CN111798917A - Data processing method and device for dynamic test result of single event effect of memory - Google Patents
Data processing method and device for dynamic test result of single event effect of memory Download PDFInfo
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- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
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- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5606—Error catch memory
Abstract
The application discloses a data processing method for dynamic test results of single event effect of a memory, which comprises the following steps: acquiring a dynamic test result of the single event effect of the memory; storing error data in the dynamic test result into a two-dimensional array line by line according to a reading period of the memory, wherein one reading period corresponds to one line in the two-dimensional array; and traversing and checking the elements in the two-dimensional array from the last row according to rows, and deleting the elements which repeatedly appear in each row relative to the last row to obtain a first array. Generally, the data processing method can delete a large amount of error data repeatedly appearing in a dynamic test result of the single event effect of the memory, thereby effectively reducing the data volume of the test result and facilitating the subsequent processing and transmission of the result data.
Description
Technical Field
The application relates to the technical field of single event effect testing of electronic devices, in particular to a data processing method and device for dynamic testing results of single event effect of a memory.
Background
Before being applied to aerospace vehicles, electronic components need to be evaluated and researched in radiation resistance. It is counted that about 70% of the electronic components in the spacecraft are damaged by the Single event effect, and the damage caused by the Single event effect (dynamic) accounts for the largest proportion of the radiation effect. The single event effect refers to that in a space radiation environment, single high-energy particles such as heavy ions, protons, neutrons or alpha particles are incident into a device, interact with internal materials and deposit energy in a sensitive area, so that the device is subjected to transient or permanent functional damage and logic change.
Among electronic components, the use of memory is the most widespread and fundamental. In spacecraft integrated circuits and systems, various memories are required to store instructions and data, and there may be memory where data is transmitted. Therefore, the method has great scientific research significance and economic value for carrying out the anti-irradiation performance test on the memory, particularly the single event effect test.
The single event effect test method of the memory is generally divided into static test and dynamic test.
The static test is to write data into the memory, and then let the device irradiate for a period of time under the irradiation source, after the irradiation is finished, it is usually only necessary to obtain read data once and compare with the write data before irradiation. The changed data is called error data, and the address and the number of the error are counted.
The dynamic test means that data is firstly written into the memory, then the data is read out from the memory for a plurality of times continuously in the irradiation process and compared, and the test system continuously records error data read out each time until the irradiation is finished.
It follows that dynamic testing produces a greater amount of data than static testing. In the actual test process, in order to obtain the test effect of a single particle, the read speed of the memory is required to be as fast as possible, and the read data interval is required to be as short as possible, so that the data volume obtained by the dynamic test is further greatly increased compared with the data generated by the static test.
Disclosure of Invention
Objects of the invention
The technical problem to be solved by the application is to provide a data processing method for a dynamic test result of a single event effect of a memory, which is used for overcoming the problem of overlarge data volume caused by data explosion in the dynamic test process.
(II) technical scheme
In a first aspect, a data processing method for a dynamic test result of a single event effect of a memory provided in an embodiment of the present application includes:
acquiring a dynamic test result of the single event effect of the memory;
storing error data in the dynamic test result into a two-dimensional array line by line according to a reading period of the memory, wherein one reading period corresponds to one line in the two-dimensional array;
and traversing and checking the elements in the two-dimensional array from the last row according to rows, and deleting the elements which repeatedly appear in each row relative to the last row to obtain a first array.
In a second aspect, a data processing apparatus for a dynamic test result of a single event effect of a memory provided in an embodiment of the present application includes:
the test result acquisition module is used for acquiring a dynamic test result of the single event effect of the memory;
the error data storage module is used for storing the error data in the dynamic test result into a two-dimensional array line by line according to the reading period of the memory, and one reading period corresponds to one line in the two-dimensional array;
and the array checking and deleting module is used for performing line-by-line traversal checking on the elements in the two-dimensional array from the last line and deleting the elements which repeatedly appear in each line relative to the last line.
In a third aspect, an electronic device provided in an embodiment of the present application includes a memory and a processor; the memory for storing a computer program; the processor is configured to, when executing the computer program, implement the data processing method according to the first aspect.
In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, where a computer program is stored on the storage medium, and when the computer program is executed by a processor, the data processing method according to the first aspect is implemented.
(III) advantageous effects
The technical scheme has the advantages that the dynamic test result is stored into the two-dimensional array with the determined storage rule according to the reading period of the memory, and the comparison and deletion of the error data of each reading period and the error data of the previous reading period are realized by utilizing the specific data structure of the two-dimensional array, so that the data volume of the dynamic test result is effectively reduced.
Drawings
FIG. 1 is a schematic diagram illustrating data storage of a dynamic test result of a single event effect of a memory according to an embodiment of the present disclosure;
FIG. 2 is a schematic illustration of storing error data in the dynamic test results of FIG. 1;
FIG. 3 is a schematic diagram illustrating data storage of dynamic test results of single event effect of another memory according to an embodiment of the present disclosure;
FIG. 4 is a schematic illustration of storing error data in the dynamic test results of FIG. 3;
FIG. 5 is a schematic diagram of the arrangement of error data shown in FIGS. 2 and 4;
FIG. 6 is a schematic flow chart of a data processing method according to an embodiment of the present application;
FIG. 7 is a schematic flow chart of a further method of step S120 of FIG. 6;
FIG. 8 is a schematic flow chart of a further method of step S121 of FIG. 7;
FIG. 9 is a schematic flow chart of a further method of step S1212 in FIG. 8;
FIG. 10 is a schematic flow chart of a further method of step S125 of FIG. 7;
FIG. 11 is a schematic flow chart of a further method of step S1252 of FIG. 10;
FIG. 12 is a schematic flow chart of a further method in the embodiment of FIG. 6;
FIG. 13 is a block diagram showing a configuration of a data processing apparatus according to an embodiment of the present application;
FIG. 14 is a schematic flow chart diagram illustrating a data processing method according to yet another embodiment of the present application;
FIG. 15 is a schematic flow chart of a further method of step 240 of FIG. 14;
fig. 16 is a schematic flow chart of a further method of the embodiment of fig. 14.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is further described in detail below with reference to the accompanying drawings in combination with the detailed description. It should be understood that the description is intended to be exemplary only, and is not intended to limit the scope of the present application. Moreover, in the following description, descriptions of well-known structures and techniques are omitted so as to not unnecessarily obscure the concepts of the present application.
The embodiments described herein are part of the embodiments described herein, and not all embodiments described herein. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
In the description of the present application, it is noted that the terms "first", "second", and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In addition, the technical features mentioned in the different embodiments of the present application described below may be combined with each other as long as they do not conflict with each other.
Fig. 1 is a schematic data storage diagram of a dynamic test result of a single event effect of a memory according to an embodiment of the present disclosure.
FIG. 2 is a schematic diagram of error data storage in the dynamic test results of FIG. 1.
The memory of the embodiment of fig. 1 and 2 is an FRAM memory, and the FRAM memory corresponds to a target file, wherein each read cycle corresponds to a plurality of sets of target data, i.e., error data, and an end flag.
FIG. 3 is a schematic data storage diagram of a dynamic test result of single event effect of another memory according to the embodiment of the present application.
FIG. 4 is a schematic diagram of storing error data in the dynamic test result of FIG. 3.
The memory in the embodiments of fig. 3 and 4 is a Flash memory, and the target file corresponds to the Flash memory, wherein the target data, i.e. the error data, is stored in another manner, but each read cycle also has an end mark.
It can be seen from fig. 1 and 3 that as the number of read cycles increases, i.e. the duration of the single event effect increases, the amount of target data in the target file and also error data in the read data of the memory increases.
As can be seen from fig. 2 and 4, the target data, i.e., the error data, in the processed target file are approximately equal in number in each week period. That is, in the processed target file, the error data repeatedly appearing in the subsequent read period is deleted through processing, and only the error data actually appearing in the subsequent read period due to the single event effect is retained.
Fig. 5 is a schematic diagram of an arrangement of error data in fig. 2 and 4.
As shown in fig. 5, it embodies the idea of using the two-dimensional list in mathematics to represent the dynamic test result of the memory in the processing method of the present application, i.e. each read operation during the test process is treated as a row list, and the read error data is treated as an element in the row list. The number of rows in the two-dimensional list is the number M of read cycles in the test, and the number of elements in a row list is the number of error data read in that cycle. In some embodiments of the present application, the two-dimensional list is defined as a two-dimensional array commonly used in computer languages.
Fig. 6 is a schematic flowchart of a data processing method in an embodiment of the present application.
As shown in fig. 6, the data processing method for the dynamic test result of the single event effect of the memory includes:
s110: acquiring a dynamic test result of a single event effect of a memory;
s120: storing error data in the dynamic test result into a two-dimensional array line by line according to a reading period of a memory, wherein one reading period corresponds to one line in the two-dimensional array;
s130: and traversing and checking the elements in the two-dimensional array from the last row according to rows, and deleting the elements which repeatedly appear in each row relative to the last row to obtain a first array.
The step S110 of obtaining the dynamic test result of the single event effect of the memory refers to saving the dynamic test result as a target file in the data storage form in fig. 1 or fig. 3.
In step S120, the error data in the dynamic test result is stored as a two-dimensional array line by line according to the read cycle of the memory, which means that the data storage form in the stored target file is converted into a two-dimensional array that is convenient for the subsequent computer comparison and deletion operations.
In step S130, the elements in the two-dimensional array are searched from the last row in a row-by-row traversal manner, and the elements that repeatedly appear in each row relative to the previous row are deleted to obtain a first array, which means that the data structure characteristics of the two-dimensional array are utilized to compare and delete the error data in the next reading cycle and the previous reading cycle, and obtain the first array capable of performing subsequent processing.
Fig. 7 is a schematic flow chart of a further method of step S120 in fig. 6.
As shown in fig. 7, step S120 is a process of specifically generating two-dimensional data for storing all error data in the dynamic test result according to the read cycle, and includes the steps of:
s121: acquiring the read cycle number M of the memory in the dynamic test result;
s122: obtaining the number N of error data of each read cycle of a memoryi，i＝1、2、3…M；
S123: m is NiAssigns a maximum number of to N;
s124: establishing a two-dimensional array with M rows and N columns;
s125: and storing error data in the dynamic test result into a two-dimensional array of M rows and N columns line by line according to the reading period of the memory.
Fig. 8 is a schematic flow chart of a further method of step S121 in fig. 7.
As shown in fig. 8, step S121 is a process of determining the number of read cycles of the dynamic test result, and includes the steps of:
s1211: definition m ═ 0;
s1212: traversing and checking the dynamic test result from the beginning, and automatically adding 1 to the m value when reading the end mark of the reading period of the memory;
s1213: and after the dynamic test result is traversed and checked, assigning the last M value to the read cycle number M.
Fig. 9 is a schematic flow chart of a further method in step S1212 in fig. 8.
As shown in fig. 9, step S1212 is the process of determining the read cycle in step S121, and includes the steps of:
s12121: reading the dynamic test result line by line from the beginning by using a readline () function;
s12122: when the readline () function recognizes the end of read flag, the value of m is automatically incremented by 1.
The readline () function in steps S12121 to S12122 is a function for reading a certain character or a tag in a line in python language, and the number M of read cycles in the dynamic measurement data can be finally determined by the readline () function.
Fig. 10 is a schematic flow chart of a further method of step S125 in fig. 7.
As shown in fig. 10, step S125 is a process of saving error data in the dynamic test result to a two-dimensional array with M rows and N columns, and includes the steps of:
s1251: definition i ═ 1;
s1252: extracting error data in the dynamic test result cycle by cycle according to the reading cycle of the memory, storing all the extracted error data of the ith reading cycle into the ith row of the two-dimensional array of M rows and N columns one by one according to bits, automatically adding 1 to the value of i,
s1253: the above process of extraction and preservation is repeated until i ═ M.
Fig. 11 is a schematic flow chart of a further method of step S1252 in fig. 10.
As shown in fig. 11, step S1252 is a process of extracting error data in each read cycle of the dynamic test result, and includes the steps of:
s12521: extracting all error data in the ith reading cycle by using a find () function, and determining the number Ni of all error data in the ith reading cycle;
s12522: and storing the Ni error data to the ith row of the two-dimensional array of the M rows and the N columns one by one according to bits.
The find () function in step S12521 is a function for finding specific data by comparison in the python language. In this embodiment, the find () function can find out the data that has changed from the original written data in the read data in each read cycle, i.e. the error data.
Fig. 12 is a schematic flow chart of a further method in the embodiment of fig. 6.
As shown in fig. 12, the further method is a process of marking error data inverted during the dynamic test, which includes the steps of:
s140: traversing and checking the elements in the two-dimensional array from the first row downwards according to rows, and deleting the same elements in each row relative to the next row to obtain a second array;
s150: comparing all error data in the second array with all error data in the first array one by one;
s160: the same erroneous data in the first array as in the second array is marked.
The task to be completed in step S140 to step S160 is to find out, in the two-dimensional array, the data that is inverted in the next reading cycle due to the continuous dynamic test, that is, the error data that disappears by converting the error into the correct 0, and store the error data as the second array; the second array is then used to mark the missing error data in the first array.
Finding the lost error data, for example, if the error data in the ith row in the two-dimensional array is (a, b, c, d), and if the error data in the (i + 1) th row is (a, b, c, d, e), it indicates that there is no lost error data in the (i + 1) th row, that is, all the error data in the ith row appear in the (i + 1) th row, at this time, all the error data in the ith row are deleted; if the error data of the (i + 1) th row is (a, b, d, e), it indicates that the error data c of the (i) th row disappears in the (i + 1) th row, or, because of the dynamic effect of the single particle, the data of the corresponding address is recovered to be correct, and the error data c is left after the (i) th row is compared and deleted. And finally, storing the error data left in each row into a second array with a two-dimensional array structure, wherein all elements in the second array are the error data which are inverted in the dynamic test process.
The second array is used to mark the disappeared error data in the first array, for example, the elements in the second array are compared with the elements in the first array one by one, and the same elements in the first array as those in the second array are marked, for example, a negative sign is added before the error data corresponding to the elements, so as to indicate that the error data in the first array is recovered to be correct data in the read data of the memory in the next read cycle, so as to more accurately know the dynamic condition of the single-particle effect in the dynamic measurement process.
The data processing method in each embodiment can have universality for single event effect tests of different types of memories, and in some embodiments, the processing of the single event effect dynamic test results of the different types of memories can be completed only by changing the storage format of the target file of the dynamic measurement results.
Fig. 13 is a block diagram of a data processing apparatus according to an embodiment of the present application.
As shown in fig. 13, the data processing apparatus for dynamic test results of single event effect of memory includes:
the test result acquisition module 01 is used for acquiring a dynamic test result of the single event effect of the memory;
the error data storage module 02 is used for storing the error data in the dynamic test result into a two-dimensional array line by line according to the reading period of the memory, wherein one reading period corresponds to one line in the two-dimensional array;
the array checking and deleting module 03 is configured to traverse and check the elements in the two-dimensional array from the last row by rows, and delete the elements that repeatedly appear in each row relative to the previous row.
Fig. 14 is a flowchart illustrating a data processing method according to another embodiment of the present application.
Fig. 15 is a schematic flow chart of a further method of step 240 of fig. 14.
Fig. 16 is a schematic flow chart of a further method of the embodiment of fig. 14.
As shown in fig. 14, the data processing method for the result of the dynamic test of the effect of the single event in the memory includes:
s210: and opening the test result file according to the specified path.
Defining the path and file name of the test result file (i.e. target file), and opening the target file in a readable mode to allow the content of the file to be read.
S220: the read-out period M in the file is determined.
The read cycle in the recording result, i.e., the number of times of reading from the memory, is denoted as M. M is different in each target file, the longer the test time, the greater the number of cycles M. Firstly, initializing M to be 0, reading data line by line from the first line of the file to the last line by using a readline () function, judging whether each line contains an end mark for marking the completion of a reading period, and if the mark exists, adding one to M. After the traversal of the entire file is complete, the value of M in the file may be determined.
S230: a two-dimensional array all _ data of M rows by N columns is generated for storing all error data.
Fig. 5 is a schematic diagram of an arrangement of error data, which embodies the idea of representing the dynamic test result of the memory by using a two-dimensional list in mathematics in the present application: each read operation during the test is treated as a row list, and the read error data is treated as an element in the row list. The number of rows in the two-dimensional list is the number M of read cycles in the test, and the number of elements in a row list is the number n of error data read in that cycle.
Then, only the target data in the target file needs to be extracted and stored in the list. The difficulty of this step is that it is not known how many read cycles M exist in the file and how many data n will be read out each time before the program is executed. The number of rows and columns cannot be determined when initializing the all _ data number column.
The data of the first test period is stored in the first row list, and if no single event effect occurs in the period, no error data is generated in the memory, so that the list is empty (in practical test application, more and more error data are generated along with accumulation of irradiation time, and no data is generated in the first period generally). And sequentially storing the information of the mth test period into a list of the mth row, wherein if the number of the accumulated data of all the single event effects generated in the period is n, the list of the mth row has n rows of data.
The solution of the step is as follows: the apend () function in Python language can add an element (which could be a string, number or even a list) at the end of the column. Firstly initializing a null number column named all _ data and adding a row of null number columns in the null number column, then extracting data in the first reading cycle, and adding the data to the row of null number column every time one data is extracted. And after the periodic data extraction is finished, adding the next row of empty number array into the all _ data again, and continuously extracting the data of the next period into the row of empty number array, thus circularly knowing that all data extraction is finished.
S240: and extracting data in each period in the target file, and respectively storing the data into the number sequences of different rows of the all _ data number sequence.
As shown in fig. 15, first, it needs to determine whether there is target data in the jth period, and whether there is target data in a certain line of text can be determined by using a find () function in Python language; if data exists in the period, it needs to be judged how many data exist in the period: the text can be sliced from a specific position by using a split () function, and the space of the line is sliced according to the characteristics of the target data in FIG. 1 and divided into n small segments, namely the line has n target data; traversing the n targets, extracting data respectively and adding the data into a j-th row list in all _ data (using an apend () function mentioned in step S230); after the processing of the line of text is finished, reading the next line of text, and continuing the line to judge whether a target character exists; if an end character occurs, the end of the cycle is flagged, the next cycle begins, and j needs to be updated to j + 1. After the entire target file is read, all data in each cycle is added to the all _ data array.
S250: a new sequence ch _ data is generated by the method in step S230 for storing the data after the filtering.
S260: and screening all elements in the all _ data array, and deleting the elements which repeat every period.
All error information in each period is stored in the all _ data sequence obtained in step S240, and here, a large number of elements appear repeatedly. This is because some single event effects cause data errors that are permanent and the presence of such errors is detected every read cycle after the error data is generated. Therefore, in order to determine the data change in one reading cycle, the elements in all _ data need to be screened to obtain the data change situation in each cycle: if which errors are newly added to the cycle and which errors disappear in the cycle.
As shown in fig. 16, first, the parameters m, n, x are initialized; then, judging the m-th row element in all _ data: whether the nth column element within the row list appears in the previous row. If it appears, it is indicated as a duplicate element and the next element is ignored and judged directly. If no element appears indicating that the element is an added element, it is added to the m-th line of the newly created list ch _ data in step 5. Continuing to judge the next element; and then, judging the m-1 line element in the all _ data: whether the xth element in the line list appears in the next line. If it appears, it is a repeated element, the next element is directly ignored and judged, and if it does not appear, it means that the element disappears. To distinguish from the newly added element, an identifier "subtract" is added in front of it, and the whole is added to the mth line of ch _ data. Continuing to judge the next row of elements; and after all elements in the row list are traversed, adding 1 to the cycle number m, and continuously judging the elements in the next cycle until the last row is screened.
S270: the file name and path of the pre-generated file are defined.
After the data is extracted and screened, the data needs to be input into a form file for reading and secondary processing of the data, so that the file name and the path of the file are well defined.
S280: and storing the screened data into the csv file.
Step S360: and writing all data in the ch _ data array into the csv file row by row and saving according to the path and the file name defined in the step 7. The csv file format is stored because the format is similar to the excel file format and is a table file, so that data comparison and secondary processing are facilitated. Fig. 2 and fig. 4 respectively show a schematic diagram of results after FRAM and Flash memory single event effect test data processing, each row of elements is error data or an address which is newly added or reduced in the read cycle, where the extracted elements in fig. 2 are "addresses: data ". The elements extracted in fig. 4 are only addresses. The empty row indicates that the data read in the cycle is the same as the previous cycle and has not changed.
The data processing equipment for the dynamic test result of the single event effect of the memory comprises the memory and a processor; a memory for storing a computer program; a processor for implementing the data processing method of any of the embodiments described above when executing a computer program.
A computer-readable storage medium, on which a computer program is stored, which, when executed by a processor, implements the data processing method of any of the embodiments described above.
As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
It is to be understood that the above-described embodiments of the present application are merely illustrative of or illustrative of the principles of the present application and are not to be construed as limiting the present application. Therefore, any modification, equivalent replacement, improvement and the like made without departing from the spirit and scope of the present application shall be included in the protection scope of the present application. Further, it is intended that the appended claims cover all such changes and modifications that fall within the scope and range of equivalents of the appended claims, or the equivalents of such scope and range.
Claims (10)
1. The data processing method of the dynamic test result of the single event effect of the memory is characterized by comprising the following steps:
acquiring a dynamic test result of the single event effect of the memory;
storing error data in the dynamic test result into a two-dimensional array line by line according to a reading period of the memory, wherein one reading period corresponds to one line in the two-dimensional array;
and traversing and checking the elements in the two-dimensional array from the last row according to rows, and deleting the elements which repeatedly appear in each row relative to the last row to obtain a first array.
2. The data processing method according to claim 1, wherein the saving the error data in the dynamic test result as a two-dimensional array row by row according to the read cycle of the memory comprises:
acquiring the read cycle number M of the memory in the dynamic test result;
obtaining the number N of error data of each reading period of the memoryi，i＝1、2、3…M；
M is NiAssigns a maximum number of to N;
establishing a two-dimensional array with M rows and N columns;
and storing the error data in the dynamic test result into the two-dimensional array of the M rows and the N columns line by line according to the reading period of the memory.
3. The data processing method of claim 2, wherein the determining the number M of read cycles of the memory in the dynamic test result comprises:
definition m ═ 0;
traversing and checking the dynamic test result from the beginning, and automatically adding 1 to the m value when reading the end mark of the reading period of the memory;
and after the dynamic test result is traversed and checked, assigning the last M value to the read cycle number M.
4. The data processing method according to claim 3, wherein the performing a de novo traversal of the dynamic test results, and when reading the end flag of the read cycle of the memory, automatically adding 1 to the m value comprises:
reading the dynamic test result line by line from the beginning by utilizing a readline () function;
when the readline () function reads the end flag, the value of m is automatically incremented by 1.
5. The data processing method according to claim 2, wherein the saving error data in the dynamic test result to the two-dimensional array of M rows and N columns row by row according to the read cycle of the memory comprises:
definition i ═ 1;
extracting error data in the dynamic test result cycle by cycle according to the reading cycle of the memory, storing all the extracted error data of the ith reading cycle to the ith row of the two-dimensional array of the M rows and the N columns one by one according to bits, automatically adding 1 to the value of i,
the above process of extraction and preservation is repeated until i ═ M.
6. The data processing method according to claim 5, wherein the scanning and extracting the error data in the dynamic test result cycle by cycle according to the read cycle of the memory, and storing all the extracted error data of the ith read cycle to the ith row of the two-dimensional array of the M rows and the N columns one by one according to bits comprises:
extracting all the error data in the ith reading cycle by using a find () function, and determining the number N of all the error data in the ith reading cyclei；
Will NiAnd storing the error data to the ith row of the two-dimensional array of the M rows and the N columns one by one according to bits.
7. The data processing method of claim 1, further comprising:
traversing and checking the elements in the two-dimensional array from the first row downwards according to rows, and deleting the same elements in each row relative to the next row to obtain a second array;
comparing all the error data in the second array with all the error data in the first array one by one;
marking the same error data in the first array as in the second array.
8. The data processing device of the dynamic test result of the single event effect of the memory is characterized by comprising the following components:
the test result acquisition module is used for acquiring a dynamic test result of the single event effect of the memory;
the error data storage module is used for storing the error data in the dynamic test result into a two-dimensional array line by line according to the reading period of the memory, and one reading period corresponds to one line in the two-dimensional array;
and the array checking and deleting module is used for performing line-by-line traversal checking on the elements in the two-dimensional array from the last line and deleting the elements which repeatedly appear in each line relative to the last line.
9. An electronic device comprising a memory and a processor; the memory for storing a computer program; the processor, when executing the computer program, for implementing the data processing method of any of claims 1-8.
10. Computer-readable storage medium, characterized in that the storage medium has stored thereon a computer program which, when being executed by a processor, carries out the data processing method according to any one of claims 1-8.
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