CN111133338B - 具有单片闪烁体的多层探测器 - Google Patents

具有单片闪烁体的多层探测器 Download PDF

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Publication number
CN111133338B
CN111133338B CN201880061019.3A CN201880061019A CN111133338B CN 111133338 B CN111133338 B CN 111133338B CN 201880061019 A CN201880061019 A CN 201880061019A CN 111133338 B CN111133338 B CN 111133338B
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scintillator
region
monolithic
physical block
ray radiation
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Chinese (zh)
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CN111133338A (zh
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R·斯特德曼布克
W·吕腾
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Koninklijke Philips NV
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
    • H10F39/1898—Indirect radiation image sensors, e.g. using luminescent members

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Radiology & Medical Imaging (AREA)
  • Pulmonology (AREA)
  • Theoretical Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
CN201880061019.3A 2017-08-31 2018-08-20 具有单片闪烁体的多层探测器 Active CN111133338B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201762552563P 2017-08-31 2017-08-31
US62/552,563 2017-08-31
PCT/EP2018/072383 WO2019042797A1 (en) 2017-08-31 2018-08-20 MULTILAYER MONOLITHIC SCINTILLATOR DETECTOR

Publications (2)

Publication Number Publication Date
CN111133338A CN111133338A (zh) 2020-05-08
CN111133338B true CN111133338B (zh) 2024-06-11

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Country Status (5)

Country Link
US (1) US11181488B2 (https=)
EP (1) EP3676639B1 (https=)
JP (2) JP7181283B2 (https=)
CN (1) CN111133338B (https=)
WO (1) WO2019042797A1 (https=)

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* Cited by examiner, † Cited by third party
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EP3676639B1 (en) * 2017-08-31 2024-04-24 Koninklijke Philips N.V. Multi-layer detector with a monolithic scintillator
WO2019226859A1 (en) 2018-05-23 2019-11-28 The Research Foundation For The State University Of New York Flat panel x-ray imager with scintillating glass substrate
CN114076972B (zh) 2020-08-19 2025-05-27 清华大学 探测准直单元、探测装置及spect成像系统
CN114966813A (zh) * 2022-05-26 2022-08-30 西安交通大学 一种可用于快中子束流大面积成像的阵列型结构探测器
WO2023235270A1 (en) * 2022-05-31 2023-12-07 University Of Washington Coded detection for single photon emission computed tomography
CN114878604A (zh) * 2022-07-11 2022-08-09 芯晟捷创光电科技(常州)有限公司 一种射线探测器、探测方法和探测系统
CN115462821B (zh) * 2022-10-18 2025-03-21 明峰医疗系统股份有限公司 Ct探测器模块
WO2025255118A1 (en) * 2024-06-03 2025-12-11 The Research Foundation For The State University Of New York Structured glass-ceramic scintillators

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CN101937095A (zh) * 2009-06-30 2011-01-05 同方威视技术股份有限公司 双能x射线探测器及双能x射线探测器阵列装置
CN103339527A (zh) * 2011-02-03 2013-10-02 皇家飞利浦有限公司 单能量或多能量垂直辐射敏感探测器
CN103620445A (zh) * 2011-04-06 2014-03-05 皇家飞利浦有限公司 成像探测器
CN104285162A (zh) * 2012-05-07 2015-01-14 皇家飞利浦有限公司 具有设置在至少两个闪烁体阵列层之间的至少一个薄光传感器阵列层的多层水平计算机断层摄影(ct)探测器阵列
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EP1876955B1 (en) * 2005-04-26 2016-11-23 Koninklijke Philips N.V. Double decker detector for spectral ct
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CN103339527A (zh) * 2011-02-03 2013-10-02 皇家飞利浦有限公司 单能量或多能量垂直辐射敏感探测器
CN103620445A (zh) * 2011-04-06 2014-03-05 皇家飞利浦有限公司 成像探测器
CN104285162A (zh) * 2012-05-07 2015-01-14 皇家飞利浦有限公司 具有设置在至少两个闪烁体阵列层之间的至少一个薄光传感器阵列层的多层水平计算机断层摄影(ct)探测器阵列
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Publication number Publication date
JP7181283B2 (ja) 2022-11-30
US11181488B2 (en) 2021-11-23
EP3676639A1 (en) 2020-07-08
WO2019042797A1 (en) 2019-03-07
JP2022174229A (ja) 2022-11-22
US20210072167A1 (en) 2021-03-11
CN111133338A (zh) 2020-05-08
EP3676639B1 (en) 2024-04-24
JP2020531183A (ja) 2020-11-05

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