Nano press-in test fixture for section of filamentous material
Technical Field
The invention relates to the technical field of nano-indentation, in particular to a nano-indentation test fixture for a section of a filamentous material.
Technical Field
Nano indentation measurement is a new technology which is emerging in recent years, can continuously monitor the indentation depth of a material by controlling continuous change of load through a computer, is widely suitable for measuring the mechanical properties of micro-volume materials such as thin films, coatings, materials in micro electro mechanical systems and the like, and can measure various mechanical properties of the materials on a nano scale. Compared with the traditional material testing machine, the technology does not need to damage materials, meanwhile, the measurement accuracy is greatly improved, the mechanical property of the film material can be directly obtained under the condition that the film and the substrate material are not needed to be separated during measurement, and various mechanical properties of the material, such as a load-displacement curve, an elastic modulus, hardness, fracture toughness, a strain hardening effect, viscoelasticity or creep behavior and the like, can also be directly measured. With the development of the preparation and processing technology of nano materials, more and more research sizes of the materials enter the micro-nano scale.
At present, the mechanical property of the cross section of the filamentous material is limited by the influence of the size of the filamentous material and cannot be well measured by a nanometer pressing instrument, so that in order to enable the nanometer pressing instrument to measure the mechanical property of the cross section of the filamentous material, a clamp device for nanometer pressing test of the cross section of the filamentous material needs to be designed, the filamentous material is overlapped together, and therefore nanometer pressing test work is well carried out.
Disclosure of Invention
In view of the above problems in the prior art, the present invention provides a fixture for nanoimprint testing of sections of filamentary materials, so as to achieve efficient, safe and stable measurement of mechanical properties of sections of optical fiber materials.
The technical scheme of the invention is as follows:
the utility model provides a nanometer test fixture that impresses for filamentous material cross-section, a serial communication port, including fixed frame, setting bottom plate and the filamentous material clamping device of setting in the fixed frame, filamentous material clamping device includes limit baffle and locking bolt, the end panel both sides of fixed frame are equipped with the fixed plate respectively, the through-hole has been seted up on the fixed plate, limit baffle's both ends are equipped with the engaging lug respectively, and have seted up the through-hole on the engaging lug, limit baffle sliding fit sets up in fixed frame, locking bolt wears to establish on fixed plate and engaging lug to lock through the nut, thereby press from both sides tightly filamentous material in the fixed frame.
The nanometer press-in test fixture for the section of the filamentous material is characterized in that sliding grooves are respectively formed in the upper and lower opposite positions of two side plates of the fixing rack, steps are arranged at two ends of the bottom plate, and the steps and the sliding grooves are connected in an inserting mode.
The nanometer press-in test fixture for the section of the filamentous material is characterized in that guide rails are respectively arranged at opposite positions on two side plates of the fixed rack, and grooves are formed in the joints of the connecting lugs and the limiting baffle and are in sliding fit with the guide rails through the grooves.
The nanometer press-in test fixture for the section of the filamentous material is characterized in that the height of the limiting baffle is lower than the top heights of the fixed rack and a sample to be tested, so that the nanometer press-in test is facilitated.
The invention has the beneficial effects that: the device design benefit, rational in infrastructure, convenient to use, the application is carried out the nanometer of cross section for filamentous material's sample and is impressed the test, has conveniently satisfied the test of the mechanical properties of the cross-section of different filamentous material, has enlarged the scope that nanometer appearance can be measured impressed, has important meaning to the research field that the nanometer was impressed.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a front view of the present invention;
FIG. 3 is a schematic view of a stationary gantry of the present invention;
FIG. 4 is a top view of the present invention;
FIG. 5 is a schematic view of a limit stop of the present invention;
FIG. 6 is a schematic view of a base plate of the present invention;
in the figure: 1-fixing a frame; 2-bolt; 3-a sample; 4-limiting baffle plates; 5-a nut; 6-through holes; 7-a chute; 8-a guide rail; 9 a bottom plate.
Detailed Description
The technical scheme of the invention is further described by combining the drawings in the specification:
as shown in fig. 1-6, the fixture for nanoimprint testing of the cross section of the filamentous material comprises a main body part fixing rack 1 of the fixture, wherein sliding grooves 7 are respectively arranged at opposite positions on the upper and lower parts of two side plates of the fixing rack 1, and guide rails 8 are arranged at opposite positions between the two side plates of the fixing rack 1; bottom plate 9 cooperates with fixed frame 1 through both sides spout 7, and limit baffle 4 carries out the fixed clamp tightly to sample 3 through guided way 8 and cooperation bolt 2 and nut 5, and bottom plate 9 is hugged closely to the terminal surface of sample 3, and the inboard of limit baffle 4 and fixed frame 1 is hugged closely respectively to two sides carries out fixed positioning.
Example (b):
a nanometer press-in test fixture for section of filamentous material is characterized by comprising a fixed rack 1, a bottom plate 9 arranged on the fixed rack 1 and a filamentous material clamping device arranged on the fixed rack 1; the bottom plate 9 is used for closely positioning the cross section of the sample 3;
the clamping device for the filamentous materials in the embodiment comprises limiting baffles 4 and locking bolts 2, wherein fixing plates 6 are respectively arranged on two sides of an end panel of the fixing rack 1, through holes are formed in the fixing plates 6, connecting lugs are respectively arranged on two ends of each limiting baffle 4, through holes are formed in the connecting lugs, one or more limiting baffles 4 are arranged on the fixing rack 1 and are respectively arranged on the fixing rack in a sliding fit manner, samples 3 are arranged between the adjacent limiting baffles 4 or between the limiting baffles 4 and the end panel of the fixing rack 1; the locking bolt 2 penetrates through the fixing plate 6 and the connecting lug and is locked through a nut, so that the filiform materials on the fixing rack 1 are clamped.
In this embodiment, the upper and lower opposite positions of the two side plates of the fixed frame 1 are respectively provided with a sliding chute 7, two ends of the bottom plate 9 are provided with steps, and the bottom plate 9 is inserted into the sliding chutes 7 through the steps, so as to be fixed at the bottom of the fixed frame 1.
Relative positions on two side plates of the fixed rack 1 are respectively provided with guide rails 8, the joints of the connecting lugs and the limit baffles 4 are provided with grooves, the guide rails 8 can be provided with a plurality of limit baffles 4 through the sliding fit of the grooves and the guide rails 8, and the limit baffles 4 are arranged in the guide rails 8 in parallel.
The height of the limit baffle 4 in the embodiment is lower than the top heights of the fixed rack 1 and the sample 3 to be tested, so that the nanometer press-in test is convenient to carry out.
The working process is as follows:
firstly, inserting and fixing a bottom plate 9 along a sliding groove 7 on one side of a fixed frame 1; then the section of the filamentous material sample 3 to be measured is tightly attached to the bottom plate 9 to be aligned and placed, the filamentous material sample 3 to be measured is tightly arranged in a row in order by abutting against the fixed rack 1, the limit baffle plate 4 is matched with the guide rail 8 on the fixed rack 1 through the concave of the limit baffle plate to fix the filamentous material sample 3 to be measured, the steps are repeated, and after the multiple rows of samples 3 to be measured are inserted and fixed, the bolts 2 penetrate through the through holes 6 on the limit baffle plate 4 and the nuts 5 to fixedly clamp the sample 3 to be measured. At this moment, the bottom plate 9 placed at the bottom is drawn out, then the bottom plate 9 is inserted into the sliding groove 7 at the other side of the fixed rack 1 for fixing, then the whole device is turned over up and down, and at this moment, the section of the filiform sample 3 which is originally aligned at the bottom is turned over to the upper end face, so that the section alignment work of the sample 3 to be detected is completed. Finally, the device can be placed on a nanoimprint apparatus for the relevant test.