CN110887452A - Method for measuring surface inclination angle of target position of curved surface object - Google Patents
Method for measuring surface inclination angle of target position of curved surface object Download PDFInfo
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- CN110887452A CN110887452A CN201911234184.7A CN201911234184A CN110887452A CN 110887452 A CN110887452 A CN 110887452A CN 201911234184 A CN201911234184 A CN 201911234184A CN 110887452 A CN110887452 A CN 110887452A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
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Abstract
The invention discloses a method for measuring the surface inclination angle of a target position of a curved surface object, which comprises the implementation steps of determining the target position to be measured of the curved surface object, dynamically imaging the surface of the target position by using an optical imaging device with adjustable optical axis angle, large visual field and shallow depth of field, adjusting the optical axis angle of the optical imaging device, and recording the optical axis angle β of the optical imaging device as the surface inclination angle of the target position of the curved surface object when all pixels including the target position in the visual field are imaged clearly at the same time.
Description
Technical Field
The invention relates to a technology for measuring an inclination angle of a micro area at a certain position on the surface of a regular or irregular curved surface object, in particular to a method for measuring the surface inclination angle of a target position of the curved surface object.
Background
In industrial processing or scientific measurements, it is sometimes necessary to determine the tilt angle of a location of interest on the surface of an object. If the object to be measured is irregular or the curvature change of the position to be measured is large, the inclination angle of the tangent plane of the target point is actually measured, namely the surface of a micro area around the target point is regarded as an approximate plane, and the inclination angle of the plane is the inclination angle of the position of the object. The tangent plane of the position needs to be determined according to the surface extension condition of a small area around the interest point, the accurate measurement of the surface inclination angle of the tiny target position at low cost is difficult, and the smaller the area is, the larger the measurement error is.
Because the curvature change of the position to be measured is large, the surface of the object can be regarded as an approximate plane only in a micro area, and the difficulty is brought to accurate measurement of the surface inclination angle of the micro target position at low cost.
Disclosure of Invention
The technical problems to be solved by the invention are as follows: the invention provides a method for measuring the surface inclination angle of the target position of a curved surface object, which aims at the problems in the prior art, and has the advantages of accurate angle, easy operation and the like.
In order to solve the technical problems, the invention adopts the technical scheme that:
a method for measuring the surface inclination angle of a target position of a curved surface object comprises the following implementation steps:
1) determining a target position to be measured of a curved surface object;
2) using an optical imaging device with an adjustable optical axis angle to carry out dynamic imaging on the surface of the target position;
3) and adjusting the optical axis angle of the optical imaging device, and recording the optical axis angle β of the optical imaging device as the surface inclination angle of the target position of the curved object when all pixels including the target position in the visual field are imaged clearly at the same time.
Optionally, the optical imaging device is a large-field-of-view and shallow-field-depth optical imaging device, the shallow field depth specifically means that a clear imaging distance of the imaging device is shallow, and the remaining depths except for a target position of a curved object cannot be clearly imaged, and the large field of view is that, with respect to the shallow field of view, a ratio of the field of view to a diameter of the field of view is sufficiently small, so that an error angle e for measuring the surface inclination angle in this aspect is sufficiently small.
Optionally, the detailed steps of step 2) include:
2.1) setting the aperture of the optical imaging device to be minimum initially to make the initial depth of field as deep as possible;
2.2) aligning a lens of the optical imaging equipment with the curved surface object, adjusting the distance between the lens and the curved surface object, and capturing the target position of the curved surface object, wherein the successful capturing of the target position means that the curved surface object is in the visual field and at least one part of the curved surface object can be clearly imaged;
and 2.3) gradually enlarging the aperture of the optical imaging equipment and synchronously finely adjusting the distance between the lens and the curved surface object, so that the depth of field is reduced and the target curved surface object area is always captured until the depth of field is adjusted to be the shallowest.
Optionally, the detailed steps of step 3) include:
3.1) on the premise of ensuring that the lens is aligned with the curved surface object and successfully capturing the target curved surface object, repeatedly adjusting the direction of the optical lens to realize the adjustment of the optical axis angle of the optical imaging equipment, and skipping to execute the step 3.2 when all pixels including the target position in the visual field are imaged clearly at the same time;
3.2) recording the optical axis angle β of the optical imaging device at this time as the curved object target position surface tilt angle.
Compared with the prior art, the invention has the following advantages:
1. the invention firstly determines the angle vertical to the optical axis and then calculates the surface inclination angle of the object by utilizing the characteristic that the visual field scenery is all clear simultaneously if the optical axis is vertical to the cortex during optical imaging, can realize the measurement of the surface inclination angle of the target position of the object with any curved surface, and has the advantages of accurate angle, easy operation and the like.
2. The invention firstly determines the angle of the vertical optical axis and then calculates the surface inclination angle of the object by utilizing the characteristic that the visual field scenery is clear if the optical axis is vertical to the cortex during optical imaging, and because the depth of the scene of the imaging system is shallow and the visual field is large, when all the positions of the cortex in the visual field are imaged clearly, the optical axis is basically vertical to the surface of the cortex, and the error is very small.
3. The method has simple and clear operation steps under the condition of complete functions of the optical imaging system.
4. The invention is especially suitable for research experiments combining optical observation and electrophysiological observation. In such experiments, a fully functional optical imaging system is generally provided, and no additional configuration is required; and generally all curved surface objects are required to be clear in the optical observation experiment, the lens adjusting process in the step 3) is also required to be experienced in the optical observation experiment, and the step can be omitted in the method.
Drawings
FIG. 1 is a schematic diagram of a basic flow of a method according to an embodiment of the present invention.
FIG. 2 is a diagram illustrating an error of the method according to an embodiment of the present invention.
Fig. 3 is a schematic diagram illustrating measurement of an optical axis angle in a pitch direction according to an embodiment of the present invention.
Detailed Description
The method for measuring the surface inclination angle of the target position of the curved object according to the present invention will be further described in detail below by taking a cerebral cortex as a specific curved object as an example. It should be noted that the method for measuring the surface inclination of the target position of the curved object of the present invention is not limited to the cerebral cortex, and it is obvious that the method can also be applied to any other curved object.
As shown in fig. 1, the implementation steps of the method for measuring the surface inclination angle of the target position of the curved surface object in the present embodiment include:
1) determining a target position to be measured of a curved surface object;
2) using an optical imaging device with an adjustable optical axis angle to carry out dynamic imaging on the surface of the target position;
3) and adjusting the optical axis angle of the optical imaging device, and recording the optical axis angle β of the optical imaging device as the surface inclination angle of the target position of the curved object when all pixels including the target position in the visual field are imaged clearly at the same time.
In this embodiment, the optical imaging device is an optical imaging device with a large field of view and a shallow depth of field, where the shallow depth of field specifically refers to that the clear imaging distance of the imaging device is shallow, and the remaining depths except the target position of the curved object cannot be clearly imaged, and the large field of view refers to that the ratio of the depth of field to the diameter of the field of view is sufficiently small relative to the shallow depth of field, so that the error angle e for measuring the surface inclination angle in this aspect is sufficiently small, as shown in fig. 2.
In this embodiment, the optical imaging device uses a Nikon camera external telephoto lens, and the camera operates in an LCD viewing mode and can dynamically observe an imaging result. The camera is fixed on a group of CCD locating frames for intrinsic (endogenous) optical imaging, and the angles of the camera body and the lens can be obtained by measuring the inclination angle of the fixed arm.
In this embodiment, the detailed steps of step 2) include:
2.1) setting the aperture of the optical imaging device to be minimum initially to make the initial depth of field as deep as possible;
2.2) aligning a lens of the optical imaging equipment with the curved surface object, adjusting the distance between the lens and the curved surface object, and capturing the target position of the curved surface object, wherein the successful capturing of the target position means that the curved surface object is in the visual field and at least one part of the curved surface object can be clearly imaged;
and 2.3) gradually enlarging the aperture of the optical imaging equipment and synchronously finely adjusting the distance between the lens and the curved surface object, so that the depth of field is reduced and the target curved surface object area is always captured until the depth of field is adjusted to be the shallowest.
In this embodiment, the detailed steps of step 3) include:
3.1) on the premise of ensuring that the lens is aligned with the curved surface object and successfully capturing the target curved surface object, repeatedly adjusting the direction of the optical lens to realize the adjustment of the optical axis angle of the optical imaging equipment, and skipping to execute the step 3.2 when all pixels including the target position in the visual field are imaged clearly at the same time;
3.2) recording the optical axis angle β of the optical imaging device at this time as the curved object target position surface tilt angle.
In this embodiment, the optical axis angle β of the optical imaging apparatus is obtained by measuring the CCD fixing arm angle, fig. 3 is a schematic diagram of measuring the optical axis angle in the pitch direction, that is, the CCD fixing arm angle, and referring to fig. 3, the calculation formula of the fixing arm pitch angle β is:
in the above formula, wherein d is the width of the horizontal direction of the CCD fixing arm, and h is the height of the vertical direction of the CCD fixing arm. This embodiment is through utilizing optical imaging time optical axis if the perpendicular to cortex then the whole clear this characteristics simultaneously of field of vision scenery, at first confirms perpendicular optical axis's angle, and then calculates object surface inclination, because imaging system depth of field is shallow, the field of view is big, when the clear formation of image of all positions of cortex in the field of view, optical axis basic perpendicular to cortex surface, the error is very little.
As shown in FIG. 2, the magnitude of the error angle e is actan (fd/fs). If the imaging field diameter fs is 1.5mm and the depth of field fd is 50um, the maximum error angle e of the optical axis in the vertical direction is:
therefore, the method for measuring the surface inclination angle of the target position of the curved surface object has the advantage of small error angle.
In summary, in the method for measuring the surface inclination angle of the target position of the curved surface object according to the embodiment, the optical imaging device with an adjustable optical axis angle, a large field of view and a shallow depth of field is used for dynamically imaging the surface of the target position, then the optical axis angle of the optical imaging device is adjusted, when all target positions in the field of view are clear in imaging simultaneously, the optical axis angle β of the optical imaging device at the moment is recorded as the surface inclination angle of the target position of the curved surface object, and by utilizing the characteristic that all visual field scenes are clear simultaneously if the optical axis is perpendicular to the cortex during optical imaging, the angle perpendicular to the optical axis is determined at first, and then the object surface inclination angle is calculated, so that the measurement of the surface inclination angle of the target position of.
The above description is only a preferred embodiment of the present invention, and the protection scope of the present invention is not limited to the above embodiments, and all technical solutions belonging to the idea of the present invention belong to the protection scope of the present invention. It should be noted that modifications and embellishments within the scope of the invention may occur to those skilled in the art without departing from the principle of the invention, and are considered to be within the scope of the invention.
Claims (4)
1. A method for measuring the surface inclination angle of a target position of a curved object is characterized by comprising the following implementation steps:
1) determining a target position to be measured of a curved surface object;
2) using an optical imaging device with an adjustable optical axis angle to carry out dynamic imaging on the surface of the target position;
3) and adjusting the optical axis angle of the optical imaging device, and recording the optical axis angle β of the optical imaging device as the surface inclination angle of the target position of the curved object when all pixels including the target position in the visual field are imaged clearly at the same time.
2. The method according to claim 1, wherein the optical imaging device is a large-field, shallow-depth optical imaging device, the shallow depth of field is specifically defined as the clear imaging distance of the imaging device is shallow, the remaining depths except the target position of the curved object cannot be clearly imaged, and the large field of view is defined as the ratio of the depth of field to the diameter of the field of view is small enough relative to the shallow depth of field, so that the error angle e for measuring the surface inclination in this respect is small enough.
3. The method for measuring the surface inclination of a curved object at a target position according to claim 1, wherein the detailed steps of step 2) include:
2.1) setting the aperture of the optical imaging device to be minimum initially to make the initial depth of field as deep as possible;
2.2) aligning a lens of the optical imaging equipment with the curved surface object, adjusting the distance between the lens and the curved surface object, and capturing the target position of the curved surface object, wherein the successful capturing of the target position means that the curved surface object is in the visual field and at least one part of the curved surface object can be clearly imaged;
and 2.3) gradually enlarging the aperture of the optical imaging equipment and synchronously finely adjusting the distance between the lens and the curved surface object, so that the depth of field is reduced and the target curved surface object area is always captured until the depth of field is adjusted to be the shallowest.
4. The method for measuring the surface inclination of a target position of a curved object according to claim 1, wherein the detailed steps of step 3) comprise:
3.1) on the premise of ensuring that the lens is aligned with the curved surface object and successfully capturing the target curved surface object, repeatedly adjusting the direction of the optical lens to realize the adjustment of the optical axis angle of the optical imaging equipment, and skipping to execute the step 3.2 when all pixels including the target position in the visual field are imaged clearly at the same time;
3.2) recording the optical axis angle β of the optical imaging device at this time as the curved object target position surface tilt angle.
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