CN111238384A - Qualitative thickness measuring method for thin stainless steel part coating - Google Patents
Qualitative thickness measuring method for thin stainless steel part coating Download PDFInfo
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- CN111238384A CN111238384A CN202010122909.XA CN202010122909A CN111238384A CN 111238384 A CN111238384 A CN 111238384A CN 202010122909 A CN202010122909 A CN 202010122909A CN 111238384 A CN111238384 A CN 111238384A
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- thickness
- coating
- stainless steel
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention discloses a qualitative thickness measuring method for a thin stainless steel part coating, which comprises the steps of irradiating the surface of a stainless steel part by a light source, and setting the standard thickness delta of the coating0Lower reflection strength value of I0Collecting the brightness of the illumination area with a CCD camera, and measuring the thickness delta of the coating<δ0Brightness of illumination area I<I0Judging whether the thickness of the non-plating layer or the plating layer does not reach the standard; when measuring the thickness delta of the coating>δ0Brightness of illumination area I>I0And judging that the thickness of the plating layer is qualified. According to the qualitative thickness measuring method, the CCD is used for carrying out fixed area microscopic judgment to determine whether the coating is thin or not through the obvious difference between the reflection of the plated part when the part is thin and the normal or thick part, so that the thin part is ensured to be rapidly and stably identified, and the assembly line type measuring method is high in efficiency and low in cost.
Description
Technical Field
The invention relates to a plating layer detection method, in particular to a qualitative thickness measurement method for a plating layer of a thin stainless steel part.
Background
When whether the surface coating of the stainless steel part is qualified or not is detected, the common magnetic eddy current or the common electric eddy current cannot be adopted for online measurement, and the XRAY measurement efficiency is not enough to meet the requirement of measurement speed, so that the method cannot be applied to the unique detection working conditions. Therefore, it is desirable to design a new measuring method specifically for simple and efficient coating quality inspection.
Disclosure of Invention
Based on the above, the invention provides a qualitative thickness measurement method for a coating of a thin stainless steel part, which simply judges whether the coating is on the surface of the stainless steel or whether the thickness of the coating is qualified according to the principle that the reflection of the plated part in the thin state is obviously different from the reflection of a normal or thick part.
In order to achieve the purpose, the invention adopts the following technical scheme:
a qualitative thickness measuring method for the coating of thin stainless steel part includes such steps as using light source to irradiate the surface of stainless steel part, and setting the standard thickness delta of coating0Lower reflection strength value of I0Collecting the brightness of the illumination area with a CCD camera, and measuring the thickness delta of the coating<δ0Brightness of illumination area I<I0Judging whether the thickness of the non-plating layer or the plating layer does not reach the standard; when measuring the thickness delta of the coating>δ0Brightness of illumination area I>I0And judging that the thickness of the plating layer is qualified.
In particular, when measuring the thickness of the coating layer delta<δ0When the lighting area is gray; when measuring the thickness delta of the coating>δ0When the lamp is used, the whole illumination area is bright silver.
In particular, delta0Set to 3 microns.
In particular, I0Set to 2000 mcd.
In particular, the thickness of the stainless steel part is 0 to 5 microns.
In conclusion, compared with the prior art, the qualitative thickness measurement method for the coating of the thin stainless steel part provided by the invention has the advantages that the reflection of light of the part after being plated is obviously different from that of a normal or thick part, and the CCD is used for carrying out fixed area microscopic judgment to determine whether the coating is thin or not, so that the thin part is ensured to be rapidly and stably identified, and the assembly line type measurement method has high efficiency and low cost.
Detailed Description
The technical solution of the present invention is further explained by the following embodiments.
This example provides a qualitative thickness measuring method for coating on thin stainless steel parts, which irradiates the surface of a stainless steel part with a light source to set the standard thickness delta of the coating0Lower reflection strength value of I0Specifically, the embodiment selects δ0Is 3 μm, I0According to the actual CCD setting, taking 2000mcd as an example, the brightness of the illumination area is collected by a CCD camera, and the thickness delta of the coating is measured<δ0Brightness of illumination area I<I0Judging whether the thickness of the non-plating layer or the plating layer does not reach the standard; when measuring the thickness delta of the coating>δ0In the meantime, the light shinesZone brightness I>I0And judging that the thickness of the plating layer is qualified.
In practice, when measuring the thickness delta of the coating<δ0When the lighting area is gray; when measuring the thickness delta of the coating>δ0And meanwhile, the whole illumination area is bright silver, so that CCD identification is more convenient.
The method is suitable for explosion stainless steel parts with the thickness of 0-5 microns, and due to the fact that the reflection values of parts with normal thickness and parts with partial thickness are different, the CCD cannot distinguish the coating thickness of the parts with normal thickness from the coating thickness of the parts with partial thickness.
In conclusion, in the qualitative thickness measurement method for the coating of the thin stainless steel part in the embodiment, the CCD is used for carrying out fixed area microscopic judgment to determine whether the coating is thin or not through the obvious difference between the reflection of the part after being plated and the normal or thick part when the part is thin, so that the thin part is ensured to be identified quickly and stably, and the assembly line type measurement method is high in efficiency and low in cost.
The above description is only a preferred embodiment of the present invention, and for those skilled in the art, the present invention should not be limited by the description of the present invention, which should be interpreted as a limitation.
Claims (5)
1. A qualitative thickness measuring method for the coating of thin stainless steel parts is characterized in that a light source is used for irradiating the surface of the stainless steel part, and the standard thickness delta of the coating is set0Lower reflection strength value of I0Collecting the brightness of the illumination area with a CCD camera, and measuring the thickness delta of the coating<δ0Brightness of illumination area I<I0Judging whether the thickness of the non-plating layer or the plating layer does not reach the standard; when measuring the thickness delta of the coating>δ0Brightness of illumination area I>I0And judging that the thickness of the plating layer is qualified.
2. The method of claim 1 for qualitative thickness measurement of the coating of thin stainless steel parts, wherein: when measuring the thickness delta of the coating<δ0When the lighting area is gray; when measuring the thickness delta of the coating>δ0The whole of the illumination areaIt is bright silver.
3. The method of claim 1 for qualitative thickness measurement of the coating of thin stainless steel parts, wherein: delta0Set to 3 microns.
4. The method of claim 1 for qualitative thickness measurement of the coating of thin stainless steel parts, wherein: i is0Set to 2000 mcd.
5. The method of claim 1 for qualitative thickness measurement of the coating of thin stainless steel parts, wherein: the thickness of the stainless steel part is 0-5 microns.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010122909.XA CN111238384A (en) | 2020-02-27 | 2020-02-27 | Qualitative thickness measuring method for thin stainless steel part coating |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010122909.XA CN111238384A (en) | 2020-02-27 | 2020-02-27 | Qualitative thickness measuring method for thin stainless steel part coating |
Publications (1)
| Publication Number | Publication Date |
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| CN111238384A true CN111238384A (en) | 2020-06-05 |
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| CN202010122909.XA Pending CN111238384A (en) | 2020-02-27 | 2020-02-27 | Qualitative thickness measuring method for thin stainless steel part coating |
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Citations (10)
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| CN1071004A (en) * | 1992-09-29 | 1993-04-14 | 清华大学 | Super thin transparent medium membrane thickness measured method |
| CN1128346A (en) * | 1994-11-16 | 1996-08-07 | 大宇电子株式会社 | Apparatus for measuring a coating thickness |
| CN1144906A (en) * | 1995-09-06 | 1997-03-12 | 东南大学 | Imaging detecting method and its equipment for film thickness and refractive index |
| EP1110054A4 (en) * | 1998-08-27 | 2001-10-31 | Tevet Process Control Technolo | Methods and apparatus for measuring the thickness of a film, particularly of a photoresist film on a semiconductor substrate |
| CN101017085A (en) * | 2007-02-27 | 2007-08-15 | 河南中光学集团有限公司 | Method for on-line measuring refractive index of blooming |
| US7483152B2 (en) * | 2004-03-03 | 2009-01-27 | Baker Hughes Incorporated | High resolution statistical analysis of localized corrosion by direct measurement |
| CN102221336A (en) * | 2010-03-11 | 2011-10-19 | 西部数据（弗里蒙特）公司 | Method and system for interrogating the thickness of a carbon layer |
| CN102980521A (en) * | 2012-10-25 | 2013-03-20 | 上海宏昊企业发展有限公司 | Thick-thin dual-purpose plating thickness measurer |
| CN103003661A (en) * | 2011-02-24 | 2013-03-27 | 康宁股份有限公司 | Methods and apparatus for the measurement of film thickness |
| EP2780663A2 (en) * | 2011-11-15 | 2014-09-24 | Process Metrix | Apparatus, process, and system for monitoring the integrity of containers |
-
2020
- 2020-02-27 CN CN202010122909.XA patent/CN111238384A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1071004A (en) * | 1992-09-29 | 1993-04-14 | 清华大学 | Super thin transparent medium membrane thickness measured method |
| CN1128346A (en) * | 1994-11-16 | 1996-08-07 | 大宇电子株式会社 | Apparatus for measuring a coating thickness |
| CN1144906A (en) * | 1995-09-06 | 1997-03-12 | 东南大学 | Imaging detecting method and its equipment for film thickness and refractive index |
| EP1110054A4 (en) * | 1998-08-27 | 2001-10-31 | Tevet Process Control Technolo | Methods and apparatus for measuring the thickness of a film, particularly of a photoresist film on a semiconductor substrate |
| US7483152B2 (en) * | 2004-03-03 | 2009-01-27 | Baker Hughes Incorporated | High resolution statistical analysis of localized corrosion by direct measurement |
| CN101017085A (en) * | 2007-02-27 | 2007-08-15 | 河南中光学集团有限公司 | Method for on-line measuring refractive index of blooming |
| CN102221336A (en) * | 2010-03-11 | 2011-10-19 | 西部数据（弗里蒙特）公司 | Method and system for interrogating the thickness of a carbon layer |
| CN103003661A (en) * | 2011-02-24 | 2013-03-27 | 康宁股份有限公司 | Methods and apparatus for the measurement of film thickness |
| EP2780663A2 (en) * | 2011-11-15 | 2014-09-24 | Process Metrix | Apparatus, process, and system for monitoring the integrity of containers |
| CN102980521A (en) * | 2012-10-25 | 2013-03-20 | 上海宏昊企业发展有限公司 | Thick-thin dual-purpose plating thickness measurer |
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| ZHANGFAN WEI等: "《Measurement of base angle of an axicon lens based on auto-collimation optical path》", 《OPTICS COMMUNICATIONS》 * |
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Application publication date: 20200605 |
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