CN111199326B - Product yield monitoring method and device and computer readable storage medium - Google Patents
Product yield monitoring method and device and computer readable storage medium Download PDFInfo
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- CN111199326B CN111199326B CN201811379295.2A CN201811379295A CN111199326B CN 111199326 B CN111199326 B CN 111199326B CN 201811379295 A CN201811379295 A CN 201811379295A CN 111199326 B CN111199326 B CN 111199326B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
- G06Q10/00—Administration; Management
- G06Q10/06—Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
- G06Q10/063—Operations research, analysis or management
- G06Q10/0633—Workflow analysis
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM]
- G05B19/41865—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM] characterised by job scheduling, process planning, material flow
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/32—Operator till task planning
- G05B2219/32252—Scheduling production, machining, job shop
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
Abstract
The invention provides a product yield monitoring method, which comprises the following steps: obtaining production information of products, wherein the production information comprises the number of products passing and failing through each station test and the number of products passing and failing through each visual test; calculating the yield of the product according to the production information, wherein the yield comprises one or more of the yield of each station, the total yield of the product and the yield of the project; comparing the calculated yield of the product with a preset yield control target, and judging whether the yield of the product meets the standard or not; when judging that the yield of the product does not reach the standard, generating early warning information; and generating a visual report according to the production information, the yield of the product and the early warning information, and controlling a display unit to display the visual report. The invention also provides a product yield monitoring device and a computer readable storage medium. The invention replaces the operation mode of manual yield control, improves the efficiency of yield control and reduces the production cost.
Description
Technical Field
The invention relates to the field of industrial production, in particular to a product yield monitoring method and device and a computer readable storage medium.
Background
At present, the defective products generated in the assembly and production process of electronic products are manually brushed to obtain data, the yield of the products is calculated, and a manual report is made to monitor the yield of the products. However, the manual process is slow, requires high demands on engineers, and the improvement period is long. During this period, defective products continue to be produced, affecting production efficiency and wasting production costs.
Disclosure of Invention
In view of the foregoing, there is a need for a method, apparatus and computer-readable storage medium for product yield monitoring to solve the above-mentioned problems.
The first aspect of the present invention provides a product yield monitoring method, which includes: obtaining production information of products, wherein the production information comprises the number of products passing and failing through each station test and the number of products passing and failing through each visual test; calculating the yield of the product according to the production information, wherein the yield comprises one or more of the yield of each station, the total yield of the product and the yield of the project; comparing the calculated yield of the product with a preset yield control target, and judging whether the yield of the product meets the standard or not; when judging that the yield of the product does not reach the standard, generating early warning information; and generating a visual report according to the production information, the yield of the product and the early warning information, and controlling a display unit to display the visual report.
A second aspect of the present invention proposes a product yield monitoring device for monitoring a yield of a product, the product yield monitoring device comprising: a display unit; a processor adapted to implement instructions; and a storage device adapted to store a plurality of instructions adapted to be loaded by the processor and to perform the steps of: obtaining production information of products, wherein the production information comprises the number of products passing and failing through each station test and the number of products passing and failing through each visual test; calculating the yield of the product according to the production information, wherein the yield comprises one or more of the yield of each station, the total yield of the product and the yield of the project; comparing the calculated yield of the product with a preset yield control target, and judging whether the yield of the product meets the standard or not; when judging that the yield of the product does not reach the standard, generating early warning information; and generating a visual report according to the production information, the yield of the product and the early warning information, and controlling a display unit to display the visual report.
A third aspect of the present invention proposes a computer-readable storage medium having stored thereon a computer program that is loaded by a processor and that executes a product yield monitoring method, the product yield monitoring method comprising: obtaining production information of products, wherein the production information comprises the number of products passing and failing through each station test and the number of products passing and failing through each visual test; calculating the yield of the product according to the production information, wherein the yield comprises one or more of the yield of each station, the total yield of the product and the yield of the project; comparing the calculated yield of the product with a preset yield control target, and judging whether the yield of the product meets the standard or not; when judging that the yield of the product does not reach the standard, generating early warning information; and generating a visual report according to the production information, the yield of the product and the early warning information, and controlling a display unit to display the visual report.
The product yield monitoring method and the product yield monitoring device can acquire the production information of the product, calculate the yield of the product, judge whether the yield meets the standard, and generate and display a visual report. The product yield monitoring method and the product yield monitoring device replace the manual yield control operation mode, improve the yield control efficiency and further reduce the production cost.
Drawings
Fig. 1 is a schematic hardware architecture diagram of a product yield monitoring device according to an embodiment of the present invention.
Fig. 2 is a schematic block diagram of a product yield monitoring system according to an embodiment of the present invention.
Fig. 3 is a flowchart of a method for monitoring a product yield in an embodiment of the present invention.
FIG. 4 is a flowchart of a method for monitoring yield of products according to another embodiment of the present invention.
Description of the main reference signs
| Product yield monitoringControl device | 1 |
| Product yield monitoring system | 10 |
| Processor and method for controlling the same | 11 |
| Memory device | 12 |
| Display unit | 13 |
| Input unit | 14 |
| Communication unit | 15 |
| Information acquisition module | 101 |
| Calculation module | 102 |
| Early warning module | 103 |
| Data analysis module | 104 |
| Visual report module | 105 |
The invention will be further described in the following detailed description in conjunction with the above-described figures.
Detailed Description
In order that the above-recited objects, features and advantages of the present invention will be more clearly understood, a more particular description of the invention will be rendered by reference to the appended drawings and appended detailed description. In addition, embodiments of the present application and features of the embodiments may be combined with each other without conflict.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention, and the described embodiments are merely some, rather than all, of the embodiments of the present invention. All other embodiments, based on the embodiments of the invention, which a person of ordinary skill in the art would achieve without inventive faculty, are within the scope of the invention.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.
The term "and/or" as used herein includes any and all combinations of one or more of the associated listed items.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a product yield monitoring device 1 according to an embodiment of the invention. The product yield monitoring device 1 comprises a processor 11, a memory 12, a display unit 13, an input unit 14 and a communication unit 15, wherein the memory 12, the display unit 13, the input unit 14 and the communication unit 15 are respectively and electrically connected with the processor 11.
The processor 11 may be a central processing unit (Central Processing unit, CPU), a digital signal processor, a single chip microcomputer, or the like, and is adapted to implement instructions.
The memory 12 is used for storing various data, such as program codes, in the product yield monitoring device 1, and implementing high-speed and automatic access of programs or data in the running process of the product yield monitoring device 1.
The Memory 12 may be, but is not limited to, read-Only Memory (ROM), random-access Memory (Random Access Memory, RAM), programmable Read-Only Memory (Programmable Read-Only Memory, PROM), erasable programmable Read-Only Memory (EPROM), one-time programmable Read-Only Memory (OTPROM), electrically erasable rewritable Read-Only Memory (EEPROM), compact disc Read-Only Memory (Compact Disc Read-Only Memory, CD-ROM) or other optical disk Memory, magnetic disk Memory, tape Memory, or any other computer readable medium capable of being used to carry or store data.
The memory 12 also stores a production database, an intelligent analysis database, and a quality control database.
The production database is used for storing production information of products, including the number of passing and failing tests at each station, an assembly line body, assembly time, a test line body, a bad workstation, test time, maintenance records, material use conditions, poor test items of the present time, historical poor test items and the like, and the production information is stored by taking a product serial number as a label.
The intelligent analysis database is used for storing historical maintenance information, namely historical maintenance information corresponding to a plurality of bad items, and the bad items are used as labels for storage.
The quality control database is used for storing yield control targets, including a total yield target, a site yield target and a project yield target.
It will be appreciated that in other embodiments, only the quality control database may be stored in the memory 12, and the production database and the intelligent analysis database may be databases in external systems.
The display unit 13 is configured to display a processing result of the processor 11. The display unit 13 comprises at least one display.
The input unit 14 is used for inputting various information, control instructions, and the like by a user. In the present embodiment, the input unit 14 may include a keyboard, a mouse, a touch screen, a camera, a remote controller, etc., but is not limited thereto.
The communication unit 15 is configured to establish a communication connection with other electronic devices. The communication unit 15 may be a wired communication unit or a wireless communication unit.
The product yield monitoring device 1 is internally provided with a product yield monitoring system. The product yield monitoring system comprises a functional module composed of a plurality of program code segments. Program code for each program segment in the product yield monitoring system may be stored in the memory 12 and executed by the processor 11 to implement the functions of the product yield monitoring system described above.
Referring to fig. 2, the product yield monitoring system 10 includes an information acquisition module 101, a calculation module 102, an early warning module 103, a data analysis module 104 and a visual report module 105.
The information acquisition module 101 is configured to acquire production information of a product. The production information comprises the number of products passing and failing through each station, an assembly line body, assembly time, a test line body, a defective station, test time, maintenance records, material use conditions, defective items of the current test, the number of products passing and failing through each visual test, historical defective items of the test and the like. The production information may be stored in the production database or in a system external to the product yield monitoring device. When the production information is stored in an external system, the information acquisition module 101 acquires the production information through the communication unit 15.
The calculating module 102 is configured to calculate a yield of the product according to the production information. The yield includes one or more of a site yield, a total product yield, and a project yield.
The early warning module 103 is configured to compare the calculated yield of the product with a preset yield control target, determine whether the yield of the product meets a standard, and generate early warning information when the yield does not meet the standard.
The data analysis module 104 is configured to match the current defective item with the historical maintenance information, obtain the historical maintenance data corresponding to the defective item, and perform centralized analysis on the current defective item according to the cause of the defective item. The historical maintenance information may be preset in the intelligent analysis database, or may be obtained from other systems by the information obtaining module 101.
The early warning module 103 is further configured to determine whether the current test defective item is consistent with the historical test defective item, determine whether the product after maintenance of the historical test defective item passes the test, and generate early warning information when it is determined that the product after maintenance of the historical test defective item does not pass the test.
The visual report module 105 is configured to generate a visual report according to the production information of the product, the calculated yield of the product, and the judging result that the yield reaches the standard, and control the display unit 13 to display the visual report.
The visual report module 105 is further configured to generate a visual report according to the project history maintenance data and the centralized analysis result.
Fig. 3 is a flowchart of a product yield monitoring method provided by the present invention, please refer to fig. 1 to 3, wherein the product yield monitoring method includes the following steps:
step S301: and obtaining production information of the product.
Specifically, the information acquisition module 101 acquires production information of a product from a production database according to a set condition. The set conditions include, but are not limited to, a model, a work order, a time period, an area, and the like.
The production information comprises the number of products passing and failing through each station, an assembly line body, assembly time, a test line body, a defective station, test time, maintenance records, material use conditions, defective items of the current test, the number of products passing and failing through each visual test, historical defective items of the test and the like.
In at least one embodiment, the information acquisition module 101 acquires both the historical maintenance information in the intelligent analysis database and the quality control information in the quality control database.
Step S302: and calculating the yield of the product, wherein the yield comprises one or more of the yield of each station, the total yield of the product and the yield of the project.
Specifically, the calculating module 102 calculates the yield of each site, the total yield of the product and the yield of the project according to the production information of the product.
The station yield is the ratio of the number of products passing the station test to the input number of the products. When the station yield is calculated, the number of products passing the test in each station and the number of products failing the test are added to obtain the input number of the products; and then dividing the number of products passing the test by the input number of the products to obtain the site yield.
Since products typically need to be tested through multiple sites in sequence, the overall yield of the product is the product of the yields of the multiple sites.
The project yield is the ratio of the number of products passing the test in the project to the input number of products in the project. And when the yield of the project is calculated, adding the number of products passing the test in the project and the number of products failing the test to obtain the input number of the products in the project. And then dividing the number of products passing the test by the input number of the products in the project, and obtaining the project yield.
Step S303: and comparing the calculated yield of the product with a preset yield control target, and judging whether the yield of the product meets the standard.
Specifically, the early warning module 103 compares the calculated yield of the product with a yield control target, and determines whether the yield of the product meets the standard.
If not, that is, at least one of the yield, the total product yield and the project yield of each site does not reach the standard, the step S304 is entered. If yes, that is, the yield of the products is up to standard, the process proceeds to step S305.
Step S304: and generating early warning information.
Specifically, the early warning module 103 generates early warning information according to the qualified rate.
Step S305: a visual report is generated and the display unit 13 is controlled to display the visual report.
Specifically, the visual report module 105 generates a visual report according to the production information of the product, the yield of the product and the standard condition of the yield, and controls the display unit 13 to display the visual report.
When the early warning information is generated, the visual report module further generates the visual report according to the early warning information, and the visual report module 105 can control the display unit 13 to prompt the unqualified yield in the visual report, for example, the chart area corresponding to the unqualified yield is displayed in red.
In some preferred embodiments, referring to fig. 4, between step S301 and step S305, the following steps are further included:
step S306: and matching the defective item in the test with the historical maintenance information to obtain the historical maintenance data corresponding to the defective item.
Specifically, the data analysis module 104 matches the current bad item in the production information with the acquired historical maintenance information, and obtains the historical maintenance data corresponding to the current bad item.
Step S307: and carrying out centralized analysis on the defective items of the test according to the defective reasons.
Specifically, the data analysis module 104 analyzes the concentration of the bad test item according to three categories of the test line body, the test station and the test fixture.
When the concentration is analyzed according to the test line body, the test line body where the bad product in the test project is located is judged to be concentrated on one test line body. When the concentration is analyzed according to the testing stations, the testing stations where the bad products in the current testing project are located are judged to be concentrated at one testing station. When the concentration is analyzed according to the test fixture, the defective item of the test is judged to be concentrated on a certain test fixture. By the above-described analysis of the concentration, the cause of the occurrence of the test failure item can be monitored.
It will be appreciated that the steps S302, S306, S307 described above may be performed simultaneously, or sequentially in a certain order.
Step S308: and judging whether the current test bad item is consistent with the historical test bad item.
The early warning module 103 judges whether the current test bad item is consistent with the corresponding historical test bad item. If yes, no early warning information is generated, and the step S305 is directly carried out; if not, the process proceeds to step S306.
Step S309: judging whether the product of the history test bad item corresponding to the test bad is tested to pass after maintenance.
And the early warning module 103 tests whether the product of the maintained product of the historical bad test item corresponding to the bad test passes or not. If yes, the step S305 is directly carried out without generating early warning information; if not, the process proceeds to step S310.
Step S310: and generating early warning information.
The early warning module 103 generates early warning information.
Next, in step S305, the visual report module 105 generates a visual report according to the project history maintenance data and the centralized analysis result.
When the early warning information has been generated, in step S305, the chart area of the visual report corresponding to the history defective test item is displayed in red.
The above yield monitoring method is exemplified below.
The production information, the historical maintenance information and the yield management and control targets of the products are obtained from a production database, an intelligent analysis database and a quality management and control database by setting conditions (model TL, work order WRO, time period 2018/10/12:07-2018/10/12:19, area A building 3) as follows:
site 1 drops 2000 pieces of product, passes 1990 pieces of test, and fails 10 pieces of test;
site 2 drops 2000 pieces of product, test passes 1970 pieces, test fails 30 pieces;
site 3 drops 2000 pieces of product, test pass 1950 pieces, test fail 50 pieces;
project a put 1000 pieces of product, test pass 990 pieces, test fail 10 pieces;
project B put 1000 pieces of product, 980 pieces tested, 20 pieces tested failed;
project C put 1000 pieces of product, test pass 970 pieces, test fail 30 pieces.
According to the information, the yield of the station 1 is 99.5%, the yield of the station 2 is 98.5%, the yield of the station 3 is 97.5%, and the total yield is 95.56%; the yield of the item A is 99%, the yield of the item B is 98%, and the yield of the item C is 97%.
Matching the defective item of the test with the historical maintenance information to obtain the corresponding historical maintenance data of the defective item, wherein the specific steps are as follows:
the historical change big data of the project A is as follows: 40 sheets of material X feeding problem accounting for 40 percent; 30 pieces of material Y are used for feeding, and the proportion is 30%; the material Z has 20 pieces of feeding material and accounts for 20 percent; the recombination material is X10 pieces, and the proportion is 10 percent.
The historical change big data of the project B is as follows: 40 sheets of material U with 40 percent of incoming material; 30 sheets of material V with a proportion of 30%; the material W is supplied into 20 sheets, and accounts for 20 percent; false test failure (NTF) 10 pieces, accounting for 10%.
The historical big data of the item C is: 50 sheets of material R feeding problem, 50% of material R feeding problem, 20 sheets of material S feeding problem, and 20% of material S feeding problem; 20 sheets of material T are taken as raw materials, the proportion is 20%, 10 sheets of material R are taken as raw materials, and the proportion is 10%.
Meanwhile, the defective item of the test is subjected to centralized analysis according to the defective reason, and the method specifically comprises the following steps:
the total of 10 bad products in item A are subjected to centralized analysis according to a product assembly line body, and the result is that: the line a01 failure was 4 pieces, the line a02 failure was 3 pieces, and the line a03 failure was 3 pieces.
The centralized analysis is carried out according to the test line body, and the result is that: the number of P04 line defects was 4, the number of P05 line defects was 4, and the number of P06 line defects was 2.
The centralized analysis is carried out according to the test fixture, and the result is as follows: 2 poor work stations 01# jig corresponding to the P04 line item A, and 2 poor work stations 03# jig corresponding to the P04 line item A; the P05 line item A corresponds to 4 poor work stations 02# jig; the number of defective work stations 01# corresponding to the line P06 item A is 1, and the number of defective work stations 02# corresponding to the line P06 item A is 1.
Similarly, items B and C are collectively analyzed for failure reasons, and are not listed here.
Then, comparing the yield of the product with a yield control target, wherein the result is that the yield of the station 1, the station 2, the item A, the item B and the item C reach the standard; station 3 yield does not reach standard. And then, generating and displaying a visual report, wherein the chart area corresponding to the yield of the station 3 is red, and the rest chart areas are green.
The product yield monitoring method and the product yield monitoring device 1 can acquire the production information of the product, calculate the yield of the product, judge whether the yield meets the standard, and generate and display a visual report. According to the product yield monitoring method and the product yield monitoring device 1, the operation mode of manual yield control is replaced, the timeliness of feedback is improved, the efficiency of yield control is improved, and further the production cost is reduced.
In addition, the product yield monitoring method and the product yield monitoring device 1 can also analyze the historical maintenance data corresponding to the bad item, and provide a reference for improving the bad item; meanwhile, the poor project of the test can be subjected to centralized analysis according to the poor reason, so that engineers can make improvement decisions quickly, and the management and control efficiency is further improved.
In addition, each functional unit in the embodiments of the present invention may be integrated in the same processing unit, or each unit may exist alone physically, or two or more units may be integrated in the same unit. The integrated units can be realized in a form of hardware or a form of hardware and a form of software functional modules.
It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The present embodiments are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned. Furthermore, it is evident that the word "comprising" does not exclude other elements or steps, and that the singular does not exclude a plurality. Product yield monitoring device the plurality of units or product yield monitoring devices recited in the claims may also be implemented by the same unit or computer device in software or hardware. The terms first, second, etc. are used to denote a name, but not any particular order.
Finally, it should be noted that the above-mentioned embodiments are merely for illustrating the technical solution of the present invention and not for limiting the same, and although the present invention has been described in detail with reference to the preferred embodiments, it should be understood by those skilled in the art that modifications and equivalents may be made to the technical solution of the present invention without departing from the spirit and scope of the technical solution of the present invention.
Claims (5)
1. The product yield monitoring method is characterized by comprising the following steps of:
obtaining production information of products, wherein the production information comprises the number of products passing and failing through each station test and the number of products passing and failing through each visual test, an assembly line body, assembly time, a test line body, a bad station, test time, maintenance records, material use conditions, a current test bad item and a historical test bad item;
matching the defective item in the current test with preset historical maintenance information to obtain historical maintenance data corresponding to the defective item; judging whether the current test bad item is consistent with the historical test bad item; when judging that the current test bad item is consistent with the historical test bad item, judging whether a product of the historical test bad item corresponding to the current test bad item after maintenance passes the test or not; when the product test of the history test bad item after maintenance is judged not to pass, generating early warning information; according to the three categories of the test line body, the test station and the test fixture, carrying out centralized analysis on the defective item of the current test;
calculating the yield of the product according to the production information, wherein the yield comprises one or more of the yield of each station, the total yield of the product and the yield of the project;
comparing the calculated yield of the product with a preset yield control target, and judging whether the yield of the product meets the standard or not;
when judging that the yield of the product does not reach the standard, generating early warning information;
and generating a visual report according to the production information, the yield of the product and the early warning information, and controlling a display unit to display the visual report.
2. The method of claim 1, wherein the station yield is a ratio of a number of products tested by the station to a number of products input by the station, the total product yield is a product of a plurality of the station yields, and the project yield is a ratio of a number of products tested by the project to a number of products input by the project.
3. A product yield monitoring device for monitoring yield of products, the product yield monitoring device comprising:
a display unit;
a processor adapted to implement instructions; a kind of electronic device with high-pressure air-conditioning system
A storage device adapted to store a plurality of instructions adapted to be loaded by the processor and to perform the steps of:
obtaining production information of products, wherein the production information comprises the number of products passing and failing through each station test and the number of products passing and failing through each visual test, an assembly line body, assembly time, a test line body, a bad station, test time, maintenance records, material use conditions, a current test bad item and a historical test bad item;
matching the defective item in the current test with preset historical maintenance information to obtain historical maintenance data corresponding to the defective item; judging whether the current test bad item is consistent with the historical test bad item; when judging that the current test bad item is consistent with the historical test bad item, judging whether a product of the historical test bad item corresponding to the current test bad item after maintenance passes the test or not; when the product test of the history test bad item after maintenance is judged not to pass, generating early warning information; according to the three categories of the test line body, the test station and the test fixture, carrying out centralized analysis on the defective item of the current test;
calculating the yield of the product according to the production information, wherein the yield comprises one or more of the yield of each station, the total yield of the product and the yield of the project;
comparing the calculated yield of the product with a preset yield control target, and judging whether the yield of the product meets the standard or not;
when judging that the yield of the product does not reach the standard, generating early warning information;
and generating a visual report according to the production information, the yield of the product and the early warning information, and controlling a display unit to display the visual report.
4. The product yield monitoring device according to claim 3, wherein the station yield is a ratio of a number of products tested by the station to a number of products put in, the total product yield is a product of a plurality of the station yields, and the project yield is a ratio of a number of products tested by the project to a number of products put in the project.
5. A computer readable storage medium having a computer program stored thereon, wherein the computer program is loaded by a processor and performs the product yield monitoring method according to any of claims 1-2.
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