CN111355492B - Comparator and analog-digital conversion circuit - Google Patents
Comparator and analog-digital conversion circuit Download PDFInfo
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- CN111355492B CN111355492B CN201811577291.5A CN201811577291A CN111355492B CN 111355492 B CN111355492 B CN 111355492B CN 201811577291 A CN201811577291 A CN 201811577291A CN 111355492 B CN111355492 B CN 111355492B
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
- H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
- H03K3/356—Bistable circuits
- H03K3/356017—Bistable circuits using additional transistors in the input circuit
- H03K3/356052—Bistable circuits using additional transistors in the input circuit using pass gates
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
- H03K3/356—Bistable circuits
- H03K3/356104—Bistable circuits using complementary field-effect transistors
- H03K3/356113—Bistable circuits using complementary field-effect transistors using additional transistors in the input circuit
- H03K3/35613—Bistable circuits using complementary field-effect transistors using additional transistors in the input circuit the input circuit having a differential configuration
- H03K3/356139—Bistable circuits using complementary field-effect transistors using additional transistors in the input circuit the input circuit having a differential configuration with synchronous operation
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
- H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
- H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
- H03K5/249—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors using clock signals
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/36—Analogue value compared with reference values simultaneously only, i.e. parallel type
- H03M1/361—Analogue value compared with reference values simultaneously only, i.e. parallel type having a separate comparator and reference value for each quantisation level, i.e. full flash converter type
Abstract
The invention relates to a comparator and an analog-digital conversion circuit. A comparator is suitable for comparing an input voltage with a reference voltage to generate a comparison result. The comparator includes a resistor circuit, a current source circuit and a transistor switch circuit. The resistance circuit receives first and second input voltages among the input voltages. The current source circuit provides a first current and a second current, and the first current, the second current and the resistance circuit generate a reference voltage. The transistor switch circuit generates a comparison result at an output end of the transistor switch circuit according to the first control voltage and the second control voltage at the input end of the transistor switch circuit. The current source circuit and the resistance circuit generate a first control voltage according to a first current and a first input voltage, and generate a second control voltage according to a second current and a second input voltage.
Description
Technical Field
The present disclosure relates to a comparator, and more particularly, to a comparator applicable to an analog-to-digital converter.
Background
In common signal processing applications, for example: applications such as digital wireless communication systems, digital voice processing, digital video processing, etc., require a high speed and high resolution converter. Among various high-speed analog-to-digital converters (ADCs), flash ADCs have a faster conversion speed.
The conventional flash analog-to-digital converter compares an input with a reference voltage by using a comparator to generate a thermometer code (thermometer code), and then converts the thermometer code into a digital code by using a decoder. Most of the comparators used in the conventional flash adc employ auto-zero comparators (auto-zero comparators), and the circuit architecture of the auto-zero comparators usually consists of a preamplifier and a latch. However, such a comparator is power consuming and complicated to route.
Another conventional comparator is generally composed of 4 input transistors (MOSFETs). However, such a comparator requires inputs of 4 input transistors and has a large parasitic capacitance at its output terminal, so that the switching speed is reduced. Although there are comparators with 2 input transistors, the offset correction circuit is designed at the output terminal, so the switching speed is relatively slow.
Disclosure of Invention
In one embodiment, a comparator is adapted to compare an input voltage with a reference voltage to generate a comparison result. The comparator comprises a resistance circuit, a current source circuit and a transistor switch circuit. The resistance circuit receives a first input voltage and a second input voltage. The current source circuit provides a first current and a second current, and the first current, the second current and the resistance circuit are used for generating a reference voltage. The transistor switch circuit comprises an input end and an output end, and generates a comparison result at the output end according to the first control voltage and the second control voltage at the input end. The current source circuit and the resistance circuit generate a first control voltage according to a first current and a first input voltage, and generate a second control voltage according to a second current and a second input voltage.
In some embodiments, the comparator further includes a regulating current source for providing a first regulating current and a second regulating current, wherein the first regulating current, the second regulating current and the resistor circuit are used for generating an operating voltage at the input terminal of the transistor switch circuit, so that the transistor switch circuit operates in a normal operation region. In some embodiments, the operating voltage is a common mode voltage.
In one embodiment, a comparator is adapted to compare an input voltage with a reference voltage to generate a comparison result. The comparator comprises a resistance circuit, a current source circuit and a transistor switch circuit. The resistance circuit receives an input voltage. The current source circuit provides a first current. The first current and resistance circuit is used for generating a reference voltage. The transistor switch circuit comprises an input end and an output end, and generates a comparison result at the output end according to a control voltage at the input end. The current source circuit and the resistance circuit generate control voltage according to the input voltage and the reference voltage.
In some embodiments, the comparator further comprises a coupling circuit connected in parallel with the resistor circuit for coupling the input voltage to the input terminal of the transistor switch circuit.
In some embodiments, the comparator further includes a latch circuit coupled to the output terminal of the transistor switch circuit for outputting the comparison result.
In some embodiments, the comparator further comprises an adjustable current source circuit for providing a second current, wherein the second current and the resistor circuit are used for generating a calibration voltage to calibrate the comparator.
In some embodiments, the comparator further includes an adjustment current source for providing an adjustment current, wherein the adjustment current and the resistance circuit are used for generating the operating voltage at the input terminal of the transistor switch circuit, so that the transistor switch circuit operates in the normal operation region.
In one embodiment, an analog-to-digital conversion circuit is adapted to convert an input voltage into a digital signal. Wherein the input voltage comprises a first input voltage and a second input voltage, and the analog-to-digital conversion circuit comprises: a resistance circuit, a current source circuit, a transistor switch circuit and a decoder. The resistance circuit receives a first input voltage and a second input voltage. The current source circuit provides a first current and a second current. The transistor switch circuit comprises an input end and an output end, and generates a comparison result at the output end according to a first control voltage and a second control voltage of the input end. The current source circuit and the resistance circuit generate a first control voltage according to a first current and a first input voltage, and generate a second control voltage according to a second current and a second input voltage. The decoder converts the comparison result into a digital signal.
In summary, according to the comparator and the analog-digital conversion circuit of the present invention, the output capacitance of the output terminal of the comparison stage is very small, so as to increase the overall conversion speed.
Drawings
Fig. 1 is a schematic diagram of a comparator according to an embodiment of the present disclosure.
Fig. 2 is a flowchart illustrating a comparison method according to an embodiment of the disclosure.
Fig. 3 is a circuit diagram of a comparator according to an embodiment of the present disclosure.
Fig. 4 is a schematic diagram of an analog-to-digital conversion circuit according to some embodiments of the present disclosure.
Detailed Description
Referring to fig. 1, fig. 1 is a schematic diagram of a comparator according to an embodiment of the present disclosure, the comparator is used for comparing an input voltage with a reference voltage to generate a comparison result. The following description will take a differential input voltage as an example, but the present invention is not limited thereto, and the comparator of the present invention can also be used for a single-ended input voltage.
As shown in fig. 1, the comparator 100 includes a transistor switch circuit 110, a resistance circuit 120, and a current source circuit 130. The resistor circuit 120 is coupled between the input terminal of the comparator 100 and the input terminal of the transistor switch circuit 110, and the current source circuit 130 is coupled to the input terminal of the transistor switch circuit 110. That is, the first terminal of the resistor circuit 120 is coupled to the input terminal of the comparator 100, and the second terminal of the resistor circuit 120 is coupled to the input terminal of the transistor switch circuit 110.
The resistor circuit 120 is configured to receive the input voltages Vip and Vin, and the current source circuit 130 inputs a current to the second terminal of the resistor circuit 120 or pumps a current from the second terminal of the resistor circuit 120. In some embodiments, the current source circuit 130 inputs the currents Irn and Irp to the second terminal of the resistor circuit 120, or pumps the currents Irn and Irp from the second terminal of the resistor circuit 120 to provide the reference voltage at the second terminal of the resistor circuit 120. In other words, the second terminal of the resistor circuit 120 outputs or receives the currents Irn and Irp from the current source circuit 130. Therefore, according to ohm's law, the combination of the currents Irn, irp and the resistance of the resistor circuit 120 can be used to generate the reference voltage. The current source circuit 130 may be implemented by one or more current sources.
In some embodiments, the currents Irn, irp are constant currents, respectively. In an exemplary embodiment, the current source circuit 130 includes a constant current source circuit 131. The constant current source circuit 131 is coupled to the resistor circuit 120, and the constant current source circuit 131 outputs constant currents Irn and Irp to the second terminal of the resistor circuit 120 (or pumps the constant currents Irn and Irp from the second terminal of the resistor circuit 120).
Referring to fig. 1 and fig. 2, the input terminal of the comparator 100 receives the input voltages Vip and Vin, the input voltages Vip and Vin are provided to the first terminal of the resistor circuit 120, and the reference voltages are provided by the currents Irn and Irp flowing through the resistor circuit 120, so as to form the control voltages Vcp and Vcn (step S11). At this time, control voltages Vcp, vcn are supplied to the input terminals of the transistor switch circuit 110, wherein the control voltages Vcp, vcn are related to the reference voltage.
When the input terminal of the transistor switch circuit 110 receives the control voltages Vcp and Vcn, the transistor switch circuit 110 generates a comparison result according to the control voltages Vcp and Vcn (step S13). Wherein the comparison result can be the thermometer codes Dp and Dn. More specifically, when Vcp > Vcn, the thermometer code Dp is 1, the thermometer code Dn is 0; conversely, when Vcp < Vcn, the thermometer code Dp is 1 and the thermometer code Dn is 0.
In some embodiments, comparator 100 also includes a latch circuit 150. Latch circuit 150 is coupled to the output of transistor switch circuit 110. The transistor switch circuit 110 generates a comparison result based on the control voltages Vcp, vcn, and outputs the comparison result from the output terminal of the transistor switch circuit 110 to the latch circuit 150. The latch circuit 150 latches the thermometer codes Dp and Dn generated by the transistor switch circuit 110, and outputs the thermometer codes Dp and Dn from the output terminal of the comparator 100 according to the clock signal CK.
In some embodiments, the second terminal of the resistor circuit 120 also receives or is pumped with currents Ion and Iop to provide the correction voltage. In other words, according to ohm's law, the combination of the currents Ion, iop and the resistance of the resistor circuit 120 can be used to realize the correction voltage, so as to eliminate the voltage offset caused by the internal circuit mismatch (mismatch) and other factors.
In an exemplary embodiment, the current source circuit 130 may further include an adjustable current source circuit 132, and the adjustable current source circuit 132 is coupled to the second terminal of the resistor circuit 120. The adjustable current source circuit 132 provides currents Ion, iop to the second terminal of the resistor circuit 120, or pumps currents Ion, iop from the second terminal of the resistor circuit 120, so as to provide a correction voltage at the second terminal of the resistor circuit 120.
In another example, the adjustable current source circuit 132 may be disposed outside the current source circuit 130 or the comparator 100. In some embodiments, the adjustable current source circuit 132 is controlled by the control circuit 30, wherein the control circuit 30 may be disposed inside or outside the comparator 100.
In an exemplary case where the comparator 100 does not perform the comparison operation, the control circuit 30 may short-circuit two terminals (the first terminal and the second terminal) of the resistor circuit 120 (which may be implemented by a switch controlled by the control circuit 30) and detect the output terminal of the comparator 100 to obtain the output of the latch circuit 150. Then, the control circuit 30 generates the setting signal Ss according to the output of the latch circuit 150 (e.g., the comparison result without comparison performed by the comparator 100), and outputs the generated setting signal Ss to the control terminal of the adjustable current source circuit 132, so that the adjustable current source circuit 132 provides (outputs or draws) the required currents Ion, iop according to the setting signal Ss. In an exemplary embodiment, the control circuit 30 may find the setting signal Ss corresponding to the output of the latch circuit 150 by a lookup table.
In some embodiments, adjustable current source circuit 132 may be implemented by one or more current sources.
It should be noted that, since the offset correction of the comparator 100 is implemented at the input terminal of the transistor switch circuit 110, the output capacitance of the output terminal of the comparator 100 is very small, thereby increasing the overall switching speed of the comparator 100.
In some embodiments, the comparator 100 may further include a coupling circuit 160, the coupling circuit 160 being connected in parallel to the resistance circuit 120. Here, the coupling circuit 160 can couple an Alternating Current (AC) signal to avoid signal delay. Furthermore, parasitic capacitors exist at the input terminals of the transistor switch circuit 110, and the parasitic capacitors respectively form equivalent low-pass filters with the resistor circuit 120, thereby reducing the overall conversion speed of the comparator 100; the input voltages Vip and Vin are coupled from the input terminal of the comparator 100 to the input terminal of the transistor switch circuit 110 through the coupling circuit 160, and the resistor circuit 120 and the parasitic capacitor of the transistor switch circuit 110 do not form an equivalent low-pass filter when viewed from the input terminal of the comparator 100, thereby increasing the overall conversion speed of the comparator 100. In some examples, the coupling circuit 160 may be implemented with a capacitor having a large capacitance.
In some embodiments, the comparator 100 may further include an adjustment current source circuit 180, and the adjustment current source circuit 180 is coupled to the input terminal of the transistor switch circuit 110. The adjustment current source circuit 180 provides an adjustment current to the input terminal of the transistor switch circuit 110, so as to provide an input operating voltage to the transistor switch circuit 110, such that the transistor switch circuit 110 can operate in a normal operating region. In this embodiment, the operating voltage may also be referred to as a common mode voltage.
Referring to fig. 3, fig. 3 is a circuit diagram of a comparator 100 according to an embodiment of the present disclosure. The transistor switch circuit 110 includes a transistor M1 and a transistor M2, and a source of the transistor M1 and a source of the transistor M2 are coupled to each other. The drain of the transistor M1 and the drain of the transistor M2 are coupled to the latch circuit 150. The source of the transistor M1 and the source of the transistor M2 are further coupled to ground through the switch transistor M5. Herein, the switching transistor M5 is controlled by the clock signal CK.
The resistor circuit 120 includes a resistor R1 and a resistor R2, wherein a first end of the resistor R1 is coupled to the first input terminal of the comparator 100, and a second end of the resistor R1 is coupled to the gate of the transistor M1; the first terminal of the resistor R2 is coupled to the second input terminal of the comparator 100, and the second terminal of the resistor R2 is coupled to the gate of the transistor M2.
In some embodiments, the gates of the transistors M1 and M2 have parasitic capacitances, and the parasitic capacitances and the corresponding resistors R1 and R2 form equivalent low-pass filters, respectively, thereby reducing the overall speed of the comparator 100. To solve this problem, the coupling circuit 160 connects the resistor circuit 120 in parallel, i.e. connects the capacitor C1 in parallel to the resistor R1 and connects the capacitor C2 in parallel to the resistor R2, and herein the capacitor C1 and the capacitor C2 couple the input voltage Vip and the input voltage Vin to the gates of the transistor M1 and the transistor M2, respectively, so that the parasitic capacitances of the transistor M1 and the transistor M2 do not affect the speed of the comparator 100.
When the comparator 100 performs the comparison operation, the first terminal of the resistor R1 receives the first input voltage Vip, and the second terminal of the resistor R1 receives the current Irn from the current source circuit 131 or the current Irn pumped by the current source circuit 131. Similarly, the first terminal of the resistor R2 receives the input voltage Vin, and the second terminal of the resistor R2 receives the current Irp from the current source circuit 131 or the current Irp pumped by the current source circuit 131. Then, the transistors M1 and M2 form thermometer codes Dn and Dp according to the level control voltage Vcp and the level control voltage Vcn. More specifically, assuming that the resistance values of the resistors R1 and R2 are R, when Vip-Vin > (Irp-Irn) × R, the thermometer code Dp is 1 and the thermometer code Dn is 0; accordingly, when Vip-Vin < (Irp-Irn) > R, the thermometer code Dp is 0 and the thermometer code Dn is 1, wherein (Irp-Irn) > R can be regarded as a reference voltage. Then, the latch circuit 150 outputs thermometer codes Dn and Dp from the second output terminal and the first output terminal of the comparator according to the clock signal CK.
In some embodiments, the constant current source circuit 131 includes two constant current sources 131a, 131b. The constant current source 131a is coupled to the second terminal of the resistor R1 and is used to provide a current Irn. The current source 131b is coupled to the second terminal of the resistor R2 and is used to provide a current Irp.
In one embodiment, adjustable current source circuit 132 may include two sets of adjustable current sources 132a, 132b. The adjustable current source 132a is coupled to the second terminal of the resistor R1 and is used to provide a current Ion. The adjustable current source 132b is coupled to the second terminal of the resistor R2 and is used to provide a current Iop, and the combination of the currents Ion, iop and the resistances of the resistors R1, R2 can be used to realize a correction voltage, so as to eliminate the voltage offset caused by the mismatch of the internal circuit. The currents Ion, iop provided by the adjustable current sources 132a, 132b can be adjusted by the control signal (e.g. the control signal Ss shown in fig. 1).
In one embodiment, the adjustment current source circuit 180 may include two sets of adjustment current sources 180a, 180b. The adjusting current source 180a is coupled to the second terminal of the resistor R1, the adjusting current source 180b is coupled to the second terminal of the resistor R2, and the adjusting current sources 180a and 180b are used for providing currents to the second terminals of the resistors R1 and R2, respectively, so as to provide the input common mode voltage to the transistor M1 and the transistor M2, so that the transistor M1 and the transistor M2 can operate in a normal operating region.
In some embodiments, the comparator 100 can also compare the single-ended input voltage with the reference voltage, for example, consider the input voltage Vip as the single-ended input voltage, and generate the reference voltage by using the current source 131a and the resistor R1, and consider the thermometer code Dn as the comparison result.
In some embodiments, the comparator 100 can be applied to the flash analog-to-digital conversion circuit 300. Referring to fig. 4, the flash adc circuit 400 may include the comparator and decoder 20 of any of the embodiments described above. The output terminal of the comparator is coupled to the decoder 20.
The comparator includes at least a transistor switch circuit 110, a resistance circuit 120, and a constant current source circuit 131. The configuration and operation of these circuits are substantially the same as described above, and thus are not described again. The decoder 20 converts the thermometer codes Dp, dn into a digital signal A0, such as a binary code (binary code) digital signal A0.
In summary, according to the comparator, the comparing method and the flash adc, the output capacitance of the output terminal of the comparing stage is very small, so that the overall speed can be relatively increased.
[ description of symbols ]
100 comparator 110 transistor switching circuit
120 resistance circuit 130 current source circuit
131 constant current source circuits 131a, 131b constant current sources
132 adjustable current source circuit 132a, 132b adjustable current source
150 latch circuit 160 coupling circuit
180-regulated current sources 180a, 180b
20 decoder 30 control circuit
C1 first capacitance C2 second capacitance
Parasitic capacitance of CK clock signal Cgp, cgan
Dp, dn thermometer code Irp, irn current
Iop, ion current M1 first transistor
M2 second transistor M3 third transistor
M4 fourth transistor M5 switching transistor
M7 switching transistor M8 switching transistor
R1 first resistor R2 second resistor
Vcp control voltage VDD power supply
Vip, vin input voltages Vcp, vcn control voltages.
Claims (20)
1. A comparator for comparing an input voltage with a reference voltage to generate a comparison result, wherein the input voltage comprises a first input voltage and a second input voltage, the comparator comprising:
a resistance circuit for receiving the first input voltage and the second input voltage;
a current source circuit for providing a first current and a second current, wherein the first current, the second current and the resistor circuit are used for generating the reference voltage; and
the transistor switch circuit is used for generating the comparison result at the output end according to a first control voltage and a second control voltage of the input end, wherein the current source circuit and the resistor circuit are used for generating the first control voltage according to the first current and the first input voltage and generating the second control voltage according to the second current and the second input voltage.
2. The comparator of claim 1, further comprising:
a coupling circuit, connected in parallel to the resistor circuit, for coupling the first input voltage and the second input voltage to the input terminal of the transistor switch circuit.
3. The comparator of claim 1, further comprising:
a latch circuit coupled to the output terminal of the transistor switch circuit for outputting the comparison result.
4. The comparator as claimed in claim 1, wherein the current source circuit comprises:
a constant current source for providing the first current and the second current; and
an adjustable current source circuit for providing a third current and a fourth current, wherein the third current, the fourth current and the resistor circuit are used for generating a correction voltage at the input end of the transistor switch circuit to correct the comparator.
5. The comparator of claim 1, further comprising:
an adjustable current source circuit for providing a third current and a fourth current, wherein the third current, the fourth current and the resistor circuit are used for generating a correction voltage at the input end of the transistor switch circuit to correct the comparator.
6. The comparator as claimed in claim 5, wherein the adjustable current source circuit provides the third current and the fourth current according to a setting signal outputted from a setting circuit, wherein the setting circuit is configured to generate the setting signal according to the comparison result when the resistor circuit is short-circuited.
7. The comparator of claim 1, further comprising:
the first adjusting current, the second adjusting current and the resistor circuit are used for generating a working voltage at the input end of the transistor switch circuit, so that the transistor switch circuit works in a normal operation area.
8. The comparator as claimed in claim 7, wherein the operating voltage is a common mode voltage.
9. A comparator for comparing an input voltage with a reference voltage to generate a comparison result, the comparator comprising:
a resistance circuit for receiving the input voltage;
a current source circuit for providing a first current, wherein the first current and the resistor circuit are used for generating the reference voltage; and
the transistor switch circuit comprises an input end and an output end, and is used for generating the comparison result at the output end according to a control voltage of the input end, wherein the current source circuit and the resistance circuit are used for generating the control voltage according to the input voltage and the reference voltage.
10. The comparator as claimed in claim 9, further comprising:
a coupling circuit, connected in parallel to the resistor circuit, for coupling the input voltage to the input terminal of the transistor switch circuit.
11. The comparator as claimed in claim 9, further comprising:
a latch circuit coupled to the output terminal of the transistor switch circuit for outputting the comparison result.
12. The comparator as claimed in claim 9, wherein the current source circuit comprises:
a constant current source for providing the first current; and
an adjustable current source circuit for providing a second current, wherein the second current and the resistor circuit are used for generating a correction voltage to correct the comparator.
13. The comparator as claimed in claim 9, further comprising:
an adjustable current source circuit for providing a second current, wherein the second current and the resistor circuit are used for generating a correction voltage to correct the comparator.
14. The comparator as claimed in claim 9, further comprising:
and the adjusting current source and the resistor circuit are used for generating a working voltage at the input end of the transistor switch circuit, so that the transistor switch circuit works in a normal operation area.
15. An analog-to-digital conversion circuit for converting an input voltage into a digital signal, wherein the input voltage comprises a first input voltage and a second input voltage, the analog-to-digital conversion circuit comprising:
a resistance circuit for receiving the first input voltage and the second input voltage;
a current source circuit for providing a first current and a second current;
a transistor switch circuit, including an input terminal and an output terminal, for generating a comparison result at the output terminal according to a first control voltage and a second control voltage at the input terminal, wherein the current source circuit and the resistor circuit are used for generating the first control voltage according to the first current and the first input voltage, and generating the second control voltage according to the second current and the second input voltage; and
a decoder for converting the comparison result into the digital signal.
16. The analog-to-digital conversion circuit of claim 15, further comprising:
a coupling circuit, connected in parallel to the resistor circuit, for coupling the first input voltage and the second input voltage to the input terminal of the transistor switch circuit.
17. The analog-to-digital conversion circuit of claim 15, further comprising:
a latch circuit coupled to the output terminal of the transistor switch circuit for outputting the comparison result to the decoder.
18. The analog-to-digital conversion circuit of claim 15, wherein the current source circuit comprises:
a constant current source for providing the first current and the second current; and
an adjustable current source circuit for providing a third current and a fourth current, wherein the third current, the fourth current and the resistor circuit are used for generating a correction voltage at the input end of the transistor switch circuit.
19. The analog-to-digital conversion circuit of claim 15, further comprising:
the adjustable current source circuit is used for providing a third current and a fourth current, wherein the third current, the fourth current and the resistor circuit are used for generating a positive correction voltage at the input end of the transistor switch circuit.
20. The analog-to-digital conversion circuit of claim 15, further comprising:
and the adjusting current and the resistor circuit are used for generating a common mode voltage at the input end of the transistor switch circuit, so that the transistor switch circuit works in a normal operation area.
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|---|---|---|---|
| CN201811577291.5A CN111355492B (en) | 2018-12-21 | 2018-12-21 | Comparator and analog-digital conversion circuit |
| TW108119237A TWI694678B (en) | 2018-12-21 | 2019-06-03 | Comparator circuit and analog to digital converter |
| US16/430,953 US10673454B1 (en) | 2018-12-21 | 2019-06-04 | Comparator circuit and analog to digital converter |
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| CN201811577291.5A CN111355492B (en) | 2018-12-21 | 2018-12-21 | Comparator and analog-digital conversion circuit |
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| CN111355492A CN111355492A (en) | 2020-06-30 |
| CN111355492B true CN111355492B (en) | 2023-03-24 |
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| TWI635702B (en) * | 2017-11-23 | 2018-09-11 | 晶豪科技股份有限公司 | Compensation circuit for input voltage offset of error amplifier |
| EP3562038B1 (en) * | 2018-04-27 | 2022-04-20 | IMEC vzw | A comparator circuit |
| US10461738B1 (en) * | 2018-05-31 | 2019-10-29 | Qualcomm Incorporated | Comparator architecture and related methods |
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| TW201041317A (en) * | 2009-05-15 | 2010-11-16 | Realtek Semiconductor Corp | Self-calibrated current source and DAC using the same and operation method thereof |
| CN101847981A (en) * | 2010-04-12 | 2010-09-29 | 无锡中星微电子有限公司 | Multi-input comparator and power switching circuit |
| CN102957430A (en) * | 2011-08-26 | 2013-03-06 | 比亚迪股份有限公司 | Modulus switching circuit |
| CN108933529A (en) * | 2017-05-22 | 2018-12-04 | 伟诠电子股份有限公司 | Power supply control device and power supply control system |
| CN107733433A (en) * | 2017-11-13 | 2018-02-23 | 英特格灵芯片(天津)有限公司 | A kind of current source calibration device and method |
| CN108880545A (en) * | 2018-07-06 | 2018-11-23 | 北京时代民芯科技有限公司 | Offset foreground calibration circuit and method for comparator of pipeline analog-to-digital converter |
Also Published As
| Publication number | Publication date |
|---|---|
| TW202025631A (en) | 2020-07-01 |
| US10673454B1 (en) | 2020-06-02 |
| TWI694678B (en) | 2020-05-21 |
| US20200204188A1 (en) | 2020-06-25 |
| CN111355492A (en) | 2020-06-30 |
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