CN111094951A - Foreign matter inspection device - Google Patents

Foreign matter inspection device Download PDF

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Publication number
CN111094951A
CN111094951A CN201880060193.6A CN201880060193A CN111094951A CN 111094951 A CN111094951 A CN 111094951A CN 201880060193 A CN201880060193 A CN 201880060193A CN 111094951 A CN111094951 A CN 111094951A
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CN
China
Prior art keywords
light
foreign matter
imaging device
bottom portion
image
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Pending
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CN201880060193.6A
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Chinese (zh)
Inventor
户冢宏幸
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Omron Kirin Techno System Co Ltd
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Kirin Techno System Co Ltd
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Publication of CN111094951A publication Critical patent/CN111094951A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/94Investigating contamination, e.g. dust

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

When light emitted from an illumination device (3) is divided into first light (L1) reflected by an inner surface (1b) of a bottom (1a) of a light-transmitting container (1) and second light (L2) traveling in the bottom (1a) and reflected by an outer surface (1c) of the bottom (1a), an imaging device (5) is disposed at a position where an incident angle (α) at which the first light (L1) is received and the second light (L2) reflected by the outer surface (1c) enters the inner surface (1b) is larger than a critical angle.

Description

Foreign matter inspection device
Technical Field
The present invention relates to a foreign matter inspection device for inspecting whether or not foreign matter is present in a translucent container such as a glass bottle by imaging a bottom of the translucent container.
Background
In a glass bottle filled with a liquid such as a beverage, foreign matter such as a metal piece or a glass piece may be mixed. Foreign matter is mostly deposited on the bottom of the glass bottle. Therefore, after the glass bottle is filled with a liquid such as a beverage, the bottom of the glass bottle is inspected for the presence of foreign matter. As a device for detecting foreign matter, there is a foreign matter inspection device that detects foreign matter by image processing (for example, see patent document 1). Specifically, when the glass bottle is conveyed by the conveyor, the bottom of the glass bottle is photographed by a camera from obliquely below the glass bottle, and the foreign matter is detected from the obtained image. Since the foreign matter appears as a white or black shadow on the image, the presence or absence of the foreign matter can be detected by image processing.
Documents of the prior art
Patent document
Patent document 1: japanese patent laid-open publication No. 2004-317426
Patent document 2: japanese patent laid-open publication No. 2003-107011
Patent document 3: japanese patent laid-open No. 2012-42365
Technical problem to be solved by the invention
The outer surface of the bottom of the glass bottle is usually formed with a relief or imprint of letters or numbers. Since such emboss and imprint appear as shadows on the image, the conventional foreign matter inspection device may detect the emboss and imprint as foreign matter. Therefore, in order to detect foreign matter with high accuracy, there is a foreign matter inspection device that detects foreign matter moving in liquid by rotating a container filled with liquid and then stopping the rotation of the container (see patent document 2). However, this type of foreign matter inspection apparatus requires a special conveyance apparatus for rotating the container, not only making the whole of the foreign matter inspection apparatus large, but also making it impossible to use a conveyance apparatus existing in a factory.
As an apparatus for inspecting a container without rotating the container, there is a foreign matter inspection apparatus which illuminates the container from above and receives transmitted light transmitted through the bottom of the container by an imaging device disposed below the container to generate an image (see patent document 3). However, even this device requires a special conveying device that conveys the container while sandwiching both sides of the container in order to pick up the bottom of the container from below.
Disclosure of Invention
Accordingly, an object of the present invention is to provide a foreign matter inspection device that can detect foreign matter in a translucent container conveyed by an existing conveyor with high accuracy without being affected by embossments, imprints, and the like formed on the bottom of the translucent container such as a glass bottle.
Means for solving the problems
One embodiment of the present invention is a foreign matter inspection device including: an illumination device that is disposed on a side of the translucent container conveyed by the conveying device and illuminates the translucent container filled with the liquid; an imaging device that is disposed opposite to the illumination device with the transport device interposed therebetween and that generates an image of a bottom portion of the translucent container; and an image processing device that processes an image of the bottom portion, wherein when the light emitted from the illumination device is divided into first light reflected by an inner surface of the bottom portion and second light that travels inside the bottom portion and is reflected by an outer surface of the bottom portion, the imaging device is disposed at a position where an incident angle of the second light that is reflected by the outer surface and that can receive the first light to the inner surface is larger than a critical angle.
In a preferred embodiment of the present invention, the imaging device is disposed at a position higher than an inner surface of a bottom portion of the translucent container on the transport device.
In a preferred embodiment of the present invention, the imaging device includes a mirror disposed at a position where the mirror can receive the first light.
ADVANTAGEOUS EFFECTS OF INVENTION
When the incident angle of the second light advancing toward the liquid in the bottom of the light-transmissive container is larger than the critical angle, the second light is totally reflected on the inner surface of the bottom, and the second light does not advance toward the liquid. According to the present invention, since the second light is not received by the imaging device, the relief or the imprint formed on the outer surface of the bottom portion does not appear in the image generated by the imaging device. As a result, the foreign matter inspection device can detect foreign matter in the light-transmissive container with high accuracy without being affected by embossments, and the like.
According to the present invention, the imaging device can be disposed on the side of the translucent container. Therefore, a general type of conveying device such as a linear conveyor can be used as the conveying device for conveying the light-transmissive container. Therefore, the foreign matter inspection apparatus of the present invention can inspect the translucent container by directly using the conveying apparatus provided in the factory.
Drawings
Fig. 1 is a front view showing an embodiment of a foreign matter inspection device according to the present invention.
Fig. 2 is a plan view of the foreign matter inspection device shown in fig. 1.
Fig. 3 is a schematic view showing a state where diffused light emitted from the lighting device is reflected on the inner surface of the bottom of the glass bottle.
Fig. 4 is a diagram illustrating the position of the imaging device.
Fig. 5 is a diagram showing the progress of light when the incident angle of the second light to the inner surface of the bottom of the vial is smaller than the critical angle.
Fig. 6 is a diagram showing an image generated by the imaging device arranged at a position where the incident angle of the second light is larger than the critical angle as shown in fig. 4.
Fig. 7 is a diagram showing an image generated by the imaging device arranged at a position where the incident angle of the second light is smaller than the critical angle as shown in fig. 5.
Fig. 8 is a diagram showing another embodiment of the foreign matter inspection device.
Fig. 9 is a diagram showing still another embodiment of the foreign matter inspection device.
Detailed Description
Embodiments of the present invention will be described below with reference to the drawings.
Fig. 1 is a front view showing an embodiment of a foreign matter inspection device according to the present invention. Fig. 2 is a plan view of the foreign matter inspection device shown in fig. 1. In fig. 1 and 2, reference numeral 1 denotes a glass bottle as an example of a light-transmitting container. The foreign matter inspection device of the present embodiment inspects whether or not there is foreign matter in the bottom portion 1a of the glass bottle 1 in a state where the glass bottle 1 is filled with liquid such as beverage.
The foreign matter inspection device comprises: an illumination device 3, the illumination device 3 illuminating the glass bottle 1 filled with the liquid; an imaging device 5, wherein the imaging device 5 generates an image of the bottom 1a of the vial 1 from the light reflected by the inner surface 1b of the bottom 1a of the vial 1; and an image processing device 7, the image processing device 7 processing the image generated by the imaging device 5. The illumination device 3 and the imaging device 5 are disposed on both sides of the conveyance device 10. That is, the illumination device 3 is disposed on the side of the vial 1 conveyed by the conveyor 10, and the imaging device 5 is disposed opposite to the illumination device 3 with the conveyor 10 interposed therebetween. In the present embodiment, the imaging device 5 is disposed on the side of the conveying device 10 and at a position higher than the conveying surface (the placement surface of the glass bottle 1) 10a of the conveying device 10.
The illumination device 3 is configured to be capable of emitting diffused light, and a light emitting diode, for example, is used as a light source of the illumination device 3. The imaging device 5 includes a camera 5a having an image sensor such as a CCD or a CMOS. The illumination device 3 irradiates diffused light to the bottom portion 1a of the vial 1, and the imaging device 5 is configured to receive light reflected from the bottom portion 1a of the vial 1 with an image sensor and generate an image of the bottom portion 1a of the vial 1.
In the present embodiment, as shown in fig. 1, the imaging device 5 is disposed at a position higher than the inner surface 1b of the bottom portion 1a of the vial 1 on the conveying device 10. More specifically, the camera 5a of the imaging device 5 is directed toward the inner surface 1b of the bottom 1a of the vial 1 on the conveying device 10 and is inclined downward. In one example, the angle of the imaging device 5 with respect to the inner surface 1b of the bottom 1a of the vial 1 is less than 10 degrees.
The foreign matter inspection apparatus inspects the glass bottle 1 as follows. The glass bottle 1 is conveyed by the conveying device 10 at a predetermined speed. As shown in fig. 2, the conveying device 10 is a linear conveyor and conveys a plurality of glass bottles 1 at regular intervals. The illumination device 3 illuminates the bottom 1a of the vial 1 moved by the transport device 10, and the imaging device 5 receives light reflected by the inner surface 1b of the bottom 1a of the vial 1 and generates an image of the bottom 1 a.
The image processing device 7 receives the image from the imaging device 5 and performs image analysis. More specifically, the image processing device 7 determines whether or not the bottom portion 1a of the vial 1 contains foreign matter based on the image of the bottom portion 1 a. Since the foreign substance appears in the image as a shadow of white or black, the image processing device 7 can detect the foreign substance based on the image. The image processing device 7 may also issue an alarm signal when a foreign object is detected in the vial 1. The imaging device 5 and the image processing device 7 sequentially inspect the plurality of vials 1 conveyed by the conveyor 10 in the same manner.
The illumination device 3 is a so-called surface illumination, and is configured to be capable of emitting light in a plurality of directions from a wide area. Fig. 3 is a schematic diagram showing a state in which diffused light emitted from the illumination device 3 is reflected by the inner surface 1b of the bottom portion 1a of the glass bottle 1. As shown in fig. 3, the inner surface 1b of the bottom 1a of the glass bottle 1 generally has a curved shape protruding upward. Diffused light emitted from the illumination device 3 enters the inner surface 1b of the bottom portion 1a at various incident angles, and is reflected by the inner surface 1 b. The reflected light is transmitted through the side surface 1d of the vial 1, and the imaging device 5 receives a part of the light reflected by the inner surface 1b of the bottom 1a of the vial 1. In the example shown in fig. 3, light shown by a dotted line can be received by the imaging device 5, but light shown by a dotted line cannot be received by the imaging device 5. Therefore, the inspection range is a range of light irradiation shown by a chain line.
When the light emitted from the illumination device 3 is divided into the first light L1 reflected by the inner surface 1b of the bottom portion 1a of the vial 1 and the second light L2 traveling inside the bottom portion 1a to be reflected by the outer surface 1c of the bottom portion 1a, the imaging device 5 is disposed at a position where the incident angle α at which the first light L1 reflected by the inner surface 1b of the bottom portion 1a and the second light L2 reflected by the outer surface 1c are incident on the inner surface 1b is larger than the critical angle, and the second light L2 reflected by the outer surface 1c of the bottom portion 1a of the vial 1 is not received by the imaging device 5 disposed at such a position, and therefore an image in which the relief 15 formed on the outer surface 1c is not displayed can be generated.
Generally, it is known that light is totally reflected at an interface between media when an incident angle of light entering a medium having a small refractive index from a medium having a large refractive index is larger than a critical angle, since a refractive index of the glass bottle 1 is higher than a refractive index of a liquid in the glass bottle 1, there is a critical angle at an incident angle α of second light L2 proceeding from a bottom 1a of the glass bottle 1 to the liquid, the critical angle can be found in advance by calculation from the refractive index of the glass bottle 1 and the refractive index of the liquid, and when the incident angle α of the second light L2 is larger than the critical angle, as shown in fig. 4, the second light L2 is totally reflected at an inner surface 1b of the bottom 1a, and the second light L2 does not proceed into the liquid, and therefore, the second light L2 does not reach the image pickup device 5.
Fig. 5 is a diagram showing the progress of light when the incident angle α of the second light L2 is smaller than the critical angle when the incident angle α of the second light L2 is smaller than the critical angle, as shown in fig. 5, a part of the second light L2 enters the liquid from the bottom 1a of the glass bottle 1 and passes through the liquid to reach the imaging device 5, in which case the relief 15 appears in the image generated by the imaging device 5.
Fig. 6 is a view showing an image generated by the imaging device 5 arranged at a position where the incident angle α of the second light L2 is larger than the critical angle as shown in fig. 4, fig. 7 is a view showing an image generated by the imaging device 5 arranged at a position where the incident angle α of the second light L2 is smaller than the critical angle as shown in fig. 5, the angle of the imaging device 5 with respect to the inner surface 1b of the bottom portion 1a of the vial 1 is smaller than 10 degrees when the image of fig. 6 is acquired, and the angle of the imaging device 5 with respect to the inner surface 1b of the bottom portion 1a of the vial 1 is about 30 degrees when the image of fig. 7 is acquired.
As can be understood from fig. 6 and 7, foreign matter 20 and relief 15 appear in the image shown in fig. 7, whereas foreign matter 20 does not appear in the image shown in fig. 6. As described above, the foreign matter inspection device of the present embodiment can detect foreign matter in the glass bottle 1 with high accuracy without being affected by the embossments, marks, and the like formed on the outer surface 1c of the bottom portion 1a of the glass bottle 1.
The imaging device 5 can be disposed on the side of the vial 1. in the present embodiment, the imaging device 5 is disposed at a position higher than the inner surface 1b of the bottom 1a of the vial 1 on the conveyor 10. as described above, the position and angle of the imaging device 5 are not particularly limited as long as the conditions that the first light L1 can be received and the incident angle α of the second light L2 is larger than the critical angle are satisfied.
Fig. 8 is a diagram showing another embodiment of the foreign matter inspection device. The configuration and operation of the present embodiment, which are not described in particular, are the same as those of the embodiment shown in fig. 1 and 2, and therefore, redundant description thereof is omitted. In the embodiment shown in fig. 8, the image pickup device 5 has a mirror 5b disposed between the camera 5a and the conveyance device 10. The light reflected by the inner surface 1b of the bottom 1a of the vial 1 is further reflected by the mirror 5b to reach the camera 5 a. The camera 5a is disposed above the reflecting mirror 5 b.
In the present embodiment, the mirror 5b of the imaging device 5 is also arranged at the same position as the imaging device 5 shown in fig. 4, that is, the mirror 5b is arranged at a position where the incident angle α at which the first light L1 reflected by the inner surface 1b of the bottom portion 1a of the vial 1 can be received and the second light L2 reflected by the outer surface 1c enters the inner surface 1b is larger than the critical angle, and therefore, the foreign matter inspection device of the present embodiment can detect foreign matters inside the vial 1 with high accuracy without being affected by embossments, imprints, and the like formed on the outer surface 1c of the bottom portion 1a of the vial 1, and further, since the camera 5a can receive the first light L1 via the mirror 5b, the degree of freedom of the installation position of the camera 5a increases, and in one embodiment, the camera 5a may be positioned below the mirror 5 b.
Fig. 9 is a diagram showing still another embodiment of the foreign matter inspection apparatus, the configuration and operation of the present embodiment are the same as those of the embodiment shown in fig. 1 and 2, and therefore, the description thereof will be omitted, and in the embodiment shown in fig. 9, a plurality of image pickup devices 5, 22, 23 are provided, the image pickup devices 5, 22, 23 are disposed on the opposite side of the illumination device 3 with respect to the transport device 10, and are directed toward the illumination device 3, and the image pickup devices 22, 23 are disposed at positions and angles satisfying the condition that the first light L1 can be received and the incident angle α of the second light L2 is larger than the critical angle, as with the image pickup devices 5, 22, 23, and the image processing device 7 is connected to the image pickup devices 5, 22, 23, and processes the images transmitted from the image pickup devices 5, 22, 23 to detect the foreign matter in the glass bottle 1.
In the present embodiment, two imaging devices 22 and 23 are arranged on both sides of the imaging device 5 in addition to the imaging device 5 shown in fig. 2, but more imaging devices may be provided. The foreign matter inspection device in the present embodiment can simultaneously inspect a plurality of glass bottles 1, thereby improving the yield. The mirror 5b shown in fig. 8 can also be applied to the embodiment of fig. 9.
The above embodiments are described for the purpose of enabling those having ordinary knowledge in the art to which the present invention pertains to practice the present invention. Various modifications of the above-described embodiments will be apparent to those skilled in the art, and the technical ideas of the present invention are also applicable to other embodiments. Therefore, the present invention is not limited to the embodiments described above, but is to be interpreted in the broadest scope based on the technical idea defined in the scope of the invention.
Industrial applicability
The invention can be used for a foreign matter inspection device for imaging the bottom of a light-transmitting container such as a glass bottle to inspect whether foreign matter exists in the light-transmitting container.
Description of the symbols
1 glass bottle
3 Lighting device
5 image pickup device
5a camera
5b reflector
7 image processing device
10 conveying device
15 relief (sculpture)
20 foreign matter
22. 23 image pickup device
L1 first light
L2 second light

Claims (3)

1. A foreign matter inspection device is characterized by comprising:
an illumination device that is disposed on a side of the translucent container conveyed by the conveying device and illuminates the translucent container filled with the liquid;
an imaging device that is disposed opposite to the illumination device with the transport device interposed therebetween and that generates an image of a bottom portion of the translucent container; and
an image processing device that processes the image of the bottom portion,
when light emitted from the illumination device is divided into first light reflected by an inner surface of the bottom portion and second light that travels inside the bottom portion and is reflected by an outer surface of the bottom portion, the imaging device is disposed at a position where an incident angle at which the second light reflected by the outer surface and capable of receiving the first light enters the inner surface is larger than a critical angle.
2. The foreign matter inspection device according to claim 1,
the imaging device is disposed at a position higher than an inner surface of a bottom portion of the translucent container on the conveying device.
3. The foreign matter inspection device according to claim 1,
the imaging device includes a mirror disposed at a position capable of receiving the first light.
CN201880060193.6A 2017-09-19 2018-09-13 Foreign matter inspection device Pending CN111094951A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2017178792A JP6996736B2 (en) 2017-09-19 2017-09-19 Foreign matter inspection device
JP2017-178792 2017-09-19
PCT/JP2018/034014 WO2019059097A1 (en) 2017-09-19 2018-09-13 Foreign object inspection apparatus

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CN111094951A true CN111094951A (en) 2020-05-01

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KR (1) KR102627123B1 (en)
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WO (1) WO2019059097A1 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102021115493A1 (en) * 2021-06-15 2022-12-15 Heuft Systemtechnik Gmbh Process and device for full container inspection

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CN1366608A (en) * 2000-02-03 2002-08-28 三得利株式会社 Method and device for imaging liquid-filled container
JP2002257716A (en) * 2001-02-28 2002-09-11 Nippon Sheet Glass Co Ltd Deposit detector, and controller using the same
WO2012011438A1 (en) * 2010-07-20 2012-01-26 日本電気硝子株式会社 Device and method for detecting bubble in transparent tube
JP2013134099A (en) * 2011-12-26 2013-07-08 Kirin Techno-System Co Ltd Foreign substance inspection device
JP2016217866A (en) * 2015-05-20 2016-12-22 キリンテクノシステム株式会社 Container inspection device and inspection method

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JP2004317426A (en) 2003-04-18 2004-11-11 Kirin Techno-System Corp Apparatus for inspecting bottom of container for foreign substances
JP5724077B2 (en) 2010-08-20 2015-05-27 キリンテクノシステム株式会社 Foreign matter inspection device
JP2012122912A (en) 2010-12-10 2012-06-28 Kirin Techno-System Co Ltd Determination method of inspection region and foreign matter inspection device
JP6409178B2 (en) 2013-04-19 2018-10-24 キリンテクノシステム株式会社 Container inspection method and inspection apparatus
TW201736831A (en) 2015-12-31 2017-10-16 工業動力有限公司 System and method for inspecting containers using multile images of the containers

Patent Citations (6)

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Publication number Priority date Publication date Assignee Title
JPH02114158A (en) * 1988-10-24 1990-04-26 Hitachi Plant Eng & Constr Co Ltd Foreign matter inspection device for container such as amplule
CN1366608A (en) * 2000-02-03 2002-08-28 三得利株式会社 Method and device for imaging liquid-filled container
JP2002257716A (en) * 2001-02-28 2002-09-11 Nippon Sheet Glass Co Ltd Deposit detector, and controller using the same
WO2012011438A1 (en) * 2010-07-20 2012-01-26 日本電気硝子株式会社 Device and method for detecting bubble in transparent tube
JP2013134099A (en) * 2011-12-26 2013-07-08 Kirin Techno-System Co Ltd Foreign substance inspection device
JP2016217866A (en) * 2015-05-20 2016-12-22 キリンテクノシステム株式会社 Container inspection device and inspection method

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JP6996736B2 (en) 2022-01-17
KR20200054233A (en) 2020-05-19
JP2019053000A (en) 2019-04-04
KR102627123B1 (en) 2024-01-23
WO2019059097A1 (en) 2019-03-28

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Application publication date: 20200501