CN111562412B - Probe and circuit inspection device provided with same - Google Patents

Probe and circuit inspection device provided with same Download PDF

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Publication number
CN111562412B
CN111562412B CN202010070131.2A CN202010070131A CN111562412B CN 111562412 B CN111562412 B CN 111562412B CN 202010070131 A CN202010070131 A CN 202010070131A CN 111562412 B CN111562412 B CN 111562412B
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China
Prior art keywords
elastic
contact
longitudinal direction
probe
elastic part
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CN202010070131.2A
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Chinese (zh)
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CN111562412A (en
Inventor
朴炳圭
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Qixiang Co ltd
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Qixiang Co ltd
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Priority claimed from KR1020190139969A external-priority patent/KR102086391B1/en
Priority claimed from KR1020190139968A external-priority patent/KR102086390B1/en
Application filed by Qixiang Co ltd filed Critical Qixiang Co ltd
Publication of CN111562412A publication Critical patent/CN111562412A/en
Application granted granted Critical
Publication of CN111562412B publication Critical patent/CN111562412B/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The present invention relates to a probe, and more particularly, to a probe used for a conduction test and an operation characteristic test in a manufacturing process of an electronic product. The invention discloses a probe, comprising: an elastic part (100) which extends and contracts in the longitudinal direction; a first contact portion (200) formed at one end in the longitudinal direction of the elastic portion (100); and a second contact portion (300) formed at the other end of the elastic portion (100) in the longitudinal direction.

Description

Probe and circuit inspection device provided with same
Technical Field
The present invention relates to a probe and a circuit inspection apparatus having the same, and more particularly, to a probe used for a continuity inspection and an operation characteristic inspection in a manufacturing process of an electronic product and a circuit inspection apparatus having the same.
Background
In an electronic component module such as a video camera or a liquid crystal panel, conduction inspection, operation characteristic inspection, and the like are performed in a manufacturing process thereof, and in order to perform such inspection, an electrode portion of an FPC contact electrode for connecting to a main substrate provided in the electronic component module or a substrate to be bonded to the substrate connector and an inspection apparatus are connected using a probe.
That is, when the electrode portion in the electronic component module and the inspection apparatus are connected, the probe can be flexibly used to electrically connect the electrode portion and the inspection apparatus, and in this case, the probe can be stably contacted between the electrode terminal of the electronic component module and the inspection apparatus by an appropriate contact pressure.
On the other hand, in the case where a pogo pin including a spring is used for stable contact, a current-carrying circuit between the inspection object and the inspection apparatus is increased, and resistance is increased, which causes a problem that high power is required.
Disclosure of Invention
(problem to be solved)
The present invention has been made to solve the above-described problems of the present invention by providing a probe pin that improves the reliability of contact between an inspection target object and an inspection apparatus and reduces contact resistance.
(means for solving the problems)
The present invention is to solve the above-described problems, and discloses a probe including: an elastic part 100 which extends and contracts in a longitudinal direction; a first contact portion 200 formed at one end in a longitudinal direction of the elastic portion 100; and a second contact portion 300 formed at the other end of the elastic portion 100 in the longitudinal direction.
The elastic part 100 may include: a first elastic part 400 extending in a direction crossing the first contact part 200 and the longitudinal direction and formed in a direction spaced apart from the first contact part 200; a second elastic part 500 extending in a direction crossing the second contact part 300 and the longitudinal direction and formed in a direction spaced apart from the first contact part 200; and a third elastic part 600 formed between the first elastic part 400 and the second elastic part 500 in a direction approaching the first contact part 200.
The first elastic part 400 may include: a first straight portion 410 extending in a direction orthogonal to the first contact portion 200 and the longitudinal direction; the first curved portion 420 is formed in a circular arc shape, and has one end connected to the first straight portion 410 and the other end connected to one end of the third elastic portion 600.
The first elastic part 400 may further include a protrusion 430, and the protrusion 430 is protruded from the bottom surface of the first linear part 410 to the lower side.
The second elastic part 500 may include: a second straight portion 510 extending in a direction orthogonal to the second contact portion 300 and the longitudinal direction; the second curved portion 520 is formed in a circular arc shape, and has one end connected to the second linear portion 510 and the other end connected to the other end of the third elastic portion 600.
The third elastic part 600 may include: a first connecting portion 610 extending from the first elastic portion 400 in a direction crossing the longitudinal direction and connected thereto; a second connection part 620 extending from the second elastic part 500 in a direction crossing the longitudinal direction; the third curved portion 630 is formed in a circular arc shape and connected between the first connection portion 610 and the second connection portion 620.
The first connection portion 610 may be formed to extend from the first elastic portion 400 in a direction toward the first contact portion 200.
The second connection part 620 may be formed to extend from the second elastic part 500 in a direction toward the second contact part 300.
The elastic portion 100 may be formed of a pair of elastic pieces 110 and 120 in a band shape arranged at a distance from each other.
The elastic part 100 may include at least one bridge 130, and the bridge 130 connects the pair of elastic pieces 110 and 120 in a band shape disposed at a spaced interval from each other.
The elastic part 100 may include: a first elastic part 400 extending in a direction crossing the first contact part 200 and the longitudinal direction and formed in a direction spaced apart from the first contact part 200; a second elastic part 500 extending in a direction crossing the second contact part 300 and the longitudinal direction and formed in a direction spaced apart from the first contact part 200; a fourth elastic part 1000 extended from the first elastic part 400 in a direction close to a virtual vertical line L connecting the first contact part 200 and the second contact part 300; a fifth elastic part 1100 extended from the fourth elastic part 1000 in a direction spaced apart from the vertical line L; and a sixth elastic part 1200 formed between the fifth elastic part 1100 and the second elastic part 500 in a direction close to the vertical line L.
The second elastic part 500 may include: a second straight portion 510 extending in a direction intersecting the second contact portion 300 and the longitudinal direction; and a second bent part 520 formed in a circular arc shape and having one end connected to the second linear part 510 and the other end connected to the other end of the sixth elastic part 1200.
The second contact portion 300 may include: a second connection part 310 extending in a direction crossing the vertical line L on a lower side of the elastic part 100; a second contact surface 320 formed to protrude downward from the second connection part 310 to contact the substrate; and a second extension part 330 formed to protrude upward from the second connection part 310 at the vertical line L side.
The second linear portion 510 may be disposed at the second extension portion 330.
In addition, the present invention discloses a circuit inspection apparatus including: a socket 700 in which a plurality of receiving grooves 710 are aligned in a row at the upper part; a plurality of probes 1 according to any of claims 1 to 14, mounted in said plurality of housing grooves 710; and a body part 800 coupled to the socket part 700 and formed with an opening 810 corresponding to the plurality of receiving grooves 710 to expose at least a portion of the probe 1 to the upper side.
The present invention may include a cover 900, the cover 900 being moved in up and down directions on the upper side of the body part 800, and moved up and down by pressurization, thereby exposing at least a portion of the probe 1 to the upper side.
The cover 900 may include: a cover plate 910 formed with a plurality of open grooves 911 corresponding to the plurality of receiving grooves 710; and a plurality of elastic bodies 920 disposed between the cover plate 910 and the main body 800, and configured to move the cover plate 910 up and down by a compression and restoring force.
The socket part 700 includes: a base 720 having a through groove 721 for exposing at least a part of the probe 1 to the lower side; and a housing portion 730 disposed on an upper surface of the base 720 to form the plurality of housing grooves 710 for mounting the plurality of probes 1.
(Effect of the invention)
The probe according to the present invention includes an elastic portion that can expand and contract in the longitudinal direction, and further, maintains stable contact in various environments between the inspection apparatus and the object to be inspected, and has an advantage of high contact reliability.
The probe of the present invention has an advantage of wider usability because it includes an elastic portion that can expand and contract in the longitudinal direction, and is applicable to various inspection objects.
In addition, the probe according to the present invention has an advantage of maintaining a contact path having a shortest distance in a contact state between the inspection apparatus and the inspection object, thereby improving contact reliability and reducing contact resistance.
The probe of the present invention has superior durability to the conventional pogo pin, and more particularly, when the conventional pogo pin is compressed and expanded 10 to 15 ten thousand times, the spring force is reduced, and thus the durability is reduced, but the probe of the present invention has an advantage in that the durability is maintained even when the elastic part is repeatedly compressed and expanded 80 to 120 ten thousand times.
Drawings
Fig. 1 is a perspective view of the shape of an inspection apparatus having a probe according to the present invention.
Fig. 2 is an exploded perspective view showing the structure of the inspection apparatus of fig. 1.
Fig. 3 is a sectional view showing the shape of the inspection apparatus of fig. 1.
Fig. 4 is a side view showing an example of a probe used in the inspection apparatus of fig. 1.
Fig. 5 is a side view showing another embodiment of a probe used in the inspection apparatus of fig. 1.
Fig. 6 is a side view showing another embodiment of a probe used in the inspection apparatus of fig. 1.
Fig. 7 is a side view showing another embodiment of a probe used in the inspection apparatus of fig. 1.
Fig. 8 is a side view showing another embodiment of a probe used in the inspection apparatus of fig. 1.
Fig. 9 is a side view showing another embodiment of a probe used in the inspection apparatus of fig. 1.
Fig. 10 is a side view showing another embodiment of a probe used in the inspection apparatus of fig. 1.
Fig. 11 is a side view showing another embodiment of a probe used in the inspection apparatus of fig. 1.
Fig. 12 is a side view showing another embodiment of a probe used in the inspection apparatus of fig. 1.
Fig. 13 is a side view showing another embodiment of a probe used in the inspection apparatus of fig. 1.
(description of reference numerals)
100: elastic portion 200: first contact part
300: second contact portion 400: a first elastic part
500: second elastic portion 600: third elastic part
700: the socket part 800: main body part
900: cover part
Detailed Description
Hereinafter, a probe according to the present invention and a circuit inspection apparatus provided with the probe will be described with reference to the drawings.
As shown in fig. 1 to 3, the circuit inspection apparatus of the present invention includes: a socket part 700 in which a plurality of receiving grooves 710 are aligned in a row; a plurality of probes 1 attached to the plurality of receiving grooves 710; and a body part 800 coupled to the socket part 700 and having an opening 810 formed corresponding to the plurality of receiving grooves 710 to expose at least a portion of the probe 1 to the upper side.
The circuit inspection apparatus of the present invention may further include a cover 900, wherein the cover 900 is coupled to an upper portion of the main body 800 to be movable in a vertical direction, and moves up and down by applying pressure, thereby exposing at least a portion of the probe 1 to an upper side.
In addition, the circuit inspection apparatus of the present invention may further include a substrate which is detachable from a lower side surface of the socket part 700 and contacts one end of the probe 1 for inspecting the inspection target object.
The inspection object of the present invention may have any structure as long as it is an electronic component used by electrical contact.
For example, the inspection target object may be used for inspecting FPC (Flexible Printed Circuit), FFC (Flexible Cable), a camera module used in a mobile phone, LCD, OLED, B2B connector, and the like.
The socket 700 may have various configurations as a configuration for discharging a row of the plurality of housing grooves 710 on the upper portion.
For example, as shown in fig. 2, the socket part 700 may include: a base 720 having a through-groove 721 formed therein for exposing at least a part of the probe 1 downward; the housing portion 730 is disposed on the upper surface of the base 720 to form a plurality of housing grooves 710 for mounting a plurality of probes 1.
That is, the socket part 700 is configured to be detachable from the body part 800 while mounting the plurality of probes 1, and is configured to be detachable from the body part 800 and to be replaceable with a part or all of the plurality of probes 1 when a part of the plurality of probes 1 is defective or damaged.
The base 720 may have various structures as a structure forming the through groove 721 exposing at least a part of the probe 1 to the lower side.
For example, the base 720 is a plate-shaped plate corresponding to the plurality of probes 1 mounted with the through grooves 721, and the second contact portions 300 of the probes 1 may be exposed downward.
Accordingly, the base 720 may be electrically contacted with a substrate (i.e., PCB) for inspection, which is disposed at a lower side.
On the other hand, the base 720 has at least one base bolt hole 722, preferably four base bolt holes 722 at corners, and is coupled to the body 800, which will be described later, by bolt coupling.
The housing portion 730 may have various configurations as a configuration in which a plurality of housing grooves 710 for mounting a plurality of probes 1 are formed on the upper surface of the base 720.
For example, the receiving portion 730 is formed to protrude upward from the upper surface of the base 720, and may include a plurality of receiving grooves 710, and a plurality of probes 1 may be mounted in a row in the plurality of receiving grooves 710.
On the other hand, the housing portion 730 may form a support surface 731, and be supported by the bottom surface of the housing groove 710 in surface contact with a second linear portion 510 of the probe 1, which will be described later.
The housing portion 730 may include a blocking portion 732, and the blocking portion 732 may cross the housing grooves 710 in an arrangement direction of the plurality of housing grooves 710 so that the pair of probes 1 are inserted symmetrically in the arrangement direction perpendicular to the plurality of housing grooves 710 arranged in a line.
The body part 800 may have various structures as a structure combined on the upper side of the socket part 700 and forming opening parts 810 corresponding to the plurality of receiving grooves 710 to expose at least a portion of the probe 1 to the upper side.
For example, the body part 800 may include: a body 820 having an opening 810 formed therein corresponding to the plurality of housing grooves 710 of the socket 700; a first blocking part 830 for inserting the base 720 into the lower surface of the main body part 820; and a second blocking portion 840 extending from the first blocking portion 830 to be inserted into the receiving portion 730.
That is, the main body 800 includes a main body 820 coupled to an upper side of the socket 700, and an opening 810 having a rectangular shape is formed on a plane to correspond to the plurality of receiving grooves 710 arranged in a line; at this time, the second blocking portion 840 and the first blocking portion 830 may be formed on the lower surface to be inserted into the receiving portion 730 and the base 720.
The body 820 may have various structures as a structure coupled to the socket 700 at the upper side.
The body 820 may have openings 810 corresponding in size to the plurality of receiving grooves 710 of the socket 700, and more specifically, the socket 700 may have body bolt holes 821 formed at positions corresponding to the base bolt holes 722, and the body bolt holes 821 may be bolt-coupled to the base 720.
Accordingly, the body 820 can be coupled to the base 720 by a bolt, and the socket 700 can be easily attached and detached by a bolt.
The first blocking portion 830 may have various structures as a structure for inserting the base 720 into the lower surface of the main body portion 820.
For example, the first blocking part 830 may be formed at a lower side surface of the body part 820 to correspond to the thickness of the base 720, and thus the bottom surface of the base 720 and the bottom surface of the body part 820 may be formed to be horizontal, whereby the bottom surface may be horizontal when the base 720 is inserted and combined with the body part 800.
The second blocking portion 840 may have various structures as a structure extending from the first blocking portion 830 to be inserted into the receiving portion 730.
For example, the second blocking portion 840 may be formed to extend from the first blocking portion 830 to be inserted into the receiving portion 730, and has a size corresponding to the receiving portion 730 formed to protrude to the upper side of the socket portion 700.
The second blocking portion 840 is inserted into the housing portion 730 with the probe 1 attached thereto, and is supported by an upper surface of the first linear portion 410, which will be described later.
The lid 900 may have various structures as a structure that can move in the vertical direction on the upper side of the main body 800 and move up and down by pressurization to expose at least a part of the probe 1 to the upper side.
For example, the cover 900 may include: a cover plate 910 having a plurality of open grooves 911 formed therein to correspond to the plurality of receiving grooves 710; and a plurality of elastic bodies 920 disposed between the cover plate 910 and the body part 800 to move the cover plate 910 up and down by a compression and restoring force.
The cover plate 910 may have various structures as a structure in which a plurality of opening grooves 911 are formed to correspond to a plurality of receiving grooves 710, and a portion of the upper sides of a plurality of probes 1 mounted and disposed in the plurality of receiving grooves 710 is exposed when moving up and down.
The cover plate 910 may have the following structure: an object to be inspected is placed on the upper side, and the object to be inspected is placed and pressed to move downward, so that a part of the upper side of the exposed probe 1 contacts an electrode portion of the object to be inspected.
Accordingly, the cover plate 910 accompanies contact with the inspection target object, and thus may be composed of an insulating material.
The cover plate 910 may include a cover bolt hole 912, and a bolt 930 to be bolted to the body part 800 may penetrate through the cover bolt hole 912.
That is, the cover plate 910 is coupled to the body part 800 by the bolts 930 passing through the cover bolt holes 912, and the cover bolt holes 912 may have a diameter larger than that of the bolts 930 so as to be vertically movable.
The plurality of elastic bodies 920 may have various structures as a structure disposed between the cover plate 910 and the main body 800 so that the cover plate 910 can move up and down.
For example, the plurality of elastic bodies 920 may have the following structure: at least one of the upper surface of the main body 800 and the lower surface of the cover plate 910 is partially inserted, and is compressed when the cover plate 910 is moved downward by the self weight of the object to be inspected or the pressure of the user, and when the external force is removed, the cover plate 910 is moved upward by the restoring force.
On the other hand, the elastic bodies 920 may be disposed at corners of the rectangular cover plate 910 and the main body 800, respectively.
On the other hand, as shown in fig. 1, the circuit inspection apparatus of the present invention can be applied to one main body 800 having a step height by combining a plurality of socket parts 700 and cover parts 900 to one main body 800, and adjusting the height of the housing part 730 of each socket part 700.
The plurality of probes 1 may have various structures as a structure mounted in the plurality of receiving grooves 710 to be in electrical contact with an electrode portion of the inspection object at an upper side and to be in contact with a substrate or a PCB for inspection at a lower side.
As shown in fig. 4 to 7, the probe of the present invention includes: an elastic part 100 which extends and contracts in a longitudinal direction; a first contact portion 200 formed at one end in the longitudinal direction of the elastic portion 100; the second contact portion 300 is formed at the other end of the elastic portion 100 in the longitudinal direction.
The elastic portion 100 may have various structures as a structure that is stretchable in the longitudinal direction.
For example, the elastic part 100 may include: a first elastic part 400 extending in a direction crossing the first contact part 200 with respect to a longitudinal direction connecting the first contact part 200 and the second contact part 300, and formed in a direction spaced apart from the first contact part 200; a second elastic part 500 extending in a direction crossing the second contact part 300 and the length direction and formed in a direction spaced apart from the first contact part 200; the third elastic part 600 is formed between the first elastic part 400 and the second elastic part 500 in a direction close to the first contact part 200.
The first elastic part 400 shown may have various structures as a structure extending in a defensive line crossing the first contact part 200 with respect to a length direction connecting the first contact part 200 and the second contact part 300 and formed in a direction spaced apart from the first contact part 200.
For example, the first elastic part 400 may include: a first straight portion 410 extending in a direction orthogonal to the first contact portion 200 and the longitudinal direction; the first bent portion 420 is formed in a circular arc shape, and has one end connected to the first straight portion 410 and the other end connected to one end of the third elastic portion 600.
In addition, the first elastic part 400 may further include a protrusion 430, and the protrusion 430 is formed to protrude downward from the bottom surface of the first linear part 410.
The first straight portion 410 may have various structures as a structure extending in a direction perpendicular to the first contact portion 200 and the longitudinal direction.
For example, the first straight portion 410 may be formed to be bent at a lower end of the first contact portion 200 in a horizontal direction, whereby an upper surface may be in surface contact with the main body 800.
The first straight portion 410 may be formed of a material having elasticity, and when the first contact portion 200 is pressed downward, one end connected to the first contact portion 200 is lowered downward while the other end connected to the first bent portion 420 is maintained, and thus the entire portion is expandable and contractible in the longitudinal direction.
On the other hand, the first straight portion 410 may connect the connection surface to the first contact portion 200 in parallel with the longitudinal direction; as another example, the connection surface may be connected to the first contact portion 200 so as to be orthogonal to the longitudinal direction, and the connection surface may be connected to the first contact portion 200 so as to be inclined to intersect the longitudinal direction.
The first bent portion 420 may have various structures as a structure of a circular arc having one end connected to the first straight portion 410 and the other end connected to one end of the third elastic portion 600.
For example, the first curved portion 420 may be formed to extend from the other end opposite to the one end of the first straight portion 410 connected to the first contact portion 200, and may be formed in a circular arc shape such that the virtual center is located below the first straight portion 410.
In this case, the first bent portion 420 may be formed to be easily inclined when the first straight portion 410 is deformed by pressure so as to be expanded and contracted in the longitudinal direction of the entire elastic portion 100, and thus the first bent portion 420 may have an angle of 180 or more with respect to the virtual center.
The protrusion 430 may have various structures as a structure formed to protrude downward from the bottom surface of the first linear part 410.
For example, the protrusion 430 may include: a first projecting surface 431 having a relatively gentle inclination with respect to the bottom surface of the first straight portion 410 in a short distance from the first contact portion 200; and a second projecting surface 432 extending from the first projecting surface 431 and having a relatively large inclination.
That is, as shown in fig. 6, the protrusion 430 may include: a first projecting face 431 projecting more and more downward on a side surface in a direction spaced apart from the first contact portion 200 side; the second projecting surface 432 extends from the first projecting surface 431 and gradually returns to the first straight portion 410 in a direction away from the first contact portion 200.
The first protruding surface 431 at this time may have a relatively large included angle with respect to an imaginary line parallel to the length direction; the second projecting surface 432 may have a relatively small angle with respect to an imaginary line parallel to the length direction.
That is, the first projecting surface 431 is formed to be relatively gently inclined; the second projecting surface 432 may be formed to have a relatively large inclination.
The second elastic part 500 may have various structures as a structure formed in a direction extending in a direction crossing the second contact part 300 and the longitudinal direction and spaced apart from the first contact part 200.
For example, the second elastic part 500 may include: a second straight portion 510 extending in a direction orthogonal to the second contact portion 300 and the longitudinal direction; the second bent portion 520 is formed in a circular arc shape, and has one end connected to the second linear portion 510 and the other end connected to the other end of the third elastic portion 600.
In addition, the second elastic part 500 may further include a protruding portion (not shown) formed toward the third elastic part 600 at an upper side facing the upper side of the second linear part 510 as a structure corresponding to the protruding portion 430 described above.
The second straight portion 510 may have various structures as a structure extending in a direction orthogonal to the second contact portion 300 and the longitudinal direction.
The second linear portion 510 may be formed to extend in the same direction as the first linear portion 410 in the longitudinal direction, and may be in surface contact with the support surface 731 of the receiving portion 730 of the socket portion 700.
The second linear portion 510 may be made of a stretchable material as a structure for supporting the first contact portion 200 to stretch when it is pressed, but may be made of a hard material.
That is, the second linear portion 510 may have the following structure: the first elastic part 400 and the third elastic part 600 are extended and contracted in the longitudinal direction by being supported by the supporting surface 731 of the accommodating part 730.
On the other hand, the second straight portion 510 may be connected to the second contact portion 300, similarly to the first straight portion 410, such that a connection surface with the second contact portion 300 is parallel to the longitudinal direction; as another example, the connection surface may be perpendicular to or obliquely cross the second contact portion 300 and the longitudinal direction.
The second curved part 520 may have various structures as a circular arc structure having one end connected to the second linear part 510 and the other end connected to the other end of the third elastic part 600.
For example, the second curved portion 520 may be formed to extend from the other end opposite to the end connected to the second contact portion 300 of the second linear portion 510, and may be formed in a circular arc shape such that the virtual center is located at the lower side of the second linear portion 510.
At this time, the second bending portion 520 may be easily inclined when it is deformed by pressurization of the second connection portion 620, which will be described later, so that the entire elastic portion 100 is expanded and contracted in the longitudinal direction, and thus the angle of the second bending portion 520 with respect to the virtual center may be 180 degrees or more.
The third elastic part 600 may have various structures as a structure formed between the first elastic part 400 and the second elastic part 500 in a direction approaching the first contact part 200.
For example, the third elastic part 600 may include: a first connection part 610 extending from the first elastic part 400 in a direction crossing the longitudinal direction and connected thereto; a second connection part 620 connected in a direction crossing the second elastic part 500 and the longitudinal direction; the third curved portion 630 is formed in a circular arc shape and connected between the first connection portion 610 and the second connection portion 620.
The first connection portion 610 may have various structures as a structure extending from the first elastic portion 400 in a direction crossing the longitudinal direction and connected thereto.
For example, the first connection portion 610 has one end connected to the third bent portion 630 and the other end connected to the first bent portion 420, and may be inclined in a direction crossing the longitudinal direction.
In more detail, as shown in fig. 4 to 7, the first connection portion 610 may have an inclination that rises more and more upward from the first bent portion 420 to the third bent portion 630.
That is, the first connection portion 610 may be formed to extend from the first elastic portion 400 in a direction toward the first contact portion 200.
Accordingly, the first connection portion 610 may reduce the overall resistance by contacting the third curved portion 630 with the first and second linear portions 410 and 510 when the elastic portion 100 is compressed.
The second connection part 620 may have various structures as a structure extending and connecting from the second elastic part 500 in a direction crossing the longitudinal direction.
For example, the second connection part 620 has one end connected to the third bent part 630 and the other end connected to the first bent part 420, and may be inclined in a direction crossing the longitudinal direction.
In more detail, the second connection part 620 may form an inclination that decreases more and more to a lower side from the second bent part 520 to the third bent part 630.
That is, the second connection part 620 may be formed to extend from the second elastic part 500 in a direction toward the second contact part 300.
Accordingly, the second connection part 620 brings the third bent part 630 into contact with the second linear part 510 when the elastic part 100 is compressed, thereby reducing the resistance.
The third curved portion 630 may have various structures as a circular arc structure connected between the first connection portion 610 and the second connection portion 620.
For example, the third curved portion 630 may form a circular arc shape between the first connection portion 610 and the second connection portion 620, and a center angle may be 180 degrees or more with respect to a virtual center.
On the other hand, the elastic portion 100 may be formed of a pair of band-shaped elastic pieces 110 and 120 arranged at a distance from each other.
In addition, the elastic part 100 may further include at least one bridge 130, and the bridge 130 connects a pair of elastic pieces 110 and 120 having a band shape disposed at a distance from each other.
The pair of elastic pieces 110 and 120 may have various structures as a structure in which the elastic portion 100 is configured in a band shape disposed at a distance from each other.
The pair of elastic pieces 110 and 120 may be disposed at intervals from each other as a stretchable material to increase the stretchability in the longitudinal direction.
The bridge 130 may have various structures as a structure for connecting the pair of elastic pieces 110, 120 across.
For example, the bridge 130 may connect the pair of elastic pieces 110 and 120 spaced apart from each other across the bridge, thereby preventing a gap from being formed between the pair of elastic pieces 110 and 120.
On the other hand, a plurality of bridges 130 may be formed, and in more detail, as shown in fig. 6, may be formed at the first straight portion 410 and the second connection portion 620, respectively.
This shortens the contact path between the object to be inspected and the substrate for inspection, and reduces the resistance.
The first contact portion 200 may have various structures as a structure formed at one end of the elastic portion 100 in the longitudinal direction.
In particular, the first contact portion 200 is exposed at least partially to the upper side of the lid portion 900, and is capable of contacting an electrode portion of the inspection object located on the upper side to conduct electrical conduction.
The first contact portion 200 may include: a first connection portion 210 formed to extend upward at one end of the elastic portion 100; the first contact surface 220 is formed at the end of the first connecting portion 210 and contacts an electrode portion of the inspection object.
The first connection portion 210 may be formed to extend upward from one end of the elastic portion 100 (in more detail, the first linear portion 410).
At this time, the first connection portion 210 may be formed in a band shape having at least a portion with a space.
The first contact surface 220 may have various structures as a structure formed at the end of the first connection portion 210 to contact the electrode portion of the inspection object.
As an example, the first contact surface 220 has a U-shaped groove, and thus may be stably brought into contact with an electrode portion of the inspection target object.
On the other hand, as another example, the first contact surface 220 may be formed with an inclination on a side surface thereof, and may also be formed with a central convex shape.
The second contact portion 300 may have various structures as a structure formed at the other end of the elastic portion 100 in the longitudinal direction.
In particular, at least a portion of the second contact portion 300 is exposed to the lower side of the socket portion 700, and thus may be contacted and energized with a substrate or PCB for inspection located at the lower side.
The second contact portion 300 may include: a second connection part 310 extended downward from the other end of the elastic part 100; and a second contact surface 320 formed at the end of the second connection part 310 to contact the substrate or the PCB.
In addition, the second contact portion 300 may further include an extension portion 330, and the extension portion 330 is formed to extend toward an opposite side of the second linear portion 510 with reference to the second connection portion 310.
The second connection portion 310 may be formed to extend downward from the other end (in more detail, the second linear portion 510) of the elastic portion 100.
The second contact surface 320 may have various structures as a structure formed at the end of the second connection part 310 to contact the substrate for inspection.
As an example, the second contact surface 320 forms a U-shaped groove, thereby inducing stable contact with an electrode portion of the inspection target object.
On the other hand, as another example, the second contact surface 320 may be formed with an inclination on a side surface thereof, and may also be formed with a central convex shape.
On the other hand, as shown in fig. 8, as another embodiment, the probe of the present invention may include: a first elastic part 400, the elastic part 100 extending in a direction crossing the first contact part 200 and the longitudinal direction and formed in a direction spaced apart from the first contact part 200; a second elastic part 500 extending in a direction crossing the second contact part 300 and the longitudinal direction and formed in a direction spaced apart from the first contact part 200; a fourth elastic part 1000 extended from the first elastic part 400 in a direction close to a virtual vertical line L connecting the first contact part 200 and the second contact part 300; a fifth elastic part 1100 extended from the fourth elastic part 1000 in a direction spaced apart from the vertical line L; and a sixth elastic part 1200 formed between the fifth elastic part 1100 and the second elastic part 500 in a direction close to the vertical line L.
In this case, the configuration of the first contact portion 200 is the same as that described above, and only the configuration different from the above embodiment in each configuration will be described below, and the same contents as those described above will be omitted.
The structure in which the second elastic part 500 extends in a direction crossing the second contact part 300 and the length direction and is formed in a direction spaced apart from the first contact part 200 may have various structures.
For example, the second elastic part 500 may include: a second straight portion 510 extending in a direction crossing the second contact portion 300 and the longitudinal direction; the second bent portion 520 is formed in a circular arc shape, and has one end connected to the second linear portion 510 and the other end connected to the other end of the sixth elastic portion 1200.
That is, the second straight portion 510 may be disposed in the second contact portion 300 in a direction intersecting the vertical line L.
The probe is characterized in that the second contact portion 300 includes: a second connection part 310 extending on the lower side of the elastic part 100 to be formed in a direction crossing the vertical line L; a second contact surface 320 formed to protrude downward from the second connection portion 310 and contacting the substrate; the second extending portion 330 is formed to protrude upward from the second connecting portion 310 on the vertical line L side.
The second connection portion 310 extends below the elastic portion 100, and may be formed in a direction crossing a vertical line L connecting the first contact portion 200 and the second contact portion 300.
That is, the second connection portion 310 is formed below the elastic portion 100 in a direction intersecting the vertical line L and can be brought into close contact with the support surface 731 of the receiving portion 730 of the socket portion 700.
In this case, the second connection portion 310 may be formed horizontally such that the bottom surface 311 may be closely attached to the supporting surface 731 of the receiving portion 730 and may be perpendicular to the vertical line L.
On the contrary, the second connection part 310 may be formed to be inclined at a lower side as it is farther from the vertical line L, to prevent the upper surface 312 from interfering with the flow generated by the elastic force of the second linear part 510 in the length direction.
In more detail, as shown in fig. 8, the second connection portion 310 may have an upper surface 312 parallel to a direction in which the external force of the second linear portion 510 is not applied, and may be formed to be inclined such that the thickness thereof is thicker as it approaches the vertical line L.
The second extending portion 330 may have various structures as a structure formed to protrude from the second connecting portion 310 to the upper side at the vertical line L side.
The second extension part 330 may be formed to protrude upward from the second connection part 310, and thus may be connected to the second linear part 510.
That is, the second straight portion 510 formed in parallel with the second connection portion 310 may be connected to the second extension portion 330 formed to protrude upward from the second connection portion 310 at the vertical line L side in a state of being formed in a direction close to the vertical line L side.
The fourth elastic part 1000 may have various structures as a structure extended from the first elastic part 400 in a direction close to a virtual vertical line L connecting between the first contact part 200 and the second contact part 300.
For example, the fourth elastic part 1000 may include: a fourth connecting portion 1010 extending and connected from the first elastic portion 300 in a direction crossing the longitudinal direction; a fifth connecting part 1020 extending and connecting from the fifth elastic part 1100 in a direction crossing the longitudinal direction; and a fourth bent portion 1030 formed in a circular arc shape and connected between the fourth connection portion 1010 and the fifth connection portion 1020.
In this case, the fourth connection portion 1010 and the fifth connection portion 1020 may be formed in a direction orthogonal to the longitudinal direction; as another example, in the case of the fourth connection portion 1010, the approximate vertical line L crosses the longitudinal direction in the direction toward the upper side; in the case of the fifth connection portion 1020, the direction toward the lower side intersects the longitudinal direction as the vertical line L approaches.
The fourth curved portion 1030 may be formed in a circular arc shape between the fourth connection portion 1010 and the fifth connection portion 1020, and may have a center angle of 180 degrees or more with respect to a virtual center.
The fifth elastic part 1100 may have various structures as a structure formed to extend from the fourth elastic part 1000 in a direction spaced apart from the vertical line L.
For example, the fifth elastic part 1100 may include a fifth bending part 1110 disposed between the fifth connecting part 1020 of the fourth elastic part 1000 and the sixth connecting part 1210 of the sixth elastic part 1200.
In this case, the fifth bent part 1110 may form a circular arc shape between the fifth connection part 1020 and the sixth connection part 1210, and may form 180 degrees or more with respect to a virtual center angle.
The sixth elastic part 1200 may have various structures as a structure formed to extend from the fifth elastic part 1100 in a direction spaced apart from the vertical line L.
For example, the sixth elastic part 1200 may have the same structure as the fourth elastic part 1000, and may include: a sixth connecting portion 1210 extending and connecting from the fifth elastic portion 1100 in a direction crossing the longitudinal direction; a seventh connection portion 1220 extending and connected from the second elastic portion 500 in a direction crossing the longitudinal direction; the sixth bending portion 1230 is formed in a circular arc shape and connected between the sixth connection portion 1210 and the seventh connection portion 1220.
In this case, the sixth connection portion 1210 and the seventh connection portion 1220 may be formed in a direction perpendicular to the longitudinal direction; as another example, in the case of the sixth connecting portion 1210, the closer to the vertical line L, the longer the length direction is, the more upward the length direction is; in the case of the seventh connecting portion 1220, the longitudinal direction intersects approximately near the vertical line L in a downward direction.
The sixth bending part 1230 may be formed in a circular arc shape between the sixth connection part 1210 and the seventh connection part 1220, and may be formed at a central angle of 180 degrees or more with respect to a virtual center.
On the other hand, as shown in fig. 10 to 13, the first contact part 200 of the present invention may include: a first connection portion 210 formed to extend upward at one end of the elastic portion 100; a first contact surface 220 formed at the end of the first connection portion 210 and contacting an electrode portion of the inspection target object; at this time, the first contact surface 220 may have various shapes.
For example, the first contact surface 220 may be formed in a shape having a width that is approximately narrower toward the upper side on the side surface so that the planar area becomes smaller toward the upper side; as another example, a shape having a wider width toward the upper side may be formed on the side surface to increase the planar area toward the upper side.
In addition, the first contact surface 220 has a concave shape on a contact surface contacting with the electrode portion, or may have a convex shape; as another example, a plane may of course be formed.
In addition, as shown in fig. 8 and 13, the second contact part 300 of the present invention may include: a second connection part 310 extended downward from the other end of the elastic part 100; and a second contact surface 320 formed at an end of the second connection part 310 to contact the substrate or the PCB.
At this time, the second contact surface 320 may be disposed on the side where the elastic portion 100 is formed with reference to the second connection portion 310; as another example, the other side opposite to the side on which the elastic part 100 is formed may be inclined.
The above description is only about a part of the preferred embodiments that can be realized by the present invention, and it is well known that the scope of the present invention is not limited to the above-described embodiments, and the technical ideas of the present invention and the fundamental technical ideas thereof described above should be all included in the scope of the present invention.

Claims (12)

1. A probe, comprising:
an elastic section (100) that extends and contracts in the longitudinal direction;
a first contact portion (200) formed at one end of the elastic portion (100) in the longitudinal direction;
a second contact portion (300) formed at the other end of the elastic portion (100) in the longitudinal direction;
the elastic part (100) includes:
a first elastic part (400) formed in a direction extending in a direction intersecting the first contact part (200) and the longitudinal direction and spaced apart from the first contact part (200); a second elastic part (500) extending in a direction crossing the second contact part (300) and the longitudinal direction and formed in a direction spaced apart from the first contact part (200); a third elastic part (600) formed between the first elastic part (400) and the second elastic part (500) in a direction approaching the first contact part (200);
the first elastic part (400) includes:
a first straight portion (410) extending in a direction orthogonal to the first contact portion (200) and the longitudinal direction;
a protrusion (430) formed to protrude downward from the bottom surface of the first linear portion (410);
the projection (430) includes:
a first projecting surface (431) which projects more and more downward on the side surface in a direction spaced from the first contact portion (200) side;
and a second projection surface (432) which extends from the first projection surface (431) and which gradually returns to the first straight portion (410) side in a direction away from the first contact portion (200).
2. The probe according to claim 1,
the first elastic part (400) includes:
and a first curved portion (420) formed in a circular arc shape, one end of which is connected to the first straight portion (410), and the other end of which is connected to one end of the third elastic portion (600).
3. The probe according to claim 1,
the second elastic part (500) includes:
a second straight portion (510) extending in a direction orthogonal to the second contact portion (300) and the longitudinal direction; and a second bent portion (520) formed in a circular arc shape, one end of which is connected to the second linear portion (510), and the other end of which is connected to the other end of the third elastic portion (600).
4. The probe of claim 3,
the third elastic part (600) includes:
a first connection part (610) extending from the first elastic part (400) in a direction intersecting the longitudinal direction and connected thereto; a second connection part (620) extending from the second elastic part (500) in a direction intersecting the longitudinal direction and connected thereto; and a third bent portion (630) formed in a circular arc shape and connected between the first connection portion (610) and the second connection portion (620).
5. The probe of claim 4,
the first connection portion (610) is formed to extend from the first elastic portion (400) in a direction toward the first contact portion (200).
6. The probe of claim 4,
the second connection portion (620) is formed to extend from the second elastic portion (500) in a direction toward the second contact portion (300).
7. The probe according to claim 1,
the elastic section (100) is formed of a pair of strip-shaped elastic pieces (110, 120) arranged apart from each other at a predetermined distance.
8. The probe of claim 7,
the elastic part (100) includes: at least one bridge (130), the bridge (130) connecting between the pair of elastic pieces (110, 120) in a band shape disposed apart from each other at a certain interval.
9. A circuit inspection apparatus, comprising:
a socket part (700) in which a plurality of housing grooves (710) are arranged in a row at the top;
a plurality of probes (1) attached to the plurality of housing grooves (710);
a body part (800) coupled to the socket part (700) and formed with an opening part (810) corresponding to the plurality of housing grooves (710) to expose at least a part of the probe (1) to the upper side;
the probe (1) comprises: an elastic section (100) that extends and contracts in the longitudinal direction;
a first contact portion (200) formed at one end of the elastic portion (100) in the longitudinal direction;
a second contact portion (300) formed at the other end of the elastic portion (100) in the longitudinal direction;
the elastic part (100) includes:
a first elastic part (400) formed in a direction extending in a direction intersecting the first contact part (200) and the longitudinal direction and spaced apart from the first contact part (200);
a second elastic part (500) extending in a direction crossing the second contact part (300) and the longitudinal direction and formed in a direction spaced apart from the first contact part (200);
a third elastic part (600) formed between the first elastic part (400) and the second elastic part (500) in a direction approaching the first contact part (200);
the first elastic part (400) includes:
a first straight portion (410) extending in a direction orthogonal to the first contact portion (200) and the longitudinal direction;
a protrusion (430) formed to protrude downward from the bottom surface of the first linear portion (410);
the projection (430) includes:
a first projecting surface (431) which projects more and more downward on the side surface in a direction spaced from the first contact portion (200) side;
and a second projection surface (432) which extends from the first projection surface (431) and which gradually returns to the first straight portion (410) side in a direction away from the first contact portion (200).
10. The circuit inspection apparatus according to claim 9, comprising:
and a cover (900) that moves in the vertical direction on the upper side of the main body (800) and moves up and down by pressure, thereby exposing at least a part of the probe (1) to the upper side.
11. The circuit inspection apparatus of claim 10,
the cover (900) includes:
a cover plate (910) formed with a plurality of open grooves (911) corresponding to the plurality of receiving grooves (710); and a plurality of elastic bodies (920) which are disposed between the cover plate (910) and the main body (800) and which move the cover plate (910) up and down by compression and restoring force.
12. The circuit inspection apparatus according to claim 9,
the socket portion (700) includes:
a base (720) which forms a through groove (721) and exposes at least a part of the probe (1) to the lower side; and a housing portion (730) disposed on an upper surface of the base (720) to form the plurality of housing grooves (710) to which the plurality of probes (1) are attached.
CN202010070131.2A 2019-11-05 2020-01-21 Probe and circuit inspection device provided with same Active CN111562412B (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
KR10-2019-0139969 2019-11-05
KR1020190139969A KR102086391B1 (en) 2019-11-05 2019-11-05 Apparatus for inspecting circuit suing the same
KR10-2019-0139968 2019-11-05
KR1020190139968A KR102086390B1 (en) 2019-11-05 2019-11-05 Probe pin

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KR20220023538A (en) * 2020-08-21 2022-03-02 주식회사 플라이업 Apparatus for inspecting circuit using the same
JP2022135106A (en) * 2021-03-04 2022-09-15 オムロン株式会社 Probe pin, inspection jig, and inspection jig unit
IT202100032882A1 (en) * 2021-12-29 2023-06-29 Technoprobe Spa Contact probe for measuring heads of electronic devices and related measuring head
TWI825798B (en) * 2022-06-22 2023-12-11 吳俊杰 Elastic probe and circuit test device

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CN102012441A (en) * 2009-09-03 2011-04-13 富士通电子零件有限公司 Probe and method of manufacturing probe
KR20100098584A (en) * 2010-07-23 2010-09-08 리노공업주식회사 Test socket for semiconductor chip
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