CN107976595A - A kind of power supply apparatus ATE characterization processes - Google Patents
A kind of power supply apparatus ATE characterization processes Download PDFInfo
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- CN107976595A CN107976595A CN201711192758.XA CN201711192758A CN107976595A CN 107976595 A CN107976595 A CN 107976595A CN 201711192758 A CN201711192758 A CN 201711192758A CN 107976595 A CN107976595 A CN 107976595A
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- Prior art keywords
- test
- power supply
- supply apparatus
- characterization processes
- ate
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
Abstract
The present invention relates to electronics industry, and in particular to a kind of power supply apparatus ATE characterization processes, include the following steps:Step 1, the test program for recalling monomer to be tested;Step 2, take the monomer on assembly line to be inserted on gauge;Step 3, after connecting USB test output connecting lines, press green " F10 " key and start to test;Step 4, test result show PASS for non-defective unit;Step 5, display FAIL for defective products, stick defective product label and fill in harmful content and be placed in bad glue frame;Engineering under conveyor belt flow is put down gently after step 6, the finished goods self-test qualification that OK will be tested.A kind of power supply apparatus ATE characterization processes of the present invention, operating process is simple, workable, detection result is good, accurate positioning during detection, and the investigation rate of detection is high, greatly improving testing efficiency reduces testing cost, and the testing time can be shortened within the 30% of original testing time.
Description
Technical field
The present invention relates to electronics industry, and in particular to a kind of power supply apparatus ATE characterization processes.
Background technology
With development in science and technology, electronic industry is advanced by leaps and bounds, and various integrated, control circuit demand sharp increases, seal chip
The demand of dress also increases rapidly.Power supply is by the device that can be converted into electric energy of other forms.Power supply from " magnetic life electricity " principle, by
The regenerative resources such as waterpower, wind-force, tide, dam differential water pressures, solar energy, and burn coal, dregs of fat etc. and produce power source.Power generation
Function converts mechanical energy into electric energy, and chemical energy can be converted into electric energy by dry cell.Generator, battery are in itself and not charged, it
The two poles of the earth have positive and negative charge respectively, voltage is produced by positive and negative charge(Electric current is electric charge displacement and shape under the action of voltage
Into), natively have in electric charge conductor, to produce electric current only needs to add voltage, is when battery the two poles of the earth connect conductor
Generation electric current and positive and negative charge is discharged, when electric charge disperses, also lotus is flowed to the greatest extent(Pressure)Disappear.Dry cell etc. is called electricity
Source.By transformer and rectifier, the device for alternating current being become direct current is called rectifier power source.The electronics that signal can be provided is set
It is standby to be called signal source.Transistor can amplify the signal above sent, and behind the signal being exaggerated is transmitted to
Circuit in.Transistor can also regard signal source as circuit below.Rectifier power source, signal source are sometimes
Also referred to as power supply.
ATE is the abbreviation of Automatic Test Equipment, according to the test request, drawing and reference side of client
Case, is based on VB, VC development platform using MCU, PLC, PC, utilizes TestStand&LabVIEW and JTAG/Boundary Scan
Deng technological development, all kinds of automated test devices of design.Existing power supply for notebook computer needs to carry out ATE detections, to verify it
Whether product requirement, of the prior art senile experiment complex steps are met, and general staff is difficult operation.
A kind of power supply apparatus ATE characterization processes are now needed, to which above-mentioned technical problem can be solved.
The content of the invention
The object of the present invention is to provide a kind of power supply apparatus ATE characterization processes, to make up the deficiency in existing detection process.
In order to achieve the above object, the present invention provides a kind of power supply apparatus ATE characterization processes, step are as follows:
Step 1, the test program for recalling monomer to be tested;
Step 2, take the monomer on assembly line to be inserted on gauge;
Step 3, after connecting USB test output connecting lines, press green " F10 " key and start to test;
Step 4, test result show PASS for non-defective unit;
Step 5, display FAIL for defective products, stick defective product label and fill in harmful content and be placed in bad glue frame;
Engineering under conveyor belt flow is put down gently after step 6, the finished goods self-test qualification that OK will be tested.
Preferably, in above-mentioned steps 3, the output voltage of ATE detection devices is 12V.
Preferably, before the experiment, whether point detection test-run a machine and sample machine qualification and are recorded in an inspection table, to be examined
The product of survey need to handle with care when cannot be packed together and take collision frees occur casing scratch.
Preferably, the test waves of corresponding modulated signal are generated according to the presumptive test function of test product and needs
Shape, including:Write test code using Software Development Tools, the test code include the sample rate of symbol, the digit of symbol,
At least one of guard bit, information bit, PN code sequences, and the tested integrated electricity involved by the presumptive test function
The information of other pins on road.
A kind of power supply apparatus ATE characterization processes of the present invention, operating process is simple, workable, and detection result is good,
Accurate positioning during detection, the investigation rate of detection is high, and greatly improving testing efficiency reduces testing cost, and the testing time can shorten
To within the 30% of original testing time.
Embodiment
Embodiment 1
In order to achieve the above object, the present invention provides a kind of power supply apparatus ATE characterization processes, step are as follows:
Step 1, the test program for recalling monomer to be tested;
Step 2, take the monomer on assembly line to be inserted on gauge;
Step 3, after connecting USB test output connecting lines, press green " F10 " key and start to test;
Step 4, test result show PASS for non-defective unit;
Step 5, display FAIL for defective products, stick defective product label and fill in harmful content and be placed in bad glue frame;
Engineering under conveyor belt flow is put down gently after step 6, the finished goods self-test qualification that OK will be tested.
Wherein, in above-mentioned steps 3, the output voltage of ATE detection devices is 12V.
Wherein, before the experiment, whether point detection test-run a machine and sample machine qualification and are recorded in an inspection table, to be detected
The product collision frees that need to handle with care when cannot be packed together and take casing scratch occurs.
Wherein, the test waveform of corresponding modulated signal is generated according to the presumptive test function of test product and needs,
Including:Test code is write using Software Development Tools, the test code includes the sample rate, the digit of symbol, guarantor of symbol
Protect at least one of position, information bit, PN code sequences, and the tested integrated circuit involved by the presumptive test function
Other pins information.
Basic principle, the main features and advantages of the present invention have been shown and described above.The technical staff of the industry should
Understand, the present invention is not limited to the above embodiments, and the above embodiments and description only describe the original of the present invention
Reason, without departing from the spirit and scope of the present invention, various changes and modifications of the present invention are possible, these changes and improvements
It all fall within the protetion scope of the claimed invention.The claimed scope of the invention is by appended claims and its equivalent circle
It is fixed.
Claims (4)
1. a kind of power supply apparatus ATE characterization processes, it is characterised in that include the following steps:
Step 1, the test program for recalling monomer to be tested;
Step 2, take the monomer on assembly line to be inserted on gauge;
Step 3, after connecting USB test output connecting lines, press green " F10 " key and start to test;
Step 4, test result show PASS for non-defective unit;
Step 5, display FAIL for defective products, stick defective product label and fill in harmful content and be placed in bad glue frame;
Engineering under conveyor belt flow is put down gently after step 6, the finished goods self-test qualification that OK will be tested.
A kind of 2. power supply apparatus ATE characterization processes according to right 1, it is characterised in that in above-mentioned steps 3, ATE detections
The output voltage of equipment is 12V.
A kind of 3. power supply apparatus ATE characterization processes according to right 1, it is characterised in that before the experiment, point detection examination
Whether machine and sample machine qualification and are recorded in an inspection table, need to gently be taken when product to be detected cannot be packed together and take
Put down collision frees gently and casing scratch occurs.
4. a kind of power supply apparatus ATE characterization processes according to right 1, it is characterised in that according to test product and needs
Presumptive test function generate the test waveform of corresponding modulated signal, including:Test code is write using Software Development Tools,
At least one of the sample rate of the test code including symbol, the digit of symbol, guard bit, information bit, PN code sequences, with
And the information of other pins of the tested integrated circuit involved by the presumptive test function.
Priority Applications (1)
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CN201711192758.XA CN107976595A (en) | 2017-11-24 | 2017-11-24 | A kind of power supply apparatus ATE characterization processes |
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CN201711192758.XA CN107976595A (en) | 2017-11-24 | 2017-11-24 | A kind of power supply apparatus ATE characterization processes |
Publications (1)
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CN107976595A true CN107976595A (en) | 2018-05-01 |
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CN201711192758.XA Pending CN107976595A (en) | 2017-11-24 | 2017-11-24 | A kind of power supply apparatus ATE characterization processes |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112916420A (en) * | 2020-12-28 | 2021-06-08 | 苏州浪潮智能科技有限公司 | Mainboard edge scanning test system and method |
-
2017
- 2017-11-24 CN CN201711192758.XA patent/CN107976595A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112916420A (en) * | 2020-12-28 | 2021-06-08 | 苏州浪潮智能科技有限公司 | Mainboard edge scanning test system and method |
CN112916420B (en) * | 2020-12-28 | 2022-11-18 | 苏州浪潮智能科技有限公司 | Mainboard edge scanning test system and method |
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PB01 | Publication | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20180501 |
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WD01 | Invention patent application deemed withdrawn after publication |