CN111566779A - 多分析物离子源 - Google Patents

多分析物离子源 Download PDF

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Publication number
CN111566779A
CN111566779A CN201880085676.1A CN201880085676A CN111566779A CN 111566779 A CN111566779 A CN 111566779A CN 201880085676 A CN201880085676 A CN 201880085676A CN 111566779 A CN111566779 A CN 111566779A
Authority
CN
China
Prior art keywords
analyte
wells
sample
plate
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201880085676.1A
Other languages
English (en)
Chinese (zh)
Inventor
F.考沙尔
G.贾瓦海利
L.库森
C.乔利夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PerkinElmer Health Sciences Canada Inc
Original Assignee
PerkinElmer Health Sciences Canada Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PerkinElmer Health Sciences Canada Inc filed Critical PerkinElmer Health Sciences Canada Inc
Publication of CN111566779A publication Critical patent/CN111566779A/zh
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0404—Capillaries used for transferring samples or ions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CN201880085676.1A 2017-11-10 2018-11-08 多分析物离子源 Pending CN111566779A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201762584425P 2017-11-10 2017-11-10
US62/584,425 2017-11-10
PCT/IB2018/058793 WO2019092640A1 (en) 2017-11-10 2018-11-08 Multiple analyte ion source

Publications (1)

Publication Number Publication Date
CN111566779A true CN111566779A (zh) 2020-08-21

Family

ID=66438268

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201880085676.1A Pending CN111566779A (zh) 2017-11-10 2018-11-08 多分析物离子源

Country Status (6)

Country Link
US (1) US11367603B2 (https=)
EP (1) EP3707744A4 (https=)
JP (1) JP7293219B2 (https=)
CN (1) CN111566779A (https=)
CA (1) CA3082352A1 (https=)
WO (1) WO2019092640A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022099907A1 (zh) * 2020-11-13 2022-05-19 广州禾信仪器股份有限公司 质谱检测系统及离子源装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12555761B2 (en) * 2023-09-25 2026-02-17 Thermo Fisher Scientific (Bremen) Gmbh Sample probe systems and associated methods

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5872010A (en) * 1995-07-21 1999-02-16 Northeastern University Microscale fluid handling system
WO2000041214A1 (en) * 1999-01-08 2000-07-13 Northeastern University ELECTRO-PNEUMATIC DISTRIBUTOR FOR MULTIPLEXED ν-TAS DEVICES
US20030224531A1 (en) * 2002-05-29 2003-12-04 Brennen Reid A. Microplate with an integrated microfluidic system for parallel processing minute volumes of fluids
US20050258359A1 (en) * 2004-05-19 2005-11-24 Ionalytics Corporation Multiple nano-spray delivery system for FAIMS
CN1846136A (zh) * 2003-07-15 2006-10-11 西蒙·埃克斯特伦 利用组合的样品处理和样品承载设备来分析样品的设备和方法
GB0720012D0 (en) * 2006-10-13 2007-11-21 Agilent Technologies Inc Time division multiplexing MS with beam converging capillary
CN101211741A (zh) * 2006-12-28 2008-07-02 东华理工学院 质谱仪多功能多通道离子源
US20090194687A1 (en) * 2008-02-01 2009-08-06 Charles Jolliffe Ion source vessel and methods
CN101959580A (zh) * 2008-01-16 2011-01-26 先正达参股股份有限公司 用于样品质量分析的设备、系统和方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000066265A2 (en) * 1999-04-27 2000-11-09 Ciphergen Biosystems, Inc. Probes for a gas phase ion spectrometer
US8217343B2 (en) * 2010-01-26 2012-07-10 Agilent Technologies, Inc. Device and method using microplasma array for ionizing samples for mass spectrometry
JP6757730B2 (ja) * 2014-12-31 2020-09-23 フリューダイム カナダ インコーポレイテッド マスサイトメトリーによる分析用の構造化生体試料

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5872010A (en) * 1995-07-21 1999-02-16 Northeastern University Microscale fluid handling system
WO2000041214A1 (en) * 1999-01-08 2000-07-13 Northeastern University ELECTRO-PNEUMATIC DISTRIBUTOR FOR MULTIPLEXED ν-TAS DEVICES
US20030224531A1 (en) * 2002-05-29 2003-12-04 Brennen Reid A. Microplate with an integrated microfluidic system for parallel processing minute volumes of fluids
CN1846136A (zh) * 2003-07-15 2006-10-11 西蒙·埃克斯特伦 利用组合的样品处理和样品承载设备来分析样品的设备和方法
US20050258359A1 (en) * 2004-05-19 2005-11-24 Ionalytics Corporation Multiple nano-spray delivery system for FAIMS
GB0720012D0 (en) * 2006-10-13 2007-11-21 Agilent Technologies Inc Time division multiplexing MS with beam converging capillary
CN101211741A (zh) * 2006-12-28 2008-07-02 东华理工学院 质谱仪多功能多通道离子源
CN101959580A (zh) * 2008-01-16 2011-01-26 先正达参股股份有限公司 用于样品质量分析的设备、系统和方法
US20090194687A1 (en) * 2008-02-01 2009-08-06 Charles Jolliffe Ion source vessel and methods

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022099907A1 (zh) * 2020-11-13 2022-05-19 广州禾信仪器股份有限公司 质谱检测系统及离子源装置

Also Published As

Publication number Publication date
US11367603B2 (en) 2022-06-21
US20200350150A1 (en) 2020-11-05
EP3707744A1 (en) 2020-09-16
JP2021502678A (ja) 2021-01-28
EP3707744A4 (en) 2021-08-11
CA3082352A1 (en) 2019-05-16
JP7293219B2 (ja) 2023-06-19
WO2019092640A1 (en) 2019-05-16

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Effective date of abandoning: 20240419