. Fig. 7 is a schematic diagram of a device detail interface provided in an embodiment of the present application. Optionally, as shown in fig. 6, the method further includes:

s601, responding to the trigger operation of the equipment detail interface, and displaying the equipment detail interface, wherein the equipment detail interface comprises equipment information.

Based on the acquisition of the device information of the device to be tested, the embodiment of the application may further provide a device detail interface, as shown in fig. 7, the device detail interface may visually display detailed information of the device to be tested, which may include but is not limited to: the device state, the device operating system, the device brand, the device model, the production serial number, the device manufacturer, the device memory space (ram), the device memory space (rom), the device network card address, the device network IP, the wireless network connection information, the battery temperature, etc. of course, other information may be included according to the actual application scenario, for example, the device CPU model, the device CPU dominant frequency, the device CPU core number, the device CPU architecture, the device network DNS setting, etc., which is not limited herein.

Of course, it should be noted that the device detail interface may also have a screening function, for example, a user may screen the device to be tested belonging to the device brand according to the device brand, which is convenient for screening information and management of a manager.

Optionally, as shown in fig. 6, the method further includes:

s602, responding to a device search instruction input on the device detail interface, and displaying a corresponding search result, wherein the device search instruction comprises: a keyword of the device information.

The keywords of the device information may include, but are not limited to: the device state and part of the information of the attribute information such as the device operating system, the device brand, the device model, the production serial number and the like can be flexibly set according to the actual application scene, and the application is not limited herein. Of course, it should be noted that the device search instruction may be generated by a filtering operation of the user on the device detail interface, or may be generated by a keyword input by the user in a preset search box.

Optionally, in order to facilitate the user to perform some other custom operations on the device information of the device to be tested on the device detail interface, for example, add notes, as shown in fig. 6, the method further includes:

and S603, responding to the editing operation of the equipment information on the equipment detail interface, and displaying the edited equipment detail interface.

The editing operation can be used for adding or deleting extra remarks and deleting equipment items, and various management requirements of management personnel can be met. For example, when a certain device is temporarily off-shelf for maintenance, memo content may be filled in an entry of the device to be tested in the device detail interface, and a special state of the device or a special message may be recorded. For the operation of deleting the device entry, if a certain device to be tested is scrapped and needs to be permanently off-shelf, the deletion operation may be performed on the device to be tested, for example, when the user operates a right key on an icon of the device and clicks a "take-down" button, that is, the device information deletion operation is performed, when the user selects the deletion operation, the corresponding device information entry in the database may be permanently deleted, accordingly, according to the editing operation performed by the user, the current device detail interface may be updated, the edited device detail interface is displayed, and the edited device detail interface and the first interface do not display the corresponding device to be tested any more.

Optionally, the device state of the device under test includes: the displaying a first interface according to the device information and the mounting information includes:

After receiving the device state of the device to be tested sent by the test slave, the test host can perform distinctive display on the device state of the device to be tested displayed in the first interface. For example, the display state of a certain device to be tested on the first interface is offline, for example, the icon of the device to be tested may be displayed in a first color (for example, displayed in red), and after a certain time, the device state of the device to be tested is updated to be online, so that the display state of the device to be tested on the first interface may be adjusted to be online, for example, the icon of the device to be tested may be displayed in a second color (for example, displayed in green), and real-time update of the device state is realized, so that the online condition of the device to be tested in each slave cabinet can be clear at a glance, and online display of the device to be tested is extremely clear.

It should be noted that, of course, the test slave may send the device state of the mounted device to be tested at intervals (for example, 5s), and after receiving the device state of the device to be tested, if the device state is an offline state, the test master may update the device state of the device to be tested on the first interface according to a preset time or a preset number of times of receiving. The display state of the device to be tested in the first interface can be adjusted by taking part in the following processes: if the number 1-8 devices to be tested are hung on a certain test slave machine, 8 devices to be tested are all online during initialization, and only 1-7 devices to be tested are online during the subsequent preset times (for example, 10 times) or preset time (for example, 1 minute) of online information transmission, the number 8 devices to be tested are judged to be offline. And if the No. 1-8 devices to be tested are on line in the device state of the device to be tested sent later, judging that the No. 8 devices to be tested are on line. That is, when the display state of the device to be tested on the first interface is updated according to the device state of the device to be tested, the device needs to wait for several times of online message sending (or preset time) to trigger the device to be disconnected, but the device can be triggered to be on-line only by one-time online device state, so that the on-line condition of the device to be tested can be monitored in real time.

Optionally, the method further includes:

and responding to the equipment to be tested of which the information of the equipment meets the preset conditions on the first interface, and displaying the equipment information of the equipment to be tested meeting the preset conditions on the first interface.

Of course, it should be noted that the first interface may also have a screening function, for example, the user may screen according to the device information such as the device brand and the device system, and may display the device information of the device to be tested meeting the preset condition in the first interface, which is convenient for the administrator to manage. For a specific screening manner, reference may be made to related contents of the foregoing device detail interface, which is not described herein again.

Fig. 8 is a flowchart illustrating another test management method according to an embodiment of the present application. Optionally, as shown in fig. 8, the method further includes:

s701, responding to the trigger operation of the equipment alarm interface, and displaying the equipment alarm interface, wherein the equipment alarm interface comprises: the reason of the alarm and the equipment identifier of the equipment to be tested where the alarm occurs.

The equipment alarm interface can display the identification of the equipment to be tested with the alarm prompt and the alarm reason in the test system, so that a manager can know the alarm reason and determine the equipment to be alarmed through the equipment alarm interface, and subsequent fault analysis and further equipment maintenance are facilitated. Among them, the reason for alarm includes but is not limited to: the wireless network connection is abnormal, the remaining space of the device is insufficient, the temperature of the battery of the device is too high, the continuous power-on time of the device is too long, and the environment of the device is abnormal.

The device environment parameters may be obtained by the test slave, where the obtaining mode may be that the test master obtains data through an RPC request, or that the test slave actively pushes the data, and the present application is not limited herein. For example, the test slave may access a corresponding environment acquisition unit, and acquire the device environment parameters through the environment acquisition unit, where the acquired device environment parameters include but are not limited to: the test slave computer can store the environmental parameters of the equipment into a database after acquiring the environmental parameters of the equipment through the RPC request, and can generate a corresponding monitoring curve according to the stored environmental parameters of the equipment subsequently, so that the equipment can be monitored and managed visually. For example, the equipment alert interface may show the temperature and humidity profile for each slave cabinet over a recent period of time (e.g., one week).

Optionally, different preset alarm thresholds may be corresponded according to different alarm reasons, and the device to be tested may be alarmed when the device to be tested satisfies at least one of the following conditions. For example, when the temperature of the battery of the device is greater than a preset temperature (e.g., 33 degrees), or when the continuous power-on time of the device is greater than a preset duration (e.g., 100 hours), or when the remaining space of the device is less than a preset storage threshold (e.g., 10G), the device to be tested may be alarmed, and the identifier of the device to be tested may be displayed on the device alarm interface. In summary, by applying the embodiment of the application, the display mode of the equipment alarm information can be enriched, timely alarm is provided, and the cluster is ensured to be in a good state all the time.

Optionally, as shown in fig. 8, the method further includes:

s702, responding to the alarm threshold setting operation on the equipment alarm interface, and displaying an alarm equipment list on the equipment alarm interface according to the alarm threshold and the equipment information of the equipment to be tested, wherein the alarm equipment list comprises at least one equipment identifier of the equipment to be tested.

It should be noted that, the alarm threshold is also reset in the device alarm interface according to the actual application scenario, for example, for the device battery temperature, the preset alarm threshold is 33 degrees, then the alarm threshold of the device battery temperature may be adjusted to 25 degrees through the alarm threshold setting operation, optionally, a corresponding alarm device list may also be displayed on the device alarm interface according to the alarm threshold and the device information of the device to be tested, and the alarm device may be visually known through the alarm device list. Of course, it should be noted that the alarm device list may also include other alarm information such as alarm time, alarm frequency, and the like, and the application is not limited herein. In summary, by applying the embodiment of the present application, the alarm threshold of the cluster can be reset according to the actual application scenario, and the alarm requirements under different scenarios can be met.

Optionally, in an actual testing process, if a certain device under test gives an alarm, in order to facilitate a manager to quickly locate a physical position where the device under test is placed in the slave cabinet for performing manual processing, as shown in fig. 8, the method further includes:

s703, responding to the trigger operation of the equipment alarm interface to at least one piece of equipment to be tested in the alarm equipment list, and sending an alarm signal to the test slave machine so as to enable the test slave machine to control at least one piece of equipment to be tested to execute preset alarm operation.

Optionally, if the user clicks the identifier of a certain device to be tested in the alarm device list, the test host may respond to the trigger operation and send a corresponding alarm signal to the test slave to which the device to be tested belongs, so that the test slave may control the corresponding device to be tested to perform a preset alarm operation, for example, may control the corresponding device to be tested to flash in a highlight manner, and thus, the manager may quickly locate the placement position of the device to be tested in the real slave cabinet, thereby improving the management efficiency of the manager. Optionally, in response to the triggering operation, the current device alarm interface may jump to the first interface, the device maintenance interface, and the like, so that a manager may know the position of the device to be tested through the relevant interface.

In addition, it should be noted that the test host may also send related alarm information in the test system to system management personnel at regular time through a mailbox, a short message, communication software, and the like, so as to remind the system management personnel to process the device abnormality alarm and the environment alarm in the cluster in time, thereby ensuring that the devices to be tested in the cluster always operate in a safe and reliable range and each device to be tested maintains an optimal state.

Fig. 9 is a flowchart illustrating another test management method according to an embodiment of the present application. Optionally, as shown in fig. 9, the method further includes:

s801, responding to trigger operation of the equipment real machine interface, and displaying the equipment real machine interface, wherein the equipment real machine interface comprises: the device identification of the device to be tested, the occupation state of the device to be tested and the attribute information of the device to be tested.

The equipment real machine interface can be used for entering a real machine control interface corresponding to the equipment to be tested, and the operation of the real equipment can be executed on the equipment to be tested through the real machine control interface. For example, when the device to be tested is a mobile phone, the real-device interface of the device may display related attribute information such as an identifier, occupation, a model, a brand, an operating system, a memory, and a resolution of at least one mobile phone in the test system, but not limited thereto.

Optionally, as shown in fig. 9, the method further includes:

s802, responding to the equipment occupation operation of the equipment to be tested on the equipment real machine interface, and displaying the real machine control interface of the equipment to be tested, wherein the real machine control interface comprises: the equipment identification of the equipment to be tested and the preset interface of the equipment to be tested.

After entering the device-to-device interface, the occupation state of the device to be tested may be adjusted in the device-to-device interface, for example, if the occupation state of a certain device to be tested is unoccupied (i.e., idle state), the occupation state may be adjusted to the occupation state by the adjustment and enter the device-to-device control interface of the device to be tested, i.e., the device-to-device user interface of the device to be tested, and the device to be tested may be operated by the device-to-be-tested through the device-to-device control interface. The preset interface of the device to be tested may be a main interface of the device to be tested, for example, when the device to be tested is a mobile phone, the preset interface may be a main interface of the mobile phone, but not limited thereto.

For example, a user may interactively execute an operation of a real device through a mouse, and if a focus is on a screen of a device to be tested and a keyboard input is executed, the test host may send an RPC instruction to the corresponding test slave, so as to ensure that the keyboard input of the user is synchronously generated on the device to be tested, so that any operation of the device to be tested, such as opening an application program, performing system setting, and the like, may be implemented through a real machine control interface.

Optionally, when the device to be tested is controlled through the real machine control interface, the device to be tested may also be controlled to install the application program, and the following contents may be referred to in the installation process: the test host can transmit and store the application program to be installed into the test slave, and then the application program is installed on the corresponding device to be tested through the control of the test slave.

Optionally, the method further includes: and responding to the batch occupation operation of the equipment to be tested on the real machine interface of the equipment, switching the equipment to be tested from the idle state to the occupation state, wherein the batch application operation comprises the equipment identifications of the plurality of equipment to be tested.

It should be noted that, in the above-mentioned device real-machine interface, the device to be tested may be screened according to the device identifier, the occupation state, the attribute information (for example, the device brand/model, the operating system), and the like, so as to select the idle device to be tested, after the screening is completed, the screened device to be tested may be occupied in batch, and in response to the batch occupation operation, the device to be tested may be switched from the idle state to the occupation state.

Optionally, after the occupation, the test host may also record the user name of the occupant, and record the occupied device to be tested and the user name of the occupant. Optionally, if a certain device to be tested is set to be in an occupied state, corresponding prompt information may be given on a device real-machine interface, for example, "the device to be tested is occupied, please try again later" or "the device to be tested is occupied, please contact an occupant", and then other users may see the prompt on the device real-machine interface, or may directly see the user name of the occupant, and if a user wants to use a corresponding device, the user may directly find a related occupant to end the device usage.

Of course, it should be noted that the test host may further include other management interfaces, for example, a system management interface, where the system management interface may set user permissions and reset user passwords, and a hypervisor may perform system update.

Wherein, the user authority is divided into 3 grades: common users, managers and super managers, and users in different levels can access different interfaces. The common user can have the access right of the equipment real machine interface; the manager can have the access rights of the first interface, the equipment maintenance interface, the equipment detail interface and the system management interface and the access rights of the equipment resource pool interface; of course, it should be noted that the related management interface may also be presented to the user in the form of a web page, and when the related management interface is presented in the form of a web page, for a super manager, a button for "updating the website version" is additionally displayed on the "system management interface" to implement one-key update of the "web page background logic".

The provision of the device resource pool interface can facilitate users to complete development and test under different scenes. For example, when performing compatibility testing on a device to be tested in some special service scenarios, a large batch of devices to be tested need to be selected to run some automated compatibility testing scripts. In this scenario, the user can apply for the device permission in batch through the device resource pool interface, and perform remote connection of the device.

For example, after the user a applies for the permission of the batch device, the test host may record the occupation information into the database, and the other users may find that the corresponding device to be tested becomes the state occupied by the user a in the "device real machine interface" and "device detail interface". And the user A releases the occupation after finishing the use, and the equipment occupation state on the corresponding interface is recovered to be an idle state and can be used by other users.

Optionally, a one-key update implementation of the "website background logic" may be referred to in the following description, where the "website background logic" of the test host may run in a docker container of the test host, and control the test host to update a mirror container where the test host is located. The mechanism is as follows: the testing host can be provided with a paramiko library, the library can realize remote instruction calling on the server, and a website background module corresponding to the webpage background logic can directly acquire the IP address of the testing host, so as to trigger the paramiko library to execute the updating and restarting instruction of the docker container. After the instruction is executed, a new docker container is started, and the new docker container is a latest 'website background module', so that a function of updating a website by one key is realized on a webpage, and meanwhile, a control module function corresponding to the real machine control interface can be updated (docker chemical deployment is also adopted), so that service deployment and maintenance can be completed by a simple instruction, and user operation is simplified.

Furthermore, it should be noted that the management method may further include: and executing a preset task according to a preset time interval. For example, it may be specified that all devices to be tested are executed at a special time (for example, at 4 am to resume initialization and restart operations, and execute power-off operations of all devices to be tested on weekends every week, and execute power-on operations of devices to be tested on monday morning); through RPC calling, the device cluster unit is controlled to execute power on/off operation, and all the devices to be tested are executed with operations such as recovery initialization/restart, so that the effective service life of the battery of the devices to be tested can be ensured, and the loss of the devices to be tested is reduced.

Fig. 10 is a schematic view of a real machine interface of a switching device according to an embodiment of the present application. As shown in fig. 10, a user may enter the device-to-device interface by clicking a control corresponding to the device-to-device interface in the first interface, so as to facilitate switching by the user, and the switching manner of other interfaces may refer to the switching manner, which is not described herein again.

In summary, the test management method provided by the embodiment of the application can realize daily maintenance and user quick operation of the device cluster, and meanwhile, system maintenance and upgrading are extremely convenient.

Fig. 11 is a functional block diagram of a test management apparatus according to an embodiment of the present disclosure. Be applied to the test host computer in the test system, the test system includes: the basic principle and the technical effects of the device are the same as those of the corresponding method embodiment, and for brief description, the corresponding contents in the method embodiment can be referred to for the parts not mentioned in this embodiment. As shown in fig. 11, the test management apparatus 200 may include: a receiving module 210 and a display module 220.

The receiving module 210 is configured to receive device information of the device to be tested sent by the test slave and mounting information of the device to be tested in the slave cabinet, where the mounting information includes: the equipment to be tested comprises an identifier of a slave machine cabinet to which the equipment to be tested belongs, an equipment identifier of the equipment to be tested and a mounting position of the equipment to be tested in the slave machine cabinet; the display module 220 is configured to display a first interface according to the device information and the mounting information; the first interface includes: the equipment comprises an identifier of a slave cabinet, a cabinet graph used for representing the slave cabinet and at least one icon of equipment to be tested used for representing the mounting position of the equipment to be tested in the slave cabinet.

Optionally, the display module 220 is further configured to control, by the test slave, the at least one device under test to execute a control operation corresponding to the touch operation in response to the touch operation on the at least one device under test on the first interface.

Fig. 12 is a functional block diagram of another test management apparatus according to an embodiment of the present disclosure. Optionally, as shown in fig. 12, the test management apparatus 200 further includes an equipment maintenance module 230, configured to display an equipment maintenance interface in response to a triggering operation of the equipment maintenance interface.

Optionally, the device maintenance module 230 is further configured to adjust display positions of the icon of the device to be tested on the device maintenance interface and the first interface in response to the position adjustment instruction of the device to be tested on the device maintenance interface.

Optionally, the device maintenance module 230 is further configured to send a control instruction to the test slave in response to the control operation on the device to be tested on the device maintenance interface, where the control instruction includes a device identifier of the device to be tested.

Optionally, the device maintenance module 230 is further configured to send a batch control instruction to the test slave in response to a batch control operation on the multiple devices to be tested on the device maintenance interface, where the batch control instruction includes: and the equipment identifications of the plurality of equipment to be tested.

Fig. 13 is a schematic functional block diagram of another test management apparatus according to an embodiment of the present disclosure. Optionally, as shown in fig. 13, the test management apparatus 200 further includes: and a device detail module 250, configured to display a device detail interface in response to a trigger operation of the device detail interface, where the device detail interface includes device information.

Optionally, the device detail module 250 is further configured to display a corresponding search result in response to a device search instruction input in the device detail interface, where the device search instruction includes: a keyword of the device information.

Optionally, the device details module 250 is further configured to display an edited device details interface in response to an editing operation on the device information at the device details interface.

Optionally, the device state of the device under test includes: the display module 220 is specifically configured to obtain the device under test in the offline state, and distinctively display an icon of the device under test corresponding to the device under test in the first interface.

Optionally, the display module 220 is further configured to respond to the to-be-tested device whose device information satisfies the preset condition screened on the first interface, and display the device information of the to-be-tested device that satisfies the preset condition on the first interface.

Optionally, as shown in fig. 13, the test management apparatus 200 further includes: the device alarm module 260 is configured to display a device alarm interface in response to a triggering operation of the device alarm interface, where the device alarm interface includes: the reason of the alarm and the equipment identifier of the equipment to be tested where the alarm occurs.

Optionally, the device alarm module 260 is further configured to respond to an alarm threshold setting operation on the device alarm interface, and display an alarm device list on the device alarm interface according to the alarm threshold and the device information of the device to be tested, where the alarm device list includes a device identifier of at least one device to be tested.

Optionally, the device alarm module 260 is further configured to send an alarm signal to the test slave in response to a trigger operation of the device under test in the alarm device list at the device alarm interface, so that the test slave controls the at least one device under test to perform a preset alarm operation.

Fig. 14 is a functional block diagram of another test management apparatus according to an embodiment of the present disclosure. Optionally, as shown in fig. 14, the test management apparatus 200 further includes: and the equipment real machine module 270 is configured to respond to a trigger operation of the equipment real machine interface and display the equipment real machine interface, where the equipment real machine interface includes: the device identification of the device to be tested, the occupation state of the device to be tested and the attribute information of the device to be tested.

Optionally, the equipment real machine module 270 is further configured to respond to an equipment occupation operation of the equipment to be tested on the equipment real machine interface, and display a real machine control interface of the equipment to be tested, where the real machine control interface includes: the identification of the equipment to be tested and a preset interface of the equipment to be tested.

Optionally, the device real machine module 270 is further configured to switch the device to be tested from an idle state to an occupied state in response to a batch occupation operation on the device real machine interface on the device to be tested, where the batch application operation includes device identifiers of multiple devices to be tested.

The above-mentioned apparatus is used for executing the method provided by the foregoing embodiment, and the implementation principle and technical effect are similar, which are not described herein again.

These above modules may be one or more integrated circuits configured to implement the above methods, such as: one or more Application Specific Integrated Circuits (ASICs), or one or more microprocessors (DSPs), or one or more Field Programmable Gate Arrays (FPGAs), among others. For another example, when one of the above modules is implemented in the form of a processing element scheduler code, the processing element may be a general-purpose processor, such as a Central Processing Unit (CPU) or other processor capable of calling program code. For another example, these modules may be integrated together and implemented in the form of a system-on-a-chip (SOC).

Fig. 15 is a schematic structural diagram of an electronic device according to an embodiment of the present application. As shown in fig. 15, the electronic device may include: a processor 510, a storage medium 520, and a bus 530, the storage medium 520 storing machine-readable instructions executable by the processor 510, the processor 510 communicating with the storage medium 520 via the bus 530 when the electronic device is operating, the processor 510 executing the machine-readable instructions to perform the steps of the above-described method embodiments. The specific implementation and technical effects are similar, and are not described herein again.

Optionally, the present application further provides a storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the computer program performs the steps of the above method embodiments. The specific implementation and technical effects are similar, and are not described herein again.

In the several embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. For example, the above-described apparatus embodiments are merely illustrative, and for example, a division of a unit is merely a logical division, and an actual implementation may have another division, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.

Units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.

In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, or in a form of hardware plus a software functional unit.

The integrated unit implemented in the form of a software functional unit may be stored in a computer readable storage medium. The software functional unit is stored in a storage medium and includes several instructions to enable a computer device (which may be a personal computer, a server, or a network device) or a processor (processor) to execute some steps of the methods according to the embodiments of the present application. And the aforementioned storage medium includes: a U disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.

It is noted that, in this document, relational terms such as "first" and "second," and the like, may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.

The above description is only a preferred embodiment of the present application and is not intended to limit the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application. It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures. The above description is only a preferred embodiment of the present application and is not intended to limit the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A test management method is applied to a test host in a test system, and the test system comprises: the test system comprises a test host and at least one test slave configured in a slave cabinet, wherein the test host is in communication connection with the at least one test slave, and each test slave is used for mounting at least one device to be tested, and the method comprises the following steps:

receiving device information of the device to be tested sent by the test slave and mounting information of the device to be tested in the slave cabinet, wherein the mounting information comprises: the equipment to be tested comprises an identifier of a slave machine cabinet to which the equipment to be tested belongs, an equipment identifier of the equipment to be tested and a mounting position of the equipment to be tested in the slave machine cabinet;

displaying a first interface according to the equipment information and the mounting information; the first interface includes: the equipment to be tested comprises an identifier of the slave equipment cabinet, a cabinet graph used for representing the slave equipment cabinet and at least one icon of the equipment to be tested used for representing the mounting position of the equipment to be tested in the slave equipment cabinet.

2. The method of claim 1, further comprising:

and responding to the touch operation aiming at the at least one device to be tested on the first interface, and controlling the at least one device to be tested to execute the control operation corresponding to the touch operation through the test slave.

3. The method of claim 1, further comprising:

and responding to the triggering operation of the equipment maintenance interface, and displaying the equipment maintenance interface.

4. The method of claim 3, further comprising:

and responding to a position adjusting instruction of the equipment to be tested on the equipment maintenance interface, and adjusting the display positions of the icon of the equipment to be tested on the equipment maintenance interface and the first interface.

5. The method of claim 3, further comprising:

and responding to the control operation of the equipment to be tested on the equipment maintenance interface, and sending a control instruction to the test slave, wherein the control instruction comprises an equipment identifier of the equipment to be tested.

6. The method of claim 5, wherein said sending the control command to the test slave in response to the control operation of the device under test at the device maintenance interface comprises:

responding to batch control operation of the equipment to be tested on the equipment maintenance interface, and sending a batch control instruction to the test slave, wherein the batch control instruction comprises: and the equipment identifiers of the plurality of equipment to be tested.

7. The method according to any of claims 1-6, wherein the device information comprises at least one of: the device state of the device to be tested, the occupation state of the device to be tested, the attribute information of the device to be tested and the environmental parameters of the device to be tested.

8. The method of claim 7, further comprising:

and responding to the triggering operation of the equipment detail interface, and displaying the equipment detail interface, wherein the equipment detail interface comprises the equipment information.

9. The method of claim 8, further comprising:

responding to a device search instruction input on the device detail interface, and displaying a corresponding search result, wherein the device search instruction comprises: a keyword of the device information.

10. The method of claim 8, further comprising:

and responding to the editing operation of the equipment information on the equipment detail interface, and displaying the edited equipment detail interface.

11. The method of claim 7, wherein the device state of the device under test comprises: and displaying a first interface according to the equipment information and the mounting information in an online state and an offline state, wherein the displaying comprises:

12. The method of claim 11, further comprising:

and responding to the equipment to be tested of which the equipment information meets the preset conditions screened on the first interface, and displaying the equipment information of the equipment to be tested meeting the preset conditions in the first interface.

13. The method of claim 7, further comprising:

responding to the triggering operation of the equipment alarm interface, and displaying the equipment alarm interface, wherein the equipment alarm interface comprises: the reason of the alarm and the equipment identifier of the equipment to be tested where the alarm occurs.

14. The method of claim 13, further comprising:

and responding to the alarm threshold setting operation on the equipment alarm interface, and displaying an alarm equipment list on the equipment alarm interface according to the alarm threshold and the equipment information of the equipment to be tested, wherein the alarm equipment list comprises at least one equipment identifier of the equipment to be tested.

15. The method of claim 13, further comprising:

and sending an alarm signal to the test slave in response to the triggering operation of the equipment to be tested in the alarm equipment list on the equipment alarm interface so as to enable the test slave to control at least one piece of equipment to be tested to execute a preset alarm operation.

16. The method of claim 7, further comprising:

responding to the trigger operation of the equipment real-machine interface, and displaying the equipment real-machine interface, wherein the equipment real-machine interface comprises: the device identification of the device to be tested, the occupation state of the device to be tested and the attribute information of the device to be tested.

17. The method of claim 16, further comprising:

responding to the real machine interface of the equipment is right the equipment occupation operation of the equipment to be tested, displaying the real machine control interface of the equipment to be tested, wherein the real machine control interface comprises: the equipment identification of the equipment to be tested and the preset interface of the equipment to be tested.

18. The method of claim 16, further comprising:

responding to the real machine interface of the equipment is multiple to the batch occupation operation of the equipment to be tested, switching the equipment to be tested from an idle state to an occupation state, and applying for the equipment identification of the equipment to be tested in batches.

19. A test management device is applied to a test host in a test system, and the test system comprises: the device comprises a test host and at least one test slave configured in a slave cabinet, wherein the test host is in communication connection with the at least one test slave, and each test slave is used for mounting at least one device to be tested, and the device comprises: the device comprises a receiving module and a display module;

the receiving module is configured to receive device information of the device to be tested sent by the test slave and mount information of the device to be tested in the slave cabinet, where the mount information includes: the equipment to be tested comprises an identifier of a slave machine cabinet to which the equipment to be tested belongs, an equipment identifier of the equipment to be tested and a mounting position of the equipment to be tested in the slave machine cabinet;

the display module is used for displaying a first interface according to the equipment information and the mounting information; the first interface includes: the equipment to be tested comprises an identifier of the slave equipment cabinet, a cabinet graph used for representing the slave equipment cabinet and at least one icon of the equipment to be tested used for representing the mounting position of the equipment to be tested in the slave equipment cabinet.

20. An electronic device, comprising: a processor, a storage medium and a bus, the storage medium storing machine-readable instructions executable by the processor, the processor and the storage medium communicating via the bus when the electronic device is operating, the processor executing the machine-readable instructions to perform the steps of the test management method according to any one of claims 1 to 18.

21. A storage medium having stored thereon a computer program for performing the steps of the test management method according to any one of claims 1 to 18 when executed by a processor.