CN111128290A - Method and device for testing APST (advanced persistent storage) characteristics of solid state disk and computer equipment - Google Patents
Method and device for testing APST (advanced persistent storage) characteristics of solid state disk and computer equipment Download PDFInfo
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- CN111128290A CN111128290A CN201911349247.3A CN201911349247A CN111128290A CN 111128290 A CN111128290 A CN 111128290A CN 201911349247 A CN201911349247 A CN 201911349247A CN 111128290 A CN111128290 A CN 111128290A
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
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Abstract
The application relates to a method and a device for testing APST characteristics of a solid state disk, computer equipment and a storage medium, wherein the method comprises the following steps: acquiring a test request of APST characteristics of the solid state disk; closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in a PS1 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to a PS3 or PS4 state from PS 1; closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in a PS2 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to a PS3 or PS4 state from PS 2; and repeating the test steps until the test requirements are met. The testing method provided by the invention has higher testing coverage and is beneficial to improving the product quality of the SSD.
Description
Technical Field
The invention relates to the technical field of solid state disk testing, in particular to a method and a device for testing APST (active power test) characteristics of a solid state disk, computer equipment and a storage medium.
Background
Currently, many NVMe PCIe SSDs (hereinafter SSDs) in the market support APST (automatic power state Transitions, hereinafter APST) features. In some cases, the APST feature allows the SSD to automatically transition between its supported Power states, whereas typical consumer grade SSDs all support five Power states, PS0, PS1, PS2, PS3, and PS4 (Power State x, NVMe 1.3 protocol provides that the value of x is numbered sequentially from 0-32). Of the five power states described above, the SSD firmware typically sets PS0, PS1, and PS2 as power states in the active mode, while both PS3 and PS4 are set as power states in the inactive mode. The power consumption and performance of the SSD in the above five power states are all in the following order: PS0> PS1> PS2> PS3> PS 4.
When the APST feature of the SSD is in the on state, the power state of the SSD can only be automatically transitioned from the power state in the active mode, i.e., from one of PS 0-PS 2, to the power state in the non-active mode, i.e., PS3 or PS4, as specified by the NVMe 1.3 protocol.
The conventional method for testing the APST characteristics of the SSD is to perform repeated restarting, sleeping or sleeping tests on a host to be tested, and the principle is that in each restarting, sleeping or sleeping process, the host can turn on or turn off the APST characteristics of the SSD. Specifically, before the host does not open the SSD APST feature, the SSD is usually in the PS0 state, after the host opens the APST feature of the SSD, the SSD to be tested is usually only automatically switched from the PS0 state to the PS3 or PS4 state, and does not cover the scenario that the SSD is automatically switched from the PS1 or PS2 state to the PS3 or PS4 state when the SSD is in the PS1 or PS2 state and the APST is opened, so that the test coverage of the test method is insufficient, and a potential design defect in the scenario that the SSD is automatically switched from the PS1 or PS2 state to the PS3 or PS4 state cannot be detected.
Disclosure of Invention
In view of the above, it is necessary to provide a method and an apparatus for testing APST characteristics of a solid state disk with higher coverage, a computer device, and a storage medium.
A method for testing APST characteristics of a solid state disk comprises the following steps:
acquiring a test request of APST characteristics of the solid state disk;
closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in a PS0 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to a PS3 or PS4 state from PS 0;
closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in a PS1 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to a PS3 or PS4 state from PS 1;
closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in a PS2 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to a PS3 or PS4 state from PS 2;
and repeating the test steps until the test requirements are met.
In one embodiment, the step of closing the APST characteristic of the solid state disk to be tested, sending a command to make the solid state disk to be tested in the PS0 state, opening the APST characteristic of the solid state disk to be tested, and determining whether the solid state disk to be tested can be automatically switched from the PS0 to the PS3 or PS4 state further includes:
sending a command to close the APST feature of the SSD;
checking whether the APST function is normally closed, if so, sending a command to enable the SSD to be in a PS0 state;
checking whether the SSD is in a PS0 state, and if so, sending a command to open the APST characteristic of the SSD;
it is checked whether the APST function is normally turned on, and if so, whether the SSD can automatically transition from the PS0 to the PS3 or PS4 state.
In one embodiment, the step of closing the APST characteristic of the solid state disk to be tested, sending a command to make the solid state disk to be tested in the PS1 state, opening the APST characteristic of the solid state disk to be tested, and determining whether the solid state disk to be tested can be automatically switched from the PS1 to the PS3 or PS4 state further includes:
sending a command to close the APST feature of the SSD;
checking whether the APST function is normally closed, if so, sending a command to enable the SSD to be in a PS1 state;
checking whether the SSD is in a PS1 state, and if so, sending a command to open the APST characteristic of the SSD;
it is checked whether the APST function is normally turned on, and if so, whether the SSD can automatically transition from the PS1 to the PS3 or PS4 state.
In one embodiment, the step of closing the APST characteristic of the solid state disk to be tested, sending a command to make the solid state disk to be tested in the PS2 state, opening the APST characteristic of the solid state disk to be tested, and determining whether the solid state disk to be tested can be automatically switched from the PS2 to the PS3 or PS4 state further includes:
sending a command to close the APST feature of the SSD;
checking whether the APST function is normally closed, if so, sending a command to enable the SSD to be in a PS2 state;
checking whether the SSD is in a PS2 state, and if so, sending a command to open the APST characteristic of the SSD;
it is checked whether the APST function is normally turned on, and if so, whether the SSD can automatically transition from the PS2 to the PS3 or PS4 state.
An apparatus for testing APST characteristics of a solid state disk, the apparatus comprising:
the acquisition module is used for acquiring a test request of APST characteristics of the solid state disk;
the first test module is used for closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in the PS0 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to the PS3 or PS4 state from the PS 0;
the second test module is used for closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in the PS1 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to the PS3 or PS4 state from the PS 1;
the third testing module is used for closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in the PS2 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to the PS3 or PS4 state from the PS 2;
and the circulating module is used for repeatedly circulating the testing steps until the testing requirements are met.
In one embodiment, the first test module is further configured to:
sending a command to close the APST feature of the SSD;
checking whether the APST function is normally closed, if so, sending a command to enable the SSD to be in a PS0 state;
checking whether the SSD is in a PS0 state, and if so, sending a command to open the APST characteristic of the SSD;
it is checked whether the APST function is normally turned on, and if so, whether the SSD can automatically transition from the PS0 to the PS3 or PS4 state.
In one embodiment, the second testing module is further configured to:
sending a command to close the APST feature of the SSD;
checking whether the APST function is normally closed, if so, sending a command to enable the SSD to be in a PS1 state;
checking whether the SSD is in a PS1 state, and if so, sending a command to open the APST characteristic of the SSD;
it is checked whether the APST function is normally turned on, and if so, whether the SSD can automatically transition from the PS1 to the PS3 or PS4 state.
In one embodiment, the third testing module is further configured to:
sending a command to close the APST feature of the SSD;
checking whether the APST function is normally closed, if so, sending a command to enable the SSD to be in a PS2 state;
checking whether the SSD is in a PS2 state, and if so, sending a command to open the APST characteristic of the SSD;
it is checked whether the APST function is normally turned on, and if so, whether the SSD can automatically transition from the PS2 to the PS3 or PS4 state.
A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of any of the above methods when executing the computer program.
A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of any of the methods described above.
According to the test method and device for the APST characteristics of the solid state disk, the computer equipment and the storage medium, the test request for the APST characteristics of the solid state disk is obtained; closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in a PS0 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to a PS3 or PS4 state from PS 0; closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in a PS1 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to a PS3 or PS4 state from PS 1; closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in a PS2 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to a PS3 or PS4 state from PS 2; and repeating the test steps until the test requirements are met. The test method provided by the invention covers the test scene that the SSD APST characteristics are automatically converted into PS3 or PS4 from PS0, PS1 and PS2 after being opened, has higher test coverage, and can more effectively test the design defects related to the SSD APST characteristics, thereby being beneficial to improving the product quality of the SSD.
Drawings
Fig. 1 is a schematic flowchart illustrating a method for testing APST characteristics of a solid state disk according to an embodiment;
FIG. 2 is a schematic flowchart illustrating a method for testing APST characteristics of a solid state disk in another embodiment;
FIG. 3 is a flowchart illustrating a method for testing APST characteristics of a solid state disk according to yet another embodiment;
FIG. 4 is a flowchart illustrating a method for testing APST characteristics of a solid state disk in accordance with another embodiment;
FIG. 5 is a flowchart illustrating a method for testing APST characteristics of a solid state drive according to an embodiment;
FIG. 6 is a block diagram of an apparatus for testing APST characteristics of a solid state disk in an embodiment;
FIG. 7 is a diagram illustrating an internal structure of a computer device according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
At present, the existing method for testing the APST characteristics of the SSD is to perform a plurality of rounds of restart, sleep or hibernation tests on the host to be tested, and the principle is that the host performs an operation of turning on or off the APST characteristics of the SSD during each round of restart, sleep or hibernation. However, these test methods, although simple, have the following disadvantages: in the test method, before the host does not open the SSD APST characteristic, the SSD is usually in the PS0 state (the PS1 or PS2 state belongs to an operating state after the SSD performance is degraded, and usually the SSD enters into the PS0 or PS4 state only when the SSD temperature exceeds the set temperature control threshold and triggers down-conversion thereof), and after the host opens the APST characteristic of the SSD, the SSD to be tested is usually only automatically switched from the PS0 state to the PS3 or PS4 state, so that the test method does not cover a scenario in which the SSD is automatically switched from the PS1 or PS2 state to the PS3 or PS4 state after the SSD is in the PS1 or PS2 state and the APST is opened, so that the test coverage of the test method is insufficient, and a potential design defect in a scenario in which the SSD 1 or PS2 state is automatically switched to the PS3 or PS4 state cannot be tested.
Based on this, the invention provides a new method for testing the APST characteristics of a solid state disk, which aims to realize a test scenario that when the SSD is in the PS1 and PS2 states and the APST thereof is turned on, the SSD automatically transitions from the PS1 or PS2 state to the PS3 or PS4 state.
In one embodiment, as shown in fig. 1, a method for testing APST characteristics of a solid state disk is provided, the method including:
step 102, obtaining a test request of APST characteristics of the solid state disk;
step 104, closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in a PS0 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to a PS3 or PS4 state from PS 0;
106, closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in a PS1 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to a PS3 or PS4 state from PS 1;
step 108, closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in a PS2 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to a PS3 or PS4 state from PS 2;
and step 110, repeating the test steps until the test requirements are met.
In the embodiment, a test method is provided, and by using DriveMaster software of unlink corporation, a test script is written to accelerate testing of the APST characteristics of the SSD. Specifically, the hardware requirements include: the computer to be tested: computers that need to support access to PCIe L1.2 features; SSD to be tested: NVMe PCIeSSD which can enter into the five power states of PS 0-PS 4 needs to be supported. The software requirements include: operating the system: windows 10 operating system; testing software: DriveMaster 2015NVMe and test scripts written based on the software.
The process of executing the test script mainly includes the following three stages, and specifically, the process may be combined with the test completion flow chart shown in fig. 5, including:
the first stage is as follows: close APST → put SSD in PS0 state → open APST → SSD automatically transitions from PS0 to PS3 or PS4 state;
and a second stage: close APST → put SSD in PS1 state → open APST → SSD automatically transitions from PS1 to PS3 or PS4 state;
and a third stage: close APST → put SSD in PS2 state → open APST → SSD automatically transitions from PS2 to PS3 or PS4 state;
the three stages are 1 round, and N rounds of test are performed in a cycle (the value of N can be determined according to actual conditions). Compared with the existing testing method for testing the SSD APST characteristics, the testing method disclosed by the embodiment covers the testing scene that the SSD APST characteristics are automatically converted into PS3 or PS4 from PS0, PS1 and PS2 after being opened, the testing coverage is higher, the design defects related to the SSD APST characteristics can be more effectively tested, and the product quality of the SSD is favorably improved.
In the embodiment, a test request of APST characteristics of the solid state disk is obtained; closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in a PS0 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to a PS3 or PS4 state from PS 0; closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in a PS1 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to a PS3 or PS4 state from PS 1; closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in a PS2 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to a PS3 or PS4 state from PS 2; and repeating the test steps until the test requirements are met. The test method provided by the embodiment covers the test scene that the SSD APST characteristics are automatically converted into the PS3 or the PS4 from the PS0, the PS1 and the PS2 after being opened, the test coverage is higher, the design defects related to the SSD APST characteristics can be more effectively tested, and the product quality of the SSD is favorably improved.
In an embodiment, as shown in fig. 2, a method for testing APST characteristics of a solid state disk is provided, in which the steps of closing the APST characteristics of the solid state disk to be tested, sending a command to make the solid state disk to be tested in a PS0 state, opening the APST characteristics of the solid state disk to be tested, and determining whether the solid state disk to be tested can automatically switch from a PS0 to a PS3 or PS4 state further include:
step 202, sending a command to close the APST feature of the SSD;
step 204, checking whether the APST function is normally closed, if so, sending a command to enable the SSD to be in a PS0 state;
step 206, checking whether the SSD is in the PS0 state, if so, sending a command to open the APST characteristic of the SSD;
in step 208, it is checked whether the APST function is normally turned on, and if so, it is checked whether the SSD can be automatically switched from the PS0 to the PS3 or PS4 state.
Specifically, referring to fig. 5, the first stage of testing mainly includes the following steps:
1. and sending a command to close the APST characteristic of the SSD.
2. Is APST function checked for normal shutdown? If yes, the script continues to execute; otherwise, the script reports an error and the test is finished.
3. A command is sent to place the SSD in PS0 state.
4. Check if SSD is in PS0 state? If yes, the script continues to execute; otherwise, the script reports an error and the test is finished.
5. A command is sent to turn on the APST feature of the SSD.
6. Is the APST function checked for normal turn on? If yes, the script continues to execute; otherwise, the script reports an error and the test is finished.
7. Check if SSD can automatically transition from PS0 to PS3 or PS4 state? If yes, the script continues to execute; otherwise, the script reports an error and the test is finished.
In an embodiment, as shown in fig. 3, a method for testing APST characteristics of a solid state disk is provided, in which the steps of closing the APST characteristics of the solid state disk to be tested, sending a command to make the solid state disk to be tested in a PS1 state, opening the APST characteristics of the solid state disk to be tested, and determining whether the solid state disk to be tested can automatically switch from a PS1 to a PS3 or PS4 state further include:
step 302, sending a command to close the APST feature of the SSD;
step 304, checking whether the APST function is normally closed, if so, sending a command to enable the SSD to be in a PS1 state;
step 306, checking whether the SSD is in the PS1 state, and if so, sending a command to open the APST characteristic of the SSD;
step 308, checking whether the APST function is normally turned on, and if so, checking whether the SSD can automatically transition from the PS1 to the PS3 or PS4 state.
Specifically, referring to fig. 5, the second stage of testing mainly includes the following steps:
1. and sending a command to close the APST characteristic of the SSD.
2. Is APST function checked for normal shutdown? If yes, the script continues to execute; otherwise, the script reports an error and the test is finished.
3. A command is sent to place the SSD in PS1 state.
4. Check if SSD is in PS1 state? If yes, the script continues to execute; otherwise, the script reports an error and the test is finished.
5. A command is sent to turn on the APST feature of the SSD.
6. Is the APST function checked for normal turn on? If yes, the script continues to execute; otherwise, the script reports an error and the test is finished.
7. Check if SSD can automatically transition from PS1 to PS3 or PS4 state? If yes, the script continues to execute; otherwise, the script reports an error and the test is finished.
In an embodiment, as shown in fig. 4, a method for testing APST characteristics of a solid state disk is provided, in which the steps of closing the APST characteristics of the solid state disk to be tested, sending a command to make the solid state disk to be tested in a PS2 state, opening the APST characteristics of the solid state disk to be tested, and determining whether the solid state disk to be tested can automatically switch from a PS2 to a PS3 or PS4 state further include:
step 402, sending a command to close the APST characteristic of the SSD;
step 404, checking whether the APST function is normally closed, if so, sending a command to make the SSD in the PS2 state;
step 406, checking whether the SSD is in the PS2 state, if yes, sending a command to open the APST feature of the SSD;
in step 408, it is checked whether the APST function is normally turned on, and if so, it is checked whether the SSD can be automatically transitioned from the PS2 to the PS3 or PS4 state.
Specifically, referring to fig. 5, the third stage test mainly includes the following steps:
1. and sending a command to close the APST characteristic of the SSD.
2. Is APST function checked for normal shutdown? If yes, the script continues to execute; otherwise, the script reports an error and the test is finished.
3. A command is sent to place the SSD in PS2 state.
4. Check if SSD is in PS2 state? If yes, the script continues to execute; otherwise, the script reports an error and the test is finished.
5. A command is sent to turn on the APST feature of the SSD.
6. Is the APST function checked for normal turn on? If yes, the script continues to execute; otherwise, the script reports an error and the test is finished.
7. Check if SSD can automatically transition from PS2 to PS3 or PS4 state? If yes, the script continues to execute; otherwise, the script reports an error and the test is finished.
In the above embodiment, it can be understood that the above three-stage test is one round of test, and specifically, how many rounds of cycle test are needed in total can be determined according to actual conditions.
It should be understood that although the various steps in the flow charts of fig. 1-5 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least some of the steps in fig. 1-5 may include multiple sub-steps or multiple stages that are not necessarily performed at the same time, but may be performed at different times, and the order of performance of the sub-steps or stages is not necessarily sequential, but may be performed in turn or alternating with other steps or at least some of the sub-steps or stages of other steps.
In one embodiment, as shown in fig. 6, there is provided a device 600 for testing APST characteristics of a solid state disk, the device including:
an obtaining module 601, configured to obtain a test request for an APST characteristic of a solid state disk;
the first test module 602 is configured to close an APST characteristic of the solid state disk to be tested, send a command to enable the solid state disk to be tested to be in a PS0 state, open the APST characteristic of the solid state disk to be tested, and determine whether the solid state disk to be tested can be automatically switched from the PS0 to the PS3 or PS4 state;
the second test module 603 is configured to close the APST characteristic of the solid state disk to be tested, send a command to enable the solid state disk to be tested to be in the PS1 state, open the APST characteristic of the solid state disk to be tested, and determine whether the solid state disk to be tested can be automatically switched from the PS1 to the PS3 or PS4 state;
the third testing module 604 is configured to close the APST characteristic of the solid state disk to be tested, send a command to enable the solid state disk to be tested to be in the PS2 state, open the APST characteristic of the solid state disk to be tested, and determine whether the solid state disk to be tested can be automatically switched from the PS2 to the PS3 or PS4 state;
a loop module 605 for repeating the above steps of the test until the test requirements are met.
In one embodiment, the first testing module 602 is further configured to:
sending a command to close the APST feature of the SSD;
checking whether the APST function is normally closed, if so, sending a command to enable the SSD to be in a PS0 state;
checking whether the SSD is in a PS0 state, and if so, sending a command to open the APST characteristic of the SSD;
it is checked whether the APST function is normally turned on, and if so, whether the SSD can automatically transition from the PS0 to the PS3 or PS4 state.
In one embodiment, the second testing module 603 is further configured to:
sending a command to close the APST feature of the SSD;
checking whether the APST function is normally closed, if so, sending a command to enable the SSD to be in a PS1 state;
checking whether the SSD is in a PS1 state, and if so, sending a command to open the APST characteristic of the SSD;
it is checked whether the APST function is normally turned on, and if so, whether the SSD can automatically transition from the PS1 to the PS3 or PS4 state.
In one embodiment, the third testing module 604 is further configured to:
sending a command to close the APST feature of the SSD;
checking whether the APST function is normally closed, if so, sending a command to enable the SSD to be in a PS2 state;
checking whether the SSD is in a PS2 state, and if so, sending a command to open the APST characteristic of the SSD;
it is checked whether the APST function is normally turned on, and if so, whether the SSD can automatically transition from the PS2 to the PS3 or PS4 state.
For specific limitations of the testing apparatus for the APST characteristics of the solid state disk, reference may be made to the above limitations of the testing method for the APST characteristics of the solid state disk, and details are not described here again.
In one embodiment, a computer device is provided, the internal structure of which may be as shown in FIG. 7. The computer apparatus includes a processor, a memory, and a network interface connected by a device bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The nonvolatile storage medium stores an operating device, a computer program, and a database. The internal memory provides an environment for the operation device in the nonvolatile storage medium and the execution of the computer program. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program is executed by a processor to realize a method for testing APST characteristics of the solid state disk.
Those skilled in the art will appreciate that the architecture shown in fig. 7 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
In one embodiment, a computer device is provided, comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of the above method embodiments when executing the computer program.
In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the above respective method embodiments.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in the embodiments provided herein may include non-volatile and/or volatile memory, among others. Non-volatile memory can include read-only memory (ROM), Programmable ROM (PROM), Electrically Programmable ROM (EPROM), Electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), Dynamic RAM (DRAM), Synchronous DRAM (SDRAM), Double Data Rate SDRAM (DDRSDRAM), Enhanced SDRAM (ESDRAM), Synchronous Link DRAM (SLDRAM), Rambus Direct RAM (RDRAM), direct bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A method for testing APST characteristics of a solid state disk is characterized by comprising the following steps:
acquiring a test request of APST characteristics of the solid state disk;
closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in a PS0 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to a PS3 or PS4 state from PS 0;
closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in a PS1 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to a PS3 or PS4 state from PS 1;
closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in a PS2 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to a PS3 or PS4 state from PS 2;
and repeating the test steps until the test requirements are met.
2. The method for testing the APST characteristics of the solid state disk of claim 1, wherein the steps of closing the APST characteristics of the solid state disk to be tested, sending a command to make the solid state disk to be tested in the PS0 state, opening the APST characteristics of the solid state disk to be tested, and judging whether the solid state disk to be tested can be automatically switched from the PS0 to the PS3 or PS4 state further comprise:
sending a command to close the APST feature of the SSD;
checking whether the APST function is normally closed, if so, sending a command to enable the SSD to be in a PS0 state;
checking whether the SSD is in a PS0 state, and if so, sending a command to open the APST characteristic of the SSD;
it is checked whether the APST function is normally turned on, and if so, whether the SSD can automatically transition from the PS0 to the PS3 or PS4 state.
3. The method for testing the APST characteristics of the solid state disk of claim 1, wherein the steps of closing the APST characteristics of the solid state disk to be tested, sending a command to make the solid state disk to be tested in the PS1 state, opening the APST characteristics of the solid state disk to be tested, and judging whether the solid state disk to be tested can be automatically switched from the PS1 to the PS3 or PS4 state further comprise:
sending a command to close the APST feature of the SSD;
checking whether the APST function is normally closed, if so, sending a command to enable the SSD to be in a PS1 state;
checking whether the SSD is in a PS1 state, and if so, sending a command to open the APST characteristic of the SSD;
it is checked whether the APST function is normally turned on, and if so, whether the SSD can automatically transition from the PS1 to the PS3 or PS4 state.
4. The method for testing the APST characteristics of the solid state disk of claim 1, wherein the steps of closing the APST characteristics of the solid state disk to be tested, sending a command to make the solid state disk to be tested in the PS2 state, opening the APST characteristics of the solid state disk to be tested, and judging whether the solid state disk to be tested can be automatically switched from the PS2 to the PS3 or PS4 state further comprise:
sending a command to close the APST feature of the SSD;
checking whether the APST function is normally closed, if so, sending a command to enable the SSD to be in a PS2 state;
checking whether the SSD is in a PS2 state, and if so, sending a command to open the APST characteristic of the SSD;
it is checked whether the APST function is normally turned on, and if so, whether the SSD can automatically transition from the PS2 to the PS3 or PS4 state.
5. The device for testing APST characteristics of the solid state disk is characterized by comprising the following components:
the acquisition module is used for acquiring a test request of APST characteristics of the solid state disk;
the first test module is used for closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in the PS0 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to the PS3 or PS4 state from the PS 0;
the second test module is used for closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in the PS1 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to the PS3 or PS4 state from the PS 1;
the third testing module is used for closing the APST characteristic of the solid state disk to be tested, sending a command to enable the solid state disk to be tested to be in the PS2 state, opening the APST characteristic of the solid state disk to be tested and judging whether the solid state disk to be tested can be automatically switched to the PS3 or PS4 state from the PS 2;
and the circulating module is used for repeatedly circulating the testing steps until the testing requirements are met.
6. The apparatus for testing APST characteristics of a solid state disk according to claim 5, wherein the first testing module is further configured to:
sending a command to close the APST feature of the SSD;
checking whether the APST function is normally closed, if so, sending a command to enable the SSD to be in a PS0 state;
checking whether the SSD is in a PS0 state, and if so, sending a command to open the APST characteristic of the SSD;
it is checked whether the APST function is normally turned on, and if so, whether the SSD can automatically transition from the PS0 to the PS3 or PS4 state.
7. The apparatus for testing APST characteristics of a solid state disk according to claim 5, wherein the second testing module is further configured to:
sending a command to close the APST feature of the SSD;
checking whether the APST function is normally closed, if so, sending a command to enable the SSD to be in a PS1 state;
checking whether the SSD is in a PS1 state, and if so, sending a command to open the APST characteristic of the SSD;
it is checked whether the APST function is normally turned on, and if so, whether the SSD can automatically transition from the PS1 to the PS3 or PS4 state.
8. The apparatus for testing APST characteristics of a solid state disk according to claim 5, wherein the third testing module is further configured to:
sending a command to close the APST feature of the SSD;
checking whether the APST function is normally closed, if so, sending a command to enable the SSD to be in a PS2 state;
checking whether the SSD is in a PS2 state, and if so, sending a command to open the APST characteristic of the SSD;
it is checked whether the APST function is normally turned on, and if so, whether the SSD can automatically transition from the PS2 to the PS3 or PS4 state.
9. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the steps of the method of any of claims 1 to 4 are implemented when the computer program is executed by the processor.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method of any one of claims 1 to 4.
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