CN111090028B - Device and method for superposition test of double-piece microchannel plate - Google Patents
Device and method for superposition test of double-piece microchannel plate Download PDFInfo
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- CN111090028B CN111090028B CN201911292186.1A CN201911292186A CN111090028B CN 111090028 B CN111090028 B CN 111090028B CN 201911292186 A CN201911292186 A CN 201911292186A CN 111090028 B CN111090028 B CN 111090028B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/24—Testing of discharge tubes
- G01R31/25—Testing of vacuum tubes
- G01R31/252—Testing of electron multipliers, e.g. photo-multipliers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
- H01J43/04—Electron multipliers
- H01J43/06—Electrode arrangements
- H01J43/18—Electrode arrangements using essentially more than one dynode
- H01J43/24—Dynodes having potential gradient along their surfaces
- H01J43/246—Microchannel plates [MCP]
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Abstract
The application discloses a device and a method for a double-piece microchannel plate superposition test. The invention can test the microchannel plates with a double-plate superposed structure, control the distance between the two microchannel plates, realize that the two microchannel plates respectively carry out voltage regulation and control, facilitate the installation and the taking out of the microchannel plates, reduce the damage to the microchannel plates in the test process, simply and conveniently convert the relative positions of the two microchannel plates and avoid reinstallation of the microchannel plates.
Description
Technical Field
The invention relates to the technical field of microchannel plates, in particular to a device and a method for superposition testing of double microchannel plates.
Background
The micro-channel plate is a key element for realizing low-light night vision technology, and is a compact two-dimensional array composed of many channel electron multipliers, and has a sheet-type honeycomb structure, the inner surface of the hollow glass fiber has a resistive secondary electron emission layer, and can multiply the electrons by thousands of times, and the layer is connected with the input and output electrodes of the micro-channel plate, the hollow glass is called micro-channel, and the diameter of the channel is generally 5-12 μm. The gain of the microchannel plate refers to the ratio of the output current and the input current of the microchannel plate, and different application scenes have different requirements on the gain of the microchannel plate. In most cases, the gain of one microchannel plate can meet the requirements of optoelectronic products such as low-light night vision devices. However, under some special use requirements, the gain of the single-chip microchannel plate cannot meet the detection requirement, and at this time, the problem is often solved by using the two-chip microchannel plate in a superposed manner. Under the requirement of overlapping use of the two micro-channel plates, how to simply, conveniently, nondestructively and accurately evaluate the overlapping effect of the two micro-channel plates before the production of products is always a difficult problem which puzzles micro-channel plate testers.
Aiming at the installation process before the superposition test of the two micro-channel plates, especially under the condition that the two micro-channel plates need to be respectively applied with voltage, more electrodes and insulating rings need to be installed, and when the mutual positions of the two micro-channel plates need to be changed in the test process, all the electrodes and the micro-channel plates need to be detached and reinstalled, so that the test and installation processes are complex. The device is used for solving the problems that the double-piece microchannel plate is overlapped in the installation and test process and is difficult to avoid the scratch and the discharge, and the nondestructive installation can not be realized. In the process of overlapping and testing the two micro-channel plates, parameters such as the distance between the two micro-channels are not accurately controlled, errors are easy to generate, and results are not accurate.
Disclosure of Invention
The invention aims to solve the problems and provides a device and a method for testing a double-piece superposed microchannel plate.
The invention provides a device for a double-piece microchannel plate superposition test, which comprises a vacuum pump set, an electron/ion source, a double-piece superposed tube shell for the microchannel plate test and a signal detection system, wherein:
the vacuum pump set is used for providing 10 for the test of the micro-channel-3A vacuum environment of Pa;
the electron/ion source is used for providing electrons/ions which are incident to the tube shell for the double-piece superposed microchannel plate test;
the tube shell for testing the double-piece superposed microchannel plate comprises a plurality of connecting rings which are installed in a central symmetry manner, wherein the microchannel plate to be tested is installed from two ends of the tube shell through the pressure rings respectively, and the tube shell provides a voltage interface and adjusts the distance and the position of the microchannel plate through the tube shell;
and the signal detection system is used for measuring the corresponding current in the test process of the microchannel plate according to the electrons/ions incident to the tube shell.
Preferably, the number and energy of the electrons/ions output by the electron/ion source are adjustable.
Preferably, the tube shell for the two-piece superposed microchannel plate test comprises a central ceramic ring located in the center, and MCP support rings, a first ceramic ring, a clamping ring fixing ring, a second ceramic ring, a pressure spring support ring, a third ceramic ring and an outer metal ring which are symmetrically arranged from the central ceramic ring to two sides in sequence, wherein each pressure spring support ring, each clamping ring fixing ring and each MCP support ring are provided with a protruded pole piece, and the pressure spring support ring located on each side of the central ceramic ring is jointed with the pole piece of the clamping ring fixing ring.
Preferably, the distance between two microchannel plates to be tested is controlled by adjusting the thicknesses of the MCP support ring and the central ceramic ring in the tube shell for testing the two superposed microchannel plates.
Preferably, in the tube shell for testing the double-piece superposed microchannel plate, the surface of the central ceramic ring is plated with a metal film layer.
Preferably, the two superposed microchannel plates are used for testing, the size and thickness of the MCP support ring are adjusted and reduced in the tube shell, so that the MCP support ring only plays a role in providing voltage, and the distance between the two microchannel plates is only influenced by the thickness of the central ceramic ring.
Preferably, the distance between the two microchannel plates is at least 0.1 mm.
Preferably, the signal detection system comprises a height-adjustable anode sheet and/or a fluorescent screen as the signal receiving system, and: a current measuring system is formed by an ammeter and is used for measuring the output current of the microchannel plate; and reflecting the imaging quality of the microchannel plate by fluorescent screen imaging.
The invention also provides a method for carrying out the superposition test of the double-piece microchannel plate according to the test device, which comprises the following steps:
controlling the electron/ion source to output an electron source or an ion source, and adjusting the electron/ion source according to the quantity and the energy of electrons/ions required by the test;
using a double-piece superposed tube shell for testing the microchannel plate, and independently installing two microchannel plates to be tested from two ends of the tube shell respectively, wherein the microchannel plates do not interfere with each other in the installation process;
in the test procedure, the interval to two microchannel plates is controlled by the shell for the superimposed microchannel plate test of biplate, includes: the thickness of the MCP support ring and the central ceramic ring is controlled;
the anode sheet or the fluorescent screen with adjustable height is used as a signal receiving system to test the output current or the imaging quality of the double-sheet superposed microchannel plate.
Preferably, the surface of the central ceramic ring is plated with a metal film layer, the size thickness of the MCP support ring is changed, the MCP support ring only plays a role of supplying voltage, the distance between the two microchannel plates is only influenced by the thickness of the central ceramic ring, and the distance between the two microchannel plates is further reduced to 0.1 mm.
Preferably, during the test, the relative positions of the two microchannel plates during the test are changed by using the central symmetry of the two-piece superposed microchannel plate test shell and by rotating the two-piece superposed microchannel plate test shell without reinstalling the microchannel plate and the related electrodes.
Therefore, in the device and the method for testing the two-piece superposed microchannel plate, the microchannel plate with the two-piece superposed structure can be conveniently tested through the pipe shell for testing the two-piece superposed microchannel plate which is designed in a centrosymmetric manner, the distance between the two microchannel plates can be finely controlled, the minimum distance can reach 0.1mm, the two microchannel plates are respectively regulated and controlled in voltage, the microchannel plates are convenient to mount and take out, and the damage to the microchannel plates in the testing process can be reduced.
In the installation and test process, the relative positions of the two microchannel plates can be simply and conveniently converted without reinstalling the microchannel plates.
It should be understood that all combinations of the foregoing concepts and additional concepts described in greater detail below can be considered as part of the inventive subject matter of this disclosure unless such concepts are mutually inconsistent. In addition, all combinations of claimed subject matter are considered a part of the presently disclosed subject matter.
The foregoing and other aspects, embodiments and features of the present teachings can be more fully understood from the following description taken in conjunction with the accompanying drawings. Additional aspects of the present invention, such as features and/or advantages of exemplary embodiments, will be apparent from the description which follows, or may be learned by practice of specific embodiments in accordance with the teachings of the present invention.
Drawings
The drawings are not intended to be drawn to scale. In the drawings, each identical or nearly identical component that is illustrated in various figures may be represented by a like numeral. For purposes of clarity, not every component may be labeled in every drawing. Embodiments of various aspects of the present invention will now be described, by way of example, with reference to the accompanying drawings, in which:
FIG. 1 is a schematic diagram of a stacking test apparatus for two-piece microchannel plates according to a preferred embodiment of the invention.
FIG. 2 is a schematic diagram of a cartridge for a two-piece stacked microchannel plate test in accordance with a preferred embodiment of the present invention.
FIG. 3 is a schematic illustration of how two sheets of microchannel plates may be installed in accordance with a preferred embodiment of the invention, which need to be stacked.
Detailed Description
In order to better understand the technical content of the present invention, specific embodiments are described below with reference to the accompanying drawings.
In this disclosure, aspects of the present invention are described with reference to the accompanying drawings, in which a number of illustrative embodiments are shown. Embodiments of the present disclosure are not necessarily intended to include all aspects of the invention. It should be appreciated that the various concepts and embodiments described above, as well as those described in greater detail below, may be implemented in any of numerous ways, as the disclosed concepts and embodiments are not limited to any one implementation. In addition, some aspects of the present disclosure may be used alone, or in any suitable combination with other aspects of the present disclosure.
Referring to fig. 1-3, an apparatus for testing a stack of two sheets of microchannel plates according to an embodiment of the present invention includes a vacuum pump unit 1, an electron/ion source 2, a two-sheet stack tube housing 3 for testing a microchannel plate, and a signal detection system 4.
The vacuum pump set is used for providing 10 for the test of the micro-channel-3Pa vacuum environment. Preferably, the data of the vacuum environment is visually characterized and displayed.
And the electron/ion source 2 is used for providing electrons/ions which are incident to the tube shell for the double-piece superposed microchannel plate test. The number and energy of the electrons/ions output by the electron/ion source can be adjusted, for example, the electron/ion source can be adjusted according to the number and energy of the electrons/ions required by the test.
The pipe shell 3 for the test of the double-piece superposed microchannel plate can provide a convenient installation mode for the double-piece microchannel plate, a stable installation position and a voltage interface for the test of the microchannel plate.
Referring to fig. 2 and 3, the cartridge 3 for testing a two-piece stacked microchannel plate includes a plurality of connection rings installed in a central symmetry manner, as shown in fig. 3, microchannel plates 300A and 300B to be tested are respectively installed from both ends of the cartridge through compression rings 400, and the cartridge provides a voltage interface and performs distance and position adjustment of the microchannel plates through the cartridge.
And the signal detection system 4 is used for measuring corresponding current in the test process of the microchannel plate according to electrons/ions incident to the tube shell. Preferably, in this embodiment, the signal detection system comprises a height-adjustable anode sheet and/or a fluorescent screen as the signal receiving system. Wherein, the ammeter forms a current measuring system for measuring the output current of the microchannel plate. And the fluorescent screen is used for reflecting the imaging quality of the microchannel plate through fluorescent screen imaging. In this way, the performance of the microchannel plate is tested by detecting and imaging the output current.
With reference to fig. 2 and 3, the cartridge 3 for a two-piece stacked microchannel plate test according to this embodiment includes a central ceramic ring 306 located in the center, and MCP support rings 305, a first ceramic ring 302A, a clamping ring fixing ring 304, a second ceramic ring 302B, a pressure spring support ring 303, a third ceramic ring 302C, and outer metal rings that are symmetrically arranged from the central ceramic ring 306 to both sides in sequence, wherein each of the pressure spring support ring 303, the clamping ring fixing ring 304, and the MCP support ring 305 is provided with a protruding pole piece, and the pressure spring support ring 303 located on each side of the central ceramic ring 306 is engaged with the pole piece of the clamping ring fixing ring 304.
Preferably, the distance between two microchannel plates to be tested is controlled in the tube housing by adjusting the thickness of the MCP support ring 305 and the center ceramic ring 306.
Further preferably, in the tube package 3 for testing a two-piece stacked microchannel plate, a metal film layer may be further plated on the surface of the central ceramic ring 306, and the size and thickness of the MCP support ring 305 are adjusted to be reduced so that the MCP support ring 305 only functions to provide a voltage, and the distance between the two microchannel plates is only affected by the thickness of the central ceramic ring 306. Thus, the distance between the two microchannel plates reaches 0.1mm at minimum.
With reference to fig. 2 and 3, the method for performing a stack test of a two-piece microchannel plate according to the test apparatus includes the following steps:
controlling the electron/ion source to output an electron source or an ion source, and adjusting the electron/ion source according to the quantity and the energy of electrons/ions required by the test;
using a double-piece superposed tube shell for testing the microchannel plate, and independently installing two microchannel plates to be tested from two ends of the tube shell respectively, wherein the microchannel plates do not interfere with each other in the installation process;
in the test procedure, the interval to two microchannel plates is controlled by the shell for the superimposed microchannel plate test of biplate, includes: the thickness of the MCP support ring and the central ceramic ring is controlled;
the anode sheet or the fluorescent screen with adjustable height is used as a signal receiving system to test the output current or the imaging quality of the double-sheet superposed microchannel plate.
Preferably, the surface of the central ceramic ring is plated with a metal film layer, the size thickness of the MCP support ring is changed, the MCP support ring only plays a role of supplying voltage, the distance between the two microchannel plates is only influenced by the thickness of the central ceramic ring, and the distance between the two microchannel plates is further reduced to 0.1 mm.
Preferably, during the test, the relative positions of the two microchannel plates during the test are changed by using the central symmetry of the two-piece superposed microchannel plate test shell and by rotating the two-piece superposed microchannel plate test shell without reinstalling the microchannel plate and the related electrodes.
Therefore, the used pipe shell for the test of the double-piece superposed microchannel plate is independently installed from the two ends of the pipe shell respectively when the double-piece microchannel plate is installed, the microchannel plates cannot interfere with each other in the installation process, and the damage to the microchannel plates in the installation process can be reduced.
And the rotation of the pipe shell for the micro-channel plate test through the double-piece superposition can be realized by utilizing the central symmetry of the pipe shell for the micro-channel plate test, so that the relative positions of the two micro-channel plates during the test can be directly changed without reinstalling the micro-channel plate and the related electrodes thereof.
Therefore, in the device and the method for testing the two-piece superposed microchannel plate, the microchannel plate with the two-piece superposed structure can be conveniently tested through the pipe shell for testing the two-piece superposed microchannel plate which is designed in a centrosymmetric manner, the distance between the two microchannel plates can be finely controlled, the minimum distance can reach 0.1mm, the two microchannel plates are respectively regulated and controlled in voltage, the microchannel plates are convenient to mount and take out, and the damage to the microchannel plates in the testing process can be reduced.
In the installation and test process, the relative positions of the two microchannel plates can be simply and conveniently converted without reinstalling the microchannel plates.
Although the present invention has been described with reference to the preferred embodiments, it is not intended to be limited thereto. Those skilled in the art can make various changes and modifications without departing from the spirit and scope of the invention. Therefore, the protection scope of the present invention should be determined by the appended claims.
Claims (10)
1. The utility model provides a device for biplate microchannel plate stack test which characterized in that, includes vacuum pump package, electron/ion source, biplate superimposed microchannel plate test cartridge and signal detection system, wherein:
the vacuum pump set is used for providing 10 for the test of the micro-channel-3A vacuum environment of Pa;
the electron/ion source is used for providing electrons/ions which are incident to the tube shell for the double-piece superposed microchannel plate test;
the tube shell for testing the double-piece superposed microchannel plate comprises a plurality of connecting rings which are installed in a central symmetry manner, wherein the microchannel plate to be tested is installed from two ends of the tube shell through the pressure rings respectively, and the tube shell provides a voltage interface and adjusts the distance and the position of the microchannel plate through the tube shell;
the signal detection system is used for measuring corresponding current in the testing process of the microchannel plate according to electrons/ions incident to the tube shell;
the tube shell for the microchannel plate test with the two superposed sheets comprises a central ceramic ring (306) positioned in the center, and MCP support rings (305), a first ceramic ring (302A), a pressing ring fixing ring (304), a second ceramic ring (302B), a pressure spring support ring (303), a third ceramic ring (302C) and outer metal rings which are symmetrically arranged from the central ceramic ring (306) to two sides in sequence, wherein each pressure spring support ring (303), each pressing ring fixing ring (304) and each MCP support ring (305) are provided with a protruding pole piece, and the pressure spring support rings (303) positioned on each side of the central ceramic ring (306) are jointed with the pole pieces of the pressing ring fixing ring (304).
2. The apparatus of claim 1, wherein the number and energy of the electrons/ions output by the electron/ion source are adjustable.
3. The apparatus for the two-piece microchannel plate stack test as recited in claim 1, wherein the distance between the two pieces of microchannel plates to be tested is controlled in the cartridge by adjusting the thickness of the MCP support ring (305) and the center ceramic ring (306).
4. The apparatus for the two-piece microchannel plate stack test as recited in claim 1, wherein the surface of the central ceramic ring (306) is plated with a metal film layer in the two-piece microchannel plate test cartridge.
5. The device for the two-piece microchannel plate stack test as recited in claim 4, wherein the two-piece stacked microchannel plate test is configured by adjusting the size and thickness of the MCP support ring (305) to be reduced in the package such that the MCP support ring (305) only functions to supply a voltage, and the distance between the two microchannel plates is only affected by the thickness of the center ceramic ring (306).
6. The apparatus of claim 5, wherein the distance between the two microchannel plates is at least 0.1 mm.
7. The apparatus for the two-sheet microchannel plate overlay test of claim 1, wherein the signal detection system comprises a height-adjustable anode sheet and/or a phosphor screen as a signal receiving system, and: a current measuring system is formed by an ammeter and is used for measuring the output current of the microchannel plate; and reflecting the imaging quality of the microchannel plate by fluorescent screen imaging.
8. A method of performing a two-piece microchannel plate stack test using the apparatus of claim 1, comprising:
controlling the electron/ion source to output an electron source or an ion source, and adjusting the electron/ion source according to the quantity and the energy of electrons/ions required by the test;
using a double-piece superposed tube shell for testing the microchannel plate, and independently installing two microchannel plates to be tested from two ends of the tube shell respectively, wherein the microchannel plates do not interfere with each other in the installation process;
in the test procedure, the interval to two microchannel plates is controlled by the shell for the superimposed microchannel plate test of biplate, includes: the thickness of the MCP support ring and the central ceramic ring is controlled;
the anode sheet or the fluorescent screen with adjustable height is used as a signal receiving system to test the output current or the imaging quality of the double-sheet superposed microchannel plate.
9. The method for testing the superposition of the two microchannel plates as claimed in claim 8, wherein the MCP support ring only functions to supply voltage by plating a metal film layer on the surface of the central ceramic ring and changing the dimension thickness of the MCP support ring, and the distance between the two microchannel plates is further reduced to 0.1mm only by the thickness of the central ceramic ring.
10. The method of claim 9, wherein the rotational movement of the dual stack microchannel plate test cartridge changes the relative positions of the two microchannel plates during testing without reinstalling the microchannel plates and their associated electrodes by using the central symmetry of the dual stack microchannel plate test cartridge during testing.
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| CN201911292186.1A CN111090028B (en) | 2019-12-16 | 2019-12-16 | Device and method for superposition test of double-piece microchannel plate |
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| CN201911292186.1A CN111090028B (en) | 2019-12-16 | 2019-12-16 | Device and method for superposition test of double-piece microchannel plate |
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| CN111090028B true CN111090028B (en) | 2022-02-15 |
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| CN111463101B (en) * | 2020-05-09 | 2022-08-16 | 北方夜视技术股份有限公司 | Square microchannel plate assembly |
| CN111983345B (en) * | 2020-07-24 | 2023-03-14 | 北方夜视技术股份有限公司 | Special-shaped microchannel plate test fixture device |
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| US5737119A (en) * | 1995-09-06 | 1998-04-07 | Hughes Electronics | Thermal imaging device |
| GB0319347D0 (en) * | 2003-08-18 | 2003-09-17 | Micromass Ltd | Mass Spectrometer |
| CN100550268C (en) * | 2007-04-17 | 2009-10-14 | 中国科学院西安光学精密机械研究所 | High resolution x-ray image intensifier |
| CN103163549A (en) * | 2011-12-19 | 2013-06-19 | 中国科学院西安光学精密机械研究所 | Large-area X-ray pulse detection device based on microchannel plate splicing |
| CN103915311B (en) * | 2014-03-20 | 2017-01-18 | 中国科学院高能物理研究所 | Electrostatic focusing micro-channel plate photomultiplier |
| CN104465295B (en) * | 2014-10-27 | 2018-02-27 | 中国电子科技集团公司第五十五研究所 | A kind of AT-MCP electrode with ion barrier functionality and preparation method thereof |
| CN105606915A (en) * | 2015-09-11 | 2016-05-25 | 南京理工大学 | Test system of biplate cascade microchannel plate photomultiplier static performance |
| CN105372572B (en) * | 2015-11-19 | 2018-02-13 | 北方夜视技术股份有限公司 | A kind of gain measuring device and method for cascading microchannel plate |
| CN109841494A (en) * | 2017-11-27 | 2019-06-04 | 中国科学院大连化学物理研究所 | A kind of high dynamic range MCP detector |
| CN108364846B (en) * | 2018-01-30 | 2024-03-29 | 中国科学技术大学 | Microchannel plate clamping device |
| CN108878251B (en) * | 2018-06-20 | 2022-01-25 | 中国科学院高能物理研究所 | Microchannel plate assembly |
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