CN110676191A - A method of separating and combining LED wafer testing machine based on MES system - Google Patents

Abstract

The present invention discloses a LED wafer test disassembly grouping and collection method based on the MES system. The information recorded on the barcode is uploaded by a barcode scanning gun and compared with the information on the MES system. There is no need for manual comparison with the naked eye, which reduces the workload of operators in checking reports. At the same time, the information verification can be 100% correct, avoiding the problem of incorrect pairing of sub-batches with production equipment and reducing the production error rate. The MES system is used to monitor the production status of sub-batches in real time, so that operators can accurately judge the time for merging sub-batches and improve production efficiency, thereby greatly reducing the time for splitting batches and achieving precise control management.

Description

A method of separating and combining LED wafer testing machine based on MES system

technical field

The invention relates to the technical field of LED chip testing and production, in particular to a method for separating, assembling, and collecting an LED wafer testing machine based on an MES system.

Background technique

The LED wafer is the core part of the LED. In fact, the main optoelectronic parameters such as the wavelength, brightness, and forward voltage of the LED basically depend on the wafer material. The processing and production of related circuit components of LEDs are all completed on wafers, so wafer technology and equipment are the key to wafer manufacturing technology.

At present, the LED front-end chip manufacturing equipment determines that each batch of wafers is about 40 or more. The test time of each LED chip testing equipment is controlled at about 3-7 hours according to the size of the product and the change of test conditions. In order to shorten the time In the testing time, each batch of wafers needs to be divided into multiple sub-batches, which are tested by multiple testing machines at the same time. After multiple testing machines have completed the corresponding testing tasks, the sub-batches are merged into the original parent batch. Next, proceed to the next production process.

At present, most enterprises still use manual report records to track the production operations of each sub-batch, and rely on the physical location to distinguish which batch of products each equipment should produce. When the operator pulls the product to the front of the corresponding equipment, it is necessary to The data in the report is matched one by one with the naked eye. The data to be checked includes customer code, product model, work station, date of move-in, start date, etc. If there is a little carelessness, there will be errors in checking, and the workload of manual report tracking is large. Moreover, the timeliness is poor, which affects the production cycle of the product. In addition, after the split production, since the start test time and completion time of each batch are different, it is difficult for humans to accurately judge the time when all batches are completed.

Therefore, there is an urgent need for a split and merge management method that can facilitate the production of large-scale workshop products, so as to improve the efficiency of product split batch production.

SUMMARY OF THE INVENTION

In view of the deficiencies in the prior art, the purpose of the present invention is to provide a method for separating and assembling an LED wafer testing machine based on an MES system, so as to solve the above problems.

In order to achieve the above object, the technical scheme adopted in the present invention is:

A method for separating and combining LED wafer testing machine based on MES system, comprising the following steps:

1) Enter the information of a mother batch of LED wafers to be tested into the MES system, and physically split the mother batch of LED wafers into at least two sub-batches and place them in corresponding containers.

2) Assign each sub-batch to different production lines for detection through the MES system, and generate a corresponding barcode, which is pasted on the surface of the sub-batch container, and the barcode records the information of the parent batch of LED wafers.

3) Transport the container loaded with sub-batch LED wafers to the corresponding production line, scan the barcode with the barcode scanner, and compare with the sub-batch information allocated by the MES system. If the information is paired correctly, the production will be normal. The information is incorrectly paired, which proves that the sub-lot is not produced by this production line and needs to be re-paired to the correct production line.

4) The MES system monitors the production status of each production line in real time, and judges whether the production of each sub-batch has been completed. When all the sub-batches have completed the production of the inspection process, the MES system automatically merges the information of each sub-batch and prompts the work at the same time. Personnel physically merges sub-batches.

5) After receiving the prompt from the MES system, use the barcode scanner to scan the barcode loaded with the sub-batch container, and pair it with the information in the MES system. When the information is paired correctly, combine all the sub-batches into the same one. In the container, the physical merger is completed.

In a further technical solution, the LED wafer information at least includes: customer code, PTN/Lot, C/Lot, product model, station, MASK, Work Order, move-in date, start-up date, status, and Qly.

In a further technical solution, in step 3), the MES system displays the production status of each sub-batch on the monitoring screen, and the background color of the sub-batch in production is white, and when a certain sub-batch completes production, Change the background color to green.

By adopting the above method, the advantages of the present invention compared with the prior art are: 1. Upload the information recorded on the barcode through the code scanning gun and compare it with the information on the MES system, without the need for manual comparison with the naked eye, reducing operations The workload of personnel checking reports, and at the same time, the information checking can be 100% correct, avoiding the problem of incorrect pairing of sub-batches with production equipment, and reducing the production error rate; 2. Real-time monitoring of the production of sub-batches through the MES system , the operator can accurately judge the time of sub-batch merging and improve the production efficiency, thereby greatly reducing the time for splitting batches and achieving precise control management.

Description of drawings

The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

Fig. 1 is the schematic diagram of split batch;

Fig. 2 is the system diagram of MES system monitoring sub-batch detection production situation in step 3);

Figure 3 is a block diagram of the steps of the present invention.

Detailed ways

The technical solutions of the present invention will be clearly and completely described below. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

As shown in Figure 1, when a parent batch of LED wafers needs to be inspected, in order to speed up the inspection efficiency, the batch of LED wafers is divided into 4 sub-batches, and each sub-batch contains 3 wafers , using the LED wafer test batch split and merge management system of the MES system provided by the present invention to perform batch split production processing, as shown in Figure 3, including the following steps:

1) The mother batch of LED wafers in the state to be tested after production is uniformly packed in a "pudding bucket" container, and the information of the mother batch of LED wafers to be tested is entered into the MES system. The specific information The contents include but are not limited to customer code, PTN/Lot, C/Lot, product model, station, MASK, Work Order, move-in date, start date, status, Qty, st-age; The object is split into four sub-lots and placed in corresponding small "pudding bucket" containers.

2) The MES system assigns each sub-batch to different production lines for inspection and production, and generates a barcode, which is pasted on the surface of the small "pudding bucket" container. The barcode records the information of the parent batch of LED wafers.

3) Transport the container loaded with sub-batch LED wafers to the corresponding production line, scan the barcode with the barcode scanner, and compare with the sub-batch information allocated by the MES system. If the information is paired correctly, the production will be normal. The information is incorrectly paired, which proves that the sub-batch is not produced by this production line, and the correct production line needs to be paired again; the MES system displays the production status of each sub-batch on the monitoring screen, as shown in Figure 2, the sub-batch in production The secondary background color is white, and when a sub-lot is finished production, the background color changes to green.

In this step, the information recorded on the barcode can be uploaded through the barcode scanner and compared with the information on the MES system, without the need for manual comparison with the naked eye, reducing the workload of the operator to check the report, and at the same time, the percentage of information checking can be achieved. 100 correct, avoid the problem of incorrect pairing of sub-batches with production equipment, and reduce the production error rate.

4) The MES system monitors the production status of each production line in real time, and judges whether the production of each sub-batch is completed. After the staff finds that the background color of all sub-batches has turned green through the monitoring screen, it means that all sub-batches have completed the inspection. During the production of the process, the MES system automatically merges the information of each sub-batch.

Through the real-time monitoring of the production of sub-batches through the MES system, operators can accurately judge the time for merging sub-batches and improve production efficiency, thereby greatly reducing the time for splitting batches and achieving precise control management.

5) After receiving the prompt from the MES system, use the barcode scanner to scan the barcode loaded with the sub-batch container, and pair it with the information in the MES system. When the information is paired correctly, the staff will merge the sub-batch physical objects at the same time. , place all the LED wafers in the small "pudding bucket" containers in a "pudding bucket" to complete the physical consolidation.

The above contents are only preferred embodiments of the present invention. For those of ordinary skill in the art, according to the idea of the present invention, there will be changes in the specific embodiments and application scope. limits.

Claims (3)

1. An LED wafer test disassembly group combining and collecting method based on an MES system is characterized by comprising the following steps:

1) inputting information of a parent batch of LED wafers to be tested into an MES system, splitting the parent batch of LED wafers into at least two sub-batches and placing the sub-batches in corresponding containers;

2) distributing each sub-batch to different production lines through an MES (manufacturing execution system) for detection, generating a corresponding bar code, and pasting the bar code on the surface of a sub-batch container, wherein the bar code records the information of the LED wafer of the parent batch;

3) conveying the containers loaded with the sub-batch of LED wafers to a corresponding production line, scanning the bar codes through a code scanning gun, comparing the sub-batch information with the sub-batch information distributed by the MES system, if the information is correctly matched, normally producing the sub-batch, and if the information is incorrectly matched, verifying that the sub-batch is not produced by the production line and needs to be re-matched with the correct production line;

4) the MES system monitors the production condition of each production line in real time, judges whether each sub-batch completes production, and when all the sub-batches complete the production of the detection process, the MES system automatically combines the information of each sub-batch and prompts workers to combine the sub-batches;

5) and after the prompt of the MES system is received, the bar codes loaded with the sub-batch containers are scanned by using a code scanning gun, the bar codes are paired with the information in the MES system, and when the information pairing is correct, all the sub-batches are combined and loaded into the same container to complete the material object combination.

2. The method as claimed in claim 1, wherein the information of the LED wafer at least comprises: customer code, PTN/Lot, C/Lot, product model, work station, MASK, WorkOrder, move in date, start date, status, Qly.

3. The method as claimed in claim 1, wherein in step 3), the MES system displays the production status of each sub-lot on the monitor screen, the background color of the sub-lot is white, and the background color is changed to green after a certain sub-lot is completely produced.

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