CN111351949B - Sample testing method, sample analyzer and storage medium - Google Patents
Sample testing method, sample analyzer and storage medium Download PDFInfo
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- CN111351949B CN111351949B CN201811583856.0A CN201811583856A CN111351949B CN 111351949 B CN111351949 B CN 111351949B CN 201811583856 A CN201811583856 A CN 201811583856A CN 111351949 B CN111351949 B CN 111351949B
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- 238000012360 testing method Methods 0.000 title claims abstract description 422
- 238000002360 preparation method Methods 0.000 claims abstract description 86
- 238000004140 cleaning Methods 0.000 claims description 72
- 239000007788 liquid Substances 0.000 claims description 53
- 238000000034 method Methods 0.000 claims description 48
- 238000010586 diagram Methods 0.000 description 14
- 230000003203 everyday effect Effects 0.000 description 9
- 230000008569 process Effects 0.000 description 9
- 230000008859 change Effects 0.000 description 4
- 239000003153 chemical reaction reagent Substances 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 108010074051 C-Reactive Protein Proteins 0.000 description 2
- 102100032752 C-reactive protein Human genes 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 239000008280 blood Substances 0.000 description 2
- 210000004369 blood Anatomy 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 239000000047 product Substances 0.000 description 2
- 230000002354 daily effect Effects 0.000 description 1
- 239000012502 diagnostic product Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000000338 in vitro Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
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Abstract
The embodiment of the application discloses a sample testing method, a sample analyzer and a storage medium, comprising the following steps: acquiring the current moment and the current state of a sample analyzer; if the current time is within a preset test period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state; the sample analyzer in the test preparation state directly tests the sample applied for test after receiving the sample test instruction; after receiving the sample test instruction, the sample analyzer in the idle state executes the preparation flow before the sample test and then tests the sample applied for the test.
Description
Technical Field
The present application relates to the field of medical and detection, and relates to, but is not limited to, a sample testing method, a sample analyzer and a storage medium.
Background
Each sample analyzer in the sample analyzer pipeline automatically enters an idle state after analyzing a sample lot. If the operator is to start the next sample lot at this time, the instrument performs a pre-test procedure before the sample analysis can be started. For an operator, the time of receiving the test result of the second sample batch is the preparation time before the test+the time of sample analysis; in view of this phenomenon, the related art has an improvement in that an operator can set a time from starting a sample lot by the operator to the shortest time for the instrument to enter an idle state, but after the sample analysis is completed, the instrument needs to wait until the time point set by the operator arrives and then enter the idle state, and if the next sample lot arrives within this time, since the idle state is not entered, preparation before the test is not required to be performed, and the sample analysis is directly started. However, in this solution, after the last sample lot of the operator is obtained every day, the instrument still waits until it is time to be idle, which results in the operator working (e.g. loading reagents, consumables, daily maintenance, etc.) being pushed back every day.
Disclosure of Invention
Accordingly, embodiments of the present application provide a sample testing method, a sample analyzer, and a storage medium for solving at least one of the problems in the related art.
The technical scheme of the embodiment of the application is realized as follows:
In a first aspect, an embodiment of the present application provides a sample testing method, applied to a sample analyzer, including:
acquiring the current moment and the current state of a sample analyzer;
if the current time is within a preset test period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state; the sample analyzer in the test preparation state directly tests the sample applied for test after receiving the sample test instruction; after receiving the sample test instruction, the sample analyzer in the idle state executes the preparation flow before the sample test and then tests the sample applied for the test.
In a second aspect, embodiments of the present application provide a sample analyzer, the sample analyzer comprising a memory having stored thereon computer executable instructions and a processor, the processor executing the computer executable instructions on the memory being operable to:
acquiring the current moment and the current state of a sample analyzer;
if the current time is within a preset test period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state; the sample analyzer in the test preparation state directly tests the sample applied for test after receiving the sample test instruction; after receiving the sample test instruction, the sample analyzer in the idle state executes the preparation flow before the sample test and then tests the sample applied for the test.
In a third aspect, embodiments of the present application provide a storage medium having stored therein a program which, when executed by a processor, implements the steps of the sample testing method described above.
The embodiment of the application provides a sample testing method, a sample analyzer and a storage medium, wherein the current moment and the current state of the sample analyzer are obtained; if the current time is within a preset test period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state; the sample analyzer in the test preparation state directly tests the sample applied for test after receiving the sample test instruction; after receiving a sample test instruction, the sample analyzer in an idle state executes a preparation flow before sample test and tests a sample applied for test, so that the sample analyzer is controlled to be in a test preparation state within a preset period, frequent entering into the idle state is avoided, the time of test preparation (such as liquid path cleaning time) is greatly reduced, and a large amount of waiting time is saved for operators operating the equipment.
Drawings
FIG. 1 is a schematic diagram of a sample analyzer pipeline according to an embodiment of the present application;
FIG. 2 is a schematic diagram showing the change of the operation state of the sample analyzer with time in the related art;
FIG. 3 is another schematic diagram showing the change of the operation state of the sample analyzer with time in the related art;
FIG. 4A is a schematic diagram of a sample testing method according to an embodiment of the present application;
FIG. 4B is a schematic flow chart of another implementation of the sample testing method according to the embodiment of the present application;
FIG. 4C is a schematic diagram of another implementation flow chart of a sample testing method according to an embodiment of the present application;
FIG. 4D is a schematic diagram of another implementation flow chart of a sample testing method according to an embodiment of the present application;
FIG. 4E is a schematic flow chart of another implementation of the sample testing method according to the embodiment of the present application;
FIG. 4F is a schematic diagram of another implementation flow chart of a sample testing method according to an embodiment of the present application;
FIG. 5 is a schematic diagram of a sample testing method according to an embodiment of the present application;
FIG. 6 is a schematic diagram showing the change of the working state of the sample analyzer according to the embodiment of the present application with time;
FIG. 7 is a schematic diagram showing the composition of a sample analyzer according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application.
For a better understanding of the embodiments of the present invention, a description will be first given of a flow when sample analysis is performed in the related art.
FIG. 1 is a schematic structural diagram of a sample analyzer pipeline according to an embodiment of the present application, as shown in FIG. 1, the sample analyzer pipeline at least includes: an unloading platform 101, a sample analyzer 1, a sample analyzer 2 the sample analyzer n, the host 102 and the loading platform 103; as shown in fig. 1, the sample analyzers 1 to n are transported sequentially from the loading platform 103 to the unloading platform 101, and finally unloaded on the unloading platform 101. The host 104 is configured to receive a test result fed back after the sample analyzers 1 to n analyze the samples in the sample test tube rack; each sample analyzer also comprises a processor, and can independently control the sample analyzer to perform testing and the like. Before each sample analyzer is tested, preparation before testing is generally needed, including mechanical reset, liquid path cleaning and the like; wherein, the liquid path cleaning comprises pipeline cleaning, sample needle, reagent needle and the like cleaning. This pre-test preparation process consumes a lot of time, and in the related art, each sample analyzer automatically enters an idle state after analyzing a sample lot. If the operator is to start the next sample lot at this time, the sample analyzer performs a pre-test process before the sample analysis can be started. For the operator, the time of receiving the test result of the second sample batch is the preparation time before test+the time of sample analysis, as shown in fig. 2, after the sample analyzer is started, the sample 20 applies for the test at time t 0, then the preparation process before test is performed on the sample 20 (the time required for the preparation process before test is (t 1-t0)), after the preparation process before test is completed, the sample analysis is performed on the sample 20, the time required for the sample analysis is (t 2-t1), and the time of reporting the test result 201 corresponding to the test sample 20 to the operator is the time prepared before test plus the time of sample analysis (i.e. (t 2-t0)); when the next sample lot 21 applies for testing at time t 3, the process of preparing before testing is needed (the time when the preparation process before testing is completed is t 4), after the preparation process before testing is completed, the sample 21 is subjected to sample analysis, and the time required for sample analysis is (t 5-t4), so that the time for reporting the test result 211 corresponding to the test sample 21 to the operator is the time of preparing before testing plus the time for sample analysis (i.e., (t 5-t3)). For this phenomenon, in another related art, the operator may set a time from starting a sample lot by the operator to the shortest time for the instrument to enter the idle state, fig. 3 is another schematic diagram showing the time-varying working state of the sample analyzer in the related art, as shown in fig. 3, after the sample analyzer is started, the sample 30 applies for the test at the time t0, and then the sample 30 is first subjected to a preparation process before the test (the time required for the preparation process before the test is (t 1-t 0)), after the preparation process before the test is completed, the sample 30 is subjected to the sample analysis, and the time required for the sample analysis is (t 2-t 1), and then the time for the test result 301 corresponding to the test sample 30 is the time prepared before the test plus the time for the sample analysis (i.e., (t 2-t 0)); if the time of the test result 301 reported to the operator is less than the preset time 302 set by the operator, the sample analyzer enters an idle state when the time reaches the preset time 302; if the time for testing the samples 31 in the second sample lot exceeds the preset time 302, the sample analyzer needs to be prepared before testing, that is, the time for reporting the test result 311 corresponding to the test sample 31 to the operator is the time for preparing before testing plus the time for analyzing the samples, and a lot of time is still required.
In order to solve the above problems, an embodiment of the present application provides a sample testing method applied to a sample analyzer, and fig. 4A is a schematic flow chart of implementation of the sample testing method according to the embodiment of the present application, as shown in fig. 4A, the method includes the following steps:
step S401, the current time and the current state of the sample analyzer are obtained.
Here, the sample analyzer may be any blood analyzer or in-vitro diagnostic product, such as a pusher, a C-reactive protein (CRP) detector, a saccharification analyzer, a blood analyzer, or a reader, etc., and the number of each type of sample analyzer may be one or more in a pipeline. When the sample analysis system is used for detecting the sample, the partial sample analyzers can be used for detecting partial detection items of the sample, and the whole sample analyzers can also be used for detecting all detection items of the sample. The current state may be an untested state in which the sample analyzer is not tested, a tested state in which the sample analyzer is tested, or a pre-test ready state in which the sample analyzer is ready; the untested state of the sample analyzer also includes a test ready state, where the test ready state is a state in which the sample analyzer has no test task, but can begin testing at any time.
Step S402, if the current time is within a preset test period, and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test ready state.
Here, the sample analyzer is in a state without a test task, and it can be understood that no sample is being tested in the sample analyzer, and no sample is tested in the sample analyzer; the preset test period may be set by an operator according to the sample size required to be measured on the same day, for example, the time for testing the first sample is nine in the morning, and the time for testing the last sample is five in the afternoon, so that the preset test period is set to nine to five points, that is, the preparation process (such as mechanical reset, liquid path cleaning, etc.) before testing is required when only the first sample is tested, and when the second sample is tested, the second sample is directly tested without spending a great deal of time for preparation before testing. In this embodiment, in the preset test period, the sample analyzer has two states, namely, a test state of the test sample and a preparation state of the test sample, and the test flow starts to be executed when a test instruction is received in the preparation state. When the current moment of the sample analyzer is within a preset test period, the state of the default sample analyzer is a test preparation state when the sample analyzer does not perform sample test, and if a test task exists, the test state is switched to, and after the test is finished, the test preparation state is switched back.
Step S403, after the sample analyzer in the test preparation state receives the sample test instruction, the sample applied for test is directly tested.
Here, if the sample analyzer is in a test ready state, i.e., the current time after the sample analyzer tests the samples of one lot is within a preset test period, the test is directly performed on the samples for which the test is applied.
In step S404, after receiving the sample testing instruction, the sample analyzer in the idle state executes the preparation process before the sample testing and then tests the sample applied for testing.
Here, if the sample analyzer is in an idle state, that is, the current time after the sample analyzer finishes testing a batch of samples is not within the preset test period, the sample applied for testing is firstly subjected to a preparation process before testing, that is, firstly subjected to mechanical reset, liquid path cleaning and the like, and then is tested after the preparation process before testing is completed.
In this embodiment, the sample analyzer is controlled to be in a test ready state within a preset period of time, so that frequent entering into an idle state is avoided, the time for test preparation (for example, liquid path cleaning) is reduced, and a great amount of waiting time is saved for an operator operating the device.
An embodiment of the present application provides a sample testing method, and fig. 4B is a schematic flow chart of another implementation of the sample testing method according to the embodiment of the present application, as shown in fig. 4B, where the method includes the following steps:
step S421, the current time and the current state of the sample analyzer are obtained.
The sample analyzer comprises two working modes, namely a first mode and a second mode, and the sample analyzer is controlled to enter the working mode corresponding to the mode selection instruction according to the mode selection instruction input by an operator; the liquid path cleaning frequency corresponding to the sample analyzer in the first mode is lower than the liquid path cleaning frequency corresponding to the sample analyzer in the second mode. That is, the operator can autonomously select the operation mode of the sample analyzer, and when the operator wants to perform the rapid test, the operator can select the first mode with the smaller liquid path cleaning times; for example, when the current time of the sample analyzer is within the preset test period, the preparation process before the test is not needed for the sample applied for the test. When the operator has enough time to perform the test, the second mode of normal liquid path cleaning test can be selected, namely, the preset test period is not set (or a short preset test period is set), and the preparation flow before the test is required before each test sample.
Step S422, if the current time is within the preset test period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test ready state.
Here, if the current time is within a preset test period and the current state indicates that the sample analyzer is performing a sample test, the sample analyzer is controlled to enter a test ready state after the sample test is completed.
Step S423, after receiving the sample testing instruction, the sample analyzer in the testing preparation state switches to the testing state to test the sample applied for testing.
Here, when the sample analyzer is in the pre-test ready state, if a sample test instruction is received, that is, there is a sample for which a test is applied, the sample analyzer switches from the pre-test ready state to the non-test state, and tests the sample for which the test is applied.
Step S424, when the current test of the sample analyzer is completed and the current time is within the preset test period, controlling the sample analyzer to switch to the test ready state.
After the sample analyzer tests the sample tested by the application, and the current moment is still in the preset test period, when the current test of the sample analyzer is completed, the sample analyzer is switched to a test preparation state.
The above-mentioned step S423 and step S424 provide a way of implementing "the sample analyzer in the test ready state tests the sample applied for testing", in this way, after the sample analyzer in the test ready state receives the sample test instruction, the sample analyzer is directly switched to the test state, and the preparation process before the test is not needed, thereby saving the test time and saving the waiting time for the operator.
An embodiment of the present application provides a sample testing method, and fig. 4C is a schematic flow chart of another implementation of the sample testing method according to the embodiment of the present application, as shown in fig. 4C, where the method includes the following steps:
Step S431, obtaining a time when the sample analyzer first enters the test state in each preset time period in the I preset time periods, so as to obtain a first time set including I times.
Here, I is an integer of 1 or more. The I preset time periods may be I days, for example, seven days; each preset period may refer to each day; the step S431 may be understood as obtaining a time when the sample analyzer enters the test state for the first time every day within seven days, for example, a time when the sample analyzer enters the test state for the first time every day is nine points, but a preparation process before the test needs to be performed before the test is performed for the first time every day; so that the test can be performed directly for the sample to be tested for the next application, nine points per day can be set as the start time of the preset test period.
Step S432, obtaining the time when the sample analyzer exits the test state for the last time in each preset time period in the I preset time periods, and obtaining a second time set including the I times.
Here, if the time at which the test state is exited last time every day is five pm, four and a half may be taken as the end time of the preset test period.
Step S433, determining the preset test period according to the first time set and the second time set.
The above steps S431 to S433 provide a manner of implementing the "determining the preset test period", in which the time of entering the test state for the first time and the time of exiting the test state for the last time in each preset period are fully considered, so that the preset test period is determined according to the sample test amount and the sample test time, and further, the sample analyzer is prevented from frequently entering the idle state, and the time required for the process of preparing the sample for testing before the test in the preset test period is saved.
In step S434, the current time and the current state of the sample analyzer are obtained.
Step S435, if the current time is within the preset test period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test ready state.
In this embodiment, the preset test period is determined by fully considering the sample size to be tested, the start time and the end time of the test sample, so that the sample analyzer in the preset test period is ensured, and the preparation flow before testing is not required to be performed each time when the sample is tested, thereby saving the test time.
An embodiment of the present application provides a sample testing method, and fig. 4D is a schematic flow chart of another implementation of the sample testing method according to the embodiment of the present application, as shown in fig. 4D, the method includes the following steps:
In step 441, the current time and current state of the sample analyzer are obtained.
Step 442, if the current time is not within the preset test period and the current state of the sample analyzer is the test state, obtaining the time when the test of the sample analyzer is completed.
Here, if the current time of the sample analyzer is not within a preset test period, for example, the preset test period is nine a.m. to four pm, and if the current time is four and a half pm, and the sample analyzer is still in a test state, the time at which the sample test is completed is determined.
And step 443, updating the preset test period according to the time when the test of the sample analyzer is completed, and controlling the sample analyzer to enter the idle state.
Here, for example, the sample test of the last lot of five o 'clock is completed, then the end time of the preset test period is updated to five o' clock, and the sample analyzer is controlled to enter the idle state.
The above-mentioned step S442 and step S443 provide a manner of implementing "updating the preset test period", in which the preset test period is updated in real time according to the test completion time of the sample analyzer, so as to ensure that the sample analyzer does not frequently enter an idle state, and save the sample test time.
An embodiment of the present application provides a sample testing method, and fig. 4E is a schematic flow chart of another implementation of the sample testing method according to the embodiment of the present application, as shown in fig. 4E, where the method includes the following steps:
step S451, receiving input setting information for setting the preset test period.
Here, the operator can set the preset test period autonomously through the operation interface of the sample analyzer according to his own needs.
Step S452, determining the preset test period according to the setting information.
In step S453, the current time and the current state of the sample analyzer are acquired.
Step S454, if the current time is not within the preset test period and the sample analyzer does not have a test task, controlling the sample analyzer to enter an idle state.
Here, if the current time of the sample analyzer is not within the preset test period and there is no sample currently applied for testing, the sample analyzer enters an idle state.
In step S455, when the sample analyzer is switched from the idle state to the test state, a preparation process before the sample test is performed.
Here, when the sample analyzer in the idle state receives the test request of the sample applying for the test, the length of the time that the sample analyzer is in the idle state is first determined, if the time that the sample analyzer is in the idle state is less than the preset idle period, when the sample analyzer is switched from the idle state to the test state, the liquid path cleaning is not performed on the sample analyzer. However, if the sample analyzer is in the idle state for a time longer than the preset idle period, the liquid path cleaning is performed on the sample analyzer in the first cleaning mode (i.e., the weak cleaning mode) when the sample analyzer is switched from the idle state to the test state.
In this embodiment, the operator autonomously sets the preset test period according to his own needs, so that the sample analyzer does not need to perform a preparation process before testing the sample applied for testing in a suitable period according to his needs.
An embodiment of the present application provides a sample testing method, and fig. 4F is a schematic flow chart of another implementation of the sample testing method according to the embodiment of the present application, as shown in fig. 4F, where the method includes the following steps:
Step S461, the current time and the current state of the sample analyzer are acquired.
Step S462, if the current time is within a preset test period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state.
Step S463, if the sample analyzer does not perform the liquid path cleaning in the preset test period beyond a preset cleaning time period, performing the liquid path cleaning on the sample analyzer when the sample analyzer is in a test ready state or before the sample analyzer enters a test state.
Here, if the sample analyzer is in a preset test period for a long period of time, no pre-test preparation flow is performed for the samples for which the test is applied, in order to avoid the clogging of the liquid path, liquid path cleaning is performed on the sample analyzer when the sample analyzer is in the test preparation state or before the sample analyzer enters the test state. Or if the time that the sample analyzer is in the test preparation state is greater than the preset test preparation period, liquid path cleaning is performed on the sample analyzer according to a second cleaning mode. The cleaning time of the second cleaning mode is lower than that of the first cleaning mode. That is, if the sample analyzer is not subjected to a preparation process before the test for a long period of time (for example, is not subjected to the liquid path cleaning for a long period of time), the liquid path cleaning is performed in a weak cleaning manner (i.e., the second cleaning manner).
In this embodiment, by detecting the time when the sample analyzer is not performing liquid path cleaning, in order to avoid liquid path blockage caused by long-time non-liquid path cleaning, when the time when the sample analyzer is not performing liquid path cleaning exceeds the preset test preparation period, weak cleaning is performed on the liquid path, so that the cleaning time can be saved and the liquid path can be ensured not to be blocked.
An embodiment of the present application provides a sample testing method, and fig. 5 is a schematic flow chart of implementation of the sample testing method according to the embodiment of the present application, as shown in fig. 5, where the method includes the following steps:
Step S501, receiving input setting information for setting the preset test period.
Step S502, determining the preset test period according to the setting information.
Step S503, the current time and the current state of the sample analyzer are obtained.
Step S504, if the current time is within the preset test period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test ready state.
Here, if the current time is not within the preset test period and the current state of the sample analyzer is the test state, obtaining the time when the test of the sample analyzer is completed; and updating a preset test period according to the time when the test of the sample analyzer is completed, and controlling the sample analyzer to enter an idle state. If the time that the sample analyzer is in the idle state is less than the preset idle period, the liquid path cleaning is not performed on the sample analyzer when the sample analyzer is switched from the idle state to the test state. However, if the time during which the sample analyzer is in the idle state is greater than the preset idle period, the liquid path cleaning is performed on the sample analyzer in the first cleaning mode when the sample analyzer is switched from the idle state to the test state.
In step S505, if the sample analyzer does not perform the liquid path cleaning in the preset test period beyond the preset cleaning period, the liquid path cleaning is performed on the sample analyzer when the sample analyzer is in the test ready state or before the sample analyzer enters the test state.
In this embodiment, a preset test period is set according to the needs of the operator, and when the sample analyzer does not perform a preparation process before testing for a long time, the liquid path is cleaned, so that the test time can be saved, and the liquid path can be ensured not to be blocked.
In the related art, as shown in fig. 3, after the sample analysis is completed, the apparatus needs to wait until the time point set by the operator arrives, and then go idle, if the next sample lot arrives within this time, since no idle state is entered, preparation before the test is not required to be performed, and the sample analysis is directly started. However, after the last sample lot of the operator is obtained every day, the instrument still remains idle until the time is reached, which may result in the operator working (e.g., loading reagents, consumables, routine maintenance, etc.) being pushed back every day. Without solving the problem, the embodiment of the present application provides a sample testing method, fig. 6 is a schematic diagram showing the change of the working state of the sample analyzer according to the embodiment of the present application over time, as shown in fig. 6, an operator sets a fixed time point as a preset test period according to the sample size of each day (for example, if the time for completing the test of the last batch of samples every day is 16:00, in order to avoid suddenly increasing the sample batch, a waiting time of ten minutes is reserved, that is, 16:10 is set as the time for entering the idle state (that is, the ending time 60 of the preset test period)). When the sample analyzer is started and the first batch of samples 601 is tested at time t 0, a preparation process before testing is needed (the time required for the preparation process before testing is (t 1-t0)), after the preparation process before testing is completed, sample analysis is performed on the samples 601, and the time required for sample analysis is (t 2-t1), then the time for reporting the test result 602 corresponding to the test sample 601 to an operator is the time for preparation before testing plus the time for sample analysis (i.e., (t 2-t0)); if the time point t 2 is earlier than the time for entering the idle state set by the operator (i.e. the time point is within the preset test period), the idle state is not entered until the time for entering the idle state is reached; then when the second batch of samples 603 applies for testing at time t 3, the sample analyzer directly tests the samples without performing a preparation process before testing, if the testing of the samples 603 is completed at time t 4, that is, the time required for sample analysis on the samples 603 is (t 4-t2), then the time when the test results 604 corresponding to the test samples 603 are reported to the operator is time t 4. That is, none of the samples of the following batches need to be prepared before the test, except for the first batch, so that the time from the sample reaching the clinical laboratory to the sample analyzing the results is significantly reduced.
In other embodiments, an option may be added when each batch of samples is started, i.e., the operator may set the time point to enter idle by himself; or after each batch of samples is started, the sample analyzer does not enter an idle state until an operator actively clicks a button, so that the sample analyzer enters the idle state.
An embodiment of the present application provides a sample analyzer, fig. 7 is a schematic diagram of the composition of the sample analyzer according to the embodiment of the present application, as shown in fig. 7, the sample analyzer 700 includes a processor 701 and a memory 702, the memory 702 stores computer executable instructions, and the processor 701 implements when running the computer executable instructions on the memory: acquiring the current moment and the current state of a sample analyzer; if the current time is within a preset test period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state; the sample analyzer in the test preparation state directly tests the sample applied for test after receiving the sample test instruction; after receiving the sample test instruction, the sample analyzer in the idle state executes the preparation flow before the sample test and then tests the sample applied for the test.
In other embodiments, the sample analyzer 700 further comprises a display module 703 for displaying an operating mode display interface that provides options for a first mode and a second mode, the controller further controlling the sample analyzer to enter either the first mode or the second mode depending on the selected operating mode; the liquid path cleaning frequency corresponding to the sample analyzer in the first mode is lower than the liquid path cleaning frequency corresponding to the sample analyzer in the second mode.
In other embodiments, the sample analyzer 700 further includes a sample analysis module 704 for testing the sample and outputting test data to the display module 703 for display.
In other embodiments, the pre-sample testing preparation procedure includes at least one of the following operations: liquid path cleaning, mechanical reset, or liquid path reset.
In other embodiments, the processor 701 is configured to switch to a testing state after receiving a sample testing instruction from the sample analyzer in the testing ready state, so as to test a sample for which a test is applied;
And when the current test of the sample analyzer is completed and the current moment is within a preset test period, controlling the sample analyzer to switch to a test preparation state.
In other embodiments, the processor 701 is further configured to obtain a time when the sample analyzer first enters the test state in each of I preset time periods, so as to obtain a first time set including I times; wherein I is an integer greater than or equal to 1; acquiring the moment of the sample analyzer which finally exits from the test state in each preset time period of I preset time periods, and obtaining a second moment set containing I moments; and determining the preset test period according to the first time set and the second time set.
In other embodiments, the processor 701 is further configured to obtain a time when the sample analyzer is tested if the current time is not within a preset test period and the current state of the sample analyzer is a test state;
and updating the preset test period according to the time when the test of the sample analyzer is completed, and controlling the sample analyzer to enter the idle state.
In other embodiments, the processor 701 is further configured to receive input setting information for setting the preset test period;
and determining the preset test period according to the setting information.
In other embodiments, the processor 701 is further configured to control the sample analyzer to enter an idle state if the current time is not within a preset test period and the sample analyzer does not have a test task currently.
In other embodiments, the processor 701 is further configured to perform a preparation flow before the sample testing when the sample analyzer is switched from the idle state to the testing state.
In other embodiments, the processor 701 is further configured to perform liquid path cleaning on the sample analyzer when the sample analyzer is in a test ready state or before the sample analyzer enters a test state if the sample analyzer does not perform liquid path cleaning for more than a preset cleaning time period within the preset test period.
In other embodiments, the processor 701 is further configured to not perform a liquid path cleaning on the sample analyzer when the sample analyzer is switched from the idle state to the test state if the time the sample analyzer is in the idle state is less than a preset idle period; or (b)
If the time that the sample analyzer is in an idle state is greater than a preset idle period, when the sample analyzer is switched from the idle state to a test state, liquid path cleaning is performed on the sample analyzer according to a first cleaning mode; or (b)
If the time that the sample analyzer is in the test preparation state is longer than a preset test preparation period, performing liquid path cleaning on the sample analyzer according to a second cleaning mode; the cleaning time of the second cleaning mode is shorter than that of the first cleaning mode.
In other embodiments, the processor 701 is further configured to control the sample analyzer to enter a working mode corresponding to a mode selection instruction according to the mode selection instruction input by an operator; the liquid path cleaning frequency corresponding to the sample analyzer in the first mode is lower than the liquid path cleaning frequency corresponding to the sample analyzer in the second mode.
It should be noted that if the above-described determination method of the substance concentration is implemented in the form of a software functional module and sold or used as a separate product, it may also be stored in a computer-readable storage medium. Based on such understanding, the technical solutions of the embodiments of the present invention may be embodied in essence or in a part contributing to the prior art in the form of a software product stored in a storage medium, including several instructions for causing a computer device (which may be a personal computer or a server, etc.) to execute all or part of the methods described in the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read Only Memory (ROM), a magnetic disk, an optical disk, or other various media capable of storing program codes. Thus, embodiments of the invention are not limited to any specific combination of hardware and software.
Accordingly, an embodiment of the present invention further provides a computer storage medium having stored thereon computer executable instructions which when executed by a processor implement the steps of the sample testing method provided in the above embodiment.
The description of the sample analysis system and computer storage medium embodiments above is similar to that of the method embodiments described above, with similar benefits as the method embodiments. For technical details not disclosed in the sample analysis system and computer storage medium embodiments of the present application, please refer to the description of the method embodiments of the present application. It should be appreciated that reference throughout this specification to "one embodiment" or "an embodiment" means that a particular feature, structure or characteristic described in connection with the embodiment is included in at least one embodiment of the present application. Thus, the appearances of the phrases "in one embodiment" or "in an embodiment" in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. It should be understood that, in various embodiments of the present application, the sequence numbers of the foregoing processes do not mean the order of execution, and the order of execution of the processes should be determined by the functions and internal logic thereof, and should not constitute any limitation on the implementation process of the embodiments of the present application. The foregoing embodiment numbers of the present application are merely for the purpose of description, and do not represent the advantages or disadvantages of the embodiments. It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
In the several embodiments provided by the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. The above described device embodiments are only illustrative, e.g. the division of the units is only one logical function division, and there may be other divisions in practice, such as: multiple units or components may be combined or may be integrated into another system, or some features may be omitted, or not performed. In addition, the various components shown or discussed may be coupled or directly coupled or communicatively coupled to each other via some interface, whether indirectly coupled or communicatively coupled to devices or units, whether electrically, mechanically, or otherwise.
The units described above as separate components may or may not be physically separate, and components shown as units may or may not be physical units; can be located in one place or distributed to a plurality of network units; some or all of the units may be selected according to actual needs to achieve the purposes of the embodiment of the present application.
In addition, each functional unit in each embodiment of the present application may be integrated in one processing unit, or each unit may be separately used as one unit, or two or more units may be integrated in one unit; the integrated units may be implemented in hardware or in hardware plus software functional units.
Those of ordinary skill in the art will appreciate that: all or part of the steps for implementing the above method embodiments may be implemented by hardware related to program instructions, and the foregoing program may be stored in a computer readable storage medium, where the program, when executed, performs steps including the above method embodiments; and the aforementioned storage medium includes: a mobile storage device, a Read Only Memory (ROM), a magnetic disk or an optical disk, or the like, which can store program codes.
Or the above-described integrated units of the application may be stored in a computer-readable storage medium if implemented in the form of software functional modules and sold or used as separate products. Based on such understanding, the technical solution of the embodiments of the present application may be embodied essentially or in a part contributing to the related art in the form of a software product stored in a storage medium, including several instructions for causing a terminal to execute all or part of the methods described in the embodiments of the present application. And the aforementioned storage medium includes: various media capable of storing program codes, such as a removable storage device, a ROM, a magnetic disk, or an optical disk.
The above description is merely an embodiment of the present application, but the protection scope of the present application is not limited thereto, and any person skilled in the art can easily think about the changes or substitutions within the technical scope of the present application.
Claims (14)
1. A sample testing method for a sample analyzer, comprising:
acquiring the current moment and the current state of a sample analyzer;
If the current time is within a preset test period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state, wherein the test preparation state is a state that the sample analyzer has no test task but can start testing at any time; after the sample analyzer in the test preparation state receives the sample test instruction, the sample applied for test is directly tested, and the preparation flow before the sample test is not required to be executed;
And if the current time is not within the preset test period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter an idle state, and after receiving a sample test instruction, executing a preparation flow before sample test and then testing a sample for which test is applied.
2. The method of claim 1, wherein the pre-sample testing preparation procedure comprises at least one of: liquid path cleaning, mechanical reset, or liquid path reset.
3. The method according to claim 1, wherein the method further comprises:
After receiving a sample test instruction, the sample analyzer in the test preparation state is switched to a test state so as to test a sample applied for testing;
And when the current test of the sample analyzer is completed and the current moment is within a preset test period, controlling the sample analyzer to switch to a test preparation state.
4. The method of claim 1, wherein prior to the current time and current state of the acquired sample analyzer, the method further comprises:
acquiring the moment of the sample analyzer entering a test state for the first time in each preset time period of the I preset time periods, and obtaining a first moment set containing the I moments; wherein I is an integer greater than or equal to 1;
Acquiring the moment of the sample analyzer which finally exits from the test state in each preset time period of I preset time periods, and obtaining a second moment set containing I moments;
And determining the preset test period according to the first time set and the second time set.
5. The method according to claim 4, wherein the method further comprises:
If the current time is not within the preset test period and the current state of the sample analyzer is the test state, acquiring the time when the test of the sample analyzer is completed;
and updating the preset test period according to the time when the test of the sample analyzer is completed, and controlling the sample analyzer to enter the idle state.
6. The method of claim 1, wherein prior to the current time and current state of the acquired sample analyzer, the method further comprises:
receiving input setting information for setting the preset test period;
and determining the preset test period according to the setting information.
7. The method according to claim 1, wherein the method further comprises:
and when the sample analyzer is switched from the idle state to a testing state, executing a preparation flow before the sample testing.
8. The method according to claim 1, wherein the method further comprises:
and if the sample analyzer does not perform liquid path cleaning within the preset test period exceeding a preset cleaning time period, performing liquid path cleaning on the sample analyzer when the sample analyzer is in a test preparation state or before the sample analyzer enters a test state.
9. The method of claim 8, wherein the method further comprises:
If the time that the sample analyzer is in the idle state is less than a preset idle period, not performing liquid path cleaning on the sample analyzer when the sample analyzer is switched from the idle state to a test state; or (b)
If the time that the sample analyzer is in an idle state is greater than a preset idle period, when the sample analyzer is switched from the idle state to a test state, liquid path cleaning is performed on the sample analyzer according to a first cleaning mode; or (b)
If the time that the sample analyzer is in the test preparation state is longer than a preset test preparation period, performing liquid path cleaning on the sample analyzer according to a second cleaning mode; the cleaning time of the second cleaning mode is shorter than that of the first cleaning mode.
10. The method of claim 1, wherein the sample analyzer comprises two modes of operation: a first mode and a second mode, the method further comprising:
according to a mode selection instruction input by an operator, controlling the sample analyzer to enter a working mode corresponding to the mode selection instruction; the liquid path cleaning frequency corresponding to the sample analyzer in the first mode is lower than the liquid path cleaning frequency corresponding to the sample analyzer in the second mode.
11. A sample analyzer comprising a memory having stored thereon computer executable instructions and a processor that when executed performs the steps of:
acquiring the current moment and the current state of a sample analyzer;
if the current time is within a preset test period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state; the test preparation state is a state that the sample analyzer has no test task but can start testing at any time; after the sample analyzer in the test preparation state receives the sample test instruction, the sample applied for test is directly tested, and the preparation flow before the sample test is not required to be executed;
And if the current time is not in the preset test period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter an idle state, and after receiving a sample test instruction, executing a preparation flow before a sample test and then testing a sample applied for the test by the sample analyzer in the idle state, wherein the idle state is not in the preset test period.
12. The sample analyzer of claim 11, further comprising a display module for displaying an operating mode display interface, the operating mode display interface providing options for a first mode and a second mode, the controller further controlling the sample analyzer to enter either the first mode or the second mode based on the selected operating mode; the liquid path cleaning frequency corresponding to the sample analyzer in the first mode is lower than the liquid path cleaning frequency corresponding to the sample analyzer in the second mode.
13. The sample analyzer of claim 12, further comprising a sample analysis module for testing the sample and outputting test data to the display module for display.
14. A computer storage medium, characterized in that the computer storage medium has stored therein a program which, when executed by a processor, implements the method of any one of claims 1 to 10.
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| CN114474149B (en) * | 2021-12-21 | 2024-04-05 | 深圳优地科技有限公司 | Automatic test method, device, server and readable storage medium |
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