JP7293219B2 - 複数検体イオン源 - Google Patents
複数検体イオン源 Download PDFInfo
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- JP7293219B2 JP7293219B2 JP2020526006A JP2020526006A JP7293219B2 JP 7293219 B2 JP7293219 B2 JP 7293219B2 JP 2020526006 A JP2020526006 A JP 2020526006A JP 2020526006 A JP2020526006 A JP 2020526006A JP 7293219 B2 JP7293219 B2 JP 7293219B2
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0404—Capillaries used for transferring samples or ions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0409—Sample holders or containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/165—Electrospray ionisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Description
Claims (18)
- 質量分析器に検体を提供するためのデバイスであって、
複数のウェルをその中の所定位置に備える基板であって、
前記基板の前記複数のウェルの各々は、前記ウェルのうちの他のウェル内の検体と混合することなく、検体を受容および収容するように構成され、前記ウェルの各々は、検体がそこから出ることを可能にするためのウェル出口を備える、基板と、
前記ウェル出口のうちの少なくとも1つに流体連結されたチャネルであって、そこから出る検体イオンを前記質量分析器に案内するように構成された前記チャネルと、
前記ウェルのうちの少なくとも1つのウェル内の検体をそこから促すように構成された第1のガス源と、
前記ウェルのうちの選択された1つのウェル上の所定位置に配置して、前記ウェルのうちの前記選択された1つのウェルから検体を促すように構成された機械的並進器とを備えるデバイス。 - 前記ウェル出口の各々は、約50ミクロンの先端内径を有する導電性先端部を備える、請求項1に記載のデバイス。
- 前記質量分析器は、質量分光器である、請求項1に記載のデバイス。
- 前記質量分析器の入口に検体を輸送するために前記チャネルに輸送ガスを提供するように構成された第2のガス源をさらに備える、請求項3に記載のデバイス。
- 前記基板はプレートである、請求項1に記載のデバイス。
- 前記プレートは金属で形成されている、請求項5に記載のデバイス。
- 前記ウェルは、前記プレート内に規則的幾何学的パターンで配置されている、請求項6に記載のデバイス。
- 前記規則的幾何学的パターンは2次元アレイである、請求項7に記載のデバイス。
- 前記プレートは長方形である、請求項6に記載のデバイス。
- 前記プレートは円形である、請求項6に記載のデバイス。
- 前記プレートは、少なくとも96個の前記ウェルを備える、請求項5に記載のデバイス。
- 前記プレートは、少なくとも384個の前記ウェルを備える、請求項5に記載のデバイス。
- 前記プレートは、少なくとも1000個の前記ウェルを備える、請求項5に記載のデバイス。
- 前記ウェルはバイアルである、請求項5に記載のデバイス。
- 前記ウェルは、前記基板の一部として一体的に形成されている、請求項5に記載のデバイス。
- 前記プレートは取外し可能であり、前記ウェルは、
前記デバイスから離れた位置で充填され得る、請求項5に記載のデバイス。 - 前記チャネルは、前記プレートをその上に受容するように寸法決めされた容器内に形成されている、請求項16に記載のデバイス。
- 前記容器は、
前記質量分析器に取り付けるための出口を含む、請求項17に記載のデバイス。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201762584425P | 2017-11-10 | 2017-11-10 | |
US62/584,425 | 2017-11-10 | ||
PCT/IB2018/058793 WO2019092640A1 (en) | 2017-11-10 | 2018-11-08 | Multiple analyte ion source |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2021502678A JP2021502678A (ja) | 2021-01-28 |
JP2021502678A5 JP2021502678A5 (ja) | 2021-12-16 |
JP7293219B2 true JP7293219B2 (ja) | 2023-06-19 |
Family
ID=66438268
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2020526006A Active JP7293219B2 (ja) | 2017-11-10 | 2018-11-08 | 複数検体イオン源 |
Country Status (6)
Country | Link |
---|---|
US (1) | US11367603B2 (ja) |
EP (1) | EP3707744A4 (ja) |
JP (1) | JP7293219B2 (ja) |
CN (1) | CN111566779A (ja) |
CA (1) | CA3082352A1 (ja) |
WO (1) | WO2019092640A1 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112309823A (zh) * | 2020-11-13 | 2021-02-02 | 广州禾信仪器股份有限公司 | 质谱检测系统及离子源装置 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002515820A (ja) | 1995-07-21 | 2002-05-28 | ノースイースタン ユニバーシティ | 微量流体処理システム |
US20050258359A1 (en) | 2004-05-19 | 2005-11-24 | Ionalytics Corporation | Multiple nano-spray delivery system for FAIMS |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1155435A4 (en) * | 1999-01-08 | 2004-08-11 | Univ Northeastern | ELECTRO-PNEUMATIC DISTRIBUTOR FOR MULTIPLEX ANALYTICAL MICROSYSTEM DEVICES |
DE60045816D1 (de) * | 1999-04-27 | 2011-05-19 | Bio Rad Laboratories | Probenhalter für ein gasphaseionenspektrometer |
US20030224531A1 (en) * | 2002-05-29 | 2003-12-04 | Brennen Reid A. | Microplate with an integrated microfluidic system for parallel processing minute volumes of fluids |
SE0302074D0 (sv) * | 2003-07-15 | 2003-07-15 | Simon Ekstroem | Device and method for analysis of samples using a combined sample treatment and sample carrier device |
US20080087815A1 (en) * | 2006-10-13 | 2008-04-17 | Agilent Technologies, Inc. | Time division multiplexing MS with beam converging capillary |
CN101211741A (zh) * | 2006-12-28 | 2008-07-02 | 东华理工学院 | 质谱仪多功能多通道离子源 |
CA2711761A1 (en) * | 2008-01-16 | 2009-07-23 | Syngenta Participations Ag | Apparatus, system, and method for mass analysis of a sample |
US7659505B2 (en) * | 2008-02-01 | 2010-02-09 | Ionics Mass Spectrometry Group Inc. | Ion source vessel and methods |
US8217343B2 (en) * | 2010-01-26 | 2012-07-10 | Agilent Technologies, Inc. | Device and method using microplasma array for ionizing samples for mass spectrometry |
CA2972500C (en) * | 2014-12-31 | 2023-09-12 | Fluidigm Canada Inc. | Structured biological samples for analysis by mass cytometry |
-
2018
- 2018-11-08 EP EP18875976.5A patent/EP3707744A4/en active Pending
- 2018-11-08 CA CA3082352A patent/CA3082352A1/en active Pending
- 2018-11-08 WO PCT/IB2018/058793 patent/WO2019092640A1/en unknown
- 2018-11-08 CN CN201880085676.1A patent/CN111566779A/zh active Pending
- 2018-11-08 JP JP2020526006A patent/JP7293219B2/ja active Active
-
2020
- 2020-05-07 US US16/869,115 patent/US11367603B2/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002515820A (ja) | 1995-07-21 | 2002-05-28 | ノースイースタン ユニバーシティ | 微量流体処理システム |
US20050258359A1 (en) | 2004-05-19 | 2005-11-24 | Ionalytics Corporation | Multiple nano-spray delivery system for FAIMS |
Also Published As
Publication number | Publication date |
---|---|
US11367603B2 (en) | 2022-06-21 |
CN111566779A (zh) | 2020-08-21 |
EP3707744A1 (en) | 2020-09-16 |
EP3707744A4 (en) | 2021-08-11 |
CA3082352A1 (en) | 2019-05-16 |
JP2021502678A (ja) | 2021-01-28 |
US20200350150A1 (en) | 2020-11-05 |
WO2019092640A1 (en) | 2019-05-16 |
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