CN110473797A - The inspection system and method for conductor integrated circuit device - Google Patents

The inspection system and method for conductor integrated circuit device Download PDF

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Publication number
CN110473797A
CN110473797A CN201910611210.7A CN201910611210A CN110473797A CN 110473797 A CN110473797 A CN 110473797A CN 201910611210 A CN201910611210 A CN 201910611210A CN 110473797 A CN110473797 A CN 110473797A
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data
integrated circuit
module
inspection
semiconductor integrated
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CN110473797B (en
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郝建华
李会斌
李子考
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SHENZHEN CITY GCAI ELECTRONICS Co.,Ltd.
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Yancheng Hua Xu Photoelectric Technology Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10Measuring as part of the manufacturing process
    • H01L22/14Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Supply And Installment Of Electrical Components (AREA)

Abstract

The invention discloses the inspection system and methods of conductor integrated circuit device, the inspection system includes checking module, control module, alarm module and cloud platform, the cloud platform is used to that inspection data to be stored and be analyzed, the present invention is scientific and reasonable, it is safe and convenient to use, it is stored using testing result of the database in cloud platform to each Single Electron component's feet, and, submodule is analyzed using data, data extracting sub-module and data combination submodule handle the data of storage, can effectively the pin data of inspection be extracted and be judged, semiconductor integrated circuit can effectively be understood in process of production, the installation of which electronic component is easy to appear failure, improve convenient for production process of the later period to semiconductor integrated circuit, the production matter of semiconductor integrated circuit can be effectively improved Amount, can constantly improve the production of semiconductor integrated circuit.

Description

The inspection system and method for conductor integrated circuit device
Technical field
The present invention relates to semiconductor integrated circuit technology field, specifically the inspection system of conductor integrated circuit device and Method.
Background technique
Semiconductor integrated circuit be by the passive elements such as the active components such as transistor and diode and resistor and capacitor, It interconnects, is integrated on a block semiconductor single-chip, to complete specific circuit or system function according to certain circuit.
But semiconductor integrated circuit, if rosin joint phenomenon occurs in electronic component, will lead to half after completing Conductor integrated circuit is not available, and traditional mode is when checking semiconductor integrated circuit, not to the data of inspection It is stored and processed, so that can not be summarized according to previous inspection record to the defects of production process, it can not be half-and-half Conductor integrated circuit production process is improved and is improved, so, people are badly in need of a kind of inspection of conductor integrated circuit device System and method solves the above problems.
Summary of the invention
The purpose of the present invention is to provide the inspection system and methods of conductor integrated circuit device, to solve the prior art Middle proposition the problem of.
To achieve the above object, the invention provides the following technical scheme: the inspection system of conductor integrated circuit device, is somebody's turn to do Inspection system includes checking module, control module, alarm module and cloud platform;
The output end for checking module is electrically connected the input terminal of control module, and the output end of the control module is electrical Connect the input terminal of alarm module and cloud platform;
Whether the inspection module is described for having rosin joint phenomenon to check the welding pin of semiconductor integrated circuit Control module is used to carry out whole system the control of intelligence, is also used to intuitively show inspection result, the alarm For alarming when there is rosin joint phenomenon to the inspection of semiconductor integrated circuit, the cloud platform is used for inspection data module It is stored and is analyzed.
According to the above technical scheme, the inspection module includes first terminal, Second terminal, resistance, power supply, two poles of display Pipe and current transformer;
The output end of the power supply is electrically connected the input terminal of first terminal, and the output end of the Second terminal is electrically connected The input terminal of resistance, the output end of the resistance are electrically connected the input terminal of display diode, the output of the display diode End is electrically connected the input terminal of current transformer, and the output end of the current transformer is electrically connected the input terminal of power supply;
The first terminal and Second terminal are used to be connect with the electronic component welding pin of semiconductor integrated circuit Touching, for checking whether pin rosin joint phenomenon occurs, the resistance is used to reduce the electric current in circuit, the display two For showing to whether semiconductor integrated circuit pin rosin joint phenomenon occurs, the current transformer is used for inspection pole pipe Electric current in modular circuit is detected, and determines whether the pin of semiconductor integrated circuit rosin joint phenomenon occurs.
According to the above technical scheme, the control module includes PLC controller, input keyboard and display screen;
The output end of the input keyboard is electrically connected the input terminal of PLC controller, the output end electricity of the PLC controller Property connection display screen input terminal, be electrically connected between the PLC controller and current transformer;
The PLC controller is used to carry out intelligent control to whole system, is also used to that inspection data are calculated and located Reason, the input keyboard are used for the voltage and resistance value of input checking circuit, and the display screen is used for the knot for calculating and checking Fruit is shown, is judged for subjectivity whether semiconductor integrated circuit pin rosin joint phenomenon occurs.
According to the above technical scheme, the alarm module is alarm lamp;
The output end of the PLC controller is electrically connected the input terminal of alarm lamp;
The warning light is used to occur carrying out timely warning reminding when pin rosin joint phenomenon to semiconductor integrated circuit.
According to the above technical scheme, the cloud platform includes data analysis submodule, data extracting sub-module, data composition Submodule and database;
The output end of the PLC controller is electrically connected the input terminal of database, and the output end of the database electrically connects The input terminal of data analysis submodule is connect, the output end of the data molecular modules is electrically connected the input of data extracting sub-module End, the output end of the data extracting sub-module are electrically connected the input terminal of data group zygote module;
The database is used to store the inspection data of inspection module, several tables of data are contained in database, For carrying out classification storage to data, the data molecular modules are used to analyze the inspection data of inspection module and be located Reason, the data extracting sub-module for extracting to current data similar in current value, use by the data composition submodule It is combined, the storage of electric current similar in data is entered in tables of data, for transferring for later period in data similar in current value With check.
The inspection method of conductor integrated circuit device, the inspection method the following steps are included:
S1, the voltage value and resistance value input control module that mould group will be checked using input keyboard;
S2, two pin welds that first terminal and Second terminal are overlapped on to semiconductor integrated circuit;
S3, the current value in inspection modular circuit is detected using current transformer;
S4, the current value of current transformer and calculated current value are compared, to whether occur rosin joint phenomenon into Row determines;
S5, when there is rosin joint phenomenon, utilize PLC controller control alarm module memory warning reminding;
S6, the detection data storage for checking module is entered in database, transferring and summarizing convenient for the later period;
S7, the data analysis submodule using in cloud platform, data extracting sub-module and data combination submodule are to data The detection data of middle storage is classified, for handling detection data.
According to the above technical scheme, in the step S1-S5, firstly, will check the electricity of modular circuit using input keyboard Pressure value U, resistance value R and the resistance value R for showing diodeLIt inputs in PLC controller, according to Ohm's law:
It calculates and checks in modular circuit should there is current value I1
First terminal and Second terminal are overlapped on the adjacent of semiconductor integrated circuit two different electronic components respectively Pin at, connect and check circuit, whether occur rosin joint phenomenon using display diode pair semiconductor integrated circuit and shown, Also, using current transformer to the real-time current I for checking modular circuit2It is detected;
Work as I1≠I2When, show that rosin joint phenomenon occurs in the welding of the electronic component of semiconductor integrated circuit, utilizes display Calculating current value and detection current value are shown that the warning light of the PLC controller control alarm module carries out timely by screen Alarm, remind staff timely check.
According to the above technical scheme, in the step S6-S7, current value and calculating current be will test using PLC controller Value storage enters in database, is analyzed and processed using the data molecule submodule in cloud platform to the data of storage, utilizes Data extracting sub-module approximately detects current value to the pin of the corresponding electronic component in data and extracts and divide Class forms the extracted data of data extracting sub-module using data group zygote module, and corresponding data is deposited Storage enters in the same tables of data in database.
According to the above technical scheme, set an electronic component in semiconductor integrated circuit pin check number as N times set the current value point that the pin normal current value of in semiconductor integrated circuit electronic component detects every time as I It Wei not n1、n2、n3、...、nn, according to formula:
Work as NIt is flatWhen=I, the pin welding of an electronic component in superficial semiconductor integrated circuit is chronically at normal State does not need to be monitored the production status of this electronic component in production procedure;
Work as NIt is flatWhen ≠ I, the pin welding of an electronic component in superficial semiconductor integrated circuit is in abnormal shape State needs the production status to this electronic component in production procedure to be monitored.
Compared with prior art, the beneficial effects of the present invention are: using current transformer to the reality checked in modular circuit Border electric current is detected, and is compared with calculating current, and the welding pin that can effectively understand in semiconductor integrated circuit is It is no failure occur, if rosin joint phenomenon occur, effectively semiconductor integrated circuit can be checked, it is flat to be provided with cloud Platform is stored using testing result of the database in cloud platform to each Single Electron component's feet, also, utilizes number The data of storage are handled according to analysis submodule, data extracting sub-module and data combination submodule, it can be effectively right The pin data of inspection extracts and judges, can effectively understand semiconductor integrated circuit in process of production, which The installation of electronic component is easy to appear failure, improves convenient for production process of the later period to semiconductor integrated circuit, can be with The quality of production of semiconductor integrated circuit is effectively improved, constantly the production of semiconductor integrated circuit can be improved.
Detailed description of the invention
Fig. 1 is the module composition schematic diagram of the inspection system of conductor integrated circuit device of the present invention;
Fig. 2 is the attachment structure schematic diagram of the inspection system of conductor integrated circuit device of the present invention;
Fig. 3 is the schematic diagram of circuit connection structure of the inspection systems inspection module of conductor integrated circuit device of the present invention;
Fig. 4 is the step schematic diagram of the inspection method of conductor integrated circuit device of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other Embodiment shall fall within the protection scope of the present invention.
Embodiment: as shown in Figure 1-3, the present invention provides a kind of technical solution, the inspection system of conductor integrated circuit device System, the inspection system include checking module, control module, alarm module and cloud platform;
Check that the output end of module is electrically connected the input terminal of control module, the output end of control module is electrically connected alarm The input terminal of module and cloud platform;
It checks module: whether thering is rosin joint phenomenon to check for the welding pin to semiconductor integrated circuit;
Control module: it for carrying out whole system the control of intelligence, is also used to intuitively show inspection result;
Alarm module: it alarms when there is rosin joint phenomenon for the inspection to semiconductor integrated circuit;
Cloud platform: for inspection data to be stored and analyzed.
Check that module includes first terminal, Second terminal, resistance, power supply, display diode and current transformer;
The output end of power supply is electrically connected the input terminal of first terminal, and the output end of Second terminal is electrically connected the defeated of resistance Enter end, the output end of resistance is electrically connected the input terminal of display diode, and it is mutual to show that the output end of diode is electrically connected electric current The input terminal of sensor, the output end of current transformer are electrically connected the input terminal of power supply;
First terminal and Second terminal: being contacted for the electronic component welding pin with semiconductor integrated circuit, For checking whether pin rosin joint phenomenon occurs;
Resistance: for reducing the electric current in circuit;
Show diode: for showing to whether semiconductor integrated circuit pin rosin joint phenomenon occurs;
Current transformer: for detecting to the electric current in inspection modular circuit, determine drawing for semiconductor integrated circuit Whether foot there is rosin joint phenomenon.
Control module includes PLC controller, input keyboard and display screen;
The output end of input keyboard is electrically connected the input terminal of PLC controller, and the output end of PLC controller is electrically connected aobvious The input terminal of display screen, is electrically connected between PLC controller and current transformer;
PLC controller: it for carrying out intelligent control to whole system, is also used to that inspection data are calculated and handled;
Input keyboard: voltage and resistance value for input checking circuit;
Display screen: for being shown to the result for calculating and checking, it is to semiconductor integrated circuit pin for subjectivity No there is rosin joint phenomenon and judged.
Alarm module is alarm lamp;
The output end of PLC controller is electrically connected the input terminal of alarm lamp;
Warning light: timely warning reminding is carried out when for pin rosin joint phenomenon occur to semiconductor integrated circuit.
Cloud platform includes data analysis submodule, data extracting sub-module, data composition submodule and database;
The output end of PLC controller is electrically connected the input terminal of database, and the output end of database is electrically connected data point The input terminal of submodule is analysed, the output end of data molecular modules is electrically connected the input terminal of data extracting sub-module, and data are extracted The output end of submodule is electrically connected the input terminal of data group zygote module;
Database: it is stored for the inspection data to inspection module, several tables of data is contained in database, are used for Classification storage is carried out to data;
Data molecular modules: it is analyzed and is handled for the inspection data to inspection module;
Data extracting sub-module: for being extracted to current data similar in current value;
Data form submodule: for being combined to data similar in current value, by electric current similar in data store into Enter in tables of data, transferring and checking for the later period.
As shown in figure 4, the inspection method of conductor integrated circuit device, the inspection method the following steps are included:
S1, the voltage value and resistance value input control module that mould group will be checked using input keyboard;
S2, two pin welds that first terminal and Second terminal are overlapped on to semiconductor integrated circuit;
S3, the current value in inspection modular circuit is detected using current transformer;
S4, the current value of current transformer and calculated current value are compared, to whether occur rosin joint phenomenon into Row determines;
S5, when there is rosin joint phenomenon, utilize PLC controller control alarm module memory warning reminding;
S6, the detection data storage for checking module is entered in database, transferring and summarizing convenient for the later period;
S7, the data analysis submodule using in cloud platform, data extracting sub-module and data combination submodule are to data The detection data of middle storage is classified, for handling detection data.
According to the above technical scheme, in step S1-S5, firstly, will check the voltage value of modular circuit using input keyboard U, the resistance value R of resistance value R and display diodeLIt inputs in PLC controller, according to Ohm's law:
It calculates and checks in modular circuit should there is current value I1
First terminal and Second terminal are overlapped on the adjacent of semiconductor integrated circuit two different electronic components respectively Pin at, connect and check circuit, whether occur rosin joint phenomenon using display diode pair semiconductor integrated circuit and shown, Also, it is detected using real-time current I2 of the current transformer to inspection modular circuit;
As I1 ≠ I2, show that rosin joint phenomenon occurs in the welding of the electronic component of semiconductor integrated circuit, using aobvious Calculating current value and detection current value are shown that the warning light that PLC controller controls alarm module carries out timely by display screen Alarm reminds staff timely to check.
According to the above technical scheme, in step S6-S7, it will test current value using PLC controller and calculating current value deposited Storage enters in database, is analyzed and processed using the data molecule submodule in cloud platform to the data of storage, utilizes data Extracting sub-module approximately detects current value to the pin of the corresponding electronic component in data and extracts and classify, benefit The extracted data of data extracting sub-module are formed with data group zygote module, and corresponding data are stored and are entered In the same tables of data in database.
According to the above technical scheme, set an electronic component in semiconductor integrated circuit pin check number as N times set the current value point that the pin normal current value of in semiconductor integrated circuit electronic component detects every time as I It Wei not n1、n2、n3、...、nn, according to formula:
Work as NIt is flatWhen=I, the pin welding of an electronic component in superficial semiconductor integrated circuit is chronically at normal State does not need to be monitored the production status of this electronic component in production procedure;
Work as NIt is flatWhen ≠ I, the pin welding of an electronic component in superficial semiconductor integrated circuit is in abnormal shape State needs the production status to this electronic component in production procedure to be monitored.
Embodiment one: voltage value 4.8V, 22 Ω of resistance value and two poles of display of modular circuit will be checked using input keyboard In 2 Ω of the resistance value input PLC controller of pipe, according to Ohm's law:
It calculates and checks in modular circuit should there is current value I1=0.5A;
Using current transformer to the real-time current I2=0A for checking modular circuit;
I1≠I2, show that rosin joint phenomenon occurs in the welding of the electronic component of semiconductor integrated circuit.
Embodiment two: voltage value 4.8V, 22 Ω of resistance value and two poles of display of modular circuit will be checked using input keyboard In 2 Ω of the resistance value input PLC controller of pipe, according to Ohm's law:
It calculates and checks in modular circuit should there is current value I1=0.5A;
Using current transformer to the real-time current I for checking modular circuit2=0.5A;
I1=I2, show that the welding of the electronic component of semiconductor integrated circuit belongs to normal condition.
Embodiment three: setting the pin inspection number of an electronic component in semiconductor integrated circuit as 10 times, if The pin normal current value for determining an electronic component in semiconductor integrated circuit is 0.5A, the current value difference detected every time For 0.5A, 0.5A, 0.5A, 0.5A, 0.5A, 0.5A, 0.5A, 0.5A, 0.5A, 0.5A, according to formula:
NIt is flat=0.5A;
NIt is flatThe pin welding of=I, an electronic component in superficial semiconductor integrated circuit are chronically at normal condition, It does not need to be monitored the production status of this electronic component in production procedure;
Example IV: setting the pin inspection number of an electronic component in semiconductor integrated circuit as 10 times, if The pin normal current value for determining an electronic component in semiconductor integrated circuit is 0.5A, the current value difference detected every time For 0.5A, 0A, 0.5A, 0.5A, 0.5A, 0.5A, 0A, 0.5A, 0.5A, 0.5A, according to formula:
NIt is flat=0.4A;
NIt is flatThe pin welding of ≠ I, an electronic component in superficial semiconductor integrated circuit are in abnormal state, need The production status of this electronic component in production procedure is monitored.
It is obvious to a person skilled in the art that invention is not limited to the details of the above exemplary embodiments, Er Qie In the case where without departing substantially from spirit or essential attributes of the invention, the present invention can be realized in other specific forms.Therefore, no matter From the point of view of which point, the present embodiments are to be considered as illustrative and not restrictive, and the scope of the present invention is by appended power Benefit requires rather than above description limits, it is intended that all by what is fallen within the meaning and scope of the equivalent elements of the claims Variation is included within the present invention.Any reference signs in the claims should not be construed as limiting the involved claims.

Claims (9)

1. the inspection system of conductor integrated circuit device, it is characterised in that: the inspection system includes checking module, control mould Block, alarm module and cloud platform;
The output end for checking module is electrically connected the input terminal of control module, and the output end of the control module is electrically connected The input terminal of alarm module and cloud platform;
Whether the inspection module is for having rosin joint phenomenon to check the welding pin of semiconductor integrated circuit, the control Module is used to carry out whole system the control of intelligence, is also used to intuitively show inspection result, the alarm module It alarms when there is rosin joint phenomenon for the inspection to semiconductor integrated circuit, the cloud platform is used to carry out inspection data Storage and analysis.
2. the inspection system of conductor integrated circuit device according to claim 1, it is characterised in that: the inspection module Including first terminal, Second terminal, resistance, power supply, display diode and current transformer;
The output end of the power supply is electrically connected the input terminal of first terminal, and the output end of the Second terminal is electrically connected resistance Input terminal, the output end of the resistance is electrically connected the input terminal of display diode, the output end electricity of the display diode Property connection current transformer input terminal, the output end of the current transformer is electrically connected the input terminal of power supply;
The first terminal and Second terminal are used for being contacted with the electronic component welding pin of semiconductor integrated circuit In checking whether pin rosin joint phenomenon occurs, the resistance is used to reduce the electric current in circuit, the display diode For showing to whether semiconductor integrated circuit pin rosin joint phenomenon occurs, the current transformer is used for inspection module Electric current in circuit is detected, and determines whether the pin of semiconductor integrated circuit rosin joint phenomenon occurs.
3. the inspection system of conductor integrated circuit device according to claim 1, it is characterised in that: the control module Including PLC controller, input keyboard and display screen;
The output end of the input keyboard is electrically connected the input terminal of PLC controller, and the output end of the PLC controller electrically connects The input terminal of display screen is connect, is electrically connected between the PLC controller and current transformer;
The PLC controller is used to carry out intelligent control to whole system, is also used to that inspection data are calculated and handled, institute Voltage and resistance value of the input keyboard for input checking circuit are stated, the display screen is used to carry out the result for calculating and checking It has been shown that, judges for subjectivity whether semiconductor integrated circuit pin rosin joint phenomenon occurs.
4. the inspection system of conductor integrated circuit device according to claim 1, it is characterised in that: the alarm module For alarm lamp;
The output end of the PLC controller is electrically connected the input terminal of alarm lamp;
The warning light is used to occur carrying out timely warning reminding when pin rosin joint phenomenon to semiconductor integrated circuit.
5. the inspection system of conductor integrated circuit device according to claim 1, it is characterised in that: the cloud platform packet Include data analysis submodule, data extracting sub-module, data composition submodule and database;
The output end of the PLC controller is electrically connected the input terminal of database, and the output end of the database is electrically connected number According to the input terminal of analysis submodule, the output end of the data molecular modules is electrically connected the input terminal of data extracting sub-module, The output end of the data extracting sub-module is electrically connected the input terminal of data group zygote module;
The database is used to store the inspection data of inspection module, several tables of data are contained in database, are used for Classification storage is carried out to data, the data molecular modules are used to that the inspection data of inspection module to be analyzed and be handled, institute Data extracting sub-module is stated for extracting to current data similar in current value, the data composition submodule is used for electricity Data similar in flow valuve are combined, and the storage of electric current similar in data are entered in tables of data, transferring and checking for the later period.
6. the inspection method of conductor integrated circuit device, it is characterised in that: the inspection method the following steps are included:
S1, the voltage value and resistance value input control module that mould group will be checked using input keyboard;
S2, two pin welds that first terminal and Second terminal are overlapped on to semiconductor integrated circuit;
S3, the current value in inspection modular circuit is detected using current transformer;
S4, the current value of current transformer and calculated current value are compared, to whether rosin joint phenomenon occur and sentence It is fixed;
S5, when there is rosin joint phenomenon, utilize PLC controller control alarm module memory warning reminding;
S6, the detection data storage for checking module is entered in database, transferring and summarizing convenient for the later period;
S7, the data analysis submodule using in cloud platform, data extracting sub-module and data combination submodule in data to depositing The detection data of storage is classified, for handling detection data.
7. the inspection method of conductor integrated circuit device according to claim 6, it is characterised in that: the step S1- In S5, firstly, will check voltage value U, the resistance value R of modular circuit using input keyboard and show the resistance value R of diodeLIt is defeated Enter in PLC controller, according to Ohm's law:
It calculates and checks in modular circuit should there is current value I1
First terminal and Second terminal are overlapped on semiconductor integrated circuit two different the adjacent of electronic component respectively to draw It at foot, connects and checks circuit, shown using whether display diode pair semiconductor integrated circuit rosin joint phenomenon occurs, and And using current transformer to the real-time current I for checking modular circuit2It is detected;
Work as I1≠I2When, show that rosin joint phenomenon occurs in the welding of the electronic component of semiconductor integrated circuit, it will using display screen Calculating current value and detection current value are shown that the warning light of the PLC controller control alarm module is timely reported It is alert, remind staff timely to check.
8. the inspection method of conductor integrated circuit device according to claim 6, it is characterised in that: the step S6- In S7, it will test current value using PLC controller and the storage of calculating current value enter in database, utilize the data in cloud platform Molecule submodule is analyzed and processed the data of storage, using data extracting sub-module to the corresponding electronics member in data The pin of device approximately detects current value and extracts and classify, using data group zygote module to data extracting sub-module institute The data of extraction are formed, and the storage of corresponding data is entered in the same tables of data in database.
9. the inspection method of conductor integrated circuit device according to claim 6, it is characterised in that: setting semiconductor collection It checks that number is n times at the pin of an electronic component in circuit, sets an electronics member in semiconductor integrated circuit The pin normal current value of device is that the current value that I is detected every time is respectively n1、n2、n3、...、nn, according to formula:
Work as NIt is flatWhen=I, the pin welding of an electronic component in superficial semiconductor integrated circuit is chronically at normal condition, It does not need to be monitored the production status of this electronic component in production procedure;
Work as NIt is flatWhen ≠ I, the pin welding of an electronic component in superficial semiconductor integrated circuit is in abnormal state, needs The production status of this electronic component in production procedure is monitored.
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CN112345982B (en) * 2020-09-29 2023-05-26 歌尔科技有限公司 Circuit element welding condition detection method and device
CN115017862A (en) * 2022-07-01 2022-09-06 广东赛昉科技有限公司 Integrated circuit image matching method and system

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