CN110867151B - Display mother board, display panel and electronic leakage testing method - Google Patents
Display mother board, display panel and electronic leakage testing method Download PDFInfo
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- CN110867151B CN110867151B CN201911205308.9A CN201911205308A CN110867151B CN 110867151 B CN110867151 B CN 110867151B CN 201911205308 A CN201911205308 A CN 201911205308A CN 110867151 B CN110867151 B CN 110867151B
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- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Abstract
The embodiment of the invention provides a display mother board, a display panel and a method for testing electronic leakage, wherein the display mother board is provided with a plurality of display panels and a connecting area positioned between the display panels, the display mother board comprises a testing assembly arranged in the connecting area or a non-display area of the display panels, and the testing assembly comprises: the single primary color testing unit comprises at least one first sub-pixel, and the first sub-pixel comprises a first pixel electrode, a first light-emitting structure and a first common electrode which are sequentially stacked; the high-voltage input end is connected with a first pixel electrode of a first sub-pixel in the single primary color testing unit with at least one color; and the low-voltage input end is connected with the first pixel electrode of the first sub-pixel in the single primary color test unit of at least one color in other colors except the single primary color test unit connected with the high-voltage input end. The display motherboard provided by the embodiment of the invention can be used for detecting whether the transverse electronic leakage occurs.
Description
Technical Field
The invention relates to the technical field of display equipment, in particular to a display mother board, a display panel and an electronic leakage testing method.
Background
Organic Light Emitting Diode (OLED) Display devices are widely used in various consumer electronic products such as mobile phones, televisions, personal digital assistants, digital cameras, notebook computers, desktop computers, etc. as flat panel Display devices, because of their advantages such as high image quality, power saving, thin body, and wide application range, and become the mainstream of Display devices.
In the production process of the OLED display device, if the characteristics of the OLED light-emitting element can be accurately tested, the method has positive effects on mastering the service life of the OLED display device, judging whether the OLED display device has defects and the like.
Therefore, a display mother board, a display panel and a method for testing electronic leakage, which can detect whether the display panel has defects, are needed.
Disclosure of Invention
The invention aims to detect whether a display panel has lateral electron leakage.
In one aspect, an embodiment of the present invention provides a display mother board, where the display mother board has a plurality of display panels and a connection area located between the display panels, the display panels have a display area and a non-display area, the display mother board includes a test component disposed in the connection area and/or the non-display area, and the test component includes: the single primary color testing unit comprises at least one first sub-pixel, and the first sub-pixel comprises a first pixel electrode, a first light-emitting structure and a first common electrode which are sequentially stacked; the high-voltage input end is connected with a first pixel electrode of a first sub-pixel in the single primary color testing unit with at least one color; and the low-voltage input end is connected with the first pixel electrode of the first sub-pixel in the single primary color test unit of at least one color in other colors except the single primary color test unit connected with the high-voltage input end.
According to an embodiment of an aspect of the present invention, the number of the first sub-pixels in the single primary color test unit is plural, the first pixel electrodes of at least two first sub-pixels in the single primary color test unit are connected to each other, and the high voltage input terminal and/or the low voltage input terminal are connected to the first pixel electrodes connected to each other.
According to one aspect of the present invention, in any one of the embodiments described above, a conductive lead is disposed on a side of the first pixel electrode facing away from the first light emitting structure, and the first pixel electrodes of at least two first sub-pixels in the single primary color testing unit are connected to each other through the conductive lead.
According to one aspect of the present invention in any one of the preceding embodiments, the high voltage input is connected to the first pixel electrode of the first sub-pixel, or the high voltage input is connected to a conductive lead.
According to one aspect of the present invention in any one of the preceding embodiments, the low voltage input is connected to the first pixel electrode of the first sub-pixel, or the low voltage input is connected to a conductive lead.
According to one aspect of the present invention in any of the previous embodiments, the test element comprises three different primary colors;
two of the three single primary color test units with different primary colors are connected to the high-voltage input end, and the other one is connected to the low-voltage input end;
or, two of the single primary color test units of the three different primary colors are connected to the low voltage input end, and the other one is connected to the high voltage input end.
According to one aspect of the present invention, in any one of the embodiments, the plurality of first sub-pixels in the test group are arranged according to a preset rule;
the single primary color testing unit is composed of first sub-pixels with the same color in a plurality of first sub-pixels which are formed by arranging according to a preset rule.
According to one aspect of the present invention, in any one of the foregoing embodiments, a plurality of second sub-pixels are disposed in the display region, and a layout rule of the plurality of first sub-pixels is the same as a layout rule of the plurality of second sub-pixels.
On the other hand, an embodiment of the present invention further provides a display panel, where the display panel has a display area and a non-display area, the non-display area is provided with a test component, and the test component includes: the single primary color testing unit comprises at least one first sub-pixel, and the first sub-pixel comprises a first pixel electrode, a first light-emitting structure and a first common electrode which are sequentially stacked; the high-voltage input end is connected with a first pixel electrode of a first sub-pixel in the single primary color testing unit with at least one color; and the low-voltage input end is connected with the first pixel electrode of the first sub-pixel in the single primary color test unit of at least one color in other colors except the single primary color test unit connected with the high-voltage input end.
In another aspect, an embodiment of the present invention further provides a method for testing an electronic leakage, which is used to test the display motherboard and/or the display panel, and the method includes:
applying a first voltage to the high-voltage input end and applying a second voltage to the low-voltage input end, wherein the first voltage is greater than the second voltage;
acquiring a current value and/or a resistance value between a high-voltage input end and a low-voltage input end;
and determining whether electron leakage occurs between the single primary color test unit connected to the high voltage input terminal and the single primary color test unit connected to the low voltage input terminal according to the current value and/or the resistance value.
In the display mother board of the embodiment of the invention, the display mother board comprises a test assembly, and the test assembly comprises a single primary color test unit, a high-voltage input end and a low-voltage input end. The high-voltage input end is connected to the first pixel electrode of the single primary color testing unit with at least one color, the low-voltage input end is connected to the first pixel electrode of the single primary color testing unit with another color, and the high-voltage input end and the low-voltage input end are connected to the first pixel electrodes of the single primary color testing units with different colors. When the display template is tested, low voltage is input to the high-voltage input end, low voltage is input to the low-voltage input end, and whether electron leakage occurs between the single-primary-color test units with the two different colors can be judged by detecting the current value and/or the resistance value between the high-voltage input end and the low-voltage input end. Therefore, the display motherboard according to the embodiment of the invention can be used for detecting whether lateral electronic leakage occurs.
Drawings
Other features, objects and advantages of the invention will become apparent from the following detailed description of non-limiting embodiments with reference to the accompanying drawings in which like or similar reference characters refer to the same or similar parts.
Fig. 1 is a schematic structural diagram of a display motherboard according to an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a test assembly according to an embodiment of the present invention;
FIG. 3 is a partial cross-sectional view of FIG. 2;
FIG. 4 is a partial cross-sectional view of FIG. 1;
fig. 5 is a schematic flow chart of a method for detecting electron leakage according to an embodiment of the present invention.
Description of reference numerals:
100. a display panel; 100a, a display area; 100b, a non-display area;
110. a second sub-pixel; 111. a second pixel electrode; 112. a second light emitting structure; 113. a second common electrode; 114. driving the array layer;
200. a connecting region;
300. testing the component; 300a, a single primary color testing unit;
310. a first sub-pixel; 311. a first pixel electrode; 312. a first light emitting structure; 313. a first common electrode; 314. an auxiliary layer; 320. a conductive lead; 330. a high voltage input; 340. a low voltage input terminal.
400. A substrate;
500. a cover plate;
600. a light extraction layer;
700. a first blind hole;
800. a second blind hole.
Detailed Description
Features and exemplary embodiments of various aspects of the present invention will be described in detail below. In the following detailed description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced without some of these specific details. The following description of the embodiments is merely intended to provide a better understanding of the present invention by illustrating examples of the present invention. In the drawings and the following description, at least some well-known structures and techniques have not been shown to avoid unnecessarily obscuring the present invention; also, the dimensions of some of the structures may be exaggerated for clarity. Furthermore, the described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.
In the description of the present invention, it is to be noted that, unless otherwise specified, "a plurality" means two or more; the terms "upper," "lower," "left," "right," "inner," "outer," and the like, as used herein, refer to an orientation or positional relationship indicated for convenience in describing the invention and to simplify description, but do not indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the invention. Furthermore, the terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
The directional terms used in the following description are intended to refer to directions shown in the drawings, and are not intended to limit the specific structure of embodiments of the present invention. In the description of the present invention, it should also be noted that, unless otherwise explicitly specified or limited, the terms "mounted" and "connected" are to be interpreted broadly, e.g., as either a fixed connection, a removable connection, or an integral connection; can be directly connected or indirectly connected. The specific meaning of the above terms in the present invention can be understood as appropriate to those of ordinary skill in the art.
For better understanding of the present invention, the display mother board, the display panel and the method for testing the electronic leakage according to the embodiment of the present invention will be described in detail with reference to fig. 1 to 5.
The light emitting layer in the OLED display panel includes light emitting layers of different color sub-pixels, and the electron injection layer, the electron transport layer, the hole injection layer and the hole transport layer corresponding to the light emitting layers of the different color sub-pixels are usually common layers. This results in the possibility of lateral electron transport to adjacent sub-pixels during use, and common layer leakage causes cross talk, resulting in the problem of poor brightness and inaccurate color display for adjacent sub-pixels. The invention is provided for detecting whether the electrons in the display panel leak laterally.
Fig. 1 is a schematic structural diagram of a display mother board according to an embodiment of the present invention, the display mother board has a plurality of display panels 100 and a connection area 200 located between the display panels 100, the display panels 100 have a display area 100a and a non-display area 100b, and the display mother board includes a test assembly 300 disposed in the connection area 200 and/or the non-display area 100 b.
The number of the test elements 300 may be one or more, and as shown in fig. 1, the number of the test elements 300 may be 3, and 3 test elements 300 are disposed at different positions.
Referring to fig. 2 and 3 together, fig. 2 shows a schematic structural diagram of a test assembly 300. Fig. 3 shows a partial cross-sectional view of a test assembly 300.
As shown in fig. 2, the test assembly 300 includes: the single primary color test unit 300a corresponding to different primary colors, the single primary color test unit 300a includes at least one first sub-pixel 310, and the first sub-pixel 310 includes a first pixel electrode 311, a first light emitting structure 312, and a first common electrode 313, which are sequentially stacked; a high voltage input terminal 330 connected to the first pixel electrode 311 of the first sub-pixel 310 in the single primary color test unit 300a of at least one color; and a low voltage input terminal 340 connected to the first pixel electrode 311 of the first sub-pixel 310 in the single primary color test unit 300a of at least one of the other colors except the single primary color test unit 300a connected to the high voltage input terminal 330.
In the display mother board of the embodiment of the present invention, the display mother board includes a test assembly 300, and the test assembly 300 includes a single primary color test unit 300a, a high voltage input terminal 330, and a low voltage input terminal 340. The high voltage input terminal 330 is connected to the first pixel electrode 311 of the single primary color testing unit 300a of at least one color, the low voltage input terminal 340 is connected to the first pixel electrode 311 of the single primary color testing unit 300a of another color, and the high voltage input terminal 330 and the low voltage input terminal 340 are connected to the first pixel electrodes 311 of the single primary color testing units 300a of different colors. Therefore, when the display mother board according to the embodiment of the present invention is tested, a low voltage is input to the high voltage input terminal 330, and a low voltage is input to the low voltage input terminal 340, and whether an electron leakage occurs between the two single primary color test units 300a having different colors can be determined by detecting a current value and/or a resistance value between the high voltage input terminal 330 and the low voltage input terminal 340. Therefore, the display motherboard according to the embodiment of the invention can be used for detecting whether lateral electron leakage occurs.
Specifically, the first pixel electrode 311 is, for example, an anode of the first sub-pixel 310, and the first common electrode 313 is, for example, a cathode of the first sub-pixel 310. The anodes of the first sub-pixels 310 in the test assembly 300 are separated from each other, the high voltage input terminal 330 and the low voltage input terminal 340 are respectively connected to the first pixel electrodes 311 of the single primary color test cells 300a of different colors, and the high voltage and the low voltage can be respectively applied to the single primary color test cells 300a of the two colors through the high voltage input terminal 330 and the low voltage input terminal 340. When electron leakage occurs between the single basic color test cells 300a of the two colors, an electronic crosstalk may be generated between the high voltage input terminal 330 and the low voltage input terminal 340, thereby causing a change in a current value and/or a resistance value between the high voltage input terminal 330 and the low voltage input terminal 340. Therefore, the display motherboard according to the embodiment of the invention can be used for detecting whether lateral electron leakage occurs.
The single primary color test cell 300a refers to a test cell containing one color of sub-pixels. For example, when the test assembly 300 includes a plurality of red, green, and blue sub-pixels, the single primary color test unit 300a includes only one or more red sub-pixels, or the single primary color test unit 300a includes only one or more green sub-pixels, or the single primary color test unit 300a includes only one or more blue sub-pixels.
The first sub-pixel 310 refers to a sub-pixel in the test assembly 300, and when the test assembly 300 includes a plurality of red, green and blue sub-pixels, the first sub-pixel 310 may be, for example, a red sub-pixel, and the first sub-pixel 310 may also be a blue or green sub-pixel. Any sub-pixel in the test assembly 300 may be referred to as a first sub-pixel 310.
The number of the single primary color test units 300a in the test assembly 300 is set to be various. In some alternative embodiments, the test assembly 300 includes single primary test elements 300a of two primary colors, for example, the test assembly 300 includes a single primary test element 300a of red and a single primary test element 300a of blue. At this time, the high voltage input terminal 330 is connected to the pixel electrode of the first sub-pixel 310 in the single primary color test unit 300a of one color, and the low voltage input terminal 340 is connected to the pixel electrode of the first sub-pixel 310 in the single primary color test unit 300a of the other color.
In other alternative embodiments, the test assembly 300 includes three different primary colors. For example, the test assembly 300 includes a red single primary color test cell 300a, a blue single primary color test cell 300a, and a green single primary color test cell 300 a.
In the above embodiment, two of the single primary color test cells 300a of the three different primary colors are connected to the high voltage input terminal 330, and the other is connected to the low voltage input terminal 340. Alternatively, two of the three different primary color single primary color test cells 300a are connected to the low voltage input 340 and the other is connected to the high voltage input 330. For example, the three different primary colors are red, green and blue, the blue single primary color test unit 300a and the green single primary color test unit 300a in the single primary color test unit 300a of the three different primary colors are connected to the high voltage input terminal 330, and the red single primary color test unit 300a is connected to the low voltage input terminal 340. Alternatively, the blue single primary color test cell 300a and the green single primary color test cell 300a of the three primary color test cells 300a are connected to the low voltage input terminal 340, and the red single primary color test cell 300a is connected to the high voltage input terminal 330.
The single primary color test cell 300a may include any suitable number of first subpixels 310. In some alternative embodiments, the number of the first sub-pixels 310 in the single primary color testing unit 300a is multiple, the first pixel electrodes 311 of at least two first sub-pixels 310 in the single primary color testing unit 300a are connected to each other, and the high voltage input terminal 330 and/or the low voltage input terminal 340 are connected to the first pixel electrodes 311 connected to each other.
In these alternative embodiments, at least two first pixel electrodes 311 of the single primary color test unit 300a are connected to each other, and when an electron leakage occurs between the single primary color test units 300a of two colors, an amount of electron leakage occurring between the at least two first pixel electrodes 311 connected to each other is greater than an amount of electron leakage occurring between one first pixel electrode 311. Therefore, the variation of the current value and/or the resistance value between the high voltage input terminal 330 and the low voltage input terminal 340 connected to the first pixel electrode 311 is large, the electron leakage is more easily detected, and the test result is more accurate.
Preferably, the high voltage input terminal 330 is connected to the first pixel electrode 311 interconnected in the single primary color test cell 300a of one color, and the low voltage input terminal 340 is connected to the first pixel electrode 311 interconnected in the single primary color test cell 300a of the other color. The accuracy of the test result can be further improved.
In some alternative embodiments, the first pixel electrodes 311 of all the first sub-pixels 310 in the single primary color test unit 300a are connected to each other. The connection manner of the plurality of first pixel electrodes 311 in the single primary color test unit 300a is various, for example, the plurality of first pixel electrodes 311 are connected in series, or the plurality of first pixel electrodes 311 are connected in parallel, or a part of the plurality of first pixel electrodes 311 are connected in series, another part of the plurality of first pixel electrodes 311 are connected in parallel, and the like. As long as the plurality of first pixel electrodes 311 are electrically connected to each other. In these embodiments, the high voltage input terminal 330 and/or the low voltage input terminal 340 is connected to the first pixel electrode 311 of any one of the first sub-pixels 310.
There are various ways for the first pixel electrodes 311 of the at least two first sub-pixels 310 in the single primary color testing unit 300a to be connected to each other, in some alternative embodiments, a conductive lead 320 is disposed on a side of the first pixel electrode 311 facing away from the first light emitting structure 312, and the first pixel electrodes 311 of the at least two first sub-pixels 310 in the single primary color testing unit 300a are connected to each other through the conductive lead 320.
When the test assembly 300 includes the conductive lead 320, the high voltage input terminal 330 may be connected to the first pixel electrode 311 of the first subpixel 310, or the high voltage input terminal 330 may be connected to the conductive lead 320. As long as a high voltage can be input to the first pixel electrode 311 through the high voltage input terminal 330.
There are various ways for disposing the high voltage input terminal 330, for example, the high voltage input terminal 330 is disposed on the first pixel electrode 311 of any one of the first sub-pixels 310 in the plurality of first sub-pixels 310. Alternatively, the high voltage input terminal 330 is disposed on the conductive wire 320, and the high voltage input terminal 330 is connected to the first pixel electrode 311 through the conductive wire 320.
In some optional embodiments, the display motherboard further includes a cover plate 500 and a light extraction layer 600, a first blind hole 700 is disposed on the display motherboard, the first blind hole 700 is disposed corresponding to the high voltage input end 330, and the first blind hole 700 extends from the cover plate 500 to the high voltage input end 330, so that an external pressure component or a detection element can be inserted into the first blind hole 700 to connect the high voltage input end 330.
The first blind hole 700 may be formed in various ways, for example, after the display mother board is formed, the first blind hole 700 may be formed by drilling the display mother board. Alternatively, in the molding process of the display mother board, when the layer structures located above the high voltage input end 330 are formed, the first blind holes 700 are etched at the positions of the layer structures corresponding to the high voltage input end 330.
In other embodiments, when the test assembly 300 includes the conductive lead 320, the low voltage input 340 may be connected to the first pixel electrode 311 of the first subpixel 310, or the low voltage input 340 may be connected to the conductive lead 320. As long as a high voltage can be input to the first pixel electrode 311 through the low voltage input terminal 340.
The low voltage input terminal 340 can be disposed in various manners, for example, the low voltage input terminal 340 is disposed on the first pixel electrode 311 of any one of the first sub-pixels 310 in the plurality of first sub-pixels 310. Alternatively, the low voltage input terminal 340 is disposed on the conductive wire 320, and the low voltage input terminal 340 is connected to the first pixel electrode 311 through the conductive wire 320.
There are various ways for connecting the low voltage input end 340 and the external pressing component or the detecting element, in some optional embodiments, the display mother board further includes a cover plate 500 and a light extraction layer 600, a second blind hole 800 is disposed on the display mother board, the second blind hole 800 is disposed corresponding to the low voltage input end 340, and the second blind hole 800 extends from the cover plate 500 to the low voltage input end 340, so that the external pressing component or the detecting element can be inserted into the second blind hole 800 to connect the low voltage input end 340.
The second blind holes 800 may be formed in various manners, for example, after the display mother board is formed, the second blind holes 800 may be formed by drilling the display mother board. Alternatively, during the molding process of the display mother board, when the layer structures located above the low voltage input terminal 340 are formed, the second blind holes 800 are etched at the positions of the layer structures corresponding to the low voltage input terminal 340.
Referring to fig. 4, the display area 100a of the display panel 100 is further provided with more than two second sub-pixels 110. The test assembly 300 includes more than two single primary color test units 300a connected to the high voltage input terminal 330 and the low voltage input terminal 340, respectively, so that the test assembly 300 includes more than two first sub-pixels 310.
There are various arrangements of the two or more first sub-pixels 310, and in some alternative embodiments, the arrangement rule of the two or more first sub-pixels 310 is the same as the arrangement rule of the two or more second sub-pixels 110. The characteristics of the plurality of first sub-pixels 310 in the test assembly 300 are made closer to the characteristics of the plurality of second sub-pixels 110 in the display panel 100, and thus whether or not electron leakage occurs in the display panel 100 can be inferred according to whether or not electron leakage occurs in the test assembly 300.
In some alternative embodiments, the plurality of first sub-pixels 310 in the test assembly 300 are arranged according to a predetermined rule; the single primary color test unit 300a is composed of first sub-pixels 310 of the same color in a plurality of first sub-pixels 310 arranged according to a preset rule. The first sub-pixels 310 in the single primary color testing unit 300a are not necessarily adjacent, and the first sub-pixels 310 in the single primary color testing unit 300a may be the first sub-pixels 310 arranged separately from each other, as long as the colors of the first sub-pixels 310 in the single primary color testing unit 300a are the same.
The second sub-pixel 110 includes a driving array layer 114, a second pixel electrode 111, a second light emitting structure 112, and a second common electrode 113, which are sequentially stacked.
In some alternative embodiments, the second pixel electrode 111 and the first pixel electrode 311 are simultaneously formed, and/or the second light emitting structure 112 and the first light emitting structure 312 are simultaneously formed, and/or the second common electrode 113 and the first common electrode 313 are jointly formed. So that the characteristics of the plurality of first sub-pixels 310 in the test assembly 300 are closer to the characteristics of the plurality of second sub-pixels 110 in the display panel 100.
In some alternative embodiments, the first sub-pixel 310 further comprises an auxiliary layer 314 located at the first pixel facing away from the first light emitting structure 312. When the test assembly 300 includes the conductive leads 320, the conductive leads 320 are located within the auxiliary layer 314.
The auxiliary layer 314 is not limited, and in some alternative embodiments, the number of layers of the auxiliary layer 314 and the thickness of each layer are the same as the driving array layer 114. Therefore, the thickness of the auxiliary layer 314 is consistent with the thickness of the driving array layer 114, and further the thickness of the testing assembly 300 is consistent with the thickness of the display area 100a of the display panel 100, so that the characteristics of each first sub-pixel 310 in the testing assembly 300 are closer to the characteristics of each second sub-pixel 110 in the display area 100a of the display panel 100.
The motherboard is shown to further include a substrate 400, with the auxiliary layer 314 and the drive array layer 114 both disposed on the substrate 400. The driving array layer 114 includes, for example, a buffer layer, an active layer, source and drain electrodes, a gate insulating layer, and a gate electrode layer, which are sequentially stacked on the substrate 400. The conductive leads 320 may be layered with any of the metal layers in the driver array layer 114, such as the conductive leads 320 and source and drain electrodes, or the conductive leads 320 and gate electrode layers.
In the molding process of the display mother board, for example, when the source and drain electrodes of the driving array layer 114 are formed and the conductive leads 320 and the source and drain electrodes are in the same layer, a metal layer is deposited on the active layer, the metal layer is patterned to form the source and drain electrodes corresponding to the display area 100a, and the metal layer is patterned to form the conductive leads 320 corresponding to the test assembly 300.
Alternatively, when the source and drain electrodes of the driving array layer 114 are formed and the conductive leads 320 are not on the same layer as the source and drain electrodes, a metal layer is deposited on the active layer, and the metal layer is patterned to form the source and drain electrodes corresponding to the display region 100 a. The manufacturing process can be simplified by not performing any treatment on the metal layer in the region corresponding to the test assembly 300 to make the thicknesses of the auxiliary layer 314 and the driving array layer 114 close. Or the metal layer is etched in the region corresponding to the test component 300, and the part of the metal layer corresponding to the test component 300 is etched away, so that the array layer 114 is driven to be thinner by the auxiliary layer 314, and materials can be saved.
The embodiment of the present invention further provides a display panel 100, wherein a testing assembly 300 is disposed in a non-display area 100b of the display panel 100, and the testing assembly 300 is the testing assembly 300 according to any of the embodiments. The display panel 100 can be tested whether or not electron leakage occurs.
Referring to fig. 5, another embodiment of the invention further provides a testing method for testing the display mother board or the display panel 100 including the testing assembly 300, the testing method including:
step S01: a first voltage is applied to the high voltage input terminal, a second voltage is applied to the low voltage input terminal, and the first voltage is greater than the second voltage.
There are various ways to apply the second voltage to the low voltage input terminal 340, such as grounding the low voltage input terminal 340 to make the second voltage zero. Or a voltage is applied to the low voltage input 340, but the second voltage applied to the low voltage input 340 is less than the first voltage applied to the high voltage input 330.
Step S02: the current value and/or the resistance value between the high-voltage input end and the low-voltage input end is obtained.
There are various ways to obtain the current value and/or the resistance value, for example, a multimeter is connected between the high voltage input terminal 330 and the low voltage input terminal 340, and the current value and/or the resistance value is directly read by the multimeter. Alternatively, an ammeter is connected between the high voltage input terminal 330 and the low voltage input terminal 340 to measure a current value, and a resistance value is obtained from the current value, a difference between the first voltage and the second voltage.
Step S03: and determining whether electron leakage occurs between the single primary color test unit connected to the high voltage input terminal and the single primary color test unit connected to the low voltage input terminal according to the current value and/or the resistance value.
In the testing method of the embodiment of the invention, first, a first voltage and a second voltage are applied through the high voltage input end 330 and the low voltage input end 340 respectively, and the first voltage is greater than the second voltage. When an electron leakage occurs between the single basic color test cell 300a connected to the high voltage input terminal 330 and the single basic color test cell 300a connected to the low voltage input terminal 340, the leaked electron is moved due to a voltage difference between the high voltage input terminal 330 and the low voltage input terminal 340, so that a current value and/or a resistance value between the high voltage input terminal 330 and the low voltage input terminal 340 is changed. It can be determined whether or not electron leakage occurs by step S03.
There are various embodiments of the step S03, for example, when the resistance value is infinite or the current value is close to zero, it may be determined that no electron leakage occurs between the single basic color test cell 300a connected to the high voltage input terminal 330 and the single basic color test cell 300a connected to the low voltage input terminal 340.
Alternatively, in other alternative embodiments, when the resistance value is greater than or equal to the resistance threshold value, it is determined that no electron leakage occurs between the single primary color test cell 300a connected to the high voltage input terminal 330 and the single primary color test cell 300a connected to the low voltage input terminal 340.
The resistance threshold may be set in various ways, for example, the resistance threshold may be determined in combination with a display spectrum. When the resistance is smaller than the preset resistance value, the color of the first sub-pixel 310 of the single primary color testing unit 300a connected to the high voltage input end 330 is color-shifted, and when the resistance is greater than or equal to the preset resistance value, the color of the first sub-pixel 310 of the single primary color testing unit 300a connected to the high voltage input end 330 is not color-shifted, and the preset resistance value is the threshold resistance value.
Alternatively, in further alternative embodiments, when the current value is less than or equal to the current threshold value, it is determined that no electron leakage occurs between the single primary color test cell 300a connected to the high voltage input terminal 330 and the single primary color test cell 300a connected to the low voltage input terminal 340.
The current threshold may be set in a variety of ways, for example, the current threshold may be determined in conjunction with a displayed spectrum. When the current is greater than the preset current value, the color of the first sub-pixel 310 of the single primary color testing unit 300a connected to the high voltage input end 330 is color-shifted, and when the current is less than or equal to the preset current value, the color of the first sub-pixel 310 of the single primary color testing unit 300a connected to the high voltage input end 330 is not color-shifted, and the preset current value is the current threshold.
While the application has been described with reference to a preferred embodiment, various modifications may be made and equivalents may be substituted for elements thereof without departing from the scope of the application. In particular, the technical features mentioned in the embodiments can be combined in any way as long as there is no structural conflict. The present application is not intended to be limited to the particular embodiments disclosed herein but is to cover all embodiments that may fall within the scope of the appended claims.
Claims (8)
1. A display mother board, characterized in that, the display mother board has a plurality of display panels and is located in the connection region between the display panels, the display panels have display area and non-display area, the display mother board includes the test assembly that sets up in the connection region and/or the non-display area, the test assembly includes:
the single-primary-color testing device comprises more than two single-primary-color testing units corresponding to different primary colors, wherein the number of first sub-pixels in each single-primary-color testing unit is multiple, and each first sub-pixel comprises a first pixel electrode, a first light-emitting structure and a first common electrode which are sequentially stacked;
a conductive lead is arranged on one side of the first pixel electrode, which is far away from the first light-emitting structure, and the first pixel electrodes of at least two first sub-pixels in the single primary color testing unit are connected with each other through the conductive lead;
the high-voltage input end is connected to the first pixel electrode of the first sub-pixel in the single primary color testing unit with at least one color;
a low voltage input terminal connected to the first pixel electrode of the first sub-pixel in the single primary color test unit of at least one color of other colors than the single primary color test unit connected to the high voltage input terminal;
the high voltage input terminal and/or the low voltage input terminal are connected to the first pixel electrodes connected to each other.
2. The display mother board of claim 1, wherein the high voltage input terminal is connected to the first pixel electrode of the first subpixel or the high voltage input terminal is connected to the conductive lead.
3. The display mother board of claim 1, wherein the low voltage input is connected to the first pixel electrode of the first subpixel or the low voltage input is connected to the conductive lead.
4. The display motherboard of claim 1, wherein the test assembly comprises three different primary colors;
two of the single primary color test units of three different primary colors are connected to the high-voltage input end, and the other one is connected to the low-voltage input end;
or, two of the single primary color test units of three different primary colors are connected to the low voltage input terminal, and the other is connected to the high voltage input terminal.
5. The display motherboard of claim 1,
a plurality of first sub-pixels in the test group are arranged according to a preset rule;
the single primary color testing unit is composed of the first sub-pixels with the same color in the plurality of first sub-pixels which are formed by arranging according to the preset rule.
6. The display mother board according to claim 1, wherein a plurality of second sub-pixels are provided in the display region, and an arrangement rule of the plurality of first sub-pixels is the same as an arrangement rule of the plurality of second sub-pixels.
7. A display panel having a display area and a non-display area, the non-display area being provided with a test assembly, the test assembly comprising:
the single primary color testing unit comprises a plurality of first sub-pixels, and each first sub-pixel comprises a first pixel electrode, a first light-emitting structure and a first common electrode which are sequentially stacked;
a conductive lead is arranged on one side of the first pixel electrode, which is far away from the first light-emitting structure, and the first pixel electrodes of at least two first sub-pixels in the single primary color testing unit are connected with each other through the conductive lead;
the high-voltage input end is connected to the first pixel electrode of the first sub-pixel in the single primary color testing unit with at least one color;
a low voltage input terminal connected to the first pixel electrode of the first sub-pixel in the single primary color test unit of at least one color of other colors than the single primary color test unit connected to the high voltage input terminal;
the high voltage input terminal and/or the low voltage input terminal are connected to the first pixel electrodes connected to each other.
8. A method for testing an electronic leak, for testing the display mother board of claim 1 and/or the display panel of claim 7, the method comprising:
applying a first voltage to the high voltage input terminal and a second voltage to the low voltage input terminal, wherein the first voltage is greater than the second voltage;
acquiring a current value and/or a resistance value between the high-voltage input end and the low-voltage input end;
and determining whether electron leakage occurs between the single primary color test unit connected to the high-voltage input end and the single primary color test unit connected to the low-voltage input end according to the current value and/or the resistance value.
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