CN110609177A - Transformer testing device - Google Patents
Transformer testing device Download PDFInfo
- Publication number
- CN110609177A CN110609177A CN201910841689.3A CN201910841689A CN110609177A CN 110609177 A CN110609177 A CN 110609177A CN 201910841689 A CN201910841689 A CN 201910841689A CN 110609177 A CN110609177 A CN 110609177A
- Authority
- CN
- China
- Prior art keywords
- sliding block
- transformer
- thimble
- fixing seat
- testing device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 92
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 8
- 229910052802 copper Inorganic materials 0.000 claims abstract description 8
- 239000010949 copper Substances 0.000 claims abstract description 8
- 230000000712 assembly Effects 0.000 claims description 10
- 238000000429 assembly Methods 0.000 claims description 10
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- 229910052782 aluminium Inorganic materials 0.000 claims description 4
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 239000003990 capacitor Substances 0.000 abstract description 7
- 229920001342 Bakelite® Polymers 0.000 description 3
- 239000004637 bakelite Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses a transformer testing device, which comprises a testing box body, an ejector pin fixing seat, a first sliding block, a second sliding block and a driving unit, wherein the ejector pin fixing seat is arranged in the testing box body and fixed on a bottom plate; the first sliding block is provided with a test position for placing a transformer; a first thimble group facing the test position is arranged on the thimble fixing seat, and a second thimble group facing the test position is arranged on the second sliding block; copper layers for grounding are arranged on the inner surface of the bottom plate of the test box body, the thimble fixing seat and the outer surface of the second sliding block. The transformer testing device is used for testing the transformer of the adapter without the Y capacitor, has high stability, strong anti-interference capability and less misjudgment, meets the MEI testing requirement of the complete adapter, and improves the complete adapter assembly rate and the product yield.
Description
Technical Field
The invention relates to the technical field of transformer detection, in particular to a transformer testing device.
Background
At present, the Y capacitor is widely used in the switching power supply, but the existence of the Y capacitor causes leakage current between the input line and the output line. The adapter with Y capacitor will cause the danger of electric shock for users and interference effect for communication products, so some adapter manufacturers are beginning to adopt adapter without Y capacitor, however, the design of removing Y capacitor to EMI (electromagnetic interference) brings difficulty, the pulse width modulator with frequency jitter and frequency modulation can improve the performance of MEI, but can not absolutely ensure that the adapter passes the EMI test, and it must be improved on the circuit and transformer structure to make the adapter meet the MEI standard.
The existing transformer test fixture has poor anti-interference capability, low transformer test yield and high misjudgment rate, and cannot meet the test requirements and the complete machine EMI test.
Disclosure of Invention
The invention aims to provide a transformer testing device with strong anti-interference capability.
The technical scheme adopted by the invention for solving the technical problems is as follows: the transformer testing device comprises a testing box body, a thimble fixing seat, a first sliding block, a second sliding block and a driving unit, wherein the thimble fixing seat is arranged in the testing box body and fixed on a bottom plate of the testing box body;
the first sliding block is provided with a test position for placing a transformer; the thimble fixing seat is provided with a first thimble group facing the test position and used for being connected with pins on the transformer, and the second slide block is provided with a second thimble group facing the test position and used for being connected with pins on the transformer; and copper layers for grounding are arranged on the inner surface of the bottom plate of the test box body and on the outer surfaces of the thimble fixing seat and the second sliding block.
Preferably, the transformer testing device further comprises at least one group of supporting and guiding assemblies arranged in the testing box body;
the supporting and guiding assembly comprises a first fixed seat, a second fixed seat and a guide rail, the first fixed seat is positioned on one side of the first sliding block, which is back to the second sliding block, the second fixed seat is positioned on one side of the second sliding block, which is back to the first sliding block, and the guide rail penetrates through the first sliding block and the second sliding block and is connected between the first fixed seat and the second fixed seat; the first sliding block and the second sliding block move back and forth along the guide rail in the direction close to and far away from the thimble fixing seat.
Preferably, the support guide assembly further comprises a first spring and a second spring which respectively drive the first slider and the second slider to move and then return; the first spring is sleeved on the guide rail and abutted between the first fixing seat and the first sliding block, and the second spring is sleeved on the guide rail and abutted between the first sliding block and the second sliding block.
Preferably, the transformer testing device comprises two groups of supporting and guiding assemblies, and the two ends of the two groups of supporting and guiding assemblies, which correspond to the first sliding block and the second sliding block, are arranged on two opposite sides of the thimble fixing seat.
Preferably, the driving unit includes a quick clamp; the quick clamp is fixed on the bottom plate of the test box body and is positioned on one side, far away from the first sliding block, of the second sliding block.
Preferably, the telescopic shaft of the quick clamp is connected with the second sliding block.
Preferably, the bottom plate is an aluminum plate.
Preferably, at least one wiring hole is arranged on a side plate of the test box body.
Preferably, the test box body comprises a bottom box with an open top, and a box cover covering the open top of the bottom box; and the box cover is provided with a window corresponding to the test position and the driving unit.
Preferably, the bottom box comprises the bottom plate and a plurality of side plates which are enclosed on the peripheral edge of the bottom plate; a notch is arranged on a side plate corresponding to the driving unit.
The transformer testing device is used for testing the transformer of the adapter without the Y capacitor, has high stability, strong anti-interference capability and less misjudgment, meets the MEI testing requirement of the complete adapter, and improves the complete adapter assembly rate and the product yield.
Drawings
The invention will be further described with reference to the accompanying drawings and examples, in which:
FIG. 1 is a schematic structural diagram of a transformer testing apparatus (after a box cover is removed from a testing box body) according to an embodiment of the present invention;
fig. 2 is a top view of a transformer testing apparatus according to an embodiment of the invention.
Detailed Description
For a more clear understanding of the technical features, objects and effects of the present invention, embodiments of the present invention will now be described in detail with reference to the accompanying drawings.
As shown in fig. 1 and 2, a transformer testing apparatus according to an embodiment of the present invention is used for simulating an adapter common mode noise test. The transformer testing device comprises a testing box body 10, an ejector pin fixing seat 20 arranged in the testing box body 10, a first sliding block 31, a second sliding block 32 and a driving unit 40.
The thimble fixing base 20 is fixed on the bottom plate 11 of the testing box 10, and is provided with a first thimble group 51 for connecting with the pins of the transformer 1. The first slider 31 and the second slider 32 are sequentially disposed on one side of the thimble fixing base 20 and can move back and forth in a direction close to and away from the thimble fixing base 20, and the driving unit 40 drives the first slider 31 and the second slider 32 to move. The first sliding block 31 is located between the thimble fixing base 20 and the second sliding block 32, and a testing position 310 for placing the transformer 1 is arranged on the first sliding block. The second slider 32 is provided with a second thimble group 52 for connecting with the pins of the transformer 1. The first thimble group 51 and the second thimble group 52 face the testing position 310 of the first slider 31, respectively, and after the driving unit 40 drives the first slider 31 and the second slider 32 to move toward the thimble fixing base 20, the first thimble group 51 and the second thimble group 52 are in contact with and conducted with pins on two opposite sides of the transformer 1, respectively, so as to start testing the transformer 1.
Copper layers are arranged on the inner surface of the bottom plate 11 of the test box body 10 and the outer surfaces of the thimble fixing seat 20 and the second sliding block 32, and are used for grounding and shielding interference.
Specifically, the test cassette body 10 may include a bottom cassette 101 open at the top, and a cassette cover 102 covering the open top of the bottom cassette 101. When the transformer 1 is tested, the box cover 102 is covered on the bottom box 101, so that the interference to the test of the transformer 1 is avoided or reduced. To facilitate observation of the inside of the test case 10, the case cover 102 may be made of transparent material such as acrylic.
The box cover 102 may have a window 103 corresponding to the test position 310 and the driving unit 40, so as to facilitate taking and placing the transformer 1 and operating the driving unit 40 to move the first slider 31 and the second slider 32.
The bottom case 101 further includes a bottom plate 11 and a plurality of side plates 12 surrounding the periphery of the bottom plate 11, wherein a receiving space is defined between the bottom plate and the side plates for receiving the thimble fixing base 20, the first slider 31, the second slider 32, the driving unit 40, and the like. Preferably, the bottom plate 11 is an aluminum plate, and a copper layer is disposed on a surface of the aluminum plate, so that the thimble holders 20, the first slider 31, the second slider 32, the driving unit 40, and the like are disposed on the copper layer.
The base plate 11 may have a thickness of 8-10mm and thus a certain weight so that the entire testing device can be positioned on the platform without being easily moved. The side plates 12 may be made of bakelite.
At least one wiring hole 13 is formed in at least one side plate 12 of the bottom case 101, after the first thimble group 51 and the second thimble group 52 are connected to pins of the transformer 1, an external oscilloscope and a signal transmitter are required to be connected for testing, and a connecting wire can enter the bottom case 101 through the wiring hole 13 to be connected with the first thimble group 51 and the second thimble group 52.
A side plate 12 of the bottom case 101 corresponding to the driving unit 40 may also be provided with a notch 14 to provide a space for the driving unit 40 to move.
The shape of the test cassette 10 may be square as shown in fig. 1, or may be any other shape such as polygonal, circular, or irregular.
The thimble fixing base 20, the first slider 31 and the second slider 32 are disposed in parallel in the test cassette 10. The first slider 31 and the second slider 32 are provided on the base plate 11 and are movable relative to the base plate 11. The thimble fixing seat 20, the first sliding block 31 and the second sliding block 32 can be made of bakelite. The copper layer on the thimble fixing base 20 is not connected to the first thimble group 51, and the copper layer on the second slider 32 is not connected to the second thimble group 52.
The first thimble group 51 includes a plurality of first thimbles, and the number and arrangement correspond to pins on the transformer 1. The first thimble may transversely penetrate through two opposite surfaces of the thimble fixing base 20, one end of the first thimble is located on one surface of the thimble fixing base 20 facing the first sliding block 31, and the other end of the first thimble protrudes from one surface of the thimble fixing base 20 facing away from the first sliding block 31. The end part of the first thimble, which is contacted with the pin of the transformer 1, can be arranged to be in a pointed shape, so that the accuracy of aligning and contacting with the pin is improved.
The second thimble group 52 also includes a plurality of second thimbles, the number and arrangement of which correspond to the pins of the transformer 1. The second thimble may transversely penetrate through two opposite surfaces of the second slider 32, one end of the second thimble is located on a surface of the second slider 32 facing the first slider 31, and the other end of the second thimble protrudes from a surface of the second slider 32 facing away from the first slider 31. The end part of the second thimble, which is contacted with the pin of the transformer 1, can be arranged to be in a pointed shape, so that the accuracy of aligning and contacting with the pin is improved.
In the present embodiment, the driving unit 40 includes a quick clamp. The quick clamp is fixed on the bottom 11 plate of the test cassette 10 and is located on the side of the second slider 32 away from the first slider 31. The extension shaft of the quick clamp faces the second slider 32 and can be connected with the second slider 32 or close to the second slider 32. When the handle of the quick clamp is pulled, the telescopic shaft extends to drive the second slide block 32 to move, and after the second thimble group 52 abuts against the transformer 1, the transformer 1 and the first slide block 31 where the transformer 1 is located are also driven to move, and the second thimble group is close to the thimble fixing base 20 until the first thimble group 4 contacts and is connected with the pins on the transformer 1.
Further, the transformer testing device of the present invention further includes at least one set of supporting and guiding components 60 disposed in the testing box 10, which support and guide the first slider 31 and the second slider 32.
The supporting and guiding assembly 60 may include a first fixing seat 61, a second fixing seat 62 and a guide rail 63, wherein the first fixing seat 61 and the second fixing seat 62 are fixed on the bottom plate 11. The first fixing seat 61 is located on one side of the first sliding block 31, which faces away from the second sliding block 32, the second fixing seat 62 is located on one side of the second sliding block 32, which faces away from the first sliding block 31, and the guide rail 63 passes through the first sliding block 31 and the second sliding block 32 and is connected between the first fixing seat 61 and the second fixing seat 62. The first slider 31 and the second slider 32 can move back and forth along the guide rail 63 in a direction approaching to and departing from the thimble holders 20.
The guide 63 may be a circular shaft as shown in fig. 1. The first fixing seat 61, the second fixing seat 62 and the guide rail 63 can be made of bakelite.
Further, the support guide assembly 60 further includes a first spring 64 and a second spring 65 for respectively urging the first slider 31 and the second slider 32 to move and then return. The first spring 64 is sleeved on the guide rail 63 and abuts between the first fixed seat 61 and the first sliding block 31, and the second spring 65 is sleeved on the guide rail 63 and abuts between the first sliding block 31 and the second sliding block 32. When the driving unit 40 drives the second slider 32 to move toward the needle holder 20, both the second slider 32 and the first slider 31 move along the guide rail 63, and the first spring 64 and the second spring 65 are compressed. After the force of the driving unit 40 is removed, the first spring 64 and the second spring 65 are extended and restored by the restoring force, so as to drive the first slider 31 and the second slider 32 to move along the guide rail 63 in the direction away from the needle holder 20.
In this embodiment, the first slider 31 and the second slider 32 are long blocks, the test site 310 is disposed at a middle position of the first slider 31, and the second thimble group 52 is disposed at a middle position of the second slider 32 corresponding to the test site 310. In order to ensure the balanced back and forth movement of the first slider 31 and the second slider 32, in this embodiment, the transformer testing apparatus includes two sets of supporting guide assemblies 60, and two ends of the two sets of supporting guide assemblies 60, corresponding to the first slider 31 and the second slider 32, are disposed on two opposite sides of the thimble fixing base 20.
A set of first and second fixed seats 61 and 62 for supporting the guide assembly 60 are disposed at opposite sides of one end of the first slider 31 and one end of the second slider 32, and a guide rail 63 for supporting the guide assembly 60 passes through one end of the first slider 31 and one end of the second slider 32; the first fixing seat 61 and the second fixing seat 62 of the other set of the supporting and guiding assemblies 60 are disposed at opposite sides of the other ends of the first slider 31 and the second slider 32, and the guide rail 63 of the set of the supporting and guiding assemblies 60 passes through the other ends of the first slider 31 and the second slider 32. The thimble fixing seat 20 is positioned between the two first fixing seats 61; the driving unit 20 is located between the two second fixing seats 62.
According to the requirement, the transformer testing device of the present invention may further include an oscilloscope and a signal transmitter connected to the first and second thimble groups 51 and 52 through connection lines.
With reference to fig. 1 and 2, in use, the transformer testing apparatus of the present invention positions the transformer 1 on the testing position 310 of the first slider 31, and pins on two sides of the transformer 1 face the first thimble group 51 and the second thimble group 52, respectively. Pushing the quick clamp to drive the second sliding block 32 and the second sliding block 31 to move towards the thimble fixing seat 20 until the first thimble group 51 and the second thimble group 52 contact with the pins at two sides of the transformer 1 respectively, and starting the test; after the test is completed, the quick clamp is pulled back, and the first slide block 31 and the second slide block 32 move and reset.
The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes performed by the present specification and drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (10)
1. A transformer testing device is characterized by comprising a testing box body, a thimble fixing seat, a first sliding block, a second sliding block and a driving unit, wherein the thimble fixing seat is arranged in the testing box body and fixed on a bottom plate of the testing box body;
the first sliding block is provided with a test position for placing a transformer; the thimble fixing seat is provided with a first thimble group facing the test position and used for being connected with pins on the transformer, and the second slide block is provided with a second thimble group facing the test position and used for being connected with pins on the transformer; and copper layers for grounding are arranged on the inner surface of the bottom plate of the test box body and on the outer surfaces of the thimble fixing seat and the second sliding block.
2. The transformer testing device of claim 1, further comprising at least one set of support guide assemblies disposed within the testing cassette;
the supporting and guiding assembly comprises a first fixed seat, a second fixed seat and a guide rail, the first fixed seat is positioned on one side of the first sliding block, which is back to the second sliding block, the second fixed seat is positioned on one side of the second sliding block, which is back to the first sliding block, and the guide rail penetrates through the first sliding block and the second sliding block and is connected between the first fixed seat and the second fixed seat; the first sliding block and the second sliding block move back and forth along the guide rail in the direction close to and far away from the thimble fixing seat.
3. The transformer testing device of claim 2, wherein the supporting guide assembly further comprises a first spring and a second spring for respectively driving the first slider and the second slider to return after moving; the first spring is sleeved on the guide rail and abutted between the first fixing seat and the first sliding block, and the second spring is sleeved on the guide rail and abutted between the first sliding block and the second sliding block.
4. The transformer testing device according to claim 2, wherein the transformer testing device comprises two sets of the supporting and guiding assemblies, and the two sets of the supporting and guiding assemblies are arranged on two opposite sides of the thimble fixing seat corresponding to two ends of the first sliding block and the second sliding block.
5. The transformer testing apparatus of claim 1, wherein the driving unit comprises a quick clamp; the quick clamp is fixed on the bottom plate of the test box body and is positioned on one side, far away from the first sliding block, of the second sliding block.
6. The transformer testing device of claim 5, wherein the retractable shaft of the quick clamp is connected with the second slider.
7. The transformer testing device of claim 1, wherein the base plate is an aluminum plate.
8. The transformer testing device according to claim 1, wherein at least one wiring hole is formed on a side plate of the testing box body.
9. The transformer testing device according to any one of claims 1 to 8, wherein the testing box body comprises a bottom box with an open top, and a box cover covering the open top of the bottom box; and the box cover is provided with a window corresponding to the test position and the driving unit.
10. The transformer testing device of claim 9, wherein the bottom case comprises the bottom plate and a plurality of side plates which are connected around the peripheral edge of the bottom plate; a notch is arranged on a side plate corresponding to the driving unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910841689.3A CN110609177A (en) | 2019-09-06 | 2019-09-06 | Transformer testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910841689.3A CN110609177A (en) | 2019-09-06 | 2019-09-06 | Transformer testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN110609177A true CN110609177A (en) | 2019-12-24 |
Family
ID=68892438
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910841689.3A Pending CN110609177A (en) | 2019-09-06 | 2019-09-06 | Transformer testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110609177A (en) |
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| CN202548223U (en) * | 2011-12-30 | 2012-11-21 | 江苏利通电子有限公司 | SMD transformer automatic detecting jig |
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