CN111025173A - ATE (automatic test equipment) detection process for power supply device - Google Patents
ATE (automatic test equipment) detection process for power supply device Download PDFInfo
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- CN111025173A CN111025173A CN201811169265.9A CN201811169265A CN111025173A CN 111025173 A CN111025173 A CN 111025173A CN 201811169265 A CN201811169265 A CN 201811169265A CN 111025173 A CN111025173 A CN 111025173A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention relates to the electronic industry, in particular to a power device ATE detection process, which comprises the following steps: step 1, calling a test program of a monomer to be tested; step 2, inserting the monomer on the assembly line into a jig; step 3, after the USB test output connecting line is connected, pressing a green 'F10' key to start testing; step 4, the testing result shows that PASS is good; step 5, displaying that the FAIL is a defective product, pasting a defective label, filling defective contents and placing the defective contents in a defective glue frame; and 6, lightly releasing the conveyor belt to flow down the engineering after the finished product of the test OK is qualified through self-inspection. The ATE detection process for the power device has the advantages of simple operation process, strong operability, good detection effect, accurate positioning during detection and high detection troubleshooting rate, greatly improves the test efficiency, reduces the test cost and can shorten the test time to be within 30 percent of the original test time.
Description
Technical Field
The invention relates to the electronic industry, in particular to a power supply device ATE detection process.
Background
With the development of science and technology, the electronic industry has been rapidly advanced, the demand of various integrated and control circuits has been rapidly increased, and the demand of chip packaging has also been rapidly increased. A power source is a device that converts other forms of energy into electrical energy. The power source is derived from the principle of magnetic electricity generation, and is generated by renewable energy sources such as water power, wind power, sea tide, dam water pressure difference, solar energy and the like, coal burning, oil residue and the like. The generator can convert mechanical energy into electric energy, and the dry battery can convert chemical energy into electric energy. The generator and the battery are not electrified, the two poles of the generator and the battery are respectively provided with positive and negative charges, voltage is generated by the positive and negative charges (current is formed by directional movement of the charges under the action of the voltage), the current is generated in a charge conductor by adding the voltage, the positive and negative charges are released to generate the current when the two poles of the battery are connected with the conductor, and the charge is eliminated when the charge is dissipated. Dry cells and the like are called power sources. A device that converts ac power to dc power through a transformer and a rectifier is called a rectified power supply. The electronic device that can provide the signal is called a signal source. The transistor can amplify the signal from the front and transmit the amplified signal to the circuit at the back. The transistor can also be considered as a signal source for the following circuits. Rectified power, the source of the signal, is sometimes also called the power supply.
ATE is an abbreviation of Automatic Test Equipment, MCU, PLC and PC are adopted according to the Test requirements, drawings and reference schemes of customers, development platforms based on VB and VC are adopted, and various Automatic Test Equipment is developed and designed by utilizing technologies such as TestStand, LabVIEW, JTAG/Boundary Scan and the like. The conventional power supply for the notebook computer needs ATE detection to verify whether the power supply meets the product requirements, the aging experiment steps in the prior art are complicated, and the operation is difficult for general personnel.
There is a need for a power device ATE detection process that can solve the above-mentioned technical problems.
Disclosure of Invention
The invention aims to provide a power device ATE detection process to make up for the defects in the existing detection process.
In order to achieve the purpose, the invention provides a power device ATE detection process, which comprises the following steps:
step 1, calling a test program of a monomer to be tested;
step 2, inserting the monomer on the assembly line into a jig;
step 3, after connecting the USB test output connecting line, pressing an F10 key to start testing;
step 4, the testing result shows that PASS is good; a qualified good product is tested, and the good product is lightly discharged from a conveying belt to flow down to a station after being qualified through self-inspection;
step 5, the test result shows that the FAIL is a defective product, a defective label is pasted, defective content is filled, and the defective product is separately stored in a defective glue frame;
and 6, after the test of the single product is finished, repeating the steps 2 to 5.
Preferably, in step 3, the output voltage of the ATE detection device is 12V.
Preferably, before the experiment, whether the point inspection tester and the sample machine are qualified or not is recorded in the point inspection table, products to be detected cannot be stacked together and need to be lightly taken and placed when being taken, and therefore the case is prevented from being scratched due to collision.
Preferably, generating a test waveform of the corresponding modulated signal according to the product under test and the required predetermined test function includes: writing test code using a software development tool, the test code including at least one of a sampling rate of a symbol, a number of bits of a symbol, a guard bit, an information bit, a PN code sequence, and information of other pins of the integrated circuit under test involved in the predetermined test function.
The ATE detection process for the power device has the advantages of simple operation process, strong operability, good detection effect, accurate positioning during detection and high detection troubleshooting rate, greatly improves the test efficiency, reduces the test cost and can shorten the test time to be within 30 percent of the original test time.
Detailed Description
In order to achieve the purpose, the invention provides a power device ATE detection process, which comprises the following steps:
step 1, calling a test program of a monomer to be tested;
step 2, inserting the monomer on the assembly line into a jig;
step 3, after connecting the USB test output connecting line, pressing an F10 key to start testing;
step 4, the testing result shows that PASS is good; a qualified good product is tested, and the good product is lightly discharged from a conveying belt to flow down to a station after being qualified through self-inspection;
step 5, the test result shows that the FAIL is a defective product, a defective label is pasted, defective content is filled, and the defective product is separately stored in a defective glue frame;
and 6, after the test of the single product is finished, repeating the steps 2 to 5.
In step 3, the output voltage of the ATE detection device is 12V.
Before the experiment, whether the point inspection test machine and the sample machine are qualified or not is recorded in the point inspection table, products to be detected cannot be stacked together and need to be lightly taken and placed when being taken, and the case is prevented from being scratched due to collision.
The method for generating the test waveform of the corresponding modulation signal according to the tested product and the required preset test function comprises the following steps: writing test code using a software development tool, the test code including at least one of a sampling rate of a symbol, a number of bits of a symbol, a guard bit, an information bit, a PN code sequence, and information of other pins of the integrated circuit under test involved in the predetermined test function.
The foregoing illustrates and describes the principles, general features, and advantages of the present invention. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are described in the specification and illustrated only to illustrate the principle of the present invention, but that various changes and modifications may be made therein without departing from the spirit and scope of the present invention, which fall within the scope of the invention as claimed. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (4)
1. A power device ATE detection process is characterized by comprising the following steps:
step 1, calling a test program of a monomer to be tested;
step 2, inserting the monomer on the assembly line into a jig;
step 3, after connecting the USB test output connecting line, pressing an F10 key to start testing;
step 4, the testing result shows that PASS is good; a qualified good product is tested, and the good product is lightly discharged from a conveying belt to flow down to a station after being qualified through self-inspection;
step 5, the test result shows that the FAIL is a defective product, a defective label is pasted, defective content is filled, and the defective product is separately stored in a defective glue frame;
and 6, after the test of the single product is finished, repeating the steps 2 to 5.
2. The ATE detection process for power devices as claimed in claim 1, wherein in the step 3, the output voltage of the ATE detection equipment is 12V.
3. The ATE detection process for the power devices, as claimed in claim 1, is characterized in that before an experiment is carried out, whether a point detection testing machine and a sample machine are qualified or not is recorded in a point detection table, products to be detected cannot be stacked together and need to be lightly taken when being taken, and therefore the situation that a machine shell is scratched due to collision is avoided.
4. The ATE detection process for the power supply device, as claimed in claim 1, wherein the step of generating the test waveform of the corresponding modulation signal according to the product under test and the required predetermined test function comprises: writing test code using a software development tool, the test code including at least one of a sampling rate of a symbol, a number of bits of a symbol, a guard bit, an information bit, a PN code sequence, and information of other pins of the integrated circuit under test involved in the predetermined test function.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811169265.9A CN111025173A (en) | 2018-10-08 | 2018-10-08 | ATE (automatic test equipment) detection process for power supply device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811169265.9A CN111025173A (en) | 2018-10-08 | 2018-10-08 | ATE (automatic test equipment) detection process for power supply device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN111025173A true CN111025173A (en) | 2020-04-17 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811169265.9A Pending CN111025173A (en) | 2018-10-08 | 2018-10-08 | ATE (automatic test equipment) detection process for power supply device |
Country Status (1)
| Country | Link |
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| CN (1) | CN111025173A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113962340A (en) * | 2021-09-23 | 2022-01-21 | 富翔精密工业(昆山)有限公司 | Detection apparatus, system, method, and computer-readable storage medium |
-
2018
- 2018-10-08 CN CN201811169265.9A patent/CN111025173A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113962340A (en) * | 2021-09-23 | 2022-01-21 | 富翔精密工业(昆山)有限公司 | Detection apparatus, system, method, and computer-readable storage medium |
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| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20200417 |
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| WD01 | Invention patent application deemed withdrawn after publication |