CN105043304A - Novel calibration plate and calibration method for performing length measurement by using calibration plate - Google Patents

Novel calibration plate and calibration method for performing length measurement by using calibration plate Download PDF

Info

Publication number
CN105043304A
CN105043304A CN201510585127.9A CN201510585127A CN105043304A CN 105043304 A CN105043304 A CN 105043304A CN 201510585127 A CN201510585127 A CN 201510585127A CN 105043304 A CN105043304 A CN 105043304A
Authority
CN
China
Prior art keywords
group
place kick
positioning balls
scaling board
novel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201510585127.9A
Other languages
Chinese (zh)
Inventor
刘洪霞
张敏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenyang Aircraft Industry Group Co Ltd
Original Assignee
Shenyang Aircraft Industry Group Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenyang Aircraft Industry Group Co Ltd filed Critical Shenyang Aircraft Industry Group Co Ltd
Priority to CN201510585127.9A priority Critical patent/CN105043304A/en
Publication of CN105043304A publication Critical patent/CN105043304A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

The invention relates to a novel calibration plate and a calibration method for performing length measurement by using the calibration plate. According to the structure of the novel calibration plate, a calibration plate body is provided with a plurality of positioning balls; the positioning balls are divided into four groups, wherein each group includes two positioning balls; the positioning balls in the A group are located at two sides of a vertical midline of the calibration plate and are symmetrically arranged; the diameter of the positioning balls in the A group is 50mm; the interval between the positioning balls in the A group is 150mm; the diameter of the positioning balls in the B group is 80mm; the positioning balls in the B group are located obliquely below the outer sides of the positioning balls in the A group; the interval between the positioning balls in the B group is 250mm; the diameter of the positioning balls in the C group is 150mm; the positioning balls in the C group are located at the outer sides of the positioning balls in the B group; the interval between the positioning balls in the C group is 400mm; the diameter of the positioning balls in the D group is 150mm; the positioning balls in the D group are located at the outer sides of the positioning balls in the C group; and the interval between the positioning balls in the D group is 750mm. The calibration method includes the following steps that: the difference of measurement indicating length La between positioning balls in each group and actual dimension between positioning balls in each group of the novel calibration plate, namely a calibration length truth value Lr, is obtained, so that a measurement error E can be obtained; an optical 3D measurement system is adjusted until the error satisfies accuracy requirements, and calibration work can be completed. This method is simple, quick, convenient and practical.

Description

A kind of novel scaling board and apply the calibration steps that this scaling board carries out length-measuring error
Technical field
The present invention relates to a kind of method that optical three-dimensional measurement system for sector scanning carries out length-measuring error calibration.Particularly devise a kind of novel scaling board, be exclusively used in calibrating for error of this measuring system.
Background technology
Optical three-dimensional measurement system is a kind of general measurement and testing apparatus, can be configured by user, to adapt to specifically measure task.Their sensor is made up of a few part, comprises one or several imageing sensor (camera), one or several optical projection system for being carried out to body surface measuring by structured light projection, or one for illuminating the texture illuminator that any surface exists.As: based on provision projection or the measuring system of mole provision technology, and there is the photogrammetric of sector scanning ability or scanning system.
Based on the optical three-dimensional measurement system of Surface scan, adopt the method for detecting phases of light field, during measurement, structured light (the grating provision of specific coding) is projected examined workpiece surface, the raster image of distortion is by the two or more camera synchronous acquisitions being mutually certain angle, through Digital Image Processing, calculate the three-dimensional point cloud coordinate of pixel in the public vision area of camera.
In optical three-dimensional measurement systematic difference process, likely there are some measuring error, it is generally length-measuring error, the error characteristics of the whole measurement range of measuring system are described by error in length parameter, these error characteristics depend on the superposition of various individual error, as uncorrected systematic error, the alignment error in succession during several measured object images and stochastic error.And way is not measured at present accordingly for this error, cause optical three-dimensional measurement system to there is bottleneck in application process.
Summary of the invention
In order to solve the technical matters of above-mentioned existence, the invention provides a kind of novel scaling board and applying the calibration steps that this scaling board carries out length-measuring error.
The object of the invention is to be achieved through the following technical solutions: a kind of novel scaling board, comprises scaling board body, it is characterized in that: on scaling board body, arrange some place kick, and described place kick is A, B, C, D tetra-groups, often organizing place kick has 2; Described A group place kick is positioned at scaling board median vertical line symmetria bilateralis and arranges, and sphere diameter is the spacing of 50mm, A group place kick is 150mm; Described B group place kick sphere diameter is 80mm, and be positioned at below the outer skew back of A group place kick, the spacing of B group place kick is 250mm; Described C group place kick sphere diameter is 150mm, is positioned at outside the place kick of B group, and the spacing of C group place kick is 400mm; Described D group place kick sphere diameter is 150mm, is positioned at outside the place kick of C group, and the spacing of D group place kick is 750mm.
Described scaling board length is 1m, and width is 40cm.
Apply the calibration steps that described scaling board carries out length-measuring error, step is as follows:
(1) aforementioned novel scaling board is arranged on platform to be measured;
(2) novel location-plate is aimed at camera, by optical grating projection instrument, Projection surveying is carried out in place kick on novel location-plate, during measurement, project structured light is surperficial to examined workpiece, the raster image of distortion is by the two or more camera synchronous acquisitions being mutually certain angle, through Digital Image Processing, calculate the three-dimensional point cloud coordinate of pixel in the public vision area of camera; Utilize data processing software, the corresponding measurement indicating length La often organized between place kick;
(3) physical size between place kick often organized by the measurement indicating length La between often group place kick step (2) obtained and novel location-plate, namely calibrates length true value Lr, does difference, obtain measuring error E; Getting maximal value in 4 groups of data is error amount;
(4) for the measuring error E obtained in step (3), adjustment optical three-dimensional measurement system, until error meets accuracy requirement, completes calibration operation.
Beneficial effect of the present invention: the novel scaling board of the optical three-dimensional measurement system that is exclusively used in that the present invention is arranged, spacing between place kick on scaling board is definite value, the physical size between place kick often organized by the measurement indicating length La that can be obtained by optical three-dimensional measurement system Actual measurement and novel location-plate, namely calibrate length true value Lr and ask poor, obtain measuring error E, i.e. measuring error E=La-Lr; Thus adjustment optical three-dimensional measurement system, error in length is made zero, the calibration of optical three-dimensional measurement system can be realized.This method simple and fast, convenient and practical.There is the problem that error cannot be calibrated in the optical three-dimensional measurement system in the past that solves.
Accompanying drawing explanation
Fig. 1 is the optical three-dimensional measurement system construction drawing based on Surface scan.
Fig. 2 is the novel scaling board structural drawing of the present invention.
Embodiment
Namely the present invention is applicable to the measuring system of single scan (" single-view ") three-dimensional body, is also applicable to the optical three-dimensional measurement system determining measured object from a few width different images (" from various visual angles ").
Based on Surface scan optical three-dimensional measurement system as shown in Figure 1, primarily of camera 1, optical grating projection instrument 2, tripod 3, scaling board composition.
Wherein scaling board, as shown in Figure 2, comprises scaling board body 41, and scaling board 41 length is 1m, and width is 40cm; Scaling board body 41 arranges some place kick, and place kick is A, B, C, D tetra-groups, and often organizing place kick has 2; A group place kick 42 is positioned at scaling board median vertical line symmetria bilateralis and arranges, and sphere diameter is the spacing of 50mm, A group place kick 42 is 150mm; B group place kick 43 sphere diameter is 80mm, and be positioned at below the outer skew back of A group place kick 42, the spacing of B group place kick 43 is 250mm; C group place kick 44 sphere diameter is 150mm, is positioned at outside B group place kick 43, and the spacing of C group place kick 44 is 400mm; D group place kick 45 sphere diameter is 150mm, is positioned at outside C group place kick 44, and the spacing of D group place kick 45 is 750mm.
Application of aforementioned scaling board carries out a calibration steps for length-measuring error, and step is as follows:
(1) aforementioned novel scaling board is arranged in optical three-dimensional measurement system;
(2) novel location-plate is aimed at camera, by optical grating projection instrument, Projection surveying is carried out in place kick on novel location-plate, during measurement, project structured light is surperficial to examined workpiece, the raster image of distortion is by the two or more camera synchronous acquisitions being mutually certain angle, through Digital Image Processing, calculate the three-dimensional point cloud coordinate of pixel in the public vision area of camera; Utilize data processing software, the corresponding measurement indicating length La often organized between place kick;
(3) physical size between place kick often organized by the measurement indicating length La between often group place kick step (2) obtained and novel location-plate, namely calibrates length true value Lr, does difference, obtain measuring error E; Getting maximal value in 4 groups of data is error amount;
(4) for the measuring error E obtained in step (3), adjustment optical three-dimensional measurement system, until error meets accuracy requirement, completes calibration operation.

Claims (3)

1. a novel scaling board, comprises scaling board body, it is characterized in that: on scaling board body, arrange some place kick, and described place kick is A, B, C, D tetra-groups, and often organizing place kick has 2; Described A group place kick is positioned at scaling board median vertical line symmetria bilateralis and arranges, and sphere diameter is the spacing of 50mm, A group place kick is 150mm; Described B group place kick sphere diameter is 80mm, and be positioned at below the outer skew back of A group place kick, the spacing of B group place kick is
250mm; Described C group place kick sphere diameter is 150mm, is positioned at outside the place kick of B group, and the spacing of C group place kick is 400mm; Described D group place kick sphere diameter is 150mm, is positioned at outside the place kick of C group, and the spacing of D group place kick is 750mm.
2. novel scaling board according to claim 1, is characterized in that: described scaling board length is 1m, and width is 40cm.
3. application rights requires that described in 1, scaling board carries out a calibration steps for length-measuring error, and it is characterized in that, step is as follows:
(1) aforementioned novel scaling board is arranged on platform to be measured;
(2) novel location-plate is aimed at camera, by optical grating projection instrument, Projection surveying is carried out in place kick on novel location-plate, during measurement, project structured light is surperficial to examined workpiece, the raster image of distortion is by the two or more camera synchronous acquisitions being mutually certain angle, through Digital Image Processing, calculate the three-dimensional point cloud coordinate of pixel in the public vision area of camera; Utilize data processing software, the corresponding measurement indicating length La often organized between place kick;
(3) physical size between place kick often organized by the measurement indicating length La between often group place kick step (2) obtained and novel location-plate, namely calibrates length true value Lr, does difference, obtain measuring error E; Getting maximal value in 4 groups of data is error amount;
(4) for the measuring error E obtained in step (3), adjustment optical three-dimensional measurement system, until error meets accuracy requirement, completes calibration operation.
CN201510585127.9A 2015-09-15 2015-09-15 Novel calibration plate and calibration method for performing length measurement by using calibration plate Pending CN105043304A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510585127.9A CN105043304A (en) 2015-09-15 2015-09-15 Novel calibration plate and calibration method for performing length measurement by using calibration plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510585127.9A CN105043304A (en) 2015-09-15 2015-09-15 Novel calibration plate and calibration method for performing length measurement by using calibration plate

Publications (1)

Publication Number Publication Date
CN105043304A true CN105043304A (en) 2015-11-11

Family

ID=54450043

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510585127.9A Pending CN105043304A (en) 2015-09-15 2015-09-15 Novel calibration plate and calibration method for performing length measurement by using calibration plate

Country Status (1)

Country Link
CN (1) CN105043304A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109405736A (en) * 2018-10-09 2019-03-01 东莞市北井光控科技有限公司 Semiconducter IC component size measurement method, device and terminal device
WO2019210644A1 (en) * 2018-05-04 2019-11-07 苏州玻色智能科技有限公司 Standard component used for three-dimensional white light scanning device and calibration method therefor
CN110702004A (en) * 2019-09-23 2020-01-17 深圳市智信精密仪器有限公司 Calibration block design and inspection method for high-precision calibration splicing of multiple line lasers
CN111256591A (en) * 2020-03-13 2020-06-09 易思维(杭州)科技有限公司 External parameter calibration device and method for structured light sensor
CN111890255A (en) * 2020-07-29 2020-11-06 苏州华兴源创科技股份有限公司 Crimping method and crimping system
CN114326273A (en) * 2022-03-16 2022-04-12 成都工业学院 Projector array positioning device for light field expansion

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1971206A (en) * 2006-12-20 2007-05-30 北京航空航天大学 Calibration method for binocular vision sensor based on one-dimension target
CN101074869A (en) * 2007-04-27 2007-11-21 东南大学 Method for measuring three-dimensional contour based on phase method
JP2011112401A (en) * 2009-11-24 2011-06-09 Omron Corp Calibration method for three-dimensional measurement and three-dimensional visual sensor
CN102425996A (en) * 2011-09-02 2012-04-25 黑龙江科技学院 Optical three-dimensional measuring equipment precision integration detection method and detection apparatus thereof
CN103697907A (en) * 2012-09-28 2014-04-02 北京航天计量测试技术研究所 High-precision calibration plate for camera parameter calibration and manufacturing method thereof
CN103954245A (en) * 2014-03-21 2014-07-30 北京信息科技大学 Precision calibration plate for articulated coordinate measuring machine
CN203893820U (en) * 2014-06-12 2014-10-22 李志刚 Matte ball plate and precision detection device of 3D scanning device

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1971206A (en) * 2006-12-20 2007-05-30 北京航空航天大学 Calibration method for binocular vision sensor based on one-dimension target
CN101074869A (en) * 2007-04-27 2007-11-21 东南大学 Method for measuring three-dimensional contour based on phase method
JP2011112401A (en) * 2009-11-24 2011-06-09 Omron Corp Calibration method for three-dimensional measurement and three-dimensional visual sensor
CN102425996A (en) * 2011-09-02 2012-04-25 黑龙江科技学院 Optical three-dimensional measuring equipment precision integration detection method and detection apparatus thereof
CN103697907A (en) * 2012-09-28 2014-04-02 北京航天计量测试技术研究所 High-precision calibration plate for camera parameter calibration and manufacturing method thereof
CN103954245A (en) * 2014-03-21 2014-07-30 北京信息科技大学 Precision calibration plate for articulated coordinate measuring machine
CN203893820U (en) * 2014-06-12 2014-10-22 李志刚 Matte ball plate and precision detection device of 3D scanning device

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
刘宝善等: "《航空人体测量学》", 30 June 2014, 北京航空航天大学出版社 *
闻邦椿 等: "《现代机械设计师手册 下册》", 30 June 2012, 机械工业出版社 *

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019210644A1 (en) * 2018-05-04 2019-11-07 苏州玻色智能科技有限公司 Standard component used for three-dimensional white light scanning device and calibration method therefor
KR20190127684A (en) * 2018-05-04 2019-11-13 쑤저우 보손 스마트 테크놀로지 엘티디 Reference member of 3D white light scanner and its calibration method
KR102190471B1 (en) * 2018-05-04 2020-12-14 쑤저우 보손 스마트 테크놀로지 엘티디 3D white light scanner calibration method
CN109405736A (en) * 2018-10-09 2019-03-01 东莞市北井光控科技有限公司 Semiconducter IC component size measurement method, device and terminal device
CN109405736B (en) * 2018-10-09 2021-09-14 东莞市北井光控科技有限公司 Semiconductor IC component size measuring method and device and terminal equipment
CN110702004A (en) * 2019-09-23 2020-01-17 深圳市智信精密仪器有限公司 Calibration block design and inspection method for high-precision calibration splicing of multiple line lasers
CN111256591A (en) * 2020-03-13 2020-06-09 易思维(杭州)科技有限公司 External parameter calibration device and method for structured light sensor
CN111890255A (en) * 2020-07-29 2020-11-06 苏州华兴源创科技股份有限公司 Crimping method and crimping system
CN111890255B (en) * 2020-07-29 2021-10-01 苏州华兴源创科技股份有限公司 Crimping method and crimping system
CN114326273A (en) * 2022-03-16 2022-04-12 成都工业学院 Projector array positioning device for light field expansion

Similar Documents

Publication Publication Date Title
CN105043304A (en) Novel calibration plate and calibration method for performing length measurement by using calibration plate
CN102364299B (en) Calibration technology for multiple structured light projected three-dimensional profile measuring heads
CN101901501B (en) Method for generating laser color cloud picture
CN101949693B (en) Method for calibrating three-dimensional imaging system
CN105934648A (en) Calibration method and measurement tool
JP6170281B2 (en) Three-dimensional measuring device, control method for three-dimensional measuring device, and program
US20090059011A1 (en) Calibration method for structure parameters of structured-light vision sensor
CN104913737A (en) Component quality checking device based on line laser three-dimensional measurement and detection method of device
CN103149560B (en) Calibrating method for CCD (Charge Coupled Device) imaging lateral laser radar
Xie et al. Simultaneous calibration of the intrinsic and extrinsic parameters of structured-light sensors
CN109443214B (en) Calibration method and device, measurement method and device for structured light three-dimensional vision
EP2588836A1 (en) Three-dimensional measurement apparatus, three-dimensional measurement method, and storage medium
CN111161358B (en) Camera calibration method and device for structured light depth measurement
JP2012058076A (en) Three-dimensional measurement device and three-dimensional measurement method
CN110849268A (en) Quick phase-height mapping calibration method
CN110672037A (en) Linear light source grating projection three-dimensional measurement system and method based on phase shift method
EP3548838B1 (en) Wire rope measuring device and wire rope measuring method
CN109990698A (en) Fast calibration device and quick calibrating method
CN109855559B (en) Full-space calibration system and method
CN106441234B (en) Detect scaling method in a kind of 3D machine vision space
JP5611022B2 (en) Three-dimensional measuring apparatus and three-dimensional measuring method
Xiong et al. The development of optical fringe measurement system integrated with a CMM for products inspection
CN106289086A (en) A kind of for optical indicia dot spacing from the double camera measuring method of Accurate Calibration
JP5270138B2 (en) Calibration jig and calibration method
CN202393362U (en) Long axis straightness detection system

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication

Application publication date: 20151111

RJ01 Rejection of invention patent application after publication