CN110927561B - Single-point laser test platform - Google Patents
Single-point laser test platform Download PDFInfo
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- CN110927561B CN110927561B CN201911318231.6A CN201911318231A CN110927561B CN 110927561 B CN110927561 B CN 110927561B CN 201911318231 A CN201911318231 A CN 201911318231A CN 110927561 B CN110927561 B CN 110927561B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
Abstract
The invention discloses a single-point laser test platform, and particularly relates to the technical field of experimental test equipment, which comprises a base, wherein equipment racks are fixedly arranged on two sides of the top of the base, a fixed plate is fixedly arranged between the two equipment racks, an operation platform is fixedly arranged at the bottom of the fixed plate, and a positioning platform is fixedly arranged in the middle of the fixed plate; the operation platform middle part activity is provided with the movable support, the fixed station that is provided with in movable support top, the fixed dead lever that is provided with in fixed station top four corners is fixed, four the fixed platform that compresses tightly that is provided with in dead lever top. According to the invention, the extensible movable support is arranged, so that the chip is conveniently and fixedly clamped between the movable table and the pressing table, the heat conducting blade absorbs the heat, and the heat conducting blade is matched with the cooling fan to drive the airflow to move, so that the heat generated in the test process is conveniently dissipated, the test accuracy is prevented from being influenced by high heat, and the test result is prevented from being influenced.
Description
Technical Field
The embodiment of the invention relates to the technical field of experimental test equipment, in particular to a single-point laser test platform.
Background
The laser error injection refers to injecting an accurate laser beam with adjustable multiple parameters such as energy, duration and the like at a specific physical position and at a specific moment in the operation process of a chip so as to cause the chip to generate specific errors, and tampering the read-write content of a memory and even acquiring sensitive information such as a secret key by using purposefully modified program flow.
The prior art has the following defects: the chip is fixed placing of centre gripping need be carried out in the experiment test, and the centre gripping is unstable, influences the test experiment operation easily, can produce a large amount of heats in the chip course of operation, and high temperature influences the test result easily.
Disclosure of Invention
Therefore, the embodiment of the invention provides a single-point laser test platform, which is convenient for a chip to be fixedly clamped between a movable table and a pressing table by arranging an extendable movable support, utilizes a heat conduction blade to absorb the heat, and is matched with a cooling fan to drive airflow to move, so that the heat dissipation effect is realized, the fixed installation of the sample chip is convenient, the heat generated in the test process is conveniently dissipated, the high heat generated by the chip is prevented from influencing the accuracy of the test, the test result is prevented from being influenced, and the problem caused by the influence of the high heat generated by the chip on the test experiment due to the inconvenience in the installation and fixation of the chip in the prior art is solved.
In order to achieve the above object, the embodiments of the present invention provide the following technical solutions: a single-point laser test platform comprises a base, wherein equipment racks are fixedly arranged on two sides of the top of the base, a fixed plate is fixedly arranged between the two equipment racks, an operation platform is fixedly arranged at the bottom of the fixed plate, and a positioning platform is fixedly arranged in the middle of the fixed plate;
the operation platform is movably provided with a movable support in the middle, the top of the movable support is fixedly provided with a fixed table, four corners of the top of the fixed table are fixedly provided with fixed rods, the tops of the four fixed rods are fixedly provided with a pressing table, a movable table is arranged between the fixed table and the pressing table, four corners of the movable table are respectively movably connected with the four fixed rods, the bottoms of the four corners of the movable table are respectively provided with a pressing spring, and the pressing springs are sleeved with the fixed rods;
a heat dissipation support is movably arranged in the movable support, the top of the heat dissipation support is fixedly connected with the bottom of the movable table, heat conduction blades are fixedly arranged in the heat dissipation support, a heat dissipation fan is fixedly arranged at the bottom of the heat dissipation support, an operation pull rod is arranged at the bottom of the heat dissipation fan, and two ends of the operation pull rod are fixedly connected with the heat dissipation support;
the fixed plate top is provided with the lifter plate, the fixed bolster that is provided with in lifter plate bottom, the inside activity of fixed bolster is provided with the locating plate, locating plate fixed surface is provided with the installation sleeve, the laser pen has been placed to installation sleeve inside, location platform fixed surface is provided with positioning window, positioning window and the vertical collineation setting of movable table, the laser pen and the inside swing joint of positioning window.
Further, operation platform and locating platform are horizontal parallel arrangement, the movable support middle part is the setting of U-shaped recess, the fixed limiting plate that is provided with in movable support bottom, the corresponding movable support middle part in fixed station and limiting plate middle part is the recess setting.
Furthermore, both sides of the top of the movable support are provided with slide rails, the slide rails are fixedly connected with the operating platform, the bottoms of both ends of the fixed platform are fixedly provided with pulleys, and the pulleys are slidably connected with the slide rails.
Furthermore, the rear end of the movable support is fixedly provided with a connecting base plate, and the surface of the connecting base plate and the surface of the fixing plate are both provided with magnet blocks, two of which are arranged in a magnetic attraction manner.
Furthermore, all fixed spacing cushion that is provided with in activity platform top four corners, spacing cushion cup joints the setting with pressure spring, it is the cavity setting to compress tightly platform and activity platform middle part, it all is fixed with the buffering cushion to compress tightly platform bottom end face and activity platform top end face, and two sets of buffering cushions correspond the setting.
Furthermore, the heat conduction leaf is made by high heat conduction metal material, heat conduction leaf quantity sets up to a plurality ofly, and is vertical parallel arrangement setting, radiator fan air-out direction is vertical downward setting, the operating rod middle part is the crooked setting of circular arc.
Further, the fixed catch plate that is provided with in lifter plate top, the fixed mounting panel that is provided with in fixed plate trailing flank, the fixed lifting push rod that is provided with in mounting panel middle part, lifting push rod output and catch plate fixed connection, catch plate bottom both sides are all fixed and are provided with the locating lever, locating lever and mounting panel swing joint.
Further, the fixed bolster overlooking shape is the setting of C font, the fixed movable rod that is provided with in fixed bolster inside, the fixed slider that is provided with in locating plate rear side, slider and movable rod swing joint, slider one side is provided with reset spring, reset spring cup joints with the movable rod, fixed bolster one side threaded connection is provided with the promotion bolt, promotion bolt inner matches the setting with the slider.
The embodiment of the invention has the following advantages:
1. the invention stretches the movable support out of the operation platform by arranging the operation platform, places a sample chip to be detected by using the movable platform, pushes the movable platform to move upwards by the compression spring, compresses the chip by matching with the compression platform to realize the fixation of the chip, pushes the movable support into the operation platform, injects energy into a specific position of a subsequent sample chip, matches with a precise laser beam emitted by a laser pen, the test platform has the advantages that the test operation is carried out on the sample chip, after the sample chip is injected with energy, the sample chip works, the emitted heat is absorbed by the heat conducting blades at the bottom of the movable platform and is matched with the heat radiating fan to drive airflow to move, the heat radiating effect is realized, compared with the existing test platform, the fixed installation of the sample chip is facilitated, the heat generated in the test process is conveniently radiated, the high heat generated by the chip is prevented from influencing the test accuracy, and the test result is prevented from being influenced;
2. according to the invention, the lifting plate is arranged, the lifting push rod is used for pushing the push plate at the top end of the lifting plate to control the lifting motion of the lifting plate, the positioning rod provides the lifting stability of the lifting plate, the mounting sleeve is used for placing a laser pen, the push bolt is rotated to push the sliding block at the rear side of the positioning plate, the sliding block is driven to slide on the movable rod to compress the reset spring, the left and right positions of the positioning plate are adjusted, the output position of the laser pen is conveniently adjusted, the laser beam is conveniently positioned and irradiated on the sample chip, the accuracy of the test operation is improved, and the test effect is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below. It should be apparent that the drawings in the following description are merely exemplary, and that other embodiments can be derived from the drawings provided by those of ordinary skill in the art without inventive effort.
The structures, ratios, sizes, and the like shown in the present specification are only used for matching with the contents disclosed in the specification, so as to be understood and read by those skilled in the art, and are not used to limit the conditions that the present invention can be implemented, so that the present invention has no technical significance, and any structural modifications, changes in the ratio relationship, or adjustments of the sizes, without affecting the effects and the achievable by the present invention, should still fall within the range that the technical contents disclosed in the present invention can cover.
FIG. 1 is a schematic view of the overall structure provided by the present invention;
FIG. 2 is a schematic overall cross-sectional structure provided by the present invention;
FIG. 3 is a schematic view of the structure of part A of FIG. 2 according to the present invention;
FIG. 4 is a schematic view of the overall structure of the cradle according to the present invention;
FIG. 5 is a schematic top cross-sectional view of a cradle according to the present invention;
FIG. 6 is a rear view of the fixing plate according to the present invention;
FIG. 7 is a schematic top sectional view of a fixing bracket according to the present invention;
in the figure: the device comprises a base 1, a device support 2, a fixing plate 3, an operation platform 4, a positioning platform 5, a movable support 6, a fixing platform 7, a fixing rod 8, a pressing platform 9, a movable platform 10, a pressing spring 11, a heat dissipation support 12, a heat conduction blade 13, a heat dissipation fan 14, an operation pull rod 15, a lifting plate 16, a fixing support 17, a positioning plate 18, a mounting sleeve 19, a laser pen 20, a positioning window 21, a limiting plate 22, a sliding rail 23, a pulley 24, a connecting base plate 25, a magnet block 26, a limiting cushion block 27, a buffer rubber cushion 28, a pushing plate 29, a mounting plate 30, a lifting push rod 31, a positioning rod 32, a movable rod 33, a sliding block 34, a reset spring 35 and a pushing bolt 36.
Detailed Description
The present invention is described in terms of particular embodiments, other advantages and features of the invention will become apparent to those skilled in the art from the following disclosure, and it is to be understood that the described embodiments are merely exemplary of the invention and that it is not intended to limit the invention to the particular embodiments disclosed. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to the attached drawings 1-4 of the specification, the single-point laser test platform of the embodiment comprises a base 1, wherein equipment racks 2 are fixedly arranged on two sides of the top of the base 1, a fixed plate 3 is fixedly arranged between the two equipment racks 2, an operation platform 4 is fixedly arranged at the bottom of the fixed plate 3, and a positioning platform 5 is fixedly arranged in the middle of the fixed plate 3;
a movable support 6 is movably arranged in the middle of the operating platform 4, a fixed table 7 is fixedly arranged at the top of the movable support 6, fixed rods 8 are fixedly arranged at four corners of the top of the fixed table 7, pressing tables 9 are fixedly arranged at the tops of the four fixed rods 8, a movable table 10 is arranged between the fixed table 7 and the pressing tables 9, four corners of the movable table 10 are respectively movably connected with the four fixed rods 8, pressing springs 11 are respectively arranged at the bottoms of the four corners of the movable table 10, and the pressing springs 11 are sleeved with the fixed rods 8;
a heat dissipation support 12 is movably arranged inside the movable support 6, the top of the heat dissipation support 12 is fixedly connected with the bottom of the movable table 10, heat conduction blades 13 are fixedly arranged inside the heat dissipation support 12, a heat dissipation fan 14 is fixedly arranged at the bottom of the heat dissipation support 12, an operation pull rod 15 is arranged at the bottom of the heat dissipation fan 14, and two ends of the operation pull rod 15 are fixedly connected with the heat dissipation support 12;
3 tops of fixed plate are provided with lifter plate 16, the fixed bolster 17 that is provided with in lifter plate 16 bottom, the inside activity of fixed bolster 17 is provided with locating plate 18, 18 fixed surface of locating plate is provided with installation sleeve 19, laser pen 20 has been placed to installation sleeve 19 inside, 5 fixed surface of locating platform are provided with location window 21, location window 21 sets up with the vertical collineation of movable table 10, laser pen 20 and the inside swing joint of location window 21.
Further, operation platform 4 and locating platform 5 are horizontal parallel arrangement, 6 middle parts of movable support are the setting of U-shaped recess, 6 fixed limiting plates 22 that are provided with in bottom of movable support, 7 and the limiting plate 22 middle parts of fixed station correspond 6 middle parts of movable support and are the recess setting, utilize the U nature recess that sets up, make things convenient for placing and taking away of sample chip.
Further, 6 top both sides of movable support all are provided with slide rail 23, slide rail 23 and operation platform 4 fixed connection, 7 both ends bottoms of fixed station are all fixed and are provided with pulley 24, pulley 24 and slide rail 23 sliding connection make things convenient for the roll-off of movable support 6, make things convenient for placing of sample chip.
Further, the rear end of the movable support 6 is fixedly provided with a connecting base plate 25, the surface of the connecting base plate 25 and the surface of the fixed plate 3 are both provided with magnet blocks 26, the magnet blocks 26 are arranged in a magnetic attraction manner, and the two magnet blocks 26 are mutually attracted, so that the movable support 6 can be conveniently positioned and fixed.
Further, all fixed spacing cushion 27 that is provided with in activity platform 10 top four corners, spacing cushion 27 cup joints the setting with pressure spring 11, it is the cavity setting to compress tightly platform 9 and activity platform 10 middle part, it all fixes and is provided with buffering cushion 28 to compress tightly platform 9 bottom face and activity platform 10 top face, and two sets of buffering cushions 28 correspond the setting, utilize spacing cushion 27 to inject activity platform 10 and the closest distance that compresses tightly platform 9, utilize buffering cushion 28 to cushion the fixed chip of centre gripping, improve the centre gripping effect, also protect the chip.
Further, heat conduction leaf 13 is made by high heat conduction metal material, heat conduction leaf 13 quantity sets up to a plurality ofly, and is vertical parallel arrangement setting, radiator fan 14 air-out direction is vertical downward setting, operation pull rod 15 middle part is the circular arc crooked setting, utilizes heat conduction leaf 13 to absorb the heat that the chip sent, and cooperation radiator fan 14 drives the air current motion, and the flow passes heat conduction leaf 13 air and dispels the heat to heat conduction leaf 13, improves the radiating effect, conveniently dispels the heat to the chip, avoids the high heat quantity that the chip produced to influence the accuracy of test, avoids influencing the test result, and operation pull rod 15 conveniently stimulates heat dissipation support 12, and then drives the movable table 10 and descends.
The implementation scenario is specifically as follows: when the invention uses the testing platform to carry out testing operation, firstly, the movable support 6 is stretched out from the operating platform 4, the pulley 24 slides on the slide rail 23, the to-be-tested object is placed on the movable table 10, the compression spring 11 pushes the movable table 10 to move upwards to cooperate with the compression table 9 to carry out chip compression, the limit cushion block 27 limits the closest distance between the movable table 10 and the compression table 9, the buffer rubber cushion 28 is utilized to buffer the clamping fixed chip, the clamping effect is improved, the chip is also protected to realize chip fixation, then the movable support 6 is pushed into the operating platform 4, energy is injected into the specific position of the subsequent sample chip, the sample chip is tested and operated by cooperating with the precise laser beam emitted by the laser pen 20, after the sample chip is injected with energy, the sample chip works, the emitted heat is absorbed by the heat conduction blade 13 at the bottom of the movable table 10, and cooperates with the heat radiation fan 14 to drive airflow to move, realize the radiating effect, operation pull rod 15 conveniently stimulates heat dissipation support 12, and then drives movable table 10 and descends, makes things convenient for the fixed mounting of sample chip, conveniently dispels the heat that produces in the testing process, avoids the high heat that the chip produced to influence the accuracy of test, avoids influencing the test result.
Referring to the attached drawings 2 and 5-7 of the specification, in the single-point laser test platform of this embodiment, a pushing plate 29 is fixedly disposed at the top end of the lifting plate 16, a mounting plate 30 is fixedly disposed at the rear side surface of the fixing plate 3, a lifting push rod 31 is fixedly disposed in the middle of the mounting plate 30, the output end of the lifting push rod 31 is fixedly connected with the pushing plate 29, positioning rods 32 are fixedly disposed on both sides of the bottom of the pushing plate 29, the positioning rods 32 are movably connected with the mounting plate 30, the lifting push rod 31 pushes the pushing plate 29 to drive the lifting plate 16 to lift, and the positioning rods 32 move on the mounting plate 3 to limit the lifting motion of the lifting plate 16, so that the lifting stability is improved.
Further, fixed bolster 17 overlooks the shape and is the setting of C font, the fixed movable rod 33 that is provided with of fixed bolster 17 inside is fixed, the fixed slider 34 that is provided with in locating plate 18 rear side, slider 34 and movable rod 33 swing joint, slider 34 one side is provided with reset spring 35, reset spring 35 cup joints with movable rod 33, fixed bolster 17 one side threaded connection is provided with promotion bolt 36, promotion bolt 36 the inner sets up with slider 34 matching, conveniently operates 18 side-to-side motions of locating plate, makes things convenient for laser pen 20 to control position control, makes things convenient for the laser beam location to shine on the sample chip, improves test operation's accuracy, improves the test effect.
The implementation scenario is specifically as follows: when the laser pen 20 is operated, the lifting push rod 31 pushes the push plate 29 at the top end of the lifting plate 16 to control the lifting plate 16 to descend, the positioning rod 32 moves on the mounting plate 3 to limit the lifting movement of the lifting plate 16 and improve the lifting stability, the laser pen 20 is placed in the mounting sleeve 19, the limiting ring is arranged on the surface of the middle of the laser pen 20, the laser pen 20 is placed by blocking of the limiting ring, the pushing bolt 36 is rotated, the pushing bolt 36 pushes the sliding block 34 on the rear side of the positioning plate 18 to drive the sliding block 34 to slide on the movable rod 33, the reset spring 35 is compressed, the left and right positions of the positioning plate 18 are adjusted, the output position of the laser pen 20 is conveniently adjusted, the laser beam is conveniently positioned and irradiated on a sample chip, the accuracy of test operation is improved, and the test effect is improved.
The working principle is as follows:
referring to the attached drawings 1-4, when a test platform is used for test operation, a movable support 6 is firstly stretched out from an operation platform 4, a to-be-tested sample is placed on a movable table 10, a compression spring 11 pushes the movable table 10 to move upwards to be matched with a compression table 9 to compress the chip so as to fix the chip, then the movable support 6 is pushed into the operation platform 4, energy is injected into a specific position of a subsequent sample chip, the sample chip is tested and operated by matching with a precise laser beam emitted by a laser pen 20, the sample chip works after the sample chip is injected with energy, the dissipated heat is absorbed by a heat conduction blade 13 at the bottom of the movable table 10 and is driven to move by matching with a heat dissipation fan 14 so as to realize the heat dissipation effect, the fixed installation of the sample chip is convenient, the heat generated in the test process is conveniently dissipated, and the high heat generated by the chip is prevented from influencing the test accuracy, the test result is prevented from being influenced;
referring to fig. 2 and 5-7, when the laser pen 20 is operated, the lifting push rod 31 pushes the push plate 29 at the top end of the lifting plate 16 to control the lifting of the lifting plate 16, the positioning rod 32 provides the lifting stability of the lifting plate 16, the laser pen 20 is placed in the mounting sleeve 19, the pushing bolt 36 is rotated, the pushing bolt 36 pushes the slider 34 at the rear side of the positioning plate 18 to drive the slider 34 to slide on the movable rod 33, the reset spring 35 is compressed, the left and right positions of the positioning plate 18 are adjusted, the output position of the laser pen 20 is conveniently adjusted, the laser beam is conveniently positioned and irradiated on a sample chip, the accuracy of testing operation is improved, and the testing effect is improved.
Although the invention has been described in detail above with reference to a general description and specific examples, it will be apparent to one skilled in the art that modifications or improvements may be made thereto based on the invention. Accordingly, such modifications and improvements are intended to be within the scope of the invention as claimed.
Claims (8)
1. The utility model provides a single point laser test platform, includes base (1), its characterized in that: equipment racks (2) are fixedly arranged on two sides of the top of the base (1), a fixed plate (3) is fixedly arranged between the two equipment racks (2), an operation platform (4) is fixedly arranged at the bottom of the fixed plate (3), and a positioning platform (5) is fixedly arranged in the middle of the fixed plate (3);
a movable support (6) is movably arranged in the middle of the operating platform (4), a fixed table (7) is fixedly arranged at the top of the movable support (6), fixed rods (8) are fixedly arranged at four corners of the top of the fixed table (7), a pressing table (9) is fixedly arranged at the tops of the four fixed rods (8), a movable table (10) is arranged between the fixed table (7) and the pressing table (9), four corners of the movable table (10) are respectively movably connected with the four fixed rods (8), pressing springs (11) are respectively arranged at the bottoms of the four corners of the movable table (10), and the pressing springs (11) are sleeved with the fixed rods (8);
a heat dissipation support (12) is movably arranged in the movable support (6), the top of the heat dissipation support (12) is fixedly connected with the bottom of the movable table (10), heat conduction blades (13) are fixedly arranged in the heat dissipation support (12), a heat dissipation fan (14) is fixedly arranged at the bottom of the heat dissipation support (12), an operation pull rod (15) is arranged at the bottom of the heat dissipation fan (14), and two ends of the operation pull rod (15) are fixedly connected with the heat dissipation support (12);
fixed plate (3) top is provided with lifter plate (16), lifter plate (16) bottom is fixed and is provided with fixed bolster (17), the inside activity of fixed bolster (17) is provided with locating plate (18), locating plate (18) fixed surface is provided with installation sleeve (19), laser pen (20) have been placed to installation sleeve (19) inside, location platform (5) fixed surface is provided with positioning window (21), positioning window (21) and the vertical collineation setting of activity platform (10), laser pen (20) and the inside swing joint of positioning window (21).
2. The single point laser test platform of claim 1, wherein: operation platform (4) and locating platform (5) are horizontal parallel arrangement, movable support (6) middle part is the U-shaped recess setting, movable support (6) bottom is fixed and is provided with limiting plate (22), fixed station (7) and limiting plate (22) middle part correspond movable support (6) middle part and are the recess setting.
3. The single point laser test platform of claim 1, wherein: both sides of the top of the movable support (6) are provided with slide rails (23), the slide rails (23) are fixedly connected with the operating platform (4), the bottoms of the two ends of the fixed platform (7) are fixedly provided with pulleys (24), and the pulleys (24) are slidably connected with the slide rails (23).
4. The single point laser test platform of claim 1, wherein: the movable support is characterized in that a connecting base plate (25) is fixedly arranged at the rear end of the movable support (6), magnet blocks (26) are arranged on the surface of the connecting base plate (25) and the surface of the fixing plate (3), and the magnet blocks (26) are arranged in a magnetic attraction manner.
5. The single point laser test platform of claim 1, wherein: the movable table is characterized in that limiting cushion blocks (27) are fixedly arranged at four corners of the top of the movable table (10), the limiting cushion blocks (27) are sleeved with compression springs (11), the middle parts of the compression table (9) and the movable table (10) are hollow, buffering rubber pads (28) are fixedly arranged on the bottom end face of the compression table (9) and the top end face of the movable table (10), and the two buffering rubber pads (28) are correspondingly arranged.
6. The single point laser test platform of claim 1, wherein: heat conduction leaf (13) are made by high heat conduction metal material, heat conduction leaf (13) quantity sets up to a plurality ofly, and is vertical parallel arrangement and sets up, radiator fan (14) air-out direction is vertical downward setting, operation pull rod (15) middle part is the crooked setting of circular arc.
7. The single point laser test platform of claim 1, wherein: the fixed slurcam (29) that is provided with in lifter plate (16) top, fixed plate (3) trailing flank is fixed and is provided with mounting panel (30), fixed lifting rod (31) that is provided with in mounting panel (30) middle part, lifting rod (31) output and slurcam (29) fixed connection, slurcam (29) bottom both sides are all fixed and are provided with locating lever (32), locating lever (32) and mounting panel (30) swing joint.
8. The single point laser test platform of claim 1, wherein: fixed bolster (17) overlook the shape and be the setting of C font, fixed bolster (17) inside fixed movable rod (33) that is provided with, fixed slider (34) that is provided with in locating plate (18) rear side, slider (34) and movable rod (33) swing joint, slider (34) one side is provided with reset spring (35), reset spring (35) cup joint with movable rod (33), fixed bolster (17) one side threaded connection is provided with and promotes bolt (36), it sets up with slider (34) matching to promote bolt (36) inner.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201911318231.6A CN110927561B (en) | 2019-12-19 | 2019-12-19 | Single-point laser test platform |
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| CN201911318231.6A CN110927561B (en) | 2019-12-19 | 2019-12-19 | Single-point laser test platform |
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| CN110927561B true CN110927561B (en) | 2021-08-24 |
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Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005315719A (en) * | 2004-04-28 | 2005-11-10 | Arufakusu Kk | Device test fixture |
| CN103630821A (en) * | 2012-08-20 | 2014-03-12 | 上海斐讯数据通信技术有限公司 | Test auxiliary device |
| CN204287405U (en) * | 2014-10-17 | 2015-04-22 | 深圳瑞波光电子有限公司 | The proving installation of semiconductor laser chip assembly |
| CN105182207A (en) * | 2014-05-30 | 2015-12-23 | 国民技术股份有限公司 | Chip error injection testing method and device |
| CN205720305U (en) * | 2016-04-14 | 2016-11-23 | 深圳清华大学研究院 | The test device of semiconductor laser chip assembly |
| CN205720553U (en) * | 2016-04-07 | 2016-11-23 | 深圳清华大学研究院 | Multistation chip of laser assembly loading platform |
| CN207502670U (en) * | 2017-08-31 | 2018-06-15 | 深圳市振云精密测试设备有限公司 | A kind of micropin module test fixture |
| CN109738783A (en) * | 2018-12-11 | 2019-05-10 | 惠州市骏亚数字技术有限公司 | A kind of PCB test device and test method |
| CN110208579A (en) * | 2019-04-30 | 2019-09-06 | 深圳市致宸信息科技有限公司 | A kind of chip test base |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4439151B2 (en) * | 2001-10-31 | 2010-03-24 | 株式会社リコー | IC socket |
| FR2959018B1 (en) * | 2010-04-20 | 2012-08-31 | European Aeronautic Defence & Space Co Eads France | METHODS AND DEVICES FOR CONDUCTING AN INTEGRATED CIRCUIT |
-
2019
- 2019-12-19 CN CN201911318231.6A patent/CN110927561B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005315719A (en) * | 2004-04-28 | 2005-11-10 | Arufakusu Kk | Device test fixture |
| CN103630821A (en) * | 2012-08-20 | 2014-03-12 | 上海斐讯数据通信技术有限公司 | Test auxiliary device |
| CN105182207A (en) * | 2014-05-30 | 2015-12-23 | 国民技术股份有限公司 | Chip error injection testing method and device |
| CN204287405U (en) * | 2014-10-17 | 2015-04-22 | 深圳瑞波光电子有限公司 | The proving installation of semiconductor laser chip assembly |
| CN205720553U (en) * | 2016-04-07 | 2016-11-23 | 深圳清华大学研究院 | Multistation chip of laser assembly loading platform |
| CN205720305U (en) * | 2016-04-14 | 2016-11-23 | 深圳清华大学研究院 | The test device of semiconductor laser chip assembly |
| CN207502670U (en) * | 2017-08-31 | 2018-06-15 | 深圳市振云精密测试设备有限公司 | A kind of micropin module test fixture |
| CN109738783A (en) * | 2018-12-11 | 2019-05-10 | 惠州市骏亚数字技术有限公司 | A kind of PCB test device and test method |
| CN110208579A (en) * | 2019-04-30 | 2019-09-06 | 深圳市致宸信息科技有限公司 | A kind of chip test base |
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Address after: 1904, 19th floor, Juneng building, Bailu Science Park, Yingtan hi tech Industrial Development Zone, Jiangxi Province Applicant after: Jiangxi smart cloud testing safety testing center Co.,Ltd. Applicant after: Beijing Smart Cloud Measurement Information Technology Co.,Ltd. Address before: 404f, 4th floor, Juneng building, 3 Juneng Road, high tech Industrial Development Zone, Yingtan City, Jiangxi Province Applicant before: Jiangxi smart Cloud Security Testing Center Co.,Ltd. Applicant before: Beijing Smart Cloud Measurement Information Technology Co.,Ltd. |
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