CN110836861A - Long-wave infrared bicolor imaging monitoring system for SF6 gas leakage - Google Patents
Long-wave infrared bicolor imaging monitoring system for SF6 gas leakage Download PDFInfo
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- 238000012544 monitoring process Methods 0.000 title claims abstract description 37
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Abstract
The invention discloses a long-wave infrared double-color imaging monitoring system for SF6 gas leakage, which integrates and packages a micro-filter array matched with SF6 spectrum and infrared double-color image differential processing on a focal plane of a long-wave infrared focal plane detector, so that the whole structure is compact, the positioning is rapid and accurate, and the sensitivity is improved. The invention comprises a long-wave infrared optical lens, a long-wave infrared bicolor focal plane detector and an infrared bicolor image processing module; the long-wave infrared optical lens, the long-wave infrared bicolor focal plane detector and the infrared bicolor image processing module are sequentially arranged along the direction of an incident light path; the long-wave infrared double-color focal plane detector is characterized in that an integrally packaged micro-electroluminescent sheet array is arranged on a focal plane of the long-wave infrared double-color focal plane detector, and the long-wave infrared double-color focal plane detector is a refrigeration type or non-refrigeration type long-wave infrared focal plane detector.
Description
Technical Field
The invention relates to an SF6 gas leakage monitoring system, which is particularly used for monitoring SF6 gas leakage in the power industry.
Background
In high-voltage equipment in the power industry, SF6 gas is widely used because of its good chemical stability, thermal stability, insulation and arc extinguishing properties. The insulating medium is the first choice for equipment such as circuit breakers, high-voltage switches, high-voltage transformers, high-voltage transmission lines, high-power transformers and the like. Leakage of SF6 gas in high voltage equipment is a common phenomenon due to factors such as the manufacturing process, installation method, and equipment aging of the power equipment. The SF6 gas leakage can cause the internal pressure of the equipment to drop, resulting in the reduction of insulation and arc extinguishing performance, and can bring serious threats to the safe operation of power equipment and the life health of indoor workers. Therefore, the SF6 gas leakage monitoring technology has important significance for preventing SF6 gas leakage and timely early warning in the power equipment operation area.
The current common methods for monitoring SF6 gas leakage points on site mainly comprise ultraviolet ionization type monitoring, ultrasonic monitoring, laser imaging monitoring and infrared imaging monitoring technologies. The ultraviolet ionization type monitoring technology has poor positioning performance, and can only determine which sealing surface leaks, but can not accurately find a leak point. The ultrasonic monitoring technology cannot detect the leakage point of the charged equipment in a short distance, so that the detection and the positioning are not accurate. The laser monitoring technology needs a certain background as a reflecting surface, and the monitor has large volume, heavy mass and monitoring dead angles, so that the application and popularization of the monitor form certain limitations. The SF6 infrared imaging monitoring technology can realize noncontact type large-range monitoring and quick positioning of leakage points. However, the prior art is realized by adding a narrow-band filter matched with the infrared spectrum of the SF6 gas in an infrared optical system, and the technical means reduces the signal-to-noise ratio of the monitoring system, thereby reducing the sensitivity of the SF6 gas imaging monitoring system.
Disclosure of Invention
The technical problem to be solved by the invention is to provide a long-wave infrared two-color imaging monitoring system for SF6 gas leakage, which aims at the problems of difficult positioning of leakage position, low sensitivity and large volume of the traditional SF6 gas leakage monitoring technology, and integrates and packages a micro-filter sheet array matched with SF6 spectrum and infrared two-color image differential processing on the focal plane of a long-wave infrared focal plane detector, so that the whole structure is compact, the positioning is fast and accurate, and the sensitivity is improved.
In order to achieve the purpose, the invention adopts the following technical scheme to realize the purpose:
a long-wave infrared bicolor imaging monitoring system for SF6 gas leakage is characterized in that,
the infrared double-color image processing device comprises a long-wave infrared optical lens, a long-wave infrared double-color focal plane detector and an infrared double-color image processing module;
the long-wave infrared optical lens, the long-wave infrared bicolor focal plane detector and the infrared bicolor image processing module are sequentially arranged along the direction of an incident light path;
the long-wave infrared double-color focal plane detector is characterized in that an integrally packaged micro-electroluminescent sheet array is arranged on a focal plane of the long-wave infrared double-color focal plane detector, and the long-wave infrared double-color focal plane detector is a refrigeration type or non-refrigeration type long-wave infrared double-color focal plane detector.
As a preferred embodiment of the present invention: the arrangement mode of the micro-filter plate array is any one of three arrangement modes of a grid type, a spaced type and a spaced type.
As a preferred embodiment of the present invention:
in the grid type arrangement mode of the micro-filter plate array, the structural sizes of the single micro-filter plate and the pixels of the long-wave infrared double-color focal plane detector are the same;
in the interlaced arrangement mode of the micro-filter plate array, the height sizes of the single-row micro-filter plates and the single-row pixels of the long-wave infrared double-color focal plane detector are the same;
in the spaced arrangement mode of the micro-filter array, the width sizes of single-row micro-filters are the same as the width sizes of single-row pixels of the long-wave infrared double-color focal plane detector.
As a preferred embodiment of the present invention: the micro-filter units in the micro-filter array are divided into two types according to spectral filtering characteristics; wherein the first type is a band-stop filter with a central wavelength in the range of 10.5-10.6 μm; the other is a long-wave infrared anti-reflection filter.
As a preferred embodiment of the present invention: the long-wave infrared anti-reflection filter comprises a detector pixel which is not integrated with a packaged micro-filter.
As a preferred embodiment of the present invention: the implementation process of the micro-filter array is divided into two modes:
firstly, coating a long-wave infrared anti-reflection filter film on an infrared substrate material to form a long-wave infrared anti-reflection substrate; manufacturing a micro-fluorescence sheet array on a substrate;
secondly, a micro-filter array is directly manufactured on the focal plane of the long-wave infrared detector.
As a preferred embodiment of the present invention: in the integrated packaging structure of the micro-filter array:
for a grid-type micro-filter array, a single micro-filter is aligned with a single pixel of the focal plane; for an interlaced micro-filter array, the single row of micro-filters is aligned with the single row of pixels of the focal plane; for the array of alternating micro-filters, a single row of micro-filters is aligned with a single row of pixels of the focal plane.
As a preferred embodiment of the present invention: the infrared double-color image processing module performs data processing through an infrared double-color image processing method: the infrared double-color image processing method comprises the following steps:
(1) deconstructing two infrared images from the infrared double-color image;
(2) respectively carrying out non-uniform correction processing on the two double-color images;
(3) locating the position of SF6 gas leakage in a differential image of the infrared bi-color image;
(4) in combination with the shape of SF6 leaking gas, SF6 leaking gas regions were detected and marked in the averaged image of the infrared two-color image.
The invention has the beneficial effects that:
the invention discloses a long-wave infrared double-color imaging detection system for SF6 gas leakage, which solves the problems of difficult leakage position positioning, low sensitivity and large volume of the existing SF6 gas leakage monitoring system. The system comprises a long-wave infrared optical lens, a long-wave infrared bicolor focal plane detector and an infrared bicolor image processing module. The long-wave infrared double-color focal plane detector is formed by integrally packaging a micro-filter array matched with SF6 absorption spectrum in front of the long-wave infrared focal plane detector. The invention utilizes a long-wave infrared optical lens to focus incident infrared radiation, utilizes a long-wave bicolor focal plane detector to obtain two infrared images in real time, and completes positioning monitoring of SF6 gas through an infrared bicolor image processing module; and micro-filter arrays matched with SF6 spectrum are integrally packaged on a focal plane of the long-wave infrared focal plane detector, and infrared double-color image differential processing is performed. The long-wave infrared bicolor monitoring system for SF6 gas leakage disclosed by the invention has the advantages of compact structure, miniaturization, high sensitivity and rapid positioning of the leakage position.
Drawings
FIG. 1 is a schematic structural diagram of an embodiment of the present invention;
FIG. 2-1 shows the layout of the micro-filter array of the present invention in the 1 st mode;
FIG. 2-2 shows the layout of the micro-filter array of the present invention in the 2 nd layout;
FIGS. 2-3 show the 3 rd layout of the micro-filter array according to the present invention;
fig. 3 is a flow chart of the infrared bi-color image processing method of the present invention.
Description of reference numerals:
101: infrared radiation of a scene, 102: long-wave infrared optical lens, 103: long-wave infrared bicolor focal plane detector, 104: micro-filter plate array, 105: long-wave infrared focal plane, 106: and the infrared double-color image processing module.
In FIGS. 2-1 to 2-3: I. III and V represent: a band-elimination filter with the central wavelength within the range of 10.5-10.6 mu m; II. IV and VI represent: a long-wave infrared anti-reflection filter.
Detailed Description
The following description of the embodiments of the present invention refers to the accompanying drawings and examples:
as shown in the drawings, the specific embodiment of the invention is shown, and aiming at the problems of difficult leakage position location, low sensitivity and large volume of the traditional SF6 gas leakage monitoring technology, the invention provides a long-wave infrared bicolor imaging monitoring system for SF6 gas leakage by integrally packaging a microfilter array matched with an SF6 spectrum on a focal plane of a long-wave infrared focal plane detector and carrying out infrared bicolor image differential processing.
As shown in the figure, the system disclosed by the invention comprises a long-wave infrared optical lens 102, a long-wave infrared bicolor focal plane detector 103 and an infrared bicolor image processing module 106; the position relation of the devices is as follows: the long-wave infrared optical lens 102, the long-wave infrared bicolor focal plane detector 103 and the long-wave infrared bicolor image processing module 106 are arranged along the incident light path direction in sequence.
The long-wave infrared double-color focal plane detector 103 is formed by integrally packaging a micro-filter array 104 on a long-wave infrared focal plane 105 of the long-wave infrared double-color focal plane detector 103, wherein the long-wave double-color infrared focal plane detector 103 is a refrigeration type or non-refrigeration type long-wave infrared double-color focal plane detector.
The micro-filter array 104 includes three arrangements, namely, a grid arrangement (as shown in fig. 2-1), a spaced arrangement (as shown in fig. 2-2) and a spaced arrangement (as shown in fig. 2-3). For the grid type arrangement mode, the structural sizes of the single micro-filter plate and the long-wave infrared focal plane detector pixel are the same; for the interlaced arrangement mode, the height sizes of the single-row micro-filter plates and the single-row pixels of the long-wave infrared focal plane detector are the same; for the separated arrangement mode, the width sizes of the single-row micro-filter plates and the single-row pixels of the long-wave infrared focal plane detector are the same.
The micro-filter units of the micro-filter array 104 are divided into two types according to spectral filtering characteristics; wherein the first type is a band-stop filter with a central wavelength in the range of 10.5-10.6 μm; the other is a long-wave infrared anti-reflection filter. The long-wave infrared anti-reflection optical filter comprises a detector pixel which is not integrated with a packaged micro-filter.
In the integrated packaging process of the micro-filter array 104, for the grid micro-filter array, a single micro-filter is aligned with a single pixel of the focal plane; for an interlaced micro-filter array, the single row of micro-filters is aligned with the single row of pixels of the focal plane; for the array of alternating micro-filters, a single row of micro-filters is aligned with a single row of pixels of the focal plane.
The infrared double-color image processing method of the infrared double-color image processing module comprises the following steps:
step 1: deconstructing two infrared images from the infrared double-color image;
step 2: respectively carrying out non-uniform correction processing on the two double-color images;
and step 3: locating the position of SF6 gas leakage in a differential image of the infrared bi-color image;
and 4, step 4: in combination with the shape of SF6 leaking gas, SF6 leaking gas regions were detected and marked in the averaged image of the infrared two-color image.
To sum up:
the invention provides a long-wave infrared bicolor imaging monitoring system for SF6 gas leakage by integrally packaging a microfilter plate array matched with an SF6 spectrum on a focal plane of a long-wave infrared focal plane detector and performing infrared bicolor image differential processing. The SF6 gas leakage monitoring system provided by the invention has the advantages of compact structure, miniaturization, high sensitivity, non-contact type and rapid positioning of leakage positions.
As shown in the figure, incident radiation 101 passes through a long-wave infrared optical lens 102 and is focused on a focal plane of a long-wave infrared bicolor focal plane detector 103, and the long-wave infrared bicolor focal plane detector 103 can output two infrared images, and after the two infrared images are processed by an infrared bicolor image processing module 106, an SF6 gas leakage area is marked in a scene infrared image; the position relation of the devices is as follows: the long-wave infrared optical lens 102, the long-wave infrared bicolor focal plane detector 103 and the infrared bicolor image processing module 106 are arranged along the incident light path direction in sequence.
The long-wave infrared bicolor focal plane detector 103 is formed by integrally packaging a microfilter plate array 104 on a focal plane 105 of the long-wave infrared focal plane detector, wherein the long-wave infrared focal plane 105 is a refrigerating type or non-refrigerating type long-wave infrared focal plane. A relatively common non-refrigeration type long-wave infrared focal plane is of a vanadium oxide or amorphous silicon material type, and the response wavelength range is 8-14 um.
The infrared bi-color image processing module 106 comprises an infrared bi-color image processing method comprising the following steps:
step 1: deconstructing two infrared images from the infrared double-color image;
step 2: respectively carrying out non-uniform correction processing on the two double-color images;
and step 3: locating the position of SF6 gas leakage in a differential image of the infrared bi-color image;
and 4, step 4: in combination with the shape of SF6 leaking gas, SF6 leaking gas regions were detected and marked in the averaged image of the infrared two-color image.
While the preferred embodiments of the present invention have been described in detail with reference to the accompanying drawings, the present invention is not limited to the above embodiments, and various changes, which relate to the related art known to those skilled in the art and fall within the scope of the present invention, can be made within the knowledge of those skilled in the art without departing from the gist of the present invention.
Many other changes and modifications can be made without departing from the spirit and scope of the invention. It is to be understood that the invention is not to be limited to the specific embodiments, but only by the scope of the appended claims.
Claims (8)
1. A long-wave infrared bicolor imaging monitoring system for SF6 gas leakage is characterized in that,
the infrared double-color image processing device comprises a long-wave infrared optical lens, a long-wave infrared double-color focal plane detector and an infrared double-color image processing module;
the long-wave infrared optical lens, the long-wave infrared bicolor focal plane detector and the infrared bicolor image processing module are sequentially arranged along the direction of an incident light path;
the long-wave infrared double-color focal plane detector is characterized in that an integrally packaged micro-electroluminescent sheet array is arranged on a focal plane of the long-wave infrared double-color focal plane detector, and the long-wave infrared double-color focal plane detector is a refrigeration type or non-refrigeration type long-wave infrared double-color focal plane detector.
2. The long-wave infrared bicolor imaging monitoring system for SF6 gas leakage of claim 1, wherein said microfilter array is arranged in any one of three modes of grid, spaced and spaced.
3. The long wave infrared bi-color imaging monitoring system for SF6 gas leakage of claim 2,
in the grid type arrangement mode of the micro-filter plate array, the structural sizes of the single micro-filter plate and the long-wave bicolor focal plane detector pixel are the same;
in the interlaced arrangement mode of the micro-filter plate array, the height sizes of single-row pixels of the single-row micro-filter plates and the single-row pixels of the long-wave infrared focal plane detector are the same;
in the spaced arrangement mode of the micro-filter plate array, the width sizes of single-row pixels of the micro-filter plates are the same as those of single-row pixels of the long-wave infrared focal plane detector.
4. The long wave infrared bi-color imaging monitoring system for SF6 gas leakage of claim 1, wherein: the micro-filter units in the micro-filter array are divided into two types according to spectral filtering characteristics; wherein the first type is a band-stop filter with a central wavelength in the range of 10.5-10.6 μm; the other is a long-wave infrared anti-reflection filter.
5. The long wave infrared bi-color imaging monitoring system for SF6 gas leakage of claim 4, wherein: the long-wave infrared anti-reflection filter comprises a detector pixel which is not integrated with a packaged micro-filter.
6. The long wave infrared bi-color imaging monitoring system for SF6 gas leakage of claim 1, wherein: the implementation process of the micro-filter array is divided into two modes:
firstly, coating a long-wave infrared anti-reflection filter film on an infrared substrate material to form a long-wave infrared anti-reflection substrate; manufacturing a micro-fluorescence sheet array on a substrate;
secondly, a micro-filter array is directly manufactured on the focal plane of the long-wave infrared detector.
7. The long wave infrared bi-color imaging monitoring system for SF6 gas leakage of claim 1, wherein: in the integrated packaging structure of the micro-filter array:
for the grid type micro-filter array, a single micro-filter is aligned with a single pixel of the long-wave infrared focal plane; for the interlaced micro-filter array, the single-row micro-filters are aligned with the single-row pixels of the long-wave infrared focal plane; for the staggered micro-filter array, the single row of micro-filters is aligned with the single row of pixels of the long-wave infrared focal plane.
8. The long wave infrared bi-color imaging monitoring system for SF6 gas leakage of claim 1, wherein: the infrared double-color image processing module performs data processing through an infrared double-color image processing method: the infrared double-color image processing method comprises the following steps:
(1) deconstructing two infrared images from the infrared double-color image;
(2) respectively carrying out non-uniform correction processing on the two double-color images;
(3) locating the position of SF6 gas leakage in a differential image of the infrared bi-color image;
(4) in combination with the shape of SF6 leaking gas, SF6 leaking gas regions were detected and marked in the averaged image of the infrared two-color image.
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| CN111653630A (en) * | 2020-04-29 | 2020-09-11 | 西北工业大学 | Manufacturing method of double-color focal plane detector and double-color image obtaining method |
| CN114112972A (en) * | 2021-12-02 | 2022-03-01 | 国网安徽省电力有限公司电力科学研究院 | Closed space SF6Gas leakage infrared remote measuring device and imaging positioning method thereof |
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