CN111243656A - Multithreading multi-temperature-zone intelligent aging test machine - Google Patents
Multithreading multi-temperature-zone intelligent aging test machine Download PDFInfo
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- CN111243656A CN111243656A CN202010133339.4A CN202010133339A CN111243656A CN 111243656 A CN111243656 A CN 111243656A CN 202010133339 A CN202010133339 A CN 202010133339A CN 111243656 A CN111243656 A CN 111243656A
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5604—Display of error information
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5606—Error catch memory
Abstract
The invention discloses an intelligent aging test machine with multiple threads and multiple temperature zones, which combines multiple ring test equipment, a detection instrument and auxiliary software or a functional module into one equipment, realizes synchronous operation of multiple programs and multiple instructions through system intelligent control, and can intuitively simulate the stability of a product used in different environments in time through the auxiliary software. The invention can reduce the investment cost and reduce the investment amount of personnel, field, equipment and capital; the man-made error rate is reduced, and the man-made error rate is also reduced by reducing the manpower and debugging of multiple equipment parameters; the profit is maximized, the research and development period can be shortened, and the product can be put into the market as soon as possible to obtain larger profit; the application range is wide, and the method is also suitable for small and medium-sized enterprises.
Description
Technical Field
The invention relates to the technical field of aging testers, in particular to a multithreading multi-temperature-zone intelligent aging tester.
Background
A semiconductor memory (semi-conductor memory) is a memory having a semiconductor circuit as a storage medium, and an internal memory is composed of a semiconductor integrated circuit called a memory chip. It can be divided into a Random Access Memory (RAM) and a Read Only Memory (ROM) according to their functions. Small size, fast storage speed, high storage density and easy interface with logic circuit.
In the conventional semiconductor storage product, when a temperature control environment is simulated for testing, a plurality of detection devices, such as a constant temperature and humidity machine, a pressure testing machine, a power supply, an oscilloscope, and poor detection auxiliary software, need to be constructed, and the detection needs to be performed by multiple devices for a long time and multiple manpower, so that a detection data result is obtained, and the following influences are caused: the research and development cost is high, and the research and development cost is increased due to the input of more workers, more equipment and more fields; the development period is too long, the best market occupation opportunity can be lost, and the profit of the product after being put into the market is reduced; when different products are switched, parameter setting errors can be caused due to habitual operation, so that the risk of detection data distortion is caused; for example, the product testing is complex, and the requirements on capital, field, equipment, personnel and the like are high, so that the method is not suitable for small-scale enterprise application.
Disclosure of Invention
The invention aims to provide a multithreading multi-temperature-zone intelligent aging tester to solve the problems in the background technology.
In order to achieve the purpose, the invention provides the following technical scheme: the intelligent aging test machine comprises a temperature zone control module and a multithreading instruction module, wherein the temperature zone control module is connected with a plurality of temperature boxes, the multithreading instruction module is connected with a plurality of threads, the temperature boxes are connected with an internal computer through a data acquisition module, the internal computer is respectively connected with the temperature zone control module and auxiliary software, the auxiliary software is connected with the multithreading instruction module, and the threads are respectively and correspondingly connected with the temperature boxes.
Preferably, the plurality of incubators comprise a first incubator, a second incubator, a third incubator and an Nth incubator, wherein N is an integer greater than 3, and a detection plate is installed in the incubators.
Preferably, the plurality of threads comprise a first thread, a second thread, a third thread and an Mth thread, M is an integer greater than 3, and the number of threads is consistent with the number of incubators.
Preferably, the using method comprises the following steps:
A. firstly, a user issues an instruction, a system calls detection parameters, and meanwhile, a temperature control device is started;
B. after the detection parameters are called, the program module is started, and after the temperature control device is started, environment simulation is carried out;
C. starting a plurality of programs after the program module is started, setting a plurality of temperature controls during environment simulation, and synchronously carrying out the plurality of programs and the temperature controls;
D. then the device to be tested is verified and the record is stored;
E. meanwhile, the background monitoring terminal carries out real-time monitoring.
Compared with the prior art, the invention has the beneficial effects that: the invention synthesizes a plurality of ring test devices, a detection instrument and auxiliary software or a functional module into one device, and can intuitively simulate the stability of the product in different environments in time through system intelligent control and multi-program and multi-instruction synchronous operation and the auxiliary software. The invention can reduce the investment cost and reduce the investment amount of personnel, field, equipment and capital; the man-made error rate is reduced, and the man-made error rate is also reduced by reducing the manpower and debugging of multiple equipment parameters; the profit is maximized, the research and development period can be shortened, and the product can be put into the market as soon as possible to obtain larger profit; the application range is wide, and the method is also suitable for small and medium-sized enterprises.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a flow chart of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, the present invention provides a technical solution: a multithreading multi-temperature-zone intelligent aging test machine comprises a temperature zone control module 1 and a multithreading instruction module 2, wherein the temperature zone control module 1 is connected with a plurality of temperature boxes, the multithreading instruction module 2 is connected with a plurality of threads, the temperature boxes are connected with a built-in computer 4 through a data acquisition module 3, the built-in computer 4 is respectively connected with the temperature zone control module 1 and auxiliary software 5, the auxiliary software 5 is connected with the multithreading instruction module 2, and the threads are respectively and correspondingly connected with the temperature boxes. The multithread instruction detection module is used for sending a test instruction in boxes with different temperature (humidity) and pressure environments, so that a product is tested in different environments, a test result is reported in real time, the test result is displayed in a real-time data or linear graph mode and the like, and a tester can know the test condition in time and can improve the abnormal condition in time; the built-in computer is connected with the detection board through a data line, and mutually transmits detection data and sends a test instruction; in addition, through auxiliary software, after corresponding data are detected, a logic judgment function of each test is added in a summary data table of the detection items. And finally, displaying the detection result in a visual display mode.
In the invention, a plurality of temperature boxes comprise a first temperature box 6, a second temperature box 7, a third temperature box 8 and an Nth temperature box, N is an integer more than 3, and a detection plate 9 is arranged in each temperature box; the multiple threads comprise a first thread 10, a second thread 11, a third thread 12 and an Mth thread, wherein M is an integer larger than 3, and the number of the threads is consistent with the number of the incubators.
The working principle is as follows: the using method of the invention comprises the following steps:
A. firstly, a user issues an instruction, a system calls detection parameters, and meanwhile, a temperature control device is started;
B. after the detection parameters are called, the program module is started, and after the temperature control device is started, environment simulation is carried out;
C. starting a plurality of programs after the program module is started, setting a plurality of temperature controls during environment simulation, and synchronously carrying out the plurality of programs and the temperature controls;
D. then the device to be tested is verified and the record is stored;
E. meanwhile, the background monitoring terminal carries out real-time monitoring.
In summary, the invention combines a plurality of ring test devices, a detection instrument and auxiliary software or functional modules into one device, and can intuitively simulate the stability of the product in different environments in time through system intelligent control, multi-program and multi-instruction synchronous operation and auxiliary software. The invention can reduce the investment cost and reduce the investment amount of personnel, field, equipment and capital; the man-made error rate is reduced, and the man-made error rate is also reduced by reducing the manpower and debugging of multiple equipment parameters; the profit is maximized, the research and development period can be shortened, and the product can be put into the market as soon as possible to obtain larger profit; the application range is wide, and the method is also suitable for small and medium-sized enterprises.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (4)
1. The utility model provides an intelligent aging testing machine of multithread multi-temperature-zone which characterized in that: the temperature control system comprises a temperature zone control module (1) and a multithreading instruction module (2), wherein the temperature zone control module (1) is connected with a plurality of temperature boxes, the multithreading instruction module (2) is connected with a plurality of threads, the temperature boxes are connected with a built-in computer (4) through a data acquisition module (3), the built-in computer (4) is respectively connected with the temperature zone control module (1) and auxiliary software (5), the auxiliary software (5) is connected with the multithreading instruction module (2), and the threads are respectively and correspondingly connected with the temperature boxes.
2. The intelligent aging tester with multi-thread and multi-temperature zone according to claim 1, wherein: the multiple temperature boxes comprise a first temperature box (6), a second temperature box (7), a third temperature box (8) and an Nth temperature box, wherein N is an integer larger than 3, and a detection plate (9) is installed in each temperature box.
3. The intelligent aging tester with multi-thread and multi-temperature zone according to claim 1, wherein: the multiple threads comprise a first thread (10), a second thread (11), a third thread (12) and an Mth thread, wherein M is an integer larger than 3, and the number of the threads is consistent with the number of the incubators.
4. The use method of the multithreading multi-temperature-zone intelligent aging tester, which is described in claim 1, is realized by the following steps: the using method comprises the following steps:
A. firstly, a user issues an instruction, a system calls detection parameters, and meanwhile, a temperature control device is started;
B. after the detection parameters are called, the program module is started, and after the temperature control device is started, environment simulation is carried out;
C. starting a plurality of programs after the program module is started, setting a plurality of temperature controls during environment simulation, and synchronously carrying out the plurality of programs and the temperature controls;
D. then the device to be tested is verified and the record is stored;
E. meanwhile, the background monitoring terminal carries out real-time monitoring.
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| CN202010133339.4A CN111243656A (en) | 2020-03-01 | 2020-03-01 | Multithreading multi-temperature-zone intelligent aging test machine |
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| CN202010133339.4A CN111243656A (en) | 2020-03-01 | 2020-03-01 | Multithreading multi-temperature-zone intelligent aging test machine |
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103810072A (en) * | 2012-11-09 | 2014-05-21 | 上海飞田通信技术有限公司 | Device and method for guaranteeing order execution of multithread tasks |
| CN107885598A (en) * | 2017-09-26 | 2018-04-06 | 东软集团股份有限公司 | Storage device detection method, device and computer |
| US20180136277A1 (en) * | 2014-04-18 | 2018-05-17 | Breker Verification Systems | Scheduling Of Scenario Models For Execution Within Different Computer Threads And Scheduling Of Memory Regions For Use With The Scenario Models |
| CN109164329A (en) * | 2018-10-23 | 2019-01-08 | 江苏华存电子科技有限公司 | A kind of semiconductor memory product high/low temperature ageing testing method |
| CN109390031A (en) * | 2018-10-23 | 2019-02-26 | 江苏华存电子科技有限公司 | A kind of semiconductor memory product high temperature ageing test method |
| US20190370173A1 (en) * | 2018-05-30 | 2019-12-05 | Advanced Micro Devices, Inc. | Prioritizing local and remote memory access in a non-uniform memory access architecture |
-
2020
- 2020-03-01 CN CN202010133339.4A patent/CN111243656A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103810072A (en) * | 2012-11-09 | 2014-05-21 | 上海飞田通信技术有限公司 | Device and method for guaranteeing order execution of multithread tasks |
| US20180136277A1 (en) * | 2014-04-18 | 2018-05-17 | Breker Verification Systems | Scheduling Of Scenario Models For Execution Within Different Computer Threads And Scheduling Of Memory Regions For Use With The Scenario Models |
| CN107885598A (en) * | 2017-09-26 | 2018-04-06 | 东软集团股份有限公司 | Storage device detection method, device and computer |
| US20190370173A1 (en) * | 2018-05-30 | 2019-12-05 | Advanced Micro Devices, Inc. | Prioritizing local and remote memory access in a non-uniform memory access architecture |
| CN109164329A (en) * | 2018-10-23 | 2019-01-08 | 江苏华存电子科技有限公司 | A kind of semiconductor memory product high/low temperature ageing testing method |
| CN109390031A (en) * | 2018-10-23 | 2019-02-26 | 江苏华存电子科技有限公司 | A kind of semiconductor memory product high temperature ageing test method |
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