CN110673022A - Thin film keyboard PCBA testing device and method - Google Patents

Thin film keyboard PCBA testing device and method Download PDF

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Publication number
CN110673022A
CN110673022A CN201911079508.4A CN201911079508A CN110673022A CN 110673022 A CN110673022 A CN 110673022A CN 201911079508 A CN201911079508 A CN 201911079508A CN 110673022 A CN110673022 A CN 110673022A
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China
Prior art keywords
test
testing
pcba
upper computer
key
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CN201911079508.4A
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Chinese (zh)
Inventor
肖国晟
苏冠勳
尹海松
文发慧
许小丽
苏品忠
陈桂林
吴胜堂
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Dongguan Mattel Electronics Co Ltd
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Dongguan Mattel Electronics Co Ltd
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Priority to CN201911079508.4A priority Critical patent/CN110673022A/en
Publication of CN110673022A publication Critical patent/CN110673022A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Input From Keyboards Or The Like (AREA)

Abstract

The invention discloses a device and a method for testing a thin film keyboard PCBA (printed Circuit Board Assembly), wherein the device comprises a testing jig, a testing device and a control device, wherein the testing jig is connected with a PCBA golden finger through a jig probe and is connected with an upper computer; the testing jig comprises a built-in testing board, the built-in testing board comprises an MCU and a plurality of gating switch units, the PCBA key rows and columns are respectively connected to different gating switch units by the jig probes, the enabling end and the gating control end of each gating switch unit are both connected to the MCU, the MCU controls short circuit conduction of the PCBA key rows and columns, an upper computer testing program needs to be started before the PCBA of the membrane keyboard is tested, the PCBA micro-processing unit of the membrane keyboard synchronously uploads testing data to an upper computer through USB communication or other wireless communication modes, and the upper computer testing software displays testing states and testing results. The invention adopts one-key starting to simulate all keys of the keyboard to test full functions, and has simple operation and high test efficiency.

Description

Thin film keyboard PCBA testing device and method
Technical Field
The invention relates to a membrane keyboard PCBA test technology, in particular to a membrane keyboard PCBA test device and a membrane keyboard PCBA test method.
Background
The keyboard is widely applied to the input of texts and commands in computers and various electronic product equipment as the most common input device of computers and various automatic equipment, has the important function in the field of external equipment, and effectively facilitates the man-machine interaction between operators and the equipment. The existing keyboard in the market is the largest or common Membrane keyboard, an upper cover, a lower cover, a keycap, a Membrane Switch (Membrane Switch), a PCBA (Printed Circuit Board + Assembly), a Rubber key module (Rubber Sheet), an iron pressing bar, a foot pad, a USB wire or a battery (the wired keyboard uses a USB wire, and the wireless keyboard uses a battery) need to be installed in the production process of the Membrane keyboard, wherein the key factor influencing the Assembly yield is the PCBA.
In order to ensure the production quality of the PCBA, a manufacturer usually uses a jig to test the PCBA before shipment, but the existing PCBA test of the keyboard selects 18-20 keys of a keyboard matrix to test, as shown in figure 1, the test mode is that 18-20 micro switches are installed on the test jig, and the micro switches on the jig are pressed one by one to check whether the function of the PCBA is intact, so that the test is complex and the efficiency is low. The test mode is only to the IC paster or the IC Bonding on the PCBA to carry out open circuit test, the poor I/O short circuit of the IC part in the processing process of the PCBA cannot be detected, the keyboard connection key can be caused to be poor after the keyboard is assembled, the production yield is influenced, and the material scrapping can be caused by disassembling and reworking.
Disclosure of Invention
The purpose of the invention is as follows: aiming at the problems, the invention provides a device and a method for testing a thin film keyboard PCBA, which are started by one key, simulate all keys of the keyboard to test full functions, and have the advantages of simple operation and high testing efficiency.
The technical scheme is as follows: in order to realize the purpose of the invention, the technical scheme adopted by the invention is as follows: a membrane keyboard PCBA testing device is characterized by comprising an upper computer, a testing jig and a power supply; the test fixture comprises a built-in test board, a power interface, a test switch, an upper computer interface and a probe interface, wherein the power interface, the test switch and the probe interface are all connected to the built-in test board, and the upper computer interface is connected to a USB interface probe point of the PCBA through a fixture probe; the testing jig is connected with a thin film keyboard PCBA golden finger through a jig probe, the jig probe is connected with a probe interface, is connected with a power supply through a power supply interface, and is connected with an upper computer through an upper computer interface; the test fixture is started through the test switch to test the PCBA, test data are synchronously uploaded to the upper computer, and test software of the upper computer displays a test state and a test result.
Furthermore, the built-in test board comprises an MCU, a power interface connector, a voltage conversion unit, a jig probe connector and a plurality of gating switch units; the test switch is connected with the MCU; the power interface connector is connected with the voltage conversion unit to supply power to the MCU and the gating switch units; pins of the jig probe connector are led out to be used as probe interfaces, the PCBA key rows and columns are respectively connected to the input ends of different gating switch units, and the common ends of the gating switch units are all in short circuit connection; the enabling end and the gating control end of the gating switch unit are connected to the MCU, the MCU controls short circuit conduction of the PCBA key row and column, test data are synchronously uploaded to the upper computer, and test software of the upper computer displays a test state and a test result.
Furthermore, the test fixture further comprises a firmware update interface, and the built-in test board further comprises a firmware update interface connector connected to the MCU.
A membrane keyboard PCBA test method comprises the following steps:
(1) inserting a power supply into a power supply interface of the test fixture;
(2) the test fixture upper computer interface is connected with an upper computer;
(3) the test fixture probe interface is connected with the fixture probe, and the fixture probe is connected with the PCBA golden finger;
(4) and opening the test program of the upper computer, and then testing according to the test switch on the test fixture.
Furthermore, before the test, the method also comprises the step of burning the lower computer program to the MCU of the test fixture through the firmware updating interface.
Further, the lower computer program includes the steps of:
(1) starting a program and initializing;
(2) judging whether the test switch is turned on or not;
(3) if yes, running a row-column short circuit program.
Further, the upper computer test program includes the steps of:
(1) starting a program and initializing;
(2) judging whether the test device is normally accessed;
(3) if yes, the key detection program is operated.
Further, the key detecting program includes the steps of:
(1) running a time detection program for inputting the character keys;
(2) receiving the character key code until the character key is checked finally;
(3) and detecting whether the number of the keys is correct or not, returning a detection result, and displaying that the test is successful or displaying the missing keys.
Further, the input character key time detecting program includes the steps of:
(1) acquiring the key input time;
(2) judging whether the key acquisition time is equal to the key acquisition time of the last time, if so, continuing to the step 3, and if not, continuing to the step 4;
(3) displaying a short circuit error of the character key, and ending the program;
(4) judging whether the time obtained by subtracting the time obtained by the last key from the time obtained by the last key is greater than a set time threshold value or not;
(5) if yes, displaying the overtime of the character key input; if not, the last key acquisition time variable is stored as the next key acquisition time.
Has the advantages that: the testing method adopts one-key starting, simulates all keys of the keyboard to test full functions, and has simple operation and high testing efficiency.
Drawings
FIG. 1 is a diagram of a membrane keypad matrix;
FIG. 2 is a diagram of a membrane keypad PCBA test apparatus architecture in accordance with the present invention;
FIG. 3 is a circuit diagram of a built-in test board;
FIG. 4 is a schematic view of a fixture probe connector;
FIG. 5 is a schematic diagram of a gating switch unit;
FIG. 6 is a truth table of CD74HC 4067;
FIG. 7 is a schematic diagram of a 5V voltage conversion unit;
FIG. 8 is a schematic diagram of a 3.3V voltage conversion unit;
FIG. 9 is a schematic diagram of an MCU;
FIG. 10 is a schematic diagram of a firmware update interface connector;
fig. 11 is a flowchart of the lower computer program;
fig. 12 is a flowchart of a lower computer initialization procedure;
FIG. 13 is a row-column shortrange sequence flowchart;
FIG. 14 is a flowchart of a host computer test program;
FIG. 15 is a flowchart of a test initialization routine of the upper computer;
FIG. 16 is a flowchart of a key detect routine;
fig. 17 is a flowchart of an input character key time detection procedure;
FIG. 18 is a simulated keyboard display interface.
Detailed Description
The technical solution of the present invention is further described below with reference to the accompanying drawings and examples.
As shown in fig. 2, the membrane keyboard PCBA testing device of the present invention comprises a membrane keyboard PCBA testing jig, which uses a testing computer with a display as an upper computer, and is connected with the testing jig through a USB wire; the test fixture also comprises a DC9V power supply for supplying power to the test fixture.
The test fixture comprises a built-in test board, a DC9V power interface, a test switch S1, an upper computer interface and a probe interface, wherein the power interface, the test switch S1 and the probe interface are all connected to the built-in test board, and the upper computer interface is connected to a USB interface probe point of the PCBA through a fixture probe. If the keyboard is a 2.4G or Bluetooth type thin film keyboard, a code-matching-free receiver needs to be added on the test fixture, and the code-matching-free receiver is connected with a USB interface of a test computer.
The test fixture is connected with a PCBA golden finger through a fixture probe, the fixture probe is connected with a probe interface, connected with a power supply through a power supply interface and connected with an upper computer through an upper computer interface. The test fixture starts the built-in test board through the test switch, runs a test program on the PCBA, synchronously uploads test data to the upper computer, and the upper computer test software displays a test state and a test result.
As shown in fig. 3, the built-in test board includes an MCU, a power interface connector J1, a voltage conversion unit, a jig probe connector CN1, and a plurality of gate switch units. The test switch S1 is connected with the MCU, and the power interface connector J1 is connected with the voltage conversion unit to supply power for the MCU and the gating switch units.
As shown in fig. 4, the pins of the jig probe connector CN1 are led out as probe interfaces, and PCBA key rows and columns are respectively connected to different gating switch unit input ends, and the gating switch unit common ends are all shorted together.
As shown in fig. 5, the keyboard full-key test device comprises 3 gating switch units, wherein the gating switch unit is CD74HC4067, is a digital signal controlled 1-out-of-16 switch element, and is controlled by the MCU to conduct the rows (Row, U1) and the columns (Column, U2/U3) in a short circuit manner, so as to realize the keyboard full-key test in an analog manner. The enabling end and the gating control end of the gating switch unit are both connected to the MCU, the MCU controls the short-circuit conduction of the PCBA key Row and Column, E1-E3 are CD74HC4067 enabling pins, and the digital signals from S10-S13, S20-S23 and S30-S33 select Row and Column short-circuit conduction. The truth table of CD74HC4067 is shown in FIG. 6.
As shown in fig. 7, the DC9V power supply supplies power to the test board, and then supplies VCC5V voltage to the CD74HC4067 via the power interface connector J1 and the 5V voltage conversion unit. 7805 voltage stabilization is adopted in the 5V voltage conversion unit. As shown in fig. 8, for a 3.3V voltage conversion unit, VCC5V is supplied to the input terminal of XC6503D331, VCC5V is reduced in voltage by XC6503D331 to provide 3.3V for MCU operation, and LED1 is a 3.3V voltage indicator.
As shown in fig. 9, the MCU is connected to gate control terminals S10 to S13, S20 to S23, and S30 to S33 of the gate switch unit, and is selectively turned on by short-circuiting the Column with Row through a digital signal, and is connected to enable pins E1 to E3 of the CD74HC 4067.
As shown in fig. 10, the test fixture further includes a firmware update interface, and the internal test board further includes a firmware update interface connector J2 connected to the MCU.
The film keyboard PCBA to be tested needs to be burnt with shipment firmware FW, and signals of the CD74HC4067 simulation keyboard full-key test are processed by the MCU on the film keyboard PCBA and then transmitted to an upper computer system (Windows/IOS/Google and the like) for processing through USB transmission.
The invention discloses a membrane keyboard PCBA test method, which comprises the following steps:
(1) inserting a DC9V power supply into a power supply interface of the test fixture to supply power for the test system;
(2) one end of the USB wire is inserted into a USB interface of the test computer, the upper computer interface of the test fixture is connected with an upper computer, and the test fixture is communicated with the test computer;
(3) the test fixture probe interface connector CN1 on the test board built in the test fixture is connected with the fixture probe, and the fixture probe is connected with the gold finger of the PCBA;
(4) the lead of a test switch S1 on a test board built in the test fixture is arranged on the panel of the test fixture, and the test switch S1 is a PCBA board-changing test key of the membrane keyboard;
(5) the golden fingers and the test point pads on the thin film keyboard PCBA to be tested are connected with the probes of the test fixture in a one-to-one correspondence manner;
(6) before the PCBA test of the thin film keyboard to be tested, the power supply of a jig needs to be confirmed to be connected, a jig USB wire is inserted into a USB interface of a test computer, and a test program (. exe) at the test computer end is opened; then the membrane keyboard PCBA to be tested is placed at the appointed position, the probe is contacted and conducted with the test point by utilizing the connecting rod structure of the testing tool, and then the testing is carried out by pressing the test switch S1 on the testing tool.
Before the test, the method also comprises the step of burning the lower computer program to the MCU of the test fixture through the firmware updating interface.
As shown in fig. 11, the lower computer program includes the steps of:
(1) a start routine for initialization, as shown in fig. 12;
(2) judging whether the test switch is turned on or not;
(3) if so, the row column short program is run, as shown in FIG. 13. And when each row runs to the last row, performing delay judgment, delaying for 100ms, performing row +1 again, and judging whether the row is the last row again.
As shown in fig. 14, the upper computer test program includes the steps of:
(1) a start program for initialization, as shown in fig. 15;
(2) judging whether the test device is normally accessed, including judging whether a USB is inserted or not, and carrying out HID consultation inspection;
(3) if yes, lighting an LED indicator lamp, and operating a key detection program;
(4) and if the HID consults to check the error, displaying the HID error.
As shown in fig. 16, the key detecting program includes the steps of:
(1) running a time detection program for inputting the character keys;
(2) receiving the character key code until the character key is checked finally;
(3) and detecting whether the number of the keys is correct or not, returning a detection result, and displaying that the test is successful or displaying the missing keys.
As shown in fig. 17, the input word time detecting program includes the steps of:
(1) acquiring the key input time;
(2) judging whether the key acquisition time is equal to the key acquisition time of the last time, if so, continuing to the step 3, and if not, continuing to the step 4;
(3) displaying a short circuit error of the character key, and ending the program;
(4) judging whether the time obtained by subtracting the time obtained by the last key from the time obtained by the last key is greater than a set time threshold value or not;
(5) if yes, displaying the overtime of the character key input; if not, the last key acquisition time variable is stored as the next key acquisition time.
During testing, the testing computer display interface can simulate the keyboard display interface, as shown in fig. 18, and the testing keys are lightened one by one, so that the detection result can be clearly and clearly viewed.

Claims (9)

1. A membrane keyboard PCBA testing device is characterized by comprising an upper computer, a testing jig and a power supply; the test fixture comprises a built-in test board, a power interface, a test switch, an upper computer interface and a probe interface, wherein the power interface, the test switch and the probe interface are all connected to the built-in test board, and the upper computer interface is connected to a USB interface probe point of the PCBA through a fixture probe;
the testing jig is connected with the golden fingers of the PCBA through jig probes, the jig probes are connected with the probe interfaces, connected with the power supply through the power supply interfaces and connected with the upper computer through the upper computer interface; the test fixture is started through the test switch to test the PCBA, test data are uploaded to the upper computer in real time, and test software of the upper computer displays a test state and a test result.
2. The membrane keyboard PCBA testing device as in claim 1, wherein the built-in testing board comprises MCU, power interface connector, voltage conversion unit, fixture probe connector and several gate switch units;
the test switch is connected with the MCU;
the power interface connector is connected with the voltage conversion unit to supply power to the MCU and the gating switch units;
pins of the jig probe connector are led out to be used as probe interfaces, the PCBA key rows and columns are respectively connected to the input ends of different gating switch units, and the common ends of the gating switch units are all in short circuit connection;
the enabling end and the gating control end of the gating switch unit are connected to the MCU, the MCU controls short circuit conduction of the PCBA key row and column, test data are synchronously uploaded to the upper computer, and test software of the upper computer displays a test state and a test result.
3. The device for testing the PCBA of a membrane keyboard as claimed in claim 1, wherein the testing fixture further comprises a firmware update interface, and the built-in testing board further comprises a firmware update interface connector connected to the MCU.
4. A membrane keypad PCBA testing method using the testing apparatus of claims 1-3, comprising the steps of:
(1) inserting a power supply into a power supply interface of the test fixture;
(2) the test fixture upper computer interface is connected with an upper computer;
(3) the test fixture probe interface is connected with the fixture probe, and the fixture probe is connected with the PCBA golden finger;
(4) and opening the test program of the upper computer, and then testing according to the test switch on the test fixture.
5. The method for testing the PCBA of the thin film keyboard as recited in claim 4, further comprising programming the lower computer program to the MCU of the test fixture via the firmware update interface before testing.
6. The membrane keyboard PCBA testing method as in claim 5, wherein said lower computer program comprises steps of:
(1) starting a program and initializing;
(2) judging whether the test switch is turned on or not;
(3) if yes, running a row-column short circuit program.
7. The membrane keyboard PCBA testing method as in claim 4, wherein said upper computer testing program comprises steps of:
(1) starting a program and initializing;
(2) judging whether the test device is normally accessed;
(3) if yes, the key detection program is operated.
8. A membrane keypad PCBA testing method according to claim 7, wherein the key detection program comprises the steps of:
(1) running a time detection program for inputting the character keys;
(2) receiving the character key code until the character key is checked finally;
(3) and detecting whether the number of the keys is correct or not, returning a detection result, and displaying that the test is successful or displaying the missing keys.
9. A membrane keypad PCBA testing method according to claim 8, wherein the input key time detection program comprises the steps of:
(1) acquiring the key input time;
(2) judging whether the key acquisition time is equal to the key acquisition time of the last time, if so, continuing to the step 3, and if not, continuing to the step 4;
(3) displaying a short circuit error of the character key, and ending the program;
(4) judging whether the time obtained by subtracting the time obtained by the last key from the time obtained by the last key is greater than a set time threshold value or not;
(5) if yes, displaying the overtime of the character key input; if not, the last key acquisition time variable is stored as the next key acquisition time.
CN201911079508.4A 2019-11-07 2019-11-07 Thin film keyboard PCBA testing device and method Pending CN110673022A (en)

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111273170A (en) * 2020-02-10 2020-06-12 东莞美泰电子有限公司 Keyboard character key module testing device and method
CN112240944A (en) * 2020-12-17 2021-01-19 天津飞旋科技有限公司 Test system, test method, and computer-readable storage medium
CN113341300A (en) * 2021-06-23 2021-09-03 紫光展讯通信(惠州)有限公司 Matrix key circuit automatic detection method, system, medium and equipment
CN114217209A (en) * 2021-12-14 2022-03-22 厦门芯阳科技股份有限公司 Multi-station PCBA board detection method
CN114441992A (en) * 2021-12-29 2022-05-06 苏州浪潮智能科技有限公司 Test fixture, test device and test method for transmission cable line sequence

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CN103913699A (en) * 2014-04-14 2014-07-09 合肥宝龙达信息技术有限公司 Circuit, system and method for testing main board keyboard interface
CN107367652A (en) * 2017-07-29 2017-11-21 北京广利核系统工程有限公司 Obtain test device, test system and the method for testing of keyboard action

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Publication number Priority date Publication date Assignee Title
CN111273170A (en) * 2020-02-10 2020-06-12 东莞美泰电子有限公司 Keyboard character key module testing device and method
CN112240944A (en) * 2020-12-17 2021-01-19 天津飞旋科技有限公司 Test system, test method, and computer-readable storage medium
CN113341300A (en) * 2021-06-23 2021-09-03 紫光展讯通信(惠州)有限公司 Matrix key circuit automatic detection method, system, medium and equipment
CN113341300B (en) * 2021-06-23 2023-03-03 紫光展讯通信(惠州)有限公司 Matrix key circuit automatic detection method, device, medium and equipment
CN114217209A (en) * 2021-12-14 2022-03-22 厦门芯阳科技股份有限公司 Multi-station PCBA board detection method
CN114217209B (en) * 2021-12-14 2023-06-30 厦门芯阳科技股份有限公司 Multi-station PCBA board detection method
CN114441992A (en) * 2021-12-29 2022-05-06 苏州浪潮智能科技有限公司 Test fixture, test device and test method for transmission cable line sequence
CN114441992B (en) * 2021-12-29 2024-01-26 苏州浪潮智能科技有限公司 Test fixture, test device and test method for cable sequence of transmission line

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