CN112578134A

CN112578134A - Sample analysis system and control method thereof

Info

Publication number: CN112578134A
Application number: CN201910942535.3A
Authority: CN
Inventors: 冷知见; 陶思理
Original assignee: Shenzhen Mindray Bio Medical Electronics Co Ltd
Current assignee: Shenzhen Mindray Bio Medical Electronics Co Ltd
Priority date: 2019-09-30
Filing date: 2019-09-30
Publication date: 2021-03-30

Abstract

A sample analysis system and a control method thereof, the method comprising: acquiring identification information of a sample to be detected; determining a test item of the sample to be tested according to the identification information of the sample to be tested; determining a scheduling plan of a sample to be tested according to a test project of the sample to be tested, wherein the scheduling plan at least comprises target analysis equipment which needs to perform the test project on the sample to be tested; and when the scheduling plan of the sample to be tested is determined, the target analysis equipment of the sample to be tested is also controlled to start preparation work before testing. Due to the fact that preparation work before testing of the target analysis equipment is started while the scheduling plan of the sample to be tested is determined, waiting time of the sample to be tested after the sample to be tested reaches the target analysis equipment is shortened, and testing efficiency and testing flux of the sample analysis system are improved.

Description

Sample analysis system and control method thereof

Technical Field

The invention relates to a sample analysis system and a control method thereof.

Background

An analysis apparatus for a sample is a type of instrument for performing an assay on a sample, and may include a cell analyzer, a hemagglutination instrument, a urine analyzer, a biochemical analyzer, an immunoassay analyzer, and the like. A common testing process is that an analysis device first adds a sample and a reagent into an empty reaction cup, then needs to mix the sample and the reagent uniformly, and after a period of incubation, measures a solution formed by the sample and the reagent to obtain a measurement result. Generally, the procedure of adding the sample and reagent to the cuvette and mixing them together has a great influence on the testing speed of the analysis apparatus. Research is now well conducted to improve, plan and speed up the above process, such as technicians introducing multiple sample and reagent aspirating syringes and planning their timing sequence to ultimately improve the testing speed, throughput and efficiency of the analytical equipment.

Another factor limiting the speed, throughput and efficiency of the assay is the sample introduction. Generally, a user puts samples into an analysis device in batches, and needs to pay attention to whether the analysis device completes the test of the samples of the current batch, if the test is completed, the user needs to put the samples of the next batch into the analysis device in time, otherwise, the analysis device is in an idle state, which reduces the test flux and the test efficiency of the analysis device; in addition, in practical situations, a sample often performs test items required to be performed on a plurality of analysis devices, for example, the sample needs to be put into one of the analysis devices for testing, and then put into an immunoassay device for performing immunoassay items, in which case, a user needs to put the sample into one of the analysis devices for testing, and pay attention to that the test on the current analysis device is completed all the time, if the test is completed, the sample needs to be taken out in time and put into another analysis device for testing of the remaining items, which needs to spend a lot of time and energy on the user, and a lot of time that the user does not take the sample out of the analysis device in time and put into another analysis device for testing continuously, so that the time for the final result of the sample is greatly delayed.

Therefore, with the demand for large numbers of assay samples, sample analysis systems have also emerged that are streamlined to test samples in order to meet high throughput and reduce time. The sample analysis system is characterized in that samples to be tested are put into one input module in a unified mode, the input module is used for scanning the samples to determine which test items need to be carried out on the samples, then the samples are dispatched into corresponding analysis equipment in sequence through the track to be tested, after the test in one analysis equipment is finished, if the samples need to be tested in other analysis equipment, the system can automatically dispatch the samples into the corresponding other analysis equipment again to be tested until all the items of the samples are tested.

Some progress has been made in how to improve the efficiency of testing a system of pipelined test samples, such as a sample analysis system, and the major improvement points of the technicians are focused on how to reasonably plan and schedule the samples.

Disclosure of Invention

The application provides a sample analysis system and a control method thereof.

According to a first aspect, there is provided in an embodiment a sample analysis system comprising:

the input module is used for receiving a sample to be detected put in by a user and acquiring identification information of the sample to be detected;

the pretreatment module is used for pretreating a sample to be detected received by the input module and comprises one or more of a centrifugation module, a serum detection module, a decapping module and a dispensing module; the centrifugal module is used for centrifuging a sample to be centrifuged; the serum detection module is used for detecting whether the serum amount of the sample is enough and/or whether the serum quality of the sample is qualified; the uncapping module is used for uncapping the centrifuged sample; the separate injection module is used for separating samples;

the analysis equipment is used for testing the sample to be tested; the analysis device comprises a sample component, a sample dispensing mechanism, a reagent component, a reagent dispensing mechanism, a reaction component, a measurement component and a cleaning mechanism; the sample part is used for bearing a sample; the sample dispensing mechanism is used for sucking a sample from the sample component and discharging the sample into a reaction cup to be loaded; the reagent component is used for bearing a reagent; the reagent dispensing mechanism is used for sucking the reagent from the reagent component and discharging the reagent into a reaction cup to be added with the reagent; the reaction component is provided with at least one placing position, and the placing position is used for placing the reaction cup and incubating the reaction liquid in the reaction cup; the measuring part is used for measuring the incubated reaction solution to obtain the test data of the sample; the cleaning mechanism is used for cleaning the reaction cup;

a post-processing module comprising one or more of a membrane addition/capping module, a refrigerated storage module, and a membrane removal/capping module; the film adding/capping module is used for adding films or caps to the samples; the refrigeration storage module is used for storing samples; the membrane removing/cover removing module is used for removing membranes or covers of the samples;

the track is used for sequentially connecting the input module, the pre-processing module, the plurality of sample analysis devices and the post-processing module;

the scheduling device is used for scheduling the samples to be tested through the track according to the scheduling plan of the samples to be tested; and

the processor is used for determining a test item of the sample to be tested according to the identification information of the sample to be tested, which is acquired by the input module, and determining a scheduling plan of the sample to be tested according to the test item of the sample to be tested, wherein the scheduling plan comprises all target analysis equipment which needs to perform the test item on the sample to be tested, and a path through which the sample to be tested reaches the target analysis equipment; when the scheduling plan of the sample to be detected is determined, the processor also judges whether the target analysis equipment of the sample to be detected has the analysis equipment which is not connected with the track and is closest to the pretreatment module, and if so, the processor also controls the corresponding target analysis equipment to start the cleaning mechanism of the corresponding target analysis equipment to clean the reaction cup.

According to a second aspect, there is provided in an embodiment a sample analysis system comprising:

the cascade analysis equipment is used for testing a sample to be tested;

a track for connecting the input module and the plurality of analysis devices;

the scheduling device is used for scheduling the samples to be tested through the track according to the scheduling plan of the samples to be tested;

the processor is used for determining a test item of the sample to be tested according to the identification information of the sample to be tested, which is acquired by the input module, and determining a scheduling plan of the sample to be tested according to the test item of the sample to be tested, wherein the scheduling plan at least comprises target analysis equipment which needs to perform the test item on the sample to be tested; when the scheduling plan of the sample to be tested is determined, the processor also controls the target analysis equipment of the sample to be tested to start preparation work before testing.

In an embodiment, when determining the scheduling plan of the sample to be tested, before controlling the target analysis device of the sample to be tested to start the preparation work before testing, the processor first determines whether the target analysis device of the sample to be tested has an analysis device that is not connected to the track and is closest to the input module, and if so, the processor controls the corresponding target analysis device to start the preparation work before testing.

In one embodiment, when determining the scheduling plan of the sample to be tested, the processor further controls the target analysis device of the sample to be tested to start the preparation before test, including: when a plurality of target analysis devices for the samples to be tested exist in the scheduling plan, the processor controls the plurality of target analysis devices to start preparation work before testing at the same time.

In one embodiment, an analysis apparatus includes a sample section, a sample dispensing mechanism, a reagent section, a reagent dispensing mechanism, a reaction section, a measurement section, and a washing mechanism; the sample part is used for bearing a sample; the sample dispensing mechanism is used for sucking a sample from the sample component and discharging the sample into a reaction cup to be loaded; the reagent component is used for bearing a reagent; the reagent dispensing mechanism is used for sucking the reagent from the reagent component and discharging the reagent into a reaction cup to be added with the reagent; the reaction component is provided with at least one placing position, and the placing position is used for placing the reaction cup and incubating the reaction liquid in the reaction cup; the measuring part is used for measuring the incubated reaction solution to obtain the test data of the sample; the cleaning mechanism is used for cleaning the reaction cup;

the processor controls the target analysis equipment of the sample to be tested to start preparation work before testing, and the preparation work comprises the following steps: the processor controls the target analysis equipment of the sample to be tested to start the cleaning mechanism of the target analysis equipment to clean the reaction cup.

In one embodiment, the target analysis device controls the washing mechanism thereof to wash the reaction cup according to a washing mode, wherein the washing mode comprises a sequential washing mode and a simultaneous washing mode.

In one embodiment, for any target analysis device, the processor obtains the number of samples to be detected of the target analysis device, and determines the cleaning mode of the target analysis device according to the number of samples to be detected of the target analysis device;

when the number of samples to be detected of the target analysis equipment is larger than the preset number, the processor determines that the cleaning mode of the target analysis equipment is a simultaneous cleaning mode; otherwise, the processor determines that the cleaning mode of the target analysis device is a sequential cleaning mode.

In one embodiment, for any target analysis device, the processor sets the washing mode of the target analysis device in response to a user setting command for the washing mode of the target analysis device.

In an embodiment, when it is determined that the target analysis device is recovered from the shielding state to the normal state, the processor controls the target analysis device to start the device, and then controls the target analysis device to prepare for a test.

According to a third aspect, there is provided in one embodiment a method of controlling a sample analysis system, the sample analysis system comprising a plurality of cascaded analysis devices, the method comprising:

acquiring identification information of a sample to be detected;

determining a test item of the sample to be tested according to the identification information of the sample to be tested;

determining a scheduling plan of the sample to be tested according to the test project of the sample to be tested; the scheduling plan at least comprises target analysis equipment for performing test items on the sample to be tested;

and when the scheduling plan of the sample to be tested is determined, the target analysis equipment of the sample to be tested is also controlled to start preparation work before testing.

In an embodiment, when determining the scheduling plan of the sample to be tested, before the target analysis device controlling the sample to be tested starts preparation before testing, it is determined whether the target analysis device of the sample to be tested has an analysis device that is not connected to the track and closest to the input module, and if so, the corresponding target analysis device is controlled to start preparation before testing.

In one embodiment, when determining the scheduling plan of the sample to be tested, the method further controls the target analysis device of the sample to be tested to start preparation before testing, including: when a plurality of target analysis devices of the sample to be tested exist in the scheduling plan, the plurality of target analysis devices are controlled to start preparation work before testing at the same time.

In one embodiment, the controlling the target analysis device of the sample to be tested to start the preparation before the test includes: and controlling the target analysis equipment of the sample to be detected to start cleaning the reaction cup.

In one embodiment, the method for controlling the target analysis equipment of the sample to be tested to start the cleaning of the reaction cup comprises the following steps:

acquiring a cleaning mode of target analysis equipment, wherein the cleaning mode comprises a sequential cleaning mode and a simultaneous cleaning mode;

and controlling the target analysis equipment to clean the reaction cup according to the cleaning mode.

In one embodiment, obtaining a cleaning pattern for a target analysis device comprises:

acquiring the number of samples to be detected of target analysis equipment, and determining a cleaning mode of the target analysis equipment according to the number of the samples to be detected of the target analysis equipment;

when the number of samples to be detected of the target analysis equipment is larger than the preset number, determining that the cleaning mode of the target analysis equipment is a simultaneous cleaning mode; otherwise, determining that the cleaning mode of the target analysis equipment is a sequential cleaning mode.

In one embodiment, obtaining a cleaning pattern for a target analysis device comprises: the washing mode of the target analysis apparatus is set in response to a user's setting command for the washing mode of the target analysis apparatus.

In an embodiment, when it is determined that the target analysis device is recovered from the shielding state to the normal state, the target analysis device is controlled to start the device, and then the target analysis device is controlled to prepare for a test.

According to a fourth aspect, an embodiment provides a computer readable storage medium comprising a program executable by a processor to implement a method as described in any of the embodiments herein.

According to the sample analysis system, the control method thereof and the computer-readable storage medium of the embodiment, the identification information of the sample to be detected is obtained; determining a test item of the sample to be tested according to the identification information of the sample to be tested; determining a scheduling plan of a sample to be tested according to a test project of the sample to be tested, wherein the scheduling plan at least comprises target analysis equipment which needs to perform the test project on the sample to be tested; and when the scheduling plan of the sample to be tested is determined, the target analysis equipment of the sample to be tested is also controlled to start preparation work before testing. Due to the fact that preparation work before testing of the target analysis equipment is started while the scheduling plan of the sample to be tested is determined, waiting time of the sample to be tested after the sample to be tested reaches the target analysis equipment is shortened, and testing efficiency and testing flux of the sample analysis system are improved.

Drawings

FIG. 1 is a schematic diagram of a sample analysis system according to an embodiment;

FIG. 2 is a schematic structural diagram of an analysis apparatus according to an embodiment;

FIG. 3 is a schematic structural view of a cleaning mechanism according to an embodiment;

FIG. 4 is a schematic diagram of a sample analysis system according to another embodiment;

FIG. 5 is a schematic diagram of a preprocessing module according to an embodiment;

FIG. 6 is a schematic diagram of an exemplary aftertreatment module;

FIG. 7 is a schematic structural diagram of a sample analysis system according to yet another embodiment;

FIG. 8 is a flow chart of a method of controlling a sample analysis system according to an embodiment;

fig. 9 is a flowchart of a control method of a sample analysis system according to another embodiment.

Detailed Description

The present invention will be described in further detail with reference to the following detailed description and accompanying drawings. Wherein like elements in different embodiments are numbered with like associated elements. In the following description, numerous details are set forth in order to provide a better understanding of the present application. However, those skilled in the art will readily recognize that some of the features may be omitted or replaced with other elements, materials, methods in different instances. In some instances, certain operations related to the present application have not been shown or described in detail in order to avoid obscuring the core of the present application from excessive description, and it is not necessary for those skilled in the art to describe these operations in detail, so that they may be fully understood from the description in the specification and the general knowledge in the art.

Furthermore, the features, operations, or characteristics described in the specification may be combined in any suitable manner to form various embodiments. Also, the various steps or actions in the method descriptions may be transposed or transposed in order, as will be apparent to one of ordinary skill in the art. Thus, the various sequences in the specification and drawings are for the purpose of describing certain embodiments only and are not intended to imply a required sequence unless otherwise indicated where such sequence must be followed.

The numbering of the components as such, e.g., "first", "second", etc., is used herein only to distinguish the objects as described, and does not have any sequential or technical meaning. The term "connected" and "coupled" when used in this application, unless otherwise indicated, includes both direct and indirect connections (couplings).

In the research on how to improve the testing efficiency of a system for pipelining test samples, such as a sample analysis system, the applicant does not follow the currently mainstream improvement direction, namely how to reasonably prescribe and schedule samples, but finds that the current analysis equipment has some problems in cascading into the sample analysis system, so that the testing efficiency of the system for pipelining test samples is researched and improved from another aspect. When the analysis device is used as a stand-alone device for testing, the analysis device generally scans a sample in a sample part (such as a sample tray or a rail-type sample introduction mechanism) of the analysis device, and then controls to suck the sample and discharge the sample into a reaction cup, and suck a reagent and discharge the reagent into the reaction cup, so as to complete a process of adding the sample and the reagent into the reaction cup. When a single machine is used for testing, the reaction cups are generally not cleaned in advance, because the reaction cups are cleaned if the test is not determined to be carried out, which causes waste of cleaning reagents. In a pipelined sample analysis system, after a plurality of analysis devices are cascaded, each analysis device is actually tested according to the same flow of a single machine, for example, when a user uniformly places a sample in an input module of the sample analysis system, the input module scans the sample, then determines the test items of the sample, plans to schedule the sample to which analysis devices to test, and then respectively schedules the sample to the corresponding analysis devices to test according to the planned scheme, for any analysis device on the pipeline, the analysis device will start to clean the reaction cup only after the sample enters the analysis device and the analysis device scans the sample (the analysis device needs to scan the sample to determine which items need to be tested on the device), the analysis device will start to clean the reaction cup, and the sample can only start to test after the analysis device cleans the reaction cup, thereby wasting much time. The applicant starts to improve immediately after the problem is solved, and provides a method for starting corresponding analysis equipment to clean reaction cups immediately when an input module uniformly placing samples scans and determines that the samples need to be scheduled to reach the analysis equipment to be tested, so that when a user reaches the corresponding equipment, the user does not need to waste time and wait for the analysis equipment to clean the reaction cups, namely a typical scene, for example, two analysis equipment are cascaded, the user uniformly places a batch of samples at the input module, the input module controls the two analysis equipment to start cleaning the reaction cups immediately when scanning and determining that the batch of samples need to be scheduled to be tested in the two analysis equipment respectively, thus after the samples are tested in the first analysis equipment, the second analysis equipment also prepares clean reaction cups for testing, and the samples can start to be tested immediately without waiting, time is saved, and testing efficiency is improved.

The present invention will be explained below.

Referring to fig. 1, a sample analysis system according to an embodiment may include an input module 10, a plurality of cascaded analysis devices 20, a track 30, a scheduling device 40, and a processor 50, which are described in detail below.

The input module 10 may be configured to receive a sample to be tested placed by a user and obtain identification information of the sample to be tested. A user may put a sample to be tested into the input module 10, and the input module 10 may scan a label, such as a barcode or a two-dimensional code, on the sample to be tested through a scanning device, for example, to obtain identification information of the sample to be tested. The identification information may include, for example, a sample number, a sample category, sample source information, and the like.

A plurality of analysis devices 20 are cascaded through a track 30. For example, more than three analytical devices 20 are shown, but it is to be understood that this is by way of illustration only and is not intended to limit the number of sample analysis systems. It is understood that the plurality of analysis devices 20 in the present invention may be the same type of analysis device, i.e. analysis device for measuring the same item, or different types of analysis devices, i.e. analysis devices for measuring different items, which may be configured according to the user's needs, and the present invention is not limited thereto. Referring to fig. 2, an analysis apparatus 20 according to an embodiment may include a sample unit 21, a sample dispensing mechanism 22, a reagent unit 23, a reagent dispensing mechanism 24, a reaction unit 25, a measurement unit 26, and a washing mechanism 27.

The sample block 21 is used to carry a sample. Some examples of the Sample unit 21 may include a Sample Delivery Module (SDM) and a front end rail; in other examples, the sample unit 21 may be a sample tray including a plurality of sample sites for placing samples such as sample tubes, and the sample tray may dispatch the samples to corresponding positions by rotating the tray structure, for example, positions for the sample dispensing mechanism 22 to suck the samples.

The sample dispensing mechanism 22 is used to suck a sample and discharge the sample into a reaction cup to be loaded. For example, the sample dispensing mechanism 22 may include a sample needle that performs a two-dimensional or three-dimensional motion in space by a two-dimensional or three-dimensional driving mechanism, so that the sample needle can move to aspirate a sample carried by the sample member 21 and to a cuvette to be loaded and discharge the sample to the cuvette.

The reagent component 23 is used to carry reagents. In one embodiment, the reagent member 23 may be a reagent disk, which is configured in a disk-shaped structure and has a plurality of positions for carrying reagent containers, and the reagent member 23 can rotate and drive the reagent containers carried by the reagent member to rotate to a specific position, for example, a position for sucking reagent by the reagent dispensing mechanism 24. The number of the reagent member 23 may be one or more.

The reagent dispensing mechanism 24 is used to suck a reagent and discharge it into a reaction cup to which the reagent is to be added. In one embodiment, the reagent dispensing mechanism 24 may include a reagent needle that performs a two-dimensional or three-dimensional motion in space by a two-dimensional or three-dimensional driving mechanism, so that the reagent needle can move to aspirate a reagent carried by the reagent unit 23 and to a cuvette to which the reagent is to be added and discharge the reagent to the cuvette.

The reaction unit 25 has at least one placement site for placing a cuvette and incubating a reaction solution in the cuvette. For example, the reaction component 25 may be a reaction tray, which is configured in a disc-shaped structure and has one or more placing positions for placing reaction cups, and the reaction tray can rotate and drive the reaction cups in the placing positions to rotate, so as to schedule the reaction cups in the reaction tray and incubate the reaction solution in the reaction cups.

The measuring unit 26 is used for performing optical measurement on the reaction solution after completion of the incubation, and obtaining reaction data of the sample. For example, the measuring unit 26 detects the light emission intensity of the reaction solution to be measured, and calculates the concentration of the component to be measured in the sample from the calibration curve. In one embodiment, the measuring part 26 is separately provided outside the reaction part 25.

The washing mechanism 27 may be used to wash the cuvette. Typically, the washing mechanism 27 washes the cuvettes before they are required to be tested. The cleaning mechanism 27 may be implemented using an existing cleaning structure or a cleaning structure that will come out in the future. In one embodiment, the cleaning mechanism 27 may include one or more stages of cleaning pins, each stage of cleaning pins determines whether to clean or not to clean the reaction cup according to the cleaning state of the reaction cup, so as to perform a corresponding cleaning operation. The following description will not be made by taking a 4-step wash pin as shown in FIG. 3 as an example. Each reaction cup to be cleaned, for example, a reaction cup marked in a dirty state, is sequentially and respectively cleaned by a 1 st-order cleaning needle (hereinafter referred to as a 1 st-order needle), a 2 nd-order cleaning needle (hereinafter referred to as a 2 nd-order needle), a 3 rd-order cleaning needle (hereinafter referred to as a 3 rd-order needle), and a 4 th-order cleaning needle (hereinafter referred to as a 4 th-order needle), wherein the 1 st-order needle is used for injecting cleaning liquid and sucking away waste liquid, the 2 nd-order needle and the 3 rd-order needle are used for injecting cleaning liquid and sucking away waste liquid, and the 4 th-order needle is not injected with liquid but sucking away waste liquid. The inside of the analysis apparatus 20 is connected to a liquid line device through a liquid line to realize the circulation of the cleaning liquid and the cleaning water, and the discharge of the waste water. The specific liquid pipeline connection modes are various, for example, in the first mode, the 1 st-order needle can absorb cleaning liquid from a cleaning agent container and absorb waste liquid after cleaning to a waste liquid container; the 2 nd-order needle and the 3 rd-order needle are independent and do not influence each other, and the liquid injection and the waste liquid suction can be respectively and independently controlled, namely, the washing water can be sucked from the washing water container, and the waste liquid after washing is sucked into the waste liquid container; the 4 th step needle can suck the waste liquid into a waste liquid container; for example, in the second mode, the liquid path connection mode of the 1 st-order needle and the 4 th-order needle is unchanged; the 2 nd order needle and the 3 rd order needle are simultaneously controlled to inject liquid and absorb waste liquid, namely washing water can be absorbed from a washing water container, and the waste liquid after washing is absorbed into a waste liquid container, wherein the simultaneous control of liquid injection and waste liquid absorption means that the 3 rd order needle is simultaneously injected when the 2 nd order needle is injected with liquid, and the 3 rd order needle is simultaneously absorbed with waste liquid when the 2 nd order needle is absorbed with waste liquid.

The above are some of the descriptions of the analysis device 20.

The rails 30 are used to connect the devices together. For example, the track 30 connects the input module 10 with a plurality of analytical devices 20 such that samples can be dispatched from the input module 10 to each analytical device 20 via the track 30 for testing.

The scheduling means 40 is used for scheduling samples through the track 30, for example, from the input module 10 to the analysis apparatus 20, to be scheduled from one analysis apparatus 20 to another analysis apparatus 20. In general, the scheduling device 40 may schedule the samples to be tested to the corresponding analysis equipment through the track 30 according to the scheduling plan of the samples to be tested.

The above is a description of some of the structures of the sample analysis system. The sample is generally subjected to a pretreatment before testing, such as centrifugation of the sample, and some sample analysis systems also integrate the pretreatment function. Referring to fig. 4, the sample analysis system of an embodiment may further include a pre-processing module 60 and/or a post-processing module 70, which will be described in detail below.

The preprocessing module 60 is configured to preprocess the sample to be detected received by the input module. Generally, after the user puts the sample into the input module 10, the input module 10 scans the sample, the scheduling device 40 then schedules the sample into the pre-processing module 60 for pre-processing, and the pre-processed sample is then scheduled into the corresponding analysis device 20 from the pre-processing module 60 for testing. In one embodiment, referring to fig. 5, the pre-treatment module 60 may include one or more of a centrifugation module 61, a serum detection module 62, a decapping module 63, and a dispensing module 64. The centrifugation module 61 is used for centrifuging a sample to be centrifuged, and the number of the centrifugation modules 61 may be one or more. The serum testing module 62 is used to test whether the serum content of the sample is sufficient and/or whether the serum quality of the sample is acceptable, to determine whether the centrifuged sample can be used for subsequent testing. The decapping module 63 is used for decapping the centrifuged sample — as will be understood, capping, coating, decapping, and decapping the sample herein, it refers to capping, coating, decapping, and decapping a sample tube containing the sample; typically, the sample is uncapped after centrifugation for subsequent dispensing or pipetting in the dispensing module 24 or in an analytical device. The dispensing module 64 is used for dispensing a sample, for example, a sample is divided into a plurality of samples, which are sent to different analysis devices 20 for measurement. The preprocessing module 60 generally has a preprocessing flow: the centrifugation module 61 receives the sample scheduled by the input module 10 and centrifuges the sample; the serum detection module 62 detects serum of the centrifuged sample, and determines whether the serum can be used for subsequent measurement, and if the serum is insufficient or the quality is not qualified, the serum cannot be used for subsequent measurement; if the detection is passed, the sample is dispatched to the decapping module 63, the decapping module 63 removes the cap of the sample, if the dispensing module 64 is available, the dispensing module 64 sorts the removed sample, then the sorted sample is dispatched to the corresponding analysis device 20 for measurement, and if the dispensing module 64 is not available, the sample is dispatched from the decapping module 63 to the corresponding analysis device 20 for measurement.

The post-processing module 70 is used to complete post-processing of the sample. In one embodiment, referring to fig. 6, the post-treatment module 70 includes one or more of a capping/filming module 71, a refrigerated storage module 72, and a decapping/decapping module 73. The membrane/capping module 71 is used for coating or capping the sample; the refrigerated storage module 72 is used to store samples; the stripping/decapping module 73 is used to strip or decap the sample. One typical post-processing flow of the post-processing module 70 is: after all the samples to be measured in the analysis equipment 20 are sucked, the samples are dispatched to a film/capping module 71, the film/capping module 71 performs film coating or capping on the measured samples, and then the samples are dispatched to a refrigeration storage module 72 for storage; if the sample requires retesting, the sample is dispatched from the refrigerated storage module 72, stripped or decapped in a stripping/decapping module 73, and then dispatched to the corresponding analytical equipment 20 for testing.

Fig. 7 is a schematic structural diagram of a sample analysis system including a pre-processing module 60 and a post-processing module 70 according to the present invention. As shown in fig. 7, each device or module may be further provided with a module buffer, the track 30 may also have a track buffer, and the whole track may be a circular track. It should be noted that there is only one module in each type shown in the figures, but those skilled in the art will understand that there is no limitation on the number, for example, there may be more centrifugal modules 61, more decapping modules 63, etc.

The above is a description of some of the structures of the sample analysis system of some embodiments of the present invention.

In an embodiment of the present invention, after the input module 10 obtains the identification information of the sample to be tested, the processor 50 may determine the test item of the sample to be tested according to the identification information of the sample to be tested obtained by the input module 10, and determine the scheduling plan of the sample to be tested according to the test item of the sample to be tested, where the scheduling plan at least includes a target analysis device that needs to perform its test item on the sample to be tested. In some examples, the schedule plan further includes paths for the samples to reach the target analysis devices, which may typically include an order in which the samples reach the target analysis devices, such as which target analysis device to test first and then which target analysis device to test. It should be noted that, the target analysis device in this document refers to an analysis device for which a sample needs to be scheduled for testing, for example, there are three analysis devices, and a sample S only needs to perform a test item on the second and third analysis devices, but does not perform a test item on the first analysis device, and then the second and third analysis devices are the target analysis devices for the sample S, and the first analysis device is not the target analysis device for the sample S. In some embodiments, when determining the scheduling plan of the sample to be tested according to the test item of the sample to be tested, the processor 50 may also comprehensively consider load conditions of a plurality of analysis devices cascaded in the sample analysis system to implement load balancing, thereby further improving test efficiency. The Processor 50 may be, for example, a Central Processing Unit (CPU), other general-purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), or the like. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.

In one embodiment, when determining the scheduling plan for the sample under test, the processor 50 also controls the target analysis equipment for the sample under test to initiate the pre-test preparation. It will be appreciated that in practice, the target analysis device may be one or more than one for the same sample, depending on the project test that the sample actually needs to perform. Once the target analysis device of the sample to be tested is determined, the processor 50 controls the target analysis device to start preparation work before testing, and then dispatches the sample to be tested to the target analysis device for testing. In some embodiments, for the case where multiple target analysis devices are determined, i.e., when there are multiple target analysis devices for the sample to be tested in the dispatch plan, the processor 50 controls the multiple target analysis devices to simultaneously initiate the pre-test preparation.

For the sample analysis system shown in fig. 1, if there is a first analysis device among the target analysis devices with samples, that is, the analysis device closest to the input module on the track connection, and there are some subsequent analysis devices relatively less close to the input module, then for improving the test efficiency of the system, the subsequent analysis devices are started to perform the preparation before test when the scheduling plan is determined, and the benefit is higher, that is, the help for improving the test efficiency of the system is larger, because after the scheduling plan is determined, the samples are quickly scheduled to the first analysis device for test, at this time, the first analysis device is started to perform the preparation before test in advance, and relatively less time difference exists between the time when the samples enter the first analysis device and the time when the first analysis device restarts the preparation before test, i.e. how long the preparation work before the test of the first analysis device has not been advanced; however, for those analysis devices that are not so close to the input module in the target analysis devices, the preparation work before the test is started for the following analysis devices when the scheduling plan is determined is relatively high, that is, the help for improving the test efficiency of the system is relatively large, because the sample may be tested by the preceding analysis device (for example, the first analysis device) after the scheduling plan is determined, or even if the testing by the preceding analysis device is not needed, the sample is scheduled to the following analysis device for a relatively long time, so the preparation work before the test can be performed by the following target analysis devices by fully utilizing the time; that is, the preparation work before the test of the target analysis device and the scheduling process of the sample to be tested from the input module to the target analysis device can be performed in parallel, which shortens the TAT of the sample to be tested and improves the test efficiency and the test flux of the sample analysis system. Thus, in some instances, when determining a schedule for a sample under test, the sample analysis system may need to initiate pre-test preparation at least for the analysis devices in the target analysis device that are not so close to the input module, and the analysis device closest to the input module may or may not initiate pre-test preparation in some cases. Therefore, in an embodiment, when determining the scheduling plan of the sample to be tested, the processor 50 determines whether the target analysis device of the sample to be tested has an analysis device that is not on the track connection and closest to the input module before controlling the target analysis device of the sample to be tested to start the preparation work before testing, and if so, the processor 50 controls the corresponding target analysis device, that is, the analysis device that is not closest to the input module in the target analysis device to start the preparation work before testing.

In the sample analysis systems including the preprocessing module 60 shown in fig. 4 and the like, when determining the scheduling plan of the sample, the sample needs to be scheduled into the preprocessing module 60 for preprocessing, such as centrifugation, and then scheduled into the corresponding target analysis device for testing, so in this case, when determining the scheduling plan of the sample to be tested, the sample analysis system starts all the target analysis devices to start the preparation before testing, which is very high in benefit, i.e., the improvement of the testing efficiency of the system is very helpful, because this at least uses the time of the preprocessing of the sample, so that the preprocessing of the sample and the preparation before testing of the target analysis device are performed in parallel, and when the sample reaches the target analysis device after preprocessing, the sample can be tested quickly.

In summary, in the sample analysis system of the present invention, when the scheduling plan of the sample to be tested is determined, the target analysis device of the sample to be tested is controlled to start the preparation before testing, so that the preparation before testing of the target analysis device can be performed in parallel with the scheduling process of the sample to be tested from the input module to the target analysis device, the waiting time after the sample to be tested reaches the target analysis device is reduced, the TAT time of the sample to be tested is shortened, and the testing efficiency and the testing flux of the sample analysis system are further improved.

The pre-test preparation refers to some work of the analysis apparatus before a formal test such as aspiration of a sample, and typically, the pre-test preparation may be cleaning of a reaction cup, a reagent needle, a sample needle, and the like for the test. In which, generally, the time for cleaning the cuvette for testing is relatively long, so in one embodiment, the preparation before the processor 50 controls the target analysis device for the sample to be tested to start the testing may include: the processor 50 controls the target analysis apparatus for the sample to be tested to activate the washing mechanism 27 thereof to wash the cuvette.

In some embodiments, each analyzing device 20 may specifically perform cleaning according to its cleaning mode including a sequential cleaning mode and a simultaneous cleaning mode when controlling its cleaning mechanism 27 to clean the cuvettes. In the sequential cleaning mode, the cleaning mechanism 27 may clean the cuvettes to be cleaned one by one according to a preset sequence; in the simultaneous cleaning mode, the cleaning mechanism 27 can simultaneously clean a plurality of cuvettes to be cleaned.

In some embodiments, for any target analysis device, the processor 50 obtains the number of samples to be tested of the target analysis device, and determines the cleaning mode of the target analysis device according to the number of samples to be tested of the target analysis device; when the number of samples to be detected of the target analysis equipment is larger than the preset number, the processor determines that the cleaning mode of the target analysis equipment is a simultaneous cleaning mode; otherwise, the processor determines that the cleaning mode of the target analysis device is a sequential cleaning mode. For the condition that the number of samples to be tested is large, the reaction cup is cleaned in a simultaneous cleaning mode, so that the time for cleaning the reaction cup can be shortened, the time consumed by preparation work before testing is reduced, and the testing efficiency is improved; and for the condition that the number of samples to be detected is small, the reaction cup is cleaned in a sequential cleaning mode, so that cleaning according to needs can be realized, the consumption of cleaning liquid, cleaning agent and the like is effectively reduced, and the use cost is reduced. To improve the user experience, the analysis device may also receive a user set command for the washing mode. In one embodiment, for any target analysis device, processor 50 sets the washing mode of the target analysis device in response to a user setting command for the washing mode of the target analysis device.

When the analysis equipment in the sample analysis system is shielded, for example, a fault occurs or a quality control project is out of control, the test equipment cannot perform the test work on the sample to be tested. When it is determined that the target analysis device is recovered from the shielding state to the normal state, the processor 50 controls the target analysis device to start the device, and then controls the target analysis device to prepare for a test.

The above is some descriptions of the sample analysis system of the present invention, and in some embodiments of the present invention, a control method (hereinafter, referred to as a control method) of the sample analysis system is also disclosed, and the sample analysis system involved in the control method may be the sample analysis system disclosed above.

Referring to fig. 8, a control method according to some embodiments may include:

and step 100, obtaining the identification information of the sample to be detected.

In this embodiment, for example, a scanning device of the sample analysis system may scan a barcode or a two-dimensional code or other labels on a sample to be detected, so as to obtain identification information of the sample to be detected; user input of identification information of the sample to be tested can also be received. The identification information may include, for example: sample number, sample category, sample source information, etc.

And step 110, determining a test item of the sample to be tested according to the identification information of the sample to be tested.

In this embodiment, after the identification information of the sample to be tested is determined, the test item of the sample to be tested can be determined according to the identification information of the sample to be tested. One sample to be tested may have a plurality of items to be tested.

Step 120, determining a scheduling plan of the sample to be tested according to the test item of the sample to be tested, wherein the scheduling plan at least comprises target analysis equipment which needs to perform the test item on the sample to be tested.

In this embodiment, after the test item of the sample to be tested is determined, the scheduling plan of the sample to be tested can be determined according to the test item of the sample to be tested. The sample analysis system may schedule the sample to be tested according to a scheduling plan for the sample to be tested. The scheduling plan may include a target analysis device that needs to perform its test project on the sample to be tested, and may also include a path for the sample to be tested to reach its target analysis device.

Optionally, when determining the scheduling plan of the sample to be tested, the load condition of each analysis device in the sample analysis system may be further considered to implement load balancing and further improve the test efficiency. For example, if a plurality of analysis devices in the sample analysis system can execute a test item of a sample to be tested, the analysis device with a smaller load may be preferentially selected as the target analysis device of the sample to be tested.

And step 130, controlling the target analysis equipment of the sample to be tested to start preparation work before testing when the scheduling plan of the sample to be tested is determined.

In this embodiment, when the scheduling plan of the sample to be tested is determined, the target analysis device of the sample to be tested is controlled to start the preparation before testing, so that the target analysis device can start the preparation before testing in time, and the waiting time after the sample to be tested arrives is reduced.

It can be understood that when the scheduling plan of the sample to be tested is determined, the target analysis device of the sample to be tested is controlled to start the preparation work before testing, and after the scheduling plan of the sample to be tested is determined, the sample to be tested is scheduled to the target analysis device according to the scheduling plan of the sample to be tested, so that the preparation work before testing of the target analysis device can be performed in parallel with the scheduling process of the sample to be tested, and compared with a serial mode that the sample to be tested is scheduled first and then the preparation work before testing of the target analysis device is performed, the total testing time can be shortened.

The pre-test preparation may include, for example, washing the reaction cuvette, washing the reagent needle, washing the sample needle, and the like. In this embodiment, the preparation work before the target analysis device for controlling the sample to be tested starts the test may include: and controlling the target analysis equipment of the sample to be detected to start cleaning the reaction cup.

According to the control method of the sample analysis system, the identification information of the sample to be tested is obtained, the test item of the sample to be tested is determined according to the identification information of the sample to be tested, the scheduling plan of the sample to be tested is determined according to the test item of the sample to be tested, and meanwhile, when the scheduling plan of the sample to be tested is determined, the target analysis equipment of the sample to be tested is controlled to start preparation work before testing, so that the waiting time of the sample to be tested after reaching the target analysis equipment is shortened, the TAT time of the sample to be tested is shortened, and the testing efficiency and the testing flux of the sample analysis system are improved.

One sample to be tested can have a plurality of items to be tested, so that a plurality of target analysis devices of the sample to be tested can also be provided; for the case that the sample rack is used to carry the sample to be tested, one sample rack can carry a plurality of samples to be tested, and the test items of the plurality of samples to be tested can be the same or different, so that one sample rack may need to be dispatched to a plurality of target analysis devices in sequence for testing.

For the case that there are multiple target analysis devices for a sample to be tested, and in order to further improve the testing efficiency, on the basis of the foregoing embodiment, in the control method of the sample analysis system provided in this embodiment, when determining the scheduling plan of the sample to be tested, the control method further controls the target analysis devices for the sample to be tested to start preparation work before testing, which may include: when a plurality of target analysis devices of the sample to be tested exist in the scheduling plan, the plurality of target analysis devices are controlled to start preparation work before testing at the same time. By starting the preparation work before the test of the target analysis devices, the waiting time of the sample to be tested after reaching each target analysis device can be effectively reduced, and the test efficiency is improved.

Optionally, when the scheduling rule of the sample to be tested is determined, before the target analysis device controlling the sample to be tested starts preparation before testing, it is determined whether there is an analysis device which is not connected to the rail and is closest to the input module, and if so, the corresponding target analysis device is controlled to start preparation before testing.

Optionally, controlling the target analysis device of the sample to be tested to start the washing of the reaction cup may include:

acquiring a cleaning mode of target analysis equipment, wherein the cleaning mode comprises a sequential cleaning mode and a simultaneous cleaning mode; and controlling the target analysis equipment to clean the reaction cup according to the cleaning mode.

How to obtain the washing pattern of the target analysis device is explained below by two specific examples.

Fig. 9 is a flowchart of an embodiment of a method for determining a cleaning mode of a target analysis apparatus according to the present invention. As shown in fig. 9, determining the cleaning mode of the target analysis device in this embodiment may include:

and 131, acquiring the number of samples to be detected of the target analysis equipment.

Step 132, determining whether the number of samples to be tested of the target analysis device is greater than a preset number, if so, performing step 133, otherwise, performing step 134.

Step 133, determining that the cleaning mode of the target analysis device is a simultaneous cleaning mode.

And step 134, determining that the cleaning mode of the target analysis equipment is a sequential cleaning mode.

In the embodiment, the cleaning mode of the target analysis equipment is determined according to the number of samples to be tested of the target analysis equipment, and for the condition that the number of the samples to be tested is large, the reaction cups are cleaned by adopting the simultaneous cleaning mode, so that the time for cleaning the reaction cups can be shortened, the time consumed by preparation work before testing is reduced, and the testing efficiency is improved; and for the condition that the number of samples to be tested is small, the reaction cup is cleaned in a sequential cleaning mode, so that the test requirement can be met, cleaning according to requirements can be realized, the consumption of cleaning liquid, cleaning agent and the like is effectively saved, and the use cost is reduced.

For example, the target analysis device may receive a setting command of the user for the cleaning mode through a button or a touch interface, and thus acquiring the cleaning mode of the target analysis device in this embodiment may include: the washing mode of the target analysis apparatus is set in response to a user's setting command for the washing mode of the target analysis apparatus.

When the analysis equipment in the sample analysis system is shielded or fails, the test work on the sample to be tested cannot be executed. When shielding is cancelled or failure is recovered, in order to enable the analysis equipment to execute test work as soon as possible, when the target analysis equipment is judged to be recovered from the shielding state to the normal state, the target analysis equipment is controlled to start the equipment, and then the target analysis equipment is controlled to prepare for work before starting the test.

Reference is made herein to various exemplary embodiments. However, those skilled in the art will recognize that changes and modifications may be made to the exemplary embodiments without departing from the scope hereof. For example, the various operational steps, as well as the components used to perform the operational steps, may be implemented in differing ways depending upon the particular application or consideration of any number of cost functions associated with operation of the system (e.g., one or more steps may be deleted, modified or incorporated into other steps).

In the above embodiments, the implementation may be wholly or partially realized by software, hardware, firmware, or any combination thereof. Additionally, as will be appreciated by one skilled in the art, the principles herein may be reflected in a computer program product on a computer readable storage medium, which is pre-loaded with computer readable program code. Any tangible, non-transitory computer-readable storage medium may be used, including magnetic storage devices (hard disks, floppy disks, etc.), optical storage devices (CD-to-ROM, DVD, Blu-Ray discs, etc.), flash memory, and/or the like. These computer program instructions may be loaded onto a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the instructions which execute on the computer or other programmable data processing apparatus create means for implementing the functions specified. These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including means for implementing the function specified. The computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified.

While the principles herein have been illustrated in various embodiments, many modifications of structure, arrangement, proportions, elements, materials, and components particularly adapted to specific environments and operative requirements may be employed without departing from the principles and scope of the present disclosure. The above modifications and other changes or modifications are intended to be included within the scope of this document.

The foregoing detailed description has been described with reference to various embodiments. However, one skilled in the art will recognize that various modifications and changes may be made without departing from the scope of the present disclosure. Accordingly, the disclosure is to be considered in an illustrative and not a restrictive sense, and all such modifications are intended to be included within the scope thereof. Also, advantages, other advantages, and solutions to problems have been described above with regard to various embodiments. However, the benefits, advantages, solutions to problems, and any element(s) that may cause any element(s) to occur or become more pronounced are not to be construed as a critical, required, or essential feature or element of any or all the claims. As used herein, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, system, article, or apparatus. Furthermore, the term "coupled," and any other variation thereof, as used herein, refers to a physical connection, an electrical connection, a magnetic connection, an optical connection, a communicative connection, a functional connection, and/or any other connection.

Those skilled in the art will recognize that many changes may be made to the details of the above-described embodiments without departing from the underlying principles of the invention. Accordingly, the scope of the invention should be determined only by the following claims.

Claims

1. A sample analysis system, comprising:

the pretreatment module is used for pretreating a sample to be detected received by the input module and comprises one or more of a centrifugation module, a serum detection module, a decapping module and a dispensing module; the centrifugal module is used for centrifuging a sample to be centrifuged; the serum detection module is used for detecting whether the serum amount of the sample is enough and/or whether the serum quality of the sample is qualified; the decapping module is used for decapping the centrifuged sample; the separate injection module is used for separating samples;

the analysis equipment is used for testing the sample to be tested; the analysis device comprises a sample component, a sample dispensing mechanism, a reagent component, a reagent dispensing mechanism, a reaction component, a measurement component and a cleaning mechanism; the sample part is used for bearing a sample; the sample dispensing mechanism is used for sucking a sample from the sample component and discharging the sample into a reaction cup to be loaded; the reagent component is used for bearing a reagent; the reagent dispensing mechanism is used for sucking a reagent from the reagent component and discharging the reagent into a reaction cup to be added with the reagent; the reaction component is provided with at least one placing position, and the placing position is used for placing the reaction cup and incubating the reaction liquid in the reaction cup; the measuring part is used for measuring the incubated reaction liquid to obtain the test data of the sample; the cleaning mechanism is used for cleaning the reaction cup;

a post-processing module comprising one or more of a membrane addition/capping module, a refrigerated storage module, and a membrane removal/capping module; the film adding/capping module is used for adding films or caps to the samples; the refrigeration storage module is used for storing samples; the membrane removing/cover removing module is used for removing a membrane or a cover of a sample;

a track for connecting the input module, the pre-processing module, the plurality of sample analysis devices, and the post-processing module in sequence;

the scheduling device is used for scheduling the sample to be tested through the track according to the scheduling plan of the sample to be tested; and

the processor is used for determining a test item of the sample to be tested according to the identification information of the sample to be tested, which is acquired by the input module, and determining a scheduling plan of the sample to be tested according to the test item of the sample to be tested, wherein the scheduling plan comprises all target analysis equipment which needs to perform the test item on the sample to be tested and a path through which the sample to be tested reaches the target analysis equipment; when the scheduling plan of the sample to be detected is determined, the processor also judges whether the target analysis equipment of the sample to be detected has the analysis equipment which is not connected with the track and is closest to the pretreatment module, and if so, the processor also controls the corresponding target analysis equipment to start the cleaning mechanism of the corresponding target analysis equipment to clean the reaction cup.

2. A sample analysis system, comprising:

the at least two cascaded analysis devices are used for testing a sample to be tested;

a track for connecting the input module and the plurality of analysis devices;

the scheduling device is used for scheduling the sample to be tested through the track according to the scheduling plan of the sample to be tested;

3. The sample analysis system of claim 2, wherein when determining the scheduling plan of the sample to be tested, the processor determines whether the target analysis device of the sample to be tested has an analysis device that is not connected to the track but is closest to the input module before controlling the target analysis device of the sample to be tested to start the preparation before testing, and if so, the processor controls the corresponding target analysis device to start the preparation before testing.

4. The sample analysis system of claim 2, wherein when determining the schedule of the sample under test, the processor further controls the target analysis device of the sample under test to initiate a pre-test preparation, comprising: when a plurality of target analysis devices for the sample to be tested exist in the scheduling plan, the processor controls the plurality of target analysis devices to start preparation work before testing at the same time.

5. The sample analysis system according to any one of claims 2 to 4, wherein the analysis device comprises a sample section, a sample dispensing mechanism, a reagent section, a reagent dispensing mechanism, a reaction section, an assay section, and a washing mechanism; the sample part is used for bearing a sample; the sample dispensing mechanism is used for sucking a sample from the sample component and discharging the sample into a reaction cup to be loaded; the reagent component is used for bearing a reagent; the reagent dispensing mechanism is used for sucking a reagent from the reagent component and discharging the reagent into a reaction cup to be added with the reagent; the reaction component is provided with at least one placing position, and the placing position is used for placing the reaction cup and incubating the reaction liquid in the reaction cup; the measuring part is used for measuring the incubated reaction liquid to obtain the test data of the sample; the cleaning mechanism is used for cleaning the reaction cup;

the processor controls the target analysis equipment of the sample to be tested to start preparation work before testing, and the preparation work comprises the following steps: the processor controls the target analysis equipment of the sample to be detected to start the cleaning mechanism of the target analysis equipment to clean the reaction cup.

6. The sample analysis system of claim 5, wherein the target analysis device controls its washing mechanism to wash the cuvettes according to a washing mode, the washing mode comprising a sequential washing mode and a simultaneous washing mode.

7. The sample analysis system of claim 6, wherein for any target analysis device, the processor obtains the number of samples to be tested of the target analysis device and determines the cleaning mode of the target analysis device according to the number of samples to be tested of the target analysis device;

8. The sample analysis system of claim 6, wherein for any one target analysis device, the processor sets the washing mode of the target analysis device in response to a user setting command for the washing mode of the target analysis device.

9. The sample analysis system of claim 2, wherein when it is determined that the target analysis device is restored from the shielded state to the normal state, the processor controls the target analysis device to perform device start-up first, and then controls the target analysis device to perform preparation before starting the test.

10. A control method of a sample analysis system including a plurality of cascaded analysis devices, characterized by comprising:

acquiring identification information of a sample to be detected;

determining a scheduling plan of the sample to be tested according to the test project of the sample to be tested; wherein the scheduling plan at least comprises target analysis equipment which needs to perform test items on the sample to be tested;

11. The control method according to claim 10, wherein when determining the scheduling plan of the sample to be tested, before the target analysis device that controls the sample to be tested starts preparation before testing, it is determined whether the target analysis device that controls the sample to be tested has an analysis device that is not connected to the track and is closest to the preprocessing module, and if so, the corresponding target analysis device is controlled to start preparation before testing.

12. The method of claim 10, wherein when determining the schedule of the sample under test, the method further comprises controlling the target analysis device of the sample under test to initiate pre-test preparation, comprising: when a plurality of target analysis devices of the sample to be tested exist in the scheduling plan, the plurality of target analysis devices are controlled to start preparation work before testing at the same time.

13. The control method according to any one of claims 10 to 12, wherein the target analysis device that controls the sample to be tested starts a pre-test preparation work including: and controlling the target analysis equipment of the sample to be detected to start cleaning the reaction cup.

14. The method of claim 13, wherein the controlling the target analysis device of the sample to be tested to initiate the washing of the cuvette comprises:

15. The control method of claim 14, wherein the obtaining a washing pattern of the target analysis device includes:

16. The control method of claim 14, wherein the obtaining a washing pattern of the target analysis device includes: the washing mode of the target analysis apparatus is set in response to a user's setting command for the washing mode of the target analysis apparatus.

17. The control method according to claim 10, wherein when it is determined that the target analysis device is restored from the shielded state to the normal state, the target analysis device is controlled to perform device start-up, and then the target analysis device is controlled to perform preparation before starting the test.

18. A computer-readable storage medium, characterized by comprising a program executable by a processor to implement the method of any one of claims 10 to 17.