CN111710272B - Detection circuit and method of display panel and display panel - Google Patents
Detection circuit and method of display panel and display panel Download PDFInfo
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- CN111710272B CN111710272B CN202010606148.5A CN202010606148A CN111710272B CN 111710272 B CN111710272 B CN 111710272B CN 202010606148 A CN202010606148 A CN 202010606148A CN 111710272 B CN111710272 B CN 111710272B
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Abstract
The application provides a detection circuit and method of a display panel and the display panel, and relates to the technical field of display. The detection circuit includes: a plurality of first panel test switch units configured to be connected with the first sub-pixel regions through data lines; the test signal unit is connected with the first panel test switch unit and used for providing N different test signals for the plurality of first panel test switches so as to control the expected bright and dark states of the sub-pixels in at least one first sub-pixel region to be opposite to those of the sub-pixels in any other first sub-pixel region at the same time, the test signals comprise test control signals and test data signals, and N is an integer greater than 2; and the plurality of multi-way distribution switch units are configured to be connected with the sub-pixel areas through the data lines and connected with the sector routing lines. By means of the technical scheme, whether short circuit occurs to the sector wiring can be determined, and safety of the display panel is guaranteed.
Description
Technical Field
The application belongs to the technical field of display, and particularly relates to a detection circuit and method for a display panel and the display panel.
Background
With the rapid development of display technologies, the application of display panels is more and more extensive, and the requirements of users on the display area of the display panels are also higher and higher. Narrow bezel has become an important development trend for display panels.
In the display panel with the narrow frame, the space of the lower frame is very small. The lower frame is provided with a sector trace (i.e., fanout) for connecting an Integrated Circuit (IC) and a trace of a data line. Because the sector wires are densely arranged, the distance between the sector wires is short, and short circuit is easy to occur. And the short circuit of the sector routing can not be found at the present stage, so that the safety of the display panel is reduced.
Disclosure of Invention
The embodiment of the application provides a detection circuit and method for a display panel and the display panel, which can determine whether a sector wiring is short-circuited or not so as to ensure the safety of the display panel.
In a first aspect, an embodiment of the present application provides a detection circuit for a display panel, where the display panel has a plurality of sub-pixel regions, each sub-pixel region includes a first sub-pixel region, and each first sub-pixel region includes sub-pixels in the same column and in the same color;
the detection circuit includes: a plurality of first panel test switch units configured to be connected with the first sub-pixel regions through data lines; the test signal unit is connected with the first panel test switch unit and used for providing N different test signals for the plurality of first panel test switches so as to control the expected bright and dark states of the sub-pixels in at least one first sub-pixel region to be opposite to those of the sub-pixels in any other first sub-pixel region at the same time, the test signals comprise test control signals and test data signals, and N is an integer greater than 2; and the plurality of multiplexing switch units are configured to be connected with the sub-pixel areas through the data lines and connected with the sector wiring.
According to a first aspect of an embodiment of the present application, a first panel test switch unit is connected to a first sub-pixel region, the test signal unit includes N1 first test control signal lines, one first test control signal line is used for providing a test control signal, N1 test control signals provided by the N1 first test control signal lines are different, N1 is an integer and N1 is greater than or equal to 2 and less than or equal to N-1,
each first test control signal line is connected with at least one first panel test switch unit, and the first panel test switch units connected with different first test control signal lines are different.
According to the first aspect of the embodiments of the present application, the first sub-pixel regions in a row of sub-pixel regions are alternately connected to N1 first test control signal lines.
According to a first aspect of embodiments of the present application, the test signal unit includes N2 first test data signal lines, one first test data signal line for providing one test data signal, N2 test data signals provided by the N2 first test data signal lines are different, one first panel test switch unit is connected to one first sub-pixel region, N2 is an integer and N2 is greater than or equal to 2 and less than or equal to N-1,
each first test data signal line is connected with at least one first panel test switch unit, and the first panel test switch units connected with different first data control signal lines are different.
According to the first aspect of the embodiments of the present application, the first sub-pixel regions in a row of sub-pixel regions are alternately connected to the N2 first test data signal lines.
According to the first aspect of the embodiment of the application, the first test control signal line is connected with the control end of the first panel test switch unit, and the test control signal provided by the first test control signal line is used for controlling the on-off of the first panel test switch unit.
According to the first aspect of the embodiments of the present application, the first test data signal line is connected to the first end or the second end of the first panel test switch unit, and the test control signal provided by the first test data signal line are used to control the desired bright and dark state of the sub-pixel in the first sub-pixel region.
According to the first aspect of the embodiments of the present application, the detection circuit of the display panel further includes: and the detection unit is used for determining that the sector wiring is short-circuited under the condition that the expected bright and dark states of the sub-pixels in one first sub-pixel region are opposite to those of the sub-pixels in the other first sub-pixel region, and the actual bright and dark states of the sub-pixels in one first sub-pixel region are the same as those of the sub-pixels in the other first sub-pixel region.
According to the first aspect of the embodiment of the present application, the detection unit is specifically configured to emit light at the same time in the first sub-pixel region corresponding to the first panel test switch unit connected to the different first test control signal lines, and determine that the sector line is short-circuited.
According to the first aspect of the embodiment of the present application, the detection unit is specifically configured to emit light at the same time in the first sub-pixel region corresponding to the first panel test switch unit connected to the different first test data signal lines, and determine that the sector line is short-circuited.
According to the first aspect of the embodiments of the present application, the sub-pixel region further includes a second sub-pixel region, and the second sub-pixel region includes sub-pixels in the same column and with different colors;
the detection circuit further comprises a plurality of second panel test switch units, wherein the second panel test switch units are configured to be connected with the second sub-pixel regions through the data lines;
the test signal unit further includes a second test control signal line, a third test control signal line, a second test data signal line, and a third test data signal line,
the second test control signal line is connected to the second panel test switch unit connected to the sub-pixel of one color in the second sub-pixel region through the data line,
the third test control signal line is connected with the second panel test switch unit connected with the sub-pixel of the other color in the second sub-pixel region through the data line,
the second test data signal line is connected to a second panel test switch unit connected to the sub-pixel of one color in the second sub-pixel region through the data line,
the third test data signal line is connected to the second panel test switch unit connected to the sub-pixel of the other color in the second sub-pixel region through the data line.
According to the first aspect of the embodiments of the present application, the detection circuit further includes a demultiplexing control signal unit including two or more demultiplexing control signal lines,
the multiple distribution switch units connected to the same sub-pixel region are connected to the same multiple distribution control signal line.
In a second aspect, an embodiment of the present application provides a method for detecting a display panel, which is applied to a detection circuit of the display panel in the technical solution of the first aspect, and the method for detecting the display panel includes: generating N different test signals, inputting the test signals into a first panel test switch unit, wherein the test signals comprise test control signals and test data signals, and N is an integer greater than 2; acquiring an expected bright-dark state of a sub-pixel in a first sub-pixel region; and determining that the sector wiring is short-circuited under the condition that the expected bright-dark state of the sub-pixels in one first sub-pixel region is opposite to that of the sub-pixels in the other first sub-pixel region, and the actual bright-dark state of the sub-pixels in one first sub-pixel region is the same as that of the sub-pixels in the other first sub-pixel region.
In a third aspect, an embodiment of the present application provides a display panel, including the detection circuit in the technical solution of the first aspect.
The embodiment of the application provides a detection circuit and a method of a display panel and the display panel. The test signal unit provides N different test signals for the plurality of first panel test switches, and controls the sub-pixels in at least one first sub-pixel region to be opposite to the expected bright and dark states of the sub-pixels in any other first sub-pixel region at the same time. If the sector trace is short-circuited, a signal on the sector trace corresponding to the first sub-pixel region expected to emit light in a bright-dark state may be transmitted to the sector trace corresponding to the adjacent first sub-pixel region expected to emit light in a dark-bright state, so that the sub-pixels of the adjacent first sub-pixel region expected to emit light in a dark-bright state emit light. Therefore, whether the short circuit occurs to the wiring of the sector is determined based on the actual bright and dark states of the sub-pixels in each first sub-pixel area, and the safety of the display panel is ensured.
Drawings
The present application may be better understood from the following description of specific embodiments thereof taken in conjunction with the accompanying drawings. Wherein like or similar reference numerals refer to like or similar features.
Fig. 1 is a schematic view of a display panel provided in an embodiment of the present application;
FIG. 2 is a schematic diagram of an example of an arrangement of sub-pixels in the display area shown in FIG. 1;
fig. 3 is a schematic structural diagram of a detection circuit of a display panel according to an embodiment of the present disclosure;
fig. 4 is a schematic structural diagram of a detection circuit of a display panel according to another embodiment of the present disclosure;
FIG. 5 is a signal timing diagram of an example of signals of the detection circuit of the display panel shown in FIG. 4;
fig. 6 is a schematic structural diagram of a detection circuit of a display panel according to yet another embodiment of the present application;
FIG. 7 is a signal timing diagram of an example of signals of the detection circuit of the display panel shown in FIG. 6;
fig. 8 is a flowchart of a method for detecting a display panel according to an embodiment of the present disclosure.
Detailed Description
Features and exemplary embodiments of various aspects of the present application will be described in detail below, and in order to make objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are merely illustrative of and not restrictive on the broad application. It will be apparent to one skilled in the art that the present application may be practiced without some of these specific details. The following description of the embodiments is merely intended to provide a better understanding of the present application by illustrating examples thereof.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrases "comprising 8230; \8230;" 8230; "does not exclude the presence of additional like elements in a process, method, article, or apparatus that comprises the element.
It will be understood that when a layer, region or layer is referred to as being "on" or "over" another layer, region or layer in describing the structure of the component, it can be directly on the other layer, region or layer or intervening layers or regions may also be present. Also, if the component is turned over, one layer or region may be "under" or "beneath" another layer or region.
The display panel has a display area and a non-display area. The display area is used for displaying. The non-display area is used for wiring, arranging circuits and the like. Fig. 1 is a schematic view of a display panel according to an embodiment of the present disclosure. As shown in fig. 1, the display panel includes a display area AA and a non-display area NA.
The display area AA has a plurality of sub-pixel regions. The sub-pixels of the same column may belong to the same sub-pixel region. The sub-pixel region may include a first sub-pixel region and a second sub-pixel region. The first sub-pixel region may include sub-pixels in the same column and color. The second sub-pixel region may include sub-pixels in the same column and different colors. Fig. 2 is a schematic diagram illustrating an example of an arrangement of sub-pixels in the display area shown in fig. 1. As shown in fig. 2, one row of sub-pixels is arranged as rgbgrgbgrg 8230 \8230;, and the other row of sub-pixels is arranged as BGRGBGRG \8230;. Where R denotes a red sub-pixel, G denotes a green sub-pixel, and B denotes a blue sub-pixel. The green sub-pixels in the same column can be used as a first sub-pixel region 21. The red and blue sub-pixels of the same column may serve as one second sub-pixel region 22, and the blue and red sub-pixels of the same column may serve as one second sub-pixel region 22. The arrangement of the sub-pixels of the display area is not limited to the arrangement shown in fig. 2.
As shown in fig. 1, a panel Test (CT) component 11, a demultiplexing (demux) component 12, a sector trace (fanout) 13, and an Integrated Circuit (IC) 14 are disposed in the non-display area NA from near to far from the display area AA. The sector routing is dense, the distance is small, and the risk of short circuit is high. The CT component is used for carrying out basic display panel display detection, and cannot detect whether the sector wiring is short-circuited or not, so that the safety of the display panel is influenced.
The embodiment of the application provides a detection circuit and method for a display panel and the display panel, which can detect whether a short circuit occurs to a sector wire in the process of CT, so that whether the short circuit occurs to the sector wire is found in time, and the safety of the display panel is improved.
Fig. 3 is a schematic structural diagram of a detection circuit of a display panel according to an embodiment of the present disclosure. As shown in fig. 3, the detection circuit may include a plurality of first panel test switch units 31, a test signal unit 41, and a plurality of demultiplexing switch units 51.
The first panel test switching unit 31 is configured to be connected to the first sub-pixel region 21 through the data line 15. The test signal unit 41 is connected to the first panel test switch unit 31. Specifically, the first panel test switch unit 31 is connected to the sub-pixels in the first sub-pixel region 21 through the data lines 15. The test signal unit 41 may be configured to provide N different test signals to the plurality of first panel test switches to control the desired bright-dark state of the sub-pixels in at least one first sub-pixel area 21 to be opposite to the desired bright-dark state of the sub-pixels in any other first sub-pixel area 21 at the same time. N is an integer greater than 2. The first panel test switch unit 31 may be a switching device, such as a Thin Film Transistor (TFT), and the like, but is not limited thereto.
The test signals may include test control signals and test data signals. The test control signal may be used to control the first panel test switch unit 31 to be turned on or off. The test data signal and the test control signal may collectively control a desired bright-dark state of the first subpixel area 21. The desired bright-dark state is the bright-dark state of the sub-pixels of first sub-pixel area 21 under control of the test data signal and the test control signal without short-circuiting sector trace 14. The bright-dark state may specifically include light emission or no light emission.
The test control signal and the test data signal may act on the plurality of first panel test switch units 31 to turn on or off the plurality of first panel test switch units 31. The on/off states of the plurality of first panel test switch units 31 may be identical or non-identical at the same time, and are not limited herein.
In the process of detecting the display panel, N different test signals are passed, so that at the same time, the desired bright-dark state of the sub-pixels of one part of the first sub-pixel region 21 is light emission, and the desired bright-dark state of the sub-pixels of the other part of the first sub-pixel region 21 is no light emission. For example, for a row of sub-pixel regions, the desired bright-dark state of the sub-pixels of a portion of the sub-pixel regions in the row of sub-pixel regions is light emitting, and the desired bright-dark state of the sub-pixels of another portion of the sub-pixel regions in the row of sub-pixel regions is no light emitting.
The multiplexing switch unit 51 is configured to be connected to the sub-pixel region through the data line 15. Specifically, the multiplexing switch unit 51 is connected to the sub-pixels in the sub-pixel region through the data lines 15. The multiplexing switch unit 51 is also connected to the sector traces 14. When the multiplexing switch unit 51 is turned on, the signal transmitted to the data line 15 through the first panel test switch unit 31 can be transmitted to the sector trace 14 through the multiplexing switch unit 51. The demultiplexer switch unit 51 may be a switching device, such as a TFT, and the like, and is not limited herein.
If the sector trace 14 is short-circuited, a signal on the sector trace 14 corresponding to the first sub-pixel region 21 expected to emit light in a bright-dark state may be transmitted to the sector trace 14 corresponding to the adjacent first sub-pixel region 21 expected to emit no light in a bright-dark state, so that the sub-pixels of the adjacent first sub-pixel region 21 expected to emit no light in a bright-dark state may emit light. If the sector trace 14 is not short-circuited, the actual bright-dark state of the sub-pixels of the first sub-pixel region 21, whose bright-dark state is non-light emitting, is expected to be non-light emitting.
That is, in the detection process, if the sub-pixels of the first sub-pixel region 21 expected to emit light in the dark-bright state and the sub-pixels of the first sub-pixel region 21 expected to emit light in the dark-bright state emit light at the same time, it can be determined that the sector line 14 is short-circuited.
In some examples, the detection circuit of the display panel may further include a detection unit (not shown in the drawings). The detection unit is used for determining that the sector wiring 14 is short-circuited in the case that the expected bright-dark state of the sub-pixels in one first sub-pixel region 21 is opposite to that of the sub-pixels in the other first sub-pixel region 21, and the actual bright-dark state of the sub-pixels in one first sub-pixel region 21 is the same as that of the sub-pixels in the other first sub-pixel region 21.
In an embodiment of the present application, the plurality of first panel test switches in the detection circuit are configured to be connected to the first sub-pixel region. The test signal unit provides N different test signals for the plurality of first panel test switches, and controls the sub-pixels in at least one first sub-pixel area to be opposite to the expected bright and dark states of the sub-pixels in any other first sub-pixel area at the same time. If the sector trace is short-circuited, a signal on the sector trace corresponding to the first sub-pixel region expected to emit light in a bright-dark state may be transmitted to the sector trace corresponding to the adjacent first sub-pixel region expected to emit light in a dark-bright state, so that the sub-pixels of the adjacent first sub-pixel region expected to emit light in a dark-bright state emit light. Therefore, whether the sector wiring is short-circuited or not can be determined based on the actual bright and dark states of the sub-pixels in each first sub-pixel area, and the safety of the display panel is ensured.
Moreover, the detection circuit of the display panel provided by the embodiment of the application can determine whether the short circuit occurs to the sector wires in time in the process of panel detection (namely, CT), and does not need to determine whether the short circuit occurs to the sector wires when the dot screen detection is performed after bonding. Therefore, whether the sector wiring is short-circuited or not can be determined before bonding, and waste of redundant processes of a fault panel is avoided.
In some examples, as shown in fig. 3, the detection circuit of the display panel may further include a plurality of second panel test switch units 32. The second panel test switch unit 32 is configured to be connected to the second sub-pixel region 22 through the data line 15.
The test signal unit 41 may also provide a test signal to the second panel test switch unit 32. The test signals provided by the test signal unit 41 to the second panel test switch unit 32 may include a test control signal and a test data signal. The test control signal provided to the second panel test switch unit 32 may be used to control the second panel test switch unit 32 to be turned on or off. The test control signal and the test data signal provided to the second panel test switch unit 32 may collectively control the bright and dark states of the sub-pixels of the second sub-pixel region 22.
In the above embodiment, one first panel test switch unit 31 is connected to one first sub-pixel region 21. Specifically, one first panel test switch unit 31 is connected to one first sub-pixel region 21 through the data line 15. The test signal unit 41 may include a first test control signal line and a first test data signal line. The first test control signal line is used to provide a test control signal corresponding to the first panel test switch unit 31. The first test data signal line is used to provide a test data signal corresponding to the first panel test switch unit 31.
A second panel test switch 32 is connected to a second sub-pixel region 22. Specifically, a second panel test switch 32 is connected to a second sub-pixel region 22 through the data line 15. The test signal unit 41 may further include a second test control signal line, a third test control signal line, a second test data signal line, and a third test data signal line.
The second test control signal line is connected to the second panel test switch unit 32 connected to the sub-pixel of one color in the second sub-pixel region 22 through the data line 15. The second test data signal line is connected to the second panel test switch unit 32 connected to the sub-pixel of one color in the second sub-pixel region 22 through the data line 15. That is, the second panel test switch unit 32 to which the second test control signal line is connected to the sub-pixel of one color in the second sub-pixel region 22 through the data line 15. The second panel test switch unit 32 connected to the second test data signal line is connected to the sub-pixel of one color in the second sub-pixel region 22 through the data line 15.
The third test control signal line is connected to the second panel test switch unit 32 connected to the sub-pixel of the other color in the second sub-pixel region 22 through the data line 15. The third test data signal line is connected to the second panel test switch unit 32 connected to the sub-pixel of the other color in the second sub-pixel region 22 through the data line 15. That is, the second panel test switch unit 32 to which the third test control signal line is connected to the sub-pixel of the other color in the second sub-pixel region 22 through the data line 15. The second panel test switch unit 32 connected to the third test data signal line is connected to the sub-pixel of the other color in the second sub-pixel region 22 through the data line 15.
The first test control signal line is connected to a control terminal of the first panel test switch unit 31. The test control signal provided by the first test control signal line may be used to control the on or off of the first panel test switch unit 31. The first test data signal line is connected to one of the first terminal or the second terminal of the first panel test switch unit 31, and the other of the first terminal or the second terminal of the first panel test switch unit 31 is connected to the sub-pixel in the first sub-pixel region 21 through the data line 15. The test control signal provided by the first test control signal line and the test control signal provided by the first test data signal line are used to control the desired bright and dark state of the sub-pixels in the first sub-pixel region 21.
The second test control signal line is connected to the control terminal of the second panel test switch unit 32. The test control signal provided by the second test control signal line may be used to control the second panel test switch unit 32 to be turned on or off. The second test data signal line is connected to one of the first terminal or the second terminal of the second panel test switch unit 32, and the other of the first terminal or the second terminal of the second panel test switch unit 32 is connected to the sub-pixels in the second sub-pixel region 22 through the data line 15. The test control signal provided by the second test control signal line and the test control signal provided by the second test data signal line are used to control the desired bright and dark state of the sub-pixels in the second sub-pixel region 22.
In the above embodiment, as shown in fig. 3, the detection circuit of the display panel may further include a demultiplexing control signal unit 42. The demultiplexing control signal unit 42 may include more than two demultiplexing control signal lines. The multi-path distribution switch unit 51 connected to the sub-pixel regions with the same sub-pixel arrangement is connected to the same multi-path distribution control signal line, so that in the CT process, the data test signal of the sub-pixel regions with the same sub-pixel arrangement can be transmitted to the sector trace 14 through the multi-path distribution switch unit 51.
In some examples, the number of the first test control signal lines is N1, and the number of the first test data signal lines may be one, or two or more, and is not limited herein. A first test control signal line is used to provide a test control signal. A first test data signal line is for providing a test data signal. The N1 test control signals provided by the N1 first test control signal lines are different. Wherein N1 is an integer and N1 is not less than 2 and not more than N-1. It should be noted that the N1 test control signals provided by the N1 first test control signal lines are different, which means that at least one test control signal in the N1 test control signals is different from other test control signals, but it is not required that each test control signal in the N2 test control signals is different.
Each first test control signal line is connected with at least one first panel test switch unit. The first panel test switch units connected with different first test control signal lines are different. The condition that the same first panel test switch unit is connected with more than two first test control signal lines can not occur. Specifically, the first sub-pixel regions in a row of sub-pixel regions are alternately connected to N1 first test control signal lines.
For convenience of explanation, the test signal unit is described below as including two first test control signal lines and one first test data signal line. Fig. 4 is a schematic structural diagram of a detection circuit of a display panel according to another embodiment of the present disclosure. As shown in fig. 4, the sub-pixel in the first sub-pixel region is a green sub-pixel G. The sub-pixels in the second sub-pixel region include a red sub-pixel R and a blue sub-pixel B. But the type of sub-pixels in the sub-pixel region is not limited thereto.
The first panel test switch unit T1 is connected to the first sub-pixel region B1 through a data line. The first panel test switch unit T2 is connected to the second first sub-pixel region B2 through a data line. The first panel test switch unit T3 is connected to the third first sub-pixel region B3 through a data line. The first panel test switching unit T4 is connected to the fourth first sub-pixel region B4 through a data line. The second panel test switching units T5 and T6 are connected to the first and second sub-pixel regions C1 through data lines. The second panel test switch units T7 and T8 are connected to the second sub-pixel region C2 through data lines. The second panel test switch units T9 and T10 are connected to the third second sub-pixel region C3 through data lines. The second panel test switching units T11 and T12 are connected to the fourth second sub-pixel region C4 through data lines. The following second sub-pixel region and the second panel test switch unit are not described herein again.
The test signal unit includes two first test control signal lines, a first test data signal line, a second test control signal line, a third test control signal line, a second test data signal line, and a third test data signal line. The multiplexing control signal unit may include three multiplexing control signal lines. As shown in fig. 4, the two first test control signal lines are D _ SW1_1 and D _ SW1_2, respectively. One first test data signal line is D _ G. One second test control signal line is D _ SW2. One third test control signal line is D _ SW3. One second test data signal line is D _ R. And a third test data signal line D _ B. The three multiplexing control signal lines are D _ mux1, D _ mux2, and D _ mux3, respectively. The multiplexing control signal line supplies a multiplexing control signal. The multi-channel distribution control signal is used for controlling the on or off of the multi-channel distribution switch unit.
The first panel test switch units T1 and T3 are connected to the first test control signal line D _ SW1_1 and the first test data signal line D _ G. The first panel test switch units T2 and T4 are connected to the first test control signal line D _ SW1_2 and the first test data signal line D _ G.
The second panel test switch units T5, T8, T9, and T12 are connected to the second test control signal line D _ SW2 and the second test data signal line D _ R. The second panel test switch units T6, T7, T10, and T11 are connected to the third test control signal line D _ SW3 and the third test data signal line D _ B.
The demultiplexing switching units M1, M4, M7, and M10 are connected to a demultiplexing control signal line D _ mux 1. The demultiplexing switching units M2, M5, M8, and M11 are connected to a demultiplexing control signal line D _ mux 2. The demultiplexing switching units M3, M6, M9 and M12 are connected to the demultiplexing control signal line D _ mux3.
The description will be given by taking an example that the test control signal is a high level to control the first panel test switch unit and the second panel test switch unit to be turned off, the test control signal is a low level to control the first panel test switch unit and the second panel test switch unit to be turned on, the test data signal is a high level to correspond to the sub-pixel to emit light, the test data signal is a low level to correspond to the sub-pixel to not emit light, the multi-path distribution control signal is a high level to control the multi-path distribution switch unit to be turned off, and the multi-path distribution control signal is a low level to control the multi-path distribution switch unit to be turned on. Fig. 5 is a signal timing diagram of an example of signals of the detection circuit of the display panel shown in fig. 4.
As shown in fig. 4 and 5, in the T1 phase, the test control signal provided by the first test control signal line D _ SW1_1 is at a low level, and the first panel test switch units T1 and T3 are turned on. The test control signal provided by the first test control signal line D _ SW1_2 is at a high level, and the first panel test switch units T2 and T4 are turned off. The test data signal supplied from the first test data signal line D _ G is at a high level, the desired bright-dark state of the sub-pixels in the first sub-pixel regions B1 and B3 is light emission, and the desired bright-dark state of the sub-pixels in the first sub-pixel regions B2 and B4 is no light emission. The demultiplexing control signal provided by the demultiplexing control signal line D _ mux2 is at a low level, and the demultiplexing switching units M2 and M8 are turned on. The other first panel test switch units, the second panel test switch units and the other demultiplexer switch units are turned off.
In the period T2, the test control signal provided by the first test control signal line D _ SW1_2 is at a low level, and the first panel test switch units T2 and T4 are turned on. The test control signal provided by the first test control signal line D _ SW1_1 is at a high level, and the first panel test switch units T1 and T3 are turned off. The test data signal supplied from the first test data signal line D _ G is at a high level, the desired bright-dark state of the sub-pixels in the first sub-pixel regions B2 and B4 is light emission, and the desired bright-dark state of the sub-pixels in the first sub-pixel regions B1 and B3 is no light emission. The demultiplexing control signal supplied from the demultiplexing control signal line D _ mux2 is at a low level, and the demultiplexing switching units M5 and M11 are turned on. The other first panel test switch units, the second panel test switch units and the other demultiplexer switch units are turned off.
Correspondingly, the detecting unit in the above embodiment may be specifically configured to emit light at the same time in the first sub-pixel regions corresponding to the first panel test switch units connected to different first test control signal lines, so as to determine that the sector wiring is short-circuited.
For example, in the t1 phase or the t2 phase, if the first sub-pixel regions B1, B2, B3, and B4 emit light at intervals, the desired bright-dark state of the sub-pixels in each first sub-pixel region is consistent with the actual bright-dark state, that is, it indicates that the sector lines are not short-circuited. If more than two continuous first sub-pixel areas emit light, the expected bright and dark states of the sub-pixels in part of the first pixel areas are opposite to the actual bright and dark states, namely, the short circuit of the sector wiring is indicated.
In other examples, the number of the first test data signal lines is N2, and the number of the first test control signal lines may be one, or may be two or more, which is not limited herein. A first test control signal line is used to provide a test control signal. A first test data signal line is for providing a test data signal. The N2 test data signals provided by the N2 first test data signal lines are different. Wherein N2 is an integer and N2 is not less than 2 and not more than N-1. It should be noted that, the N2 test data signals provided by the N2 first test data signal lines are different, which means that at least one test data signal in the N2 test data signals is different from other test data signals, but it is not required that each test data signal in the N2 test data signals is different.
Each first test data signal line is connected with at least one first panel test switch unit. The first panel test switch units connected with different first test data signal lines are different. The condition that the same first panel test switch unit is connected with more than two first test data signal lines can not occur. Specifically, the first sub-pixel regions in a row of sub-pixel regions are alternately connected to N2 first test data signal lines.
For convenience of explanation, the test signal unit includes one first test control signal line and two first test data signal lines. Fig. 6 is a schematic structural diagram of a detection circuit of a display panel according to yet another embodiment of the present disclosure. As shown in fig. 6, the sub-pixel in the first sub-pixel region is a green sub-pixel G. The sub-pixels in the second sub-pixel region include a red sub-pixel R and a blue sub-pixel B. But the type of sub-pixels in the sub-pixel region is not limited thereto.
The first panel test switching unit T13 is connected to the first sub-pixel region B5 through a data line. The first panel test switch unit T14 is connected to the second first sub-pixel region B6 through a data line. The first panel test switch unit T15 is connected to the third first sub-pixel region B7 through a data line. The first panel test switch unit T16 is connected to the fourth first sub-pixel region B8 through a data line. The second panel test switch units T17 and T18 are connected to the first second sub-pixel region C5 through data lines. The second panel test switching units T19 and T20 are connected to the second sub-pixel region C6 through data lines. The second panel test switching units T21 and T22 are connected to the third second sub-pixel region C7 through data lines. The second panel test switch units T23 and T24 are connected to the fourth second sub-pixel region C8 through data lines. The following second sub-pixel region and the second panel test switch unit are not described herein again.
The test signal unit includes a first test control signal line, two first test data signal lines, a second test control signal line, a third test control signal line, a second test data signal line, and a third test data signal line. The demultiplexing control signal unit may include three demultiplexing control signal lines. As shown in fig. 6, one first test control signal line is D _ SW1. The two first test data signal lines are respectively D _ G _1 and D _ G _2. One second test control signal line is D _ SW2. One third test control signal line is D _ SW3. One second test data signal line is D _ R. And a third test data signal line D _ B. The three multiplexing control signal lines are D _ mux1, D _ mux2, and D _ mux3, respectively. The multiplexing control signal line supplies a multiplexing control signal. The multi-channel distribution control signal is used for controlling the multi-channel distribution switch unit to be switched on or switched off.
The first panel test switch units T13 and T15 are connected to the first test control signal line D _ SW1 and the first test data signal line D _ G _ 1. The first panel test switch units T14 and T16 are connected to the first test control signal line D _ SW1 and the first test data signal line D _ G _2.
The second panel test switch units T17, T20, T21, and T24 are connected to the second test control signal line D _ SW2 and the second test data signal line D _ R. The second panel test switch units T18, T19, T22, and T23 are connected to the third test control signal line D _ SW3 and the third test data signal line D _ B.
The demultiplexing switching units M13, M16, M19 and M22 are connected to the demultiplexing control signal line D _ mux 1. The demultiplexing switching units M14, M17, M20, and M23 are connected to a demultiplexing control signal line D _ mux 2. The demultiplexing switching units M15, M18, M21 and M24 are connected to the demultiplexing control signal line D _ mux3.
The description will be given by taking an example that the test control signal is a high level to control the first panel test switch unit and the second panel test switch unit to be turned off, the test control signal is a low level to control the first panel test switch unit and the second panel test switch unit to be turned on, the test data signal is a high level to correspond to the sub-pixel to emit light, the test data signal is a low level to correspond to the sub-pixel to not emit light, the multi-path distribution control signal is a high level to control the multi-path distribution switch unit to be turned off, and the multi-path distribution control signal is a low level to control the multi-path distribution switch unit to be turned on. Fig. 7 is a signal timing diagram of an example of signals of the detection circuit of the display panel shown in fig. 6.
As shown in fig. 6 and 7, in the T1 phase, the test control signal supplied from the first test control signal line D _ SW1 is at a low level, and the first panel test switch units T13, T14, T15, and T16 are turned on. The test data signal supplied from the first test data signal line D _ G _1 is at a high level, the test data signal supplied from the first test data signal line D _ G _2 is at a low level, the desired bright-dark state of the sub-pixels in the first sub-pixel regions B5 and B7 is light emission, and the desired bright-dark state of the sub-pixels in the first sub-pixel regions B6 and B8 is no light emission. The demultiplexing control signal supplied from the demultiplexing control signal line D _ mux2 is low, and the demultiplexing switching units M14 and M20 are turned on. The other first panel test switch units, the second panel test switch units and the other demultiplexer switch units are turned off.
In the T2 phase, the test control signal provided by the first test control signal line D _ SW1 is at a low level, and the first panel test switch units T13, T14, T15, and T16 are turned on. The test data signal supplied from the first test data signal line D _ G _1 is at a low level, the test data signal supplied from the first test data signal line D _ G _2 is at a high level, the desired bright-dark state of the sub-pixels in the first sub-pixel regions B6 and B8 is light emission, and the desired bright-dark state of the sub-pixels in the first sub-pixel regions B5 and B7 is no light emission. The demultiplexing control signal supplied from the demultiplexing control signal line D _ mux2 is low, and the demultiplexing switching units M17 and M23 are turned on. The other first panel test switch units, the second panel test switch units and the other demultiplexer switch units are turned off.
Correspondingly, the detecting unit in the above embodiment may be specifically configured to emit light at the same time in the first sub-pixel regions corresponding to the first panel test switch units connected to different first test data signal lines, so as to determine that the sector wiring is short-circuited.
For example, in the stage t1 or the stage t2, if the first sub-pixel regions B5, B6, B7, and B8 emit light at intervals, the desired bright-dark state of the sub-pixels in each first sub-pixel region matches the actual bright-dark state, i.e., it indicates that the sector lines are not short-circuited. If more than two continuous first sub-pixel areas emit light, the expected bright and dark states of the sub-pixels in part of the first pixel areas are opposite to the actual bright and dark states, namely, the short circuit of the sector wiring is indicated.
The embodiment of the application also provides a detection method of the display panel, which can be applied to the detection circuit of the display panel in the embodiment. Fig. 8 is a flowchart of a method for detecting a display panel according to an embodiment of the present disclosure. As shown in fig. 8, the detection method may include steps S801 to S803.
In step S801, N different test signals are generated and input to the first panel test switch unit.
Wherein N is an integer greater than 2. The test signals include test control signals and test data signals. In some examples, the N test signals may include N1 test control signals and one test data signal, N1 being an integer and 2 ≦ N1 ≦ N-1. In other examples, the N test signals may include N1 test control signals and more than two test data signals. In still other examples, the N test signals may include one test control signal and N2 test data signals, N2 being an integer and 2 ≦ N-1. In still other examples, the N test signals may include more than two test control signals and N2 test data signals.
The test signal is input into the first panel test switch unit, and the first panel test switch unit can be controlled to be switched on and off, so that the first sub-pixel area is controlled to emit light or not to emit light. The test signals are different, and all the first sub-pixel regions can not emit light at the same time under the condition that the sector wires are not short-circuited.
In step S802, a desired bright-dark state of the sub-pixels in the first sub-pixel region is acquired.
The desired bright-dark state is the bright-dark state of the sub-pixels of the first sub-pixel area under control of the test data signal and the test control signal without short-circuiting the sector lines. The bright-dark state may specifically include light emission or no light emission.
In step S803, in the case that the expected bright-dark state of the sub-pixels in one first sub-pixel region is opposite to that of the sub-pixels in another first sub-pixel region, and the actual bright-dark state of the sub-pixels in one first sub-pixel region is the same as that of the sub-pixels in another first sub-pixel region, it is determined that the sector wiring is short-circuited.
If the sector trace is not shorted, the expected bright-dark state and the actual bright-dark state of the sub-pixels in the first sub-pixel region should be consistent. I.e. the expected bright-dark state of the sub-pixels in one first sub-pixel region is opposite to the expected bright-dark state of the sub-pixels in another first sub-pixel region, and correspondingly the actual bright-dark state of the sub-pixels in this one first sub-pixel region is opposite to the actual bright-dark state of the sub-pixels in another first sub-pixel region.
If the sector wires are short-circuited, signals transmitted by the short-circuited sector wires are affected by signals transmitted by adjacent sector wires, so that the expected bright-dark state of the sub-pixels in the first sub-pixel region corresponding to the short-circuited sector wires is inconsistent with the actual bright-dark state. I.e. the desired bright-dark state of the sub-pixels in one first sub-pixel region is opposite to the desired bright-dark state of the sub-pixels in another first sub-pixel region, which is the same as the actual bright-dark state of the sub-pixels in the other first sub-pixel region. Therefore, if it is detected that the expected bright-dark state of the sub-pixels in one first sub-pixel region is opposite to the expected bright-dark state of the sub-pixels in another first sub-pixel region, and the actual bright-dark state of the sub-pixels in the one first sub-pixel region is the same as the actual bright-dark state of the sub-pixels in the another first sub-pixel region, it can be determined that the sector wiring is short-circuited.
Other descriptions of steps S801 to S803 may refer to relevant contents in the above embodiments, and are not repeated herein.
In this embodiment, the N different test signals generated for the plurality of first panel test switches may control the desired bright and dark states of the sub-pixels in at least one first sub-pixel region to be opposite to those of the sub-pixels in any other first sub-pixel region at the same time. If the sector trace is short-circuited, a signal on the sector trace corresponding to the first sub-pixel region expected to emit light in a bright-dark state may be transmitted to a sector trace corresponding to the adjacent first sub-pixel region expected to emit no light in a bright-dark state, so that the sub-pixel of the adjacent first sub-pixel region expected to emit no light in a bright-dark state emits light. Under the condition that the expected bright and dark states of the sub-pixels in one first sub-pixel region are opposite to the expected bright and dark states of the sub-pixels in the other first sub-pixel region, and the actual bright and dark states of the sub-pixels in one first sub-pixel region are the same as the actual bright and dark states of the sub-pixels in the other first sub-pixel region, the short circuit of the sector wiring can be determined, and the safety of the display panel is ensured.
Moreover, by adopting the detection method of the display panel provided by the embodiment of the application, whether the short circuit occurs to the sector wires can be determined in time in the CT process, and whether the short circuit occurs to the sector wires is determined when the dot screen detection is performed after bonding is not needed. Therefore, whether the sector wiring is short-circuited or not can be determined before bonding, and waste of redundant processes of a fault panel is avoided.
In some examples, according to the detection circuit in the above embodiments, the step S803 may be specifically subdivided into: and simultaneously emitting light in first sub-pixel areas corresponding to the first panel test switch units connected with different first test control signal lines to determine that the sector wiring is short-circuited.
In other examples, according to the detection circuit in the above embodiments, the step S803 may be specifically subdivided into: the detection unit is specifically used for simultaneously emitting light in first sub-pixel regions corresponding to first panel test switch units connected with different first test data signal lines to determine that short circuit occurs in sector wiring.
The embodiment of the application also provides a display panel, which comprises the detection circuit of the display panel in the embodiment. Specifically, the detection circuit can be disposed in a non-display region of the display panel. The display panel may be a display screen of a device such as a mobile phone, a tablet, a palm computer, an IPAD, and the like, but is not limited thereto.
The embodiments in the present specification are described in a progressive manner, and the same or similar parts in the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. For the embodiments of the detection method and the display panel, the relevant points can be referred to the description part of the embodiments of the detection circuit. In accordance with the embodiments of the present application as described above, these embodiments are not exhaustive and do not limit the application to the specific embodiments described. Obviously, modifications and variations are possible in light of the above teachings. The embodiments were chosen and described in order to best explain the principles of the application and its practical application, to thereby enable others skilled in the art to best utilize the application and its various modifications as are suited to the particular use contemplated.
Claims (14)
1. The detection circuit of the display panel is characterized in that the display panel is provided with a plurality of sub-pixel regions, each sub-pixel region comprises a first sub-pixel region, and each first sub-pixel region comprises sub-pixels which are in the same column and have the same color;
the detection circuit includes:
a plurality of first panel test switch units configured to be connected with the first sub-pixel regions through data lines;
a test signal unit, connected to the first panel test switch unit, configured to provide N different test signals to the plurality of first panel test switches, so as to control that a desired bright-dark state of a sub-pixel in at least one first sub-pixel region is opposite to a desired bright-dark state of a sub-pixel in any other first sub-pixel region at the same time, where the test signals include a test control signal and a test data signal, and N is an integer greater than 2;
and the plurality of multi-way distribution switch units are configured to be connected with the sub-pixel areas through data lines and connected with the sector routing lines.
2. The detection circuit of claim 1, wherein one of the first panel test switch units is connected to one of the first sub-pixel regions, the test signal unit includes N1 first test control signal lines, one of the first test control signal lines is used to provide one of the test control signals, N1 of the test control signals provided by the N1 first test control signal lines are different, N1 is an integer and 2. Ltoreq.N 1. Ltoreq.N-1,
each first test control signal line is connected with at least one first panel test switch unit, and the first panel test switch units connected with different first test control signal lines are different.
3. The detecting circuit of claim 2, wherein the first sub-pixel regions in a row of the sub-pixel regions are alternately connected to N1 of the first test control signal lines.
4. The detection circuit of claim 1, wherein the test signal unit comprises N2 first test data signal lines, one of the first test data signal lines is used for providing a test data signal, N2 test data signals provided by the N2 first test data signal lines are different, one of the first panel test switch units is connected to one of the first sub-pixel regions, N2 is an integer and 2. Ltoreq. N2. Ltoreq.N-1,
each first test data signal line is connected with at least one first panel test switch unit, and the first panel test switch units connected with different first test data signal lines are different.
5. The detecting circuit of claim 4, wherein the first sub-pixel regions in a row of the sub-pixel regions are alternately connected to N2 of the first test data signal lines.
6. The detection circuit of claim 2 or 3, wherein the first test control signal line is connected to a control terminal of the first panel test switch unit, and a test control signal provided by the first test control signal line is used to control on/off of the first panel test switch unit.
7. The detection circuit of claim 4 or 5, wherein the first test data signal line is connected to a first terminal or a second terminal of the first panel test switch unit, and the test control signal provided by the first test data signal line are used to control a desired bright-dark state of the sub-pixels in the first sub-pixel region.
8. The detection circuit of the display panel according to claim 1, further comprising:
and the detection unit is used for determining that the sector routing is short-circuited under the condition that the expected bright and dark states of the sub-pixels in one first sub-pixel region are opposite to the expected bright and dark states of the sub-pixels in the other first sub-pixel region, and the actual bright and dark states of the sub-pixels in one first sub-pixel region are the same as the actual bright and dark states of the sub-pixels in the other first sub-pixel region.
9. The detecting circuit of claim 8, wherein the detecting unit is specifically configured to emit light at the same time in the first sub-pixel regions corresponding to the first panel test switch units connected to different first test control signal lines, so as to determine that the sector trace is shorted.
10. The detection circuit of claim 8, wherein the detection unit is specifically configured to emit light at the same time in the first sub-pixel regions corresponding to the first panel test switch units connected to different first test data signal lines, so as to determine that the sector trace is shorted.
11. The detection circuit of the display panel according to claim 1, wherein the sub-pixel region further comprises a second sub-pixel region, and the second sub-pixel region comprises sub-pixels in the same column and different colors;
the detection circuit further comprises a plurality of second panel test switch units configured to be connected with the second sub-pixel regions through data lines;
the test signal unit further includes a second test control signal line, a third test control signal line, a second test data signal line, and a third test data signal line,
the second test control signal line is connected to the second panel test switch unit connected to the sub-pixel of one color in the second sub-pixel region through a data line,
the third test control signal line is connected to the second panel test switch unit connected to the sub-pixel of the other color in the second sub-pixel region through a data line,
the second test data signal line is connected to the second panel test switch unit connected to the sub-pixel of one color in the second sub-pixel region through a data line,
the third test data signal line is connected to the second panel test switch unit connected to the sub-pixel of the other color in the second sub-pixel region through a data line.
12. The detection circuit of a display panel according to claim 11, further comprising a demultiplexing control signal unit including two or more demultiplexing control signal lines,
the multi-path distribution switch units connected with the sub-pixel regions with the same sub-pixel arrangement are connected with the same multi-path distribution control signal line.
13. A method for inspecting a display panel, which is applied to the inspection circuit for a display panel according to any one of claims 1 to 12, the method comprising:
generating N different test signals, inputting the test signals into the first panel test switch unit, wherein the test signals comprise test control signals and test data signals, and N is an integer greater than 2;
acquiring an expected bright-dark state of the sub-pixels in the first sub-pixel region;
and determining that the sector wiring is short-circuited in the case that the expected bright-dark state of the sub-pixels in one first sub-pixel region is opposite to that of the sub-pixels in the other first sub-pixel region, and the actual bright-dark state of the sub-pixels in the one first sub-pixel region is the same as that of the sub-pixels in the other first sub-pixel region.
14. A display panel comprising the detection circuit according to any one of claims 1 to 12.
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