CN111256591B - External parameter calibration device and method for structured light sensor - Google Patents
External parameter calibration device and method for structured light sensor Download PDFInfo
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Abstract
The invention discloses an external parameter calibration device and method of a structured light sensor, which comprises the following steps: the device comprises a target body and a plurality of standard holes, wherein the plurality of standard holes are arranged on the target body in parallel, the number of the standard holes is not less than four, the circle centers of the upper surfaces of the standard holes are not on the same spatial plane, the horizontal distance between the centers of two adjacent standard holes is greater than the sum of the radiuses of the two standard holes, and the vertical distance is less than the sum of the radiuses of the two standard holes; the invention also provides a method for carrying out external reference calibration on the structured light sensor by using the calibration device, which has the characteristics of high flexibility and convenience in use, is suitable for calibration of various structured light sensors, reduces the dependence on the experimental environment where the calibration is carried out, and can be implemented in various industrial fields and shorten the time of the external reference calibration process.
Description
Technical Field
The invention relates to the field of external reference calibration, in particular to an external reference calibration device and method for a structured light sensor.
Background
With the development of computer vision, non-contact visual detection and other applications are more and more widely applied to scientific research and industry, wherein the visual measurement based on the line-structured light has the advantages of simple structure, low cost, high efficiency, flexible use and the like, and is widely applied to scientific research and industry, and the line-structured light sensor comprises a line-structured light projector and a camera; the projector projects structured light with a certain mode to the surface of a measured object, the camera collects the characteristics of the structured light, the characteristic points are extracted through image processing, and the characteristic points are restored to a sensor coordinate system O according to the structured light measurement principlec-three-dimensional space coordinates in XYZ, typically the sensor coordinate system, i.e. the camera coordinate system in the sensor, which is calibrated when the sensor is calibrated.
In the application of structured light measurement, it is far from insufficient to obtain the coordinates of the features under the sensor coordinate system, and the three-dimensional coordinates under the sensor coordinate system need to be converted into the coordinate system outside the sensor, i.e. external parameter calibration of the sensor is carried out, and how to quickly and accurately obtain the external parameters of the sensor in the field application is a key technology in the calibration of the sensor; the existing common method is to estimate the pose of the camera by using PNP, and the method has low precision and cannot meet the high-precision calibration requirement of the sensor; patent 201721209036.6-an industrial field fast calibration device, which proposes a fast target for field calibration, where the target can only measure one feature point each time during calibration, and needs to place a measuring ball on different ball seats for multiple times to measure multiple feature points, which is complicated to operate; in addition, in the process of coordinate system transformation, the sensor needs to be detached from the fastening device, and the sensor is installed back on the fastening device after calibration is finished, so that the time consumption is long, and assembly errors and pin hole matching errors are added.
Disclosure of Invention
Aiming at the problems, the invention provides the external reference calibration device and the external reference calibration method for the structured light sensor, the method is simple to operate, the calibration device only needs to be fastened to a proper position, and the time of the external reference calibration process is shortened.
An external reference calibration device of a structured light sensor is characterized by comprising: the horizontal distance between the centers of two adjacent standard holes is greater than the sum of the radiuses of the two standard holes, and the vertical distance is less than the sum of the radiuses of the two standard holes.
In order to ensure that the centers of the surface circles of the standard holes are not on the same spatial plane: the target body is provided with a plurality of planes with different heights, the planes are distributed in a ladder shape, and are gradually increased or gradually decreased, or are increased first and then decreased, or are decreased first and then increased, or are irregularly distributed in height.
Preferably, the standard holes are through holes having different sizes.
A method for calibrating a structured light sensor by using the external reference device, wherein the structured light sensor comprises a projector and a camera; the projector can project multi-line parallel structure light, multi-line cross structure light or speckles;
the method comprises the following steps:
1) fixing the calibration device in a field range of a camera, wherein the upper surface of each standard hole is perpendicular to the optical axis of the camera, a projector projects structural light onto the calibration device, and at least two light planes in the projected speckle or multiline structural light can cover all the standard holes in the calibration device;
2) a camera collects a structured light image modulated by a standard hole, and extracts all speckle structured light characteristics/light strip centers of a plurality of line structures projected on a single standard hole; performing three-dimensional reconstruction by using a structured light measurement principle, extracting edge characteristic points of a circle, fitting the circle and solving a three-dimensional coordinate of the circle center under a sensor coordinate system;
traversing each standard hole, and resolving the three-dimensional coordinates of the circle center of the upper surface of each standard hole under a sensor coordinate system by adopting the same method;
3) acquiring three-dimensional coordinates of the circle center of the upper surface of each standard hole in an external coordinate system by using a standard measuring instrument;
4) and resolving a rotational translation matrix between the sensor coordinate system and an external coordinate system based on rigid body transformation to obtain the external parameters of the structured light sensor.
The method carries out external reference calibration aiming at the speckle structure optical sensor and the multi-line structure optical sensor; the following describes a calibration method for a single-line structured light sensor:
a method for calibrating a structured light sensor by using the external reference device is disclosed, wherein the structured light sensor is a single-line structured light sensor and comprises a projector, a camera and a light source;
the method comprises the following steps:
1) fixing the calibration device in the field range of a camera, enabling the upper surface of each standard hole to be perpendicular to the optical axis of the camera, turning off a light source, projecting structured light to the calibration device by a projector, and covering all standard holes in the calibration device by the projected single-line structured light;
the camera collects a structured light image modulated by the standard hole, and calculates the coordinate (x) of the central point of the intersected straight line of the light plane and the upper surface of the single standard hole under the sensor coordinate system according to the light bars in the structured light imageQ,yQ,zQ)；
Turning off the projector, turning on the light source, collecting the standard hole image by the camera, calculating the circle center pixel coordinate of the upper surface of the single standard hole, and the connecting line of the circle center and the origin of the camera coordinate systemIntersecting the light plane at a point P, and converting the point P into a sensor coordinate system by using a line structured light measurement principle to obtain (x)P,yP,zP)；
According to the space geometric relation, calculating the space coordinate (x) of the circle center of the surface of the single standard hole under the sensor coordinate systemm,ym,zm)：
2) Traversing each standard hole, and obtaining the space coordinate of the center of the circle of the upper surface of each standard hole under the sensor coordinate system by adopting the calculation of the step 1);
3) acquiring three-dimensional coordinates of the surface circle center of each standard hole in an external coordinate system by using a standard measuring instrument;
4) and resolving a rotational translation matrix between the sensor coordinate system and an external coordinate system based on rigid body transformation to obtain the external parameters of the structured light sensor.
Preferably, the sensor coordinate system is established in the camera coordinate system.
Further, the standard measuring instrument includes: three-coordinate machine, laser tracker, total station, theodolite, joint arm type measuring machine.
Further, the three-dimensional coordinates of the center of the standard hole surface under a sensor coordinate system and an external coordinate system are used for precision evaluation:
obtaining the distance I between the centers of circles of the upper surfaces of any two or more standard holes under a sensor coordinate system;
obtaining the distance D between the circle centers of the upper surfaces of any two or more standard holes in an external coordinate system;
and comparing the distance I with the distance D to obtain a deviation value, and evaluating the precision of the structured light sensor according to the deviation value.
The calibration device and the calibration method have high flexibility, are suitable for calibrating various structured light sensors, reduce the dependence on the experimental environment where the calibration is positioned, and can be implemented in various industrial fields; the external parameter calibrated by the method of the invention is utilized to convert the sensor coordinate system into an external coordinate system, and the precision of the measured relative distance can reach +/-0.05 mm, thereby meeting the high-precision calibration requirement of the structured light sensor.
Drawings
Fig. 1 is a schematic perspective view and a top view of a calibration device in embodiment 1;
FIG. 2 is a diagram showing a camera collecting a single line structured light image modulated by a standard aperture;
FIG. 3 is an image of a standard hole acquired by a camera when the projector is turned off and the light source is turned on in example 1;
FIG. 4 is a schematic view of calculating the center of a circle on the top surface of a standard hole in embodiment 1;
fig. 5 is a schematic diagram of intersection of the light plane and the standard aperture of the multi-line structured light sensor in embodiment 2.
Detailed Description
The technical solution of the present invention is described in detail below with reference to the accompanying drawings and the detailed description.
Example 1
An external reference calibration device of a structured light sensor comprises: the horizontal distance between the centers of two adjacent standard holes is greater than the sum of the radiuses of the two standard holes, and the vertical distance is less than the sum of the radiuses of the two standard holes.
In order to ensure that the centers of the surface circles of the standard holes are not on the same spatial plane: the target body is provided with a plurality of planes with different heights, the planes are distributed in a ladder shape, and are gradually increased or gradually decreased, or are increased first and then decreased, or are decreased first and then increased, or are irregularly distributed in height.
As shown in fig. 1, in the present embodiment, a total of 4 standard holes are provided, and for the sake of convenience of distinction, the standard holes are through holes having different sizes.
The following explains a specific calibration process by taking an external reference calibration method of the single-line structured light sensor as an example:
a method for calibrating a structured light sensor by using the external reference device is disclosed, wherein the structured light sensor is a single-line structured light sensor and comprises a projector, a camera and a light source;
the method comprises the following steps:
1) fixing the calibration device in the field range of a camera, enabling the upper surface of each standard hole to be perpendicular to the optical axis of the camera, turning off a light source, projecting structured light to the calibration device by a projector, and covering all standard holes in the calibration device by the projected single-line structured light;
the camera collects a structured light image (shown in figure 2) containing modulated standard holes, and calculates the coordinate (x) of the central point of the intersecting straight line of the light plane and the upper surface of the single standard hole in the sensor coordinate system according to the light bars in the structured light imageQ,yQ,zQ)；
Turning off the projector, turning on the light source, collecting the standard hole image by the camera (as shown in FIG. 3), calculating the circle center pixel coordinate of the upper surface of the single standard hole, as shown in FIG. 4, the line connecting the circle center and the origin of the camera coordinate system intersects the light plane at point P, wherein, O is shown in the figurecXYZ denotes the sensor coordinate system, OmIs the center of the upper surface of a single standard hole, A, B is the intersection point of the light plane and the circular hole, Q is the midpoint of AB, and the center of O ismAnd the origin O of the camera coordinate systemcThe intersection of the connecting line between the two points and the light plane is at a point P;
converting the P point into a sensor coordinate system by using a line structured light measurement principle to obtain (x)P,yP,zP)；
According to the space geometric relationship, calculating the space coordinate (x) of the center of the upper surface of the single standard hole under the sensor coordinate systemm,ym,zm)：
2) Traversing each standard hole, and obtaining the space coordinate of the center of the circle of the upper surface of each standard hole under the sensor coordinate system by adopting the calculation of the step 1);
3) acquiring three-dimensional coordinates of the surface circle center of each standard hole in an external coordinate system by using a standard measuring instrument;
4) and resolving a rotational translation matrix between the sensor coordinate system and an external coordinate system based on rigid body transformation to obtain the external parameters of the structured light sensor.
Wherein, the standard measuring instrument can be one of a three-coordinate machine, a laser tracker, a total station, a theodolite and an articulated arm type measuring machine.
In addition, as another application of the calibration device, the embodiment provides a method for performing precision evaluation by using three-dimensional coordinates of the center of the surface of the standard hole in a sensor coordinate system and in an external coordinate system:
obtaining the distance I between the centers of circles of the upper surfaces of any two or more standard holes under a sensor coordinate system;
obtaining the distance D between the circle centers of the upper surfaces of any two or more standard holes in an external coordinate system;
and comparing the distance I with the distance D to obtain a deviation value, and evaluating the precision of the structured light sensor according to the deviation value.
Example 2
An external reference calibration method for a single-line structured light sensor is introduced in embodiment 1, and the external reference calibration device and the application process thereof are explained by taking a speckle structured light sensor and a multi-line structured light sensor as examples in this embodiment;
an external reference calibration device of a structured light sensor comprises: the horizontal distance between the centers of two adjacent standard holes is greater than the sum of the radiuses of the two standard holes, and the vertical distance is less than the sum of the radiuses of the two standard holes.
In order to ensure that the centers of the surface circles of the standard holes are not on the same spatial plane: the target body is provided with a plurality of planes with different heights, the planes are distributed in a ladder shape, and are gradually increased or gradually decreased, or are increased first and then decreased, or are decreased first and then increased, or are irregularly distributed in height.
In this embodiment, 4 standard holes are provided, and for the convenience of distinction, the standard holes are through holes with different sizes.
A method for calibrating a structured light sensor by using the external reference device, wherein the structured light sensor comprises a projector and a camera; the projector can project multi-line parallel structure light, multi-line cross structure light or speckles;
the method comprises the following steps:
1) fixing the calibration device in a field range of a camera, wherein the surface of each standard hole is vertical to the optical axis of the camera, a projector projects structural light to the calibration device, and at least two light planes in the projected speckle or multiline structural light can cover all the standard holes in the calibration device;
in the present embodiment, the light with the multi-line cross structure is taken as an example, as shown in fig. 5, two crossed light planes intersect with 4 standard holes;
2) a camera collects a structured light image modulated by a standard hole, and extracts all speckle structured light characteristics/light strip centers of a plurality of line structures projected on a single standard hole; performing three-dimensional reconstruction by using a structured light measurement principle, extracting edge characteristic points of a circle, fitting the circle and solving a three-dimensional coordinate of the circle center under a sensor coordinate system;
traversing each standard hole, and resolving the three-dimensional coordinates of the circle center of the upper surface of each standard hole under a sensor coordinate system by adopting the same method;
3) acquiring three-dimensional coordinates of the circle center of the upper surface of each standard hole in an external coordinate system by using a standard measuring instrument;
4) and resolving a rotational translation matrix between the sensor coordinate system and an external coordinate system based on rigid body transformation to obtain the external parameters of the structured light sensor.
For convenience of calculation, a sensor coordinate system is established in a camera coordinate system, and the calculation is as follows:
wherein the content of the first and second substances,
is a three-dimensional coordinate of the center of the circle on the upper surface of the standard hole under a camera coordinate system,
is the three-dimensional coordinate of the center of the upper surface of the standard hole in the external coordinate system, [ R T ]]A transformation matrix for the transformation of the camera coordinate system to an external coordinate system, i.e. the external parameters of the sensor. Where R is the rotation matrix in the rigid body transformation,
r is an orthogonal matrix and satisfies the following constraint equation:
and
t is a translation matrix in the rigid body transformation,
the parameters in the [ R T ] transformation matrix are solved by at least 4 non-coplanar circle center coordinates.
The foregoing descriptions of specific exemplary embodiments of the present invention have been presented for purposes of illustration and description. The foregoing description is not intended to be exhaustive or to limit the invention to the precise form disclosed, and obviously many modifications and variations are possible in light of the above teaching. The exemplary embodiments were chosen and described in order to explain certain principles of the invention and its practical application to enable others skilled in the art to make and use various exemplary embodiments of the invention and various alternatives and modifications thereof. It is intended that the scope of the invention be defined by the following claims and their equivalents.
Claims (7)
1. A method for calibrating a structured light sensor by using an external reference calibration device, wherein the structured light sensor comprises a projector and a camera; the projector can project multi-line parallel structure light, multi-line cross structure light or speckles;
the external reference calibration device comprises: the device comprises a target body and a plurality of standard holes, wherein the plurality of standard holes are arranged on the target body in parallel, the number of the standard holes is not less than four, the circle centers of the upper surfaces of the standard holes are not on the same spatial plane, the horizontal distance between the centers of two adjacent standard holes is greater than the sum of the radiuses of the two standard holes, and the vertical distance is less than the sum of the radiuses of the two standard holes;
the method is characterized by comprising the following steps:
1) fixing the calibration device in a field range of a camera, wherein the upper surface of each standard hole is perpendicular to the optical axis of the camera, a projector projects structured light onto the calibration device, and at least two light planes in the projected speckle or multi-line structured light can cover all the standard holes in the calibration device;
2) a camera collects a structured light image modulated by a standard hole, and extracts all speckle structured light characteristics/light strip centers of a plurality of line structures projected on a single standard hole; performing three-dimensional reconstruction by using a structured light measurement principle, extracting edge characteristic points of a circle, fitting the circle and solving a three-dimensional coordinate of the circle center under a sensor coordinate system;
traversing each standard hole, and resolving the three-dimensional coordinates of the circle center of the upper surface of each standard hole under a sensor coordinate system by adopting the same method;
3) acquiring three-dimensional coordinates of the circle center of the upper surface of each standard hole in an external coordinate system by using a standard measuring instrument;
4) and resolving a rotational translation matrix between the sensor coordinate system and an external coordinate system based on rigid body transformation to obtain the external parameters of the structured light sensor.
2. A method for calibrating a structured light sensor by using an external reference calibration device is characterized by comprising the following steps: the structured light sensor is a single-line structured light sensor and comprises a projector, a camera and a light source;
the external reference calibration device comprises: the device comprises a target body and a plurality of standard holes, wherein the plurality of standard holes are arranged on the target body in parallel, the number of the standard holes is not less than four, the circle centers of the upper surfaces of the standard holes are not on the same spatial plane, the horizontal distance between the centers of two adjacent standard holes is greater than the sum of the radiuses of the two standard holes, and the vertical distance is less than the sum of the radiuses of the two standard holes; the method is characterized by comprising the following steps:
1) fixing the calibration device in the field range of a camera, enabling the upper surface of each standard hole to be perpendicular to the optical axis of the camera, turning off a light source, projecting structured light to the calibration device by a projector, and covering all standard holes in the calibration device by the projected single-line structured light;
the camera collects a structured light image modulated by the standard hole, and calculates the coordinate (x) of the central point of the intersected straight line of the light plane and the upper surface of the single standard hole under the sensor coordinate system according to the light bars in the structured light imageQ,yQ,zQ)；
Turning off the projector, turning on the light source, collecting the standard hole image by the camera, calculating the pixel coordinate of the center of a circle on the upper surface of the single standard hole, intersecting the line between the center of the circle and the origin of the camera coordinate system with the light plane at a point P, and converting the point P into the sensor coordinate system by using the line structured light measurement principle to obtain (x)P,yP,zP)；
According to the space geometric relation, calculating the space coordinate (x) of the circle center of the surface of the single standard hole under the sensor coordinate systemm,ym,zm)：
2) Traversing each standard hole, and obtaining the space coordinate of the center of the circle of the upper surface of each standard hole under the sensor coordinate system by adopting the calculation of the step 1);
3) acquiring three-dimensional coordinates of the surface circle center of each standard hole in an external coordinate system by using a standard measuring instrument;
4) and resolving a rotational translation matrix between the sensor coordinate system and an external coordinate system based on rigid body transformation to obtain the external parameters of the structured light sensor.
3. The method of claim 1 or 2, wherein: and establishing a sensor coordinate system in a camera coordinate system.
4. The method of claim 1 or 2, wherein: the standard measuring instrument comprises: three-coordinate machine, laser tracker, total station, theodolite, joint arm type measuring machine.
5. The method of claim 1 or 2, wherein: and (3) performing precision evaluation by using three-dimensional coordinates of the circle center of the upper surface of the standard hole under a sensor coordinate system and an external coordinate system:
obtaining the distance I between the centers of circles of the upper surfaces of any two or more standard holes under a sensor coordinate system;
obtaining the distance D between the circle centers of the upper surfaces of any two or more standard holes in an external coordinate system;
and comparing the distance I with the distance D to obtain a deviation value, and evaluating the precision of the structured light sensor according to the deviation value.
6. The method of claim 1 or 2, wherein: in order to ensure that the centers of the surface circles of the standard holes are not on the same spatial plane: the target body is provided with a plurality of planes with different heights, the planes are distributed in a ladder shape, and are gradually increased or gradually decreased, or are increased first and then decreased, or are decreased first and then increased, or are irregularly distributed in height.
7. The method of claim 1 or 2, wherein: the standard holes are through holes with different sizes.
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| CN113945152B (en) * | 2021-10-18 | 2023-09-08 | 易思维（杭州）科技有限公司 | Method for recovering measurement function of single-line structured light three-dimensional sensor by utilizing three-dimensional block |
| CN113983933B (en) * | 2021-11-11 | 2022-04-19 | 易思维（杭州）科技有限公司 | Calibration method of multi-line laser sensor |
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