CN111781445B - System and method for testing radiation total dose and electromagnetic interference synergistic damage effect - Google Patents
System and method for testing radiation total dose and electromagnetic interference synergistic damage effect Download PDFInfo
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- CN111781445B CN111781445B CN202010575638.3A CN202010575638A CN111781445B CN 111781445 B CN111781445 B CN 111781445B CN 202010575638 A CN202010575638 A CN 202010575638A CN 111781445 B CN111781445 B CN 111781445B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
- G01R29/0857—Dosimetry, i.e. measuring the time integral of radiation intensity; Level warning devices for personal safety use
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Abstract
The invention discloses a system and a method for testing total irradiation dose and electromagnetic interference synergistic damage effect, wherein the system comprises a radio frequency signal source, a radio frequency power divider, a constant voltage source, a semiconductor parameter tester, a matrix switch, an upper computer, an irradiation test board and a test sample board; the radio frequency signal source provides electromagnetic interference signals with any frequency and amplitude, and the electromagnetic interference signals are injected into a plurality of test samples through the one-to-many radio frequency power divider; the constant voltage source provides bias voltage for the test sample through the semiconductor parameter tester; the semiconductor parameter tester can be simultaneously connected with a plurality of test samples through the matrix switch and set different bias states for the test samples; controlling a semiconductor parameter tester through an upper computer program, setting different testing tasks and setting different parameters for a testing sample, and completing parameter testing; the test sample is fixed on an irradiation test board and placed under the irradiation of particles; therefore, the damage effect test of the irradiation total dose and the electromagnetic interference synergy is realized.
Description
Technical Field
The invention belongs to the technical field of radiation effect research and test measurement, and particularly relates to a system and a method for testing a damage effect by combining total irradiation dose and electromagnetic interference.
Background
In space and other extreme environment applications, particle ionizing radiation damage and environmental electromagnetic interference are two important factors causing performance degradation and even failure of electronic components. Protons, electrons, neutrons, photons and the like can cause instantaneous or permanent damage to electronic components, and the main damage types are three: ionization effects, displacement damage and single event effects. Electromagnetic interference can enter the system through the coupling of a front door (an antenna, a sensor and the like) or a rear door (a hole, a gap and the like), and induced current is generated in an electronic system, so that disturbance and even damage effects are generated on sensitive circuits of the system, and the system generates transient interference and permanent failure. The radiation damage and electromagnetic interference synergistic effect formed by radiation particles in space and man-made radiation environments can cause the key performance parameter indexes of electronic elements to be more seriously degraded than the key performance parameter indexes generated by simple particle radiation or electromagnetic interference, so that the development of experimental research on the mechanism of the ionizing radiation total dose (TID) and electromagnetic interference synergistic damage effect of a typical process transistor has important significance, and a related technical basis can be provided for evaluating the reliability of the transistor working in space and other polar environments and the protection optimization design of the transistor working in space and other polar environments.
The current radiation effect test system is designed only for the pure radiation effect, and does not consider the synergistic effect of electromagnetic interference. These test systems tend to test only a particular type of device and have a limited number and variety of samples that can be tested simultaneously.
Disclosure of Invention
In order to solve the technical problems in the background art, the invention provides a system and a method for testing the combined damage effect of total irradiation dose and electromagnetic interference, which realize the test of the combined damage effect of the total irradiation dose and the electromagnetic interference.
In order to achieve the purpose, the invention adopts the following technical scheme:
a damage effect testing system with irradiation total dose and electromagnetic interference cooperation comprises a radio frequency signal source, a radio frequency power divider, a constant voltage source, a semiconductor parameter tester, a matrix switch, an upper computer, an irradiation testing board and a testing sample; the test sample is fixed on the irradiation test board; the irradiation test board is arranged in the irradiation test room; the test sample is connected with the semiconductor parameter tester through the matrix switch; the matrix switch is controlled by the upper computer to carry out signal connection switching; the constant voltage source provides bias voltage for the test sample through the semiconductor parameter tester; the semiconductor parameter tester completes a parameter testing task under the control of the upper computer; the radio frequency signal source provides an electromagnetic interference signal for the test sample; the radio frequency power divider equally divides one path of electromagnetic interference signal into multiple paths of signals for a plurality of test samples.
The semiconductor parameter tester can complete on-line parameter testing.
The radio frequency signal source can generate signals with any frequency, any amplitude and any waveform.
The radio frequency power divider is a one-to-n power divider, and n is selected according to the number of the test samples.
The matrix switch needs to select the corresponding channel number according to the number of the test samples.
The test sample is provided with an injection port reserved for electromagnetic interference signals.
The test method of the radiation total dose and electromagnetic interference synergistic damage effect test system comprises the following steps:
1) connecting all test samples with a semiconductor parameter tester through a matrix switch; setting different parameters for each channel of the semiconductor parameter tester through an upper computer; enabling the test sample to work in different states required by the experiment;
2) setting different test tasks in an upper computer according to test requirements to form a test task list;
3) generating an electromagnetic interference signal with required signal frequency and signal amplitude by a radio frequency signal source; selecting the type of the radio frequency power divider and the number of the radio frequency signal sources according to the number of the test samples, and finally generating electromagnetic interference signals with the number equal to that of the test samples; injecting an electromagnetic interference signal into the test sample through the radio frequency cable;
4) placing a test sample in an irradiation test room for irradiation; when the total irradiation dose reaches the required dose point, controlling the semiconductor parameter tester by the upper computer to complete parameter testing according to the testing task list;
5) and repeating the step 4) until parameter testing of all irradiation dose points is completed.
The testing method can simultaneously measure a plurality of test samples, set the test samples in different working states and contrastively analyze the influence of the working states on the damage effect of the test samples.
The invention has the advantages that:
1) the method can complete the research of the combined damage effect of the total dose of the semiconductor device test sample and the electromagnetic interference, and can set a control group sample without electromagnetic interference signals and irradiation, so that the comparison of the three effects can be realized by one-time test.
2) The device can simultaneously measure a plurality of test samples, can set the test samples into different working states, and contrastively analyzes the influence of the working states on the damage effect of the test samples.
Drawings
FIG. 1 is a block diagram of the system of the present invention.
Detailed Description
For a better understanding of the present invention, reference will now be made in detail to the present invention as illustrated in the accompanying drawings.
And the test system hardware module performs model selection according to the index requirements in the aspects of specific speed, precision and channel number. As shown in fig. 1, the hardware of the testing system adopted in the present invention includes a radio frequency signal source, a radio frequency power divider, a constant voltage source, a semiconductor parameter tester, a matrix switch, an upper computer, an irradiation testing board, and a testing sample.
The semiconductor parameter tester completes parameter testing tasks under the control of an upper computer, and needs to complete different channel voltage settings, parameter scanning settings and the like.
As shown in fig. 1, the matrix switch performs signal connection switching under the control of an upper computer to complete parameter testing of each test sample; the constant voltage source provides bias voltage for the test sample through the semiconductor parameter tester; fixing a test sample on an irradiation test board, wherein an electromagnetic interference signal injection port needs to be reserved, and the irradiation test board is placed in an irradiation room; the test sample is connected with the semiconductor parameter tester through the matrix switch; the radio frequency signal source provides an electromagnetic interference signal for the test sample; the radio frequency power divider can equally divide one path of electromagnetic interference signal into multiple paths of signals for a plurality of test samples;
the test method of the system comprises the following concrete implementation steps:
1) connecting all test samples with a semiconductor parameter tester through a matrix switch; setting different parameters for each channel of the semiconductor parameter tester through an upper computer; enabling the test sample to work in different states required by the experiment;
2) setting different test tasks in an upper computer according to test requirements to form a test task list;
3) generating an electromagnetic interference signal with required signal frequency and signal amplitude by a radio frequency signal source; selecting the type of the radio frequency power divider and the number of the radio frequency signal sources according to the number of the test samples, and finally generating electromagnetic interference signals with the number equal to that of the test samples; injecting an electromagnetic interference signal into the test sample through the radio frequency cable;
4) placing a test sample in an irradiation test room for irradiation; when the total irradiation dose reaches the required dose point, controlling the semiconductor parameter tester by the upper computer to complete parameter testing according to the testing task list;
5) and repeating the step 4) until parameter testing of all irradiation dose points is completed.
Claims (7)
1. A test method of a damage effect test system combining total irradiation dose and electromagnetic interference is disclosed, the test system comprises a radio frequency signal source, a radio frequency power divider, a constant voltage source, a semiconductor parameter tester, a matrix switch, an upper computer, an irradiation test board and a test sample; the test sample is fixed on the irradiation test board; the irradiation test board is arranged in the irradiation test room; the test sample is connected with the semiconductor parameter tester through the matrix switch; the matrix switch is controlled by the upper computer to carry out signal connection switching; the constant voltage source provides bias voltage for the test sample through the semiconductor parameter tester; the semiconductor parameter tester completes a parameter testing task under the control of the upper computer; the radio frequency signal source provides an electromagnetic interference signal for the test sample; the radio frequency power divider equally divides one path of electromagnetic interference signal into multiple paths of signals for a plurality of test samples;
the method is characterized in that: the test method comprises the following steps:
1) connecting all test samples with a semiconductor parameter tester through a matrix switch; setting different parameters for each channel of the semiconductor parameter tester through an upper computer; enabling the test sample to work in different states required by the experiment;
2) setting different test tasks in an upper computer according to test requirements to form a test task list;
3) generating an electromagnetic interference signal with required signal frequency and signal amplitude by a radio frequency signal source; selecting the type of the radio frequency power divider and the number of the radio frequency signal sources according to the number of the test samples, and finally generating electromagnetic interference signals with the number equal to that of the test samples; injecting an electromagnetic interference signal into the test sample through the radio frequency cable;
4) placing a test sample in an irradiation test room for irradiation; when the total irradiation dose reaches the required dose point, controlling the semiconductor parameter tester by the upper computer to complete parameter testing according to the testing task list;
5) and repeating the step 4) until parameter testing of all irradiation dose points is completed.
2. The method for testing the damage effect testing system of the total irradiation dose and the electromagnetic interference cooperation according to claim 1, wherein the method comprises the following steps: the semiconductor parameter tester can complete on-line parameter testing.
3. The method for testing the damage effect testing system of the total irradiation dose and the electromagnetic interference cooperation according to claim 1, wherein the method comprises the following steps: the radio frequency signal source can generate signals with any frequency, any amplitude and any waveform.
4. The method for testing the damage effect testing system of the total irradiation dose and the electromagnetic interference cooperation according to claim 1, wherein the method comprises the following steps: the radio frequency power divider is a one-to-n power divider, and n is selected according to the number of the test samples.
5. The method for testing the damage effect testing system of the total irradiation dose and the electromagnetic interference cooperation according to claim 1, wherein the method comprises the following steps: the matrix switch needs to select the corresponding channel number according to the number of the test samples.
6. The method for testing the damage effect testing system of the total radiation dose and the electromagnetic interference combination according to claim 1, wherein: the test sample is provided with an injection port reserved for electromagnetic interference signals.
7. The method for testing the damage effect testing system of the total irradiation dose and the electromagnetic interference cooperation according to claim 1, wherein the method comprises the following steps: the device can simultaneously measure a plurality of test samples, set the test samples into different working states, and contrastively analyze the influence of the working states on the damage effect of the test samples.
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| CN112349339B (en) * | 2020-11-09 | 2023-07-28 | 中国工程物理研究院电子工程研究所 | System and method for remote dynamic test of instantaneous ionizing radiation effect of memory |
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