CN111505473A - Power supply mosfet detection device - Google Patents

Power supply mosfet detection device Download PDF

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Publication number
CN111505473A
CN111505473A CN201910098021.4A CN201910098021A CN111505473A CN 111505473 A CN111505473 A CN 111505473A CN 201910098021 A CN201910098021 A CN 201910098021A CN 111505473 A CN111505473 A CN 111505473A
Authority
CN
China
Prior art keywords
mainboard
power
power supply
mosfets
maintained
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201910098021.4A
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Chinese (zh)
Inventor
王昌盛
钟智敏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitac Computer Shunde Ltd
Shunda Computer Factory Co Ltd
Original Assignee
Shunda Computer Factory Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shunda Computer Factory Co Ltd filed Critical Shunda Computer Factory Co Ltd
Priority to CN201910098021.4A priority Critical patent/CN111505473A/en
Publication of CN111505473A publication Critical patent/CN111505473A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2621Circuits therefor for testing field effect transistors, i.e. FET's
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40Testing power supplies

Abstract

The utility model provides a power mosfet detection device, its a maintenance that is used for detecting to have power mosfet problem detects the mainboard, should wait to maintain and detect and be provided with a plurality of power mosfet on the mainboard, and these a few power mosfets divide into problematic and do not have two kinds of problematic, problematic still divide into bad piece and functional defective part, its characterized in that, this power mosfet detection device includes: the power supply device is used for providing a test rated voltage; the adjustable current limiting device is connected with the power supply device in series, can limit the load current to a preset current value, and when the mainboard to be maintained and detected is loaded with short circuits, the preset current value cannot cause secondary damage to other power supply mosfets or directly burn the mainboard to be maintained and detected; an inductor connected to the adjustable current limiting device; and the output test circuit is connected with the inductor and used for connecting and detecting the power mosfets on the mainboard to be maintained and detected and generating a detection result.

Description

Power supply mosfet detection device
Technical Field
The invention relates to a power supply mosfet detection device, in particular to a power supply mosfet detection device capable of effectively reducing the risk of burning a mainboard.
Background
In the production process of a server mainboard, related voltage test failures caused by power supply mosfet (metal oxide semiconductor field effect transistor) problems occur in batch in ICT (automatic on-line tester) tests, a large number of electronic components on the mainboard can be burnt out once the mainboard is electrified in the subsequent analysis and verification process, and the mainboard can be burnt out seriously to cause scrapping.
In the analysis process of the power supply mosfets, a large number of elements are burnt out when the main board is electrified, so that the problem caused by which mosfet cannot be accurately judged, the analysis is sent to a supplier for some samples with burnt short circuits, and the analysis result is often electrical overstress. The mosfet (without open short circuit) with poor functionality can not be sent to the supplier for analysis, so that the fault cause can not be clarified for a long time, and the quality problem can not be settled in time.
In the process of analyzing the power mosfets, in order to prevent the main board from being burned out, each power mosfet of the related circuit is replaced, and the number of times of replacing the package exceeds 3 times, so that the main board is scrapped (specified by the requirement of the customer). At present, power supply mosfets on a mainboard are distributed in a large number, sometimes, each group of power supply circuits has as many as 6 mosfets, and a device capable of accurately judging and analyzing power-on signals is urgently needed.
In view of this, the present invention provides a power mosfet detection apparatus capable of effectively reducing the risk of burning out the motherboard.
Disclosure of Invention
The invention aims to provide a power supply mosfet detection device which can effectively reduce the risk of burning a mainboard.
For solving above-mentioned technical problem, a power mosfet detection device, it is used for detecting a maintenance detection mainboard that has power mosfet problem, should wait to maintain and detect and be provided with a plurality of power mosfet on the mainboard, and these some power mosfets divide into problematic and two kinds that do not have the problem, problematic still divide into bad piece and functional defective part, and this power mosfet detection device includes:
the power supply device is used for providing a test rated voltage;
the adjustable current limiting device is connected with the power supply device in series, can limit the load current to a preset current value, and when the mainboard to be maintained and detected is loaded with short circuits, the preset current value cannot cause secondary damage to other power supply mosfets or directly burn the mainboard to be maintained and detected;
an inductor connected to the adjustable current limiting device; and
the output test circuit is connected to the inductor and used for connecting and detecting the power mosfets on the to-be-maintained detection mainboard, and a worker can judge the power mosfets with problems according to a detection result generated by the output test circuit.
Preferably, the detection result generated by the output test circuit includes detection information of each of the power mosfets.
Compared with the prior art, the power supply mosfet detection device provided by the invention has the advantages that the adjustable current limiting device is connected in series with the power supply device, the power supply device is used for electrifying and detecting the mainboard to be maintained and detected, the risk of burning the mainboard to be maintained and detected or a large number of burning parts can be reduced, meanwhile, specific power supply mosfet bad parts and functional bad parts can be accurately judged, the power supply mosfets are replaced in a targeted manner, the frequency of reworking and replacing the power supply mosfets is reduced, the requirement of a customer is met, and the production cost is favorably saved.
[ description of the drawings ]
Fig. 1 is a connection diagram of the power mosfet detecting device according to the present invention.
[ detailed description ] embodiments
Referring to fig. 1, the present invention provides a power mosfet detection apparatus for detecting a to-be-maintained main board 5 having a power mosfet problem, the to-be-maintained main board being provided with a plurality of power mosfets (not numbered), the power mosfets being classified into two types of problematic and non-problematic, problematic being further classified into defective devices and functional defective devices, the power mosfet detection apparatus comprising:
a power supply device 1 for providing a test rated voltage;
the adjustable current limiting device 2 is connected with the power supply device 1 in series, the adjustable current limiting device 2 can limit the load current to a preset current value, and when the to-be-maintained detection mainboard 5 is loaded with a short circuit, the preset current value cannot burn the to-be-maintained detection mainboard 6 or other electronic components on the to-be-maintained detection mainboard 6;
an inductor 3 connected to the adjustable current limiting device 2, wherein the inductor 3 is used for ensuring the stability and continuity of the output voltage of the power supply device 1; and
an output test circuit 4, it connects in this inductance 3, these power mosfets on this output test circuit 4 is used for connecting this maintenance detection mainboard 5 of treating, and the staff can judge these power mosfets that have a problem according to a testing result that this output test circuit 4 produced to change the maintenance in later stage.
In this embodiment, the detection result generated by the output test circuit 4 includes detection information of each of the power mosfets.
In summary, according to the power supply mosfet detection device of the invention, the adjustable current limiting device 2 is connected in series to the power supply device 1, and then the power supply detection is performed on the main board 5 to be maintained, so that the risk of burning the main board 5 to be maintained or a large number of burning parts can be reduced, meanwhile, specific power supply mosfet bad parts and functional bad parts can be accurately judged, the power supply mosfets can be replaced in a targeted manner, the frequency of replacing the power supply mosfets in a rework manner is reduced to meet the requirements of customers, and the production cost is saved.
The above description is only for the specific embodiments of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention, and all the changes or substitutions should be covered within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims (2)

1. The utility model provides a power mosfet detection device, its a maintenance that is used for detecting to have power mosfet problem detects the mainboard, should wait to maintain and detect and be provided with a plurality of power mosfet on the mainboard, and these a few power mosfets divide into problematic and do not have two kinds of problematic, problematic still divide into bad piece and functional defective part, its characterized in that, this power mosfet detection device includes:
the power supply device is used for providing a test rated voltage;
the adjustable current limiting device is connected with the power supply device in series, can limit the load current to a preset current value, and when the mainboard to be maintained and detected is loaded with short circuits, the preset current value cannot cause secondary damage to other power supply mosfets or directly burn the mainboard to be maintained and detected;
an inductor connected to the adjustable current limiting device; and
and the output test circuit is connected with the inductor and used for connecting and detecting the power mosfets on the mainboard to be maintained and detected and generating a detection result.
2. The apparatus of claim 1, wherein the detection result generated by the output test circuit comprises detection information of each of the power mosfets.
CN201910098021.4A 2019-01-31 2019-01-31 Power supply mosfet detection device Pending CN111505473A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910098021.4A CN111505473A (en) 2019-01-31 2019-01-31 Power supply mosfet detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910098021.4A CN111505473A (en) 2019-01-31 2019-01-31 Power supply mosfet detection device

Publications (1)

Publication Number Publication Date
CN111505473A true CN111505473A (en) 2020-08-07

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910098021.4A Pending CN111505473A (en) 2019-01-31 2019-01-31 Power supply mosfet detection device

Country Status (1)

Country Link
CN (1) CN111505473A (en)

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006084395A (en) * 2004-09-17 2006-03-30 Shibasoku:Kk Current limiting circuit, and testing device
US20130342237A1 (en) * 2012-06-21 2013-12-26 Hon Hai Precision Industry Co., Ltd. Power supply test device
CN103487765A (en) * 2012-06-13 2014-01-01 上海唐盛信息科技有限公司 Testing device for maintaining optical transmission device power module
US20140015345A1 (en) * 2012-07-10 2014-01-16 iLumisys, Inc Current limiting circuit for electrical devices
CN103760499A (en) * 2014-01-26 2014-04-30 广州视源电子科技股份有限公司 Power panel testing method and device
CN203909241U (en) * 2014-07-01 2014-10-29 中国西电电气股份有限公司 Universal power unit test platform for power devices
CN105548853A (en) * 2015-10-29 2016-05-04 温州墨熵微电子有限公司 High temperature reverse bias and high temperature gate bias test system for power device
CN106771972A (en) * 2016-12-29 2017-05-31 百富计算机技术(深圳)有限公司 A kind of automatic testing equipment, the system and method for POS mainboard
CN206848417U (en) * 2017-06-08 2018-01-05 北京华峰测控技术有限公司 A kind of high-voltage MOSFET water breakdown voltage multistation parallel measurement device
CN207232327U (en) * 2017-09-21 2018-04-13 济南浪潮高新科技投资发展有限公司 It is a kind of to be used for the test device based on Shen prestige processor control mainboard
CN109254182A (en) * 2018-10-12 2019-01-22 山东阅芯电子科技有限公司 The current limiting protecting method of power device dynamic test

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006084395A (en) * 2004-09-17 2006-03-30 Shibasoku:Kk Current limiting circuit, and testing device
CN103487765A (en) * 2012-06-13 2014-01-01 上海唐盛信息科技有限公司 Testing device for maintaining optical transmission device power module
US20130342237A1 (en) * 2012-06-21 2013-12-26 Hon Hai Precision Industry Co., Ltd. Power supply test device
US20140015345A1 (en) * 2012-07-10 2014-01-16 iLumisys, Inc Current limiting circuit for electrical devices
CN103760499A (en) * 2014-01-26 2014-04-30 广州视源电子科技股份有限公司 Power panel testing method and device
CN203909241U (en) * 2014-07-01 2014-10-29 中国西电电气股份有限公司 Universal power unit test platform for power devices
CN105548853A (en) * 2015-10-29 2016-05-04 温州墨熵微电子有限公司 High temperature reverse bias and high temperature gate bias test system for power device
CN106771972A (en) * 2016-12-29 2017-05-31 百富计算机技术(深圳)有限公司 A kind of automatic testing equipment, the system and method for POS mainboard
CN206848417U (en) * 2017-06-08 2018-01-05 北京华峰测控技术有限公司 A kind of high-voltage MOSFET water breakdown voltage multistation parallel measurement device
CN207232327U (en) * 2017-09-21 2018-04-13 济南浪潮高新科技投资发展有限公司 It is a kind of to be used for the test device based on Shen prestige processor control mainboard
CN109254182A (en) * 2018-10-12 2019-01-22 山东阅芯电子科技有限公司 The current limiting protecting method of power device dynamic test

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Application publication date: 20200807