CN216053895U - Digital board test system - Google Patents

Abstract

The application relates to a digital board testing system, which comprises: the testing cabinet comprises a source range channel, a middle range channel and a power range channel; at least one of the source range channel, the middle range channel and the power range channel is used for connecting a digital board to be tested, acquiring a detection test signal, performing online copying on the digital board to be tested through the detection test signal, and outputting operation data; and the monitoring cabinet is respectively connected with the source range channel, the intermediate range channel and the power range channel, is used for receiving the operation data, and determines the fault condition of the digital board to be detected according to the operation data. The method and the device can find the potential fault hidden danger of the new spare part in advance, avoid installing the new spare part with the potential fault hidden danger on the nuclear instrument system, and further improve the operation reliability of the nuclear instrument system. Meanwhile, the accurate positioning of the fault plate can be realized, and the running cost of the nuclear instrument system can be reduced.

Description

Digital board test system

Technical Field

The application relates to the technical field of nuclear instruments, in particular to a digital plate testing system.

Background

At present, nuclear instrument systems are mostly adopted in domestic nuclear power stations to measure the neutron flux outside the nuclear reactor, and each nuclear instrument system comprises a probe and a plurality of digital boards, wherein the digital boards are used for processing current signals or pulse signals transmitted by the probe so as to finish measurement.

In recent years, with continuous commercial operation of each nuclear power unit, the failure times and failure rate of a digital plate in a nuclear instrument system are gradually increased, and the safe operation of the nuclear power unit is greatly influenced. When a nuclear instrument system is maintained, a fault plate is generally determined in a removing mode, namely, part of the digital plate in the system is replaced by a new spare part, and whether the digital plate is the fault plate is determined by comparing the functions of the nuclear instrument system before and after replacement.

However, since the diagnosis means for the digital board of the nuclear instrument system is relatively lagged at present, and no system for testing the digital board exists, when a new spare part is replaced, the appearance of the new spare part can be checked only by visual inspection, and the function of the new spare part cannot be tested. The function of the new spare part needs to be verified after it is installed on the nuclear instrumentation system, making it difficult to determine if there is a potential failure hazard with the new spare part installed on the nuclear instrumentation system. At present, the case that faults occur again after a plurality of new spare parts operate for a short time has occurred, and the operation reliability of the nuclear instrument system is greatly reduced.

SUMMERY OF THE UTILITY MODEL

Therefore, a need exists for a digital board testing system capable of testing the functions of a digital board, so as to avoid installing a new spare part with potential fault hidden danger on a nuclear instrumentation system, and further improve the operational reliability of the nuclear instrumentation system.

A digital board testing system, the system comprising:

the testing cabinet comprises a source range channel, a middle range channel and a power range channel; at least one channel of the source range channel, the middle range channel and the power range channel is used for connecting a digital board to be detected, the channel connected with the digital board to be detected is used for acquiring a detection test signal, and the digital board to be detected is copied on line through the detection test signal and outputs operation data;

and the monitoring cabinet is respectively connected with the source range channel, the intermediate range channel and the power range channel and is used for receiving the operation data and determining the fault condition of the digital board to be detected according to the operation data.

In one embodiment, the digital board test system further comprises a detection test cabinet respectively connected with the source range channel, the intermediate range channel and the power range channel. The detection test cabinet is used for generating and sending a detection test signal.

In one embodiment, the probe test cabinet comprises a first industrial computer and a first test interface, the test cabinet further comprises a second test interface, and the test system further comprises a hard-wired cable and/or a NERVIA network. The first industrial personal computer is connected with a first test interface, the first test interface is connected with a second test interface through a hard-wired cable and/or a NERVIA network cable, and the second test interface is respectively connected with the source range channel, the intermediate range channel and the power range channel.

In one embodiment, the test cabinet further comprises a first HUB and a first photoelectric converter, and the monitoring cabinet further comprises a second HUB, a second photoelectric converter and a second industrial personal computer. First HUB concentrator is connected source range passageway, middle range passageway, power range passageway and first photoelectric converter respectively, and first photoelectric converter, second HUB concentrator and second industrial computer connect gradually.

In one embodiment, the first and second optical-to-electrical converters are both optical-to-electrical converters supporting a NERVIA network.

In one embodiment, the test cabinet further comprises a first rack, a second rack, and a third rack. The source range channel is arranged on the first rack, the middle range channel is arranged on the second rack, and the power range channel is arranged on the third rack.

In one embodiment, the first, second and third bays are each provided with slots for matching different sizes of digitizing tablets.

In one embodiment, the first rack, the second rack, and the third rack are all backplane racks.

In one embodiment, the test cabinet further comprises alarm indicator lamps respectively connected with the source range channel, the middle range channel and the power range channel.

In one embodiment, the test cabinet further comprises an operation panel connected with the detection test cabinet.

Among the above-mentioned digital board test system, including test cabinet and monitoring cabinet, wherein the test cabinet includes source range passageway, middle range passageway and power range passageway, at least one passageway in source range passageway, middle range passageway and the power range passageway is used for connecting the digital board that awaits measuring, and this passageway of connecting the digital board that awaits measuring is used for acquireing the detection test signal to carry out online copying to the digital board that awaits measuring through the detection test signal, and output operating data. The monitoring cabinet is respectively connected with the source range channel, the middle range channel and the power range channel and used for receiving the operation data and determining the fault condition of the digital board to be detected according to the operation data. Therefore, the test cabinet can continuously provide a simulation running environment for the digital board to be tested so as to simulate the real working state of the digital board to be tested on a transported nuclear instrument system and carry out online copying diagnosis on the digital board to be tested; the monitoring cabinet can continuously record the operating data of the digital board to be detected, and accordingly the fault condition of the digital board to be detected is determined, and the performance of the board is judged. The method and the device can find the potential fault hidden danger of the new spare part in advance, avoid installing the new spare part with the potential fault hidden danger on the nuclear instrument system, and further improve the operation reliability of the nuclear instrument system. Meanwhile, the method can also be used for copying faults of the digital plate replaced from the nuclear instrument system and realizing accurate positioning of the fault plate, so that the fault-free plate can be reused, and the running cost of the nuclear instrument system can be reduced.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments or the conventional technologies of the present application, the drawings used in the descriptions of the embodiments or the conventional technologies will be briefly introduced below, it is obvious that the drawings in the following descriptions are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.

FIG. 1 is a first schematic block diagram of a digital board test system in one embodiment;

FIG. 2 is a second schematic block diagram of a digital board test system in one embodiment;

FIG. 3 is a block diagram of the schematic structure of the test cabinet and the monitoring cabinet in one embodiment.

Detailed Description

To facilitate an understanding of the present application, the present application will now be described more fully with reference to the accompanying drawings. Embodiments of the present application are set forth in the accompanying drawings. This application may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.

It will be understood that the terms "first," "second," and the like as used herein may be used herein to describe various devices, but these devices are not limited by these terms. These terms are only used to distinguish one device from another. For example, a first industrial computer may be referred to as a second industrial computer, and similarly, a second industrial computer may be referred to as a first industrial computer, without departing from the scope of the present application. Both the first industrial computer and the second industrial computer are industrial computers, but the first industrial computer and the second industrial computer are not the same industrial computer.

It is to be understood that "connection" in the following embodiments is to be understood as "electrical connection", "communication connection", and the like if the connected circuits, modules, units, and the like have communication of electrical signals or data with each other.

As used herein, the singular forms "a", "an" and "the" may include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises/comprising," "includes" or "including," etc., specify the presence of stated features, integers, steps, operations, components, parts, or combinations thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, components, parts, or combinations thereof. Also, as used in this specification, the term "and/or" includes any and all combinations of the associated listed items.

As described in the background art, a test system for a digital board does not exist in the conventional technology, so that online copy test of a new spare part is difficult, and the operation reliability of a nuclear instrument system is greatly reduced. The inventor researches and finds that the problem is caused because all the nuclear instrument systems in the nuclear power station are in an operating state at present, namely all the nuclear instrument systems are put into use and used for measuring various parameters in the nuclear power station, and no nuclear instrument system in an idle state is used for online copying and testing of digital boards.

Therefore, each time the nuclear instrumentation system fails, multiple pieces of the digitizing board need to be replaced at the same time to enable the nuclear instrumentation system to resume normal operation. Because the traditional technology lacks a test system aiming at the digital plate, the prior art has no means for copying and reproducing faults of each replaced digital plate so as to realize the accurate positioning of the fault plate. Therefore, it is impossible to determine whether the fault of the nuclear instrumentation system is caused by one of the digital boards or by the interaction of a plurality of digital boards, and only all the replaced digital boards can be eliminated, thereby greatly increasing the operating cost of the nuclear instrumentation system.

In order to solve the above problems, the present application provides a digital board testing system, which is used to provide a simulation running environment for a digital board to be tested, so as to simulate a real working state of the digital board to be tested on a nuclear instrumentation system in operation. The test system can find potential fault hidden dangers of new spare parts in advance by enabling the digital board to be tested to continuously run for a preset time (namely online copying), and can realize fault copying and reproduction of the changed digital board, so that the accurate positioning of the fault board is realized, and the running reliability of the nuclear instrument system is increased and the running cost is reduced.

In one embodiment, as shown in FIG. 1, a digital board testing system is provided that includes a test cabinet 100 and a monitoring cabinet 200. The test cabinet 100 comprises a source range channel 110, a middle range channel 120 and a power range channel 130, at least one of the source range channel 110, the middle range channel 120 and the power range channel 130 is connected with a digital board to be tested, the channel connected with the digital board to be tested is used for acquiring a detection test signal, the digital board to be tested is copied on line through the detection test signal, and operation data is output. The monitoring cabinet 200 is connected to the source range channel 110, the intermediate range channel 120, and the power range channel 130, respectively, and the monitoring cabinet 200 is configured to receive the operation data and determine a fault condition of the digital board to be detected according to the operation data.

The test cabinet 100 may be a device that simulates a nuclear transportation instrument system, and after the digital board to be tested is connected, the test cabinet 100 may be regarded as a complete nuclear instrument system, and may measure the digital board to be tested by detecting a test signal and output a corresponding measurement result. The channel structure of each channel in the test system may be determined according to the structure of the nuclear instrumentation system, and in one example, the channel structure of each channel may be the same as the structure of each channel in the in-transit nuclear instrumentation system. According to the method and the device, different types of nuclear instrument system digital boards are assembled into the available measuring channel, so that an accurate simulation environment can be provided for the digital board to be measured, and the working condition of the digital board to be measured on the transported nuclear instrument system can be accurately simulated.

It can be understood that, in each channel, except the digital board to be tested, the other digital boards forming the channel are fault-free digital boards, so that the interference of the other digital boards on the test result is avoided as much as possible, and the test accuracy is improved. The monitoring cabinet 200 may be a device that continuously monitors the operation data output by the test cabinet 100 and determines whether the potential fault hidden trouble exists in the digital board to be tested.

According to the plate type of the digital board to be tested (for example, the digital board to be tested may be a power plate, a switching value plate or a digital plate), at least one of the source range channel 110, the intermediate range channel 120 and the power range channel 130 may be correspondingly connected to the digital board to be tested, in other words, the digital board to be tested may be connected to any one, any two or each of the aforementioned 3 channels. For example, when the digitizer board to be tested is a power board, each channel may be connected to the digitizer board to be tested.

The channel connected with the digital board to be detected can obtain a detection test signal. The detection test signal may be a current signal or a pulse signal transmitted from a probe in the nuclear instrument system to the digital board, and further, the detection test signal may be transmitted to the test cabinet 100 by the probe after being collected by the nuclear power station, or may be generated by a test device and output to the test cabinet 100 under each measurement condition. After the detection test signal is obtained, the channel connected with the digital board to be tested can perform online copying on the digital board to be tested through the detection test signal, namely, the digital board to be tested is enabled to continuously run for a period of time (for example, continuously run for 2 hours) by using the detection test signal, and the running data in the running period is output. The monitoring cabinet 200 receives and continuously records the operation data output by the test cabinet 100, and determines the function of the digital board to be tested according to the operation data so as to judge the performance of the digital board to be tested. Further, the monitoring cabinet 200 can also output fault information when the digital board to be detected has a fault.

In the above digital board testing system, the testing cabinet 100 can continuously provide a simulation running environment for the digital board to be tested, so as to simulate the real working state of the digital board to be tested on a transported nuclear instrument system, and perform online copying diagnosis on the digital board to be tested; the monitoring cabinet 200 can continuously record the operation data of the digital board to be detected, and accordingly determine the fault condition of the digital board to be detected, and therefore the performance of the board is judged. The method and the device can find the potential fault hidden danger of the new spare part in advance, avoid installing the new spare part with the potential fault hidden danger on the nuclear instrument system, and further improve the operation reliability of the nuclear instrument system. Meanwhile, the method can also be used for copying faults of the digital plate replaced from the nuclear instrument system and realizing accurate positioning of the fault plate, so that the fault-free plate can be reused, and the running cost of the nuclear instrument system can be reduced.

In one embodiment, as shown in FIG. 2, the digital board test system further includes a probe tester 300 connected to the source range channel 110, the intermediate range channel 120, and the power range channel 130, respectively, the probe tester 300 being configured to generate and transmit probe test signals. The probing test cabinet 300 may be a device that generates and outputs probing test signals for each measurement situation. The detection test cabinet 300 can perform an identification test on various types of channels in the test cabinet 100, that is, can output a detection test signal to the test cabinet 100, so that the test cabinet 100 can perform online copying on a digital board to be tested based on the detection test signal. In one embodiment, the probing test cabinet 300 can also receive the operation data output by the test cabinet 100, and accordingly determine whether each channel in the test cabinet 100 operates normally.

In this embodiment, by setting the detection test cabinet 300 in the test system and using the detection test cabinet 300 to generate and output detection test signals, the detection test signals under each measurement condition can be output through the detection test cabinet 300, so as to meet the test requirements of each type of digital board to be tested, and further improve the accuracy of the test.

In one embodiment, as shown in FIG. 2, the probing test cabinet 300 includes a first industrial computer 310 and a first test interface 320, the test cabinet 100 further includes a second test interface 140, and the digitized board testing system further includes a hard-wired cable and/or a NERVIA network. The first industrial personal computer 310 is connected with a first test interface 320, the first test interface 320 is connected with a second test interface 140 through a hard-wired cable and/or a NERVIA network cable, and the second test interface 140 is respectively connected with the source range channel 110, the intermediate range channel 120 and the power range channel 130.

The first industrial personal computer 310 may be a device having signal generation and output functions, and is configured to inject a detection test signal and read a result, so as to perform a re-authentication function test on a digital board to be tested. Further, the first industrial personal computer 310 may further include an input device and a display device, so as to implement functions of viewing and modifying hardware/software parameters, viewing fault types and information, and the like through the input device and the display device.

The interface types of the first test interface 320 and the second test interface 140 may be determined according to the data transmission manner between the test cabinet 100 and the probing test cabinet 300, and the interface types of the two interfaces may be the same or different, which is not limited in this application. In one example, the first testing interface 320 and the second testing interface 140 may both be interfaces that support a NERVIA network. A NERVIA network refers to a network that supports data transmission over a NERVIA network.

Specifically, the first industrial personal computer 310 may establish a connection with the second test interface 140 of the test cabinet 100 through a hardwire cable or a NERVIA network cable to transmit a probing test signal to each channel in the test cabinet 100 through the second test interface 140. The first industrial personal computer 310 may be connected to each channel within the test cabinet 100 through the first test interface 320, the hard-wired cable, and the second test interface 140 in sequence. Alternatively, the first industrial personal computer 310 may be connected to the channels in the test cabinet 100 through the first test interface 320, the NERVIA network cable, and the second test interface 140 in sequence. In this manner, probe test cabinet 300 may inject probe test signals into test cabinet 100 through the NERVIA network or hard-wired cable. When the first industrial personal computer 310 transmits and receives data to and from the test cabinet 100 through the NERVIA network cable, reliability and convenience of data transmission and reception can be improved.

Further, the probing test cabinet 300 may further include a test interface panel, and the test interface panel is provided with a first test interface 320, and further, the test interface panel may also be provided with other types of interfaces. Therefore, the interfaces of the detection test cabinet 300 can be integrated, and wiring is convenient.

In one example, as shown in fig. 2, the test cabinet 100 may further include a first power supply 150, and the first power supply 150 is used for supplying power to each device in the test cabinet 100. The probe test cabinet 300 may further include a second power supply 330, wherein the second power supply 330 is used for supplying power to the devices in the probe test cabinet 300.

In this embodiment, the detection test cabinet 300 is implemented by the first industrial personal computer 310 and the first test interface 320, and the signal transmission between the detection test cabinet 300 and the test cabinet 100 is implemented by the hard-wired cable and/or the NERVIA network cable, so that the composition of the detection test cabinet 300 can be simplified while the reliability of signal generation and transmission is ensured, and the cost of the test system can be reduced.

In one embodiment, as shown in fig. 2-3, the test cabinet 100 further includes a first HUB 160 and a first opto-electric converter 170, and the monitoring cabinet 200 includes a second HUB 230, a second opto-electric converter 240, and a second industrial computer 210. The first HUB 160 is connected to the source range channel 110, the intermediate range channel 120, the power range channel 130 and the first photoelectric converter 170, respectively, the first photoelectric converter 170 is connected to the second photoelectric converter 240, the second photoelectric converter 240 is connected to the second HUB 230, and the second HUB 230 is connected to the second industrial personal computer 210.

The HUB can be used to regenerate, shape and/or amplify the received signal, and output the processed signal, so as to increase the transmission distance of the network. The first photoelectric converter 170 and the second photoelectric converter 240 may be any type of photoelectric converter, and the two photoelectric converters may be of the same type or different types. In one embodiment, the first optical-to-electrical converter 170 and the second optical-to-electrical converter 240 are both optical-to-electrical converters supporting a NERVIA network, so as to improve the reliability and convenience of communication. In one example, the first and second photoelectric converters 170 and 240 may each be a TP/FL photoelectric converter.

Meanwhile, the arrangement positions of the first HUB 160, the first photoelectric converter 170, the second HUB 230 and the second photoelectric converter 240 in the cabinet may also be determined according to practical situations, which is not particularly limited in this application. In one example, a first HUB 160 and a first opto-electric converter 170 may be provided on the back of the test cabinet 100, and a second HUB 230 and a second opto-electric converter 240 may be provided on the back of the monitoring cabinet 200.

Specifically, the input of the first HUB 160 is connected to the source range channel 110, the intermediate range channel 120, and the power range channel 130, respectively, to acquire the aforementioned 3-channel board signals (i.e., operating data). In one example, the input of the first HUB 160 may be connected to each channel in the test cabinet 100 via a network cable. The first HUB 160 processes the board signals of the respective channels and transmits the processed signals to the first photoelectric converter 170. The first photoelectric converter 170 converts the received signal into an optical signal and transmits the optical signal to the second photoelectric converter 240. In one example, the first photoelectric converter 170 may be connected to the second photoelectric converter 240 through an optical fiber.

The second photoelectric converter 240 independently receives the network data (i.e., optical signals) transmitted by the test cabinet 100 in one direction, converts the received optical signals into electrical signals, transmits the electrical signals to the second HUB 230, the second HUB 230 processes the received electrical signals, and transmits the processed electrical signals to the second industrial personal computer 210, so that the second industrial personal computer 210 continuously monitors the plate signals of each channel, and determines the signal trend of the plate signals of each channel. In one embodiment, the monitoring cabinet 200 may further include a display device and an input device to implement a Human Machine Interface (HMI) for displaying all system status information, including but not limited to board status, runtime logs, and system data 24 hour trend records.

In one example, as shown in fig. 2, the monitoring cabinet 200 may further include a third power supply 220, and the third power supply 220 is used for supplying power to each device in the monitoring cabinet 200. In this embodiment, the HUB and the photoelectric converter are used to implement data communication between the test cabinet 100 and the monitoring cabinet 200, so as to improve communication capacity, communication distance, and communication rate.

In one embodiment, the test cabinet 100 further includes a first rack, a second rack, and a third rack. Source range channel 110 is located on a first rack, intermediate range channel 120 is located on a second rack, and power range channel 130 is located on a third rack.

Specifically, each channel in the test cabinet 100 is implemented by using a corresponding rack, that is, the source range channel 110, the intermediate range channel 120, and the power range channel 130 are respectively disposed on 3 different racks, so as to facilitate installation and connection of the digital board to be tested. The size of each frame may be determined according to the number and size of the digitizing plates constituting the channel, and the size of each frame may be the same or different. In one example, the first, second, and third racks may each be 19 "6U racks.

In one embodiment, the first rack, the second rack and the third rack can be back-panel racks, so that the digital board to be tested can be installed by inserting the racks into the back panel in a front-back manner, and the installation of the digital board to be tested is further facilitated.

In one embodiment, the first rack, the second rack and the third rack are provided with slots for matching different types of digital boards, that is, the board slot size of each rack can match the size of different types of digital boards, so that each type of digital board can be conveniently installed, and the applicability of the test system is widened.

In one embodiment, test cabinet 100 also includes alarm indicator lights connected to source range channel 110, intermediate range channel 120, and power range channel 130, respectively. In one embodiment, the alarm indicator light may be provided on the front panel of the test cabinet 100. Furthermore, the number of the alarm indicator lamps can be one or more, when the number of the alarm indicator lamps is more than one, each channel can be respectively connected with different alarm indicator lamps, and when an alarm condition occurs, the corresponding alarm indicator lamps can be driven to work. Therefore, when the digital board to be detected breaks down, the alarm can be given by the alarm indicating lamp so as to facilitate monitoring.

In one embodiment, the test cabinet 100 further includes an operation panel connected to the probe test cabinet 300 for performing test data exchange with the probe test cabinet 300. In one embodiment, the operation panel may be disposed on the front panel of the test cabinet 100.

In some embodiments of the application, through designing the frames with 3 different measuring ranges and matching the digital boards with different sizes, continuous copying monitoring and recording of output signals of the digital boards to be detected can be realized. The test system can perform long-time online copying monitoring, function re-identification test, hardware/software parameter adjustment and automatic fault information output on the digital board to be tested, positions the fault board and finds potential fault hidden dangers of new spare parts in advance, can improve fault diagnosis capacity and save cost, and provides technical support for reliable and stable operation of a nuclear instrument system.

In the description herein, references to the description of "some embodiments," "other embodiments," "desired embodiments," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, a schematic description of the above terminology may not necessarily refer to the same embodiment or example.

The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.

The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the utility model. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims (10)

1. A digital board testing system, comprising:

the test cabinet comprises a source range channel, a middle range channel and a power range channel; at least one of the source range channel, the intermediate range channel and the power range channel is used for connecting a digital board to be tested, acquiring a detection test signal, performing online copying on the digital board to be tested through the detection test signal, and outputting operating data; the test cabinet is used for simulating a nuclear instrument system;

and the monitoring cabinet is respectively connected with the source range channel, the intermediate range channel and the power range channel, and is used for receiving the operation data and determining the fault condition of the digital board to be detected according to the operation data.

2. The digital board test system according to claim 1, further comprising a probe tester connected to said source-range channel, said intermediate-range channel, and said power-range channel, respectively;

the detection test cabinet is used for generating and sending the detection test signal.

3. The digitized board testing system of claim 2 wherein the probing test cabinet comprises a first industrial computer and a first test interface, the testing cabinet further comprising a second test interface, the system further comprising a hard-wired cable and/or a NERVIA network;

the first industrial personal computer is connected with the first test interface, the first test interface is connected with the second test interface through the hard-wired cable and/or the NERVIA network cable, and the second test interface is respectively connected with the source range channel, the intermediate range channel and the power range channel.

4. The digitized board testing system of claim 1 wherein the test cabinet further comprises a first HUB and a first photoelectric converter; the monitoring cabinet comprises a second HUB concentrator, a second photoelectric converter and a second industrial personal computer;

the first HUB concentrator is respectively connected with the source range channel, the middle range channel, the power range channel and the first photoelectric converter, the second HUB concentrator and the second industrial personal computer are sequentially connected.

5. The digitized board test system of claim 4 wherein the first and second opto-electric converters are all opto-electric converters supporting a NERVIA network.

6. The digitized board testing system of claim 1 wherein the test cabinet further comprises a first rack, a second rack, and a third rack;

the source range channel is arranged on the first rack, the middle range channel is arranged on the second rack, and the power range channel is arranged on the third rack.

7. The digital board testing system of claim 6, wherein the first rack, the second rack, and the third rack are each provided with slots for matching different types of digital boards.

8. The digitized board testing system of claim 6 or 7 wherein the first, second and third racks are all backplane racks.

9. The digitized board testing system of any of claims 2 to 7 wherein the test cabinet further comprises an operator panel, the operator panel being connected to the probe tester cabinet.

10. The digitized board testing system of any of claims 1-7 wherein the test cabinet further includes alarm indicator lights connected to the source range channel, the intermediate range channel and the power range channel, respectively.

Images