CN111273153A - Automatic testing method, device and system for chip - Google Patents
Automatic testing method, device and system for chip Download PDFInfo
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- CN111273153A CN111273153A CN202010069965.1A CN202010069965A CN111273153A CN 111273153 A CN111273153 A CN 111273153A CN 202010069965 A CN202010069965 A CN 202010069965A CN 111273153 A CN111273153 A CN 111273153A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
Abstract
The invention discloses an automatic test method of a chip, which comprises the following steps: when detecting that the chip firmware equipment is accessed, judging whether the chip firmware equipment is connected with a chip to be detected; when the chip firmware equipment is judged to be connected with a chip to be tested, sending automatic test data to the chip firmware equipment so that the chip firmware equipment receives the automatic test data and starts an automatic test program; sending a test instruction to the chip firmware equipment so that the chip firmware equipment performs module function test on the chip to be tested; and generating an automatic test result according to the test response returned by the chip firmware equipment. The invention also discloses a corresponding automatic testing device and a corresponding automatic testing system. By adopting the embodiment of the invention, the function test of the chip module can be automatically realized, the efficiency of the chip test is effectively improved, and the human resources and the time cost are saved.
Description
Technical Field
The present invention relates to the field of semiconductor integrated circuit technology, and in particular, to a method, an apparatus, and a system for automatically testing a chip.
Background
In the existing chip design, a Multi Project Wafer (MPW) is usually adopted to perform small-lot production on the chips, so as to verify the functions of the chips or meet the requirements of customers for small-lot production. In the multi-project wafer, a plurality of integrated circuits with the same process are designed on the same wafer for chip flow to obtain a plurality of chip samples, and the MPW chip can greatly reduce the research and development cost of the integrated circuits and is widely applied.
However, in the production and processing process of the MPW chip in a factory, hardware testing and parameter configuration processes of a system are not performed, and it cannot be guaranteed that each chip after production meets the design target. In the prior art, in order to screen out individual chips which are partially defective due to the manufacturing process problem, each module function test needs to be manually performed on each chip after production and processing. The testing process is manually operated, the process is complicated, and the efficiency is low. In the case of a large number of chips, a large human resource and time cost are required.
Disclosure of Invention
The embodiment of the invention aims to provide a method, a device and a system for automatically testing a chip, which can automatically realize the function test of a chip module, effectively improve the efficiency of chip test and save human resources and time cost.
In order to achieve the above object, an embodiment of the present invention provides an automatic test method for a chip, including:
when detecting that the chip firmware equipment is accessed, judging whether the chip firmware equipment is connected with a chip to be detected;
when the chip firmware equipment is judged to be connected with a chip to be tested, sending automatic test data to the chip firmware equipment so that the chip firmware equipment receives the automatic test data and starts an automatic test program;
sending a test instruction to the chip firmware equipment so that the chip firmware equipment performs module function test on the chip to be tested; and generating an automatic test result according to the test response returned by the chip firmware equipment.
As an improvement of the above scheme, the sending of the test instruction to the chip firmware device is performed to enable the chip firmware device to perform module function test on the chip to be tested; and according to the test response returned by the chip firmware equipment, generating an automatic test result, which specifically comprises the following steps:
reading a first test instruction in a preset test instruction list;
sending the read first test instruction to the chip firmware equipment so that the chip firmware equipment performs module function test on the chip to be tested according to the first test instruction and returns a first test response;
generating a sub-test result according to a first test response returned by the chip firmware equipment, and reading a next test instruction in the preset test instruction list;
and after each test instruction in the test instruction list is sent, obtaining the automatic test result according to each generated sub-test result.
As an improvement of the above solution, after the receiving the first test response returned by the chip firmware device and generating the sub-test result, the method further includes the steps of:
storing the sub-test result to a preset LOG file; and the LOG file corresponds to the serial number information of the chip to be tested one by one.
As an improvement of the above scheme, when it is detected that the chip firmware device is accessed, determining whether the chip firmware device is connected to the chip to be tested specifically includes:
when detecting that the chip firmware equipment is accessed, sending a BOOT protocol frame to the chip firmware equipment, so that the chip firmware equipment is controlled to return a BOOT response after the chip to be detected receives the BOOT protocol frame;
and when a BOOT response returned by the chip firmware equipment is received, judging that the chip firmware equipment is connected with a chip to be tested.
As an improvement of the above scheme, when it is detected that the chip firmware device is accessed, the method for sending the BOOT protocol frame to the chip firmware device specifically includes:
and when detecting that the chip firmware equipment is accessed, sending BOOT protocol frames to the chip firmware equipment every other preset time period until receiving BOOT response returned by the chip firmware equipment.
As an improvement of the above scheme, when it is determined that the chip firmware device is connected to the chip to be tested, the method sends automatic test data to the chip firmware device, so that the chip firmware device receives the automatic test data and starts an automatic test program, and specifically includes:
when the chip firmware equipment is judged to be connected with a chip to be tested, sending automatic test data to the chip firmware equipment so that the chip firmware equipment receives the automatic test data;
and after the automatic test data is sent, sending a data operation instruction to the chip firmware equipment so that the chip firmware equipment starts an automatic test program after receiving the automatic test data and the data operation instruction.
The embodiment of the invention also provides an automatic testing device of the chip, which comprises an equipment detection module, a test data sending module and an automatic testing module; wherein the content of the first and second substances,
the device detection module is used for judging whether the chip firmware device is connected with a chip to be detected or not when the chip firmware device is detected to be accessed;
the test data sending module is used for sending automatic test data to the chip firmware equipment when the chip firmware equipment is judged to be connected with a chip to be tested, so that the chip firmware equipment receives the automatic test data and starts an automatic test program;
the automatic test module is used for sending a test instruction to the chip firmware equipment so as to enable the chip firmware equipment to perform module function test on the chip to be tested; and generating an automatic test result according to the test response returned by the chip firmware equipment.
As an improvement of the above scheme, the automatic test module comprises a test instruction reading unit, a test instruction sending unit, a first result generating unit and a second result generating unit; wherein the content of the first and second substances,
the test instruction reading unit is used for reading a first test instruction in a preset test instruction list;
the test instruction sending unit is used for sending the read first test instruction to the chip firmware equipment so that the chip firmware equipment performs module function test on the chip to be tested according to the first test instruction and returns a first test response;
the first result generating unit is configured to receive a first test response returned by the chip firmware device, generate a sub-test result, and control the test instruction reading unit to read a next test instruction in the preset test instruction list;
and the second result generation unit is used for obtaining the automatic test result according to each generated sub-test result after each test instruction in the test instruction list is sent.
As an improvement of the above scheme, the device detection module includes a protocol frame sending unit and a device judgment unit; wherein the content of the first and second substances,
the protocol frame sending unit is used for sending a BOOT protocol frame to the chip firmware equipment after detecting that the chip firmware equipment is accessed, so that the chip to be tested controls the chip firmware equipment to return a BOOT response after receiving the BOOT protocol frame;
and the device judging unit is used for judging that the chip firmware device is connected with a chip to be tested when receiving a BOOT response returned by the chip firmware device.
The embodiment of the invention also provides an automatic test system of the chip, which comprises PC end equipment and chip fixing equipment; the PC terminal equipment is connected with the chip fixing equipment; the chip fixing equipment is used for connecting a chip to be tested; the PC terminal equipment comprises the automatic testing device of the chip.
Compared with the prior art, the automatic test method, the device and the system of the chip disclosed by the invention have the advantages that the PC terminal equipment judges whether the accessed chip fixing equipment is connected with the chip to be tested, and when the chip firmware equipment is judged to be connected with the chip to be tested, the automatic test data is sent to the chip firmware equipment; the chip firmware equipment receives the automatic test data and starts an automatic test program; the PC terminal equipment sends a test instruction to the chip firmware equipment, and the chip firmware equipment performs module function test on the chip to be tested according to the test instruction and returns a test response; and the PC terminal equipment generates an automatic test result according to the test response. The invention can automatically realize module function test of the chip to be tested, provides automatic test results for users, effectively improves the efficiency of chip test, and greatly saves human resources and time cost. Meanwhile, errors caused by manual testing are avoided, and the accuracy of the test result of the chip is improved.
Drawings
FIG. 1 is a flowchart illustrating steps of a method for automatically testing a chip according to an embodiment of the present invention;
fig. 2 is a schematic flowchart illustrating step S1 in the method for automatically testing a chip according to an embodiment of the present invention;
fig. 3 is a schematic flowchart of step S2 in the automatic test method for chips according to an embodiment of the present invention;
fig. 4 is a schematic flowchart illustrating step S3 in the method for automatically testing a chip according to an embodiment of the present invention;
fig. 5 is a schematic structural diagram of an automatic testing apparatus for a chip according to a second embodiment of the present invention;
fig. 6 is a schematic structural diagram of an automatic test system for chips according to a third embodiment of the present invention;
fig. 7 is a schematic flowchart of an automatic test system for chips according to a third embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the embodiment of the invention, the automatic test method of the chip is executed by PC end equipment in the automatic test system, the PC end equipment is connected with chip firmware equipment so as to control the chip firmware equipment to perform function test on each module of the chip to be tested, and the chip firmware equipment is used for connecting the chip to be tested.
It should be noted that the chips to be tested need to be calibrated in advance by the accuracy of the system clock inside the chips, and the actual frequency of the system clock inside each chip to be tested is adjusted to be equal to the preset expected value, so that the accuracy and consistency of the system clock of each chip to be tested in batch production are ensured, and the accuracy of the test result of the subsequent functional test on each chip to be tested is ensured.
Specifically, referring to fig. 1, a schematic step flow diagram of an automatic testing method for a chip according to an embodiment of the present invention is provided. The automatic test method of the chip includes steps S1 to S3:
s1, when detecting the chip firmware device access, judging whether the chip firmware device is connected with the chip to be tested.
Specifically, before the function test of the chip is performed, the chip firmware device is powered on and started in advance, that is, the BOOT area is started, and a user downloads a Bootloader program to the chip firmware end. When the chip function test is carried out, a user establishes connection between the PC end equipment and the chip fixing equipment through a serial port-USB data line of the chip firmware equipment, and simultaneously selects a chip to be tested to be connected to the chip fixing end.
And when the PC side equipment detects that new equipment is accessed, reading all accessed equipment lists, and finding serial port to USB equipment from the equipment lists so as to identify the chip fixed equipment. And searching the corresponding serial port number and opening the serial port connection by reading the information list of the chip fixing equipment. And after the serial port connection with the chip fixing equipment is opened, the PC side equipment judges whether the chip fixing equipment finishes the preparation work of chip testing. The preparation work comprises the operations of downloading the Bootloader program and connecting the chip to be tested.
Before chip testing, the chip firmware equipment needs to make peripheral equipment of a hardware connection part according to a test item of automatic test so as to perform subsequent module function test on a chip to be tested.
As a preferred implementation manner, referring to fig. 2, it is a schematic flowchart of step S1 in the automatic testing method for chips provided in the first embodiment of the present invention, and step S1 in the first embodiment of the present invention is executed through steps S11 to S12:
and S11, when detecting that the chip firmware equipment is accessed, sending a BOOT protocol frame to the chip firmware equipment, so that the chip to be tested controls the chip firmware equipment to return a BOOT response after receiving the BOOT protocol frame.
And S12, when the BOOT response returned by the chip firmware equipment is received, judging that the chip firmware equipment is connected with a chip to be tested.
And when the PC terminal equipment detects the chip firmware equipment and opens the corresponding serial port connection, sending a BOOT protocol frame to the chip firmware equipment so as to identify the chip to be tested connected with the chip firmware equipment. When the chip firmware equipment is connected with a chip to be tested, the chip to be tested receives the BOOT protocol frame through the chip firmware equipment, so that the chip firmware equipment is controlled to return a BOOT response to the PC terminal equipment, and the PC terminal equipment is informed of the preparation work of chip automatic testing. And after receiving the BOOT response, the PC side equipment judges that the chip firmware equipment is connected with the chip to be tested, and then the next step of automatic test operation is carried out.
Preferably, the PC-side device sends a BOOT protocol frame to the chip firmware device every preset time period until receiving a BOOT response returned by the chip firmware device. The preset time period is preferably 10 seconds.
And after the PC side equipment sends the BOOT protocol frame to the chip firmware equipment, if the returned BOOT response is not received within 10 seconds, the BOOT protocol frame is sent to the chip firmware equipment again until the BOOT response is received.
In the embodiment of the invention, the PC terminal equipment sends the BOOT protocol frame to the chip firmware equipment, and judges whether the chip firmware equipment is connected with the chip to be tested or not by judging whether the BOOT response returned by the chip firmware equipment is received or not, namely, the preparation work of automatic testing of the chip is completed, so that the PC terminal equipment can conveniently control the subsequent automatic testing operation, the efficiency of the automatic testing process can be effectively improved, and the misoperation of the PC terminal equipment is reduced.
And S2, when the chip firmware equipment is judged to be connected with the chip to be tested, sending automatic test data to the chip firmware equipment so that the chip firmware equipment receives the automatic test data and starts an automatic test program.
Specifically, after receiving a BOOT response returned by the chip firmware device, the PC-side device downloads the automatic test data and sends the automatic test data to the chip firmware device. And after the chip firmware equipment receives the automatic test data, starting the MAIN program area of the MAIN and starting an automatic test program.
The automatic test data is specifically an automatic test software code, and after the chip firmware equipment receives the automatic test software code, the automatic test software code can be directly executed so as to complete the function test of a corresponding module in the chip to be tested.
As a preferred implementation manner, refer to fig. 3, which is a schematic flowchart of step S2 in the automatic testing method for a chip according to the first embodiment of the present invention. Step S2 of the first embodiment of the present invention is executed through steps S21 to S22:
and S21, when the chip firmware equipment is judged to be connected with the chip to be tested, sending automatic test data to the chip firmware equipment so that the chip firmware equipment receives the automatic test data.
And S22, after the automatic test data is sent, sending a data operation instruction to the chip firmware equipment, so that the chip firmware equipment starts an automatic test program after receiving the automatic test data and the data operation instruction.
Preferably, after the PC-side device receives the BOOT response returned by the chip firmware device, the automatic test data is downloaded. And after the chip firmware equipment receives the automatic test data, checking and calibrating an automatic test software code according to the check CRC result so as to ensure the accuracy of the received automatic test data. And finally, the chip firmware equipment starts the MAIN MAIN program area according to the data operation instruction and starts an automatic test program.
S3, sending a test instruction to the chip firmware equipment so that the chip firmware equipment can perform module function test on the chip to be tested; and generating an automatic test result according to the test response returned by the chip firmware equipment.
Further, the PC side device sends a test instruction to the chip firmware device, and the chip firmware device processes the received test instruction, determines and runs a corresponding automatic test code, performs a function test on a corresponding module in the chip to be tested, and returns a test response after the test is completed. And the PC side equipment obtains an automatic test result according to the test response returned by the chip firmware equipment.
As a preferred implementation manner, refer to fig. 4, which is a schematic flowchart of step S3 in the automatic testing method for a chip according to the first embodiment of the present invention. Step S3 of the first embodiment of the present invention is executed through steps S31 to S34:
and S31, reading the first test instruction in the preset test instruction list.
And S32, sending the read first test instruction to the chip firmware equipment, so that the chip firmware equipment performs module function test on the chip to be tested according to the first test instruction and returns a first test response.
S33, generating a sub-test result according to the first test response returned by the chip firmware equipment, reading the next test instruction in the preset test instruction list, and jumping to the step S32.
And S34, obtaining the automatic test result according to each generated sub-test result after each test instruction in the test instruction list is sent.
Specifically, the PC-side device obtains a test instruction list in advance, where the test instruction list includes a plurality of test instructions, and different test instructions are used to control the chip firmware device to perform function tests on different modules inside the chip to be tested. The PC terminal equipment can automatically acquire a preset test instruction list through the data transmission interface by setting a data transmission interface and read the test instruction; and a test instruction list can be manually input to the PC terminal equipment by a user, without influencing the beneficial effects obtained by the invention.
Further, after the PC-side device obtains the test instruction list, the first test instructions in the test instruction list are sequentially read and sent to the chip firmware device. And the chip firmware equipment analyzes and processes the first test instruction, determines test code data corresponding to the first test instruction, and runs a corresponding test code, thereby completing the function test of a corresponding module in the chip to be tested. After the automatic test is finished, the chip firmware equipment returns a first test response to the PC side equipment, and the PC side equipment generates a sub-test result according to the returned first test response, wherein the sub-test result is used for representing a function test result of a corresponding module in the chip to be tested. Meanwhile, when the PC side equipment receives the first test response, the next test instruction in the test instruction list is read, and the next test instruction is sent to the chip firmware equipment, so that the chip firmware equipment processes the next test instruction, and the function test of the corresponding module of the chip to be tested is completed until the PC side equipment sends each test instruction in the test instruction list.
The PC end equipment sends a plurality of test instructions to the chip firmware end to perform the function test of the chip module, and also receives a plurality of test responses returned by the chip firmware equipment to generate a plurality of sub-test results. And the PC terminal equipment obtains a final automatic test result according to each sub-test result, at the moment, the automatic test of the chip to be tested is finished, and the next chip to be tested can be automatically tested by connecting the next chip to be tested to the chip firmware equipment.
Preferably, the PC side equipment sends the final automatic test result to a GUI (graphical user interface) of the PC side equipment for displaying the automatic test result, so that a user can conveniently and visually and clearly know the test result of the chip to be tested, and the chip is screened.
Preferably, a LOG file is preset, and the LOG file corresponds to the serial number information of the chip to be tested one by one. The PC terminal equipment stores each sub-test result to a preset LOG file, and simultaneously stores test data and the like generated in the test process to the LOG file, so that a user can conveniently check detailed test result reports of the chip to be tested in the later period and know the function test condition of each module in the chip.
In the automatic test method for the chip provided by the embodiment of the invention, by judging whether the accessed chip fixing equipment is connected with the chip to be tested or not, when the chip firmware equipment is judged to be connected with the chip to be tested, the automatic test data is sent to the chip firmware equipment, so that the chip firmware equipment starts an automatic test program. And then, sending a test instruction to the chip firmware equipment so that the chip firmware equipment performs module function test on the chip to be tested according to the test instruction and returns a test response. And finally, generating an automatic test result according to the test response. The invention can automatically realize module function test of the chip to be tested, provides automatic test results for users, effectively improves the efficiency of chip test, and greatly saves human resources and time cost. Meanwhile, errors caused by manual testing are avoided, and the accuracy of the test result of the chip is improved.
Fig. 5 is a schematic structural diagram of an automatic testing apparatus for a chip according to a second embodiment of the present invention. The automatic test device 20 for chips provided by the second embodiment of the present invention includes: the device testing module 21, the test data sending module 22 and the automatic testing module 23; wherein the content of the first and second substances,
the device detection module 21 is configured to determine whether the chip firmware device is connected to a chip to be tested when it is detected that the chip firmware device is accessed.
The test data sending module 22 is configured to send automatic test data to the chip firmware device when it is determined that the chip firmware device is connected to the chip to be tested, so that the chip firmware device receives the automatic test data and starts an automatic test program.
The automatic test module 23 is configured to send a test instruction to the chip firmware device, so that the chip firmware device performs a module function test on the chip to be tested; and generating an automatic test result according to the test response returned by the chip firmware equipment.
As a preferred embodiment, the automatic test module 23 includes a test instruction reading unit 231, a test instruction sending unit 232, a first result generating unit 233, and a second result generating unit 234; wherein the content of the first and second substances,
the test instruction reading unit 231 is configured to read a first test instruction in a preset test instruction list;
the test instruction sending unit 232 is configured to send the read first test instruction to the chip firmware device, so that the chip firmware device performs module function test on the chip to be tested according to the first test instruction and returns a first test response;
the first result generating unit 233 is configured to receive a first test response returned by the chip firmware device, generate a sub-test result, and control the test instruction reading unit 231 to read a next test instruction in the preset test instruction list;
the second result generating unit 234 is configured to obtain the automatic test result according to each generated sub-test result after each test instruction in the test instruction list is sent.
As a preferred embodiment, the device detection module 21 includes a protocol frame sending unit 211 and a device determination unit 212; wherein the content of the first and second substances,
the protocol frame sending unit 211 is configured to send a BOOT protocol frame to the chip firmware device after detecting that the chip firmware device is accessed, so that the chip to be tested controls the chip firmware device to return a BOOT response after receiving the BOOT protocol frame;
the device determining unit 212 is configured to determine that the chip firmware device is connected to a chip to be tested when receiving a BOOT response returned by the chip firmware device.
It should be noted that the automatic test apparatus for a chip according to the embodiment of the present invention is configured to execute all the process steps of the automatic test method for a chip according to the embodiment of the present invention, and the working principles and beneficial effects of the two are in one-to-one correspondence, so that details are not repeated.
In the automatic test device for a chip provided in the second embodiment of the present invention, by determining whether an accessed chip fixing device is connected to a chip to be tested, when it is determined that the chip firmware device is connected to the chip to be tested, automatic test data is sent to the chip firmware device, so that the chip firmware device starts an automatic test program. And then, sending a test instruction to the chip firmware equipment so that the chip firmware equipment performs module function test on the chip to be tested according to the test instruction and returns a test response. And finally, generating an automatic test result according to the test response. The invention can automatically realize module function test of the chip to be tested, provides automatic test results for users, effectively improves the efficiency of chip test, and greatly saves human resources and time cost. Meanwhile, errors caused by manual testing are avoided, and the accuracy of the test result of the chip is improved.
Fig. 6 is a schematic structural diagram of an automatic test system for a chip according to a third embodiment of the present invention. The automatic test system 30 of the chip provided by the third embodiment of the invention comprises a PC terminal device 31 and a chip fixing device 32; the PC terminal device 31 is connected with the chip fixing device 32; the chip fixing device 32 is used for connecting a chip to be tested; the PC-side device 31 includes the automatic testing apparatus 20 for chips as described in the second embodiment, and is used to implement all the flow steps of the automatic testing method for chips as described in the first embodiment, and has the same beneficial effects.
Preferably, referring to fig. 7, a schematic workflow diagram of an automatic test system for a chip according to a third embodiment of the present invention is provided. For example, the process of the automatic test system performing the functional test of the chip to be tested is as follows:
and a user powers on the chip firmware equipment, starts the BOOT area and downloads a Bootloader program to the chip firmware end. Establishing connection between PC end equipment and chip fixing equipment through a serial port of chip firmware equipment to a USB data line, selecting a UM0068 chip to be tested to be connected to the chip fixing end, and starting automatic testing of the chip.
And initializing the PC terminal equipment system, detecting whether a new device is accessed, reading all accessed equipment lists when detecting that the new device is accessed, and finding out serial port-to-USB equipment from the equipment lists so as to identify the chip fixed equipment. And searching the corresponding serial port number and opening the serial port connection by reading the information list of the chip fixing equipment. And sending a BOOT protocol frame to the chip firmware equipment so as to identify a UM0068 chip connected with the chip firmware equipment. After the serial port of the chip firmware equipment receives the BOOT protocol frame, the UM0068 chip controls the chip firmware equipment to return a BOOT response. And the PC terminal equipment receives the response returned by the UM0068 chip, downloads the automatic test data and sends the automatic test data to the chip firmware equipment. At this time, the chip firmware device receives the automatic test data. After the PC terminal equipment sends the automatic test data, a CHECK CRC result CHECK _ CRC and a data operation instruction RUN _ APP are sent, so that the chip firmware equipment starts a MAIN program area of the MAIN and starts an automatic test program. And the PC terminal equipment sequentially sends a plurality of test instructions to the chip firmware equipment, the chip firmware equipment processes the test instructions after receiving each test instruction, runs corresponding automatic test codes, performs function test on corresponding modules in the chip to be tested, and returns a test response after the test is finished. And the PC terminal equipment generates sub-test results according to the test response returned by the chip firmware equipment, stores each sub-test result into a preset LOG file, and transmits the finally obtained automatic test result to a GUI interface of the PC terminal for displaying. At this time, the automatic test of the current UM0068 chip to be tested is finished, and the next chip to be tested is replaced for automatic test.
The system for automatically testing the chip provided by the third embodiment of the invention comprises PC end equipment and chip fixing equipment. The PC terminal equipment judges whether the accessed chip fixing equipment is connected with a chip to be tested or not, and when the chip firmware equipment is judged to be connected with the chip to be tested, automatic test data are sent to the chip firmware equipment; the chip firmware equipment receives the automatic test data and starts an automatic test program; the PC terminal equipment sends a test instruction to the chip firmware equipment, and the chip firmware equipment performs module function test on the chip to be tested according to the test instruction and returns a test response; and the PC terminal equipment generates an automatic test result according to the test response. The invention can automatically realize module function test of the chip to be tested, provides automatic test results for users, effectively improves the efficiency of chip test, and greatly saves human resources and time cost. Meanwhile, errors caused by manual testing are avoided, and the accuracy of the test result of the chip is improved.
While the foregoing is directed to the preferred embodiment of the present invention, it will be understood by those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention.
Claims (10)
1. An automatic test method of a chip is characterized by comprising the following steps:
when detecting that the chip firmware equipment is accessed, judging whether the chip firmware equipment is connected with a chip to be detected;
when the chip firmware equipment is judged to be connected with a chip to be tested, sending automatic test data to the chip firmware equipment so that the chip firmware equipment receives the automatic test data and starts an automatic test program;
sending a test instruction to the chip firmware equipment so that the chip firmware equipment performs module function test on the chip to be tested; and generating an automatic test result according to the test response returned by the chip firmware equipment.
2. The method according to claim 1, wherein the sending of the test command to the chip firmware device causes the chip firmware device to perform a module function test on the chip to be tested; and according to the test response returned by the chip firmware equipment, generating an automatic test result, which specifically comprises the following steps:
reading a first test instruction in a preset test instruction list;
sending the read first test instruction to the chip firmware equipment so that the chip firmware equipment performs module function test on the chip to be tested according to the first test instruction and returns a first test response;
generating a sub-test result according to a first test response returned by the chip firmware equipment, and reading a next test instruction in the preset test instruction list;
and after each test instruction in the test instruction list is sent, obtaining the automatic test result according to each generated sub-test result.
3. The method for automatically testing a chip according to claim 2, wherein after said receiving the first test response returned by the chip firmware device and generating the sub-test result, further comprising the steps of:
storing the sub-test result to a preset LOG file; and the LOG file corresponds to the serial number information of the chip to be tested one by one.
4. The method according to claim 1, wherein when detecting that a chip firmware device is connected, determining whether the chip firmware device is connected to a chip to be tested specifically comprises:
when detecting that the chip firmware equipment is accessed, sending a BOOT protocol frame to the chip firmware equipment, so that the chip firmware equipment is controlled to return a BOOT response after the chip to be detected receives the BOOT protocol frame;
and when a BOOT response returned by the chip firmware equipment is received, judging that the chip firmware equipment is connected with a chip to be tested.
5. The automatic test method of a chip according to claim 4, wherein the sending of a BOOT protocol frame to the chip firmware device after detecting the access of the chip firmware device specifically comprises:
and when detecting that the chip firmware equipment is accessed, sending BOOT protocol frames to the chip firmware equipment every other preset time period until receiving BOOT response returned by the chip firmware equipment.
6. The method according to claim 1, wherein when it is determined that the chip firmware device is connected to the chip to be tested, sending automatic test data to the chip firmware device, so that the chip firmware device receives the automatic test data and starts an automatic test program, specifically comprising:
when the chip firmware equipment is judged to be connected with a chip to be tested, sending automatic test data to the chip firmware equipment so that the chip firmware equipment receives the automatic test data;
and after the automatic test data is sent, sending a data operation instruction to the chip firmware equipment so that the chip firmware equipment starts an automatic test program after receiving the automatic test data and the data operation instruction.
7. The automatic testing device of a chip is characterized by comprising an equipment detection module, a test data sending module and an automatic testing module; wherein the content of the first and second substances,
the device detection module is used for judging whether the chip firmware device is connected with a chip to be detected or not when the chip firmware device is detected to be accessed;
the test data sending module is used for sending automatic test data to the chip firmware equipment when the chip firmware equipment is judged to be connected with a chip to be tested, so that the chip firmware equipment receives the automatic test data and starts an automatic test program;
the automatic test module is used for sending a test instruction to the chip firmware equipment so as to enable the chip firmware equipment to perform module function test on the chip to be tested; and generating an automatic test result according to the test response returned by the chip firmware equipment.
8. The automatic test apparatus of a chip according to claim 7, wherein the automatic test module includes a test instruction reading unit, a test instruction transmitting unit, a first result generating unit, and a second result generating unit; wherein the content of the first and second substances,
the test instruction reading unit is used for reading a first test instruction in a preset test instruction list;
the test instruction sending unit is used for sending the read first test instruction to the chip firmware equipment so that the chip firmware equipment performs module function test on the chip to be tested according to the first test instruction and returns a first test response;
the first result generating unit is configured to receive a first test response returned by the chip firmware device, generate a sub-test result, and control the test instruction reading unit to read a next test instruction in the preset test instruction list;
and the second result generation unit is used for obtaining the automatic test result according to each generated sub-test result after each test instruction in the test instruction list is sent.
9. The automatic test apparatus of chip of claim 7, wherein the device detection module comprises a protocol frame transmission unit and a device judgment unit; wherein the content of the first and second substances,
the protocol frame sending unit is used for sending a BOOT protocol frame to the chip firmware equipment after detecting that the chip firmware equipment is accessed, so that the chip to be tested controls the chip firmware equipment to return a BOOT response after receiving the BOOT protocol frame;
and the device judging unit is used for judging that the chip firmware device is connected with a chip to be tested when receiving a BOOT response returned by the chip firmware device.
10. An automatic test system of a chip is characterized by comprising PC end equipment and chip fixing equipment; the PC terminal equipment is connected with the chip fixing equipment; the chip fixing equipment is used for connecting a chip to be tested; the PC terminal equipment comprises the automatic testing device of the chip as claimed in claims 7-9.
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