CN202256609U - Circuit testing device of micro telecom computing architecture - Google Patents

Circuit testing device of micro telecom computing architecture Download PDF

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Publication number
CN202256609U
CN202256609U CN2011203872028U CN201120387202U CN202256609U CN 202256609 U CN202256609 U CN 202256609U CN 2011203872028 U CN2011203872028 U CN 2011203872028U CN 201120387202 U CN201120387202 U CN 201120387202U CN 202256609 U CN202256609 U CN 202256609U
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amc
mch
simulation
link
advanced
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蒋政
曾维
周世欣
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Comba Network Systems Co Ltd
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Comba Telecom Systems China Ltd
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Abstract

The utility model discloses a circuit testing device of a micro telecom computing architecture. According to the utility model, a master control board and/or an advanced daughter card of the micro telecom computing architecture are/is vertically inserted in an external slot of the circuit testing device; the advanced daughter card and/or the master control board are/is simulated by utilizing the circuit testing device; a link circuit is respectively established between the simulated advanced daughter card and/or the master control board and the currently inserted master control board and/or the advanced daughter card to ensure that the functional test can be conveniently carried out on the inserted master control board and/or the advanced daughter card; the external slot of the circuit testing device is not separated by a case, therefore, the signal integrity test can be conveniently carried out on the inserted master control board and/or the advanced daughter card by utilizing a signal tester; the advanced daughter card is not needed to be inserted or pulled out repeatedly, therefore, the problem that the golden finger reliability of the advanced daughter card is decreased is avoided; and a mass of advanced daughter cards are not needed to be simultaneously inserted, therefore, the test process is simplified.

Description

A kind of circuit test device of little telecommunications computing framework
Technical field
The utility model relates to little telecommunications computing framework field, relates in particular to a kind of circuit test device of little telecommunications computing framework.
Background technology
Little telecommunications computing framework (Micro Telecommunications Computing Architecture; MicroTCA) be PCI industrial computer manufacturing tissue (PCI Industrial Computers Manufacturesgroup; PICMG) (Advanced Telecom ComputingArchitecture proposes on basis ATCA) at advanced telecom computing framework.Micro TCA the is compatible high-performance of ATCA, high bandwidth and advanced subcard (Advanced Mezzanine Card; AMC) dirigibility; When creating high integrated level; Greatly reduce cost, reduced system space and scale, can be good at satisfying the application demand in fields such as low and middle-end communication, industry, military affairs, medical treatment and multimedia.
A typical Micro TCA system comprises: and 12 AMC, 1 or 2 master control borad (Micro TCACarrier Hub, MCH), modules such as interconnection backboard and power supply, heat radiation.Micro TCA system supports the integrated circuit board of all four kinds of specifications of AMC, and wherein MCH is as the important component part of Micro TCA system, and its function class is used for holding the AMC module, and can carries out 12 interconnection and management between the AMC module simultaneously like support plate.As shown in Figure 1, be Micro TCA system schematic in the prior art, as can be seen from Figure 1, inserted on the cabinet backboard of this Micro TCA system 12 AMC, 2 MCH, 2 power modules (Power Module, PM) and fan.
Since 12 AMC of each MCH management, therefore, interfaces such as the IPMB among the MCH, fabric interface; Set up link respectively and between the corresponding interface of 12 AMC; Be that each interface all will carry 12 links among the MCH, therefore, in the circuit test of existing Micro TCA; When 12 links of each interface that will test MCH whether just often, can adopt following dual mode:
First kind of mode: an AMC is inserted 12 different groove positions on the cabinet backboard successively, and during AMC of every insertion, whether the link that can test between the AMC of MCH and this insertion is normal, and whether 12 links on each interface that tests out MCH are normal.As: all just often whether 12 links between the fabricinterface that will test MCH and 12 AMC; Can an AMC be inserted first groove position that is used for inserting AMC on the cabinet backboard; Then, whether after setting up link between the fabric interface of the AMC of the fabric of MCH interface and current insertion, it is normal to test this link; Whether by that analogy, come to test respectively all the other 11 links that the fabric interface of MCH carries normal.
The second way: all plug AMC being used on the cabinet backboard inserting on 12 groove positions of AMC, whether 12 links between arbitrary interface of test MCH and 12 AMC are normal.As: all just often whether 12 links between the fabric interface that will test MCH and 12 AMC; Can 12 AMC be inserted in the groove position of cabinet backboard; Whether after the fabric interface of the fabric of MCH interface and 12 AMC sets up link, it is normal to test these 12 links simultaneously.
In the above-mentioned process that MCH in the Micro TCA system and the link between the AMC are tested; (area is less because MCH and AMC belong to the high-speed and high-density plate; Need the numerous high speed signal of transmission), and signal integrity (Signal Integrity, height SI) is very obvious to the influence of signal transmission quality in the link; Therefore, the signal of MCH and AMC being carried out measuring signal integrality is very important.
Said signal integrity is meant the transmission quality of signal in link, and for example, signal has the good signal integrality and is meant when at needs the time, signal have the voltage level numerical value, less time-delay, more weak signal bias that must reach etc.
At present, can adopt signal testers such as high-speed oscilloscope to come signal integrity is tested, can reflect the relevant parameter of signal integrity intuitively, comprise reflection, vibration, bullet and crosstalking etc.In above-mentioned any one test mode, can use signal testers such as high-speed oscilloscope that the AMC and the signal integrity of MCH that are inserted on the cabinet backboard are tested.
But; When MCH and AMC being carried out measuring signal integrality and AMC and MCH are carried out functional test; If adopt above-mentioned first kind of mode, AMC is inserted 12 different slots positions successively test, because the plug number of times of golden finger in the groove position of AMC is too much; Possibly cause the golden finger reliability decrease of this AMC, thereby cause final test result to be inaccurate; And if adopt the above-mentioned second way, 12 AMC are inserted 12 different groove positions when testing simultaneously because the quantity of each AMC that inserts is too much, can cause test process complicated again, test execution is inconvenient.
On the other hand, when MCH and AMC are carried out measuring signal integrality, need carry out complete detection to the pros and cons of MCH and AMC.Because AMC and MCH are inserted on the cabinet backboard, exist the obstruct of cabinet, make test operation very difficult.Even unload the lower case baffle plate, to arrange closely owing to be inserted between MCH and a plurality of AMC on the cabinet backboard, gap between them is little, uses signal tester to carry out also unusual difficulty and inconvenient of test operation.
The utility model content
The utility model embodiment provides a kind of circuit test device of little telecommunications computing framework, has solved the problem that can't test the function of MCH and AMC effectively, easily that exists in the prior art.
A kind of circuit test device of little telecommunications computing framework comprises:
Be used to insert the master control borad slot and the advanced subcard slot that is used to insert advanced subcard AMC of master control borad MCH;
Simulation PM unit, the AMC that is used to the MCH that inserts the master control borad slot and inserts advanced subcard slot provides power supply, and the notifier processes unit;
Processing unit is used for the notice according to simulation PM unit, and when confirming current insertions MCH, the simulation AMC and the MCH of insertion set up the link that is used to test, and when confirming current insertion AMC, simulates the link that the AMC foundation of MCH and insertion is used to test.
The beneficial effect of the utility model is:
The utility model embodiment provides a kind of circuit test device of little telecommunications computing framework; Through master control borad and/or the vertical external slot of said circuit test device that inserts of advanced subcard with little telecommunications computing framework; And utilize said circuit test device to simulate advanced subcard and/or master control borad; Advanced subcard and/or master control borad through simulation are set up link respectively and between the master control borad of current insertion and/or the advanced subcard, can carry out functional test to master control borad and/or the advanced subcard that inserts easily, because the external slot of this circuit test device does not have the obstruct of cabinet; Therefore; Can use signal tester that master control borad and/or the advanced subcard that inserts slot carried out measuring signal integrality easily, and need not repeatedly to plug advanced subcard, avoid the problem of the golden finger reliability decrease of advanced subcard; And need not to insert a large amount of advanced subcards simultaneously, thereby simplified test process.
Description of drawings
Shown in Figure 1 is the system schematic of little telecommunications computing framework in the prior art;
Shown in Figure 2 is the structural representation of the circuit test device of little telecommunications computing framework among the utility model embodiment one;
Shown in Figure 3 is the process flow diagram of the circuit test device of the little telecommunications computing framework of operation among the utility model embodiment two.
Embodiment
The utility model embodiment provides a kind of circuit test device of little telecommunications computing framework; Through MCH and/or the external slot of the vertical said circuit test device of insertion of AMC, and utilize said circuit test device to simulate AMC and/or MCH, set up link respectively and between the MCH of current insertion and/or the AMC through AMC and/or the MCH that simulates with Micro TCA; Can carry out functional test to MCH and/or the AMC that inserts slot easily; Because the external slot of this circuit test device does not have the obstruct of cabinet, therefore, can use signal tester that MCH and/or the AMC that inserts slot carried out measuring signal integrality easily; And need not repeatedly to plug AMC; Avoid the problem of the golden finger reliability decrease of AMC, and need not to insert simultaneously a large amount of AMC and test MCH, thereby simplified test process.
Below in conjunction with Figure of description the utility model embodiment is done explanation further, but the utility model is not limited to following embodiment.
Embodiment one:
As shown in Figure 2; Be the circuit test device structural representation of little telecommunications computing framework among the utility model embodiment one, said Micro TCA circuit test device comprises: at least one master control borad slot 11, at least one advanced subcard slot 12, simulation PM unit 13, crosspoint 14, processing unit 15 and host computer interface 16.
Said master control borad slot 11 is used for inserting and fixing MCH, and said advanced subcard slot 12 is used for inserting and fixing AMC, and particularly, said master control borad slot 11 is the standard gold finger slot according to little telecommunication specification definition with advanced subcard slot 12.
More excellent ground; Said master control borad slot 11 can be set to horizontal parallel arranged with advanced subcard slot 12; Make master control borad slot 11 and advanced subcard slot 12 not intercept mutually each other, convenient test can effectively improve the test accuracy of the measuring signal integrality that MCH and AMC are carried out.Certainly, among the utility model embodiment, master control borad slot 11 is not limited to this a kind of arrangement mode with advanced subcard slot 12.
Simulation PM unit 13 is used to the MCH that inserts master control borad slot 11 provides power supply, and for the AMC that inserts advanced subcard slot 12 provides power supply, and notifier processes unit 15.Particularly, simulation PM unit is used for when advanced subcard slot 12 inserts AMC, notifier processes unit 15, and when receiving the triggering of processing unit 15, for the AMC that inserts provides power supply.
Crosspoint 14 is used for the request for building link that the interface with the MCH of current insertion and/or AMC sends and converges to processing unit 15; And the response message that processing unit 15 returns sent to corresponding interface; That is to say; When crosspoint 14 is used between the AMC of the MCH that inserts and/or AMC and processing unit 15 simulations and/or MCH, setting up link, carry out the transmission of link signal.Particularly; Said crosspoint 14 is used for when inserting MCH; With each interface of MCH (like IPMB; Fabric interface etc.) and between the AMC of processing unit 15 simulation set up link, that is, make to communicate between the AMC of passage and processing unit 15 simulations in 12 passages (respectively corresponding 12 passages of each interface of MCH) of each interface of the MCH that opens successively; And when inserting AMC; Set up link between the MCH with each interface (like IPMB, fabric interface etc.) of AMC and processing unit 15 simulations, promptly make to communicate between the MCH of passage and processing unit 15 simulations in the two passes (comprising active and standby two passes) of each interface of the AMC that opens successively.
Processing unit 15 is used for the notice according to simulation PM unit 13, and when confirming current insertions MCH, the simulation AMC and the MCH of insertion set up the link that is used to test, and when confirming current insertion AMC, simulates the link that the AMC foundation of MCH and insertion is used to test.
Particularly, processing unit 15 is used for when receiving the notice of simulation PM unit 13, and simulation MCH triggers simulation PM unit 13 for the AMC that inserts provides power supply, and utilizes the MCH of simulation and the AMC of insertion to set up link.
Particularly; Processing unit 15 can be simulated AMC and/or MCH through the mode of virtual machine; Processing unit 15 simulation AMC and/or MCH are meant: various signals and the function of simulation AMC and/or MCH, make for MCH that inserts and/or AMC, and be equivalent to set up link with real AMC and/or MCH.
Particularly; Said processing unit 15 can comprise MCH analog submodule unit 151 and AMC analog submodule unit 152; Wherein: MCH analog submodule unit 151 is used in when inserting AMC; Set up the link that is used to test between the AMC of simulation MCH and current insertion, at this moment, processing unit 15 gets into simulation MCH pattern; AMC analog submodule unit 152 is used in when inserting MCH, sets up the link that is used to test between the MCH of simulation AMC and current insertion, and at this moment, processing unit 15 gets into simulation AMC pattern; If current AMC and the MCH of being inserted as; Then MCH analog submodule unit 151 is simulated MCH and AMC respectively synchronously with AMC analog submodule unit 152, and sets up link with the AMC and the MCH that insert respectively, at this moment; Processing unit 15 gets into double mode, promptly simulates MCH pattern and simulation AMC pattern.
Host computer interface 16 is used for linking to each other with external device, receives the parameter that external device writes, and the information of exporting to each unit of external device output.For example; When the MCH of processing unit 15 simulation AMC and/or MCH and actual insertion and/or AMC set up link; Confirm actual MCH that inserts and/or the Interface status (like normal or fault) of AMC, and, export to external device through host computer interface 16 with the form of this failure message with test report.
Said Micro TCA circuit test device can also comprise clock unit 17, is used to accept the control of said processing unit 15, for the MCH that inserts master control borad slot 11 provides the circuit reference clock and receives the synchronous clock that this MCH sends; And the AMC that is used to the advanced subcard slot 12 of insertion provides synchronous clock and receives the circuit reference clock that this AMC sends.
Particularly:
The signal on the throne that said simulation PM unit 13 produces when also being used for detecting the signal on the throne that when master control borad slot 11 inserts MCH, produces and/or in advanced subcard slot 12, inserting AMC; Whether promptly detection is current in real time has MCH and/or AMC to test; And according to the signal on the throne that produces; That confirm current insertion is MCH or AMC or insertion MCH and AMC, and notifier processes unit 15.
Particularly, simulation PM unit 13 is used to the MCH and/or the AMC that insert master control borad slot 11 and/or advanced subcard slot 12 provides power supply, comprises following two kinds of situation:
First kind of situation: when the signal on the throne of MCH was confirmed as in simulation PM unit 13, the power supply process of stipulating according to the MicroTCA standard criterion provided power supply to MCH automatically; The power supply process of said Micro TCA standard criterion regulation is meant that when MCH inserted the cabinet backboard, Micro TCA system was the process that power supply is provided of MCH.
Second kind of situation: when the signal on the throne of AMC is confirmed as in simulation PM unit 13; Should confirm that result notification was to processing unit 15; Receive the notice of simulation PM unit 13 at processing unit 15; And behind simulation PM unit 13 return control signals, simulation PM unit 13 provides power supply for the AMC of current insertion again according to the specified process of Micro TCA standard criterion.The power supply process of said AMC standard criterion regulation is meant that when AMC inserted the cabinet backboard, Micro TCA system was the power supply process of AMC.
According to current actual MCH that inserts and the different situations of AMC; Utilize the circuit test device of the little telecommunications computing framework in the present embodiment one; The process of the link of MCH, AMC being carried out signal integrity and functional test is also incomplete same, particularly, can comprise following three kinds of situation:
First kind of situation: suppose to have MCH to insert master control borad slot 11.
Simulation PM unit 13 is through the signal on the throne of master control borad slot in the real time scan Micro TCA circuit test device 11 and advanced subcard slot 12; When detecting the signal on the throne of the current MCH of having; Confirm that the current MCH of having inserts, then the power supply process according to Micro TCA standard criterion regulation provides power supply to MCH automatically; And be that definite result notification of MCH is given processing unit 15 with current insertion.
Processing unit 15 is behind the definite result who receives self simulation PM unit 13; Get into simulation AMC pattern; That is to say, set up link between the MCH of AMC analog submodule unit 152 simulation AMC and current insertion, and control clock unit 17 provides the circuit reference clock for MCH and receives the synchronous clock that this MCH sends; At this moment, the AMC of the MCH of current insertion and 152 simulations of AMC analog submodule unit constitutes a Micro TCA system.
Each interface of MCH is set up communication link through the AMC of crosspoint 14 and processing unit 15 simulations, and arbitrary passage and the AMC of simulation that MCH opens 12 passages of each interface successively communicate.
Particularly, the AMC analog submodule unit 152 of processing unit 15 each interface of MCH that can adopt the mode of virtual machine to simulate each interface and the current insertion of AMC is set up link.
After the AMC that simulates in the MCH and the AMC analog submodule unit 152 of current insertion constitutes a MicroTCA system; Because master control borad slot 11 is externally to be provided with; Master control borad slot 11 does not hinder with the plane at advanced subcard slot 12 places; The MCH that inserts is exposed, therefore, can pass through signal tester test signal integrality easily.
In addition; After utilizing the AMC and actual Micro TCA system of MCH formation that inserts of AMC analog submodule unit 152 simulations; Need not to use actual AMC repeatedly plug in the cabinet backboard; Also need not to use 12 actual AMC to insert the cabinet backboard simultaneously and test MCH and AMC, thereby make test process convenient.
Second kind of situation: suppose to have AMC to insert advanced subcard slot 12.
Simulation PM unit 13 is through the signal on the throne of master control borad slot in the real time scan Micro TCA circuit test device 11 and advanced subcard slot 12, when detecting the signal on the throne of the current AMC of having, gives processing unit 15 with the current definite result notification that is inserted as AMC.
Processing unit 15 gets into simulation MCH pattern behind the definite result who receives self simulation PM unit 13, MCH analog submodule unit 151 simulation MCH, and instruction simulation PM unit 13 provides power supply for the AMC of current insertion.At this moment; The MCH of the AMC of current insertion and 151 simulations of MCH analog submodule unit constitutes a Micro TCA system; Each interface of the AMC of current insertion is (like IPMB; Fabric interface etc.) set up communication link between the MCH through crosspoint 14 and processing unit 15 simulations, that is, arbitrary passage that AMC opens two passes successively communicates with simulation MCH.
Wherein, MCH analog submodule unit 151 can adopt the mode of virtual machine to simulate each interface of MCH, and sets up link between the corresponding interface through crosspoint 14 and the AMC that inserts.
Similar with the situation of inserting MCH; Because advanced subcard slot 12 is externally to be provided with; Current master control borad slot 11 does not hinder with the plane at advanced subcard slot 12 places; The AMC that inserts is exposed, therefore, can test function and the signal integrity of AMC through signal tester easily.
The third situation: suppose to have MCH and AMC to insert master control borad slot 11 and advanced subcard slot 12 simultaneously respectively.
The scheme of the third situation can be regarded as first kind of situation and second kind of scheme that situation is carried out simultaneously.Need to prove that under the third situation, processing unit 15 can adopt the MCH that simulates AMC and insertion earlier to set up link; The AMC that simulates MCH and insertion again sets up link; Promptly be introduced into simulation AMC pattern (i.e. the scheme of first kind of situation), the back gets into the order of simulation MCH pattern (i.e. the scheme of second kind of situation), can carry out also that (AMC that simulates MCH and insertion of elder generation sets up link according to opposite order; The MCH that simulates AMC and insertion again sets up link); Can also synchronously simulating MCH and the AMC of insertion set up link, and the MCH of simulation AMC and insertion sets up link, i.e. the scheme of the scheme of first kind of situation of executed in parallel and second kind of situation.
Embodiment two:
As shown in Figure 3, the process flow diagram for the circuit test device of the little telecommunications computing framework of operation among the utility model embodiment two comprises following content:
Step 201: MCH and/or AMC are inserted in the master control borad slot and/or advanced subcard slot of circuit test device.
Particularly; In this step 201; Possibly have only MCH to insert the master control borad slot of circuit test device; Or have only AMC to insert in the advanced subcard slot of circuit test device, also possibly exist MCH and AMC to insert the master control borad slot corresponding in the circuit test device and the situation of advanced subcard slot simultaneously.
Step 202: circuit test device is according to the MCH of detected current insertion and/or the signal on the throne of AMC, and that confirm current insertion is MCH and/or AMC.
Particularly, the simulation PM unit in the circuit test device can detect the current signal on the throne that has or not MCH and/or AMC through the signal on the throne of real time scan master control borad slot and advanced subcard slot, and that definite current insertion is MCH and/or AMC.
If that confirm current insertion is MCH, then carry out step 203, if that definite current insertion is AMC, then carry out step 206, current as if confirming for MCH and AMC insert simultaneously, then carry out step 209.
Step 203: circuit test device provides power supply to MCH automatically according to the power supply process of Micro TCA standard criterion regulation.
Particularly, the simulation PM unit in the circuit test device can provide power supply to MCH according to the power supply process of Micro TCA standard criterion regulation; The power supply process of said Micro TCA standard criterion regulation is meant that when MCH inserted the cabinet backboard, Micro TCA system was the process that MCH provides power supply.
Step 204: circuit test device gets into simulation AMC pattern, and the MCH of simulation AMC and insertion sets up link.
Particularly; Processing unit in the circuit test device is behind the definite result who receives self simulation PM unit; Get into simulation AMC pattern, that is to say, set up link between the AMC analog submodule unit simulation AMC of processing unit and the MCH of current insertion; At this moment, the AMC of the MCH of current insertion and AMC analog submodule unit simulation constitutes a Micro TCA system.
Because each MCH can manage 12 AMC simultaneously; The IPMB of MCH; Interfaces such as fabric interface have 12 passages respectively, and therefore, AMC analog submodule unit can adopt the mode of virtual machine to simulate between each interface of MCH of AMC and current insertion and set up communication link through crosspoint; That is, arbitrary passage of 12 passages opening successively with MCH respectively of simulation AMC communicates.
Step 205: the MCH to current insertion carries out functional test and measuring signal integrality, and finishes this test process.
Particularly, can test function and the signal integrity of this MCH of the MCH of current insertion through signal tester.
Also can utilize the testing software of processing unit set inside in the circuit test device that MCH is carried out functional test; Promptly when the AMC of AMC analog submodule unit simulation sets up link with the actual MCH that inserts; Confirm the normal or fault of Interface status of the actual MCH that inserts; Generate test report, and this test report is exported to external device (like computing machine etc.) through the host computer interface.
Step 206: circuit test device gets into simulation MCH pattern, is the AMC simulation MCH of current insertion.
Particularly, the processing unit in the circuit test device gets into simulation MCH pattern after receiving the current definite result who inserts for AMC of self simulation PM unit, and the MCH analog submodule unit of processing unit is the AMC simulation MCH of current insertion.
Step 207: circuit test device provides power supply according to the power supply process of Micro TCA standard criterion regulation to AMC, sets up link with the AMC that inserts.
Particularly, simulation MCH triggers simulation PM unit and power supply is provided for the AMC of current insertion according to the power supply process of Micro TCA standard criterion regulation, and at this moment, the MCH of the AMC of current insertion and MCH analog submodule unit simulation constitutes a Micro TCA system.
Each interface of the AMC of current insertion is (like IPMB; Fabric interface etc.) set up communication link between the MCH of the MCH analog submodule unit simulation through crosspoint and processing unit; That is, AMC opens arbitrary passage of two passes successively and simulates MCH and communicates.
Step 208: the AMC to current insertion carries out functional test and measuring signal integrality, and finishes this test process.
Particularly, can test function and the signal integrity of this AMC of the AMC of current insertion through signal tester.
Also can utilize the testing software of processing unit set inside in the circuit test device that AMC is carried out functional test; Promptly when the MCH of MCH analog submodule unit simulation sets up link with the actual AMC that inserts; Confirm the normal or fault of Interface status of the actual AMC that inserts; And, export to external device (like computing machine etc.) through the host computer interface with the form of this detecting information with test report.
Step 209: circuit test device provides power supply for MCH, AMC according to the power supply process of Micro TCA standard criterion regulation.
In this step, circuit test device gives the power supply process of MCH and AMC identical with step 203 and step 207.
Step 210: the MCH of circuit test device simulation AMC and current insertion sets up link, and the AMC of simulation MCH and current insertion sets up link.
In this step, circuit test device simulation AMC is identical with step 204 and step 207 with the process of simulation MCH.
In present embodiment two; Circuit test device can preferentially adopt the simulation AMC pattern that is introduced into; The back gets into the order of simulation MCH pattern, and promptly each interface of the MCH of simulation AMC and current insertion is set up link earlier, and carries out the test of MCH; The AMC of back simulation MCH and current insertion sets up link, and carries out the test of AMC; Circuit test device also can oppositely be carried out the test to MCH and AMC; Simultaneously, under the situation that the ability of this circuit test device allows, also can walk abreast MCH and AMC are tested.
Step 211: MCH and AMC to current insertion carry out functional test and measuring signal integrality, and finish this test process.
The utility model embodiment provides a kind of circuit test device of little telecommunications computing framework; Through MCH and/or the external slot of the vertical said circuit test device of insertion of AMC, and utilize said circuit test device to simulate AMC and/or MCH, set up link respectively and between the MCH of current insertion and/or the AMC through AMC and/or the MCH that simulates with Micro TCA; Can carry out functional test to MCH and/or the AMC that inserts slot easily; Because the external slot of this circuit test device does not have the obstruct of cabinet, therefore, can use signal tester that MCH and/or the AMC that inserts slot carried out measuring signal integrality easily; And need not repeatedly to plug AMC; Avoid the problem of the golden finger reliability decrease of AMC, and need not to insert simultaneously a large amount of AMC and test MCH, thereby simplified test process.More excellent ground; Owing to the master control borad slot can be set and advanced subcard slot is horizontal parallel arranged form; Therefore between the MCH that inserts, the AMC is horizontal parallel arranged also, does not hinder mutually, can effectively improve the test accuracy of the measuring signal integrality that MCH and AMC are carried out.
The above only is the preferred embodiment of the utility model, and obviously, those skilled in the art can carry out various changes and modification and not break away from the spirit and the scope of the utility model the utility model.Like this, belong within the scope of the utility model claim and equivalent technologies thereof if these of the utility model are revised with modification, then the utility model also is intended to comprise these changes and modification interior.

Claims (10)

1. the circuit test device of a little telecommunications computing framework is characterized in that, comprising:
Be used to insert the master control borad slot and the advanced subcard slot that is used to insert advanced subcard AMC of master control borad MCH;
Simulation PM unit, the AMC that is used to the MCH that inserts the master control borad slot and inserts advanced subcard slot provides power supply, and the notifier processes unit;
Processing unit is used for the notice according to simulation PM unit, and when confirming current insertions MCH, the simulation AMC and the MCH of insertion set up the link that is used to test, and when confirming current insertion AMC, simulates the link that the AMC foundation of MCH and insertion is used to test.
2. the circuit test device of little telecommunications computing framework as claimed in claim 1 is characterized in that, said master control borad slot and advanced subcard slot are horizontal parallel arranged.
3. the circuit test device of little telecommunications computing framework as claimed in claim 1 is characterized in that, said circuit test device also comprises clock unit:
Said clock unit; Be used to accept the control of said processing unit; For the MCH that inserts the master control borad slot provides the circuit reference clock and receives the synchronous clock that this MCH sends, and be that the AMC that inserts advanced subcard slot provides synchronous clock and receives the circuit reference clock that this AMC sends.
4. the circuit test device of little telecommunications computing framework as claimed in claim 1 is characterized in that,
Said simulation PM unit; The signal on the throne that produces when specifically being used for detecting the signal on the throne that when the master control borad slot inserts MCH, produces and/or in advanced subcard slot, inserting AMC; And according to the signal on the throne that produces; That confirm current insertion is MCH or AMC or insertion MCH and AMC, and the notifier processes unit.
5. the circuit test device of little telecommunications computing framework as claimed in claim 1 is characterized in that,
Simulation PM unit specifically is used for when advanced subcard slot inserts AMC, the notifier processes unit, and when the triggering that receives processing unit, for the AMC that inserts provides power supply;
Processing unit specifically is used for when receiving the notice of simulation PM unit, and simulation MCH triggers simulation PM unit and for the AMC that inserts power supply is provided, and utilizes the MCH of simulation and the AMC of insertion to set up link.
6. like the circuit test device of the arbitrary described little telecommunications computing framework of claim 1~5, it is characterized in that,
Processing unit specifically is used for simulating MCH and/or AMC through the mode of virtual machine.
7. like the circuit test device of the arbitrary described little telecommunications computing framework of claim 1~5, it is characterized in that,
Processing unit specifically is used for when inserting MCH and AMC, and the MCH of simulation AMC and insertion sets up link earlier, and the AMC that simulates MCH and insertion again sets up link; Perhaps, the AMC of simulation MCH and insertion sets up link earlier, and the MCH that simulates AMC and insertion again sets up link; Perhaps, the AMC of synchronously simulating MCH and insertion sets up link, and the MCH of simulation AMC and insertion sets up link.
8. like the circuit test device of the arbitrary described little telecommunications computing framework of claim 1~5, it is characterized in that said device also comprises:
Crosspoint when being used between AMC that the MCH that inserts and/or AMC and processing unit are simulated and/or MCH, setting up link, carries out the transmission of link signal.
9. the circuit test device of little telecommunications computing framework as claimed in claim 8 is characterized in that,
Said crosspoint; Specifically be used for when inserting MCH; Successively 12 passages of each interface of MCH and the AMC of processing unit simulation are set up communication link, and when inserting AMC, the MCH that the active and standby two passes and the processing unit of each interface of AMC are simulated sets up communication link.
10. like the circuit test device of the arbitrary described little telecommunications computing framework of claim 1~5, it is characterized in that,
Said processing unit also is used for when the MCH of simulation AMC and insertion sets up link, confirming the Interface status of the MCH of insertion; And generation test report; And when the AMC of simulation MCH and insertion sets up link, confirm the Interface status of the AMC of insertion, and generate test report;
Said device also comprises:
The host computer interface is used to export said test report.
CN2011203872028U 2011-10-12 2011-10-12 Circuit testing device of micro telecom computing architecture Expired - Lifetime CN202256609U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102385034A (en) * 2011-10-12 2012-03-21 京信通信系统(中国)有限公司 Circuit test device of micro telecommunications computing architecture (TCA) and test method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102385034A (en) * 2011-10-12 2012-03-21 京信通信系统(中国)有限公司 Circuit test device of micro telecommunications computing architecture (TCA) and test method thereof
CN102385034B (en) * 2011-10-12 2013-08-07 京信通信系统(中国)有限公司 Circuit test device of micro telecommunications computing architecture (TCA) and test method thereof

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